JP2010052062A - Grinding method - Google Patents

Grinding method Download PDF

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JP2010052062A
JP2010052062A JP2008216814A JP2008216814A JP2010052062A JP 2010052062 A JP2010052062 A JP 2010052062A JP 2008216814 A JP2008216814 A JP 2008216814A JP 2008216814 A JP2008216814 A JP 2008216814A JP 2010052062 A JP2010052062 A JP 2010052062A
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workpiece
thickness
grinding
holding
chuck table
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Kyoko Abe
恭子 阿部
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Disco Corp
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Disco Abrasive Systems Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To accurately measure thickness and form into the desired thickness when grinding a projection part of the face of a workpiece formed with recesses and projections into the desired thickness. <P>SOLUTION: The method for grinding the face 10 of the workpiece 1 with a grinding tool 60 by affixing a back face 11 of the workpiece 1 formed with recesses and projections on its face to a holding member 2, and holding the holding member 2 side by the chuck table 5, includes a grinding process of affixing a measuring piece 4 to the holding member 2 adjacent to the workpiece 1, rotating the chuck table 5 holding the holding member 2, and grinding the measuring piece 4 with the grinding tool 60 together with the projection part 100 of the face 10 of the workpiece 1; and a thickness measurement process of measuring the thickness of the measuring piece 4 while rotation of the chuck table 5 is temporarily stopped. In the grinding process, the workpiece 1 is ground to the desired thickness based on the measurement value in the thickness measurement process. <P>COPYRIGHT: (C)2010,JPO&amp;INPIT

Description

本発明は、表面に凹凸部が形成された被加工物の当該表面を研削して所望の厚さとする研削方法に関するものである。   The present invention relates to a grinding method for grinding a surface of a workpiece having a concavo-convex portion on the surface to obtain a desired thickness.

各種の被加工物を薄化研削して所望の厚さに仕上げる場合においては、被加工物の厚さを計測しながら研削を行い、所望の厚さになると研削を終了するようにしている。被加工物の厚さを計測する方法としては、厚さ計測器の接触子を被加工物の表面及び被加工物を保持する保持テーブルの表面に接触させ、その高さの差を求めて当該差の値から被加工物の厚さを求める接触式の計測方法が知られている。また、被加工物の表面及び被加工物を保持する保持テーブルの表面に所定周波数のレーザ光等を照射し、その反射波の到達時間の差から被加工物の厚さを求める非接触式の計測方法も用いられている。いずれの場合も、被加工物の表面の高さと保持テーブルの表面の高さの差から被加工物の厚さをも求めている(例えば特許文献1,2参照)。   When various workpieces are thinned and ground to a desired thickness, grinding is performed while measuring the thickness of the workpiece, and the grinding is terminated when the desired thickness is reached. As a method of measuring the thickness of the workpiece, the contact of the thickness measuring instrument is brought into contact with the surface of the workpiece and the surface of the holding table that holds the workpiece, and the difference in height is obtained. A contact-type measuring method for obtaining the thickness of the workpiece from the difference value is known. In addition, the surface of the workpiece and the surface of the holding table that holds the workpiece are irradiated with laser light of a predetermined frequency, and the thickness of the workpiece is obtained from the difference in arrival time of the reflected waves. Measurement methods are also used. In any case, the thickness of the workpiece is also obtained from the difference between the height of the surface of the workpiece and the height of the surface of the holding table (see, for example, Patent Documents 1 and 2).

被加工物が、様々な電子部品や金属などが含まれる複合材、例えば樹脂封止された半導体パッケージ、MEMS(Micro Electro Mechanical Systems)、電子部品の電気的テストに用いられるプローブカード等であり、一方の面に凹凸が形成されたものである場合においても、その一方の面に形成された凸部を研削することによりすべての凸部を所望の高さに揃え、凸部も含めた被加工物全体を所望の厚さに形成したりすることが行われている。この場合においても、接触式、非接触式のいずれかの方法によって、凸部の頂部と保持テーブルの表面との高さの差から被加工物の厚さを求めている。   The workpiece is a composite material containing various electronic components and metals, such as resin-encapsulated semiconductor packages, MEMS (Micro Electro Mechanical Systems), probe cards used for electrical testing of electronic components, etc. Even in the case where irregularities are formed on one surface, all the convex portions are aligned to the desired height by grinding the convex portions formed on the one surface, and the workpiece including the convex portions is processed. The entire object is formed to a desired thickness. Also in this case, the thickness of the workpiece is obtained from the difference in height between the top of the convex portion and the surface of the holding table by either a contact method or a non-contact method.

