JP2009070889A - Component mounting device - Google Patents

Component mounting device Download PDF

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JP2009070889A
JP2009070889A JP2007235232A JP2007235232A JP2009070889A JP 2009070889 A JP2009070889 A JP 2009070889A JP 2007235232 A JP2007235232 A JP 2007235232A JP 2007235232 A JP2007235232 A JP 2007235232A JP 2009070889 A JP2009070889 A JP 2009070889A
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circuit board
temperature
component mounting
mounting
substrate
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JP5037275B2 (en
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Tetsuro Miyamoto
哲朗 宮本
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Juki Corp
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Juki Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To prevent a deterioration in mounting precision of a component due to size variation caused by temperature change of a circuit board during component mounting. <P>SOLUTION: The circuit board 1 is clamped by a clamp pin 14 on a support table during the component mounting. A temperature sensor 40 measures board temperature of the circuit board from below the circuit board without interrupting the component mounting halfway. A non-contact type temperature sensor is used as the temperature sensor 40 and can be freely arranged. A component mounting position is automatically corrected according to expansion or contraction of the circuit board due to change in board temperature. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、部品を順次吸着し、回路基板の該当位置に搭載していく部品搭載装置に係り、特に、部品搭載中の回路基板の温度変移によって生じる、その寸法の伸縮による部品の搭載精度低下を抑えることで、一方の面の部品搭載及びリフロー後、熱膨張している両面基板の他方の面に部品搭載する際の、回路基板の縮小による搭載精度低下を抑えことができ、又装置内の発熱によって部品搭載中の回路基板が熱膨張して生じる搭載精度低下を抑えことができる部品搭載装置に関する。   The present invention relates to a component mounting apparatus that sequentially picks up components and mounts them at corresponding positions on a circuit board, and in particular, reduces the mounting accuracy of components due to the expansion and contraction of the dimensions caused by the temperature change of the circuit board during component mounting. Suppresses the reduction in mounting accuracy due to the reduction of the circuit board when mounting components on the other side of the double-sided board that is thermally expanded after mounting and reflowing components on one side. It is related with the component mounting apparatus which can suppress the mounting precision fall which arises when the circuit board in which components are mounted is thermally expanded by heat_generation | fever.

従来から、部品搭載装置の基幹構成要素が部品搭載装置内の発熱の影響で熱膨張し、実装精度低下を生じさせてしまため、熱膨張による位置ずれのオフセット量を求め、実装動作を停止させることなく、該オフセット量によって部品搭載位置を補正するようにしている。   Conventionally, the core component of the component mounting device is thermally expanded due to the heat generated in the component mounting device, causing a reduction in mounting accuracy. Therefore, the offset amount of the misalignment due to the thermal expansion is obtained, and the mounting operation is stopped. Instead, the component mounting position is corrected based on the offset amount.

例えば特許文献1では、回路基板に対する実装を開始する前に、実装精度にかかわる基幹構成要素毎に温度を計測し、計測された温度に対応するオフセット量を求めるようにしている。例えば、その図2に示されるように、吸着ノズル13に温度センサ10を取り付けて温度を計測し、計測された温度に対応するオフセット量によって、吸着ノズル13の位置を補正するようにしている。   For example, in Patent Document 1, before starting mounting on a circuit board, the temperature is measured for each basic component related to mounting accuracy, and an offset amount corresponding to the measured temperature is obtained. For example, as shown in FIG. 2, the temperature sensor 10 is attached to the suction nozzle 13 to measure the temperature, and the position of the suction nozzle 13 is corrected by the offset amount corresponding to the measured temperature.

又、特許文献2では、例えばその図6に示されるように、移載ヘッド22の熱変形によるノズル24の傾斜を、観察装置40により、発光部32から下方へ発光された光束L,L’の位置を観察することで把握するようにしている。そして、光束L,L’の位置の変位量を補正するように、ヘッド部20の移動ストロークを補正し、電子部品を基板に搭載する。これにより、移載ヘッドの温度上昇にともなうノズルの下端部の変位による実装位置精度の低下を抑えるようにしている。   Further, in Patent Document 2, for example, as shown in FIG. 6, the light beams L and L ′ emitted downward from the light emitting unit 32 by the observation device 40 are caused by the inclination of the nozzle 24 due to the thermal deformation of the transfer head 22. It is made to grasp by observing the position of. Then, the movement stroke of the head unit 20 is corrected so as to correct the displacement amount of the positions of the light beams L and L ′, and the electronic component is mounted on the substrate. As a result, a decrease in mounting position accuracy due to the displacement of the lower end of the nozzle accompanying the temperature rise of the transfer head is suppressed.

