JP2010034341A - Chip mounting device - Google Patents

Chip mounting device Download PDF

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JP2010034341A
JP2010034341A JP2008195771A JP2008195771A JP2010034341A JP 2010034341 A JP2010034341 A JP 2010034341A JP 2008195771 A JP2008195771 A JP 2008195771A JP 2008195771 A JP2008195771 A JP 2008195771A JP 2010034341 A JP2010034341 A JP 2010034341A
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chip
holding means
pressure
amount
expansion
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JP5801526B2 (en
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Katsumi Terada
勝美 寺田
Mikio Kawakami
幹夫 川上
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Toray Engineering Co Ltd
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Toray Engineering Co Ltd
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Priority to JP2008195771A priority Critical patent/JP5801526B2/en
Priority to KR1020117004416A priority patent/KR101591125B1/en
Priority to PCT/JP2009/063542 priority patent/WO2010013764A1/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/75Apparatus for connecting with bump connectors or layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
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    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
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    • H01L2224/7525Means for applying energy, e.g. heating means
    • H01L2224/75252Means for applying energy, e.g. heating means in the upper part of the bonding apparatus, e.g. in the bonding head
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    • H01L2224/75Apparatus for connecting with bump connectors or layer connectors
    • H01L2224/757Means for aligning
    • H01L2224/75743Suction holding means
    • H01L2224/75745Suction holding means in the upper part of the bonding apparatus, e.g. in the bonding head
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    • H01L2924/013Alloys
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    • H01L2924/11Device type
    • H01L2924/14Integrated circuits

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  • Engineering & Computer Science (AREA)
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a chip mounting device that can shorten a production tact time and mounts a chip such as an integrated circuit element on a substrate such as a printed circuit board with high reliability. <P>SOLUTION: The chip mounting device includes a chip holding means of sucking and holding the chip, a pressure applying means of applying pressure to the chip holding means and also supporting the chip holding means, and a driving control means of enabling the pressure applying means to move along the height of the device, and solders a bump of the chip to an electrode of a substrate disposed at a position opposite the chip. The chip mounting device further includes a predictive control means of predicting an amount of elongation of the chip holding means in a period from heating of the chip holding means to fusion of the bump and inputting a correction command to the driving control means based upon a predicted value of elongation of the chip holding means to control the height position of the pressure applying means. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、プリント基板等の基板に集積回路素子などのチップを実装するチップ実装装置に関するものである。   The present invention relates to a chip mounting apparatus for mounting a chip such as an integrated circuit element on a substrate such as a printed circuit board.

プリント基板等の基板に集積回路素子などのチップを実装する装置として、先に本出願人により特許文献1のようなチップ実装装置が提案されている。   As a device for mounting a chip such as an integrated circuit element on a substrate such as a printed circuit board, a chip mounting device as disclosed in Patent Document 1 has been previously proposed by the present applicant.

特許文献1のチップ実装装置は図5に示すように、チップ1を保持して加圧力を与えるチップ保持手段17と、チップ保持手段17を上下に移動可能に支持し加圧力を付与する加圧付与手段15と、加圧付与手段15を昇降させるZ軸送り装置3と、加圧付与手段15の内部を移動しているチップ保持手段17の位置を検出する位置検出手段23と、位置検出手段23の検出信号に応じてZ軸送り装置3を制御する駆動制御手段22とを備えている。なお、加圧付与手段15はシリンダチューブの形状で、内部をチップ保持手段17のピストン部分が移動できるように構成され、ピストンに加わるシリンダ内の圧力がチップ保持手段17を介してチップ1に作用するようにしている。   As shown in FIG. 5, the chip mounting apparatus of Patent Document 1 holds a chip holding means 17 that holds the chip 1 and applies a pressing force, and a pressure that supports the chip holding means 17 so as to be movable up and down and applies a pressing force. Applying means 15, Z-axis feeding device 3 for raising and lowering pressure applying means 15, position detecting means 23 for detecting the position of tip holding means 17 moving inside the pressure applying means 15, and position detecting means Drive control means 22 for controlling the Z-axis feeding device 3 in response to the detection signal 23. The pressure applying means 15 is in the shape of a cylinder tube, and is configured so that the piston portion of the tip holding means 17 can move inside. The pressure in the cylinder applied to the piston acts on the tip 1 via the tip holding means 17. Like to do.

このようなチップ実装装置を用いて基板5にチップ1をハンダ接合する動作を図6のタイムチャートを用いて説明する。まず、チップ保持手段17にチップ1を吸着保持して、Z軸送り装置3を駆動して加圧付与手段15を基板5側に下降させる(t0からt1)。基板5とチップ1が接触し、設定された押し込み量d1だけ加圧付与手段15が基板5側に下降しZ軸送り装置3が停止する。このとき位置検出手段23がチップ保持手段17のピストン部分までの距離x1を検出する(t1からt2)。続いてチップ保持手段17に内蔵されているヒータ11がONし、加熱によりチップ保持手段17が伸びて位置検出手段23がチップ保持手段17のピストン部分までの距離x2を検出する。その後、チップ1のバンプ1aのハンダが溶融開始し、ハンダの溶融によりチップ保持手段17が加圧付与手段15の内部で下降する。位置検出手段23の検出しているチップ保持手段17のピストン部分までの距離がx3(設定値)になるとバンプ1aのハンダが溶融したと判断する(t2からt4)。ハンダの溶融の判断とともにハンダ冷却後のチップ1と基板5のギャップが所定値d3になるように、Z軸送り装置3を駆動し加圧付与手段15を引き上げている。そして、ヒータ11をOFFしチップ1の吸着を解除しハンダを冷却している(t4からt6)。従って、加圧付与手段15の内部を、ヒータ11の加熱およびハンダの溶融によりチップ保持手段17のピストン部分が上下に移動し、チップ保持手段17のピストン部分の位置を位置検出手段23が検出し、検出結果に基づいて駆動手段22がZ軸送り装置3を制御している。   The operation of soldering the chip 1 to the substrate 5 using such a chip mounting apparatus will be described with reference to the time chart of FIG. First, the chip 1 is sucked and held by the chip holding means 17 and the Z-axis feeding device 3 is driven to lower the pressure applying means 15 toward the substrate 5 (from t0 to t1). The substrate 5 and the chip 1 come into contact with each other, the pressurizing means 15 is lowered toward the substrate 5 by the set push amount d1, and the Z-axis feeding device 3 is stopped. At this time, the position detection means 23 detects the distance x1 to the piston portion of the tip holding means 17 (from t1 to t2). Subsequently, the heater 11 built in the chip holding means 17 is turned on, the chip holding means 17 is extended by heating, and the position detecting means 23 detects the distance x2 to the piston portion of the chip holding means 17. Thereafter, the solder of the bumps 1a of the chip 1 starts to melt, and the chip holding means 17 descends inside the pressure applying means 15 due to the melting of the solder. When the distance to the piston portion of the chip holding means 17 detected by the position detecting means 23 reaches x3 (set value), it is determined that the solder of the bump 1a has melted (from t2 to t4). The Z-axis feeding device 3 is driven and the pressure applying means 15 is pulled up so that the gap between the chip 1 and the substrate 5 after the solder cooling becomes a predetermined value d3 along with the determination of the melting of the solder. Then, the heater 11 is turned off to release the suction of the chip 1 and cool the solder (from t4 to t6). Accordingly, the piston portion of the tip holding means 17 moves up and down in the pressurizing means 15 by heating of the heater 11 and melting of the solder, and the position detecting means 23 detects the position of the piston portion of the tip holding means 17. The driving means 22 controls the Z-axis feeding device 3 based on the detection result.

