JP2009013042A - Apparatus for manufacturing high purity silicon - Google Patents

Apparatus for manufacturing high purity silicon Download PDF

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JP2009013042A
JP2009013042A JP2007198103A JP2007198103A JP2009013042A JP 2009013042 A JP2009013042 A JP 2009013042A JP 2007198103 A JP2007198103 A JP 2007198103A JP 2007198103 A JP2007198103 A JP 2007198103A JP 2009013042 A JP2009013042 A JP 2009013042A
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tetrachloride
zinc
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JP4428484B2 (en
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Takayuki Shimamune
孝之 島宗
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CS GIJUTSU KENKYUSHO KK
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an apparatus for manufacturing high purity silicon with which high purity and crystallinity silicon having a relatively large size can be continuously manufactured by the reduction of silicon tetrachloride by zinc in a system. <P>SOLUTION: The apparatus for manufacturing high purity silicon by the reaction of zinc gas and silicon tetrachloride is equipped with: a reaction column section including a gas generation mechanism for forming the zinc gas and feeding the gas to a reaction column, a supply mechanism for feeding silicon tetrachloride to the reaction column, and a mechanism for forming silicon or a silicon precursor by subjecting the zinc gas and silicon tetrachloride to a catalytic reaction and at the same time, growing, as a silicon crystal, the formed silicon or the silicon precursor by colliding the silicon or the silicon precursor with each other; and a solid-gas separation section for dropping the grown silicon crystal to separate it from a reaction gas and sending the separated silicon crystal to a silicon holding part. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は主としてソーラーセルや電子部品に使用する高純度シリコンを連続的に低消費エネルギーで得ることが出来る、四塩化珪素の金属亜鉛還元による、高純度シリコンの製造装置に関する。The present invention relates to an apparatus for producing high-purity silicon by metal zinc reduction of silicon tetrachloride, which can continuously obtain high-purity silicon used for solar cells and electronic components with low energy consumption.

本技術の特徴は四塩化ケイ素を金属亜鉛により還元して高純度シリコンを製造する製造装置であり、現在広く行われているいわゆるジーメンス法、つまりトリクロロシランの水素還元法に対して消費エネルギーが1/10程度ですむ可能性があるとされている。その一方電子デバイス用として必要とされる超高純度シリコンの製造には向かないとされ、近年のエネルギー問題に関連するソーラーセルシリコンの需要拡大に至るまでほとんど検討が行われなかった。しかしながら最近に至り、ソーラーセル用として多くの検討が行われるようになってきた。The feature of this technology is a manufacturing apparatus for producing high-purity silicon by reducing silicon tetrachloride with zinc metal, which consumes less energy than the so-called Siemens method, that is, the hydrogen reduction method of trichlorosilane. There is a possibility that it may be about / 10. On the other hand, it is considered unsuitable for the production of ultra-high-purity silicon required for electronic devices, and little investigation has been made until the demand for solar cell silicon related to energy problems in recent years has increased. Recently, however, many studies have been conducted for solar cells.

つまり、四塩化ケイ素の亜鉛還元法によるシリコンの製造は1950年頃から知られており、多くの技術提案がなされ、一部では商品化されたと言われる。しかしながら、その一方で高温プロセスでありその運転条件の保持が困難であること、また生成する塩化亜鉛の処理が困難であるという問題などがあるとされている。更にこの製造は高温気相反応により行われること、反応が非常に早いことなどから反応生成物であるシリコンが極めて微少な粒になりやす区高純度かが困難であるとされた。またこのために原料ガスや副生物である塩化亜鉛ガスとの分離が困難であると言う問題点が有するとされる。In other words, the production of silicon by the zinc reduction method of silicon tetrachloride has been known since about 1950, and many technical proposals have been made, and some have been commercialized. However, on the other hand, it is a high-temperature process, and it is difficult to maintain the operation conditions, and it is also difficult to treat the generated zinc chloride. Furthermore, since this production is carried out by a high-temperature gas phase reaction and the reaction is very fast, it is difficult to achieve high purity in which silicon, which is a reaction product, is likely to be very fine particles. For this reason, it is said that there is a problem that it is difficult to separate the raw material gas and the by-product zinc chloride gas.

このために種々の工夫がなされており、たとえば特許文献1および特許文献2では液状亜鉛表面に四塩化珪素を吹き込んでシリコンを得る方法が提案されている。この方法では比較的低い温度でシリコンの製造が出来るという特徴はあるものの、現実には固相であるシリコンと液層亜鉛並びに気相の反応生成物である塩化亜鉛との分離が容易でなく分離操作が非常に煩雑になるという問題があった。またバッチプロセスであるが故に生成シリコン中への不純物の混入機会が多くなるという問題点があった。For this purpose, various ideas have been made. For example, Patent Document 1 and Patent Document 2 propose a method of obtaining silicon by blowing silicon tetrachloride onto the surface of liquid zinc. Although this method is characterized in that silicon can be produced at a relatively low temperature, in reality, it is not easy to separate the solid phase silicon from the liquid layer zinc and the gaseous reaction product zinc chloride. There was a problem that operation became very complicated. In addition, since the process is a batch process, there is a problem in that there are many opportunities for impurities to be mixed into the generated silicon.

また四塩化珪素ガスを亜鉛ガスで還元し、生成したシリコンを反応炉の炉壁に生成させる方法は幾つか提案されているが、特許文献3ではガスの混合比を特定して析出を制御し、また炉壁へのシリコンの析出と取り出しを容易にする方法として、特許文献4では反応槽内の壁に離型材を施す事を提案している。しかしながらバッチプロセスとなるために生成シリコン中への不純物の混入機会が多くなること、反応ガスである四塩化ケイ素の除去、分離が困難であるという問題を有している。Several methods have been proposed in which silicon tetrachloride gas is reduced with zinc gas, and the generated silicon is generated on the reactor wall of the reactor. However, Patent Document 3 controls the precipitation by specifying the gas mixing ratio. As a method for facilitating the deposition and removal of silicon from the furnace wall, Patent Document 4 proposes that a release material be applied to the wall in the reaction vessel. However, since it is a batch process, there are many opportunities for mixing impurities into the generated silicon, and it is difficult to remove and separate silicon tetrachloride as a reaction gas.

一方、生成シリコン結晶をより大きく成長させるために特許文献5では四塩化ケイ素ガスと亜鉛ガスとの反応を不活性キャリアーガス雰囲気中で条件を特定して行うことを示している。さらに特許文献6では反応炉内にシリコン種結晶板を置き、あるいはそのような壁を作って、そこにシリコンを成長させるようにしている。しかしながらこれらもバッチプロセスから抜け出すことが出来ず、改良されているとしても、不純物の混入を防ぐことは極めて困難であった。On the other hand, in order to grow the generated silicon crystal larger, Patent Document 5 shows that the reaction between the silicon tetrachloride gas and the zinc gas is performed under specified conditions in an inert carrier gas atmosphere. Further, in Patent Document 6, a silicon seed crystal plate is placed in a reaction furnace, or such a wall is formed, and silicon is grown there. However, these also cannot escape from the batch process, and even if they are improved, it has been extremely difficult to prevent contamination with impurities.

