JP2008283089A - Inspecting apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an inspecting apparatus which can inspect reliably luminescent colors of plural LEDs packaged in a printed circuit board or the like. <P>SOLUTION: In the inspecting apparatus, probe arms 11, 12 are moved and a first probe pin 11a and a second probe pin 12a are brought into contact with a circuit pattern 51 where an electronic component to be subjected to electric measurement is packaged, so that a path for the first probe pin 11a, the electronic component and the second probe pin 12a is formed. Then, when the electronic component is the LED 52, electric measurement of the component is carried out by flowing electric current between the first probe pin 11a and the second probe pin 12a, and during this time, the light emitted by the electric measurement is guided to a spectroscope 30 through an optical fiber cable 20 attached to the second probe arm 12. Thus, wavelength measurement is carried out by the spectroscope 30 and color of the light is determined by a controller 40. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to an inspection apparatus that performs electrical measurement of a plurality of light emitters mounted on a printed circuit board and simultaneously inspects the light emission color of the light emitters.

  For example, there are those in which a large number of light emitters such as a warning lamp, a hazard lamp, a blinker lamp, and a shift lever lamp are mounted on a printed circuit board, such as a vehicle meter. Generally, a light emitting diode (LED) is used as a light emitter.

  In a vehicle meter, a predetermined color LED is mounted at a predetermined position on a printed circuit board. Then, there is a visual inspection of LED lighting after the assembly of the housing after mounting the components. That is, each LED is turned on and an inspector visually checks whether a predetermined color is emitted at a predetermined position of the vehicle meter.

  However, in the above-described conventional technique, since a visual inspection is performed, skilled skills are required. Further, as the number of LEDs mounted on one printed circuit board increases, an inspection error, that is, a problem that it is easy to overlook will occur. Since, for example, several tens to hundreds or more of LEDs are mounted on the printed circuit board of the vehicle meter, it is difficult to correctly inspect the positions and colors of all the LEDs by visual inspection. In particular, it was difficult for human eyes to distinguish between red and amber (orange), and it was easy to miss a mounting error.

  Further, the lighting visual inspection process is a separate process from the component mounting process. Therefore, if the LED mounting reel is mounted by mistake, there is a problem that a large number of defects such as 2000 elements occur. .

  A method of photographing each LED using a CCD camera and inspecting the emission color of each LED is conceivable. However, CCD cameras are widely used for image processing, and it is difficult to accurately identify colors with CCD sensitivity filters. In addition, a process using a CCD camera is added to all processes for manufacturing a printed circuit board, which increases the cost.

  An object of this invention is to provide the inspection apparatus which can test | inspect reliably the luminescent color of several LED mounted in the printed circuit board etc. in view of the said point.

  In order to achieve the above object, the present invention provides an electrical measurement target among a plurality of electronic components when performing electrical measurement of a plurality of electronic components mounted on a circuit board (50) on which a circuit pattern (51) is formed. Is a light emitting element (52), the tester controller (14) performs electrical measurement of the light emitting element (52), and an optical fiber attached to the second probe arm (12) while performing the electrical measurement. The light emitted from the light emitting element (52) is transmitted to the spectroscope (30) through the cable (20), the wavelength measurement is performed by the spectroscope (30), and the light is acquired by the spectroscope (30). It is an inspection apparatus that determines the color of light by making the determination by the determination unit (40) based on the light wavelength data.

  Thereby, the light emission color of a light emitting element (52) can be determined with a spectroscope (30), and the oversight and oversight by a mounting inspection of an electronic component or an inspector's visual inspection can be prevented. Since the wavelength of light is measured by the spectroscope (30), it is possible to reliably determine a color that is difficult for an inspector to distinguish, and to prevent an inspection omission and an inspection error.

  Further, since the emission color is inspected at the time of electrical measurement of the light emitting element (52), the light emitting element (52) can be inspected without adding another process for wavelength measurement.

  The light emission intensity of the light emitting element (52) mounted on the circuit board (50) is highest in the vertical direction, that is, in the vertical direction with respect to the mounting surface of the circuit board (50). Therefore, by transmitting the axis of the second probe arm (12) in the vertical direction, the light intensity of the light emitting element (52) is transmitted to the spectroscope (30) through the optical fiber cable (20) without decreasing. Can do.

