JP2008290190A - Polishing machine - Google Patents

Polishing machine Download PDF

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JP2008290190A
JP2008290190A JP2007138170A JP2007138170A JP2008290190A JP 2008290190 A JP2008290190 A JP 2008290190A JP 2007138170 A JP2007138170 A JP 2007138170A JP 2007138170 A JP2007138170 A JP 2007138170A JP 2008290190 A JP2008290190 A JP 2008290190A
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Prior art keywords
polishing
glass substrate
plate
sheet
film
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Tatsuyuki Suzuki
龍之 鈴木
Akio Mogi
昭男 茂木
Hajime Konoue
肇 鴻上
Tadao Konno
忠雄 今野
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Mitsubishi Materials Techno Corp
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Mitsubishi Materials Techno Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a polishing machine with a polishing sheet capable of removing only abnormal projections without damaging a film with normal thickness in the condition of the polishing sheet brought into contact with the surface of a glass substrate. <P>SOLUTION: In the polishing machine polishing the film of the surface of the glass substrate W with the polishing sheet 23 by moving the polishing plate 20 relative to the glass substrate W in a plane while pushing and pressing the polishing plate 20 constituted by affixing the polishing sheet 23 to a polishing platen face 20a onto the surface of the glass substrate W on which the film is formed, primary particle size of abrasive grains included in the polishing layer of the polishing sheet 23 is 10 to 50 nm. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、例えば、液晶表示装置用カラーフィルタ等のガラス基板に形成された着色膜を研磨するための研磨機に関するものである。   The present invention relates to a polishing machine for polishing a colored film formed on a glass substrate such as a color filter for a liquid crystal display device.

上記したカラーフィルタの着色層の研磨機として、例えば、特許文献1が提案されている。
この研磨機は、静止した角形のガラス基板(カラーフィルタ)の着色層が形成された面上に、その長辺の長さがガラス基板の短辺よりも長い角形の研磨プレートをガラス基板の短辺と平行に配置し、研磨プレートでガラス基板面を押圧しながら、研磨プレートにガラス基板の垂直方向を軸とした偏心回転をさせて研磨プレートをガラス基板の短辺方向に揺動させ、研磨プレートをガラス基板の長辺方向に移動させてカラーフィルタ表面を研磨するというものである。
この研磨機によれば、従来のオスカータイプの研磨機に比べて、ガラス基板の全面を均一に研磨できる利点が得られる。
For example, Patent Document 1 has been proposed as a polishing machine for the colored layer of the color filter described above.
In this polishing machine, a rectangular polishing plate whose long side is longer than the short side of the glass substrate is placed on the surface of the stationary square glass substrate (color filter) on which the colored layer is formed. Placed parallel to the side, while pressing the glass substrate surface with the polishing plate, the polishing plate is rotated eccentrically around the vertical direction of the glass substrate to swing the polishing plate in the short side direction of the glass substrate and polish The color filter surface is polished by moving the plate in the long side direction of the glass substrate.
According to this polishing machine, an advantage that the entire surface of the glass substrate can be uniformly polished is obtained as compared with a conventional Oscar type polishing machine.

ところで、液晶パネル用カラーフィルタCFは、図8に示したように、フラットなガラス基板Wの表面にブラックマトリックスBMを形成し、その上に着色膜(RGB膜)を形成した構造を有するが、製造工程においてこの着色膜に異物が混入すると、RGB膜に異常突起300が発生することがある。この異常突起300の高さS2は、図8に示すように、一般的に通常の突起を含むRGB膜厚S1の高さが1.5〜2.0μmであるのに対し、10〜40μm位と極めて大きいものであり、このような異常突起300が発生すると、製造工程においてパネルの貼り合わせに支障を来し、表示不良の要因となる。   Incidentally, as shown in FIG. 8, the color filter CF for a liquid crystal panel has a structure in which a black matrix BM is formed on the surface of a flat glass substrate W, and a colored film (RGB film) is formed thereon. If foreign matter is mixed into the colored film during the manufacturing process, abnormal projections 300 may occur on the RGB film. As shown in FIG. 8, the height S2 of the abnormal protrusion 300 is generally about 10 to 40 μm while the height of the RGB film thickness S1 including the normal protrusion is generally 1.5 to 2.0 μm. If such an abnormal projection 300 is generated, the panel is stuck in the manufacturing process, which causes a display defect.

ところが、従来の研磨機は、このような異常突起を除去するには不向きであった。これは、従来の研磨機は全面研磨用であるため、異常突起のみを研磨しようとしても正常な膜厚部分までが削られてしまう虞があるからである。   However, conventional polishing machines are not suitable for removing such abnormal protrusions. This is because a conventional polishing machine is for entire surface polishing, and even if only abnormal protrusions are to be polished, there is a risk that even a normal film thickness portion may be removed.

そこで、本出願人は、先に出願した特願2007−84946号において、研磨プレートの研磨定盤面に、研磨プレートをガラス基板に表面に押圧させた時に、ガラス基板の表面に研磨シートより先に当接して押圧力に応じて潰れ変形する弾性体で成るクリアランス調整用パッドを設けることにより、ガラス基板の表面と研磨シートとのクリアランを最適に保持するようにした研磨機を提案している。
このクリアランス調整用パッドを設けることにより、研磨の際、ガラス基板の表面の膜上に存在する異常突起だけに研磨シートが接触し、正常厚さの膜に対して非接触となるようにできるため、正常な膜厚を減らさずに異常突起だけを研磨・除去することが可能となる。
尚、このような異常突起の研磨には、ダイヤモンド砥粒やアルミナ砥粒が埋め込まれた研削力に優れる固定砥粒研磨シートが使用されている。
Therefore, in the previously filed Japanese Patent Application No. 2007-84946, the present applicant, when the polishing plate is pressed against the glass substrate against the polishing platen surface of the polishing plate, the surface of the glass substrate precedes the polishing sheet. There has been proposed a polishing machine that optimally holds the clear run between the surface of the glass substrate and the polishing sheet by providing a clearance adjustment pad made of an elastic body that abuts and deforms in response to the pressing force.
By providing this clearance adjustment pad, the polishing sheet can be brought into contact with only abnormal projections existing on the film on the surface of the glass substrate during polishing, and can be brought into non-contact with a film having a normal thickness. It is possible to polish and remove only abnormal protrusions without reducing the normal film thickness.
For polishing such abnormal protrusions, a fixed abrasive polishing sheet having excellent grinding force embedded with diamond abrasive grains or alumina abrasive grains is used.