特開平11−186795号公報(図2)Japanese Patent Laid-Open No. 11-186895 (FIG. 2) 特開平11−289198号公報(図6)Japanese Patent Laid-Open No. 11-289198 (FIG. 6)

しかしながら、これら特許文献1及び特許文献2を含め、従来の部品搭載装置では、部品搭載に際して該装置内に実装される基板に対しての温度補正機能がなかったため、実装基板の温度変移による基板伸縮によって、搭載位置がずれてしまうという問題があった。特に、搭載点数が多く、搭載時間が長い場合にこの問題が発生し易い。   However, since the conventional component mounting apparatus including Patent Document 1 and Patent Document 2 did not have a temperature correction function for the substrate mounted in the apparatus during component mounting, the expansion / contraction of the substrate due to the temperature change of the mounting substrate. As a result, there is a problem that the mounting position shifts. In particular, this problem is likely to occur when the number of mounting points is large and the mounting time is long.

部品搭載装置の装置内温度が高い場合は、搭載時間中、基板の温度が上昇して熱膨張が発生し、部品の搭載位置がずれてしまうという問題がある。あるいは、両面基板の場合、一方の面の部品搭載及びリフロー後、リフローによって温度上昇し熱膨張していた基板は、この後に他方の面に部品搭載する際、基板温度が低下していくにつれて基板が縮小し、部品の搭載精度低下が生じるという問題がある。   When the internal temperature of the component mounting apparatus is high, there is a problem that during the mounting time, the temperature of the substrate rises and thermal expansion occurs, and the mounting position of the component shifts. Alternatively, in the case of a double-sided board, after mounting and reflowing components on one side, the board whose temperature has been increased due to reflow and has been thermally expanded is boarded as the board temperature is lowered when components are subsequently mounted on the other side. However, there is a problem that the mounting accuracy of components is reduced.

なお、回路基板の熱膨張係数は、エポキシ基板やガラス基板などその基板素材によって異なるものとなっているが、従来は考慮されていなかった。   The thermal expansion coefficient of the circuit board varies depending on the substrate material such as an epoxy substrate or a glass substrate, but has not been considered in the past.

本発明は、前記従来の問題点を解決するべくなされたもので、部品搭載中の回路基板の温度変移によって生じる、その寸法の伸縮による部品の搭載精度低下を抑えることで、一方の面の部品搭載及びリフロー後、熱膨張している両面基板の他方の面に部品搭載する際の、回路基板の縮小による搭載精度低下を抑えことができ、又装置内の発熱によって部品搭載中の回路基板が熱膨張して生じる搭載精度低下を抑えことができる部品搭載装置を提供することを課題とする。   The present invention has been made to solve the above-described conventional problems, and suppresses a decrease in mounting accuracy of a component due to expansion and contraction of a dimension caused by a temperature change of a circuit board during mounting of the component. After mounting and reflow, when mounting components on the other side of the thermally expanded double-sided board, it is possible to suppress a reduction in mounting accuracy due to the reduction of the circuit board. It is an object of the present invention to provide a component mounting apparatus that can suppress a decrease in mounting accuracy caused by thermal expansion.

本発明は、部品を順次吸着し、回路基板の該当位置に搭載していく部品搭載装置において、部品搭載中の回路基板の基板温度を、該回路基板の周辺から測定する温度センサと、該基板温度の変移による回路基板の伸縮に応じて、部品搭載位置を自動補正する制御手段と、を備えたことにより、前記課題を解決したものである。   The present invention relates to a temperature sensor that measures the substrate temperature of a circuit board being mounted from the periphery of the circuit board in the component mounting apparatus that sequentially picks up the components and mounts them at the corresponding positions on the circuit board, and the board The above-described problem is solved by providing a control means for automatically correcting the component mounting position in accordance with the expansion and contraction of the circuit board due to the temperature change.

又、上記部品搭載装置において、前記基板温度の変移による回路基板の伸縮に応じて、回路基板をクランプする手段に設定する基板幅を自動調整するようにしたことにより、前記課題を解決したものである。   In the component mounting apparatus, the board width set as a means for clamping the circuit board is automatically adjusted according to the expansion and contraction of the circuit board due to the change in the board temperature, thereby solving the above problem. is there.

本発明によれば、温度変移により基板の伸縮が発生しても、搭載精度の低下を防止できる。又、基板素材の線膨張係数を計測することで、精度の高い補正を行うことができる。更に、基板素材の線膨張係数に応じた補正を、搭載動作を停止することなく行なうことができる。更には、温度変移により基板の伸縮が発生しても、基板幅の調整を行うことで安定した基板クランプ状態を維持することができる。   According to the present invention, it is possible to prevent a reduction in mounting accuracy even if the substrate is expanded or contracted due to temperature shift. Moreover, highly accurate correction can be performed by measuring the linear expansion coefficient of the substrate material. Furthermore, correction according to the linear expansion coefficient of the substrate material can be performed without stopping the mounting operation. Furthermore, even if the substrate expands or contracts due to temperature change, a stable substrate clamp state can be maintained by adjusting the substrate width.