  The spectroscope (30) has a storage unit (37) that stores the measured wavelength of light as data, and the data stored in the storage unit (37) based on a command from the determination unit (40). Can be output to the determination unit (40).

  In manufacturing the electronic apparatus using the inspection apparatus, each probe arm (11, 12) is moved, and the first probe pin is mounted on the circuit pattern (51) on which the electronic component to be subjected to electrical measurement is mounted. (11a) and the second probe pin (12a) are contacted to form a path of the first probe pin (11a), the electronic component, and the second probe pin (12a), and the electronic component is a light emitting element (52) While the electrical measurement is performed on the electronic component by passing a current between the first probe pin (11a) and the second probe pin (12a), the light emitted by the electrical measurement is transmitted to the second probe arm (12 ) Is led to the spectroscope (30) through the optical fiber cable (20) attached to the optical fiber cable (20), the wavelength is measured by the spectroscope (30), and the determination of the color of the light is performed by the determination unit (40). It can be carried out.

  By adopting the inspection step in the method of manufacturing an electronic component, if the electronic component is a light emitting element (52), electrical measurement and wavelength measurement can be performed simultaneously. Moreover, since the color is determined by measuring the wavelength with the spectroscope (30), it is possible to prevent oversight or oversight by the inspector.

  In addition, the code | symbol in the bracket | parenthesis of each said means shows the correspondence with the specific means as described in embodiment mentioned later.

(First embodiment)
Hereinafter, a first embodiment of the present invention will be described with reference to the drawings. The inspection apparatus shown in this embodiment inspects the positions and emission colors of LEDs, which are a plurality of light emitters mounted on a printed circuit board. An object to be inspected is a printed circuit board on which an LED is mounted. For example, when inspecting a printed circuit board on which a large number of LEDs are mounted, such as a printed circuit board of a vehicle meter, it is preferable to employ the inspection device shown in the present embodiment.

  FIG. 1 is a block diagram of an inspection apparatus according to an embodiment of the present invention. As shown in this figure, the inspection apparatus includes an in-circuit tester main body inspection unit 10, an optical fiber cable 20, a spectroscope 30, and a control device 40.

  The inspection unit 10 performs electrical measurement of the LED 52 as a light emitter mounted according to the circuit pattern 51 formed on the printed circuit board 50 arranged in the horizontal direction, and is a 4X-Y in-circuit tester. The inspection unit 10 includes a first probe arm 11 and a second probe arm 12, a drive unit 13, and a tester control unit 14. The printed circuit board 50 corresponds to the circuit board of the present invention, and the LED 52 corresponds to the light emitting element of the present invention.

  The first probe arm 11 and the second probe arm 12 each have a rectangular parallelepiped shape, each having a first probe pin 11a and a second probe pin 12a made of metal on one end side, and a drive mechanism for the drive unit 13 on the other end side. Is attached. The tips of the probe pins 11a and 12a are needle-shaped, and are driven against the circuit pattern 51 of the printed circuit board 50 by driving the probe arms 11 and 12, for electrical measurement of the LED 52 and other discrete components. Used.

  The drive unit 13 is a drive mechanism that adjusts the postures of the probe arms 11 and 12 and moves the positions three-dimensionally. Such a driving unit 13 moves each probe arm 11, 12 to a predetermined position of the circuit pattern 51 in the printed circuit board 50 according to a driving signal input from the tester control unit 14, and can perform electrical measurement. Each probe pin 11a, 12a is brought into contact with the circuit pattern 51.

  In addition, the drive part 13 can drive each probe arm 11 and 12 independently, and can also drive each probe arm 11 and 12 independently.

  The tester control unit 14 outputs a drive signal to the drive unit 13 to drive each probe arm 11, 12, and causes a current to flow through the circuit pattern 51 in contact with each probe pin 11 a, 12 a, thereby following the circuit pattern 51. It has a function of performing electrical measurement of electronic components such as mounted discrete components. Such a tester control unit 14 is a device including a CPU, a memory, a hard disk, and the like, and stores an electrical measurement program as software for performing electrical measurement. Furthermore, the tester control unit 14 includes an electrical characteristic measurement unit 14a as hardware for performing electrical measurement.