これらに対して本発明者らは、反応炉の炉壁にシリコンを生成させずに連続的にシリコンを生成させる方法として、旋回溶融法による高温プロセスの検討を進めてきた。これらについては特許文献7、特許文献8、特許文献9、特許文献10、特許文献11などの発明を行ってきた。これらにより反応炉の炉壁の影響を受けずしかも連続運転が可能となり製品シリコンは良い性能を示すものの、1200℃以上、通常ではシリコンの融点である1410℃付近の高温プロセスであるが故に生成シリコン中には系内に存在する不純物が僅かであるが混入しやすいためか、6−ナイン程度の純度が限界であった。さらに反応装置自身がサイクロンを形成するために大型化してしまうという問題点があった。また反応温度が極めて高いために、反応炉を構成する材料の耐久性に問題が出やすく、短時間では問題は少ないが、長期にわたっての安定な装置材料が見つかりにくいという問題があった。In contrast, the present inventors have been studying a high-temperature process using a swirl melting method as a method for continuously generating silicon without generating silicon on the furnace wall of the reactor. About these, invention of patent document 7, patent document 8, patent document 9, patent document 10, patent document 11, etc. has been performed. Although these products are not affected by the furnace wall of the reactor and can be operated continuously, the product silicon shows good performance, but it is a high-temperature process at 1200 ° C or higher, usually around 1410 ° C, which is the melting point of silicon. The purity of about 6-nine is the limit because there are few impurities present in the system but they are easily mixed. Furthermore, the reaction apparatus itself has a problem that it is increased in size to form a cyclone. In addition, since the reaction temperature is extremely high, there is a problem in that the durability of the material constituting the reaction furnace is likely to occur, and there are few problems in a short time, but there is a problem that it is difficult to find a stable apparatus material over a long period of time.

これらの解決のために本発明者らは、特許文献12で同じように気相反応法を行うが条件を規定することで、シリコンを単結晶繊維として取り出す事成功した。さらにこれによって高純度化をはかりながらそれを融体で取り出す事を行ってより効率化をはかった。(特許文献13)しかしながら、このような繊維状単結晶を形成するためには高温度で高濃度の亜鉛と四塩化ケイ素を反応させる必要があり反応場の圧力変化が比較的大きいために実用化に向けては、条件の制御がきびしくなるという問題点が新たに見出されてきた。更に高温反応であるが故に時としては不純物のレベルが高くなりやすいという問題点も見出されている。In order to solve these problems, the inventors succeeded in extracting silicon as a single crystal fiber by performing the gas phase reaction method in the same manner in Patent Document 12 but by defining the conditions. In addition, it was made more efficient by taking it out as a melt while purifying high purity. (Patent Document 13) However, in order to form such a fibrous single crystal, it is necessary to react zinc and silicon tetrachloride at a high temperature and a high concentration. Toward this, a new problem has been found that the control of conditions becomes severe. Furthermore, due to the high temperature reaction, the problem that the level of impurities tends to be high sometimes has been found.

ただ、このようにして反応装置内にシリコン結晶を生成させた後に融体化することによって連続運転が可能となったが、一方結晶を生成させるには、温度、雰囲気などの条件が厳しく装置の耐久性に問題を有する可能性があった。また、生成する結晶にばらつきが発生しやすく、ガスとの分離工程で時として成長の不十分な結晶が排ガスに混入してしまう事が散見された。一方生成する結晶をほぼ一定の状態で成長させる方法としては特許文献6に示されるように内部に種結晶をおくことが考えられるが、連続運転が困難になり本目的には合致しない。However, continuous operation is possible by forming a silicon crystal in the reactor in this way and then melting it. On the other hand, in order to form a crystal, conditions such as temperature and atmosphere are severe. There could be a problem with durability. In addition, it was found that the generated crystals tend to vary, and crystals that are insufficiently grown are sometimes mixed into the exhaust gas in the separation process with the gas. On the other hand, as a method for growing a crystal to be generated in a substantially constant state, it is conceivable to place a seed crystal inside as shown in Patent Document 6, but continuous operation becomes difficult and this does not meet this purpose.

唯一連続的に種結晶上シリコンを生成する方法としていわゆる流動層を使う方法がある。(非特許文献1)しかしながら反応ガスとして塩化亜鉛が系にある場合、反応ガスの分離回収が困難となり流動層そのものの形成が困難という問題点があった。The only method for continuously generating silicon on the seed crystal is to use a so-called fluidized bed. (Non-patent Document 1) However, when zinc chloride is used as a reaction gas in the system, there is a problem that it is difficult to separate and recover the reaction gas and it is difficult to form the fluidized bed itself.

特開平11−060228公報Japanese Patent Laid-Open No. 11-060228 特開平11−092130公報Japanese Patent Laid-Open No. 11-092130 特開2003−095633公報JP 2003-095633 A 特開2003−095632公報JP 2003-095632 A 特開2004−196643公報Japanese Patent Laid-Open No. 2004-196643 特開2003−095634公報JP 2003-095634 A 特開2004−210594公報Japanese Patent Laid-Open No. 2004-210594 特開2003−342016公報JP 2003-342016 A 特開2004−010472公報JP 2004-010472 A 特開2004−035382公報JP 2004-035382 A 特開2004−099421公報JP 2004-099421 A 特開2006−290645公報JP 2006-290645 A 特開2006−298740公報JP 2006-298740 A シリコン24(1994)培風館Silicon 24 (1994) Baifukan

本発明では四塩化珪素の亜鉛還元によって系内で比較的大きな高純度、高結晶性のシリコンを連続的に製造する装置を提供することを課題とした。An object of the present invention is to provide an apparatus for continuously producing relatively high purity and high crystalline silicon in the system by zinc reduction of silicon tetrachloride.

亜鉛ガスと四塩化ケイ素との反応によりシリコンを製造する製造装置において、亜鉛ガスを生成して反応塔に送るガス発生機構と四塩化ケイ素を反応塔に送る供給機構と内部で該亜鉛ガスと該四塩化ケイ素を接触反応させてシリコン又はシリコン前駆体を生成させると共に生成したシリコン又はシリコン前駆体を相互に衝突させるようにしてシリコン結晶として成長させる機構を含む反応塔部と該成長したシリコン結晶を反応ガスから分離落下させてシリコン保持部に送る固気分離部を有する高純度シリコン製造装置である。 これにより反応で生成したシリコン又はシリコン前駆体を含む反応ガスが乱流となりこれらシリコン又はシリコン前駆体が互いに衝突を繰り返すことによって高純度で主として単結晶からなる100ミクロン以上の大きさのシリコン結晶を得ることが出来る。つまり、本使用条件における四塩化ケイ素と亜鉛ガスとの反応では反応によって生成したシリコン又はシリコン前駆体が非常に活性であるためか、反応により生成したシリコン又はシリコン前駆体それ自身が種結晶の役割を果たすようで、高温状態で互いに衝突することによって急速に大きな結晶に成長することを新たに見いだして本発明に至ったものである。In a production apparatus for producing silicon by reaction of zinc gas and silicon tetrachloride, a gas generating mechanism for generating zinc gas and sending it to the reaction tower, a supply mechanism for sending silicon tetrachloride to the reaction tower, and the zinc gas and A reaction tower including a mechanism for causing silicon tetrachloride to react with each other to produce silicon or a silicon precursor and causing the produced silicon or silicon precursor to collide with each other to grow as a silicon crystal, and the grown silicon crystal This is a high-purity silicon production apparatus having a solid-gas separation unit that is separated and dropped from a reaction gas and sent to a silicon holding unit. As a result, the reaction gas containing silicon or silicon precursor produced by the reaction becomes a turbulent flow, and these silicon or silicon precursors repeatedly collide with each other, so that a silicon crystal having a size of 100 microns or more mainly composed of a single crystal with high purity is obtained. Can be obtained. In other words, in the reaction between silicon tetrachloride and zinc gas under these conditions of use, the silicon or silicon precursor produced by the reaction is very active, or the silicon or silicon precursor produced by the reaction itself serves as the seed crystal. Thus, the present invention has been found by newly finding that a large crystal rapidly grows by colliding with each other in a high temperature state.