WO2007/066559号公報WO2007 / 065559

しかしながら、位置検出手段23でチップ保持手段17のピストン部分の位置を検出しながらZ軸送り装置3を駆動し加圧付与手段15の位置を制御していると、検出結果が所定値に達するまで次の動作に移れなくなり、動作時間を短縮することが困難になる。そのため、生産タクトタイムが短縮できず生産性を上げることができないという問題が発生する。   However, if the position detection means 23 detects the position of the piston portion of the tip holding means 17 and drives the Z-axis feeding device 3 to control the position of the pressure applying means 15, the detection result until the detection result reaches a predetermined value. It becomes impossible to move to the next operation, and it becomes difficult to shorten the operation time. Therefore, there arises a problem that the production tact time cannot be shortened and the productivity cannot be increased.

本発明は、上記問題点に鑑み、生産タクトタイムを短縮することができ、高い信頼性で集積回路素子などのチップをプリント基板等の基板に実装するチップ実装装置を提供しようとするものである。   In view of the above problems, the present invention is intended to provide a chip mounting apparatus that can shorten the production tact time and mount a chip such as an integrated circuit element on a substrate such as a printed circuit board with high reliability. .

以上の課題を解決するために、請求項1に記載の発明は、
チップを吸着保持するチップ保持手段と、チップ保持手段に加圧力を付与するとともにチップ保持手段を支持する加圧付与手段と、加圧付与手段を装置高さ方向に移動可能にする駆動制御手段とを備え、チップに対向した位置に配した基板の電極にチップのバンプをハンダ接合させるチップ実装装置であって、
チップ保持手段の加熱からチップのバンプの溶融までの間のチップ保持手段の伸び量を予測し、チップ保持手段の伸びの予測値に基づいて駆動制御手段に補正指令を入力して加圧付与手段の高さ位置を制御する予測制御手段を備えたチップ実装装置である。
In order to solve the above problems, the invention described in claim 1
Chip holding means for sucking and holding the chip, pressure applying means for applying pressure to the chip holding means and supporting the chip holding means, and drive control means for moving the pressure applying means in the apparatus height direction; A chip mounting apparatus for soldering the bumps of the chip to the electrodes of the substrate disposed at a position facing the chip,
Predicting the amount of extension of the chip holding means from the heating of the chip holding means to the melting of the bumps of the chip, and applying a correction command to the drive control means based on the predicted value of the elongation of the chip holding means to apply pressure It is the chip | tip mounting apparatus provided with the prediction control means which controls the height position of this.

請求項2に記載の発明は、請求項1に記載の発明において、
前記予測制御手段が、さらにチップ保持手段の加熱を停止したときにチップ保持手段の縮み量を予測し、チップ保持手段の縮みの予測値に基づいて駆動制御手段に補正指令を入力して加圧付与手段の高さ位置を制御する予測制御手段であるチップ実装装置である。
The invention according to claim 2 is the invention according to claim 1,
The prediction control means predicts the amount of shrinkage of the chip holding means when the heating of the chip holding means is further stopped, and inputs a correction command to the drive control means based on the predicted shrinkage value of the chip holding means and pressurizes It is a chip mounting apparatus which is a prediction control means for controlling the height position of the applying means.

請求項3に記載の発明は、請求項1もしくは2に記載の発明において、
前記加圧付与手段がシリンダーチューブで、前記チップ保持手段が前記シリンダーチューブの内部を移動するピストンとロッドから構成され前記シリンダーチューブの上下に設けられたエアー供給ポートから供給されるエアーにより前記ピストンに作用する微弱な圧力を調整できる構成であるチップ実装装置である。
The invention according to claim 3 is the invention according to claim 1 or 2,
The pressure applying means is a cylinder tube, and the tip holding means is composed of a piston and a rod that move inside the cylinder tube, and is supplied to the piston by air supplied from air supply ports provided above and below the cylinder tube. It is a chip mounting apparatus that is configured to be able to adjust the weak pressure that acts.

請求項4に記載の発明は、請求項1から3のいずれかに記載の発明において、
事前にチップ保持手段を単体で加熱および加熱を停止し、加圧付与手段の内部を移動するチップ保持手段の移動量を伸縮量として計測し、該伸縮量が伸縮量記憶手段に記憶されており、前記伸縮量記憶手段に記憶されている伸縮量に基づいて予測制御手段から駆動制御手段に入力する補正指令が演算される構成を備えたチップ実装装置である。
The invention according to claim 4 is the invention according to any one of claims 1 to 3,
The tip holding means is heated and stopped in advance, the amount of movement of the tip holding means moving inside the pressurizing means is measured as the amount of expansion / contraction, and the amount of expansion / contraction is stored in the amount of expansion / contraction storage means. The chip mounting apparatus includes a configuration in which a correction command input from the prediction control unit to the drive control unit is calculated based on the expansion / contraction amount stored in the expansion / contraction amount storage unit.

請求項1に記載の発明によれば、予測制御手段がチップ保持手段の加熱からチップのバンプの溶融までの間のチップ保持手段の伸び量を予測し、チップ保持手段の伸びの予測値に基づいて駆動制御手段に補正指令を入力して加圧付与手段の高さ位置を制御しているので、チップ保持手段の位置を検出しながら検出結果に基づいて次の動作を行う従来のチップ実装方法の、加圧付与手段の高さ位置を一定にしている時間が短縮され、生産タクトタイムを短縮することができる。   According to the first aspect of the present invention, the prediction control means predicts the elongation amount of the chip holding means between the heating of the chip holding means and the melting of the bumps of the chip, and based on the predicted value of the elongation of the chip holding means. A conventional chip mounting method for performing the next operation based on the detection result while detecting the position of the chip holding means since the correction command is input to the drive control means to control the height position of the pressure applying means. The time during which the height position of the pressure applying means is kept constant is shortened, and the production tact time can be shortened.

請求項2に記載の発明によれば、チップ保持手段の加熱の停止とともに、時間的に徐々に変化するチップ保持手段の縮みの予測値に基づいて加圧付与手段の位置を制御しているのでチップに加わる加圧力を一定に保ちながらハンダバンプの冷却を進めることができる。また、ハンダバンプの冷却によりチップと基板間に収縮力が発生するが、チップ保持手段の縮みの予測値に基づいて加圧付与手段の位置を制御しているので、チップと基板間の収縮力が緩和されハンダバンプの破損を防止することができる。さらに、ハンダバンプの形状を均一にして高品質なハンダ接合をすることができる。   According to the second aspect of the present invention, the position of the pressurizing unit is controlled based on the predicted value of the shrinkage of the chip holding unit that changes gradually with time when the heating of the chip holding unit is stopped. The solder bump can be cooled while keeping the pressure applied to the chip constant. In addition, a shrinkage force is generated between the chip and the substrate due to the cooling of the solder bumps, but since the position of the pressure applying unit is controlled based on the predicted shrinkage of the chip holding unit, the contraction force between the chip and the substrate is reduced. The solder bumps can be prevented from being damaged. Furthermore, the solder bumps can have a uniform shape and high-quality solder bonding can be performed.

