JP2008279762A - Multilayer structure metal mask and its manufacturing process - Google Patents

Multilayer structure metal mask and its manufacturing process Download PDF

Info

Publication number
JP2008279762A
JP2008279762A JP2008102083A JP2008102083A JP2008279762A JP 2008279762 A JP2008279762 A JP 2008279762A JP 2008102083 A JP2008102083 A JP 2008102083A JP 2008102083 A JP2008102083 A JP 2008102083A JP 2008279762 A JP2008279762 A JP 2008279762A
Authority
JP
Japan
Prior art keywords
layer
conductive substrate
electroless plating
electroplating
metal mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2008102083A
Other languages
Japanese (ja)
Other versions
JP5394652B2 (en
Inventor
Keisuke Takei
圭介 武井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bon Mark Co Ltd
Original Assignee
Bon Mark Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bon Mark Co Ltd filed Critical Bon Mark Co Ltd
Priority to JP2008102083A priority Critical patent/JP5394652B2/en
Publication of JP2008279762A publication Critical patent/JP2008279762A/en
Application granted granted Critical
Publication of JP5394652B2 publication Critical patent/JP5394652B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Printing Plates And Materials Therefor (AREA)
  • Screen Printers (AREA)
  • Manufacture Or Reproduction Of Printing Formes (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To obtain a multilayer structure metal mask in which by putting an electroless plating layer the difference of plate thicknesses between a region inside the pattern region and a region outside the pattern region becomes smaller and the plate thickness of the region outside the pattern region becomes thicker as compared with electroplating, the strength as the metal mask entirety is raised, and the elongation at the time of printing can be decreased. <P>SOLUTION: The multilayer structure metal mask has a multilayer type film structure formed of an electroplating layer formed on an odd number layer including the first layer, and a electroless plating layer formed on an even number layer including the second layer. A manufacturing process of the multilayer structure metal mask includes the steps of applying a sensitive film resist on a base material, baking and hardening the sensitive film resist by exposure, removing a resist part which was not hardened to form the resist part which was hardened to become a pattern on the base material, forming an electroplating layer as the first layer on a part on which a resist part is not formed on the substrate, forming the electroless plating layer as the second layer on the electroplating layer of the first layer, removing the hardened resist part, and stripping the electroplating layer and the electroless plating layer from the base material. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

この発明は、無電解めっき層と電気めっき層とを含む2層以上の多層型皮膜構造を持つ多層構造メタルマスク及びその製造方法に関するものである。   The present invention relates to a multilayer structure metal mask having a multilayer film structure including two or more layers including an electroless plating layer and an electroplating layer, and a method for manufacturing the same.

従来、電気めっきを用いて、多層構造メタルマスクを製作する方法は良く知られている(例えば、特許文献1、2)。   Conventionally, a method of manufacturing a multilayer structure metal mask using electroplating is well known (for example, Patent Documents 1 and 2).

特開平4−166844号公報JP-A-4-166844 特開平5−85077号公報JP-A-5-85077

従来の多層構造メタルマスクを製作する方法では、電気めっきを用いて、多層構造メタルマスクを製作した場合、高密度パターンを持つメタルマスクの板厚は、そのパターン領域以内とパターン領域以外とで板厚の差が大きく出ることになる。近年のメタルマスクは、高密度、薄型化の傾向にあり、この場合は板厚が均一なメタルマスクと比較すると被膜体積が減少する。板厚が薄いメタルマスク(10〜80μm)ではマスク強度に影響をしてハイテンションの紗張り下では伸びが発生しトータルピッチ精度の低下を招いている。場合によっては指定テンション以下での破断となる場合がある。又、パターン領域内であっても、パターン領域外エリアとの境付近では板厚が薄くなる傾向にある。その場合、印刷される印刷体(導電ペースト、樹脂、インク等)の体積が少なくなり印刷量のバラツキが問題となっている。   In the conventional method of manufacturing a multi-layered metal mask, when a multi-layered metal mask is manufactured using electroplating, the thickness of the metal mask having a high-density pattern must be within the pattern area and other than the pattern area. There will be a large difference in thickness. In recent years, metal masks tend to be dense and thin. In this case, the coating volume is reduced as compared with a metal mask having a uniform plate thickness. A thin metal mask (10 to 80 μm) has an influence on the mask strength, and elongation occurs under high tension tension, resulting in a decrease in total pitch accuracy. In some cases, it may break under specified tension. Even within the pattern area, the plate thickness tends to be thin near the boundary with the area outside the pattern area. In that case, the volume of the printed body (conductive paste, resin, ink, etc.) to be printed is reduced, and there is a problem of variations in the printing amount.

この発明は、上述のような課題を解決するためになされたもので、無電解めっき層を必ず入れることにより無電解めっきの特性である均一析出(過剰析出しない)を利用し無電解めっき層と電気めっき層とを含む2層以上の多層型皮膜構造とし、電気めっき層を極力薄くする事により板厚の均一化を図り、板厚の均一化により総体積の減少をなくし印刷時の伸びを減少させることができ、無電解めっき被膜のもうひとつの特性である高硬度皮膜の多層構造メタルマスク及びその製造方法を提供するものである。   The present invention has been made to solve the above-described problems, and by using an electroless plating layer, it is necessary to use uniform precipitation (not excessive precipitation), which is a characteristic of electroless plating. A multi-layered film structure with two or more layers including an electroplating layer. By making the electroplating layer as thin as possible, the plate thickness is made uniform, and by making the plate thickness uniform, the total volume is not reduced and the elongation during printing is increased. The present invention provides a multi-layer metal mask having a high hardness film, which is another characteristic of an electroless plating film, and a method for manufacturing the same.

この発明に係る多層構造メタルマスクにおいては、第1層目を含む奇数層に形成された電気めっき層と、第2層目を含む偶数層に形成された無電解めっき層と、からなる多層型皮膜構造を持つものである。   In the multilayer structure metal mask according to the present invention, a multilayer type comprising an electroplating layer formed in an odd layer including the first layer and an electroless plating layer formed in an even layer including the second layer. It has a film structure.

また、この発明に係る多層構造メタルマスクの製造方法においては、導電性基材を用意し、導電性基材に付着している油等を除去する工程と、導電性基材上に感光膜レジストを塗布する工程と、感光膜レジストを露光により焼き付けて硬化させる工程と、露光により硬化しなかったレジスト部を除去するとともに、導電性基材上にパターンとなる硬化したレジスト部を形成する工程と、導電性基材上のレジスト部が形成されていない部分に、第1層目として電気めっき層を形成する工程と、第1層目の電気めっき層の上に、第2層目として無電解めっき層を形成する工程と、硬化したレジスト部を除去する工程と、導電性基材から電気めっき層及び無電解めっき層を一体的に剥がす工程とを備えたものである。   Further, in the method for producing a multilayer structure metal mask according to the present invention, a step of preparing a conductive substrate, removing oil and the like adhering to the conductive substrate, and a photosensitive film resist on the conductive substrate. A step of applying a photo resist, a step of baking and curing the photosensitive film resist by exposure, a step of removing a resist portion that has not been cured by exposure, and forming a cured resist portion that becomes a pattern on the conductive substrate, and A step of forming an electroplating layer as a first layer on a portion of the conductive base material where the resist portion is not formed, and an electroless layer as a second layer on the first electroplating layer The method includes a step of forming a plating layer, a step of removing the cured resist portion, and a step of integrally peeling the electroplating layer and the electroless plating layer from the conductive substrate.