これにより投入した四塩化ケイ素はほぼ全て黒色で100ミクロン以上の粒径のシリコン結晶となる。なおガスの流れが渦巻いている場合は繊維状になりやすく、流れが乱れている場合は大きな針状の結晶になる様である。これを実現するための装置は供給された亜鉛を加熱して亜鉛ガス発生させ反応塔に送るガス発生機構と四塩化ケイ素を供給する供給機構と反応を行いシリコン又はシリコン前駆体を生成させ、さらにそれらを含む反応ガスの流れを乱流にしたり攪拌したりして、該シリコン又はシリコン前駆体を互いに衝突させシリコン結晶として成長させる機構を有する反応塔とそれに続く反応ガスとシリコン結晶を分離する固気分離部を有し、さらに分離したガスは排出され、電解などの処理部に送る排ガス管並びに生成したシリコンを保持し、連続的に固体又は融体で取り出すようにしたシリコン保持部からなる。As a result, almost all of the silicon tetrachloride introduced is black and becomes a silicon crystal having a particle size of 100 microns or more. When the gas flow is swirled, it tends to be fibrous, and when the flow is disturbed, it seems to be a large needle-like crystal. An apparatus for realizing this generates silicon or a silicon precursor by reacting with a gas generation mechanism that heats supplied zinc to generate zinc gas and send it to a reaction tower and a supply mechanism that supplies silicon tetrachloride, A reaction gas having a mechanism for causing the silicon or silicon precursor to collide with each other and growing as a silicon crystal by turbulent or stirring the flow of the reaction gas containing them, and a solid phase for separating the reaction gas and the silicon crystal following the reaction tower. The gas separation unit has a gas separation unit, and the separated gas is exhausted, and includes an exhaust gas pipe to be sent to a processing unit such as electrolysis, and a silicon holding unit that holds the generated silicon and continuously takes it out as a solid or a melt.

本発明のシリコン製造装置では特に生成したシリコン又はシリコン前駆体を混合衝突させて結晶を成長させる反応塔に特徴がある。すなわち亜鉛蒸発部で発生した亜鉛ガスは反応塔に送られ、そこで四塩化ケイ素と反応してシリコン又はシリコン前駆体になる。このシリコン又はシリコン前駆体を含む反応ガスの流れを乱すように流路に邪魔板を設ける、あるいは流れを強制的に変えてこれらを含むガスを攪拌する様にする。このためにはパイプ状の反応塔の場合はパイプ内に邪魔板を設ける事によってガスの流れの方向を変えることによってシリコン又はシリコン前駆体の衝突が増加し結晶が成長するようになる。また反応によりこれら前駆体などを含むガスを四塩化ケイ素と亜鉛ガスとの反応部に戻す、あるいはガスの流れに沿って設けた2個以上の四塩化ケイ素供給部、つまり反応部により実質的に密度の濃い衝突を起こさせて結晶の成長を加速することも出来る。The silicon production apparatus of the present invention is particularly characterized by a reaction tower for growing crystals by mixing and colliding the produced silicon or silicon precursor. That is, the zinc gas generated in the zinc evaporation section is sent to a reaction tower where it reacts with silicon tetrachloride to become silicon or a silicon precursor. A baffle plate is provided in the flow path so as to disturb the flow of the reaction gas containing silicon or silicon precursor, or the gas containing them is stirred by forcibly changing the flow. For this purpose, in the case of a pipe-shaped reaction tower, a baffle plate is provided in the pipe to change the direction of gas flow, thereby increasing the collision of silicon or silicon precursor and growing crystals. Also, the gas containing these precursors is returned to the reaction part of silicon tetrachloride and zinc gas by reaction, or substantially two or more silicon tetrachloride supply parts provided along the gas flow, that is, the reaction part. Crystal growth can also be accelerated by causing dense collisions.

このような反応を行う場合の化学反応は
SiCl+2Zn→Si+2ZnCl
で示され、3分子のガスから2分子のガスを作る不均化反応であるので一般には大きな圧力変動を伴うことになる。特に四塩化ケイ素は沸点が57℃と極めて低く、反応温度である1000℃付近あるいはそれ以上では極めて分圧が大きいために、反応によって急激な減圧の起こる可能性がある。また四塩化ケイ素のガス分圧が異常に大きいので、ガス状では単位体積あたりの四塩化ケイ素、亜鉛双方の分子数が少なく、反応がスムースに行われなくなる懸念がある。このような問題を解決するために、ここでは四塩化ケイ素の反応塔への供給は圧力変動が最小となるよう、低温ガス又は液体で供給することが望ましい。四塩化ケイ素が液体であっても亜鉛ガスとの反応は極めて早く進み反応には全く問題のないことを確認した。
The chemical reaction for performing such a reaction is SiCl 4 + 2Zn → Si + 2ZnCl 2.
Since this is a disproportionation reaction in which a gas of two molecules is produced from a gas of three molecules, it generally involves a large pressure fluctuation. In particular, silicon tetrachloride has an extremely low boiling point of 57 ° C. and has a very high partial pressure at or near 1000 ° C., which is the reaction temperature. Further, since the gas partial pressure of silicon tetrachloride is abnormally large, there are concerns that the number of molecules of both silicon tetrachloride and zinc per unit volume is small in the gaseous state, and the reaction cannot be carried out smoothly. In order to solve such a problem, it is desirable here to supply silicon tetrachloride to the reaction tower with a low-temperature gas or liquid so that pressure fluctuation is minimized. It was confirmed that the reaction with zinc gas proceeded very quickly even if silicon tetrachloride was liquid, and that there was no problem with the reaction.

