JP2009045736A5 - - Google Patents
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- Publication number
- JP2009045736A5 JP2009045736A5 JP2008209143A JP2008209143A JP2009045736A5 JP 2009045736 A5 JP2009045736 A5 JP 2009045736A5 JP 2008209143 A JP2008209143 A JP 2008209143A JP 2008209143 A JP2008209143 A JP 2008209143A JP 2009045736 A5 JP2009045736 A5 JP 2009045736A5
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- substrate
- polishing pad
- shape memory
- rukoto
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005498 polishing Methods 0.000 claims 44
- 239000000758 substrate Substances 0.000 claims 19
- 238000000034 method Methods 0.000 claims 8
- 239000011159 matrix material Substances 0.000 claims 7
- 230000003750 conditioning effect Effects 0.000 claims 6
- 230000003213 activating effect Effects 0.000 claims 5
- 230000004913 activation Effects 0.000 claims 4
- 239000000126 substance Substances 0.000 claims 4
- 238000012544 monitoring process Methods 0.000 claims 3
- 239000004065 semiconductor Substances 0.000 claims 3
- 230000003287 optical effect Effects 0.000 claims 2
- 238000007517 polishing process Methods 0.000 claims 2
- 230000005684 electric field Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 230000000638 stimulation Effects 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 claims 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims 1
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/838,954 | 2007-08-15 | ||
| US11/838,954 US7458885B1 (en) | 2007-08-15 | 2007-08-15 | Chemical mechanical polishing pad and methods of making and using same |
| US12/103,232 | 2008-04-15 | ||
| US12/103,232 US8257142B2 (en) | 2008-04-15 | 2008-04-15 | Chemical mechanical polishing method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009045736A JP2009045736A (ja) | 2009-03-05 |
| JP2009045736A5 true JP2009045736A5 (https=) | 2011-10-06 |
| JP5226427B2 JP5226427B2 (ja) | 2013-07-03 |
Family
ID=40032701
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008209143A Expired - Fee Related JP5226427B2 (ja) | 2007-08-15 | 2008-08-15 | 化学機械研磨方法 |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP2025455A3 (https=) |
| JP (1) | JP5226427B2 (https=) |
| KR (1) | KR101453565B1 (https=) |
| TW (1) | TWI444248B (https=) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9144880B2 (en) * | 2012-11-01 | 2015-09-29 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Soft and conditionable chemical mechanical polishing pad |
| US9754846B2 (en) * | 2014-06-23 | 2017-09-05 | Applied Materials, Inc. | Inductive monitoring of conductive trench depth |
| WO2016048043A1 (ko) * | 2014-09-23 | 2016-03-31 | 영창케미칼 주식회사 | 화학적 기계적 연마용 연마패드의 그루브 측정 장치 및 이를 포함하는 화학적 기계적 연마 장치 |
| US9873180B2 (en) * | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| JP7066608B2 (ja) * | 2015-09-25 | 2022-05-13 | シーエムシー マテリアルズ,インコーポレイティド | 化学機械的研磨パッド、基板を化学機械的に研磨する方法、及び化学機械的研磨パッドを製造する方法 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2668273B2 (ja) * | 1989-12-08 | 1997-10-27 | 株式会社エース電研 | 研磨装置および研磨方法 |
| JPH08323614A (ja) * | 1995-05-30 | 1996-12-10 | Sony Corp | 化学的機械研磨方法および装置 |
| JP3732404B2 (ja) * | 1998-02-23 | 2006-01-05 | ニーモサイエンス ゲーエムベーハー | 形状記憶ポリマー組成物、形状記憶製品を形成する方法、および形状を記憶する組成物を形成する方法 |
| JP2000344902A (ja) * | 1999-06-04 | 2000-12-12 | Fuji Spinning Co Ltd | 研磨パッド用ウレタン成形物の製造法及び研磨パッド用ウレタン成形物 |
| JP4131632B2 (ja) | 2001-06-15 | 2008-08-13 | 株式会社荏原製作所 | ポリッシング装置及び研磨パッド |
| US7235488B2 (en) * | 2002-08-28 | 2007-06-26 | Micron Technology, Inc. | In-situ chemical-mechanical planarization pad metrology using ultrasonic imaging |
| US7901770B2 (en) | 2003-11-04 | 2011-03-08 | Boston Scientific Scimed, Inc. | Embolic compositions |
| US20060286906A1 (en) * | 2005-06-21 | 2006-12-21 | Cabot Microelectronics Corporation | Polishing pad comprising magnetically sensitive particles and method for the use thereof |
| US8192257B2 (en) | 2006-04-06 | 2012-06-05 | Micron Technology, Inc. | Method of manufacture of constant groove depth pads |
-
2008
- 2008-08-13 TW TW097130775A patent/TWI444248B/zh not_active IP Right Cessation
- 2008-08-14 EP EP08162348.0A patent/EP2025455A3/en not_active Withdrawn
- 2008-08-14 KR KR1020080080163A patent/KR101453565B1/ko not_active Expired - Fee Related
- 2008-08-15 JP JP2008209143A patent/JP5226427B2/ja not_active Expired - Fee Related
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