また、この発明に係る多層構造メタルマスクの製造方法においては、導電性基材を用意し、導電性基材に付着している油等を除去する工程と、導電性基材上に感光膜レジストを塗布する工程と、感光膜レジストを露光により焼き付けて硬化させる工程と、露光により硬化しなかったレジスト部を除去するとともに、導電性基材上にパターンとなる硬化したレジスト部を形成する工程と、導電性基材上のレジスト部が形成されていない部分に、第1層目として電気めっき層を形成する工程と、第1層目の電気めっき層の上に、第2層目として無電解めっき層を形成する工程と、第2層目の無電解めっき層の上に、電気めっき層及び無電解めっき層を交互に形成する工程と、硬化したレジスト部を除去する工程と、導電性基材から電気めっき層及び無電解めっき層の全てを一体的に剥がす工程とを備えたものである。   Further, in the method for producing a multilayer structure metal mask according to the present invention, a step of preparing a conductive substrate, removing oil and the like adhering to the conductive substrate, and a photosensitive film resist on the conductive substrate. A step of applying a photo resist, a step of baking and curing the photosensitive film resist by exposure, a step of removing a resist portion that has not been cured by exposure, and forming a cured resist portion that becomes a pattern on the conductive substrate, and A step of forming an electroplating layer as a first layer on a portion of the conductive base material where the resist portion is not formed, and an electroless layer as a second layer on the first electroplating layer A step of forming a plating layer, a step of alternately forming an electroplating layer and an electroless plating layer on the second electroless plating layer, a step of removing the cured resist portion, and a conductive group From electroplating layer to electroplating layer All of the electroless plating layer is obtained by a step of peeling integrally.

この発明によれば、無電解めっき層を必ず入れることにより無電解めっきの特性である均一析出(過剰析出しない)を利用し無電解めっき層と電気めっき層とを含む2層以上の多層型皮膜構造とし、電気めっき層を極力薄くする事により板厚の均一化を図り、板厚の均一化により総体積の減少をなくし印刷時の伸びを減少させることができ、無電解めっき被膜のもうひとつの特性である高硬度皮膜の多層構造メタルマスクを得ることができる。   According to the present invention, a multi-layered film having two or more layers including an electroless plating layer and an electroplating layer utilizing the uniform precipitation (not excessive precipitation) which is a characteristic of electroless plating by always including an electroless plating layer. The thickness of the electroplating layer is made as thin as possible, and the plate thickness is made uniform. By making the plate thickness uniform, the total volume can be reduced and the elongation during printing can be reduced. It is possible to obtain a multi-layer structure metal mask having a high hardness film having the above characteristics.

実施の形態1.
図1〜図12はこの発明の実施の形態1における多層構造メタルマスクの製造方法の各工程を順番に示す断面図、図13はこの発明の多層構造メタルマスクを比較例のメタルマスクと比較して評価した時のパターン概略構造を示す平面図、図14はこの発明の多層構造メタルマスクと比較例のメタルマスクの各測定箇所における板厚測定値を示す比較表、図15はこの発明の多層構造メタルマスクと比較例のメタルマスクの板厚差を示す比較表、図16はこの発明の多層構造メタルマスクと比較例のメタルマスクの各測定箇所における板厚測定値を示す特性図、図17はこの発明の多層構造メタルマスクと比較例のメタルマスクのピッチ距離での伸び量を示す比較表、図18はこの発明の多層構造メタルマスクと比較例のメタルマスクのピッチ距離での伸び量を示す特性図である。
Embodiment 1 FIG.
1 to 12 are cross-sectional views sequentially showing the steps of the manufacturing method of the multilayer structure metal mask according to Embodiment 1 of the present invention. FIG. 13 is a comparison of the multilayer structure metal mask of the present invention with the metal mask of the comparative example. 14 is a plan view showing the schematic structure of the pattern when evaluated, FIG. 14 is a comparison table showing the measured thickness values of the multilayer structure metal mask of the present invention and the metal mask of the comparative example, and FIG. 15 is a multilayer table of the present invention. FIG. 16 is a characteristic chart showing plate thickness measurement values at respective measurement points of the multilayer metal mask of the present invention and the metal mask of the comparative example, and FIG. FIG. 18 is a comparison table showing the elongation amount at the pitch distance between the multilayer structure metal mask of the present invention and the metal mask of the comparative example, and FIG. 18 shows the pitch of the multilayer structure metal mask of the present invention and the metal mask of the comparison example. Distance is a characteristic diagram showing the amount of elongation at.

この発明による多層構造メタルマスクの製造方法は、先ず、導電性基材(SUS等)1を準備する(図1参照)。この導電性基材1に付着している油等を脱脂液2で除去する(図2参照)。油等を除去された導電性基材1上に感光膜レジスト3を塗布する(図3参照)。次に、パターンを設ける側にネガタイプのフィルム4を乗せて露光により焼き付ける(図4参照)。この時、フィルム4の黒い箇所は光が通らないため、レジスト部3aは硬化せず、光が通ったレジスト部3bが硬化する。なお、ここでは、ネガタイプのフィルム4を使用しているが、紫外線光を用いた直描式の露光の場合は、フィルム4を使用しない。次に、露光により硬化しなかったレジスト部3aを現像液5により除去し(図5参照)、導電性基材1上にパターンとなる硬化したレジスト部3bが残る(図6参照)。次に、導電性基材1のレジスト部3bが形成されていない部分の表面に、第1層目として、過剰析出を抑制できる低電流密度で、例えば板厚が約5μmとなるように第1の電気めっき層6を形成する(図7参照)。この第1層目の電気めっき層6の形成は、例えばスルファミン酸ニッケル220〜250g/l、塩化ニッケル20〜50g/l、クエン酸10〜30g/l、NTS(1.3.6−ナフタリントリスルフォン酸ナトリウム)1〜3g/l、電流密度0.1〜2A/dm、pH4.0、浴温50℃のスルファミン酸ニッケル浴からなる電気めっき槽に入れることにより行う。なお、電流密度は、好ましくは0.1〜0.25A/dmの範囲が望ましい。そして、第1層目の電気めっき層6の形成が終わったら、電気めっき槽から引き上げて水洗い7する(図8参照)。 In the method of manufacturing a multilayer metal mask according to the present invention, first, a conductive substrate (SUS or the like) 1 is prepared (see FIG. 1). Oil or the like adhering to the conductive substrate 1 is removed with a degreasing liquid 2 (see FIG. 2). A photosensitive film resist 3 is applied on the conductive substrate 1 from which oil or the like has been removed (see FIG. 3). Next, a negative type film 4 is placed on the side on which the pattern is provided and is printed by exposure (see FIG. 4). At this time, since light does not pass through the black portion of the film 4, the resist portion 3a is not cured, and the resist portion 3b through which light passes is cured. Here, the negative type film 4 is used, but the film 4 is not used in the case of direct drawing type exposure using ultraviolet light. Next, the resist portion 3a that has not been cured by exposure is removed by the developer 5 (see FIG. 5), and the cured resist portion 3b that becomes a pattern remains on the conductive substrate 1 (see FIG. 6). Next, on the surface of the portion of the conductive base material 1 where the resist portion 3b is not formed, as a first layer, the first current is set to a low current density capable of suppressing excessive precipitation, for example, a plate thickness of about 5 μm. The electroplating layer 6 is formed (see FIG. 7). The formation of the first electroplating layer 6 is, for example, nickel sulfamate 220 to 250 g / l, nickel chloride 20 to 50 g / l, citric acid 10 to 30 g / l, NTS (1.3.6-naphthalene triflate). (Sodium sulfonate) 1-3 g / l, current density 0.1-2 A / dm 2 , pH 4.0, bath temperature 50 ° C. The current density is preferably is preferably in the range of 0.1~0.25A / dm 2. Then, when the formation of the first electroplating layer 6 is completed, the electroplating layer 6 is pulled up and washed with water 7 (see FIG. 8).