以下、図を用いて本発明の実施の形態を詳細に説明する。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

図1は、本発明が適用された実施形態の部品搭載装置を部品フィーダ37側から見た斜視図である。図2は、該部品搭載装置のサポートテーブル10を部品フィーダ37側から見た側面図である。図3は、該サポートテーブル10を上方から見た平面図である。   FIG. 1 is a perspective view of a component mounting apparatus according to an embodiment to which the present invention is applied as viewed from the component feeder 37 side. FIG. 2 is a side view of the support table 10 of the component mounting apparatus as viewed from the component feeder 37 side. FIG. 3 is a plan view of the support table 10 as viewed from above.

まず図1において、回路基板1に搭載する部品を吸着するノズルが取り付けられているヘッド部20、及び該ヘッド部20を上下動作させるZ軸動作機構部は、X軸ガントリ30及びX軸モータ32によってX軸方向に、又、Y軸ガントリ34及び35及び図示されないY軸リニアモータによってY軸方向に移動及び位置決めされる。   First, in FIG. 1, a head unit 20 to which a nozzle for adsorbing components to be mounted on the circuit board 1 and a Z-axis operation mechanism unit that moves the head unit 20 up and down are an X-axis gantry 30 and an X-axis motor 32. Is moved and positioned in the X-axis direction, and in the Y-axis direction by the Y-axis gantry 34 and 35 and a Y-axis linear motor (not shown).

又、搬送装置39によって左方から搬入された回路基板1は、部品搭載中、サポートテーブル10においてクランプピン14によりクランプされる。又、部品搭載装置において必要なすべての部品の搭載が完了した回路基板1は、搬送装置39によって右方に搬出される。なお、搬送装置39において回路基板1は、搬送レール12上を搬送される。   Further, the circuit board 1 carried in from the left by the conveying device 39 is clamped by the clamp pins 14 on the support table 10 during component mounting. In addition, the circuit board 1 on which all necessary components have been mounted in the component mounting apparatus is unloaded to the right by the transport device 39. In the transport device 39, the circuit board 1 is transported on the transport rail 12.

次に、図2及び図3に示すように、クランプされる回路基板1の下方位置には、該回路基板1の裏面の基板温度を測定するための温度センサ40が設けられている。本実施形態において温度センサ40は非接触型温度センサが用いられているが、接触型温度センサを用いるようにしてもよい。但し、温度センサ40として非接触型温度センサを用いることで、基板温度を能率よく測定することができ、又温度センサ40自体の配置の自由度も向上する。   Next, as shown in FIGS. 2 and 3, a temperature sensor 40 for measuring the substrate temperature on the back surface of the circuit board 1 is provided below the circuit board 1 to be clamped. In the present embodiment, the temperature sensor 40 is a non-contact type temperature sensor, but a contact type temperature sensor may be used. However, by using a non-contact type temperature sensor as the temperature sensor 40, the substrate temperature can be measured efficiently, and the degree of freedom of arrangement of the temperature sensor 40 itself is improved.

ここで、ヘッド部20の移動範囲には部品撮影用カメラ24が設けられ、該部品撮影用カメラ24によって、ヘッド部20の吸着ノズルに吸着されている部品を撮影し、該部品の位置や傾きを検出するようになっている。又、ヘッド部20にはBOCカメラ22が設けられている。   Here, a part photographing camera 24 is provided in the movement range of the head unit 20, and the part photographing camera 24 photographs the part sucked by the suction nozzle of the head unit 20, and the position and inclination of the part are captured. Is supposed to be detected. The head unit 20 is provided with a BOC camera 22.

図4は、本実施形態により部品搭載する回路基板1の上面の概要を示す平面図である。   FIG. 4 is a plan view showing an outline of the upper surface of the circuit board 1 on which components are mounted according to the present embodiment.

図示されるように、回路基板1の四隅の内の3つの近傍には、基板マークとも称するBOCマーク5A〜5Cが印刷されている。部品搭載装置のサポートテーブル10において回路基板1がクランプされた状態で、これらBOCマーク5A〜5Cそれぞれは、その上方にヘッド部20を移動させて該BOCカメラ22によって撮影され、この撮影の際のヘッド部20の移動位置や撮影結果に基づいて、制御装置50は、クランプされている回路基板1を上から見た時の、これらBOCマーク5A〜5Cの位置を検出する。更に制御装置50は、これらBOCマーク5A〜5Cの位置検出に基づいて、クランプされている回路基板1を上から見た時の、該回路基板1の位置や傾きや伸縮を検出する。   As illustrated, BOC marks 5A to 5C, which are also referred to as substrate marks, are printed in the vicinity of three of the four corners of the circuit board 1. In a state where the circuit board 1 is clamped on the support table 10 of the component mounting apparatus, each of the BOC marks 5A to 5C is photographed by the BOC camera 22 by moving the head unit 20 above the BOC marks 5A to 5C. Based on the moving position of the head unit 20 and the imaging result, the control device 50 detects the positions of these BOC marks 5A to 5C when the clamped circuit board 1 is viewed from above. Further, the control device 50 detects the position, inclination, and expansion / contraction of the circuit board 1 when the clamped circuit board 1 is viewed from above based on the position detection of the BOC marks 5A to 5C.