しかしながら、クリアランス調整用パッドによる研磨には、以下のような問題点が残されていた。
すなわち、クリアランス調整用パッドは弾性体で構成されているため、その変形量が研磨毎に一定でなく、よって、研磨シートの表面と異常突起間のクリアランスを常に一定に保持することが難しく、且つ、クリアランス調整用パッドの厚みもロット毎にばらつくため、パッド交換毎に研磨条件の設定(例えば、研磨圧力の調整による最適クリアランスの確保)が必要であり、研磨再現性が低いという問題である。
また、特にダイヤモンド砥粒は、砥粒硬度が高く、且つ、粒子径も大きいことから、ガラス基板の表面と研磨シートとのクリアランスが小さくなり過ぎると、ガラス基板面の正常厚さの膜面に研磨シートの表面より突出した砥粒が接触して研磨傷が発生する。
特開2004−195602号公報
However, the following problems remain in the polishing with the clearance adjustment pad.
That is, since the clearance adjustment pad is made of an elastic body, the amount of deformation is not constant for each polishing, and thus it is difficult to always keep the clearance between the surface of the polishing sheet and the abnormal protrusion constant, and Further, since the thickness of the clearance adjusting pad varies from lot to lot, it is necessary to set polishing conditions (for example, to secure an optimum clearance by adjusting the polishing pressure) every time the pad is replaced, and this is a problem that polishing reproducibility is low.
In particular, diamond abrasive grains have a high abrasive hardness and a large particle diameter. Therefore, if the clearance between the surface of the glass substrate and the polishing sheet becomes too small, the normal thickness of the glass substrate surface is reduced. Abrasive grains protruding from the surface of the polishing sheet come into contact with each other to cause polishing scratches.
JP 2004-195602 A

本発明は、上記事情に鑑み成されたもので、ガラス基板の表面に研磨シートを接触させた状態で、正常厚さの膜を傷付けることなく異常突起だけを研磨・除去することのできる研磨機を提供することを目的としている。   The present invention has been made in view of the above circumstances, and is a polishing machine capable of polishing and removing only abnormal protrusions without damaging a film having a normal thickness in a state where a polishing sheet is in contact with the surface of a glass substrate. The purpose is to provide.

すなわち、請求項1に記載の研磨機は、膜が形成されたガラス基板の表面に、研磨定盤面に研磨シートを貼り付けた研磨プレートを押圧させつつ、該研磨プレートを前記ガラス基板に対して面内移動させることで、前記ガラス基板の表面の膜を前記研磨シートで研磨する研磨機において、前記研磨シートの研磨層に含まれる砥粒の一次粒子径が10〜50nmであることを特徴としている。   That is, the polishing machine according to claim 1 is configured such that the polishing plate is pressed against the glass substrate while pressing the polishing plate with the polishing sheet attached to the surface of the polishing platen on the surface of the glass substrate on which the film is formed. In the polishing machine that polishes the film on the surface of the glass substrate with the polishing sheet by moving in-plane, the primary particle diameter of the abrasive grains contained in the polishing layer of the polishing sheet is 10 to 50 nm. Yes.

また、請求項2に記載の発明は、請求項1に記載の研磨機において、前記砥粒の一次粒子径が10〜20nmであることを特徴としている。   The invention described in claim 2 is the polishing machine according to claim 1, wherein the primary particle diameter of the abrasive grains is 10 to 20 nm.

また、請求項3に記載の発明は、請求項1または請求項2に記載の研磨機において、前記砥粒はシリカ粒子であることを特徴としている。   The invention according to claim 3 is the polishing machine according to claim 1 or 2, wherein the abrasive grains are silica particles.

また、請求項4に記載の発明は、請求項1から請求項3までの何れかに記載の研磨機において、前記研磨シートは、弾性シートを介して前記研磨プレートの研磨定盤面に貼り付けられていることを特徴としている。   According to a fourth aspect of the present invention, in the polishing machine according to any one of the first to third aspects, the polishing sheet is attached to the polishing platen surface of the polishing plate via an elastic sheet. It is characterized by having.

また、請求項5に記載の発明は、請求項1から請求項4までの何れかに記載の研磨機において、前記ガラス基板をその面方向に沿って搬送する搬送経路の下側に、前記ガラス基板が載る下定盤を配置し、この下定盤の上方に、搬送されてきた前記ガラス基板の上側の表面を研磨するための研磨ヘッドを設け、この研磨ヘッドの本体に、前記研磨シートを下に向けて、上定盤としての前記研磨プレートを上下方向移動自在に設けると共に、前記研磨ヘッドの本体と前記研磨プレートとの間に、前記研磨プレートをガラス基板に押圧させ、且つその押圧力を調整する押圧調整機構を設け、さらに、前記研磨ヘッドを、前記ガラス基板の搬送方向と直交する面内方向の運動成分を少なくとも含むようにオービタル運動させる駆動機構を設けたことを特徴としている。   Further, the invention according to claim 5 is the polishing machine according to any one of claims 1 to 4, wherein the glass is disposed below the conveyance path for conveying the glass substrate along the surface direction. A lower surface plate on which the substrate is placed is disposed, and a polishing head for polishing the upper surface of the conveyed glass substrate is provided above the lower surface plate, and the polishing sheet is placed below the main body of the polishing head. The polishing plate as an upper surface plate is provided so as to be movable in the vertical direction, and the polishing plate is pressed against the glass substrate between the main body of the polishing head and the polishing plate, and the pressing force is adjusted. And a drive mechanism for orbitally moving the polishing head so as to include at least a movement component in an in-plane direction orthogonal to the conveyance direction of the glass substrate. It is a symptom.