  The electrical characteristic measurement unit 14a performs electrical measurement of an electronic component mounted on the printed circuit board 50, and includes a constant current power source 14b, an ammeter 14c, and a voltmeter 14d. In such an electrical characteristic measuring unit 14a, a constant current power source 14b and an ammeter 14c are connected in series, and a voltmeter 14d is connected in parallel to the series connection. The constant current power supply 14b is electrically connected to the second probe pin 12a, and the ammeter 14c is electrically connected to the first probe pin 11a.

  Then, the electrical characteristic measuring unit 14a allows the probe pins 11a and 12a of the probe arms 11 and 12 to contact the circuit pattern 51 by driving the driving unit 13, and then a constant current is supplied to the electronic component by the constant current power source 14b. The voltage value between the probe pins 11a and 12a is measured with a voltmeter 14d. Thus, the voltage value acquired by the electrical characteristic measuring unit 14a is stored in the tester control unit 14 as inspection data.

  The hard disk of the tester control unit 14 stores in advance product data such as the position of the circuit pattern 51 of the printed circuit board 50 to be inspected and the position and color of the LED 52 mounted on the printed circuit board 50. Since the product data is different for each product, the product data of the net is stored in the tester control unit 14 at the time of inspection.

  The optical fiber cable 20 is a cable that transmits light taken in from one end to the other end. Among the electronic components mounted on the printed circuit board 50, the light emitted from the LED 52 during electrical measurement of the LED 52 is spectroscope 30. It plays a role to communicate to. The optical fiber cable 20 is preferably covered and protected by, for example, a resin tube.

  One end 21 of the optical fiber cable 20 is on one side surface of the second probe arm 12 of the inspection unit 10, specifically, on the side surface facing the first probe arm 11 side among the four side surfaces of the second probe arm 12 forming a rectangular parallelepiped. It is attached. As a method of attaching the optical fiber cable 20 to the second probe arm 12, for example, a method of clamping the second probe arm 12 and one end 21 of the optical fiber cable 20 with a U-shaped jig, A method of directly bonding the one end 21 of the fiber cable 20 to the side surface of the second probe arm 12 is employed.

  As described above, the long axis of the second probe arm 12 faces the vertical direction because the intensity of the light 60 emitted from the LEDs 52 mounted on the printed board 50 arranged in the horizontal direction is the printed board 50. This is because it is the highest in the direction perpendicular to the surface of the surface, that is, in the vertical direction.

  In this case, if the one end 21 of the optical fiber cable 20 is arranged at a position far from the LED 52, the intensity of light that can be transmitted to the spectroscope 30 becomes low. Conversely, if one end 21 of the optical fiber cable 20 is arranged at a position close to the LED 52, the intensity of light transmitted to the spectroscope 30 increases, and the intensity of light that can be detected by the spectroscope 30 is saturated. The peak wavelength cannot be detected by the spectroscope 30. Further, there is a problem that the optical fiber cable 20 interferes due to the influence of the LED 52. Therefore, it is preferable that the one end 21 of the optical fiber cable 20 is not affected by interference from the surroundings, and is a position where the intensity of light transmitted to the spectroscope 30 is neither too strong nor too weak.

  The other end 22 of the optical fiber cable 20 is attached to the spectroscope 30 so that light enters the spectroscope 30. Note that the optical fiber cable 20 has a flexibility that can be operated in accordance with the movement of the second probe arm 12, so there is no problem such as breakage during electrical measurement.

  As described above, since the long axis of the second probe arm 12 is oriented in the vertical direction and the first probe arm 11 is inclined with respect to the second probe arm 12, the probe arms 11 and 12 approach each other. Sometimes the optical fiber cable is not pinched by the probe arms 11 and 12. Further, since the first probe arm 11 is inclined so as to move away from the second probe arm 12, the one end 21 of the optical fiber cable 20 attached to the second probe arm 12 does not interfere with the influence of the first probe arm 11. It is also like.

  The spectroscope 30 separates the light transmitted through the optical fiber cable 20 into colors for each wavelength. FIG. 2 is an overall configuration diagram of the spectroscope 30 provided in the inspection apparatus shown in FIG. As shown in this figure, the spectroscope 30 includes an entrance slit 31, a collimating mirror 32, a transmission grating 33, a focusing mirror 34, an image sensor 35, an A / D conversion unit 36, and a storage unit 37. It has.