特開2001−351890号公報JP 2001-351890 A 特開2001−9716号公報Japanese Patent Laid-Open No. 2001-9716

しかし、凸部が微小である被加工物については、その凸部の高さを含めて被加工物の厚さを正確に計測することは困難である。具体的には、接触式の厚さ計測器を用いる場合において、凸部が微小であると、接触子を凸部に位置決めするのにかなりの精度が求められるという問題があり、更には微小な凸部が密集しているような場合には、接触子の位置決めに誤差があると、接触子が複数の凸部に同時に接触してしまうおそれがあるという問題もある。また、MEMSに形成されている中空部分等の脆弱な部分に接触子が接触すると、その部分が破損するという問題もある。一方、非接触式の厚さ測定器を用いる場合においても、凸部が微小であったり密集していたりすると、照射位置の位置決めに関して接触式の厚さ測定器の場合と同様の問題があり、位置決めに誤差があると、反射波を所望の位置に反射させることができず、厚さ計測が不可能になることもある。   However, it is difficult to accurately measure the thickness of the workpiece including the height of the convex portion of the workpiece having the minute convex portion. Specifically, in the case of using a contact-type thickness measuring device, if the convex portion is minute, there is a problem that considerable accuracy is required to position the contactor on the convex portion. In the case where the convex portions are densely packed, if there is an error in the positioning of the contact, there is a problem that the contact may come into contact with the plurality of convex portions at the same time. Moreover, when a contactor contacts weak parts, such as a hollow part currently formed in MEMS, there also exists a problem that the part will be damaged. On the other hand, even when using a non-contact type thickness measuring device, if the convex portions are minute or dense, there is a problem similar to the case of the contact type thickness measuring device regarding the positioning of the irradiation position, If there is an error in positioning, the reflected wave cannot be reflected to a desired position, and thickness measurement may be impossible.

そこで、本発明が解決しようとする課題は、凹凸が形成された被加工物の面の凸部を研削して所望の厚さとする場合において、その厚さを精度良く計測して所望の厚さに形成できるようにすることである。   Therefore, the problem to be solved by the present invention is to accurately measure the thickness of the workpiece on the surface of the workpiece on which the projections and depressions are formed to obtain the desired thickness. It is to be able to form.

本発明は、表面に凹凸が形成された被加工物の裏面を保持部材に貼着し、回転可能なチャックテーブルにおいて保持部材側を保持し、研削工具によって被加工物の表面を研削する研削方法に関するもので、チャックテーブルより外径が小さい被加工物がチャックテーブルの全面を覆う保持部材に貼着されると共に、被加工物に隣接して計測小片が保持部材に貼着され、チャックテーブルにおいて保持部材を保持してチャックテーブルを回転駆動し、被加工物の表面の凸部と共に計測小片を研削工具で研削する研削工程と、チャックテーブルの回転駆動を一時停止した状態で計測小片の厚さを計測する厚さ計測工程とからなり、研削工程では、厚さ計測工程における計測値に基づき被加工物が所望の厚さになるまで研削工具による研削を行うようにしたものである。   The present invention relates to a grinding method in which the back surface of a workpiece having irregularities formed on the surface is attached to a holding member, the holding member side is held in a rotatable chuck table, and the surface of the workpiece is ground by a grinding tool. A work piece having an outer diameter smaller than that of the chuck table is attached to a holding member that covers the entire surface of the chuck table, and a measurement piece is attached to the holding member adjacent to the work piece. Grinding process of holding the holding member and rotating the chuck table to grind the measuring piece together with the convex part on the surface of the workpiece with a grinding tool, and the thickness of the measuring piece with the rotation of the chuck table temporarily stopped In the grinding process, grinding with a grinding tool is performed until the workpiece has a desired thickness based on the measurement value in the thickness measurement process. It is obtained by the.