請求項3に記載の発明によれば、シリンダーチューブの上下に設けられたエアー供給ポートから供給されるエアーによりチップ保持手段のピストンに作用する圧力を微弱にすることができる。そのため、ハンダバンプの溶融の際もハンダバンプが破損しない圧力をチップ保持手段に付与することができる。   According to invention of Claim 3, the pressure which acts on the piston of a chip | tip holding means with the air supplied from the air supply port provided in the upper and lower sides of the cylinder tube can be made weak. Therefore, even when the solder bump is melted, a pressure that does not damage the solder bump can be applied to the chip holding means.

請求項4に記載の発明によれば、事前にチップ保持手段の伸縮特性を伸縮量記憶手段に記憶しているので、実際のチップ実装の際にはチップ保持手段の位置を検出し、検出結果に基づいて加圧付与手段を動作させなくてもよい。そのため、生産タクトタイムを短縮することができる。   According to the invention described in claim 4, since the expansion / contraction characteristics of the chip holding means are stored in advance in the expansion / contraction amount storage means, the position of the chip holding means is detected at the time of actual chip mounting, and the detection result The pressurizing means need not be operated based on the above. Therefore, production tact time can be shortened.

以下、図面を参照して本発明の実施の形態を説明する。なお、背景技術で用いた部材の符号はそのまま使用する。   Embodiments of the present invention will be described below with reference to the drawings. In addition, the code | symbol of the member used by background art is used as it is.

図1は、本実施の形態に係るチップ実装装置の正面図である。チップ実装装置に備えられたZ軸送り装置3は、装置フレーム9に装着されたサーボモータ6で送り機構7(例えば、ボールネジ)を回転させ、これを螺合させたスライダー8を、装置フレーム9に装着されたガイドレール10で案内して昇降させている。加圧付与手段15は、スライダー8に連結されたブラケット16に装着されている。サーボモータ6にはエンコーダ13がマウントされており位置制御ができるようになっている。サーボモータ6の位置制御を行うことにより加圧付与手段15の装置高さに対する高さ位置を調整できるようになっている。高さ位置の測定は、サーボモータ6にマウントされているエンコーダ13で行ってもよいし、ガイドレール10に別途リニアセンサを設けて行ってもよい。   FIG. 1 is a front view of the chip mounting apparatus according to the present embodiment. The Z-axis feeding device 3 provided in the chip mounting apparatus rotates a feeding mechanism 7 (for example, a ball screw) by a servo motor 6 mounted on the device frame 9, and a slider 8 screwed with this is used as a device frame 9. The guide rail 10 is attached to the guide rail 10 and is moved up and down. The pressure applying means 15 is attached to a bracket 16 connected to the slider 8. An encoder 13 is mounted on the servo motor 6 so that position control can be performed. By controlling the position of the servo motor 6, the height position of the pressure applying means 15 relative to the apparatus height can be adjusted. The measurement of the height position may be performed by the encoder 13 mounted on the servo motor 6 or may be performed by separately providing a linear sensor on the guide rail 10.

加圧付与手段15は、エアーシリンダーのシリンダーチューブ33で構成されている。チップ保持手段17の上部は、前記エアーシリンダーのピストン34とロッド35とで構成されており加圧付与手段15の内部を上下動し得るように装着されている。チップ保持手段17は、一般にエアーベアリングと呼ばれている静圧空気軸受18を介して加圧付与手段15に装着されている。チップ保持手段17の下端には、加熱手段としてのヒータ11とチップ1を吸着保持するツール2が備えられている。ツール2にはチップ吸着孔24が備えられており、チップ1を吸着保持している。ツール2は吸着保持するチップ1のサイズに合わせて交換できるようになっている。基板5は、基板吸着孔25を備えた基板保持ステージ4に保持されている。   The pressure applying means 15 is composed of a cylinder tube 33 of an air cylinder. The upper part of the chip holding means 17 is composed of a piston 34 and a rod 35 of the air cylinder, and is mounted so as to move up and down in the pressurizing application means 15. The chip holding means 17 is attached to the pressurizing application means 15 via a static pressure air bearing 18 generally called an air bearing. At the lower end of the chip holding means 17, a heater 11 as a heating means and a tool 2 for sucking and holding the chip 1 are provided. The tool 2 is provided with a chip suction hole 24 and holds the chip 1 by suction. The tool 2 can be exchanged according to the size of the chip 1 to be sucked and held. The substrate 5 is held by the substrate holding stage 4 having the substrate suction holes 25.

加圧付与手段15には、上下に2つのエアー供給ポートがある。上側のエアー供給ポートが加圧ポート19であり、下側のエアー供給ポートがバランス圧ポート20である。加圧ポート19にはポンプ30からのエアーが圧力調整手段27aを介して接続されている。圧力調整手段27aは加圧ポート圧力制御手段28の信号に基づいて、加圧ポート19の圧力を制御する。また、バランス圧ポート20にはポンプ30からのエアーが圧力調整手段27bを介して接続されている。圧力調整手段27bはバランス圧ポート圧力制御手段29の信号に基づいて、バランス圧ポート20の圧力を制御する。これら加圧ポート19及びバランス圧ポート20からそれぞれ圧力制御可能な圧力調整手段27a、27bによって調整された圧力P1、圧力P2が供給され加圧エアー同士の差圧でチップ保持手段17のピストン34に付与される圧力を制御することができる。そのため、チップ保持手段17に吸着保持されるチップ1に対して微弱な加圧制御ができるようになっている。例えば、チップ1のハンダバンプが加熱され溶融する際でもハンダバンプを破損することがない微弱な圧力を付与することができる。チップ1へ加圧力の変化や、チップ1の高さの変化でハンダの溶融を検知する場合、チップ1にかかる圧力がハンダバンプに集中するので加圧力の状態によってはハンダバンプを破損(バンプクラッシュ)してしまうおそれがある。そのため、本発明では微弱な圧力を付与しながらハンダの溶融を検知できるようになっている。なお、圧力調整手段27a,27bとしては、電空レギュレータなどが用いられる。   The pressure applying means 15 has two air supply ports at the top and bottom. The upper air supply port is the pressurization port 19, and the lower air supply port is the balance pressure port 20. Air from the pump 30 is connected to the pressurizing port 19 through a pressure adjusting means 27a. The pressure adjusting unit 27 a controls the pressure of the pressurizing port 19 based on a signal from the pressurizing port pressure control unit 28. In addition, air from the pump 30 is connected to the balance pressure port 20 via a pressure adjusting means 27b. The pressure adjusting unit 27 b controls the pressure of the balance pressure port 20 based on the signal from the balance pressure port pressure control unit 29. Pressures P1 and P2 adjusted by pressure adjusting means 27a and 27b capable of controlling pressure are supplied from the pressure port 19 and the balance pressure port 20, respectively, and are supplied to the piston 34 of the chip holding means 17 by the differential pressure between the pressurized air. The applied pressure can be controlled. Therefore, weak pressure control can be performed on the chip 1 held by suction by the chip holding means 17. For example, it is possible to apply a weak pressure that does not damage the solder bump even when the solder bump of the chip 1 is heated and melted. When detecting the melting of the solder by the change in the applied pressure to the chip 1 or the change in the height of the chip 1, the pressure applied to the chip 1 is concentrated on the solder bump, so the solder bump may be damaged depending on the state of the applied pressure (bump crash). There is a risk that. For this reason, in the present invention, melting of solder can be detected while applying a weak pressure. An electro-pneumatic regulator or the like is used as the pressure adjusting means 27a and 27b.