この様に低い温度の四塩化ケイ素と高温の亜鉛ガスとの反応では実際の反応温度は不明であるが、生成シリコンの不純物レベルがより低くなると言う新たな知見を見いだした。なお反応部分の雰囲気温度は亜鉛がガスとして保持する、亜鉛の沸点以上、実際には1000℃以上であることが必要である。またこの部分の反応塔壁温度は生成したシリコンが付着せず、また反応ガスである塩化亜鉛の影響を受けないよう、1030℃以上であることがより望ましい。なお四塩化ケイ素を気体で供給する場合は、雰囲気の圧力変動を最小にするために雰囲気ガスとして、アルゴンなどの不活性ガスを加えることができる。ただ、通常の気相反応で用いられるような多量の雰囲気ガス量ではなく、必要最小限とする。なお不活性ガスとしては反応性が無く、また比較的容易に入手出来反応性が無いアルゴンガスが望ましい。但し、反応を高密度に行う主旨からは四塩化ケイ素を液体で供給することが最も望ましい事は言うまでもない。Although the actual reaction temperature is unknown in the reaction between silicon tetrachloride at such a low temperature and high-temperature zinc gas, a new finding has been found that the impurity level of the produced silicon is lower. The atmospheric temperature of the reaction part needs to be higher than the boiling point of zinc, which is held by zinc as a gas, and actually 1000 ° C. or higher. The temperature of the reaction tower wall in this portion is more preferably 1030 ° C. or higher so that the generated silicon does not adhere and is not affected by the reaction gas zinc chloride. When silicon tetrachloride is supplied as a gas, an inert gas such as argon can be added as the atmosphere gas in order to minimize the pressure fluctuation of the atmosphere. However, the amount is not the large amount of atmospheric gas used in a normal gas phase reaction, but the necessary minimum amount. The inert gas is preferably an argon gas that has no reactivity and is relatively easily available and has no reactivity. However, it goes without saying that it is most desirable to supply silicon tetrachloride as a liquid in order to carry out the reaction at a high density.

なお供給する亜鉛ガスと四塩化ケイ素の量関係では、高温の四塩化ケイ素が極めて還元されやすい、つまり雰囲気に対しての酸化作用が極めて強いので、装置の酸化腐食を防ぐために、還元剤であり被酸化剤である亜鉛を常に過剰にしておくことが望ましい。ここで使用する反応塔の材質はこれらに耐性であれば特に指定しないが、このような条件では後記する固気分離部と併せて高純度石英ガラスであることが望ましい。The amount of zinc gas to be supplied and silicon tetrachloride are extremely reducing the high temperature silicon tetrachloride. In other words, the oxidizing action against the atmosphere is extremely strong. It is desirable to always keep the zinc as an oxidizing agent in excess. The material of the reaction tower used here is not particularly specified as long as it is resistant to these, but it is desirable to use high-purity quartz glass in combination with a solid-gas separation section described later under such conditions.

反応塔の壁温度は前述のように1030℃以上であることが望ましいが、一方壁温度が1300℃以上では消費エネルギーが大きくなり、反応塔自身の耐久性に問題の出る場合があること、またシリコン結晶に関してはこれ以上の温度は不要であることから1300℃を上限とする。
このようにして亜鉛ガスと四塩化ケイ素との反応によってシリコン又はシリコン前駆体を生成させ、それらを含む反応ガスと共に乱れたガスの流れに作り、相互に高濃度のまま衝突させることによって反応ガス中に100ミクロン以上の粒径を有するシリコンが生成する。この反応塔部分は水平に配置されても良いし、また垂直に配置されても良いことはもちろんである。
As described above, the wall temperature of the reaction tower is preferably 1030 ° C. or higher. On the other hand, when the wall temperature is 1300 ° C. or higher, energy consumption increases, and there may be a problem in durability of the reaction tower itself. For silicon crystals, no higher temperature is required, so 1300 ° C. is the upper limit.
In this way, silicon or silicon precursor is generated by the reaction of zinc gas and silicon tetrachloride, and is made into a turbulent gas flow together with the reaction gas containing them, and collides with each other with a high concentration in the reaction gas. In this case, silicon having a particle size of 100 microns or more is formed. Of course, the reaction tower portion may be arranged horizontally or vertically.

次いで、反応塔で生成したシリコン結晶を含む反応ガスは固気分離部に送られ固体シリコンと気体である亜鉛と塩化亜鉛混合物ガスとに分離される。この分離部は特には指定されないが、垂直サイクロン型分離部とすることが望ましい。これによってサイクロン内のガス速度によるが粒径1ミクロン以上の粒であれば固体として分離出来、下方に落下する。このようにして固体を全く含まない反応ガスは固気分離部上部から取り出される。またシリコン結晶は下方に落下してシリコン保持部に入り、そこを通して連続的に外部に取り出される。なお取り出しは固体でも良いが、シリコン保持部をシリコン融体とすることで落下してきたシリコンは液槽内で融体化して反応部と外気を機密に保持したまま連続に取り出すことが出来る。なおこの固気分離部の素材は上記のように高純度石英ガラスであることが望ましく、また壁温度は1030℃から1300℃の間に保持されて固体の付着を防ぐようにすることが望ましい。Next, the reaction gas containing silicon crystals generated in the reaction tower is sent to the solid-gas separation unit, where it is separated into solid silicon, gaseous zinc and zinc chloride mixture gas. Although this separation part is not specified in particular, it is desirable to use a vertical cyclone type separation part. As a result, depending on the gas velocity in the cyclone, particles having a particle size of 1 micron or more can be separated as a solid and fall downward. In this way, the reaction gas containing no solid is taken out from the upper part of the solid-gas separation unit. The silicon crystal falls downward and enters the silicon holding part, and is continuously taken out through the silicon holding part. Although the solid may be taken out, the silicon that has fallen by making the silicon holding part a silicon melt can be melted in the liquid tank and continuously taken out while keeping the reaction part and the outside air secretly. The material of the solid-gas separation part is desirably high-purity quartz glass as described above, and the wall temperature is desirably maintained between 1030 ° C. and 1300 ° C. so as to prevent solid adhesion.

文献によると塩化亜鉛は石英ガラスを腐食することになっているが、温度1030℃以上ではほとんど腐食することが無く、特に亜鉛ガスが共存するときにはより安定化することを見出している。
ここで固気分離部は反応塔ごとに設けても良いが、複数の反応塔を一つの固気分離部に接続することも出来る。
According to the literature, zinc chloride is supposed to corrode quartz glass, but it is found that it hardly corrodes at a temperature of 1030 ° C. or higher, and is more stabilized especially when zinc gas coexists.
Here, the solid-gas separation section may be provided for each reaction tower, but a plurality of reaction towers may be connected to one solid-gas separation section.

本発明によって四塩化ケイ素をほぼ完全に粒度100ミクロン以上のシリコン粒子あるいは繊維状高純度シリコンにすることが出来、完全に固気分離が出来るようになった。更に生成したシリコンの取り出しは下部から連続的に取り出すが、特に融体で取り出す場合は、シリコンを融体シリコン中に投入し溶解するのでシリコンの融点で容易に融体化出来るように成り連続的にシリコンを製造することが可能となった。According to the present invention, silicon tetrachloride can be almost completely made into silicon particles having a particle size of 100 microns or more or fibrous high-purity silicon, and solid-gas separation can be completely achieved. Further, the silicon produced is continuously taken out from the lower part, but especially when taking out with a melt, silicon is poured into the melted silicon and dissolved, so that it can be easily melted at the melting point of silicon. It became possible to manufacture silicon.