  The entrance slit 31 is a window portion that takes light emitted from the other end 22 of the optical fiber cable 20 into the spectrometer 30. The collimator mirror 32 is a mirror that reflects the light incident from the entrance slit 31 into the spectroscope 30 so as to be in a parallel state. The transmission grating 33 is a so-called diffraction grating, and disperses the light incident from the collimator mirror 32 for each wavelength when transmitting the light. The focusing mirror 34 is a concave mirror that forms an image on the image sensor 35 with the dispersed light incident from the transmission grating 33.

  The image sensor 35 receives light incident from the focusing mirror 34. For example, 2048 light receiving elements are arranged in a straight line. The image sensor 35 can acquire a peak wavelength having a wavelength in the range of, for example, 250 nm to 1000 nm. For example, when the light taken into the spectroscope 30 is red, a peak wavelength having a peak at, for example, 620 nm is measured.

  The A / D converter 36 converts the raw data of the peak wavelength acquired by the image sensor 35 into a digital signal. The storage unit 37 stores the peak wavelength data input from the A / D conversion unit 36 and outputs the stored data in response to an external request.

  The control device 40 requests data for all wavelengths from the spectroscope 30, searches for peaks from the data of all wavelengths input from the spectroscope 30, and determines the color, in response to a request from the tester control unit 14, The LED 52 has a function of outputting the determination result of the position and color of the LED 52 to the tester control unit 14. As such a control device 40, for example, a personal computer is adopted, and a wavelength determination program is stored as software for determining the color of the LED 52 mounted on the printed circuit board 50.

  The control device 40 and the spectroscope 30 are electrically connected by, for example, a USB connection cable. When the control device 40 outputs a trigger signal for requesting data to the spectroscope 30, measurement data is input from the spectroscope 30. It has come to be. In addition, the control apparatus 40 comes to the determination part of this invention. The above is the overall configuration of the inspection apparatus according to the present embodiment.

  Next, a method for inspecting the printed circuit board 50 using the above-described inspection apparatus will be described with reference to FIG. FIG. 3 is a flowchart showing the contents of the electrical measurement of the electronic component mounted on the printed circuit board 50 by the inspection apparatus shown in FIG. 1 and the measurement of the wavelength of the color emitted by the LED 52 among the electronic components.

  FIG. 3A is a flowchart showing the contents of electrical measurement of the printed circuit board 50, which starts when an electrical measurement program is executed in the inspection apparatus. FIG. 3B is a flowchart showing the contents of wavelength analysis / determination in the control device 40, which starts when the control device 40 executes the wavelength determination program in conjunction with the electrical measurement program. FIG. 3C is a flowchart showing the contents of wavelength measurement in the spectroscope 30. Hereinafter, electrical measurement and wavelength measurement in the inspection apparatus will be described according to the flow shown in FIG.

  When performing electrical measurement and wavelength measurement in the inspection apparatus, the printed circuit board 50 constituting the vehicle meter is an inspection target. In addition to electronic components, for example, 40 to 200 LEDs 52 are mounted on the printed circuit board 50. The light emission colors of the LEDs 52 mounted on the printed circuit board 50 are generally white, blue, green, amber (orange), and red.

  Before performing the inspection, the tester control unit 14 includes the circuit pattern 51 of the printed circuit board 50, the inspection point (information on position coordinates) of the electronic component, and data such as color, electrical measurement, and wavelength when the electronic component is the LED 52. It is assumed that product data such as standard values in measurement is stored in advance.

  Also, the inspection method shown below is employed in an inspection process in a manufacturing process for manufacturing an electronic device such as a vehicle meter, and is inspected immediately after the component mounting process of the electronic component on the printed circuit board 50 is completed. Suppose that a process is performed.