加圧付与手段17の上端位置には位置検出手段23(例えば、渦電流式センサ等)が備えられチップ保持手段17のピストン34の位置を検出している。   A position detecting means 23 (for example, an eddy current sensor or the like) is provided at the upper end position of the pressure applying means 17 to detect the position of the piston 34 of the tip holding means 17.

駆動制御手段22には、加圧ポート圧力制御手段28およびバランス圧ポート制御手段29が接続され、設定された加圧力がチップ1に加わるように加圧付与手段15の圧力制御を行っている。また、駆動制御手段22には、後述する伸縮量記憶手段31と予測制御手段32と位置検出手段23が接続され、Z軸送り装置3のサーボモータ6の位置制御を行っている。また、伸縮量記憶手段31と予測制御手段32は接続され、伸縮量記憶手段31に記憶されているデータを予測制御手段32に転送できるようになっている。   A pressurization port pressure control means 28 and a balance pressure port control means 29 are connected to the drive control means 22, and pressure control of the pressurization applying means 15 is performed so that the set pressure is applied to the chip 1. The drive control unit 22 is connected to an expansion / contraction amount storage unit 31, a prediction control unit 32, and a position detection unit 23, which will be described later, and performs position control of the servo motor 6 of the Z-axis feeding device 3. Further, the expansion / contraction amount storage means 31 and the prediction control means 32 are connected so that data stored in the expansion / contraction amount storage means 31 can be transferred to the prediction control means 32.

次に、伸縮量記憶手段31へ記憶されるデータについて説明する。   Next, data stored in the expansion / contraction amount storage unit 31 will be described.

チップ1の基板5へのハンダ接合の前に、位置検出手段23を用いて、予めチップ保持手段17の熱膨張による位置の変化を測定する。まず、チップ1と基板5がない状態(吸着保持していない状態)でチップ保持手段17が所定の加圧力になるように加圧ポート19とバランス圧ポート20の圧力を調整する。次に、チップ保持手段17の下端に装着されているツール2が基板保持ステージ4に接触するように、加圧付与手段15をZ軸送り装置3を用いて下降させる。   Prior to solder bonding of the chip 1 to the substrate 5, position change due to thermal expansion of the chip holding means 17 is measured in advance using the position detection means 23. First, the pressures of the pressure port 19 and the balance pressure port 20 are adjusted so that the chip holding means 17 has a predetermined applied pressure in a state where the chip 1 and the substrate 5 are not present (in a state where the chip 5 is not sucked and held). Next, the pressure applying unit 15 is lowered using the Z-axis feeding device 3 so that the tool 2 mounted on the lower end of the chip holding unit 17 contacts the substrate holding stage 4.

次に、ツール2に備えられたヒータ11を通電し設定温度まで昇温し、チップ保持手段17の単体の伸び量を昇温時間の経過とともに位置検出手段23で測定する。測定した値は、伸縮量記憶手段31に、伸び量と経過時間のセットで複数ポイント記憶される。例えば図2の(a)に示すように、(伸び量Lup1,経過時間Tup1)、(伸び量Lup2,経過時間Tup2)、・・・、(伸び量Lupn,経過時間Tupn)、のように複数のデータが記憶される。   Next, the heater 11 provided in the tool 2 is energized to raise the temperature to the set temperature, and the amount of single extension of the chip holding means 17 is measured by the position detection means 23 as the temperature rises. A plurality of measured values are stored in the expansion / contraction amount storage means 31 as a set of elongation amount and elapsed time. For example, as shown in FIG. 2A, there are a plurality of such as (elongation amount Lup1, elapsed time Tup1), (elongation amount Lup2, elapsed time Tup2),..., (Elongation amount Lupn, elapsed time Tupn). Are stored.

次に、ヒータ11をOFFしチップ保持手段17の冷却に伴う縮み量を冷却時間の経過とともに位置検出手段23で測定する。伸び量の測定と同様に、伸縮量記憶手段31に縮み量と経過時間のセットで複数ポイント記憶される。例えば図2の(b)に示すように、(縮み量Ldw1,経過時間Tdw1)、(縮み量Ldw2,経過時間Tdw2)、・・・、(縮み量Ldwn,経過時間Tdwn)、のように複数のデータが記憶される。   Next, the heater 11 is turned off, and the amount of shrinkage accompanying cooling of the chip holding means 17 is measured by the position detection means 23 as the cooling time elapses. Similar to the measurement of the elongation amount, a plurality of points are stored in the expansion / contraction amount storage means 31 as a set of the shrinkage amount and the elapsed time. For example, as shown in FIG. 2 (b), a plurality of contraction amounts Ldw1, elapsed time Tdw1, (contraction amount Ldw2, elapsed time Tdw2),... Are stored.

このように、チップ保持手段17の伸び縮み量の特性を予め測定し伸縮量記憶手段に記憶しているので、ヒータ11のONおよびOFFのタイミングに合わせてチップ保持手段17の伸び縮み量を精度良く推測することができる。そのため、チップ1の基板5へのハンダ接合時に、位置検出手段23で加圧付与手段15の内部を移動するチップ保持手段17の位置を検出しながら、検出結果に基づいて次の動作を判断しなくてもよい。   As described above, the expansion / contraction amount characteristic of the chip holding unit 17 is measured in advance and stored in the expansion / contraction amount storage unit. I can guess well. Therefore, when the chip 1 is soldered to the substrate 5, the position detection unit 23 detects the position of the chip holding unit 17 that moves inside the pressure applying unit 15 and determines the next operation based on the detection result. It does not have to be.

なお、伸縮量記憶手段31に記憶されるデータは、予めチップ保持手段17を加熱および冷却して測定結果を記憶させてもよいが、操作者の知見などから補正しても良いし、任意のデータを個別に入力しても良い。   The data stored in the expansion / contraction amount storage means 31 may be stored in advance by heating and cooling the tip holding means 17, but may be corrected based on the operator's knowledge, etc. Data may be entered individually.