なお、基板温度の温度変移によって回路基板1が伸びた場合、BOCマーク5Aを基準として、BOCマーク5Bは矢印A1の方向に移動し、BOCマーク5Cは矢印A3の方向に移動する。あるいは、基板温度の温度変移によって回路基板1が縮んだ場合、BOCマーク5Aを基準として、BOCマーク5Bは矢印A2の方向に移動し、BOCマーク5Cは矢印A4の方向に移動する。   When the circuit board 1 extends due to the temperature change of the substrate temperature, the BOC mark 5B moves in the direction of the arrow A1 and the BOC mark 5C moves in the direction of the arrow A3 with reference to the BOC mark 5A. Alternatively, when the circuit board 1 contracts due to the temperature change of the substrate temperature, the BOC mark 5B moves in the direction of the arrow A2 and the BOC mark 5C moves in the direction of the arrow A4 with reference to the BOC mark 5A.

なお、回路基板1の線膨張係数がプラスであると、基板温度の上昇に伴って回路基板1は伸び、基板温度の下降に伴って回路基板1は縮む。あるいは、線膨張係数がマイナスであると、基板温度の上昇に伴って回路基板1は縮み、基板温度の下降に伴って回路基板1は伸びる。   If the linear expansion coefficient of the circuit board 1 is positive, the circuit board 1 expands as the substrate temperature increases, and the circuit board 1 contracts as the substrate temperature decreases. Alternatively, if the linear expansion coefficient is negative, the circuit board 1 contracts as the substrate temperature increases, and the circuit board 1 expands as the substrate temperature decreases.

図5は、本実施形態の部品搭載装置の制御構成を示すブロック図である。   FIG. 5 is a block diagram showing a control configuration of the component mounting apparatus of the present embodiment.

制御装置50は、外部記憶装置56からRAM(Random Access Memory)54に読み出され、CPU(Central Processing Unit)52によって実行されるソフトウェア・プログラムによって、部品搭載装置の全体的な動作を制御するものである。   The control device 50 is read from an external storage device 56 to a RAM (Random Access Memory) 54 and controls the overall operation of the component mounting device by a software program executed by a CPU (Central Processing Unit) 52. It is.

又、該制御に際しては、温度センサ40から温度検知信号を入力する温度センサ信号入力部66、ヘッド部20に取り付けられている吸着ノズルを制御するノズル制御部68、BOCカメラ22を制御するカメラ制御部70、部品撮影用カメラ24を制御する部品認識装置制御部72、ヘッド部20のXYZ軸移動の機構を制御するXYZ軸移動機構制御部76、部品フィーダ37を制御する部品供給装置制御部78、搬送装置39を制御する基板搬送装置制御部80、及び、サポートテーブル10に関わる回路基板1のクランプ/アンクランプ動作を制御する基板クランプ装置制御部82のそれぞれが、I/O装置58を介して制御装置50と共に協調して、それぞれ該当部位を制御することになる。   In this control, a temperature sensor signal input unit 66 for inputting a temperature detection signal from the temperature sensor 40, a nozzle control unit 68 for controlling the suction nozzle attached to the head unit 20, and a camera control for controlling the BOC camera 22. 70, a component recognition device control unit 72 that controls the component photographing camera 24, an XYZ axis movement mechanism control unit 76 that controls the XYZ axis movement mechanism of the head unit 20, and a component supply device control unit 78 that controls the component feeder 37. The substrate transfer device control unit 80 for controlling the transfer device 39 and the substrate clamp device control unit 82 for controlling the clamping / unclamping operation of the circuit board 1 related to the support table 10 are respectively connected via the I / O device 58. Thus, each corresponding part is controlled in cooperation with the control device 50.

なお、これらCPU52、RAM54、外部記憶装置56、及びI/O装置58は、内部バス60によって互いに接続されている。   Note that the CPU 52, RAM 54, external storage device 56, and I / O device 58 are connected to each other via an internal bus 60.

以下、本実施形態の作用について説明する。   Hereinafter, the operation of the present embodiment will be described.

図6は、本実施形態の動作を示すフローチャートである。   FIG. 6 is a flowchart showing the operation of this embodiment.

まず、ステップS110では、搬送装置39により、回路基板1をサポートテーブル10まで搬入する。ステップS112では、クランプピン14を上昇させることで、搬入された回路基板1をサポートテーブル10においてクランプする。該クランプによって、回路基板1は部品搭載が可能な状態となる。   First, in step S <b> 110, the circuit board 1 is carried to the support table 10 by the transport device 39. In step S <b> 112, the loaded circuit board 1 is clamped on the support table 10 by raising the clamp pins 14. With this clamping, the circuit board 1 becomes ready for component mounting.