この発明の特徴は、第1層目の電気めっき層6の上に第2層目として、過剰析出しない無電解めっき層8を形成することにある(図9参照)。この第2層目の無電解めっき層8の形成は、例えば硫酸ニッケル20g/l、グリシン5g/l、次亜リン酸ナトリウム20g/l、ビスマス0.2ppm、pH6.0、浴温60℃の無電解めっき浴からなる無電解めっき槽に入れることにより行う。ここで、第1層目の電気めっき層6の上に第2層目として、例えば板厚が約30μmとなるように過剰析出しない無電解めっき層8を形成することにより、板厚のばらつきがパターン領域以内とパターン領域以外でその差が小さくなる。つまりパターン領域外の板厚を厚くすることが可能となる。結果としてメタルマスク全体としての強度が上がり、伸びを減少させることができる。また、パターン領域内の板厚のばらつきを低減させることにより、印刷されるハンダ量のばらつきが小さくなる。そして、第2層目の無電解めっき層8の形成が終わったら、無電解めっき槽から引き上げて水洗い9する(図10参照)。次に、この第2層目の無電解めっき層8上に第3層目として、過剰析出を抑制できる低電流密度で、例えば板厚が約5μmとなるように第2の電気めっき層10を形成する(図11参照)。この第3層目の第2の電気めっき層10の形成は、第1の電気めっき層6と同様、例えばスルファミン酸ニッケル220〜250g/l、塩化ニッケル20〜50g/l、クエン酸10〜30g/l、NTS(1.3.6−ナフタリントリスルフォン酸ナトリウム)1〜3g/l、電流密度0.1〜2A/dm、pH4.0、浴温50℃のスルファミン酸ニッケル浴からなる電気めっき槽に入れることにより行う。なお、電流密度は、好ましくは0.1〜0.25A/dmの範囲が望ましい。そして、第3層目の電気めっき10の形成が終わったら、電気めっき槽から引き上げ、剥離液により硬化したレジスト部3bを除去し、更に導電性基材1から剥がすことにより、3層構造メタルマスクが完成する(図12参照)。完成された3層構造メタルマスクは、電気めっき層の合計板厚(5μm+5μm=10μm)と無電解めっき層の合計板厚(30μm)との板厚比が1:3である。
この発明による多層構造メタルマスクは、交互に積層形成される電気めっき層の合計板厚と無電解めっき層の合計板厚との板厚比が、1:0.5〜30の範囲であれば良いが、好ましくは、1:2〜10の範囲が良い。その理由は、電気めっき層の板厚が薄過ぎると、電気めっき層にピンホールが発生する恐れが高くなるためである。また、無電解めっき層の板厚が厚過ぎると、無電解めっきは時間がかかり過ぎ、作業時間が長くなるためである。なお、板厚比が1:0.5というのは、3層構造メタルマスクの場合で、第1層目と第3層目の電気めっき層の板厚がそれぞれ5μm、第2層目の無電解めっき層の板厚が5μmの場合である。
A feature of the present invention is that an electroless plating layer 8 that does not excessively deposit is formed as a second layer on the first electroplating layer 6 (see FIG. 9). Formation of the second electroless plating layer 8 is, for example, nickel sulfate 20 g / l, glycine 5 g / l, sodium hypophosphite 20 g / l, bismuth 0.2 ppm, pH 6.0, bath temperature 60 ° C. It is performed by putting it in an electroless plating bath consisting of an electroless plating bath. Here, as the second layer is formed on the first electroplating layer 6, for example, by forming the electroless plating layer 8 that does not excessively precipitate so that the plate thickness is about 30 μm, the variation in the plate thickness can be reduced. The difference is smaller within the pattern area and outside the pattern area. That is, it is possible to increase the plate thickness outside the pattern region. As a result, the strength of the entire metal mask is increased, and the elongation can be reduced. Further, by reducing the variation in the plate thickness in the pattern area, the variation in the amount of solder to be printed is reduced. When the formation of the second electroless plating layer 8 is completed, the electroless plating layer 8 is lifted from the electroless plating tank and washed 9 (see FIG. 10). Next, the second electroplating layer 10 is formed as a third layer on the second electroless plating layer 8 at a low current density capable of suppressing excessive precipitation, for example, so that the plate thickness is about 5 μm. Form (see FIG. 11). The formation of the second electroplating layer 10 of the third layer is the same as that of the first electroplating layer 6. For example, nickel sulfamate 220 to 250 g / l, nickel chloride 20 to 50 g / l, citric acid 10 to 30 g / L, NTS (1.3.6-Naphthalene sodium trisulfonate) 1 to 3 g / l, current density 0.1 to 2 A / dm 2 , pH 4.0, bath temperature 50 ° C. nickel sulfamate bath This is done by placing it in a plating tank. The current density is preferably is preferably in the range of 0.1~0.25A / dm 2. Then, after the formation of the third layer of electroplating 10 is finished, the resist layer 3b is removed from the electroplating tank, is removed from the conductive substrate 1 by removing the resist portion 3b cured by the stripping solution. Is completed (see FIG. 12). In the completed three-layer structure metal mask, the plate thickness ratio of the total plate thickness of the electroplating layer (5 μm + 5 μm = 10 μm) and the total plate thickness of the electroless plating layer (30 μm) is 1: 3.
The multilayer structure metal mask according to the present invention has a thickness ratio between the total thickness of the electroplated layers formed alternately and the total thickness of the electroless plated layers in the range of 1: 0.5 to 30. A range of 1: 2 to 10 is preferable. The reason is that if the plate thickness of the electroplating layer is too thin, there is a high possibility that pinholes are generated in the electroplating layer. Moreover, if the plate thickness of the electroless plating layer is too thick, electroless plating takes too much time and the working time becomes longer. The thickness ratio is 1: 0.5 in the case of a three-layer structure metal mask. The thicknesses of the first and third electroplating layers are 5 μm and the second layer has no thickness. In this case, the thickness of the electrolytic plating layer is 5 μm.