本発明では、被加工物のほかに計測小片も保持部材に貼着し、被加工物及び計測小片を研削して計測小片の厚さを計測することにより被加工物の厚さを間接的に計測するため、凸部が形成されているために厚さを直接計測すると高精度な計測が困難な被加工物であっても、正確な厚さ計測が可能となり、所望の厚さに仕上げることができる。   In the present invention, in addition to the work piece, the measurement piece is also attached to the holding member, and the thickness of the work piece is indirectly measured by measuring the thickness of the measurement piece by grinding the work piece and the measurement piece. Since the convex part is formed to measure, even if the workpiece is difficult to measure with high accuracy if the thickness is directly measured, accurate thickness measurement is possible and finished to the desired thickness. Can do.

図1及び図2に示す被加工物1は、表面10に凸部100が複数形成されており、裏面11は、伸縮性のある保持部材である保持テープ2の粘着面20に貼着される。保持テープ2の粘着面20の外周部分には、リング状に形成された金属製の保持フレーム3が貼着され、保持テープ2を介して被加工物1が保持フレーム3と一体となって支持された状態となる。   The workpiece 1 shown in FIGS. 1 and 2 has a plurality of convex portions 100 formed on the front surface 10, and the back surface 11 is attached to the adhesive surface 20 of the holding tape 2, which is an elastic holding member. . A metal holding frame 3 formed in a ring shape is attached to the outer peripheral portion of the adhesive surface 20 of the holding tape 2, and the workpiece 1 is supported integrally with the holding frame 3 via the holding tape 2. It will be in the state.

保持テープ2の粘着面20には、被加工物1に隣接して、被加工物1の厚さ計測に役立つ計測小片4が貼着される。計測小片4は、接触式の厚さ計測器の接触子が接触するのに十分な大きさであり、接触子の位置決めに多少のずれがあっても接触子が確実に接触できる程度の大きさに形成されていることが望ましい。また、図2に示すように、計測小片4は、凸部100を含めた被加工物1の厚さと同じかそれ以上の厚さを有する。計測小片4は、例えばシリコン片等の、接触子が接触しても変形せず、かつ、砥石によって研削できる材質によって形成されている。   A measurement piece 4 useful for measuring the thickness of the workpiece 1 is attached to the adhesive surface 20 of the holding tape 2 adjacent to the workpiece 1. The measurement piece 4 is large enough for the contact of the contact-type thickness measuring instrument to come into contact with the contact piece, so that the contact can be reliably contacted even if there is some deviation in the positioning of the contact. It is desirable to be formed. Further, as shown in FIG. 2, the measurement piece 4 has a thickness equal to or greater than the thickness of the workpiece 1 including the convex portion 100. The measurement piece 4 is formed of a material such as a silicon piece that does not deform even when contacted with the contact and can be ground with a grindstone.

図3に示すように、保持テープ2を介して保持フレーム3に支持された被加工物1は、研削装置に備えたチャックテーブル5の保持面50に吸引保持される。保持面50においては、保持テープ2を吸引することにより被加工物1及び計測小片4を保持する。このとき、被加工物1はチャックテーブル5よりも外径が小さく、保持テープ2はチャックテーブル5の全面を覆う。一方、保持フレーム3は、チャックテーブル5の外周側に配設された固定部51によって固定される。図示の例における固定部51はマグネット式であるが、これには限定されない。   As shown in FIG. 3, the workpiece 1 supported by the holding frame 3 via the holding tape 2 is sucked and held by the holding surface 50 of the chuck table 5 provided in the grinding apparatus. On the holding surface 50, the workpiece 1 and the measurement piece 4 are held by sucking the holding tape 2. At this time, the workpiece 1 has a smaller outer diameter than the chuck table 5, and the holding tape 2 covers the entire surface of the chuck table 5. On the other hand, the holding frame 3 is fixed by a fixing portion 51 disposed on the outer peripheral side of the chuck table 5. The fixing portion 51 in the illustrated example is a magnet type, but is not limited thereto.