ステップS114では、制御装置50は、部品搭載にあたってまず回路基板1の位置を把握すべく、BOCカメラ22によってBOCマーク5A〜5Cそれぞれを撮影し、それぞれの位置を認識する。又、ステップS116では、制御装置50は、該認識結果に基づいて、クランプされている回路基板1を上から見た時の、該回路基板1の位置や傾きや伸縮を検出する。   In step S114, the controller 50 first captures the BOC marks 5A to 5C with the BOC camera 22 and recognizes the respective positions in order to grasp the position of the circuit board 1 when mounting the components. In step S116, based on the recognition result, the control device 50 detects the position, inclination, and expansion / contraction of the circuit board 1 when the clamped circuit board 1 is viewed from above.

続いて、ステップS118では、温度センサ40により、クランプされている回路基板1の裏面の基板温度を測定する。次にステップS50では、回路基板1に対する部品搭載が、すべて完了したか判定する。完了で有ればステップ138に進み、次工程が受付可能になっていれば該ステップS138において、部品搭載が完了した回路基板1を次工程装置に搬出する。   Subsequently, in step S118, the temperature sensor 40 measures the substrate temperature on the back surface of the circuit board 1 being clamped. Next, in step S50, it is determined whether all the component mounting on the circuit board 1 has been completed. If completed, the process proceeds to step 138. If the next process is acceptable, in step S138, the circuit board 1 on which component mounting is completed is carried out to the next process apparatus.

あるいは、ステップS50で未完了と判定された場合、次にステップS122では、温度センサ40により、クランプされている回路基板1の裏面の基板温度を測定する。そして、ステップS124では、今回の該ステップS122における測定結果の基板温度と、過去に測定した基準とする基板温度(基準基板温度)との差から、温度変移の有無を判定する。この基準基板温度は、前述したステップS118における測定結果の基板温度としている。   Alternatively, if it is determined in step S50 that the operation is not completed, in step S122, the temperature sensor 40 measures the substrate temperature on the back surface of the circuit board 1 being clamped. In step S124, the presence / absence of temperature change is determined from the difference between the substrate temperature of the measurement result in step S122 and the reference substrate temperature (reference substrate temperature) measured in the past. This reference substrate temperature is the substrate temperature of the measurement result in step S118 described above.

温度変移なしと判定された場合は、ステップS126において、吸着ノズルで該当部品を吸着し、回路基板1上のその該当搭載位置に該部品を搭載する。この搭載の際には、前述のステップS114や後述するステップS132における回路基板1の位置や傾きや伸縮の検出結果に基づいて、搭載位置の補正を行う。   If it is determined that there is no temperature change, in step S126, the corresponding component is sucked by the suction nozzle, and the component is mounted at the corresponding mounting position on the circuit board 1. At the time of mounting, the mounting position is corrected based on the detection result of the position, inclination, and expansion / contraction of the circuit board 1 in the above-described step S114 and later-described step S132.

あるいは、ステップS124において温度変移有りと判定された場合は、ステップ132に進み、新たに、クランプされている回路基板1を上から見た時の、該回路基板1の位置や傾きや伸縮を検出する。   Alternatively, if it is determined in step S124 that there is a temperature change, the process proceeds to step 132, and the position, inclination, and expansion / contraction of the circuit board 1 when the clamped circuit board 1 is viewed from above are newly detected. To do.

具体的には、制御装置50は、該ステップS132において、前述のステップS114と同様に、BOCカメラ22によってBOCマーク5A〜5Cを撮影し、BOCマーク5A〜5Cのそれぞれの位置を認識する。そして前述のステップS116と同様に、制御装置50は、該認識結果に基づいて、クランプされている回路基板1を上から見た時の、該回路基板1の位置や傾きや伸縮を検出する。又、該検出の後、後の処理に用いるために、制御装置50は、基板温度の変移量、及び回路基板1の伸縮量から、現在部品を搭載している回路基板1の線膨張係数を算出する。   Specifically, in step S132, the control device 50 photographs the BOC marks 5A to 5C with the BOC camera 22 and recognizes the positions of the BOC marks 5A to 5C in the same manner as in step S114 described above. Similar to step S116 described above, the control device 50 detects the position, inclination, and expansion / contraction of the circuit board 1 when the clamped circuit board 1 is viewed from above based on the recognition result. Further, for use in later processing after the detection, the control device 50 calculates the linear expansion coefficient of the circuit board 1 on which the current component is mounted from the amount of change in the substrate temperature and the amount of expansion / contraction of the circuit board 1. calculate.