図13はこの発明の多層構造メタルマスクを比較例のメタルマスクと比較して評価した時のパターン概略図であり、用いたパターンは、開口径:0.15mm、開口間距離:0.045mm、配置範囲は直径約18cmの円状パターンエリア11である。円状パターンの中心を通る直線X−Xを取り、それを円内で16等分し、各測定箇所No.X3〜X18の板厚を測定する。測定箇所No.X1、X2、X19、X20については、円状パターンエリア11外のベース部の板厚である。なお、円状パターンの中心を通る直線Y−Yについても同様である。   FIG. 13 is a schematic diagram of a pattern when the multilayer structure metal mask of the present invention is evaluated in comparison with the metal mask of the comparative example. The pattern used has an opening diameter of 0.15 mm, a distance between openings: 0.045 mm, The arrangement range is a circular pattern area 11 having a diameter of about 18 cm. A straight line XX passing through the center of the circular pattern is taken, and it is divided into 16 equal parts within the circle, and the plate thicknesses of the respective measurement locations No. X3 to X18 are measured. About measurement location No. X1, X2, X19, X20, it is the plate | board thickness of the base part outside the circular pattern area 11. FIG. The same applies to the straight line YY passing through the center of the circular pattern.

図14はこの発明の多層構造メタルマスクと比較例のメタルマスクの各測定箇所における板厚測定値を示す比較表である。表左端上段のマスク(1)は、0.5A/dmの電流密度を作業条件として作成した比較例1としてのメタルマスクである。また、表左端中段のマスク(2)は、0.25A/dmの電流密度を作業条件として作成した比較例2としてのメタルマスクである。また、表左端下段のマスク(3)は、0.25A/dmの電流密度で、例えば板厚が約5μmとなるように第1層目の電気めっき層を形成し、その上に第2層目として例えば板厚が約30μmとなるように過剰析出しない無電解めっき層を形成し、更にその上に第3層目として0.25A/dmの電流密度で、例えば板厚が約5μmとなるように第2の電気めっき層を形成したこの発明の多層構造メタルマスクである。測定値は、各測定箇所No.X1〜X20の測定値を単位:μmで示している。 FIG. 14 is a comparison table showing plate thickness measurement values at each measurement location of the multilayer structure metal mask of the present invention and the metal mask of the comparative example. A mask (1) at the upper left end of the table is a metal mask as Comparative Example 1 created with a current density of 0.5 A / dm 2 as a working condition. The middle mask (2) at the left end of the table is a metal mask as a comparative example 2 created by using a current density of 0.25 A / dm 2 as a working condition. The lower left mask (3) has a first electroplating layer having a current density of 0.25 A / dm 2 and a thickness of about 5 μm, for example. As a layer, for example, an electroless plating layer that does not excessively precipitate is formed so that the plate thickness is about 30 μm, and further, as a third layer, a current density of 0.25 A / dm 2 , for example, a plate thickness of about 5 μm. This is a multilayer structure metal mask of the present invention in which a second electroplating layer is formed so that The measured value indicates the measured value of each measurement location No. X1 to X20 in the unit: μm.

図15はこの発明の多層構造メタルマスクと比較例のメタルマスクの板厚差を示す比較表である。表左端上段のマスク(1)は、0.5A/dmの電流密度を作業条件として作成した比較例1としてのメタルマスクである。また、表左端中段のマスク(2)は、0.25A/dmの電流密度を作業条件として作成した比較例2としてのメタルマスクである。また、表左端下段のマスク(3)は、0.25A/dmの電流密度で、例えば板厚が約5μmとなるように第1層目の電気めっき層を形成し、その上に第2層目として例えば板厚が約30μmとなるように過剰析出しない無電解めっき層を形成し、更にその上に第3層目として0.25A/dmの電流密度で、例えば板厚が約5μmとなるように第2の電気めっき層を形成したこの発明の多層構造メタルマスクである。板厚差は、ベースとパターン間の測定値の差を単位:μmで示している。
図16はこの発明の多層構造メタルマスクと比較例のメタルマスクの各測定箇所における板厚測定値を示す特性図で、横軸に各測定箇所No.X1〜X20、縦軸に板厚(μm)を示し、この発明の多層構造メタルマスクの板厚差が最も少ないことが判る。
FIG. 15 is a comparison table showing the difference in plate thickness between the multilayer structure metal mask of the present invention and the metal mask of the comparative example. A mask (1) at the upper left end of the table is a metal mask as Comparative Example 1 created with a current density of 0.5 A / dm 2 as a working condition. The middle mask (2) at the left end of the table is a metal mask as a comparative example 2 created by using a current density of 0.25 A / dm 2 as a working condition. The lower left mask (3) has a first electroplating layer having a current density of 0.25 A / dm 2 and a thickness of about 5 μm, for example. As a layer, for example, an electroless plating layer that does not excessively precipitate is formed so that the plate thickness is about 30 μm, and further, as a third layer, a current density of 0.25 A / dm 2 , for example, a plate thickness of about 5 μm. This is a multilayer structure metal mask of the present invention in which a second electroplating layer is formed so that The plate thickness difference indicates the difference in measured values between the base and the pattern in the unit of μm.
FIG. 16 is a characteristic diagram showing the plate thickness measurement values at each measurement point of the multilayer structure metal mask of the present invention and the metal mask of the comparative example. The horizontal axis represents each measurement point No. X1 to X20, and the vertical axis represents the plate thickness (μm It can be seen that the thickness difference of the multilayer structure metal mask of the present invention is the smallest.

