JP2009515177A5 - - Google Patents
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- JP2009515177A5 JP2009515177A5 JP2008539306A JP2008539306A JP2009515177A5 JP 2009515177 A5 JP2009515177 A5 JP 2009515177A5 JP 2008539306 A JP2008539306 A JP 2008539306A JP 2008539306 A JP2008539306 A JP 2008539306A JP 2009515177 A5 JP2009515177 A5 JP 2009515177A5
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- JP
- Japan
- Prior art keywords
- unit
- scanning
- signal
- multiplexer
- measurement system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000005259 measurement Methods 0.000 claims description 69
- 230000003287 optical effect Effects 0.000 claims description 30
- 238000012937 correction Methods 0.000 claims description 28
- 239000013307 optical fiber Substances 0.000 claims description 13
- 230000005540 biological transmission Effects 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 7
- 238000012545 processing Methods 0.000 claims description 7
- 230000008569 process Effects 0.000 claims description 5
- 238000006243 chemical reaction Methods 0.000 description 7
- 230000033001 locomotion Effects 0.000 description 7
- 238000001514 detection method Methods 0.000 description 5
- 238000009434 installation Methods 0.000 description 5
- 230000001360 synchronised effect Effects 0.000 description 4
- 238000004364 calculation method Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 230000008054 signal transmission Effects 0.000 description 3
- 230000002411 adverse Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 230000002829 reductive effect Effects 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 230000036961 partial effect Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102005053789 | 2005-11-09 | ||
| DE102005053789.8 | 2005-11-09 | ||
| DE102006041357.1 | 2006-09-01 | ||
| DE102006041357A DE102006041357A1 (de) | 2005-11-09 | 2006-09-01 | Positionsmesseinrichtung und Verfahren zum Betrieb einer Positionsmesseinrichtung |
| PCT/EP2006/010525 WO2007054234A1 (de) | 2005-11-09 | 2006-11-02 | Positionsmesssystem |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009515177A JP2009515177A (ja) | 2009-04-09 |
| JP2009515177A5 true JP2009515177A5 (enExample) | 2012-01-26 |
| JP4999856B2 JP4999856B2 (ja) | 2012-08-15 |
Family
ID=37745911
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006293620A Active JP5128108B2 (ja) | 2005-11-09 | 2006-10-30 | 位置測定装置及び位置測定装置を作動させる方法 |
| JP2008539306A Active JP4999856B2 (ja) | 2005-11-09 | 2006-11-02 | 位置測定システム |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006293620A Active JP5128108B2 (ja) | 2005-11-09 | 2006-10-30 | 位置測定装置及び位置測定装置を作動させる方法 |
Country Status (4)
| Country | Link |
|---|---|
| EP (2) | EP1949039B1 (enExample) |
| JP (2) | JP5128108B2 (enExample) |
| DE (1) | DE102006041357A1 (enExample) |
| WO (1) | WO2007054234A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7389595B2 (en) * | 2005-11-09 | 2008-06-24 | Dr. Johannes Heidenhain Gmbh | Position-measuring device and method for operating a position-measuring device |
| DE102008007319A1 (de) * | 2008-02-02 | 2009-08-06 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
| DE102009054592A1 (de) | 2009-12-14 | 2011-06-16 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| DE102011076178B4 (de) * | 2011-05-20 | 2022-03-31 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| JP6849371B2 (ja) | 2015-10-08 | 2021-03-24 | 三星電子株式会社Ｓａｍｓｕｎｇ Ｅｌｅｃｔｒｏｎｉｃｓ Ｃｏ．，Ｌｔｄ． | 側面発光レーザ光源、及びそれを含む三次元映像取得装置 |
| CN109752033B (zh) * | 2019-02-22 | 2024-01-30 | 上海交通大学 | 高精度光纤光栅应变测量系统 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5918412A (ja) * | 1982-07-22 | 1984-01-30 | Fanuc Ltd | 位置検出方式 |
| ATE221186T1 (de) * | 1997-09-29 | 2002-08-15 | Heidenhain Gmbh Dr Johannes | Vorrichtung zur erfassung der position von zwei körpern |
| DE19843176C1 (de) * | 1998-09-21 | 2000-10-19 | Siemens Ag | Optischer Encoder zur Erfassung von Dreh- und Linearbewegungen |
| JP2000304507A (ja) * | 1999-04-21 | 2000-11-02 | Citizen Watch Co Ltd | 回折格子の回折光干渉を用いた寸法測定装置 |
| DE19941318A1 (de) * | 1999-08-31 | 2001-03-15 | Heidenhain Gmbh Dr Johannes | Optische Positionsmeßeinrichtung |
| US6494616B1 (en) * | 2000-08-04 | 2002-12-17 | Regents Of The University Of Minnesota | Multiplexed sensor array |
| WO2002033358A1 (en) * | 2000-10-22 | 2002-04-25 | Stridsberg Innovation Ab | Position transducer |
| DE10054062A1 (de) * | 2000-10-31 | 2002-05-16 | Heidenhain Gmbh Dr Johannes | Verfahren zur Positionsbestimmung und Positionsmesseinrichtung zur Ausführung des Verfahrens |
| DE10158223B4 (de) * | 2001-11-16 | 2017-10-05 | Dr. Johannes Heidenhain Gmbh | Drehwinkel-Messgerät |
| DE10235669B4 (de) * | 2002-08-03 | 2016-11-17 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| JP4381671B2 (ja) * | 2002-10-23 | 2009-12-09 | ソニーマニュファクチュアリングシステムズ株式会社 | 変位検出装置 |
| DE102004011698B4 (de) * | 2004-03-10 | 2007-12-13 | Siemens Ag | Verfahren zum Erkennen eines Sensortyps |
| DE102004053082A1 (de) * | 2004-11-03 | 2006-05-04 | Dr. Johannes Heidenhain Gmbh | Positionsmesssystem |
| DE102005043569A1 (de) * | 2005-09-12 | 2007-03-22 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
-
2006
- 2006-09-01 DE DE102006041357A patent/DE102006041357A1/de not_active Withdrawn
- 2006-10-30 JP JP2006293620A patent/JP5128108B2/ja active Active
- 2006-11-02 WO PCT/EP2006/010525 patent/WO2007054234A1/de not_active Ceased
- 2006-11-02 JP JP2008539306A patent/JP4999856B2/ja active Active
- 2006-11-02 EP EP06828910A patent/EP1949039B1/de active Active
- 2006-11-02 EP EP06022850.9A patent/EP1785698B1/de active Active
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