チャックテーブル5に保持された被加工物1の凸部100を研削するにあたっては、被加工物1及び計測小片4の上方に研削工具である砥石60が位置付けされる。砥石60は、回転軸61に固定された研削ホイール62の下面に固着されており、回転軸61に連結されたモータ63によって回転駆動される構成となっている。   When grinding the convex portion 100 of the workpiece 1 held on the chuck table 5, a grindstone 60 as a grinding tool is positioned above the workpiece 1 and the measurement piece 4. The grindstone 60 is fixed to the lower surface of the grinding wheel 62 fixed to the rotating shaft 61, and is configured to be rotationally driven by a motor 63 connected to the rotating shaft 61.

研削時は、チャックテーブル5を回転駆動すると共に、被加工物1の回転中心を通るように位置付けられて回転する砥石60が凸部100に接触することにより凸部100が研削される。また、砥石60は、凸部100と共に計測小片4も研削する(研削工程)。   At the time of grinding, the chuck table 5 is driven to rotate, and the convex stone 100 is ground by the rotating grindstone 60 positioned so as to pass through the center of rotation of the workpiece 1 contacting the convex part 100. The grindstone 60 also grinds the measurement piece 4 together with the convex portion 100 (grinding process).

研削中は、任意のタイミングでチャックテーブル5の回転駆動を一時停止させ、計測小片4を砥石60の下方から外れた位置に位置決めして計測小片4の厚さを計測する。計測小片4の厚さを計測する際には、図4に示すように、厚さ計測器の接触子7を計測小片4の被研削面40に接触させ、そのときの接触子4の高さを認識する。また、その前に、接触子7を予めチャックテーブル5の保持面50に接触させ、そのときの接触子7の高さを認識しておく。そして、接触子7がチャックテーブル5の保持面50に接触したときの高さと計測小片4に接触したときの高さとの差を求め、その差の値から更に保持テープ2の厚さを引くと、その値が計測小片4の厚さとなる。そして、計測小片4は被加工物1の凸部100と共に研削されるため、計測小片4の厚さは被加工物1の厚さでもある。こうして被加工物1の厚さが求められる(厚さ計測工程)。このように、被加工物1の厚さを直接計測しなくてもその厚さを間接的に求めることができるため、凸部100が微小であったり密集していたりする場合でもその影響を受けることなく精度良く厚さを計測することができ、厳しい位置決め精度を要求されることもない。また、被加工物1には接触子が接触しないため、接触子が接触すると損傷するおそれがある被加工物であっても、損傷させずに厚さを計測することができる。   During grinding, the rotational drive of the chuck table 5 is temporarily stopped at an arbitrary timing, the measurement piece 4 is positioned at a position off the lower side of the grindstone 60, and the thickness of the measurement piece 4 is measured. When measuring the thickness of the measurement piece 4, as shown in FIG. 4, the contact 7 of the thickness measuring instrument is brought into contact with the surface 40 to be ground of the measurement piece 4, and the height of the contact 4 at that time is measured. Recognize Before that, the contact 7 is brought into contact with the holding surface 50 of the chuck table 5 in advance, and the height of the contact 7 at that time is recognized. Then, the difference between the height when the contact 7 comes into contact with the holding surface 50 of the chuck table 5 and the height when the contact 7 comes into contact with the measurement piece 4 is obtained, and the thickness of the holding tape 2 is further subtracted from the difference value. The value is the thickness of the measurement piece 4. Since the measurement piece 4 is ground together with the convex portion 100 of the workpiece 1, the thickness of the measurement piece 4 is also the thickness of the workpiece 1. Thus, the thickness of the workpiece 1 is obtained (thickness measurement step). As described above, since the thickness can be indirectly obtained without directly measuring the thickness of the workpiece 1, even when the convex portions 100 are minute or dense, the thickness is affected. The thickness can be measured accurately without any strict positioning accuracy being required. Moreover, since a contact does not contact the workpiece 1, even if it is a workpiece which may be damaged if a contact contacts, thickness can be measured, without damaging.