次に、この発明の多層構造メタルマスクと比較例のメタルマスクの枠貼り付け後のピッチ距離での伸び量を測定した結果について説明する。コンビネーション仕様として、枠種類=鋳物枠650mm*550mm、紗張り=テトロンメッシュ:#225、スクエアー張り、テンション=0.60mm(テンションゲージSTG−75B使用時)、ピッチ距離=180mmである。測定方法は、温度:20℃、湿度:55%にて放置、1日1回の測定(X方向、Y方向を測定)した。
図17はこの発明の多層構造メタルマスクと比較例のメタルマスクのピッチ距離での伸び量を示す比較表である。表左端上部のマスク(1)X、Yは、0.5A/dmの電流密度を作業条件として作成した比較例1としてのメタルマスクである。また、表左端中央のマスク(2)X、Yは、0.25A/dmの電流密度を作業条件として作成した比較例2としてのメタルマスクである。また、表左端下部のマスク(3)X、Yは、0.25A/dmの電流密度で、例えば板厚が約5μmとなるように第1層目の電気めっき層を形成し、その上に第2層目として例えば板厚が約30μmとなるように過剰析出しない無電解めっき層を形成し、更にその上に第3層目として0.25A/dmの電流密度で、例えば板厚が約5μmとなるように第2の電気めっき層を形成したこの発明の多層構造メタルマスクである。ピッチ測定結果は、図13に示すパターン概略図の測定箇所No.X3とNo.X18の間の距離180mmでの伸び量及びパターン概略図の測定箇所No.Y3とNo.Y18の間の距離180mmでの伸び量(μm)で示している。また、初日を零とした場合の8日間での伸び量を示している。
図18はこの発明の多層構造メタルマスクと比較例のメタルマスクのピッチ距離での伸び量を示す特性図で、横軸に経過日数(初日〜8日)、縦軸に伸び量(μm)を示し、この発明の多層構造メタルマスクの伸び量が最も少ないことが判る。
Next, a description will be given of the results of measuring the amount of elongation at the pitch distance after the frame attachment of the multilayer structure metal mask of the present invention and the metal mask of the comparative example. As the combination specifications, frame type = casting frame 650 mm * 550 mm, cocoon tension = Tetron mesh: # 225, square tension, tension = 0.60 mm (when using tension gauge STG-75B), pitch distance = 180 mm. The measuring method was left at a temperature of 20 ° C. and a humidity of 55% and measured once a day (measured in the X and Y directions).
FIG. 17 is a comparison table showing the elongation amount at the pitch distance between the multilayer structure metal mask of the present invention and the metal mask of the comparative example. The masks (1) X and Y at the upper left end of the table are metal masks as Comparative Example 1 created by using a current density of 0.5 A / dm 2 as a working condition. Further, the masks (2) X and Y at the center of the left end of the table are metal masks as Comparative Example 2 created by using a current density of 0.25 A / dm 2 as a working condition. Further, the mask (3) X and Y at the lower left end of the front surface is formed with a first electroplating layer so that the plate thickness is about 5 μm at a current density of 0.25 A / dm 2 , For example, an electroless plating layer that does not excessively precipitate is formed as a second layer, for example, so that the plate thickness is about 30 μm, and a third layer is formed thereon with a current density of 0.25 A / dm 2 , for example, the plate thickness Is a multilayer structure metal mask of the present invention in which the second electroplating layer is formed so that the thickness of the film is about 5 μm. The pitch measurement results are as follows: the amount of elongation at a distance of 180 mm between the measurement points No. X3 and No. X18 in the pattern schematic diagram shown in FIG. 13 and the distance of 180 mm between the measurement points No. Y3 and No. Y18 in the pattern schematic diagram. It is shown by the amount of elongation (μm). Moreover, the amount of growth in 8 days when the first day is zero is shown.
FIG. 18 is a characteristic diagram showing the amount of elongation at the pitch distance of the multilayer structure metal mask of the present invention and the metal mask of the comparative example. It can be seen that the amount of elongation of the multilayer structure metal mask of the present invention is the smallest.

この発明によれば、第1層目を電気めっき層、第2層目を無電解めっき層、第3層目を電気めっき層とする多層型皮膜構造を持ち、中間層に無電解めっき層を入れることにより、電気めっきで作製したメタルマスクと比べて、板厚のばらつきがパターン領域以内とパターン領域以外でその差が小さくなる。つまり、この発明を用いることでパターン領域外の板厚を厚くすることが可能となる。結果としてメタルマスク全体としての強度が上がるので、印刷時の伸びを低減することができる。また、パターン領域内の板厚のばらつきを低減させることにより、印刷されるハンダ量のばらつきが小さくなる。   According to this invention, the first layer has an electroplating layer, the second layer has an electroless plating layer, the third layer has an electroplating layer, and the intermediate layer has an electroless plating layer. As a result of the insertion, the difference in the plate thickness variation between the pattern area and the non-pattern area is smaller than that of a metal mask produced by electroplating. That is, by using the present invention, it is possible to increase the plate thickness outside the pattern region. As a result, the strength of the entire metal mask is increased, so that elongation during printing can be reduced. Further, by reducing the variation in the plate thickness in the pattern area, the variation in the amount of solder to be printed is reduced.

実施の形態2.
実施の形態1では、第1層目を電気めっき層、第2層目を無電解めっき層、第3層目を電気めっき層とする3層型皮膜構造を持つ3層構造メタルマスクについて説明したが、第1層目を電気めっき層、第2層目を無電解めっき層とする2層型皮膜構造を持つ2層構造メタルマスク、或いは第1層目を電気めっき層、第2層目を無電解めっき層、第3層目を電気めっき層、第4層目を無電解めっき層とする4層型皮膜構造を持つ4層構造メタルマスク、或いは第1層目を電気めっき層、第2層目を無電解めっき層、第3層目を電気めっき層、第4層目を無電解めっき層、第5層目を電気めっき層とする5層型皮膜構造を持つ5層構造メタルマスク等、第2層目の無電解めっき層の上に、電気めっき層及び無電解めっき層を交互に形成してなる多層構造メタルマスクとすることができる。
Embodiment 2. FIG.
In the first embodiment, a three-layer structure metal mask having a three-layer coating structure in which the first layer is an electroplating layer, the second layer is an electroless plating layer, and the third layer is an electroplating layer has been described. However, a two-layer metal mask having a two-layer coating structure in which the first layer is an electroplating layer and the second layer is an electroless plating layer, or the first layer is an electroplating layer and the second layer Electroless plating layer, 4-layer metal mask having a four-layer coating structure in which the third layer is an electroplating layer and the fourth layer is an electroless plating layer, or the first layer is an electroplating layer, second 5-layer metal mask having a 5-layer coating structure in which the layer is an electroless plating layer, the third layer is an electroplating layer, the fourth layer is an electroless plating layer, and the fifth layer is an electroplating layer. An electroplating layer and an electroless plating layer are alternately formed on the second electroless plating layer. It is possible to structure a metal mask.

なお、1回の無電解めっき層の板厚を厚くすると、無電解めっきに時間が掛かり過ぎて納期が遅れるという問題が生じてくる。したがって、第1層目を電気めっき層、第2層目を無電解めっき層、第3層目を電気めっき層、第4層目を無電解めっき層とする4層型皮膜構造を持つ4層構造メタルマスク、或いは第1層目を電気めっき層、第2層目を無電解めっき層、第3層目を電気めっき層、第4層目を無電解めっき層、第5層目を電気めっき層とする5層型皮膜構造を持つ5層構造メタルマスク等、第2層目の無電解めっき層の上に、電気めっき層及び無電解めっき層を交互に形成してなる多層構造メタルマスクのように、時間が掛かり過ぎる無電解めっき層の1層当りの板厚を薄くして無電解めっき層を複数層形成するようにすれば、無電解めっきに時間が掛かり過ぎて納期が遅れるという問題が解消することができる。   If the thickness of the electroless plating layer is increased once, there is a problem that the electroless plating takes too much time and the delivery time is delayed. Therefore, four layers having a four-layer coating structure in which the first layer is an electroplating layer, the second layer is an electroless plating layer, the third layer is an electroplating layer, and the fourth layer is an electroless plating layer. Structural metal mask or first layer electroplated layer, second layer electroless plated layer, third layer electroplated layer, fourth layer electroless plated layer, fifth layer electroplated A multi-layer metal mask in which an electroplating layer and an electroless plating layer are alternately formed on the second electroless plating layer, such as a five-layer structure metal mask having a five-layer coating structure as a layer. As described above, if the thickness of each electroless plating layer that takes too much time is made thin to form a plurality of electroless plating layers, the electroless plating takes too much time and the delivery time is delayed. Can be resolved.