  First, as shown in FIG. 3A, the tester control unit 14 moves the probe arms 11 and 12 to the inspection point according to the product data, and sets the probe pins 11a and 12a to the circuit pattern 51 of the movement destination. Contact (step 100). When the electronic component at the position of each probe pin 11a, 12a is the LED 52, the tester control unit 14 outputs a wavelength measurement start signal to the control device 40 so as to measure the wavelength of light emitted from the LED 52 (step 110). On the other hand, when the electronic component at the position is not the LED 52 but another discrete component or the like, the tester control unit 14 proceeds to the next step without outputting the wavelength measurement start signal.

  Thereafter, a constant current is supplied to the electronic component by the constant current power source 14b in the electrical characteristic measuring unit 14a of the tester control unit 14, the electrical measurement of the electronic component is performed by the voltmeter 14d, and the results are accumulated (steps 120 and 130). ). Then, by inputting a drive signal from the tester control unit 14 to the drive unit 13, the probe arms 11 and 12 are moved to the next inspection point to be electrically measured (step 140). In the XY in-circuit tester, the measurement interval per inspection point is relatively high, such as several tens of milliseconds to several hundreds of milliseconds.

  At each probe arm 11, 12, it is determined whether or not there is a next inspection point, that is, whether or not electrical measurement has been completed at all inspection points (step 150), and electrical measurement is completed at all inspection points. If not, step 100 to step 140 are repeated for each inspection point. In this case, when each inspection point is the LED 52, the tester control unit 14 outputs a wavelength measurement start signal to the control device 40 each time (step 110).

  As described above, when the wavelength measurement start signal is output from the tester control unit 14 in step 110, the control device 40 inputs the wavelength measurement start signal from the tester control unit 14, as shown in FIG. (Step 200), and outputs the wavelength measurement start signal to the spectrometer 30 (Step 210).

  Then, as shown in FIG. 3C, when the spectrometer 30 receives a wavelength measurement start signal from the control device 40 (step 300), it starts wavelength measurement (step 310). Specifically, the tester control unit 14 outputs the wavelength measurement start signal to the control device 40 and then performs electrical measurement of the LED 52. However, since the current flows through the LED 52 during the electrical measurement, the LED 52 emits light. To do.

  Thus, the light emitted from the LED 52 for electrical measurement is taken in from the one end 21 of the optical fiber cable 20 attached to the second probe arm 12 and guided to the incident slit 31 of the spectrometer 30. The light guided into the spectroscope 30 is dispersed when reflected by the collimating mirror 32 and transmitted through the transmission grating 33, and is focused on the image sensor 35 by the focusing mirror 34. Then, the peak wavelength is acquired by the image sensor 35.

  FIG. 4 is a diagram illustrating an example of the peak wavelength measured by the image sensor 35 of the spectroscope 30. As shown in this figure, if the LED 52 emits red, a peak appears at 620 nm, for example, and if the LED 52 emits green, a peak appears at 525 nm, for example. In addition, blue, amber, and white have peak wavelengths with peaks. The spectroscope 30 stores the data indicating the peak wavelength obtained by the image sensor 35 as shown in FIG. 4 in the storage unit 37 via the A / D conversion unit 36 as accumulated data (step 310). The accumulated data stored in the storage unit 37 of the spectroscope 30 is peak wavelength data in one LED 52.

  On the other hand, the control device 40 finely adjusts the time lag with respect to the electrical measurement performed by the tester control unit 14 and outputs a wavelength measurement start signal to the spectrometer 30, and then captures the peak wavelength data acquired by the spectrometer 30. The accumulated data request signal is output to the spectroscope 30 (step 220). When the spectroscope 30 receives the accumulated data request signal from the control device 40 (step 320), it outputs the accumulated data of all wavelengths stored in the storage unit 37 to the control device 40 (step 330).

  Subsequently, when the accumulated data is input from the spectroscope 30 (step 230), the control device 40 analyzes and determines the accumulated data (step 240). Specifically, the control device 40 determines whether or not the peak wavelength peak indicated by the accumulated data is included within a certain range, and whether or not the emission color of the LED 52 that is the target of electrical measurement is correct. Determine.

  When the control device 40 analyzes and determines accumulated data in this way, in addition to determining whether or not the peak wavelength peak is included within a certain range, a color matching function based on JIS standard Z8701 is used. Tristimulus values can be obtained and chromaticity determination can be performed, or conversion to the main wavelength can be performed based on JIS standard Z8701, and determination at the main wavelength can be performed. In particular, for white determination, chromaticity determination is preferably performed.

