JP2009244144A5 - - Google Patents

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Publication number
JP2009244144A5
JP2009244144A5 JP2008091976A JP2008091976A JP2009244144A5 JP 2009244144 A5 JP2009244144 A5 JP 2009244144A5 JP 2008091976 A JP2008091976 A JP 2008091976A JP 2008091976 A JP2008091976 A JP 2008091976A JP 2009244144 A5 JP2009244144 A5 JP 2009244144A5
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JP
Japan
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subject
infrared
temperature
heating
cooling
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JP2008091976A
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English (en)
Japanese (ja)
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JP5333817B2 (ja
JP2009244144A (ja
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Priority to JP2008091976A priority Critical patent/JP5333817B2/ja
Priority claimed from JP2008091976A external-priority patent/JP5333817B2/ja
Publication of JP2009244144A publication Critical patent/JP2009244144A/ja
Publication of JP2009244144A5 publication Critical patent/JP2009244144A5/ja
Application granted granted Critical
Publication of JP5333817B2 publication Critical patent/JP5333817B2/ja
Expired - Fee Related legal-status Critical Current
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JP2008091976A 2008-03-31 2008-03-31 被検体欠陥部等の赤外線検査方法 Expired - Fee Related JP5333817B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008091976A JP5333817B2 (ja) 2008-03-31 2008-03-31 被検体欠陥部等の赤外線検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008091976A JP5333817B2 (ja) 2008-03-31 2008-03-31 被検体欠陥部等の赤外線検査方法

Publications (3)

Publication Number Publication Date
JP2009244144A JP2009244144A (ja) 2009-10-22
JP2009244144A5 true JP2009244144A5 (fi) 2011-08-11
JP5333817B2 JP5333817B2 (ja) 2013-11-06

Family

ID=41306196

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008091976A Expired - Fee Related JP5333817B2 (ja) 2008-03-31 2008-03-31 被検体欠陥部等の赤外線検査方法

Country Status (1)

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JP (1) JP5333817B2 (fi)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101326655B1 (ko) * 2012-02-29 2013-11-08 한국표준과학연구원 전도 및 근접복사열 가열수단을 이용한 적외선 열화상 부품 결함 측정 장치
KR101643461B1 (ko) * 2014-09-11 2016-07-28 한국표준과학연구원 열전도 억제장치를 이용한 적외선 열화상 비파괴 검사 시스템 및 검사방법
JP6908905B2 (ja) * 2016-12-16 2021-07-28 国立研究開発法人理化学研究所 検査装置、検査方法及びプログラム
CN110095502B (zh) * 2019-05-13 2021-10-22 合肥工业大学 一种发射电磁或微波进行红外道路病害无损检测的装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001249094A (ja) * 2000-03-06 2001-09-14 Mitsubishi Heavy Ind Ltd 半導体素子の発熱分布計測方法
JP4014867B2 (ja) * 2001-12-25 2007-11-28 株式会社トクヤマ ヒートシンクサブマウント及びその製造方法
JP4765101B2 (ja) * 2006-01-20 2011-09-07 富士電機株式会社 半導体装置
JP4218037B2 (ja) * 2006-06-06 2009-02-04 株式会社九州ノゲデン 被検体欠陥部等の検出装置

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