なお、この発明の多層構造メタルマスクは、はんだ印刷用マスク、サブスレートマスク、ボール搭載マスク、ウエハバンプ印刷マスク、EL&シャドウマスクに代表される蒸着マスク、はんだボールの篩(シーブ)マスク、導電性ペースト印刷マスク、開口部にメッシュ構造を持つ多層マスク、サスペンドマスク等のメタルマスクに適用することができる。   The multilayer structure metal mask of the present invention includes a solder printing mask, a slate mask, a ball mounting mask, a wafer bump printing mask, a vapor deposition mask represented by an EL & shadow mask, a solder ball sieve mask, and a conductive paste. The present invention can be applied to a metal mask such as a printing mask, a multilayer mask having a mesh structure in an opening, and a suspend mask.

この発明の実施の形態1における多層構造メタルマスクの製造方法の最初の工程を示す断面図である。It is sectional drawing which shows the 1st process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクの製造方法の次工程を示す断面図である。It is sectional drawing which shows the next process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクの製造方法の次工程を示す断面図である。It is sectional drawing which shows the next process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクの製造方法の次工程を示す断面図である。It is sectional drawing which shows the next process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクの製造方法の次工程を示す断面図である。It is sectional drawing which shows the next process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクの製造方法の次工程を示す断面図である。It is sectional drawing which shows the next process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクの製造方法の次工程を示す断面図である。It is sectional drawing which shows the next process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクの製造方法の次工程を示す断面図である。It is sectional drawing which shows the next process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクの製造方法の次工程を示す断面図である。It is sectional drawing which shows the next process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクの製造方法の次工程を示す断面図である。It is sectional drawing which shows the next process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクの製造方法の次工程を示す断面図である。It is sectional drawing which shows the next process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクの製造方法の最終工程を示す断面図である。It is sectional drawing which shows the last process of the manufacturing method of the multilayer structure metal mask in Embodiment 1 of this invention. この発明の実施の形態1における多層構造メタルマスクを比較例のメタルマスクと比較して評価した時のパターン概略構造を示す平面図である。It is a top view which shows the pattern schematic structure when evaluating the multilayer structure metal mask in Embodiment 1 of this invention compared with the metal mask of a comparative example. この発明の多層構造メタルマスクと比較例のメタルマスクの各測定箇所における板厚測定値を示す比較表である。It is a comparison table | surface which shows the plate | board thickness measured value in each measurement location of the multilayer structure metal mask of this invention, and the metal mask of a comparative example. この発明の多層構造メタルマスクと比較例のメタルマスクの板厚差を示す比較表である。It is a comparison table | surface which shows the board | plate thickness difference of the multilayer structure metal mask of this invention, and the metal mask of a comparative example. この発明の多層構造メタルマスクと比較例のメタルマスクの各測定箇所における板厚測定値を示す特性図である。It is a characteristic view which shows the plate | board thickness measured value in each measurement location of the multilayer structure metal mask of this invention, and the metal mask of a comparative example. この発明の多層構造メタルマスクと比較例のメタルマスクのピッチ距離での伸び量を示す比較表である。It is a comparison table | surface which shows the elongation amount in the pitch distance of the multilayer structure metal mask of this invention, and the metal mask of a comparative example. この発明の多層構造メタルマスクと比較例のメタルマスクのピッチ距離での伸び量を示す特性図である。It is a characteristic view which shows the elongation amount in the pitch distance of the multilayer structure metal mask of this invention, and the metal mask of a comparative example.

符号の説明Explanation of symbols

1 導電性基材
2 脱脂液
3 感光膜レジスト
3a 硬化しなかったレジスト部
3b 硬化したレジスト部
4 フィルム
5 現像液
6 第1の電気めっき層(第1層目)
7 水洗い
8 無電解めっき層(第2層目)
9 水洗い
10 第2の電気めっき層(第3層目)
11 円状パターンエリア
DESCRIPTION OF SYMBOLS 1 Conductive base material 2 Degreasing liquid 3 Photoresist resist 3a Resist part 3b which did not harden | cure Resist part 4 Film 5 Developer 6 1st electroplating layer (1st layer)
7 Washing with water 8 Electroless plating layer (second layer)
9 Washing 10 Second electroplating layer (third layer)
11 Circular pattern area

Claims (9)