次に、図3に示すタイムチャートを用いてチップ実装装置の動作について説明する。図3において(A)に示すタイムチャートはチップ1の実装における加圧付与手段15の装置高さに対する高さ位置を示したものであり、チップ1のバンプ1aの下端部が基板5の電極5aに当接した位置を基準高さ(図3のh0)としている。図3において(B)に示すタイムチャートは、加圧付与手段15の内部のチップ保持手段17のピストン34の位置を示したものであり、チップ保持手段17のピストン34の下端が加圧付与手段15と接触した位置を図中の下端位置として表記している。図3において(C)に示すタイムチャートは、ツール2のヒータ11の通電のON−OFFのタイミングを示している。図3において(D)に示すタイムチャートは、チップ1のバンプ1aおよび基板5の電極5aにかかる加圧力(荷重)を示している。   Next, the operation of the chip mounting apparatus will be described using the time chart shown in FIG. In FIG. 3, the time chart shown in FIG. 3A shows the height position with respect to the device height of the pressure applying means 15 in mounting the chip 1, and the lower end of the bump 1 a of the chip 1 is the electrode 5 a of the substrate 5. The reference height (h0 in FIG. 3) is the position in contact with. The time chart shown in FIG. 3B shows the position of the piston 34 of the tip holding means 17 inside the pressurizing means 15, and the lower end of the piston 34 of the tip holding means 17 is the pressurizing means. The position in contact with 15 is shown as the lower end position in the figure. In FIG. 3, a time chart shown in (C) shows ON / OFF timing of energization of the heater 11 of the tool 2. A time chart shown in FIG. 3D shows the pressure (load) applied to the bump 1 a of the chip 1 and the electrode 5 a of the substrate 5.

チップ1と基板5のハンダ接合を開始しようとする初期状態において、加圧付与手段15は上昇位置にある(図3のt0のタイミングにおける高さh1)。   In an initial state in which solder bonding between the chip 1 and the substrate 5 is about to start, the pressurizing means 15 is in the raised position (height h1 at the timing t0 in FIG. 3).

次に、加圧ポート圧力制御手段28とバランス圧ポート圧力制御手段29に、駆動制御手段22より設定圧力の指令を行う。指令にもとづき加圧ポート圧力制御手段28が圧力調整手段27aを圧力制御し、バランス圧ポート圧力制御手段29が圧力調整手段27bを圧力制御し、設定圧力が加圧付与手段15の内部を移動するチップ保持手段17のピストン34に作用する。ピストン34に作用する圧力は、ハンダバンプの溶融の際もバンプが破損しない微弱な圧力を設定する。   Next, the set pressure command is issued from the drive control means 22 to the pressurization port pressure control means 28 and the balance pressure port pressure control means 29. Based on the command, the pressurizing port pressure control means 28 controls the pressure adjusting means 27a, the balance pressure port pressure control means 29 controls the pressure adjusting means 27b, and the set pressure moves inside the pressurizing application means 15. It acts on the piston 34 of the tip holding means 17. The pressure acting on the piston 34 is set to a weak pressure at which the bump is not damaged even when the solder bump is melted.

次に、駆動制御手段22の指令にもとづきZ軸送り装置3が作動することにより、加圧付与手段15が、チップ1を吸着保持したツール2と一体となって下降する。下降の途中でチップ1のバンプ1aが基板5の電極5aに接触する(図3のt1)。   Next, when the Z-axis feeding device 3 is operated based on a command from the drive control means 22, the pressurizing application means 15 is lowered integrally with the tool 2 that holds the chip 1 by suction. The bump 1a of the chip 1 comes into contact with the electrode 5a of the substrate 5 during the downward movement (t1 in FIG. 3).

さらに、Z軸送り装置3による加圧付与手段15の送りが続行され、チップ保持手段17のピストン34が加圧付与手段15に対して相対的に上昇する(図3のt1からt2)。   Further, the feeding of the pressurizing means 15 by the Z-axis feeding device 3 is continued, and the piston 34 of the tip holding means 17 rises relative to the pressurizing means 15 (from t1 to t2 in FIG. 3).

次に、Z軸送り装置3の送り量が予め設定した値d1(バンプ押し込み量)になると加圧付与手段15の下降を停止する(図3のt2)。   Next, when the feed amount of the Z-axis feed device 3 reaches a preset value d1 (bump pushing amount), the descent of the pressurizing means 15 is stopped (t2 in FIG. 3).

次に、ツール2のヒータ11に通電してチップ1のバンプ1aをハンダ溶融点以上の温度に加熱する。加熱にあわせてZ軸送り装置3を駆動制御し、加圧付与手段15を上昇させる。Z軸送り装置3の駆動制御は、次のように行う。まず、伸縮量記憶手段31に記憶されているチップ保持手段17の伸び量と経過時間のデータを予測制御手段32に転送する。次に、予測制御手段32でヒータ11の通電タイミングに合わせてZ軸送り装置3の駆動量が計算される。次に、予測制御手段32から駆動制御手段22に計算結果が入力され駆動制御手段22からの指令に基づきZ軸送り装置3が駆動されるようになっている。   Next, the heater 11 of the tool 2 is energized to heat the bump 1a of the chip 1 to a temperature equal to or higher than the solder melting point. The Z-axis feeding device 3 is driven and controlled in accordance with the heating, and the pressure applying means 15 is raised. The drive control of the Z-axis feeding device 3 is performed as follows. First, the extension amount and elapsed time data of the chip holding means 17 stored in the expansion / contraction amount storage means 31 are transferred to the prediction control means 32. Next, the driving amount of the Z-axis feeding device 3 is calculated by the prediction control means 32 in accordance with the energization timing of the heater 11. Next, a calculation result is inputted from the prediction control means 32 to the drive control means 22, and the Z-axis feeding device 3 is driven based on a command from the drive control means 22.

そのため、加圧付与手段15がチップ保持手段17の伸びの予測値に基づいて上昇するので、図3の(B)t2からt2’に示されるヒータ11の昇温によるチップ保持手段17の伸びが発生する区間では、チップ保持手段17の加圧付与手段15の内部における位置が変化しない。続いて、チップ1と基板5がハンダ冷却後に所定のギャップ高さになるようにZ軸送り装置3を駆動制御して加圧付与手段15を所定高さ(d3)まで上昇させる(図3の(B)のt2’からt3の区間)。   For this reason, the pressure applying means 15 rises based on the predicted value of the elongation of the chip holding means 17, so that the elongation of the chip holding means 17 due to the temperature rise of the heater 11 shown from t 2 to t 2 ′ in FIG. In the generated section, the position of the chip holding means 17 inside the pressure applying means 15 does not change. Subsequently, the Z-axis feeding device 3 is driven and controlled so that the chip 1 and the substrate 5 have a predetermined gap height after the solder is cooled, and the pressurizing means 15 is raised to a predetermined height (d3) (FIG. 3). (B) t2 ′ to t3).

このように、ヒータ11の通電開始からZ軸送り装置を駆動制御して加圧付与手段15を上昇させ、ハンダの溶融開始を監視する段階でハンダ冷却後のチップ1と基板5のギャップ高さに加圧付与手段15を位置決めしているので、ハンダの溶融を検出してから加圧付与手段15をチップ1と基板5のギャップ高さに移動している従来のチップ実装装置に比べて加圧付与手段15の移動時間を短縮することができる。これは、加圧付与手段15の内部のチップ保持手段17の位置を位置検出手段23で検出しなくても、伸縮量記憶手段31のデータに基づき予測制御手段32がチップ保持手段17の伸び量を予測して、予測値に基づいてZ軸送り装置3を駆動しているためである。   Thus, the gap height between the chip 1 and the substrate 5 after the solder cooling is performed at the stage where the pressurization applying means 15 is raised by driving and controlling the Z-axis feeding device from the start of energization of the heater 11 and the start of melting of the solder is monitored. Since the pressurizing means 15 is positioned on the surface, the pressurizing means 15 is added to the gap height between the chip 1 and the substrate 5 after detecting the melting of the solder. The moving time of the pressure applying means 15 can be shortened. Even if the position of the tip holding means 17 inside the pressure applying means 15 is not detected by the position detecting means 23, the prediction control means 32 is based on the data in the expansion / contraction amount storage means 31 and the extension amount of the tip holding means 17. This is because the Z-axis feeding device 3 is driven based on the predicted value.