該算出の際、上記の基板温度の変移量は、今回の基板温度測定結果と基準基板温度との差から求められ、又、上記の回路基板1の伸縮量は、これら基板温度測定結果及び基準基板温度に対応して認識したBOCマーク5A〜5Cの位置の変化から求められる。   In the calculation, the amount of change in the substrate temperature is obtained from the difference between the current substrate temperature measurement result and the reference substrate temperature, and the amount of expansion / contraction of the circuit board 1 is determined based on the substrate temperature measurement result and the reference substrate temperature. It is obtained from the change in position of the BOC marks 5A to 5C recognized corresponding to the substrate temperature.

あるいは、該ステップS132では、制御装置50において予め回路基板1の線膨張係数が得られている場合、前述のステップS114と同様のBOCマーク5A〜5Cの位置認識は行なわず、制御装置50は、今回の基板温度測定結果と基準基板温度との差に該線膨張係数を乗算するなどして、現在のBOCマーク5A〜5Cの位置を算出することで、これらBOCマーク5A〜5Cの検出位置を修正する。そして、該ステップS132において制御装置50は、該算出結果のBOCマーク5A〜5Cのそれぞれの位置に基づいて、クランプされている回路基板1を上から見た時の、該回路基板1の位置や傾きや伸縮を検出する。   Alternatively, in step S132, when the linear expansion coefficient of the circuit board 1 is obtained in advance in the control device 50, the position recognition of the BOC marks 5A to 5C is not performed as in step S114, and the control device 50 By calculating the current position of the BOC marks 5A to 5C by multiplying the difference between the substrate temperature measurement result this time and the reference substrate temperature by the linear expansion coefficient, the detected positions of the BOC marks 5A to 5C are calculated. Correct it. In step S132, the control device 50 determines the position of the circuit board 1 when the clamped circuit board 1 is viewed from above based on the respective positions of the BOC marks 5A to 5C as the calculation results. Detect tilt and expansion / contraction.

上述のように、回路基板1の線膨張係数が得られている場合としては、部品搭載する回路基板1の線膨張係数を、オペレータが予め入力している場合がある。あるいは、同じ回路基板1の部品搭載を連続して行なっているため、前の回路基板1でその回路基板1の線膨張係数が既に算出されている場合がある。   As described above, when the linear expansion coefficient of the circuit board 1 is obtained, the operator may input the linear expansion coefficient of the circuit board 1 to be mounted in advance. Alternatively, since component mounting of the same circuit board 1 is continuously performed, the linear expansion coefficient of the circuit board 1 may already be calculated in the previous circuit board 1.

ステップS134では、基板温度の変移によって、回路基板1の幅が変化が場合、正しく回路基板1を搬送し又クランプできるように、搬送レール12の幅を自動的に調整したり、正しくクランプできるようにクランプピン14の位置を自動的に調整したりする。このステップS134の後には、再びステップS120の直前に分岐する。   In step S134, when the width of the circuit board 1 changes due to the change in the substrate temperature, the width of the conveyance rail 12 can be automatically adjusted or correctly clamped so that the circuit board 1 can be correctly conveyed and clamped. The position of the clamp pin 14 is automatically adjusted. After this step S134, the process branches again immediately before step S120.

なお、図7は、本実施形態において、本発明を適用しない場合の比較例の動作を示すフローチャートである。   FIG. 7 is a flowchart showing the operation of a comparative example when the present invention is not applied in the present embodiment.

本発明を適用しない場合は、ステップS116の後は、ステップS120及びステップS126により、その回路基板1に必要なすべての部品を搭載し、搭載完了後にはステップS138において回路基板1を搬出する。   When the present invention is not applied, after step S116, all necessary components are mounted on the circuit board 1 in steps S120 and S126, and after the mounting is completed, the circuit board 1 is unloaded in step S138.

以上に説明したように、本実施形態では、回路基板1への部品搭載を中断することなく、温度センサ40により回路基板1の基板温度の変移を検知し、BOCマーク5A〜5Cの検出位置を修正して、クランプされている回路基板1の位置や傾きや伸縮を修正することで、該基板温度変移に応じて部品搭載位置を補正することができる。   As described above, in the present embodiment, the temperature sensor 40 detects a change in the substrate temperature of the circuit board 1 without interrupting the mounting of components on the circuit board 1, and detects the detection positions of the BOC marks 5A to 5C. The component mounting position can be corrected in accordance with the board temperature change by correcting and correcting the position, inclination and expansion / contraction of the circuit board 1 being clamped.

又、回路基板1の基板温度の変移に応じて、搬送レール12の幅を自動的に調整したり、クランプピン14の位置を自動的に調整したりしているので、安定した回路基板1の搬送やクランプが可能になっている。確実にクランプすることで、温度変化によって生じ易い回路基板1の反りを押さえ込むこともできる。   Further, since the width of the transport rail 12 is automatically adjusted or the position of the clamp pin 14 is automatically adjusted according to the change of the substrate temperature of the circuit board 1, the stable circuit board 1 is provided. Transport and clamping are possible. By securely clamping, it is possible to suppress warping of the circuit board 1 that is likely to occur due to temperature changes.