第1層目を含む奇数層に形成された電気めっき層と、第2層目を含む偶数層に形成された無電解めっき層と、からなる多層型皮膜構造を持つことを特徴とする多層構造メタルマスク。   A multilayer structure characterized by having a multilayer film structure comprising an electroplating layer formed on an odd layer including the first layer and an electroless plating layer formed on an even layer including the second layer Metal mask. 導電性基材を用意し、導電性基材に付着している油等を除去する工程と、
前記導電性基材上に感光膜レジストを塗布する工程と、
前記感光膜レジストを露光により焼き付けて硬化させる工程と、
露光により硬化しなかったレジスト部を除去するとともに、導電性基材上にパターンとなる硬化したレジスト部を形成する工程と、
前記導電性基材上のレジスト部が形成されていない部分に、第1層目として電気めっき層を形成する工程と、
前記第1層目の電気めっき層の上に、第2層目として無電解めっき層を形成する工程と、
前記硬化したレジスト部を除去する工程と、
前記導電性基材から前記電気めっき層及び無電解めっき層を一体的に剥がす工程と、
を備えたことを特徴とする多層構造メタルマスクの製造方法。
A step of preparing a conductive substrate and removing oil and the like adhering to the conductive substrate;
Applying a photoresist resist on the conductive substrate;
Baking and curing the photoresist resist by exposure; and
Removing the resist portion that has not been cured by exposure, and forming a cured resist portion that becomes a pattern on the conductive substrate;
A step of forming an electroplating layer as a first layer in a portion where the resist portion on the conductive substrate is not formed;
Forming an electroless plating layer as a second layer on the first electroplating layer;
Removing the cured resist portion;
Removing the electroplating layer and the electroless plating layer integrally from the conductive substrate;
A method for producing a multi-layer structure metal mask, comprising:
導電性基材を用意し、導電性基材に付着している油等を除去する工程と、
前記導電性基材上に感光膜レジストを塗布する工程と、
前記感光膜レジストを露光により焼き付けて硬化させる工程と、
露光により硬化しなかったレジスト部を除去するとともに、導電性基材上にパターンとなる硬化したレジスト部を形成する工程と、
前記導電性基材上のレジスト部が形成されていない部分に、第1層目として第1の電気めっき層を形成する工程と、
前記第1層目の電気めっき層の上に、第2層目として無電解めっき層を形成する工程と、
前記第2層目の無電解めっき層の上に、第3層目として第2の電気めっき層を形成する工程と、
前記硬化したレジスト部を除去する工程と、
前記導電性基材から前記第1の電気めっき層、無電解めっき層及び第2の電気めっき層を一体的に剥がす工程と、
を備えたことを特徴とする多層構造メタルマスクの製造方法。
A step of preparing a conductive substrate and removing oil and the like adhering to the conductive substrate;
Applying a photoresist resist on the conductive substrate;
Baking and curing the photoresist resist by exposure; and
Removing the resist portion that has not been cured by exposure, and forming a cured resist portion that becomes a pattern on the conductive substrate;
Forming a first electroplating layer as a first layer in a portion where the resist portion on the conductive substrate is not formed;
Forming an electroless plating layer as a second layer on the first electroplating layer;
Forming a second electroplating layer as a third layer on the second electroless plating layer;
Removing the cured resist portion;
Integrally peeling the first electroplating layer, the electroless plating layer and the second electroplating layer from the conductive substrate;
A method for producing a multi-layer structure metal mask, comprising:
導電性基材を用意し、導電性基材に付着している油等を除去する工程と、
前記導電性基材上に感光膜レジストを塗布する工程と、
前記感光膜レジストを露光により焼き付けて硬化させる工程と、
露光により硬化しなかったレジスト部を除去するとともに、導電性基材上にパターンとなる硬化したレジスト部を形成する工程と、
前記導電性基材上のレジスト部が形成されていない部分に、第1層目として電気めっき層を形成する工程と、
前記第1層目の電気めっき層の上に、第2層目として無電解めっき層を形成する工程と、
前記第2層目の無電解めっき層の上に、電気めっき層及び無電解めっき層を交互に形成する工程と、
前記硬化したレジスト部を除去する工程と、
前記導電性基材から前記電気めっき層及び無電解めっき層の全てを一体的に剥がす工程と、
を備えたことを特徴とする多層構造メタルマスクの製造方法。
A step of preparing a conductive substrate and removing oil and the like adhering to the conductive substrate;
Applying a photoresist resist on the conductive substrate;
Baking and curing the photoresist resist by exposure; and
Removing the resist portion that has not been cured by exposure, and forming a cured resist portion that becomes a pattern on the conductive substrate;
A step of forming an electroplating layer as a first layer in a portion where the resist portion on the conductive substrate is not formed;
Forming an electroless plating layer as a second layer on the first electroplating layer;
Forming an electroplating layer and an electroless plating layer alternately on the second electroless plating layer; and
Removing the cured resist portion;
A step of integrally removing all of the electroplating layer and the electroless plating layer from the conductive substrate;
A method for producing a multi-layer structure metal mask, comprising:
多層型皮膜構造を持つメタルマスクにおいて、電気めっき層と過剰析出しない無電解めっき層とが交互に積層形成され、同一平面上での板厚差を小さくしたことを特徴とする多層構造メタルマスク。   A metal mask having a multilayer film structure, wherein an electroplating layer and an electroless plating layer that does not excessively deposit are alternately laminated to reduce a difference in plate thickness on the same plane. 交互に積層形成される電気めっき層の合計板厚と無電解めっき層の合計板厚との板厚比が、1:0.5〜30の範囲であることを特徴とする、請求項5に記載の多層構造メタルマスク。   The plate thickness ratio of the total plate thickness of the electroplating layers formed alternately and the total plate thickness of the electroless plating layer is in the range of 1: 0.5 to 30, characterized in that The multilayer metal mask described. 導電性基材を用意し、導電性基材に付着している油等を除去する工程と、
前記導電性基材上に感光膜レジストを塗布する工程と、
前記感光膜レジストを露光により焼き付けて硬化させる工程と、
露光により硬化しなかったレジスト部を除去するとともに、導電性基材上にパターンとなる硬化したレジスト部を形成する工程と、
前記導電性基材上のレジスト部が形成されていない部分に、第1層目として過剰析出を抑制できる低電流密度で電気めっき層を形成する工程と、
前記第1層目の電気めっき層の上に、第2層目として過剰析出しない無電解めっき層を形成する工程と、
前記硬化したレジスト部を除去する工程と、
前記導電性基材から前記電気めっき層及び無電解めっき層を一体的に剥がす工程と、
を備えたことを特徴とする多層構造メタルマスクの製造方法。
A step of preparing a conductive substrate and removing oil and the like adhering to the conductive substrate;
Applying a photoresist resist on the conductive substrate;
Baking and curing the photoresist resist by exposure; and
Removing the resist portion that has not been cured by exposure, and forming a cured resist portion that becomes a pattern on the conductive substrate;
Forming an electroplating layer at a low current density capable of suppressing excessive precipitation as a first layer in a portion where the resist portion on the conductive substrate is not formed;
Forming an electroless plating layer that does not excessively deposit as a second layer on the first electroplating layer; and
Removing the cured resist portion;
Removing the electroplating layer and the electroless plating layer integrally from the conductive substrate;
A method for producing a multi-layer structure metal mask, comprising:
導電性基材を用意し、導電性基材に付着している油等を除去する工程と、
前記導電性基材上に感光膜レジストを塗布する工程と、
前記感光膜レジストを露光により焼き付けて硬化させる工程と、
露光により硬化しなかったレジスト部を除去するとともに、導電性基材上にパターンとなる硬化したレジスト部を形成する工程と、
前記導電性基材上のレジスト部が形成されていない部分に、第1層目として過剰析出を抑制できる低電流密度で第1の電気めっき層を形成する工程と、
前記第1層目の電気めっき層の上に、第2層目として過剰析出しない無電解めっき層を形成する工程と、
前記第2層目の無電解めっき層の上に、第3層目として過剰析出を抑制できる低電流密度で第2の電気めっき層を形成する工程と、
前記硬化したレジスト部を除去する工程と、
前記導電性基材から前記第1の電気めっき層、無電解めっき層及び第2の電気めっき層を一体的に剥がす工程と、
を備えたことを特徴とする多層構造メタルマスクの製造方法。
A step of preparing a conductive substrate and removing oil and the like adhering to the conductive substrate;
Applying a photoresist resist on the conductive substrate;
Baking and curing the photoresist resist by exposure; and
Removing the resist portion that has not been cured by exposure, and forming a cured resist portion that becomes a pattern on the conductive substrate;
Forming a first electroplating layer at a low current density capable of suppressing excessive precipitation as a first layer in a portion where the resist portion on the conductive substrate is not formed;
Forming an electroless plating layer that does not excessively deposit as a second layer on the first electroplating layer; and
Forming a second electroplating layer on the second electroless plating layer at a low current density capable of suppressing excessive precipitation as a third layer;
Removing the cured resist portion;
Integrally peeling the first electroplating layer, the electroless plating layer and the second electroplating layer from the conductive substrate;
A method for producing a multi-layer structure metal mask, comprising:
導電性基材を用意し、導電性基材に付着している油等を除去する工程と、
前記導電性基材上に感光膜レジストを塗布する工程と、
前記感光膜レジストを露光により焼き付けて硬化させる工程と、
露光により硬化しなかったレジスト部を除去するとともに、導電性基材上にパターンとなる硬化したレジスト部を形成する工程と、
前記導電性基材上のレジスト部が形成されていない部分に、第1層目として過剰析出を抑制できる低電流密度で電気めっき層を形成する工程と、
前記第1層目の電気めっき層の上に、第2層目として過剰析出しない無電解めっき層を形成する工程と、
前記第2層目の無電解めっき層の上に、過剰析出を抑制できる低電流密度で電気めっき層及び過剰析出しない無電解めっき層を交互に形成する工程と、
前記硬化したレジスト部を除去する工程と、
前記導電性基材から前記電気めっき層及び無電解めっき層の全てを一体的に剥がす工程と、
を備えたことを特徴とする多層構造メタルマスクの製造方法。
A step of preparing a conductive substrate and removing oil and the like adhering to the conductive substrate;
Applying a photoresist resist on the conductive substrate;
Baking and curing the photoresist resist by exposure; and
Removing the resist portion that has not been cured by exposure, and forming a cured resist portion that becomes a pattern on the conductive substrate;
Forming an electroplating layer at a low current density capable of suppressing excessive precipitation as a first layer in a portion where the resist portion on the conductive substrate is not formed;
Forming an electroless plating layer that does not excessively deposit as a second layer on the first electroplating layer; and
On the second electroless plating layer, alternately forming an electroplating layer and an electroless plating layer that does not excessively precipitate at a low current density capable of suppressing excessive precipitation; and
Removing the cured resist portion;
A step of integrally removing all of the electroplating layer and the electroless plating layer from the conductive substrate;
A method for producing a multi-layer structure metal mask, comprising:
JP2008102083A 2007-04-10 2008-04-10 Multilayer metal mask and method of manufacturing the same Active JP5394652B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008102083A JP5394652B2 (en) 2007-04-10 2008-04-10 Multilayer metal mask and method of manufacturing the same