また、請求項6に記載の発明は、請求項1から請求項5までの何れかに記載の研磨機において、前記ガラス基板は、ディスプレイパネルのカラーフィルタであり、前記膜は、RGBの着色膜であることを特徴としている。   The invention according to claim 6 is the polishing machine according to any one of claims 1 to 5, wherein the glass substrate is a color filter of a display panel, and the film is an RGB colored film. It is characterized by being.

請求項1、2に記載の発明によれば、研磨シートの研磨層に含まれる砥粒(研磨材粒子)の一次粒子径が10〜50nm、好ましくは、10〜20nmの微粒子から成り、ダイヤモンド砥粒のように粒径数μmオーダーの粗大粒子を含まないため、研磨の際にガラス基板の表面の膜を傷付けることなく、異常突起だけを効率良く研磨・除去することができる。例え、研磨中に研磨シートがガラス基板の膜面に接触しても、研磨シートの砥粒径が10〜50nmと極めて微細であるため、膜面は鏡面研磨されるだけであって、不良となるような研磨傷は発生しない。   According to invention of Claim 1, 2, the primary particle diameter of the abrasive grain (abrasive material particle) contained in the polishing layer of the polishing sheet is 10 to 50 nm, preferably 10 to 20 nm. Since it does not contain coarse particles having a particle size of several μm, unlike grains, only abnormal protrusions can be efficiently polished and removed without damaging the film on the surface of the glass substrate during polishing. For example, even if the polishing sheet comes into contact with the film surface of the glass substrate during polishing, since the abrasive grain size of the polishing sheet is extremely fine as 10 to 50 nm, the film surface is only mirror polished and Such polishing scratches do not occur.

また、請求項3に記載の発明によれば、砥粒としてシリカ粒子を用いたので、上述したように、超微粒子であることに加え、シリカ粒子は、ダイアモンド砥粒やアルミナ砥粒に比べて砥粒硬度がかなり低いため、研磨傷の発生をより確実に防止できる。   Moreover, according to the invention of claim 3, since silica particles are used as abrasive grains, as described above, in addition to being ultrafine particles, silica particles are compared to diamond abrasive grains or alumina abrasive grains. Since the abrasive hardness is considerably low, the occurrence of polishing flaws can be prevented more reliably.

また、請求項4に記載の発明によれば、研磨定盤と研磨シートの間に弾性シートを介在するようにしたので、この弾性シートのクッションによって、ガラス基板に加わる押圧力が分散され、均一の研磨圧力により研磨されるため、研磨斑を防止できる。   According to the invention described in claim 4, since the elastic sheet is interposed between the polishing surface plate and the polishing sheet, the pressing force applied to the glass substrate is dispersed by the cushion of the elastic sheet, and is uniform. Since polishing is performed with this polishing pressure, polishing spots can be prevented.

また、請求項5に記載の発明によれば、研磨ヘッドに研磨プレートを上下方向移動自在に設け、押圧調整機構により研磨プレートをガラス基板に押圧させるようにしているので、ガラス基板に対する研磨シートの押圧力を、研磨傷を付けずに効率良く研磨できる好適な押圧力に調整することができる。   According to the invention described in claim 5, the polishing plate is provided on the polishing head so as to be movable in the vertical direction, and the polishing plate is pressed against the glass substrate by the press adjusting mechanism. The pressing force can be adjusted to a suitable pressing force that allows efficient polishing without scratching the surface.

さらに、請求項6に記載の発明によれば、カラーフィルタの表面に傷をつけることなく、カラーフィルタの着色膜に生じた異常突起を効率良く除去することができる。   Furthermore, according to the sixth aspect of the present invention, it is possible to efficiently remove abnormal protrusions generated on the colored film of the color filter without damaging the surface of the color filter.

以下、本発明の研磨機の実施形態を図1〜図7に基づいて説明する。
本実施形態の研磨機は、液晶表示装置用カラーフィルタの着色膜(RGB膜)を研磨するためのものであり、図1は本実施形態の研磨機を装備したガラス基板Wの製造ラインの要部構成を示す平面図、図2は同、要部構成を示す側面図、図3は研磨プレートの下部構成を示すガラス基板の搬送方向の側方から見た断面図、図4はガラス基板に研磨プレートを押圧させた時の状態を示す要部拡大図、図5は研磨シートの構造を示す断面図、図6は研磨プレートを下から見た図、図7は研磨ヘッドの構成を示すガラス基板の搬送方向の側方から見た断面図で、(a)は研磨プレートをガラス基板に押圧させる前の状態を示す図、(b)は研磨プレートをガラス基板に押圧させた状態を示す図である。
Hereinafter, an embodiment of a polishing machine of the present invention will be described with reference to FIGS.
The polishing machine of the present embodiment is for polishing a colored film (RGB film) of a color filter for a liquid crystal display device, and FIG. 1 is a schematic diagram of a production line for a glass substrate W equipped with the polishing machine of the present embodiment. FIG. 2 is a side view showing the main part configuration, FIG. 3 is a sectional view of the lower part of the polishing plate as viewed from the side in the transport direction of the glass substrate, and FIG. FIG. 5 is a cross-sectional view showing the structure of the polishing sheet, FIG. 6 is a view of the polishing plate as viewed from below, and FIG. 7 is a glass showing the structure of the polishing head. It is sectional drawing seen from the side of the conveyance direction of a board | substrate, (a) is a figure which shows the state before pressing a polishing plate against a glass substrate, (b) is a figure which shows the state which pressed the polishing plate against the glass substrate. It is.