本発明の実施形態を図面により説明する。つまり、図1、図2及び図3は横型反応塔の場合の模式図であり、また図4及び5は縦型反応塔の場合の模式図である。すなわち図1は横型の反応塔内の四塩化ケイ素と亜鉛ガスとの反応後に邪魔板を設けてシリコン又はシリコン前駆体を含む反応ガスを乱流にして相互衝突させるようにしたものであり、図2では同じく横型の反応塔に対して亜鉛ガス中への四塩化ケイ素の供給口をガスの流れに沿って2個設けることによって第1の供給口で生成したシリコン又はシリコン前駆体を第2の供給口で生成するシリコン又はシリコン前駆体と衝突させるようにしたものである。図3は同じく横型の反応塔であるが、シリコン又はシリコン前駆体を含む反応ガスの一部をバイパスによってその出口から四塩化ケイ素供給口の手前に戻すようにし、供給口で生成するシリコン又はシリコン前駆体と衝突させ結晶成長を促すようにしたものである。また図4は図1に示す横型の反応塔を垂直型とした模式図であり、図5は図2の反応塔を垂直型とした模式図であって、機能はそれぞれ図1、図2と同等である。
図6はこれらの反応塔4台を1台の固気分離部・シリコン保持部に対して放射状に設置した模式図である。
An embodiment of the present invention will be described with reference to the drawings. That is, FIGS. 1, 2 and 3 are schematic diagrams in the case of a horizontal reaction column, and FIGS. 4 and 5 are schematic diagrams in the case of a vertical reaction column. That is, FIG. 1 shows that a baffle plate is provided after the reaction between silicon tetrachloride and zinc gas in a horizontal reaction tower so that a reaction gas containing silicon or a silicon precursor is turbulently caused to collide with each other. 2, the silicon or silicon precursor produced at the first supply port is provided in the second reaction column by providing two silicon tetrachloride supply ports into the zinc gas along the gas flow in the horizontal reaction column. It is made to collide with the silicon or silicon precursor generated at the supply port. FIG. 3 also shows a horizontal reaction tower, in which a part of the reaction gas containing silicon or silicon precursor is returned from its outlet to the front of the silicon tetrachloride supply port by bypass, and silicon or silicon produced at the supply port is shown. It collides with a precursor to promote crystal growth. 4 is a schematic diagram in which the horizontal reaction tower shown in FIG. 1 is a vertical type, and FIG. 5 is a schematic diagram in which the reaction tower in FIG. 2 is a vertical type, with the functions shown in FIGS. It is equivalent.
FIG. 6 is a schematic diagram in which four of these reaction towers are installed radially with respect to one solid-gas separation unit / silicon holding unit.

図1、図4においては、1が反応塔であり、ここに2の亜鉛ガス発生装置からの亜鉛ガスと3の四塩化ケイ素供給装置からの四塩化ケイ素を接触反応させてシリコン又はシリコン前駆体を生成し、それらを含む反応ガスを邪魔板などによる乱流とする撹拌部6にて相互に会合・衝突させて100ミクロン以上のシリコン結晶に成長させ、それを固気分離部4に送る。固気分離部4はサイクロンなどの方式により、固体であるシリコンを下方に落下させ、シリコン保持部5に送って連続的に取り出すようにする。シリコン保持部ではシリコンは固体でも良いが、予め融体シリコンを保持するようにしてそこに固体シリコンを落とすようにして即座に融解し、融解したシリコンを連続的に取り出す事がより望ましい。取り出す時に反応塔内のガスが出てこないようにするために図に示したような仕切を有するシリコン保持部を用い、オーバーフロー的にシリコン融体を取り出すようにする。
また固気分離したガスはガス出口11から電解槽などの反応ガス再生を行う処理装置12に送り処理をする。
なお反応塔と固気分離部の壁部温度は1030℃より高いこと、1050℃から1300℃に保持することによって壁面へのシリコン結晶の付着の無い様にする
1 and 4, reference numeral 1 denotes a reaction tower, in which zinc gas from a zinc gas generator 2 and silicon tetrachloride from a silicon tetrachloride supply device 3 are contacted and reacted to form silicon or a silicon precursor. The reaction gas containing them is caused to associate and collide with each other in the stirring unit 6 which makes the reaction gas turbulent by a baffle plate or the like to grow into a silicon crystal of 100 microns or more, and is sent to the solid-gas separation unit 4. The solid-gas separation unit 4 drops silicon, which is solid, downward by a system such as a cyclone, and sends it to the silicon holding unit 5 so as to be continuously taken out. In the silicon holding portion, silicon may be solid, but it is more preferable to hold the melted silicon in advance and drop the solid silicon immediately to melt it, and continuously take out the molten silicon. In order to prevent the gas in the reaction tower from coming out when taking out, a silicon holding part having a partition as shown in the figure is used, and the silicon melt is taken out in an overflow manner.
The gas separated from the solid gas is sent from the gas outlet 11 to the processing device 12 for regenerating the reaction gas such as an electrolytic cell.
The wall temperature of the reaction tower and the solid-gas separation section is higher than 1030 ° C., and the temperature is maintained at 1050 ° C. to 1300 ° C. so that silicon crystals do not adhere to the wall surface.

図2及び図5も同様であるが、反応塔内に四塩化ケイ素の供給口を反応ガスの流れに沿って2台並べた場合を示し、第1の四塩化ケイ素供給口付近で生成したシリコン又はシリコン前駆体が第2の四塩化ケイ素供給口付近で生成するシリコン又はシリコン前駆体と衝突することによって結晶の顕著な成長が起こる。この他は図1及び図4の説明と同じである。また図3では一度生成したシリコン又はシリコン前駆体、あるいは生成したシリコン結晶を含む反応ガスの一部を戻すことによってシリコンの成長を行わせる装置で、主要な作用、機構は他の図と同様である。
以下に実験的に組み立てた試験装置による実施例を示す。
2 and 5 are the same, but the case where two silicon tetrachloride supply ports are arranged in the reaction tower along the flow of the reaction gas is shown, and the silicon produced in the vicinity of the first silicon tetrachloride supply port is shown. Alternatively, significant crystal growth occurs by the silicon precursor colliding with the silicon or silicon precursor produced near the second silicon tetrachloride feed. The rest is the same as the description of FIGS. Also, in FIG. 3, the silicon is grown by returning a part of the reaction gas containing silicon or silicon precursor once generated or the generated silicon crystal, and the main operation and mechanism are the same as in the other figures. is there.
Examples of experimentally assembled test devices are shown below.

