JP2008215924A - 測位装置、測位方法及びプログラム - Google Patents

測位装置、測位方法及びプログラム Download PDF

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Publication number
JP2008215924A
JP2008215924A JP2007051338A JP2007051338A JP2008215924A JP 2008215924 A JP2008215924 A JP 2008215924A JP 2007051338 A JP2007051338 A JP 2007051338A JP 2007051338 A JP2007051338 A JP 2007051338A JP 2008215924 A JP2008215924 A JP 2008215924A
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Japan
Prior art keywords
positioning
latitude
calculated
unit
calculating
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JP2007051338A
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Japanese (ja)
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JP2008215924A5 (enExample
Inventor
Nobuo Muto
信雄 武藤
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Seiko Epson Corp
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Seiko Epson Corp
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Priority to JP2007051338A priority Critical patent/JP2008215924A/ja
Publication of JP2008215924A publication Critical patent/JP2008215924A/ja
Publication of JP2008215924A5 publication Critical patent/JP2008215924A5/ja
Withdrawn legal-status Critical Current

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  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Position Fixing By Use Of Radio Waves (AREA)
JP2007051338A 2007-03-01 2007-03-01 測位装置、測位方法及びプログラム Withdrawn JP2008215924A (ja)

Priority Applications (1)

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JP2007051338A JP2008215924A (ja) 2007-03-01 2007-03-01 測位装置、測位方法及びプログラム

Applications Claiming Priority (1)

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JP2007051338A JP2008215924A (ja) 2007-03-01 2007-03-01 測位装置、測位方法及びプログラム

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JP2008215924A true JP2008215924A (ja) 2008-09-18
JP2008215924A5 JP2008215924A5 (enExample) 2010-04-02

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JP2007051338A Withdrawn JP2008215924A (ja) 2007-03-01 2007-03-01 測位装置、測位方法及びプログラム

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012507726A (ja) * 2008-10-31 2012-03-29 クゥアルコム・インコーポレイテッド 測位システムにおける磁気計の使用
CN102692179A (zh) * 2011-03-25 2012-09-26 索尼公司 定位设备、定位方法、程序和记录介质
US8918276B2 (en) 2011-02-09 2014-12-23 Samsung Electronics Co., Ltd. Apparatus and method for integrated positioning
CN115290024A (zh) * 2022-07-11 2022-11-04 兵器工业卫生研究所 一种完全基于绘图的距离测量方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005012939A1 (ja) * 2003-07-31 2005-02-10 Nec Corporation 端末位置特定方法及びそのシステム
JP2006226952A (ja) * 2005-02-21 2006-08-31 Yamaha Corp 地磁気緯度センサ

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005012939A1 (ja) * 2003-07-31 2005-02-10 Nec Corporation 端末位置特定方法及びそのシステム
JP2006226952A (ja) * 2005-02-21 2006-08-31 Yamaha Corp 地磁気緯度センサ

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012507726A (ja) * 2008-10-31 2012-03-29 クゥアルコム・インコーポレイテッド 測位システムにおける磁気計の使用
JP2015052604A (ja) * 2008-10-31 2015-03-19 クゥアルコム・インコーポレイテッドQualcomm Incorporated 測位システムにおける磁気計の使用
US8918276B2 (en) 2011-02-09 2014-12-23 Samsung Electronics Co., Ltd. Apparatus and method for integrated positioning
US9541629B2 (en) 2011-02-09 2017-01-10 Samsung Electronics Co., Ltd. Apparatus and method for integrated positioning
CN102692179A (zh) * 2011-03-25 2012-09-26 索尼公司 定位设备、定位方法、程序和记录介质
JP2012202787A (ja) * 2011-03-25 2012-10-22 Sony Corp 測位装置、測位方法、プログラム、及び記録媒体
US9110150B2 (en) 2011-03-25 2015-08-18 Sony Corporation Positioning device, positioning method, program, and recording medium
CN115290024A (zh) * 2022-07-11 2022-11-04 兵器工业卫生研究所 一种完全基于绘图的距离测量方法
CN115290024B (zh) * 2022-07-11 2024-06-04 兵器工业卫生研究所 一种完全基于绘图的距离测量方法

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