図1、図2において、符号1はガラス基板W(本実施形態ではカラーフィルタ)をその面方向に沿って矢印A方向に搬送する搬送コンベア(搬送経路)、符号3はこの搬送コンベア1の下側に配置され、研磨時にガラス基板Wが載る下定盤、符号10はこの下定盤3の上方に配置されて、搬送されてきたガラス基板Wの上側の表面を研磨する研磨ヘッド、符号20はこの研磨ヘッド10の本体11に設けられた上定盤となる研磨プレートである。   1 and 2, reference numeral 1 denotes a conveyance conveyor (conveyance path) that conveys a glass substrate W (in this embodiment, a color filter) in the direction of arrow A along the surface direction, and reference numeral 3 denotes a lower part of the conveyance conveyor 1. The lower surface plate on which the glass substrate W is placed during polishing, the reference numeral 10 is disposed above the lower surface plate 3, and a polishing head for polishing the upper surface of the conveyed glass substrate W, the reference numeral 20 is this A polishing plate serving as an upper surface plate provided in the main body 11 of the polishing head 10.

この研磨機(研磨ヘッド10で代表される部分)は、RGB膜が形成されたガラス基板Wの表面に、研磨プレート20を押圧させながら、研磨プレート20をガラス基板Wに対して面内移動させることで、ガラス基板Wの表面の着色膜(RGB膜)を研磨するものである。
ガラス基板Wは、長方形の平板状のもので、長辺を搬送方向Aと平行にした姿勢で一方の短辺を前端にして上流側から研磨ヘッド10の下側に搬送され、下定盤3上において研磨ヘッド10により研磨されながら、そのままの姿勢と速度で下流側へ搬送されて行く。
This polishing machine (portion represented by the polishing head 10) moves the polishing plate 20 in-plane with respect to the glass substrate W while pressing the polishing plate 20 against the surface of the glass substrate W on which the RGB film is formed. Thus, the colored film (RGB film) on the surface of the glass substrate W is polished.
The glass substrate W has a rectangular flat plate shape, and is conveyed from the upstream side to the lower side of the polishing head 10 with one short side at the front end in a posture in which the long side is parallel to the conveyance direction A. While being polished by the polishing head 10, it is conveyed to the downstream side with the same posture and speed.

図3、図4に示すように、研磨プレート20の下面20a(研磨定盤面20a)には、厚み0.9mm程の弾性シート(ウレタンゴムやウレタンシート等)21を介して両面テープ等により固定砥粒研磨シート23が貼り付けられている。因みに、ウレタンシートは、硬度10〜20°、圧縮率20〜50%、圧縮弾性率94〜96%である。   As shown in FIGS. 3 and 4, the lower surface 20a (polishing surface 20a) of the polishing plate 20 is fixed with a double-sided tape or the like through an elastic sheet (urethane rubber, urethane sheet, etc.) 21 having a thickness of about 0.9 mm. An abrasive polishing sheet 23 is affixed. Incidentally, the urethane sheet has a hardness of 10 to 20 °, a compression rate of 20 to 50%, and a compression modulus of 94 to 96%.

本実施形態では、固定砥粒研磨シート23を貼り付ける際、弾性シート21の端縁部を固定砥粒研磨シート23で覆うようにして弾性シート21の角部に丸味を持たせており、このことにより、ガラス基板Wが搬送されて来た時に、ガラス基板Wの先端縁部が固定砥粒研磨シート23の端縁部に当たって、カラス基板Wの端縁部に損傷が生じたり、局部的に研磨されたする不都合を回避することができる。   In the present embodiment, when the fixed abrasive polishing sheet 23 is attached, the edge of the elastic sheet 21 is covered with the fixed abrasive polishing sheet 23 so that the corners of the elastic sheet 21 are rounded. As a result, when the glass substrate W is transported, the leading edge of the glass substrate W hits the edge of the fixed abrasive polishing sheet 23, and the edge of the crow substrate W is damaged or locally. The inconvenience of being polished can be avoided.

ところで、上記固定砥粒研磨シート23は、図5に示すように、厚さ75μm程のポリエステル等のプラスチックフィルムから成る基材24の一方の面に厚さ5μm程の研磨層26を形成したものであり、この研磨層26は、バインダーと砥粒等を有機溶剤に溶解し分散して塗工液を作製し、これを塗工手段により基材24に塗布し、乾燥させることにより形成することができる。
本実施形態では、研磨層26を形成する砥粒(研磨材粒子)27としてシリカ粒子が用いられ、またバインダーとしてエポキシ系樹脂が用いられている。
By the way, as shown in FIG. 5, the fixed abrasive polishing sheet 23 has a polishing layer 26 having a thickness of about 5 μm formed on one surface of a substrate 24 made of a plastic film such as polyester having a thickness of about 75 μm. The polishing layer 26 is formed by dissolving a binder and abrasive grains in an organic solvent and dispersing them to prepare a coating liquid, which is applied to the substrate 24 by a coating means and dried. Can do.
In the present embodiment, silica particles are used as the abrasive grains (abrasive particles) 27 that form the polishing layer 26, and epoxy resin is used as the binder.

