JP2009162591A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2009162591A5 JP2009162591A5 JP2007341369A JP2007341369A JP2009162591A5 JP 2009162591 A5 JP2009162591 A5 JP 2009162591A5 JP 2007341369 A JP2007341369 A JP 2007341369A JP 2007341369 A JP2007341369 A JP 2007341369A JP 2009162591 A5 JP2009162591 A5 JP 2009162591A5
- Authority
- JP
- Japan
- Prior art keywords
- test object
- shape
- interference
- interference fringe
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007341369A JP5053833B2 (ja) | 2007-12-28 | 2007-12-28 | 被検物の形状を測定する測定方法、測定装置及び前記被検物形状の測定をコンピュータに実行させるプログラム |
| US12/342,631 US7821648B2 (en) | 2007-12-28 | 2008-12-23 | Measurement method, a measurement apparatus, and a computer-readable recording medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007341369A JP5053833B2 (ja) | 2007-12-28 | 2007-12-28 | 被検物の形状を測定する測定方法、測定装置及び前記被検物形状の測定をコンピュータに実行させるプログラム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009162591A JP2009162591A (ja) | 2009-07-23 |
| JP2009162591A5 true JP2009162591A5 (enExample) | 2011-02-10 |
| JP5053833B2 JP5053833B2 (ja) | 2012-10-24 |
Family
ID=40797857
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007341369A Expired - Fee Related JP5053833B2 (ja) | 2007-12-28 | 2007-12-28 | 被検物の形状を測定する測定方法、測定装置及び前記被検物形状の測定をコンピュータに実行させるプログラム |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7821648B2 (enExample) |
| JP (1) | JP5053833B2 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7880897B2 (en) * | 2007-12-28 | 2011-02-01 | Fujinon Corporation | Light wave interferometer apparatus |
| JP5053833B2 (ja) * | 2007-12-28 | 2012-10-24 | キヤノン株式会社 | 被検物の形状を測定する測定方法、測定装置及び前記被検物形状の測定をコンピュータに実行させるプログラム |
| JP5955001B2 (ja) * | 2012-01-25 | 2016-07-20 | キヤノン株式会社 | 非球面形状計測方法、形状計測プログラム及び形状計測装置 |
| JP6169339B2 (ja) * | 2012-10-04 | 2017-07-26 | 株式会社日立製作所 | 形状計測方法及び装置 |
| US20150292941A1 (en) * | 2012-10-24 | 2015-10-15 | Csir | Modal decomposition of a laser beam |
| CN104634275A (zh) * | 2015-01-26 | 2015-05-20 | 河南理工大学 | 一种基于牛顿环的非球面实时干涉测量装置及方法 |
| US11262191B1 (en) * | 2018-07-12 | 2022-03-01 | Onto Innovation Inc. | On-axis dynamic interferometer and optical imaging systems employing the same |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5926277A (en) * | 1987-09-08 | 1999-07-20 | Erim International, Inc. | Method and apparatus for three-dimensional imaging using laser illumination interferometry |
| US5880841A (en) * | 1997-09-08 | 1999-03-09 | Erim International, Inc. | Method and apparatus for three-dimensional imaging using laser illumination interferometry |
| US6744522B2 (en) * | 2001-02-01 | 2004-06-01 | Zygo Corporation | Interferometer for measuring the thickness profile of thin transparent substrates |
| US6781700B2 (en) | 2001-06-20 | 2004-08-24 | Kuechel Michael | Scanning interferometer for aspheric surfaces and wavefronts |
| US7365858B2 (en) * | 2001-12-18 | 2008-04-29 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
| US7557929B2 (en) * | 2001-12-18 | 2009-07-07 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
| JP2004045168A (ja) | 2002-07-11 | 2004-02-12 | Nikon Corp | 非球面形状計測方法 |
| US7649634B2 (en) * | 2007-10-30 | 2010-01-19 | Mountain View Optical Consultant Corp. | Methods and systems for white light interferometry and characterization of films |
| JP5053833B2 (ja) * | 2007-12-28 | 2012-10-24 | キヤノン株式会社 | 被検物の形状を測定する測定方法、測定装置及び前記被検物形状の測定をコンピュータに実行させるプログラム |
| US8133127B1 (en) * | 2008-07-21 | 2012-03-13 | Synder Terrance W | Sports training device and methods of use |
-
2007
- 2007-12-28 JP JP2007341369A patent/JP5053833B2/ja not_active Expired - Fee Related
-
2008
- 2008-12-23 US US12/342,631 patent/US7821648B2/en not_active Expired - Fee Related
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2009162591A5 (enExample) | ||
| TWI521195B (zh) | 用於測量折射指數之方法,折射指數測量裝置,及用於製造光學元件之方法 | |
| KR20220017433A (ko) | 광학 요소의 계면들을 측정하기 위한 장치 및 방법 | |
| CN106248623A (zh) | 折射率测量方法、测量装置和光学元件制造方法 | |
| WO2009133674A1 (ja) | 円筒形状の被測定体の測定装置及び測定方法並びにタイヤ外観検査装置 | |
| JP2010151578A (ja) | 屈折率分布計測方法及び屈折率分布計測装置 | |
| CN101266139A (zh) | 基于红外白光干涉技术的微结构形貌测试方法 | |
| CN111366099B (zh) | 基于预分析的任意腔长下干涉加权采样解相分析方法及测量系统 | |
| JP2012004461A5 (enExample) | ||
| RU2017100254A (ru) | Сенсорное устройство, устройство измерения и способ измерений | |
| CN113639661A (zh) | 形貌检测系统及形貌检测方法 | |
| CN102607435B (zh) | 利用双缝干涉法测量光学薄膜厚度的装置实现测量光学薄膜厚度的方法 | |
| CN111664800A (zh) | 一种基于目标信息最优迭代的平行平板多表面检测方法及夹具 | |
| CN111998782A (zh) | 光学测量装置及方法 | |
| CN101986097B (zh) | 在球面面形干涉检测中高精度消除离焦误差及倾斜误差的方法 | |
| Huang et al. | Simultaneous measurement of depth-resolved refractive index field and deformation field inside polymers during the curing process | |
| JP2016223982A (ja) | 計測方法、計測装置、光学素子の製造方法 | |
| CN100449260C (zh) | 利用干涉仪精确测量望远系统物镜和目镜间距偏差的方法 | |
| JP2015105850A (ja) | 屈折率計測方法、屈折率計測装置および光学素子の製造方法 | |
| TWI524062B (zh) | 用於測量折射指數之方法和裝置及用於製造光學元件之方法 | |
| CN101441068A (zh) | 非接触式路面粗糙度测量装置以及方法 | |
| JP2017198613A (ja) | 屈折率計測方法、屈折率計測装置、及び光学素子の製造方法 | |
| US9644954B2 (en) | Device for measuring the surface state of a surface | |
| JP2012103140A5 (enExample) | ||
| JP2010203915A5 (enExample) |