JP2008227003A5 - - Google Patents
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- Publication number
- JP2008227003A5 JP2008227003A5 JP2007060613A JP2007060613A JP2008227003A5 JP 2008227003 A5 JP2008227003 A5 JP 2008227003A5 JP 2007060613 A JP2007060613 A JP 2007060613A JP 2007060613 A JP2007060613 A JP 2007060613A JP 2008227003 A5 JP2008227003 A5 JP 2008227003A5
- Authority
- JP
- Japan
- Prior art keywords
- voltage drop
- line
- circuit
- drop element
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims 3
- 239000003990 capacitor Substances 0.000 claims 2
- 238000010521 absorption reaction Methods 0.000 claims 1
- 230000003796 beauty Effects 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007060613A JP2008227003A (ja) | 2007-03-09 | 2007-03-09 | 静電気放電保護回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007060613A JP2008227003A (ja) | 2007-03-09 | 2007-03-09 | 静電気放電保護回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008227003A JP2008227003A (ja) | 2008-09-25 |
| JP2008227003A5 true JP2008227003A5 (enExample) | 2010-03-18 |
Family
ID=39845300
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007060613A Pending JP2008227003A (ja) | 2007-03-09 | 2007-03-09 | 静電気放電保護回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2008227003A (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011093150A1 (en) * | 2010-01-29 | 2011-08-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| CN102543963B (zh) * | 2012-02-09 | 2013-10-09 | 浙江大学 | 一种基于多级电流镜的esd侦测箝位电路 |
| JP5696074B2 (ja) | 2012-03-16 | 2015-04-08 | 株式会社東芝 | 半導体装置 |
| JP2014241537A (ja) * | 2013-06-12 | 2014-12-25 | 株式会社東芝 | 静電気保護回路 |
| JP6154700B2 (ja) * | 2013-09-17 | 2017-06-28 | 株式会社メガチップス | Esd保護回路 |
| JP6237183B2 (ja) * | 2013-12-09 | 2017-11-29 | セイコーエプソン株式会社 | 静電気保護回路及び半導体集積回路装置 |
| JP6342305B2 (ja) * | 2014-11-12 | 2018-06-13 | 株式会社メガチップス | Esd保護回路 |
| JP6398649B2 (ja) * | 2014-11-25 | 2018-10-03 | セイコーエプソン株式会社 | 静電気保護回路及び半導体集積回路装置 |
| JP6627333B2 (ja) * | 2015-09-01 | 2020-01-08 | セイコーエプソン株式会社 | 静電気保護回路、半導体集積回路装置、及び、電子機器 |
| KR102435672B1 (ko) * | 2017-12-05 | 2022-08-24 | 삼성전자주식회사 | 정전기 방전 보호 회로 및 이를 포함하는 집적 회로 |
| CN109301803A (zh) * | 2018-10-10 | 2019-02-01 | 合肥宽芯电子技术有限公司 | 一种高低电压通用的静电保护的静电阻抗器结构 |
| JP7396774B2 (ja) * | 2019-03-26 | 2023-12-12 | ラピスセミコンダクタ株式会社 | 論理回路 |
| CN110912098B (zh) * | 2019-11-25 | 2021-08-24 | 南京尔芯电子有限公司 | 防止静电释放esd保护在电源关断下引起漏电流的电路 |
| WO2022190475A1 (ja) * | 2021-03-12 | 2022-09-15 | ソニーセミコンダクタソリューションズ株式会社 | 静電気放電保護回路、および、電子装置 |
| CN114200371B (zh) * | 2021-08-09 | 2023-07-11 | 威凯检测技术有限公司 | 一种用于静电放电抗扰度试验的能力验证装置 |
| CN115996051A (zh) * | 2021-10-18 | 2023-04-21 | 世界先进积体电路股份有限公司 | 保护电路 |
| CN114281150A (zh) * | 2021-12-31 | 2022-04-05 | 芯动微电子科技(珠海)有限公司 | 一种钳位电路及ddr phy电路 |
| KR20240120068A (ko) | 2023-01-31 | 2024-08-07 | 삼성전자주식회사 | 반도체 장치 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7085113B2 (en) * | 2004-08-20 | 2006-08-01 | International Business Machines Corporation | ESD protection power clamp for suppressing ESD events occurring on power supply terminals |
| JP2006302971A (ja) * | 2005-04-15 | 2006-11-02 | Fujitsu Ltd | 電源クランプ回路及び半導体装置 |
-
2007
- 2007-03-09 JP JP2007060613A patent/JP2008227003A/ja active Pending
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