そして、本実施形態の固定砥粒研磨シート23では、研磨層26に含まれる砥粒27として、粒子径(一次粒子径)が10〜50nmの微粒子が使用されている。
これは、砥粒27の粒子径が10nmより小さいと研磨力が低下してしまい、所望の研磨効果が得られず、異常突起の研磨・除去が困難になり、粒子径が50nmより大きいと、研磨の際にガラス基板Wの表面の膜面に研磨傷が発生する虞があるためである。そこで、本実施形態では、研磨層26に含まれる砥粒27の粒子径を10〜50nmとし、好ましくは、10〜20nmとしている。
In the fixed abrasive polishing sheet 23 of the present embodiment, fine particles having a particle diameter (primary particle diameter) of 10 to 50 nm are used as the abrasive grains 27 included in the polishing layer 26.
This is because if the particle size of the abrasive grains 27 is smaller than 10 nm, the polishing power decreases, the desired polishing effect cannot be obtained, and it becomes difficult to polish and remove abnormal protrusions. When the particle size is larger than 50 nm, This is because a polishing flaw may occur on the film surface of the glass substrate W during polishing. Therefore, in the present embodiment, the particle diameter of the abrasive grains 27 included in the polishing layer 26 is 10 to 50 nm, preferably 10 to 20 nm.

尚、ダイヤモンド砥粒、アルミナ砥粒、シリカ砥粒による各固定砥粒研磨シートの仕様を示せば、表1の通りである   Table 1 shows the specifications of each fixed abrasive polishing sheet using diamond abrasive, alumina abrasive, and silica abrasive.

Figure 2008290190
Figure 2008290190

研磨ヘッド10は、ガラス基板Wの搬送方向Aと直交する方向に自身の長さ方向を向けて配されており、その長さが、搬送経路上を搬送されてくる1枚、または、搬送方向と直交する方向に並んだ状態で搬送されてくる複数枚(本図示例では2枚)のガラス基板Wの全てを1度に研磨できる長さに設定されている。
また、図1、図6に示すように、研磨プレート20の下面20aには、ガラス基板Wの搬送方向に並べて2枚の固定砥粒研磨シート23が平行に互いに間隔をあけて貼り付けられており、これら、2枚の固定砥粒研磨シート23の間に位置させて、研磨プレート20には、固定砥粒研磨シート23による研磨部位に純水を供給する液体供給口13が設けられている。
The polishing head 10 is arranged with its own length direction in a direction orthogonal to the conveyance direction A of the glass substrate W, and the length of the polishing head 10 is conveyed on the conveyance path, or the conveyance direction. The length is set such that all of a plurality of (two in the illustrated example) glass substrates W conveyed in a state of being arranged in a direction perpendicular to each other can be polished at a time.
As shown in FIGS. 1 and 6, two fixed abrasive polishing sheets 23 are affixed to the lower surface 20 a of the polishing plate 20 in parallel in the transport direction of the glass substrate W and spaced apart from each other in parallel. In addition, the polishing plate 20 is provided between the two fixed abrasive polishing sheets 23 and is provided with a liquid supply port 13 for supplying pure water to a portion polished by the fixed abrasive polishing sheet 23. .

研磨プレート20は、図3、図7に示すように、固定砥粒研磨シート23を下に向けて、研磨ヘッド10の本体11に上下方向移動自在に設けられている。
図7に示すように、研磨ヘッド10の本体11には、下面に開口14aを有した押圧室14が設けられており、研磨プレート20の上部がこの押圧室14の内部に収容されると共に、研磨プレート20の下部が開口14aより下方へ突出している。そして、研磨プレート20の下面の研磨定盤面20aが、搬送されてくるガラス基板Wの上側の表面に対向するようになっている。
As shown in FIGS. 3 and 7, the polishing plate 20 is provided on the main body 11 of the polishing head 10 so as to be movable in the vertical direction with the fixed abrasive polishing sheet 23 facing downward.
As shown in FIG. 7, the main body 11 of the polishing head 10 is provided with a pressing chamber 14 having an opening 14 a on the lower surface, and the upper portion of the polishing plate 20 is accommodated inside the pressing chamber 14. The lower part of the polishing plate 20 protrudes downward from the opening 14a. The polishing platen surface 20a on the lower surface of the polishing plate 20 faces the upper surface of the glass substrate W being conveyed.

また、研磨ヘッド10の本体11と研磨プレート20との間には、研磨プレート20をガラス基板Wに押圧させると共に、その押圧力を調整する加圧チューブ18と反力チューブ19とが設けられている。   Further, between the main body 11 of the polishing head 10 and the polishing plate 20, there are provided a pressurizing tube 18 and a reaction force tube 19 for pressing the polishing plate 20 against the glass substrate W and adjusting the pressing force. Yes.

加圧チューブ18は、加圧エア(エア以外の気体でも可)の導入により膨張して研磨プレート20を下方に押圧するもので、押圧室14の天井壁と研磨プレート20の上端壁との間に配置されている。
また、反力チューブ19は、加圧エア(エア以外の気体でも可)の導入により膨張して研磨プレート20を加圧チューブ18の圧力に抗して上方に押圧するもので、研磨プレート20の左右に張り出したフランジ25と研磨ヘッド10の本体11側の開口14aの左右の各フランジ15との間に配置されている。
図7(b)に、加圧チューブ18による下向き力P1と、反力チューブ19による上向き力P2の関係を示す。これら加圧チューブ18と反力チューブ19は、研磨プレート20の長さ方向のほぼ全長に渡って配設されている。
The pressurizing tube 18 is expanded by introducing pressurized air (a gas other than air may be used) and presses the polishing plate 20 downward, and between the ceiling wall of the pressing chamber 14 and the upper end wall of the polishing plate 20. Is arranged.
The reaction force tube 19 expands by introducing pressurized air (or a gas other than air) and presses the polishing plate 20 upward against the pressure of the pressure tube 18. It is disposed between the flange 25 projecting left and right and the left and right flanges 15 of the opening 14 a on the main body 11 side of the polishing head 10.
FIG. 7B shows the relationship between the downward force P1 caused by the pressurizing tube 18 and the upward force P2 caused by the reaction tube 19. The pressurizing tube 18 and the reaction force tube 19 are disposed over almost the entire length of the polishing plate 20 in the length direction.