その後、チップ1のバンプ1aの溶融が開始し、溶融に伴いチップ保持手段17が下降する(図3のt4)。位置検出手段23がチップ保持手段17の下降を検出すると所定時間が経過した後、ヒータ11の通電がOFFする(図3のt5)。ヒータ11の通電のOFFにともない、チップ保持手段17の冷却が開始され縮み始める。   Thereafter, the melting of the bump 1a of the chip 1 is started, and the chip holding means 17 is lowered along with the melting (t4 in FIG. 3). When the position detecting unit 23 detects the lowering of the chip holding unit 17, the energization of the heater 11 is turned off after a predetermined time has elapsed (t5 in FIG. 3). As the energization of the heater 11 is turned off, the cooling of the chip holding means 17 is started and starts to shrink.

次に、チップ保持手段17の縮みの予測値に基づいてZ軸送り装置3を駆動し、加圧付与手段15を下降させる。Z軸送り装置3の駆動制御は、伸縮量記憶手段31に記憶されているチップ保持手段17の伸び量と経過時間のデータを予測制御手段32に転送し、予測制御手段32でヒータ11の通電OFFのタイミングに合わせてZ軸送り装置3の駆動量が計算された後、予測制御手段32から駆動制御手段22に計算結果が入力され、駆動制御手段22の指令に基づきZ軸送り装置3が駆動されるようになっている。   Next, the Z-axis feeding device 3 is driven based on the predicted shrinkage value of the chip holding means 17, and the pressure applying means 15 is lowered. The drive control of the Z-axis feeding device 3 is performed by transferring the extension amount and elapsed time data of the chip holding means 17 stored in the expansion / contraction amount storage means 31 to the prediction control means 32, and the prediction control means 32 energizing the heater 11. After the driving amount of the Z-axis feeding device 3 is calculated in accordance with the OFF timing, the calculation result is input from the prediction control unit 32 to the driving control unit 22, and the Z-axis feeding device 3 is operated based on a command from the driving control unit 22. It is designed to be driven.

チップ1がツール2に吸着保持された状態で、チップ保持手段17の冷却が開始すると、チップ保持手段17の縮みによる応力がチップ1のバンプ1aに作用してしまい、バンプ1aが破断してしまう可能性がある。そのため、図4に示すように、チップ保持手段17の縮みの予測値に基づいてZ軸送り装置3を駆動制御して加圧付与手段15を下降させる。このようにZ軸送り装置3を制御することによりバンプ1aの破断を防止し、チップ1と基板5の冷却後のギャップを所定値d3に維持できるようにしている。   When cooling of the chip holding means 17 is started in a state where the chip 1 is held by suction with the tool 2, the stress due to the shrinkage of the chip holding means 17 acts on the bump 1a of the chip 1 and the bump 1a is broken. there is a possibility. Therefore, as shown in FIG. 4, the Z-axis feeding device 3 is driven and controlled based on the predicted shrinkage value of the tip holding unit 17 to lower the pressurizing unit 15. By controlling the Z-axis feeding device 3 in this way, the bump 1a is prevented from being broken, and the gap after cooling the chip 1 and the substrate 5 can be maintained at a predetermined value d3.

次に、ヒータ11の通電OFFから所定時間後に、チップ1の吸着保持を解除してZ軸送り装置3を動作させ加圧付与手段15を上昇させる(図3のt6)。吸着保持を解除するタイミングは、伸縮量記憶手段31に記憶されているチップ保持手段17の縮み量と経過時間のデータに基づいて行われる。チップ保持手段17が周囲温度まで冷却される時間までチップ1を吸着保持してると生産タクトタイムが伸びてしまう。また、ヒータ11の通電OFFのタイミングでチップ1の吸着保持を解除すると、バンプ1aの形状が不安定となる。そのため、伸縮量記憶手段31に記憶されているチップ保持手段17の縮み量と経過時間のデータから、最適なタイミング(バンプ1aの形状が良好で、破断が発生しないタイミング)を選択しチップ保持手段17によるチップ1の吸着保持の解除を行う。   Next, after a predetermined time has passed since the heater 11 is turned off, the suction holding of the chip 1 is released, the Z-axis feeding device 3 is operated, and the pressurizing unit 15 is raised (t6 in FIG. 3). The timing for releasing the suction holding is performed based on the shrinkage amount and elapsed time data of the chip holding means 17 stored in the expansion / contraction amount storage means 31. If the chip 1 is sucked and held until the chip holding means 17 is cooled to the ambient temperature, the production tact time is extended. Further, when the suction holding of the chip 1 is released at the timing when the heater 11 is turned off, the shape of the bump 1a becomes unstable. Therefore, an optimum timing (timing at which the shape of the bump 1a is good and no breakage occurs) is selected from the shrinkage amount and elapsed time data of the chip holding means 17 stored in the expansion / contraction amount storage means 31, and the chip holding means. The suction holding of the chip 1 by 17 is released.

以上の動作でチップ1と基板5の一連のハンダ接合が完了する。   With the above operation, a series of solder joints between the chip 1 and the substrate 5 is completed.

このように、予めチップ保持手段17の伸び量と縮み量を伸縮量記憶手段31に記憶し、この記憶された値をもとに実際のチップ1と基板5のハンダ接合の際、チップ保持手段17の伸び縮みを予測制御手段32で予測して駆動制御手段22に補正指令を入力して加圧付与手段15の高さ位置を制御している。そのため、加圧付与手段15の内部のチップ保持手段17の位置を位置検出信号の検出し、検出結果に基づいて加圧付与手段15を動作させるよりも生産タクトタイムを短くすることができる。   Thus, the amount of expansion and contraction of the chip holding means 17 is stored in advance in the expansion / contraction amount storage means 31, and the chip holding means is used when the actual chip 1 and the substrate 5 are soldered together based on the stored value. 17 is predicted by the prediction control means 32 and a correction command is input to the drive control means 22 to control the height position of the pressure applying means 15. Therefore, the production tact time can be made shorter than the position of the chip holding means 17 inside the pressure applying means 15 is detected by the position detection signal and the pressure applying means 15 is operated based on the detection result.

本発明においてチップ1とは、例えば、ICチップ、半導体チップ、光素子、表面実装部品、ウエハなど、その種類や大きさに関係なく、基板5に対して接合される対象物をいう。また、基板5とは、その種類や大きさに関係なく、チップ1に接合させる相手方の対象物をいう。   In the present invention, the chip 1 refers to an object to be bonded to the substrate 5, for example, an IC chip, a semiconductor chip, an optical element, a surface mount component, a wafer or the like regardless of the type or size. In addition, the substrate 5 refers to a target object to be bonded to the chip 1 regardless of the type or size.