なお、回路基板1の基板温度の変移による反りなどで、その回路基板1におけるZ軸方向の部品搭載位置が変化することも考えられる。このような場合は、前述のステップS132において、Z軸方向の部品搭載位置の変化を測定し、その後のステップS126での部品搭載で、Z軸方向の部品搭載位置を補正するようにしてもよい。   Note that it is also conceivable that the component mounting position in the Z-axis direction on the circuit board 1 changes due to a warp caused by a change in the substrate temperature of the circuit board 1. In such a case, the change in the component mounting position in the Z-axis direction may be measured in step S132 described above, and the component mounting position in the Z-axis direction may be corrected in the subsequent component mounting in step S126. .

本実施形態では、X軸及びY軸の軸移動の駆動に、それぞれX軸モータ32及び図示されないY軸リニアモータを用いることで、搭載点数の増大にも対処できるようになっている。他方、軸移動にリニアモータを採用すると、モータの発熱が装置内にこもりがちになり、装置内温度が上昇し易くなる。従って、部品搭載中に基板温度が上昇変移して、回路基板1が熱膨張し易くなる。特に、搭載点数が多いと、回路基板1に必要な部品すべてを搭載するための搭載時間が長引くなり、基板温度上昇や回路基板1の熱膨張もし易くなる。本実施形態では、このような悪条件にも対処し、部品搭載精度を維持することができる。   In the present embodiment, an increase in the number of mounting points can be dealt with by using an X-axis motor 32 and a Y-axis linear motor (not shown) for driving the movement of the X-axis and the Y-axis, respectively. On the other hand, when a linear motor is used for moving the shaft, the heat generated by the motor tends to be trapped in the apparatus, and the temperature in the apparatus tends to rise. Therefore, the board temperature rises and changes during component mounting, and the circuit board 1 is likely to thermally expand. In particular, when the number of mounting points is large, the mounting time for mounting all necessary components on the circuit board 1 is prolonged, and the substrate temperature rises and the thermal expansion of the circuit board 1 is easy. In the present embodiment, such an adverse condition can be dealt with and the component mounting accuracy can be maintained.

なお、本実施形態の変形例として、温度センサ40に、接触型温度センサを用いるようにしてもよい。接触型温度センサは非接触型より通常安価である。この場合、回路基板1に接触させる接触型の温度センサ40の温度検出部位が基板温度に順応し、基板温度が適正な精度で検出されるまでに時間を要する。このため、回路基板1を部品搭載装置に搬入する前に予め、該回路基板1の基板温度を測定しておき、該基板温度を、前述のステップS118で測定される基板温度に代えて用いるようにしてもよい。又、ステップS124における温度変移の判定も、温度センサ40が基板温度に順応するまでは、暫定的に温度変移なしとして、ステップS132に進む判定としてもよい。   As a modification of the present embodiment, a contact temperature sensor may be used as the temperature sensor 40. Contact temperature sensors are usually less expensive than non-contact types. In this case, it takes time for the temperature detection portion of the contact-type temperature sensor 40 to be brought into contact with the circuit board 1 to adjust to the substrate temperature and to detect the substrate temperature with appropriate accuracy. For this reason, the board temperature of the circuit board 1 is measured in advance before the circuit board 1 is carried into the component mounting apparatus, and the board temperature is used instead of the board temperature measured in the above-described step S118. It may be. Also, the determination of the temperature transition in step S124 may be a determination that the temperature sensor 40 temporarily adjusts to the substrate temperature and that the process proceeds to step S132 temporarily without the temperature transition.

本発明が適用された実施形態の部品搭載装置を部品フィーダ側から見た斜視図The perspective view which looked at the component mounting apparatus of embodiment with which this invention was applied from the component feeder side 上記実施形態におけるサポートテーブルを部品フィーダ側から見た側面図The side view which looked at the support table in the said embodiment from the parts feeder side 前記実施形態におけるサポートテーブルを上方から見た平面図The top view which looked at the support table in the said embodiment from upper direction 前記実施形態により部品搭載する回路基板の上面の概要を示す平面図The top view which shows the outline | summary of the upper surface of the circuit board which mounts components by the said embodiment. 前記実施形態の部品搭載装置の制御構成を示すブロック図The block diagram which shows the control structure of the component mounting apparatus of the said embodiment. 前記実施形態の動作を示すフローチャートFlowchart showing the operation of the embodiment 前記実施形態において、本発明を適用しない比較例の動作を示すフローチャートIn the above embodiment, a flowchart showing the operation of a comparative example to which the present invention is not applied.