  As shown in FIG. 4, the peak wavelength of the white emission color is composed of two peaks, one of which is substantially the same wavelength as the peak of the blue peak wavelength, for example. For this reason, if the determination is made based on whether or not the peak is included in a certain wavelength range, it is difficult to distinguish white from blue. However, since chromaticity is completely different between white and blue, it is possible to reliably determine white and blue.

  The control device 40 stores the results analyzed and determined as described above in a hard disk or the like. Then, the control device 40 determines whether or not wavelength measurement has been completed for all the LEDs 52 mounted on the printed circuit board 50 (step 250). If wavelength measurement has not been completed for all the LEDs 52, step 200 is performed. Returning to FIG. 4, the wavelength measurement of the LED 52 and the analysis / determination thereof are performed according to the wavelength measurement start signal input from the tester control unit 14. The determination result is stored in the control device 40 for each determination. The determination result indicates information such as whether or not the wavelength-measured LED 52 is correctly mounted and whether the emission intensity is good or bad.

  In addition, since the control apparatus 40 receives product data from the tester control part 14, it has the information of LED52 which should carry out wavelength measurement. Based on this information, the control device 40 can determine whether or not wavelength measurement has been completed for all the LEDs 52 in step 250.

  Such wavelength measurement of the LED 52 is performed simultaneously with the electrical measurement of the LED 52 when the tester control unit 14 performs electrical measurement of the LED 52 among all the electronic components mounted on the printed circuit board 50. No process is required, and the cycle time is almost the same as in the case of electrical measurement.

  As shown in FIG. 3A, when it is determined in step 150 that electrical measurement has been completed for all the inspection points, the tester control unit 14 outputs a determination result request signal to the control device 40 (step 160). ). The control device 40 that has received the determination result request signal outputs the wavelength measurement results of all the LEDs 52 to the tester control unit 14 (steps 260 and 270).

  The tester control unit 14 receives the result of the wavelength measurement from the control device 40, comprehensively determines the result of the electrical measurement performed earlier and the determination result of the wavelength measurement received from the control device 40, and inspected the printed circuit board. It is determined whether 50 is within the standard as a product (step 170).

  Thereafter, the probe arms 11 and 12 are moved from the printed board 50 (step 180), and the inspection of the printed board 50 is completed. The printed circuit board 50 determined to have no problem as a product in the inspection is attached to the housing of the vehicle meter.

  As described above, in the present embodiment, when the electronic component mounted on the printed circuit board 50 is the LED 52, the light emitted from the LED 52 at the time of electrical measurement of the LED 52 is taken into the spectroscope 30, that is, the wavelength of the LED 52 is measured. It is characterized by performing electrical measurement and wavelength measurement simultaneously.

  Thereby, even if an inspector does not look at LED52, the peak wavelength of the light emitted from LED52 by the spectroscope 30 can be acquired, and the emission color of the LED52 can be reliably determined based on the peak wavelength. it can. Therefore, it is possible to reliably distinguish and determine the light emission colors that are easily overlooked by the inspector, for example, red and amber, and it is possible to prevent an error in mounting the LED 52 on the printed circuit board 50 from being missed.

  Further, even if many LEDs 52 are mounted on the printed circuit board 50, since wavelength measurement is performed at the time of electrical measurement of the LEDs 52, inspection omissions and inspection errors can be prevented. According to this invention, it is possible to abolish the visual inspection of the emission color of the LED 52.

  Thus, since it performs simultaneously with the electrical measurement of the electronic component mounted in the printed circuit board 50, it can test | inspect, without adding the time for performing the process for wavelength measurement, or an inspection process.

  Furthermore, if the inspection process is performed immediately after the component mounting process as described above, the number of defects generated when the mounting reel is mounted by mistake can be minimized (for example, several tens of elements).

  At the time of inspection, for example, by setting information on the color to be determined in the control device 40 in advance, it is possible to determine the LEDs 52 of all colors.

