JP2009025080A5 - - Google Patents

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Publication number
JP2009025080A5
JP2009025080A5 JP2007186904A JP2007186904A JP2009025080A5 JP 2009025080 A5 JP2009025080 A5 JP 2009025080A5 JP 2007186904 A JP2007186904 A JP 2007186904A JP 2007186904 A JP2007186904 A JP 2007186904A JP 2009025080 A5 JP2009025080 A5 JP 2009025080A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2007186904A
Other versions
JP4417986B2 (ja
JP2009025080A (ja
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Publication date
Application filed filed Critical
Priority claimed from JP2007186904A external-priority patent/JP4417986B2/ja
Priority to JP2007186904A priority Critical patent/JP4417986B2/ja
Priority to US12/216,884 priority patent/US8196457B2/en
Priority to DE602008005368T priority patent/DE602008005368D1/de
Priority to EP08012684A priority patent/EP2017572B1/en
Priority to CN200810168618.3A priority patent/CN101413795B/zh
Publication of JP2009025080A publication Critical patent/JP2009025080A/ja
Publication of JP2009025080A5 publication Critical patent/JP2009025080A5/ja
Publication of JP4417986B2 publication Critical patent/JP4417986B2/ja
Application granted granted Critical
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007186904A 2007-07-18 2007-07-18 表面性状測定装置 Active JP4417986B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2007186904A JP4417986B2 (ja) 2007-07-18 2007-07-18 表面性状測定装置
US12/216,884 US8196457B2 (en) 2007-07-18 2008-07-11 Surface texture measuring device, surface texture measuring method and surface texture measuring program
DE602008005368T DE602008005368D1 (de) 2007-07-18 2008-07-14 Oberflächentextur-Messgerät, Oberflächentextur-Messverfahren und Oberflächentextur-Messprogramm
EP08012684A EP2017572B1 (en) 2007-07-18 2008-07-14 Surface texture measuring device, surface texture measuring method and surface texture measuring program
CN200810168618.3A CN101413795B (zh) 2007-07-18 2008-07-18 表面构造测量装置、表面构造测量方法和表面构造测量程序

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007186904A JP4417986B2 (ja) 2007-07-18 2007-07-18 表面性状測定装置

Publications (3)

Publication Number Publication Date
JP2009025080A JP2009025080A (ja) 2009-02-05
JP2009025080A5 true JP2009025080A5 (ja) 2009-08-13
JP4417986B2 JP4417986B2 (ja) 2010-02-17

Family

ID=39811929

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007186904A Active JP4417986B2 (ja) 2007-07-18 2007-07-18 表面性状測定装置

Country Status (5)

Country Link
US (1) US8196457B2 (ja)
EP (1) EP2017572B1 (ja)
JP (1) JP4417986B2 (ja)
CN (1) CN101413795B (ja)
DE (1) DE602008005368D1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5875900B2 (ja) * 2012-03-08 2016-03-02 株式会社ミツトヨ 表面性状測定機、その制御装置およびその調整方法
JP6030320B2 (ja) * 2012-03-19 2016-11-24 株式会社ミツトヨ 表面性状測定機

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10103947A (ja) 1996-09-30 1998-04-24 Tokyo Seimitsu Co Ltd 測定条件設定ガイド付き表面粗さ形状測定機
JPH10103948A (ja) 1996-09-30 1998-04-24 Tokyo Seimitsu Co Ltd 表面粗さ形状測定機の測定条件設定方法及びその装置
GB2339287B (en) * 1998-07-09 2002-12-24 Taylor Hobson Ltd Transducer circuit
JP2000227327A (ja) 1999-02-05 2000-08-15 Mitsutoyo Corp 表面性状測定機
JP4026998B2 (ja) 1999-11-26 2007-12-26 三洋電機株式会社 Ｌｅｄアレイ及びその製造方法
JP3525432B2 (ja) * 2000-09-29 2004-05-10 株式会社東京精密 粗さ測定方法及び粗さ測定装置
JP3885929B2 (ja) 2001-06-06 2007-02-28 株式会社東京精密 表面粗さ形状測定機の測定条件自動設定装置
JP4199450B2 (ja) 2001-11-26 2008-12-17 株式会社ミツトヨ 表面性状測定装置、表面性状測定方法及び表面性状測定プログラム
US7146850B2 (en) * 2003-07-08 2006-12-12 Chrome Deposit Corporation Roll contour measuring apparatus and method
EP1783454B1 (en) * 2005-11-08 2009-09-16 Mitutoyo Corporation Form measuring instrument
JP4749865B2 (ja) 2006-01-13 2011-08-17 旭化成建材株式会社 太陽電池モジュール一体型屋根材、これに用いる固定部材及び太陽電池モジュールの交換方法

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