JP2008241685A5 - - Google Patents

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Publication number
JP2008241685A5
JP2008241685A5 JP2007214494A JP2007214494A JP2008241685A5 JP 2008241685 A5 JP2008241685 A5 JP 2008241685A5 JP 2007214494 A JP2007214494 A JP 2007214494A JP 2007214494 A JP2007214494 A JP 2007214494A JP 2008241685 A5 JP2008241685 A5 JP 2008241685A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2007214494A
Other versions
JP4234761B2 (ja
JP2008241685A (ja
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Publication date
Application filed filed Critical
Priority to JP2007214494A priority Critical patent/JP4234761B2/ja
Priority claimed from JP2007214494A external-priority patent/JP4234761B2/ja
Priority to US12/672,078 priority patent/US8289016B2/en
Priority to EP08752280A priority patent/EP2182346A4/en
Priority to PCT/JP2008/058361 priority patent/WO2009025105A1/ja
Publication of JP2008241685A publication Critical patent/JP2008241685A/ja
Publication of JP2008241685A5 publication Critical patent/JP2008241685A5/ja
Application granted granted Critical
Publication of JP4234761B2 publication Critical patent/JP4234761B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007214494A 2006-11-21 2007-08-21 渦電流探傷方法とその装置 Expired - Fee Related JP4234761B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2007214494A JP4234761B2 (ja) 2006-11-21 2007-08-21 渦電流探傷方法とその装置
US12/672,078 US8289016B2 (en) 2006-11-21 2008-05-01 Eddy-current flaw detection method and apparatus
EP08752280A EP2182346A4 (en) 2007-08-21 2008-05-01 METHOD AND DEVICE FOR DETECTING FAULTY CURRENT DETECTION
PCT/JP2008/058361 WO2009025105A1 (ja) 2007-08-21 2008-05-01 渦電流探傷方法とその装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006313890 2006-11-21
JP2007046453 2007-02-27
JP2007214494A JP4234761B2 (ja) 2006-11-21 2007-08-21 渦電流探傷方法とその装置

Publications (3)

Publication Number Publication Date
JP2008241685A JP2008241685A (ja) 2008-10-09
JP2008241685A5 true JP2008241685A5 (ja) 2008-11-20
JP4234761B2 JP4234761B2 (ja) 2009-03-04

Family

ID=39913199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007214494A Expired - Fee Related JP4234761B2 (ja) 2006-11-21 2007-08-21 渦電流探傷方法とその装置

Country Status (2)

Country Link
US (1) US8289016B2 (ja)
JP (1) JP4234761B2 (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014020670A1 (ja) * 2012-07-30 2014-02-06 クーレヨン株式会社 磁界反射型センサ、包装箱内の添付書面有無検査装置、および、導電性膜の厚さ測定装置
DE102013014913B4 (de) * 2013-09-03 2017-06-08 QRS International AG Magnetfeldapplikator zur Magnetstimulation von Körpergewebe
JPWO2016080229A1 (ja) * 2014-11-21 2017-08-31 コニカミノルタ株式会社 磁気探傷装置および磁気探傷方法
DE102015203119A1 (de) * 2015-02-20 2016-08-25 Mahle International Gmbh Verfahren zum Detektieren von Fehlstellen in einem Kolben für eine Brennkraftmaschine
WO2017154141A1 (ja) * 2016-03-09 2017-09-14 三菱電機株式会社 床版探傷装置
JP6640138B2 (ja) * 2017-03-13 2020-02-05 三菱重工業株式会社 渦流探傷プローブ

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB631987A (en) 1947-07-25 1949-11-14 Superheater Co Ltd Improvements in and relating to apparatus for testing materials by magnetic or electrical analysis
US5006800A (en) 1989-11-06 1991-04-09 General Electric Company Eddy current imaging apparatus and method using phase difference detection
JPH0552816A (ja) 1991-08-29 1993-03-02 Ishikawajima Harima Heavy Ind Co Ltd パルス式渦流探傷用内挿型プローブ
JP3167470B2 (ja) 1992-12-04 2001-05-21 太陽化学株式会社 乳脂肪入り酸性乳飲料
EP0819944A1 (en) 1996-07-16 1998-01-21 Lucent Technologies Inc. Eddy current sensor
JPH10288606A (ja) 1997-04-14 1998-10-27 Genshiryoku Eng:Kk 回転型渦電流探傷プローブ
JPH10307124A (ja) 1997-05-08 1998-11-17 Kajima Corp 躯体鉄骨非破壊検査装置及び検査法
JP3964061B2 (ja) 1998-10-23 2007-08-22 独立行政法人科学技術振興機構 磁気計測による探傷方法及び装置
JP2000227420A (ja) 1999-02-04 2000-08-15 Nkk Corp マルチプローブ型渦流探傷方法及び装置
JP2000235020A (ja) 1999-02-12 2000-08-29 Genshiryoku Engineering:Kk 渦流探傷装置
US6344739B1 (en) * 1999-02-12 2002-02-05 R/D Tech Inc. Eddy current probe with multi-use coils and compact configuration
US6426622B1 (en) 2000-12-21 2002-07-30 General Electric Company Fixture for eddy current inspection probes
JP3981964B2 (ja) 2001-11-12 2007-09-26 学校法人日本大学 渦電流探傷用プローブとそのプローブを用いた渦電流探傷装置
JP3942165B2 (ja) 2002-05-27 2007-07-11 学校法人日本大学 渦電流探傷プローブ
US7154265B2 (en) * 2004-12-21 2006-12-26 General Electric Company Eddy current probe and inspection method
JP4323437B2 (ja) * 2005-01-12 2009-09-02 株式会社日立製作所 渦電流探傷プローブ及び渦電流探傷装置

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