(Other embodiments)
When one end 21 of the optical fiber cable 20 is attached to the second probe arm 12 close to the LED 52, a transmission filter can be provided in the spectroscope 30 to reduce the intensity of light incident into the spectroscope 30. Further, when the one end 21 of the optical fiber cable 20 is attached to the second probe arm 12 away from the LED 52, the peak wavelength can be obtained by increasing the light integration time in the spectroscope 30. Furthermore, a lens can be provided at one end 21 of the optical fiber cable 20 to adjust the intensity of incident light.

  If the relative intensity data of the wavelength is used, the luminance can be measured.

  Note that the steps shown in each figure correspond to means for realizing the function, and each step of the flowchart shown in FIG. 3 can be configured as hardware.

It is a block block diagram of the inspection apparatus which concerns on one Embodiment of this invention. It is a whole block diagram of the spectroscope with which the inspection apparatus shown by FIG. 1 was equipped. It is the flowchart which showed the content of the electrical measurement of the electronic component mounted in the printed circuit board 50 with the inspection apparatus shown by FIG. 1, and the measurement of the wavelength of the color which LED emits among electronic components. It is the figure which showed an example of the peak wavelength measured with the image sensor of a spectrometer.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 10 ... In-circuit tester main body test | inspection part, 11 ... 1st probe arm, 11a ... 1st probe pin, 12 ... 2nd probe arm, 12a ... 2nd probe pin, 13 ... Drive part, 14 ... Tester control part, 20 ... Optical fiber cable, 21 ... one end, 22 ... other end, 30 ... spectrometer, 37 ... storage unit, 40 ... control device, 50 ... printed circuit board, 51 ... circuit pattern, 52 ... LED.

Claims (3)

An inspection apparatus that performs electrical measurement of a plurality of electronic components mounted on a circuit board (50) on which a circuit pattern (51) is formed,
A first probe arm (11) provided with a first probe pin (11a) on one end of the columnar shape and a second probe arm (12) provided with a second probe pin (12a) on one end of the columnar shape; ,
It has information on the position and type of the electronic component that performs electrical measurement, and drives the drive unit (13) according to the information to move the first probe arm (11) and the second probe arm (12). The first probe pin (11a) is brought into contact with the first probe pin (11a) and the second probe pin (12a) by contacting the circuit pattern (51) on which the electronic component to be subjected to electrical measurement is mounted. A path of the electronic component and the second probe pin (12a) is formed, and an electric current is passed between the first probe pin (11a) and the second probe pin (12a) to perform electrical measurement of the electronic component. An inspection unit (10) having a tester control unit (14);
An optical fiber cable (20) having one end (21) attached to a side surface of the second probe arm (12) and taking in light from the one end (21);
A spectroscope (30) connected to the other end (22) of the optical fiber cable (20), taking in the light guided by the optical fiber cable (20), and measuring the wavelength of the light;
A determination unit (40) that determines a color based on the wavelength of light measured by the spectroscope (30) and outputs the determination result to the tester control unit (14);
When the object of electrical measurement among the plurality of electronic components is the light emitting element (52), the inspection unit (10) performs electrical measurement of the light emitting element (52) by the tester control unit (14). The light emitted from the light emitting element (52) is transmitted to the spectroscope (30) through the optical fiber cable (20) while performing the electrical measurement, and the wavelength measurement is performed by the spectroscope (30). After that, the color of the light is determined by the determination unit (40) based on the light wavelength data acquired by the spectroscope (30). Inspection device. The spectroscope (30) includes a storage unit (37) that stores the measured wavelength of light as data, and the data stored in the storage unit (37) based on a command from the determination unit (40). The inspection apparatus according to claim 1, wherein the inspection device is configured to output to the determination unit. An electronic device manufacturing method using the inspection device according to claim 1,
Each probe arm (11, 12) is moved, and the first probe pin (11a) and the second probe pin (12a) are brought into contact with a circuit pattern (51) on which electronic components to be subjected to electrical measurement are mounted. And forming a path for the first probe pin (11a), the electronic component, and the second probe pin (12a);
When the electronic component is a light emitting device (52), the current is passed between the first probe pin (11a) and the second probe pin (12a) to perform electrical measurement of the electronic component, The light emitted by the electrical measurement is guided to the spectroscope (30) through the optical fiber cable (20) attached to the second probe arm (12), and the wavelength measurement is performed by the spectroscope (30). And a step of determining the color of light by the determination unit (40).

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