「実施例1」
図1に示す小型の試験装置を作成した。図1において反応塔2の内径を25mmとし、長さを1000mmとした。材質は透明石英ガラスである。固気分離部は高さ600mm内径70mmの透明石英ガラス製の筒であり、上端を閉じて反応ガスパイプを取りつけ固気分離した後の反応ガスを取り出し処理設備12に送るようにした。また反応塔1固気分離部4との接続は反応塔のガスの流れがそのまま固気分離部で壁に沿う様に固気分離部円筒の接線方向に行った。亜鉛ガス発生装置2は融体亜鉛保持部7から亜鉛蒸発部8に定量で送る様にし、亜鉛蒸発部では高温ヒータにより即時に蒸発させて反応塔に亜鉛ガスを送るようにした。また四塩化ケイ素供給装置3は液状四塩化ケイ素貯槽9から送り機構10で反応塔内に供給するようにしているが、本実施例では重力的に滴下するようにして反応塔に送るようにした。ここでは反応ガスの流れを乱してシリコン又はシリコン前駆体の相互衝突のために10cm間隔で置いた全円の石英ガラス板に円形の穴を開けた邪魔板群を用い、穴の位置を変化させて反応ガスの流れを乱すようにした。またここでは生成シリコンが目標通り成長すること、反応ガスと分離できることに主眼を置いたので、シリコン保持槽5は系内に置いたアルミナ坩堝によって行い連続取り出しについては配慮しなかった。ここでの反応条件は反応塔1050℃、亜鉛蒸発温度1200℃、四塩化ケイ素は室温から融体のまま反応塔に供給、亜鉛ガスと四塩化ケイ素の量比は理論量に対して亜鉛を2倍となるようにした。また固気分離部の温度(壁温度は1050℃とした。このような条件での運転を行ったところ、固気分離部の坩堝中には繊維状のシリコンを含む棒状のシリコンが析出した。この粒径はほとんどが0.1から1mmの大きさを有し黒色、一部金属光沢を呈していた。また960℃に保持した排ガス管を通じて送られた処理部12には亜鉛と塩化亜鉛の混合物が貯まったが、シリコンはほとんど認められなかった。尚反応後に装置を分解して調べた所、反応塔、固気分離部ガラス表面へのシリコンの析出は認められずガラスの失透も見られなかった。排ガス管にはごくわずかであるがシリコンの存在が認められた。
一方この装置を使い、反応塔温度を1020℃まで低下して反応を行ったところ、反応塔壁面にシリコンと思われる黒色の析出物が認められた。またわずかではあるがシリコン結晶が壁面に成長しているのが認められた。
"Example 1"
A small test apparatus shown in FIG. 1 was prepared. In FIG. 1, the inner diameter of the reaction tower 2 was 25 mm and the length was 1000 mm. The material is transparent quartz glass. The solid-gas separation part was a cylinder made of transparent quartz glass having a height of 600 mm and an inner diameter of 70 mm, and the upper end was closed and a reaction gas pipe was attached, and the reaction gas after solid-gas separation was taken out and sent to the processing facility 12. Further, the connection with the reaction tower 1 solid-gas separation section 4 was made in the tangential direction of the solid-gas separation section cylinder so that the gas flow of the reaction tower was directly along the wall in the solid-gas separation section. The zinc gas generator 2 was sent in a fixed amount from the molten zinc holding part 7 to the zinc evaporation part 8, and the zinc evaporation part was immediately evaporated by a high-temperature heater to send the zinc gas to the reaction tower. In addition, the silicon tetrachloride supply device 3 is supplied from the liquid silicon tetrachloride storage tank 9 into the reaction tower by the feeding mechanism 10, but in this embodiment, the silicon tetrachloride supply apparatus 3 is sent to the reaction tower by dropping gravitationally. . Here, the flow of the reaction gas is disturbed, and the position of the holes is changed using a baffle plate group in which circular holes are drilled in a full circle quartz glass plate placed at intervals of 10 cm for mutual collision of silicon or silicon precursor. To disturb the flow of the reaction gas. Here, since the main point is that the generated silicon grows as intended and can be separated from the reaction gas, the silicon holding tank 5 is formed by an alumina crucible placed in the system, and continuous extraction is not considered. The reaction conditions here are a reaction tower of 1050 ° C., a zinc evaporation temperature of 1200 ° C., and silicon tetrachloride is supplied to the reaction tower as a melt from room temperature. The amount ratio of zinc gas and silicon tetrachloride is 2 for the theoretical amount of zinc. Doubled. The temperature of the solid-gas separation part (wall temperature was 1050 ° C.) When operation was performed under such conditions, rod-like silicon containing fibrous silicon was deposited in the crucible of the solid-gas separation part. This particle size was almost 0.1 to 1 mm, black and partly metallic luster, and the treatment section 12 sent through the exhaust gas pipe maintained at 960 ° C. had zinc and zinc chloride. Almost no silicon was observed after the reaction, but when the apparatus was disassembled after the reaction, no silicon was deposited on the glass surface of the reaction tower or solid-gas separation section, and glass devitrification was also observed. There was very little silicon in the exhaust pipe.
On the other hand, when this apparatus was used and the reaction tower temperature was lowered to 1020 ° C., the reaction was carried out, and black deposits that seemed to be silicon were found on the reaction tower wall. A slight amount of silicon crystal was observed growing on the wall.

「対比例1」
対比用として、実施例1の装置を用い、邪魔板を取り除いた以外、同じ条件でシリコンの製造を試みた。反応塔温度は1050℃であった。これによって坩堝中には実施例1に対して量として50%程度のシリコンの蓄積が見られた。またこのシリコンは一部黒色で比較的大きく成長していたものの褐色で十分に成長していないシリコンが半分以上であった。また排ガス管に褐色のシリコンの生成が認められた。これらは生成したシリコンの生育が不十分であること、またそのために固気分離が十分に出来ず一部のシリコンが排ガスと共に系外に出てしまったことによると考えられた。
Comparison 1”
For comparison, production of silicon was tried under the same conditions except that the apparatus of Example 1 was used and the baffle plate was removed. The reaction tower temperature was 1050 ° C. As a result, about 50% of silicon was accumulated in the crucible as compared with Example 1. In addition, although this silicon was partly black and grew relatively large, more than half of the silicon was brown and not sufficiently grown. In addition, the formation of brown silicon was observed in the exhaust gas pipe. These were thought to be due to the insufficient growth of the generated silicon, and because of this, solid-gas separation could not be performed sufficiently, and some silicon was discharged out of the system together with the exhaust gas.

「実施例2」
図2に示す横型の反応塔を使用してシリコンの生成実験を行った。なお基本的な装置サイズは実施例1と同じとした。また固気分離部は実施例1と同じ物を用いた。反応塔内では邪魔板を入れない代わりに四塩化ケイ素を2カ所から投入するようにした。つまり亜鉛供給側にある第一の投入口から四塩化ケイ素の1/2量を後ろ側から1/2量を供給した。亜鉛供給量は四塩化ケイ素に対して理論量の1.5倍とした。また邪魔板は使用しなかった。供給亜鉛ガス温度は1100℃とし、四塩化ケイ素は液体で供給した。雰囲気ガスは使用しなかった。固気分離部の温度は1100℃とした。これによって坩堝内には実施例1より繊維状シリコンが多いがほぼ類似の黒色シリコン粒子の積層が見られた。四塩化ケイ素の理論量に対して95%以上の収率であった。
"Example 2"
Using the horizontal reaction tower shown in FIG. 2, the silicon production experiment was conducted. The basic device size was the same as in Example 1. Moreover, the same thing as Example 1 was used for the solid-gas separation part. In the reaction tower, silicon tetrachloride was added from two places instead of a baffle plate. That is, ½ amount of silicon tetrachloride was supplied from the first inlet on the zinc supply side and ½ amount was supplied from the rear side. The amount of zinc supplied was 1.5 times the theoretical amount of silicon tetrachloride. No baffle was used. The supply zinc gas temperature was 1100 ° C., and silicon tetrachloride was supplied as a liquid. Atmospheric gas was not used. The temperature of the solid-gas separation part was 1100 ° C. As a result, although there was more fibrous silicon than in Example 1 in the crucible, almost similar lamination of black silicon particles was observed. The yield was 95% or more based on the theoretical amount of silicon tetrachloride.