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2007103026 2007-04-10
JP2007103026 2007-04-10
JP2008102083A JP5394652B2 (en) 2007-04-10 2008-04-10 Multilayer metal mask and method of manufacturing the same

Publications (2)

Publication Number Publication Date
JP2008279762A true JP2008279762A (en) 2008-11-20
JP5394652B2 JP5394652B2 (en) 2014-01-22

Family

ID=40140975

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008102083A Active JP5394652B2 (en) 2007-04-10 2008-04-10 Multilayer metal mask and method of manufacturing the same

Country Status (1)

Country Link
JP (1) JP5394652B2 (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011126097A (en) * 2009-12-16 2011-06-30 Sonocom Co Ltd Multilayer structured metal mask
CN103171256A (en) * 2011-12-23 2013-06-26 昆山允升吉光电科技有限公司 Solar cell electrode printing mask plate and manufacturing method thereof
KR20140036815A (en) * 2012-09-18 2014-03-26 김정식 Method of manufacturing the printed electronic circuit boards utilizing photoresist pillars
JP2015030162A (en) * 2013-08-01 2015-02-16 株式会社ボンマーク Multilayer structure metal mask, and method for manufacturing the same
JP2017005053A (en) * 2015-06-08 2017-01-05 株式会社ボンマーク Mask for arranging balls, mask for printing, and manufacturing method thereof
JP2018110255A (en) * 2018-02-22 2018-07-12 株式会社ボンマーク Ball array mask
JP6763626B1 (en) * 2020-02-27 2020-09-30 株式会社プロセス・ラボ・ミクロン Metal mask manufacturing method and metal mask

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08258442A (en) * 1995-03-22 1996-10-08 Ibiden Co Ltd Mask for printing and manufacture thereof
JP2007118589A (en) * 2005-09-28 2007-05-17 Bonmaaku:Kk Metal mask screen plate and its manufacturing method
JP2010017887A (en) * 2008-07-08 2010-01-28 Fuchigami Micro:Kk Mesh sheet and method for manufacturing mesh sheet

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08258442A (en) * 1995-03-22 1996-10-08 Ibiden Co Ltd Mask for printing and manufacture thereof
JP2007118589A (en) * 2005-09-28 2007-05-17 Bonmaaku:Kk Metal mask screen plate and its manufacturing method
JP2010017887A (en) * 2008-07-08 2010-01-28 Fuchigami Micro:Kk Mesh sheet and method for manufacturing mesh sheet

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011126097A (en) * 2009-12-16 2011-06-30 Sonocom Co Ltd Multilayer structured metal mask
CN103171256A (en) * 2011-12-23 2013-06-26 昆山允升吉光电科技有限公司 Solar cell electrode printing mask plate and manufacturing method thereof
CN103171256B (en) * 2011-12-23 2015-09-23 昆山允升吉光电科技有限公司 Electrode of solar battery printing mask board and manufacture method thereof
KR20140036815A (en) * 2012-09-18 2014-03-26 김정식 Method of manufacturing the printed electronic circuit boards utilizing photoresist pillars
KR102051117B1 (en) 2012-09-18 2019-12-02 김정식 Method of manufacturing the printed electronic circuit boards utilizing photoresist pillars
JP2015030162A (en) * 2013-08-01 2015-02-16 株式会社ボンマーク Multilayer structure metal mask, and method for manufacturing the same
JP2017005053A (en) * 2015-06-08 2017-01-05 株式会社ボンマーク Mask for arranging balls, mask for printing, and manufacturing method thereof
JP2018110255A (en) * 2018-02-22 2018-07-12 株式会社ボンマーク Ball array mask
JP6763626B1 (en) * 2020-02-27 2020-09-30 株式会社プロセス・ラボ・ミクロン Metal mask manufacturing method and metal mask

Also Published As

Publication number Publication date
JP5394652B2 (en) 2014-01-22

Similar Documents

Publication Publication Date Title
JP5394652B2 (en) Multilayer metal mask and method of manufacturing the same
TWI711139B (en) Surface-treated copper foil, copper foil with carrier, and manufacturing methods of copper-clad laminates and printed wiring boards using these
JP2006347165A (en) Metal mask for making pattern
JP4959052B2 (en) Improved method of forming conductive traces and printed circuit manufactured thereby
US20020112885A1 (en) Printed circuit board and method for manufacturing same
JP5441663B2 (en) Multilayer metal mask
KR20150135523A (en) Copper foil with carrier, printed circuit board, copper clad laminated sheet, electronic device, and printed circuit board fabrication method
TW200824509A (en) Film carrier tape for mounting electronic components and method of manufacturing the film carrier tape
WO2011158731A1 (en) Substrate for mounting semiconductor element and method for manufacturing the substrate
KR101126128B1 (en) Jig-integrated mask and fabricating method the same
JP2007118589A (en) Metal mask screen plate and its manufacturing method
JP6538394B2 (en) Method of manufacturing suspend metal mask using dummy pattern and suspend metal mask using dummy pattern
JP6638589B2 (en) Cathode plate for metal electrodeposition and method for producing the same
JP5286532B2 (en) Paste printing plate
JP6204107B2 (en) Multilayer metal mask and method of manufacturing the same
KR102175093B1 (en) Method for manufacturing a fine metal mask and a fine metal mask threfore
JP2004025709A (en) Screen printing plate and method for manufacturing it
US20060243700A1 (en) Composite electroformed screening mask and method of making the same
KR100736665B1 (en) Printed wiring board
JP3172509B2 (en) Manufacturing method of wiring board assembly
JP6282466B2 (en) Metal mask for screen printing and manufacturing method thereof
JP5328217B2 (en) Mask and mask manufacturing method
JPH0243356B2 (en)
JP2009233948A (en) Metal mask for screen printing and method for manufacturing the same
JP2006278431A (en) Ceramic circuit board and its manufacturing method

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20110405

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130305

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130326

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130924

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20131017

R150 Certificate of patent or registration of utility model

Ref document number: 5394652

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250