また、これら加圧チューブ18と反力チューブ19に接続された加圧エア給排管(図示せず)上には、圧力調整手段(図示せず)が接続されている。この圧力調整手段は、加圧チューブ18と反力チューブ19に導入する加圧エアの圧力バランスを調整するもので、この圧力調整手段と加圧チューブ18および反力チューブ19とにより、ガラス基板Wに対する研磨プレート20の押圧力(すなわち、研磨圧力)を調整するための押圧調整機構が構成されている。   A pressure adjusting means (not shown) is connected to a pressurized air supply / exhaust pipe (not shown) connected to the pressure tube 18 and the reaction force tube 19. The pressure adjusting means adjusts the pressure balance of the pressurized air introduced into the pressurizing tube 18 and the reaction force tube 19, and the pressure adjusting means, the pressurizing tube 18 and the reaction force tube 19 are used to adjust the glass substrate W. A pressing adjustment mechanism for adjusting the pressing force (that is, polishing pressure) of the polishing plate 20 with respect to is configured.

また、本実施形態の研磨機は、研磨ヘッド10の上端に突出した揺動軸12を介して、研磨ヘッド10を、ガラス基板Wの搬送方向と直交する面内方向の運動成分を少なくとも含むようオービタル運動させる駆動機構(図示せず)を備えている。   In addition, the polishing machine of this embodiment includes at least a motion component in the in-plane direction orthogonal to the conveyance direction of the glass substrate W via the swing shaft 12 protruding from the upper end of the polishing head 10. A drive mechanism (not shown) for orbital movement is provided.

次に上記構成の研磨機を用いてガラス基板Wの表面の膜(RGB膜)を研磨する方法について説明する。   Next, a method for polishing a film (RGB film) on the surface of the glass substrate W using the polishing machine having the above configuration will be described.

ガラス基板Wが搬送コンベア1により研磨ヘッド10の下に搬送されて来ると、図7(b)に示すように、加圧チューブ18に加圧エアを導入すると共に、反力チューブ19にも加圧エアを導入して、研磨プレート20を下降させ、ガラス基板Wの表面(RGB膜面)に研磨プレート20の下面を押圧させる。この際、加圧チューブ18と反力チューブ19の圧力バランスを調整することにより、研磨プレート20のガラス基板Wに対する押圧力を好適値に設定することができる。   When the glass substrate W is transported under the polishing head 10 by the transport conveyor 1, as shown in FIG. 7B, pressurized air is introduced into the pressurizing tube 18 and also applied to the reaction force tube 19. The compressed air is introduced, the polishing plate 20 is lowered, and the lower surface of the polishing plate 20 is pressed against the surface (RGB film surface) of the glass substrate W. At this time, by adjusting the pressure balance between the pressurizing tube 18 and the reaction force tube 19, the pressing force of the polishing plate 20 against the glass substrate W can be set to a suitable value.

この時、図4に示すように、固定砥粒研磨シート23の表面とガラス基板Wの表面は従来と相違し、完全に接触しており、この状態で、研磨ヘッド10をガラス基板Wに対して偏心回転させることにより、ガラス基板Wの表面の膜が固定砥粒研磨シート23にて研磨される。   At this time, as shown in FIG. 4, the surface of the fixed abrasive polishing sheet 23 and the surface of the glass substrate W are different from conventional ones and are completely in contact with each other. Thus, the film on the surface of the glass substrate W is polished by the fixed abrasive polishing sheet 23.

この場合、表1に示すように、固定砥粒研磨シート23の研磨層26に含まれる砥粒27の粒子径が10〜50nm(好ましくは、10〜20nm)の超微粒子から成り、ダイヤモンド砥粒のように粒径数μmオーダー(3〜8μm)の粗大粒子を含まないため、研磨の際にガラス基板Wの表面の膜を傷付けることなく、異常突起300(図8参照)だけを効率良く研磨・除去することができる。   In this case, as shown in Table 1, the abrasive grains 27 included in the polishing layer 26 of the fixed abrasive polishing sheet 23 are composed of ultrafine particles having a particle diameter of 10 to 50 nm (preferably 10 to 20 nm), and diamond abrasive grains As shown in FIG. 8, since there are no coarse particles having a particle size of several μm order (3 to 8 μm), only the abnormal protrusion 300 (see FIG. 8) is efficiently polished without damaging the film on the surface of the glass substrate W during polishing. -Can be removed.

例え、異常突起300が先端部より徐々に研磨されて来て固定砥粒研磨シート23の研磨層26がガラス基板Wの正常厚さの膜面に達しても、上述のように、砥粒27の粒子径が10〜50nmと極めて微細であるため、膜面は鏡面研磨(仕上げ研磨)されるだけであって、使用不可となるような研磨傷が発生する虞はなく、よって、正常厚さの膜の厚みを減らさずに、異常突起300のみを効率良く研磨・除去することが可能となる。   For example, even if the abnormal protrusion 300 is gradually polished from the tip portion and the polishing layer 26 of the fixed abrasive polishing sheet 23 reaches the normal thickness film surface of the glass substrate W, as described above, the abrasive 27 Since the particle size of the film is extremely fine, 10-50 nm, the film surface is only mirror-polished (finish polishing), and there is no possibility of causing a polishing scratch that cannot be used. Thus, it is possible to efficiently polish and remove only the abnormal protrusion 300 without reducing the thickness of the film.

さらには、砥粒27としてシリカ粒子を用いているので、シリカ粒子が超微粒子であることに加え、ダイアモンド砥粒やアルミナ砥粒に比べて砥粒硬度がかなり低いため(表1参照)、研磨傷の発生をより確実に防止できるものである。   Furthermore, since silica particles are used as the abrasive grains 27, since the silica particles are ultrafine particles, the abrasive hardness is considerably lower than diamond abrasive grains or alumina abrasive grains (see Table 1). The occurrence of scratches can be prevented more reliably.