「実施例3」
図3に示す縦型の反応塔を用いてシリコンの生成試験を行った。縦型とすることによって、四塩化ケイ素は下から上に向かって供給する様にし、亜鉛ガスは横から供給するようにした。反応塔内の邪魔板は、その間隔を実施例1と同じにしたが互いに隣同士が逆方向を向いた2/3円状の邪魔板の列によった。四塩化ケイ素はヒータ付の液状四塩化ケイ素保持槽にアルゴンガスをバブリングさせてアルゴンガスと四塩化ケイ素ガス並びに四塩化ケイ素ミストとしそれを加温してアルゴンと四塩化ケイ素ガスの混合ガスとして反応塔に供給した。亜鉛ガスは実施例1と同様にして供給したが亜鉛ガスの温度は、液状亜鉛が生成するぎりぎりの温度である950℃として、亜鉛の液化を防ぐと共に、四塩化ケイ素ガスの膨張を最小限として、系内での反応に伴う圧力変動を最小にするようにした。反応塔の温度は四塩化ケイ素のノズルから下は1000℃、邪魔板部分とその上は1200℃に保持した。また固気分離部の温度は1100℃とした。この反応により反応塔内で四塩化ケイ素供給部の外側はわずかであるが黒色の沈積が認められた。只、邪魔板部分のガラス壁は透明を保持していた。固気分離部のガラス壁部分は透明を保持し、壁部分にシリコンの付着、生成は認められなかった。シリコン保持部である坩堝内には1mm程度の長さを有する棒状の結晶を主とするシリコンの析出が認められた。シリコン生成の効率は四塩化ケイ素投入量に対してほぼ89−90%であった。なおこの時に投入した四塩化ケイ素の量は200gであり、投入時間は15分間であった。
"Example 3"
A silicon production test was conducted using the vertical reaction tower shown in FIG. By adopting a vertical type, silicon tetrachloride was supplied from the bottom to the top, and zinc gas was supplied from the side. The baffle plates in the reaction tower were arranged in the same way as in Example 1, but were based on a row of 2/3 circular baffle plates adjacent to each other in opposite directions. Silicon tetrachloride reacts as a mixed gas of argon and silicon tetrachloride gas by bubbling argon gas into a liquid silicon tetrachloride holding tank equipped with a heater to heat argon gas, silicon tetrachloride gas and silicon tetrachloride mist. Feeded to the tower. Zinc gas was supplied in the same manner as in Example 1, but the temperature of the zinc gas was set to 950 ° C., which was the last temperature at which liquid zinc was generated, to prevent zinc liquefaction and to minimize expansion of silicon tetrachloride gas. The pressure fluctuation accompanying the reaction in the system was minimized. The temperature of the reaction tower was maintained at 1000 ° C. below the nozzle of silicon tetrachloride and 1200 ° C. above and on the baffle plate. The temperature of the solid-gas separation part was 1100 ° C. Due to this reaction, a slight black deposit was observed outside the silicon tetrachloride supply section in the reaction tower.只, the glass wall of the baffle plate was transparent. The glass wall portion of the solid-gas separation portion was kept transparent, and no silicon was attached or formed on the wall portion. In the crucible serving as the silicon holding portion, precipitation of silicon mainly including rod-like crystals having a length of about 1 mm was observed. The efficiency of silicon production was approximately 89-90% with respect to silicon tetrachloride input. The amount of silicon tetrachloride charged at this time was 200 g, and the charging time was 15 minutes.

「実施例4」
図4に示す反応塔を用いてシリコンの生成を行った。装置は実施例3と同じく、亜鉛並びに四塩化ケイ素の供給方向は変えたが、反応塔の管径、長さは実施例1と同じとした。この装置の運転に当たっては実施例3と同様にして、四塩化ケイ素は四塩化ケイ素とアルゴンの混合ガスとして供給した。亜鉛ガスの温度は1000℃であった。反応塔の温度は1050℃とし、固気分離部の温度を1150℃とした。これによってわずかに繊維状のシリコンを多く含む針状のシリコン結晶が生成した。粒径は100μから1mmであり、一部数ミリメートルの結晶も見られた。なお供給亜鉛量は四塩化ケイ素に対する理論量に対して2倍量となるようにした。これによって生成したシリコンの量は四塩化ケイ素に対して、95%以上であった。
Example 4
Silicon was generated using the reaction tower shown in FIG. The apparatus was the same as in Example 3, except that the supply direction of zinc and silicon tetrachloride was changed, but the tube diameter and length of the reaction tower were the same as in Example 1. In the operation of this apparatus, silicon tetrachloride was supplied as a mixed gas of silicon tetrachloride and argon in the same manner as in Example 3. The temperature of the zinc gas was 1000 ° C. The temperature of the reaction tower was 1050 ° C., and the temperature of the solid-gas separation part was 1150 ° C. As a result, needle-like silicon crystals containing a slight amount of fibrous silicon were produced. The particle size was 100 μ to 1 mm, and some crystals of several millimeters were also observed. The amount of supplied zinc was set to be twice the theoretical amount with respect to silicon tetrachloride. The amount of silicon produced thereby was 95% or more with respect to silicon tetrachloride.

ソーラーセル用に最も適した高純度シリコンを、現在のシリコン製造に必要とする電力の数分の一で製造する製造装置であり、今後のエネルギー問題、CO2による地球温暖化問題などを解消できる重要な切り札となる技術である。エネルギー源の不足が叫ばれている現在、ソーラーの活用が本格的に出来る本技術により、全ての産業の形態を変えるだけの強みを持つものである。It is a manufacturing device that produces high-purity silicon that is most suitable for solar cells in a fraction of the power required for current silicon production. It is important to solve future energy problems and global warming problems caused by CO2. It is a technology that becomes a trump card. With the current shortage of energy sources, this technology that can fully utilize solar power has the strength to change the form of all industries.

本発明の製造装置の概念図である。It is a conceptual diagram of the manufacturing apparatus of this invention. 本発明の製造装置の概念図であり、四塩化ケイ素供給口を2個設けたものである。It is a conceptual diagram of the manufacturing apparatus of this invention, and is provided with two silicon tetrachloride supply ports. 本発明の製造装置の概念図であり、反応ガスの一部を再循環させるようにしたものである。It is a conceptual diagram of the manufacturing apparatus of this invention, and is made to recirculate a part of reaction gas. 本発明の概念図であり、反応塔を縦型としたものである。It is a conceptual diagram of this invention and makes a reaction tower vertical. 本発明の概念図であり、垂直に置かれた反応塔に2個の四塩化ケイ素供給管を有するものである。It is a conceptual diagram of the present invention, and has two silicon tetrachloride supply pipes in a vertically placed reaction tower. 一台の固気分離部に複数の反応塔を放射状に並べた時の製造装置の平面概念図である。It is a plane conceptual diagram of a manufacturing device when a plurality of reaction towers are arranged radially in one solid gas separation part.