符号の説明Explanation of symbols

1…回路基板
5A〜5C…BOCマーク
10…サポートテーブル
12…搬送レール
14…クランプピン
20…ヘッド部
22…BOCカメラ
24…部品撮影用カメラ
30…X軸ガントリ
32…X軸モータ
34、35…Y軸ガントリ
37…部品フィーダ
39…搬送装置
40…温度センサ
50…制御装置
52…CPU
54…RAM
56…外部記憶装置
60…内部バス
66…温度センサ信号入力部
68…ノズル制御部
70…カメラ制御部
72…部品認識装置制御部
76…XYZ軸移動機構制御部
78…部品供給装置制御部
80…基板搬送装置制御部
82…基板クランプ装置制御部
DESCRIPTION OF SYMBOLS 1 ... Circuit board 5A-5C ... BOC mark 10 ... Support table 12 ... Transfer rail 14 ... Clamp pin 20 ... Head part 22 ... BOC camera 24 ... Camera for part photography 30 ... X-axis gantry 32 ... X-axis motor 34, 35 ... Y-axis gantry 37 ... part feeder 39 ... conveying device 40 ... temperature sensor 50 ... control device 52 ... CPU
54 ... RAM
DESCRIPTION OF SYMBOLS 56 ... External storage device 60 ... Internal bus 66 ... Temperature sensor signal input part 68 ... Nozzle control part 70 ... Camera control part 72 ... Component recognition apparatus control part 76 ... XYZ axis movement mechanism control part 78 ... Component supply apparatus control part 80 ... Substrate transport device control unit 82 ... Substrate clamp device control unit

Claims (2)

部品を順次吸着し、回路基板の該当位置に搭載していく部品搭載装置において、
部品搭載中の回路基板の基板温度を、該回路基板の周辺から測定する温度センサと、
該基板温度の変移による回路基板の伸縮に応じて、部品搭載位置を自動補正する制御手段と、
を備えたことを特徴とする部品搭載装置。
In a component mounting device that picks up components sequentially and mounts them at the corresponding position on the circuit board.
A temperature sensor for measuring the substrate temperature of the circuit board being mounted from the periphery of the circuit board;
Control means for automatically correcting the component mounting position according to the expansion and contraction of the circuit board due to the change in the substrate temperature,
A component mounting device characterized by comprising:
前記基板温度の変移による回路基板の伸縮に応じて、回路基板をクランプする手段に設定する基板幅を自動調整するようにしたことを特徴とする請求項1に記載の部品搭載装置。   2. The component mounting apparatus according to claim 1, wherein the board width set in the means for clamping the circuit board is automatically adjusted according to the expansion and contraction of the circuit board due to the change in the board temperature.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014120724A (en) * 2012-12-19 2014-06-30 Yamaha Motor Co Ltd Surface mounter and correction coefficient calculation method of surface mounter

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01110415A (en) * 1987-10-26 1989-04-27 Fujitsu Ltd Substrate transfer device
JPH033399A (en) * 1989-05-31 1991-01-09 Matsushita Electric Ind Co Ltd Detection of mounting position of electronic component
JPH09246792A (en) * 1996-03-14 1997-09-19 Matsushita Electric Ind Co Ltd Part mounting method
JP2000299597A (en) * 1999-04-12 2000-10-24 Sony Corp Apparatus and method for mounting component
JP2001102397A (en) * 1999-07-27 2001-04-13 Toray Eng Co Ltd Chip-packaging device and calibration method therefor
JP2001223499A (en) * 2000-02-09 2001-08-17 Matsushita Electric Ind Co Ltd Method and device for calibrating electronic part mounting device, and method and device for setting speed
JP2005114553A (en) * 2003-10-08 2005-04-28 Xanavi Informatics Corp Quality inspection method for board, and board inspection device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01110415A (en) * 1987-10-26 1989-04-27 Fujitsu Ltd Substrate transfer device
JPH033399A (en) * 1989-05-31 1991-01-09 Matsushita Electric Ind Co Ltd Detection of mounting position of electronic component
JPH09246792A (en) * 1996-03-14 1997-09-19 Matsushita Electric Ind Co Ltd Part mounting method
JP2000299597A (en) * 1999-04-12 2000-10-24 Sony Corp Apparatus and method for mounting component
JP2001102397A (en) * 1999-07-27 2001-04-13 Toray Eng Co Ltd Chip-packaging device and calibration method therefor
JP2001223499A (en) * 2000-02-09 2001-08-17 Matsushita Electric Ind Co Ltd Method and device for calibrating electronic part mounting device, and method and device for setting speed
JP2005114553A (en) * 2003-10-08 2005-04-28 Xanavi Informatics Corp Quality inspection method for board, and board inspection device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014120724A (en) * 2012-12-19 2014-06-30 Yamaha Motor Co Ltd Surface mounter and correction coefficient calculation method of surface mounter
KR101540278B1 (en) * 2012-12-19 2015-07-29 야마하하쓰도키 가부시키가이샤 Surface mounting apparatus, and correction coefficient calculating method of surface mounting apparatus

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