このように、本実施形態の研磨機では、従来のようなクリアランス調整パッドを無くし、固定砥粒研磨シート23とガラス基板Wを接触させた全面研磨を行うため、研磨再現性が高く、且つ、使用部材が少なくて済み、コスト低減が図れる。   Thus, in the polishing machine of this embodiment, the conventional clearance adjustment pad is eliminated, and the entire polishing is performed by bringing the fixed abrasive polishing sheet 23 and the glass substrate W into contact with each other. Therefore, the polishing reproducibility is high, and The number of members used is small, and the cost can be reduced.

また、研磨定盤20と固定砥粒研磨シート23の間に弾性シート21を介在するようにしたので、この弾性シート21のクッション作用によって、ガラス基板Wに加わる押圧力が分散され、ガラス基板Wの全面が均一な研磨圧力により研磨されるため、研磨斑の発生を防止できる。   Further, since the elastic sheet 21 is interposed between the polishing surface plate 20 and the fixed abrasive polishing sheet 23, the pressing force applied to the glass substrate W is dispersed by the cushioning action of the elastic sheet 21, and the glass substrate W Since the entire surface is polished with a uniform polishing pressure, the occurrence of polishing spots can be prevented.

また、研磨中、研磨面に液体供給口13より純水を供給することにより、研磨かすを排除することができるので、研磨かすに起因する研磨傷の発生を防止することができる。   Further, by supplying pure water from the liquid supply port 13 to the polishing surface during polishing, polishing debris can be eliminated, so that generation of polishing flaws due to polishing debris can be prevented.

研磨終了後は、図7(a)に示すように、加圧チューブ18の加圧エアを抜き、反力チューブ19に加圧エアを導入して、研磨プレート20を上昇させ、次のガラス基板Wの搬入に備える。
このように、本研磨機によれば、ガラス基板表面の異常突起の除去と仕上げ研磨が同時に行え、よって、製品の歩留まり向上と品質向上に大いに貢献できるものである。
After the polishing is finished, as shown in FIG. 7A, the pressurized air from the pressure tube 18 is extracted, the pressurized air is introduced into the reaction tube 19, the polishing plate 20 is raised, and the next glass substrate. Prepare for W loading.
As described above, according to the present polishing machine, removal of abnormal protrusions on the surface of the glass substrate and finish polishing can be performed at the same time, so that it can greatly contribute to improvement of product yield and quality.

ここで、本実施形態の研磨機の効果を確認するために、以下のような研磨試験を行った。尚、研磨定盤と固定砥粒研磨シートの間に介在した弾性シート(ウレタンシート)の物性は、密度:0.25gr/m3 、圧縮率:18〜20%、弾性率:96%、硬度:20〜21°である。 Here, in order to confirm the effect of the polishing machine of the present embodiment, the following polishing test was performed. The physical properties of the elastic sheet (urethane sheet) interposed between the polishing surface plate and the fixed abrasive polishing sheet are as follows: density: 0.25 gr / m 3 , compression ratio: 18-20%, elastic modulus: 96%, hardness : 20 to 21 °.

(1)比較例
固定砥粒研磨シートとしてアルミナシートを使用し、上述した研磨方法によりカラーフィルタ表面の異常突起を研磨した。その際の研磨条件と研磨試験の結果を表2に示す。
(1) Comparative Example An alumina sheet was used as the fixed abrasive polishing sheet, and abnormal protrusions on the color filter surface were polished by the above-described polishing method. Table 2 shows the polishing conditions and the results of the polishing test.

Figure 2008290190
Figure 2008290190

表2に示すように、アルミナシートを使用した研磨では、異常突起を研削することはできるが、カラーフィルタの膜の表面にアルミナ砥粒による接触傷が多数発生しており、使用不可の状態であった。尚、この接触傷は、その後に仕上げ研磨を行っても緩和・解消することはできなかった。
(2)実施例
As shown in Table 2, in the polishing using an alumina sheet, abnormal protrusions can be ground, but a large number of contact scratches due to alumina abrasive grains are generated on the surface of the color filter film. there were. It should be noted that this contact scratch could not be alleviated / eliminated even after finishing polishing.
(2) Examples

固定砥粒研磨シートとしてシリカシートを使用し、カラーフィルタ表面の異常突起を研磨した。その際の研磨条件と研磨試験の結果を表3に示す。   A silica sheet was used as the fixed abrasive polishing sheet, and abnormal protrusions on the color filter surface were polished. Table 3 shows the polishing conditions and the results of the polishing test at that time.

Figure 2008290190
Figure 2008290190

表3に示すように、シリカシートを使用した研磨では、砥粒による接触傷を発生させることなく、異常突起を3〜5μmまで研削することができた。   As shown in Table 3, in the polishing using a silica sheet, abnormal protrusions could be ground to 3 to 5 μm without causing contact scratches due to abrasive grains.

以上の結果から、固定砥粒研磨シートの砥粒として、粒子径が10〜50nmのシリカ粒子を用いることにより、正常厚さの膜の厚みを減らさずに、異常突起300のみを効率良く研磨・除去することが可能であることが、確認された。   From the above results, by using silica particles having a particle diameter of 10 to 50 nm as the abrasive grains of the fixed abrasive polishing sheet, it is possible to efficiently polish only the abnormal protrusion 300 without reducing the thickness of the normal thickness film. It was confirmed that it could be removed.