また、基板保持ステージ4の上面に基板5を保持(又は支持)する手段は、基板吸着孔25による吸着保持手段、静電気による静電保持手段、磁石や磁気などによる磁気保持手段、複数の可動爪によって基板を掴む機械的手段、単数又は複数の可動爪によって基板を押さえる機械的手段など、いかなる形態の保持手段であってもよい。   The means for holding (or supporting) the substrate 5 on the upper surface of the substrate holding stage 4 includes suction holding means by the substrate suction holes 25, electrostatic holding means by static electricity, magnetic holding means by magnets and magnetism, and a plurality of movable claws. It may be any form of holding means, such as mechanical means for gripping the substrate by means of, or mechanical means for holding the substrate by one or more movable claws.

また、基板保持ステージ4についても、必要に応じて、固定型、可動型のいずれに設けてもよく、かつ、可動型に設ける場合においては、平行移動制御、回転制御、昇降制御、平行移動制御と回転制御、平行移動制御と昇降制御、回転制御と昇降制御、平行移動制御と回転制御と昇降制御、等のように各種態様に制御し得るように設けても良い。   Further, the substrate holding stage 4 may be provided in either a fixed type or a movable type as required, and in the case of being provided in the movable type, parallel movement control, rotation control, elevation control, parallel movement control. And rotation control, parallel movement control and elevation control, rotation control and elevation control, parallel movement control and rotation control and elevation control, and the like.

また、チップ1に設けられたバンプ1aとは、例えば、ハンダバンプ、スタッドバンプなど、基板5に設けられた電極5a(例えば、電極、ダミー電極など)と接合される対象物である。また、基板5に設けられた電極5aとは、例えば、配線を伴った電極、配線につながっていないダミー電極など、チップ1に設けられているバンプ1a(例えば、ハンダバンプ、スタッドバンプなど)と接合される相手方の対象物をいう。   The bumps 1a provided on the chip 1 are objects to be bonded to electrodes 5a (for example, electrodes, dummy electrodes, etc.) provided on the substrate 5, such as solder bumps and stud bumps. Further, the electrode 5a provided on the substrate 5 is bonded to bumps 1a (for example, solder bumps, stud bumps, etc.) provided on the chip 1, such as electrodes with wiring, dummy electrodes not connected to the wiring, etc. This refers to the object of the opponent to be used.

また、送り機構7及びZ軸送り装置3についても、例えば、ボールネジ型やリニアモータ型等、スライダー8を移動させ得る限りにおいては、いかなる型式のものであってもよい。   The feed mechanism 7 and the Z-axis feed device 3 may be of any type as long as the slider 8 can be moved, such as a ball screw type or a linear motor type.

また、本発明においていうチップ実装装置とは、チップを搭載するマウント装置やチップを接合するボンディング装置に加えて、例えば、基板とチップ、基板と接着材(ACF(Anisotropic Conductive Film)、NCF(Non Conductive Film)など)等、予め対象物同士が接触(搭載または仮圧着など)されたものを加圧、加熱及び/又は振動手段(超音波、ピエゾ素子、磁歪素子、ボイスコイルなど)によって固着又は転写させる装置を包含する広い概念の装置をいう。   The chip mounting apparatus in the present invention refers to, for example, a substrate and a chip, a substrate and an adhesive (ACF (Anisotropic Conductive Film), NCF (Non Conductive Film) etc.), etc., which have been previously brought into contact with each other (mounted or provisional press-bonded, etc.) or fixed by pressing, heating and / or vibration means (ultrasonic, piezo element, magnetostrictive element, voice coil, etc.) A broad concept device including a transfer device.

また、上述した実施例では、ツール2にチップ1を保持させた状態でツール2を下降させて、チップ1を基板5に加圧するようにしたが、本発明はこれに限定されない。例えば、チップを接着材などを使って基板上に予め搭載しておき、チップを保持してないツールを下降させて、基板上のチップを加圧するようにしてもよい。この場合、基板上に予め搭載されたチップにツールが接触することにより、ツールとチップが重なって基板に接触することになる。   In the above-described embodiment, the tool 2 is lowered while the chip 1 is held on the tool 2 and the chip 1 is pressed against the substrate 5. However, the present invention is not limited to this. For example, the chip may be mounted on the substrate in advance using an adhesive or the like, and a tool not holding the chip may be lowered to press the chip on the substrate. In this case, when the tool comes into contact with a chip mounted on the substrate in advance, the tool and the chip overlap and come into contact with the substrate.

また、チップ保持手段17の下端に直接、ツール2を装着することに限定されず、必要ならば、ロードセルを介在させてもよい。   Moreover, it is not limited to attaching the tool 2 directly to the lower end of the chip | tip holding | maintenance means 17, If necessary, you may interpose a load cell.

また、位置検出手段23は、渦電流式センサのみに限定されず、他のセンサー(レーザや光センサー等)であってもよい。   Further, the position detecting means 23 is not limited to the eddy current sensor, but may be other sensors (laser, optical sensor, etc.).

また、加圧力が高い場合には、バランス圧ポートを使用しないで、加圧ポートのみで加圧力を制御してもよい。また、位置検出手段23は、チップ保持手段17のピストン34の高さ位置を検出することによってチップ保持手段17の高さ位置を測定するものに限らず、ツール2の高さ位置を直接、検出し得るように装着してもよい。   Further, when the pressurizing force is high, the pressurizing force may be controlled only by the pressurizing port without using the balance pressure port. Further, the position detection means 23 is not limited to measuring the height position of the tip holding means 17 by detecting the height position of the piston 34 of the tip holding means 17 but directly detecting the height position of the tool 2. It may be mounted so as to be able to.

また、実施の形態では、チップ保持手段17の下端に加熱手段としてのヒータ11が備えられているが、ヒータ11を基板保持ステージ4に備えてもよい。チップ1と基板5を効率よく加熱できる構成であればよく、加熱に伴うツール2の熱膨張によるZ軸方向の伸びは位置検出手段23で検出することができる。さらに、ツール2側および基板保持ステージ4側の両方にヒータを備えてもよい。これにより、チップ1と基板5の加温を短時間にでき、更にセラミックヒータを用いたパルスヒータで加熱を行うと応答性のよい昇温が可能となる。   In the embodiment, the heater 11 as the heating unit is provided at the lower end of the chip holding unit 17, but the heater 11 may be provided in the substrate holding stage 4. Any configuration is possible as long as the chip 1 and the substrate 5 can be efficiently heated, and the position detection means 23 can detect the elongation in the Z-axis direction due to the thermal expansion of the tool 2 accompanying the heating. Furthermore, heaters may be provided on both the tool 2 side and the substrate holding stage 4 side. As a result, heating of the chip 1 and the substrate 5 can be performed in a short time, and if the heating is further performed by a pulse heater using a ceramic heater, it is possible to raise the temperature with good responsiveness.

本発明の実施の形態に係るチップ実装装置の正面図である。It is a front view of the chip mounting apparatus which concerns on embodiment of this invention. チップ保持手段の伸び量と縮み量を示すグラフである。It is a graph which shows the amount of expansion | extension and shrinkage | contraction of a chip | tip holding means. 本発明の実施の形態に係るチップ実装装置の動作タイムチャートである。It is an operation | movement time chart of the chip mounting apparatus which concerns on embodiment of this invention. チップ保持手段の縮み量に追従して加圧付与手段を下降させる状態を示した図である。It is the figure which showed the state which follows the amount of shrinkage | contraction of a chip | tip holding | maintenance means, and pressurizes an application means. 従来のチップ実装装置の正面図である。It is a front view of the conventional chip mounting apparatus. 従来のチップ実装装置の動作タイムチャートである。It is an operation | movement time chart of the conventional chip mounting apparatus.