求めた被加工物1の厚さが所望の厚さより厚い場合は、その計測値に基づき研削工程を行い、厚さ計測工程によって被加工物1の厚さを計測する。こうして研削工程と厚さ計測工程とを繰り返し、被加工物1が所望の厚さになると、研削を終了する。   When the obtained thickness of the workpiece 1 is thicker than a desired thickness, a grinding process is performed based on the measured value, and the thickness of the workpiece 1 is measured by the thickness measurement process. Thus, the grinding process and the thickness measurement process are repeated, and when the workpiece 1 has a desired thickness, the grinding is finished.

表面に凹凸がある被加工物及び計測小片を保持テープに貼着して保持フレームに支持させた状態を示す平面図である。It is a top view which shows the state which stuck the to-be-processed object and measurement piece with the unevenness | corrugation on the surface to the holding tape, and was supported by the holding frame. 同被加工物及び計測小片を保持テープに貼着して保持フレームに支持させた状態を略示的に示す断面図である。It is sectional drawing which shows schematically the state which affixed the to-be-processed object and the measurement piece on the holding tape, and was supported by the holding frame. 研削工程において同被加工物及び計測小片を研削する状態を略示的に示す断面図である。It is sectional drawing which shows schematically the state which grinds the to-be-processed object and a measurement piece in a grinding process. 厚さ計測工程において接触子を計測小片に接触させた状態を略示的に示す断面図である。It is sectional drawing which shows schematically the state which made the contactor contact the measurement small piece in the thickness measurement process.

符号の説明Explanation of symbols

1:被加工物
10:表面 100:凸部
11:裏面
2:保持テープ 20:粘着面
3:保持フレーム
4:計測小片 40:被研削面
5:チャックテーブル 50:保持面 51:固定部
60:砥石 61:回転軸 62:研削ホイール 63:モータ
7:接触子
1: Workpiece 10: Front surface 100: Convex portion 11: Back surface 2: Holding tape 20: Adhesive surface 3: Holding frame 4: Measurement piece 40: Surface to be ground 5: Chuck table 50: Holding surface 51: Fixed portion 60: Grinding wheel 61: Rotating shaft 62: Grinding wheel 63: Motor 7: Contact

Claims (1)

表面に凹凸が形成された被加工物の裏面を保持部材に貼着し、回転可能なチャックテーブルにおいて該保持部材側を保持し、研削工具によって該被加工物の表面を研削する研削方法において、
チャックテーブルより外径が小さい被加工物が該チャックテーブルの全面を覆う保持部材に貼着されると共に、該被加工物に隣接して計測小片が該保持部材に貼着され、該チャックテーブルにおいて該保持部材を保持して該チャックテーブルを回転駆動し、該被加工物の表面の凸部と共に該計測小片を研削工具で研削する研削工程と、
該チャックテーブルの回転駆動を一時停止した状態で該計測小片の厚さを計測する厚さ計測工程とからなり、
該研削工程では、該厚さ計測工程における計測値に基づき該被加工物が所望の厚さになるまで該研削工具による研削を行う
研削方法。
In the grinding method of sticking the back surface of the workpiece with irregularities formed on the surface to the holding member, holding the holding member side in a rotatable chuck table, and grinding the surface of the workpiece with a grinding tool,
A workpiece having an outer diameter smaller than that of the chuck table is attached to a holding member that covers the entire surface of the chuck table, and a measurement piece is attached to the holding member adjacent to the workpiece. A grinding step of holding the holding member and rotating the chuck table to grind the measurement piece together with a convex portion on the surface of the workpiece with a grinding tool;
A thickness measuring step of measuring the thickness of the measurement piece in a state in which the rotational driving of the chuck table is temporarily stopped,
A grinding method in which, in the grinding step, grinding with the grinding tool is performed until the workpiece has a desired thickness based on the measurement value in the thickness measurement step.
JP2008216814A 2008-08-26 2008-08-26 Grinding method Pending JP2010052062A (en)

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Cited By (1)

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JP2013094910A (en) * 2011-11-02 2013-05-20 Disco Corp Grinding method for plate-like body

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JP2005014177A (en) * 2003-06-27 2005-01-20 Kasugai:Kk Polishing device and polishing method

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JP2013094910A (en) * 2011-11-02 2013-05-20 Disco Corp Grinding method for plate-like body

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