本発明の実施形態による研磨機を装備したガラス基板(カラーフィルタ)の製造ラインの要部構成を示す平面図。The top view which shows the principal part structure of the manufacturing line of the glass substrate (color filter) equipped with the polisher by embodiment of this invention. 同、製造ラインの要部構成を示す側面図。The side view which shows the principal part structure of a manufacturing line. 研磨プレートの下部構成を示すガラス基板の搬送方向の側方から見た断面図。Sectional drawing seen from the side of the conveyance direction of the glass substrate which shows the lower part structure of a grinding | polishing plate. ガラス基板に研磨プレートを押圧させた時の状態を示す要部拡大図。The principal part enlarged view which shows a state when pressing a grinding | polishing plate against a glass substrate. 研磨シートの構造を示す断面図。Sectional drawing which shows the structure of an abrasive sheet. 研磨プレートを下から見た図。The figure which looked at the polishing plate from the bottom. 研磨ヘッドの構成を示すガラス基板の搬送方向の側方より見た断面図で、(a)は研磨プレートをガラス基板に押圧させる前の状態を示し、(b)は研磨プレートをガラス基板に押圧させた状態を示す。It is sectional drawing seen from the side of the conveyance direction of the glass substrate which shows the structure of a grinding | polishing head, (a) shows the state before pressing a polishing plate against a glass substrate, (b) presses a polishing plate against a glass substrate. Indicates the state of the 液晶表示装置用カラーフィルタの断面図。Sectional drawing of the color filter for liquid crystal display devices.

符号の説明Explanation of symbols

1 搬送経路(搬送コンベア)
3 下定盤
10 研磨ヘッド
20 研磨プレート
20a 研磨定盤面
21 弾性シート
23 研磨シート(固定砥粒研磨シート)
24 基材
26 研磨層
27 砥粒
CF カラーフィルタ
W ガラス基板
1 Transport route (transport conveyor)
3 Lower surface plate 10 Polishing head 20 Polishing plate 20a Polishing surface plate surface 21 Elastic sheet 23 Polishing sheet (fixed abrasive polishing sheet)
24 Base material 26 Polishing layer 27 Abrasive grain CF Color filter W Glass substrate

Claims (6)

膜が形成されたガラス基板の表面に、研磨定盤面に研磨シートを貼り付けた研磨プレートを押圧させつつ、該研磨プレートを前記ガラス基板に対して面内移動させることで、前記ガラス基板の表面の膜を前記研磨シートで研磨する研磨機において、
前記研磨シートの研磨層に含まれる砥粒の一次粒子径が10〜50nmであることを特徴とする研磨機。
The surface of the glass substrate is moved by moving the polishing plate in-plane with respect to the glass substrate while pressing the polishing plate having a polishing plate attached to the surface of the glass substrate on which the film is formed. In a polishing machine for polishing the film of the film with the polishing sheet,
A polishing machine, wherein a primary particle diameter of abrasive grains contained in a polishing layer of the polishing sheet is 10 to 50 nm.
前記砥粒の一次粒子径が10〜20nmであることを特徴とする請求項1に記載の研磨機。 The polishing machine according to claim 1, wherein a primary particle diameter of the abrasive grains is 10 to 20 nm. 前記砥粒はシリカ粒子であることを特徴とする請求項1または請求項2に記載の研磨機。 The polishing machine according to claim 1 or 2, wherein the abrasive grains are silica particles. 前記研磨シートは、弾性シートを介して前記研磨プレートの研磨定盤面に貼り付けられていることを特徴とする請求項1から請求項3までの何れかに記載の研磨機 The polishing machine according to any one of claims 1 to 3, wherein the polishing sheet is attached to a polishing platen surface of the polishing plate via an elastic sheet. 前記ガラス基板をその面方向に沿って搬送する搬送経路の下側に、前記ガラス基板が載る下定盤を配置し、
この下定盤の上方に、搬送されてきた前記ガラス基板の上側の表面を研磨するための研磨ヘッドを設け、
この研磨ヘッドの本体に、前記研磨シートを下に向けて、上定盤としての前記研磨プレートを上下方向移動自在に設けると共に、
前記研磨ヘッドの本体と前記研磨プレートとの間に、前記研磨プレートをガラス基板に押圧させ、且つその押圧力を調整する押圧調整機構を設け、
さらに、前記研磨ヘッドを、前記ガラス基板の搬送方向と直交する面内方向の運動成分を少なくとも含むようにオービタル運動させる駆動機構を設けたことを特徴とする請求項1から請求項4までの何れかに記載の研磨機。
The lower surface plate on which the glass substrate is placed is disposed below the conveyance path for conveying the glass substrate along the surface direction,
A polishing head for polishing the upper surface of the glass substrate that has been conveyed is provided above the lower surface plate,
In the main body of this polishing head, with the polishing sheet facing downward, the polishing plate as an upper surface plate is provided movably in the vertical direction,
Between the main body of the polishing head and the polishing plate, a pressing adjustment mechanism for pressing the polishing plate against the glass substrate and adjusting the pressing force is provided,
5. The driving mechanism according to claim 1, further comprising an orbital movement that causes the polishing head to include at least a movement component in an in-plane direction orthogonal to a conveyance direction of the glass substrate. A polishing machine according to crab.
前記ガラス基板は、ディスプレイパネルのカラーフィルタであり、前記膜は、RGBの着色膜であることを特徴とする請求項1から請求項5までの何れかに記載の研磨機。 The polishing machine according to any one of claims 1 to 5, wherein the glass substrate is a color filter of a display panel, and the film is an RGB colored film.
JP2007138170A 2007-05-24 2007-05-24 Polishing machine Withdrawn JP2008290190A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021079456A (en) * 2019-11-14 2021-05-27 株式会社三井ハイテック Surface processing apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021079456A (en) * 2019-11-14 2021-05-27 株式会社三井ハイテック Surface processing apparatus
JP7408356B2 (en) 2019-11-14 2024-01-05 株式会社三井ハイテック surface processing equipment

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