JP2008268155A - 熱型赤外線固体撮像素子 - Google Patents

熱型赤外線固体撮像素子 Download PDF

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Publication number
JP2008268155A
JP2008268155A JP2007115319A JP2007115319A JP2008268155A JP 2008268155 A JP2008268155 A JP 2008268155A JP 2007115319 A JP2007115319 A JP 2007115319A JP 2007115319 A JP2007115319 A JP 2007115319A JP 2008268155 A JP2008268155 A JP 2008268155A
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Japan
Prior art keywords
circuit
pixel
voltage
output
sample
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JP2007115319A
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Japanese (ja)
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JP2008268155A5 (https=
Inventor
Takahiro Oonakamichi
崇浩 大中道
Masafumi Ueno
雅史 上野
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Priority to JP2007115319A priority Critical patent/JP2008268155A/ja
Publication of JP2008268155A publication Critical patent/JP2008268155A/ja
Publication of JP2008268155A5 publication Critical patent/JP2008268155A5/ja
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  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2007115319A 2007-04-25 2007-04-25 熱型赤外線固体撮像素子 Pending JP2008268155A (ja)

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JP2007115319A JP2008268155A (ja) 2007-04-25 2007-04-25 熱型赤外線固体撮像素子

Applications Claiming Priority (1)

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JP2007115319A JP2008268155A (ja) 2007-04-25 2007-04-25 熱型赤外線固体撮像素子

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JP2008268155A true JP2008268155A (ja) 2008-11-06
JP2008268155A5 JP2008268155A5 (https=) 2010-02-18

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JP2007115319A Pending JP2008268155A (ja) 2007-04-25 2007-04-25 熱型赤外線固体撮像素子

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Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010217009A (ja) * 2009-03-17 2010-09-30 Mitsubishi Electric Corp 赤外線固体撮像素子
JP2010286440A (ja) * 2009-06-15 2010-12-24 Technical Research & Development Institute Ministry Of Defence 赤外線撮像素子モジュール
JP2011510274A (ja) * 2008-01-19 2011-03-31 テスト アクチエンゲゼルシャフト サーマルカメラ
JP2011196992A (ja) * 2010-02-26 2011-10-06 Mitsubishi Electric Corp 赤外線固体撮像素子
US8581199B2 (en) 2011-03-09 2013-11-12 Kabushiki Kaisha Toshiba Solid state imaging device
US20140132279A1 (en) * 2012-11-12 2014-05-15 Kabushiki Kaisha Toshiba Apparatus and method for inspecting infrared solid-state image sensor
KR101679018B1 (ko) 2015-08-13 2016-11-25 (주)유우일렉트로닉스 진공 상태 및 저항값 편차의 테스트 회로를 구비한 판독 집적 회로 및 이를 포함하는 테스트 장치
US10225500B2 (en) 2016-01-22 2019-03-05 Panasonic Intellectual Property Management Co., Ltd. Imaging device including output signal lines for each column
CN114240914A (zh) * 2021-12-22 2022-03-25 浙江工业大学 基于数据扩增的复材红外热成像缺陷检测图像处理方法
US11838679B2 (en) 2019-06-12 2023-12-05 Mitsubishi Electric Corporation Infrared imaging device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002077738A (ja) * 2000-08-28 2002-03-15 Nikon Corp クランプ装置
JP2005214639A (ja) * 2004-01-27 2005-08-11 Mitsubishi Electric Corp 赤外線固体撮像素子

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002077738A (ja) * 2000-08-28 2002-03-15 Nikon Corp クランプ装置
JP2005214639A (ja) * 2004-01-27 2005-08-11 Mitsubishi Electric Corp 赤外線固体撮像素子

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011510274A (ja) * 2008-01-19 2011-03-31 テスト アクチエンゲゼルシャフト サーマルカメラ
JP2010217009A (ja) * 2009-03-17 2010-09-30 Mitsubishi Electric Corp 赤外線固体撮像素子
JP2010286440A (ja) * 2009-06-15 2010-12-24 Technical Research & Development Institute Ministry Of Defence 赤外線撮像素子モジュール
JP2011196992A (ja) * 2010-02-26 2011-10-06 Mitsubishi Electric Corp 赤外線固体撮像素子
US8581199B2 (en) 2011-03-09 2013-11-12 Kabushiki Kaisha Toshiba Solid state imaging device
JP2014096773A (ja) * 2012-11-12 2014-05-22 Toshiba Corp 赤外線固体撮像素子の検査装置および検査方法
US20140132279A1 (en) * 2012-11-12 2014-05-15 Kabushiki Kaisha Toshiba Apparatus and method for inspecting infrared solid-state image sensor
US9404963B2 (en) * 2012-11-12 2016-08-02 Kabushiki Kaisha Toshiba Apparatus and method for inspecting infrared solid-state image sensor
KR101679018B1 (ko) 2015-08-13 2016-11-25 (주)유우일렉트로닉스 진공 상태 및 저항값 편차의 테스트 회로를 구비한 판독 집적 회로 및 이를 포함하는 테스트 장치
US10225500B2 (en) 2016-01-22 2019-03-05 Panasonic Intellectual Property Management Co., Ltd. Imaging device including output signal lines for each column
US10999542B2 (en) 2016-01-22 2021-05-04 Panasonic Intellectual Property Management Co., Ltd. Imaging device including lines for each column
US11438536B2 (en) 2016-01-22 2022-09-06 Panasonic Intellectual Property Management Co., Ltd. Imaging device including lines for each column
US11838679B2 (en) 2019-06-12 2023-12-05 Mitsubishi Electric Corporation Infrared imaging device
CN114240914A (zh) * 2021-12-22 2022-03-25 浙江工业大学 基于数据扩增的复材红外热成像缺陷检测图像处理方法

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