符号の説明Explanation of symbols

1 チップ
1a バンプ
2 ツール
3 Z軸送り装置
4 基板保持ステージ
5 基板
5a 電極
6 サーボモータ
7 送り機構
8 スライダー
9 装置フレーム
10 ガイドレール
11 ヒータ
13 エンコーダ
15 加圧付与手段
16 ブラケット
17 チップ保持手段
18 静圧空気軸受
19 加圧ポート
20 バランス圧ポート
22 駆動制御手段
23 位置検出手段
24 チップ吸着孔
25 基板吸着孔
28 加圧ポート圧力制御手段
29 バランス圧ポート圧力制御手段
30 ポンプ
31 伸縮量記憶手段
32 予測制御手段
33 シリンダーチューブ
34 ピストン
35 ロッド
27a,27b 圧力調整手段
DESCRIPTION OF SYMBOLS 1 Chip 1a Bump 2 Tool 3 Z-axis feeding device 4 Substrate holding stage 5 Substrate 5a Electrode 6 Servo motor 7 Feeding mechanism 8 Slider 9 Device frame 10 Guide rail 11 Heater 13 Encoder 15 Pressurizing means 16 Bracket 17 Chip holding means 18 Static Pressure Air Bearing 19 Pressurization Port 20 Balance Pressure Port 22 Drive Control Means 23 Position Detection Means 24 Chip Adsorption Hole 25 Substrate Adsorption Hole 28 Pressurization Port Pressure Control Means 29 Balance Pressure Port Pressure Control Means 30 Pump 31 Expansion / contraction Amount Storage Means 32 Prediction Control means 33 Cylinder tube 34 Piston 35 Rod 27a, 27b Pressure adjusting means

Claims (4)

チップを吸着保持するチップ保持手段と、チップ保持手段に加圧力を付与するとともにチップ保持手段を支持する加圧付与手段と、加圧付与手段を装置高さ方向に移動可能にする駆動制御手段とを備え、チップに対向した位置に配した基板の電極にチップのバンプをハンダ接合させるチップ実装装置であって、
チップ保持手段の加熱からチップのバンプの溶融までの間のチップ保持手段の伸び量を予測し、チップ保持手段の伸びの予測値に基づいて駆動制御手段に補正指令を入力して加圧付与手段の高さ位置を制御する予測制御手段を備えたチップ実装装置。
Chip holding means for sucking and holding the chip, pressure applying means for applying pressure to the chip holding means and supporting the chip holding means, and drive control means for moving the pressure applying means in the apparatus height direction; A chip mounting apparatus for soldering the bumps of the chip to the electrodes of the substrate disposed at a position facing the chip,
Predicting the amount of extension of the chip holding means from the heating of the chip holding means to the melting of the bumps of the chip, and applying a correction command to the drive control means based on the predicted value of the elongation of the chip holding means to apply pressure A chip mounting apparatus provided with predictive control means for controlling the height position of the chip.
請求項1に記載の発明において、
前記予測制御手段が、さらにチップ保持手段の加熱を停止したときにチップ保持手段の縮み量を予測し、チップ保持手段の縮みの予測値に基づいて駆動制御手段に補正指令を入力して加圧付与手段の高さ位置を制御する予測制御手段であるチップ実装装置。
In the invention of claim 1,
The prediction control means predicts the amount of shrinkage of the chip holding means when the heating of the chip holding means is further stopped, and inputs a correction command to the drive control means based on the predicted shrinkage value of the chip holding means and pressurizes A chip mounting apparatus which is a prediction control means for controlling the height position of the applying means.
請求項1もしくは2に記載の発明において、
前記加圧付与手段がシリンダーチューブで、前記チップ保持手段が前記シリンダーチューブの内部を移動するピストンとロッドから構成され前記シリンダーチューブの上下に設けられたエアー供給ポートから供給されるエアーにより前記ピストンに作用する微弱な圧力を調整できる構成であるチップ実装装置。
In the invention according to claim 1 or 2,
The pressure applying means is a cylinder tube, and the tip holding means is composed of a piston and a rod that move inside the cylinder tube, and is supplied to the piston by air supplied from air supply ports provided above and below the cylinder tube. A chip mounting device that can adjust the weak pressure that acts.
請求項1から3のいずれかに記載の発明において、
事前にチップ保持手段を単体で加熱および加熱を停止し、加圧付与手段の内部を移動するチップ保持手段の移動量を伸縮量として計測し、該伸縮量が伸縮量記憶手段に記憶されており、前記伸縮量記憶手段に記憶されている伸縮量に基づいて予測制御手段から駆動制御手段に入力する補正指令が演算される構成を備えたチップ実装装置。
In the invention according to any one of claims 1 to 3,
The tip holding means is heated and stopped in advance, the amount of movement of the tip holding means moving inside the pressurizing means is measured as the amount of expansion / contraction, and the amount of expansion / contraction is stored in the amount of expansion / contraction storage means. A chip mounting apparatus having a configuration in which a correction command input from the prediction control unit to the drive control unit is calculated based on the expansion / contraction amount stored in the expansion / contraction amount storage unit.
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JP2012094725A (en) * 2010-10-28 2012-05-17 Toray Eng Co Ltd Mounting device and mounting method
JP5178921B2 (en) * 2010-05-19 2013-04-10 パナソニック株式会社 Mounting method and mounting apparatus for semiconductor light emitting device

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9165902B2 (en) * 2013-12-17 2015-10-20 Kulicke And Soffa Industries, Inc. Methods of operating bonding machines for bonding semiconductor elements, and bonding machines

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003031993A (en) * 2001-07-13 2003-01-31 Matsushita Electric Ind Co Ltd Device and method for mounting electronic component
JP2006228780A (en) * 2005-02-15 2006-08-31 Matsushita Electric Ind Co Ltd Method for packaging electronic component
WO2007066559A1 (en) * 2005-12-06 2007-06-14 Toray Engineering Co., Ltd. Chip mounting apparatus and chip mounting method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003031993A (en) * 2001-07-13 2003-01-31 Matsushita Electric Ind Co Ltd Device and method for mounting electronic component
JP2006228780A (en) * 2005-02-15 2006-08-31 Matsushita Electric Ind Co Ltd Method for packaging electronic component
WO2007066559A1 (en) * 2005-12-06 2007-06-14 Toray Engineering Co., Ltd. Chip mounting apparatus and chip mounting method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5178921B2 (en) * 2010-05-19 2013-04-10 パナソニック株式会社 Mounting method and mounting apparatus for semiconductor light emitting device
JPWO2011145278A1 (en) * 2010-05-19 2013-07-22 パナソニック株式会社 Mounting method and mounting apparatus for semiconductor light emitting device
JP2012094725A (en) * 2010-10-28 2012-05-17 Toray Eng Co Ltd Mounting device and mounting method
KR101831389B1 (en) * 2010-10-28 2018-02-22 도레 엔지니아린구 가부시키가이샤 Mounting device and mounting method

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