符号の説明Explanation of symbols

1 反応塔
2 亜鉛ガス発生装置
3 四塩化ケイ素供給装置
4 固気分離部
5 シリコン保持部
6 邪魔板
7 亜鉛保持供給部
8 亜鉛蒸発部
9 四塩化ケイ素保持部
10 四塩化ケイ素投入機構
11 ガス出口
12 処理装置
DESCRIPTION OF SYMBOLS 1 Reaction tower 2 Zinc gas generator 3 Silicon tetrachloride supply apparatus 4 Solid-gas separation part 5 Silicon holding part 6 Baffle plate 7 Zinc holding supply part 8 Zinc evaporation part 9 Silicon tetrachloride holding part 10 Silicon tetrachloride injection mechanism 11 Gas outlet 12 Processing equipment

Claims (13)

亜鉛ガスと四塩化ケイ素との反応によりシリコンを製造する製造装置において、亜鉛ガスを生成して反応塔に送るガス発生機構と四塩化ケイ素を反応塔に送る供給機構と内部で該亜鉛ガスと該四塩化ケイ素を接触反応させてシリコン又はシリコン前駆体を生成させると共に生成したシリコン又はシリコン前駆体を相互に衝突させるようにしてシリコン結晶として成長させる機構を含む反応塔部と該成長したシリコン結晶を反応ガスから分離落下させてシリコン保持部に送る固気分離部を有する高純度シリコン製造装置。In a production apparatus for producing silicon by reaction of zinc gas and silicon tetrachloride, a gas generating mechanism for generating zinc gas and sending it to the reaction tower, a supply mechanism for sending silicon tetrachloride to the reaction tower, and the zinc gas and A reaction tower including a mechanism for causing silicon tetrachloride to react with each other to produce silicon or a silicon precursor and causing the produced silicon or silicon precursor to collide with each other to grow as a silicon crystal, and the grown silicon crystal A high-purity silicon production apparatus having a solid-gas separation unit that is separated and dropped from a reaction gas and sent to a silicon holding unit. シリコン又はシリコン前駆体相互の衝突を反応塔内に設けられた邪魔板により該シリコン又はシリコン前駆体を含む反応ガスの流れ方向を変えながら撹拌することによって行うことを特徴とする請求項1の高純度シリコンの製造装置。2. The collision of silicon or silicon precursor is carried out by stirring with a baffle plate provided in the reaction tower while changing the flow direction of the reaction gas containing the silicon or silicon precursor. Purity silicon production equipment. シリコン又はシリコン前駆体の相互衝突を、四塩化ケイ素を複数のノズルから反応塔に供給して行うようにし両ノズル付近で生成するシリコン又はシリコン前駆体を互いに衝突するようにしたことを特徴とする請求項1の高純度シリコン製造装置。The silicon or silicon precursor is caused to collide with each other by supplying silicon tetrachloride from a plurality of nozzles to the reaction tower, and silicon or silicon precursors generated near both nozzles collide with each other. The high-purity silicon production apparatus according to claim 1. シリコン又はシリコン前駆体の相互衝突をシリコン又はシリコン前駆体を含む反応ガスの一部を反応塔内に戻すようにして行うことを特徴とする請求項1の高純度シリコンの製造装置。2. The apparatus for producing high-purity silicon according to claim 1, wherein the mutual collision of silicon or silicon precursor is performed by returning a part of the reaction gas containing silicon or silicon precursor into the reaction tower. 四塩化ケイ素の供給をガス状四塩化ケイ素で行う供給機構によることを特徴とする請求項1から4の高純度シリコンの製造装置。5. The apparatus for producing high-purity silicon according to claim 1, wherein the silicon tetrachloride is supplied by gaseous silicon tetrachloride. 四塩化ケイ素の供給を液状四塩化ケイ素で行う供給機構によることを特徴とする請求項1から4の高純度シリコン製造装置。5. The high purity silicon production apparatus according to claim 1, wherein the silicon tetrachloride is supplied by liquid silicon tetrachloride. 四塩化ケイ素の供給を四塩化ケイ素と不活性ガスの混合ガスで行う供給機構によることを特徴とする請求項1から4の高純度シリコン製造装置。5. The high purity silicon production apparatus according to claim 1, wherein the silicon tetrachloride is supplied by a supply mechanism that supplies silicon tetrachloride with a mixed gas of silicon tetrachloride and an inert gas. 反応塔内のシリコン又はシリコン前駆体が衝突し混合する部分の反応塔壁温度が1030℃から1300℃であることを特徴とする請求項1から7の高純度シリコン製造装置。8. The high-purity silicon production apparatus according to claim 1, wherein the temperature of the reaction tower wall at a portion where silicon or silicon precursor collides and mixes in the reaction tower is 1030 to 1300.degree. 亜鉛ガス供給機構及び四塩化ケイ素供給機構の反応塔内への供給ノズル付近の温度が950℃から1300℃であることを特徴とする請求項1から8の高純度シリコンの製造装置。9. The high-purity silicon production apparatus according to claim 1, wherein the temperature in the vicinity of the supply nozzle into the reaction tower of the zinc gas supply mechanism and the silicon tetrachloride supply mechanism is 950 to 1300.degree. 生成シリコンと反応ガスの分離を行う固気分離部が縦型サイクロンであり、該サイクロンの下部にシリコン保持槽を有することを特徴とする請求項1から9の高純度シリコンの製造装置。10. The apparatus for producing high-purity silicon according to claim 1, wherein the solid-gas separation unit for separating the generated silicon and the reactive gas is a vertical cyclone, and has a silicon holding tank at a lower part of the cyclone. 縦型サイクロンの壁温度を1030℃以上に保持する事を特徴とする請求項1から10の高純度シリコンの製造装置。The apparatus for producing high-purity silicon according to claim 1, wherein the wall temperature of the vertical cyclone is maintained at 1030 ° C. or higher. シリコン保持部に融体シリコンが保持されており、生成したシリコン結晶が融体シリコンと接触する事によって、融体化するようにしたことを特徴とする請求項1から11の高純度シリコン製造装置。12. The high-purity silicon production apparatus according to claim 1, wherein melted silicon is held in the silicon holding part, and the produced silicon crystal is melted by contact with the melted silicon. . 一台の縦型サイクロンからなる固気分離部と該サイクロンの下部のシリコン保持部と該サイクロンの周囲に放射状に配置された複数の亜鉛供給機構、四塩化ケイ素供給機構を有する反応塔を含んでなる高純度シリコン製造装置。Including a solid-gas separation unit composed of a single vertical cyclone, a silicon holding unit at the lower part of the cyclone, a plurality of zinc supply mechanisms arranged radially around the cyclone, and a reaction tower having a silicon tetrachloride supply mechanism High purity silicon manufacturing equipment.
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