JP2008185583A - Electronic component transport device and method - Google Patents

Electronic component transport device and method Download PDF

Info

Publication number
JP2008185583A
JP2008185583A JP2008001253A JP2008001253A JP2008185583A JP 2008185583 A JP2008185583 A JP 2008185583A JP 2008001253 A JP2008001253 A JP 2008001253A JP 2008001253 A JP2008001253 A JP 2008001253A JP 2008185583 A JP2008185583 A JP 2008185583A
Authority
JP
Japan
Prior art keywords
electronic component
work
workstation
supply
pickup device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2008001253A
Other languages
Japanese (ja)
Other versions
JP4879914B2 (en
Inventor
Eiriki Chokan
張簡榮力
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HNI Technologies Inc
Original Assignee
HNI Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HNI Technologies Inc filed Critical HNI Technologies Inc
Publication of JP2008185583A publication Critical patent/JP2008185583A/en
Application granted granted Critical
Publication of JP4879914B2 publication Critical patent/JP4879914B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide an electronic component transport device and method that can be easily manufactured and reduce the cost of manufacture. <P>SOLUTION: This device includes: a workstation; a first supplying and mounting tool and a first collecting and mounting tool on a first side of the workstation; a second supplying and mounting tool and a second collecting and mounting tool in a second side; and a first pickup device and a second pickup device. The first and second supplying and mounting tools mount electronic components, and are available for suction by the first pickup device and the second pickup device and for transport to the workstation. Suction nozzles are installed in lifting rods of the first pickup device and the second pickup device, and slide-rail sets are installed in frames above the workstation. The first and second pickup devices are slidable in the three axis directions, the electronic components are correctly supplied to the workstation, an electronic device is placed on the workstation in stable horizontality, and, thus, operation becomes easier and operational quality is improved. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明はワークステーションの上方に架設され並びに三軸方向にスライド可能な第1ピックアップ装置と第2ピックアップ装置を提供し、電子部品をワークステーションに輪転式に移送し、安定した水平度で電子部品をワークステーションに置いて作業を実行させ、製造を容易とし作業品質アップを達成する、電子部品移送装置及び方法に関する。   The present invention provides a first pickup device and a second pickup device that are installed above a workstation and are slidable in three axial directions. The electronic components are transferred to the workstation in a rotary manner, and the electronic components are stably leveled. The present invention relates to an electronic component transfer apparatus and method that can perform an operation by placing the device on a workstation to facilitate manufacturing and improve work quality.

図1、2、3は特許文献1に係る発明を示し、その試験装置は試験台10と、第1、2ピックアップ機構20、30、及び供給、送出機構40、50を包含する。そのうち、該試験台10の両側に、第1、2ピックアップ機構20、30が設けられ、各ピックアップ機構はそれぞれ、相互に組み合わされた横移動構造及び昇降構造を有する。各横移動構造はフレームに設けられた横向きスライドレール21、31及び横向きスクリュー22、32を包含し、横向きスクリュー22、32はモータ23、33により駆動され、スクリュースリーブ241、341と横向きスライドシート242、342を包含するスライド装置24、34が、横向きスライドレール21、31及び横向きスクリュー22、32にスライド可能に且つ螺合方式で設置され、並びに別面に縦向きスライドシート243、343が設けられ、昇降構造は底面に吸着ノズルを具えたピックアップ装置25、35の側面に縦向きスライドレール251、351を具え、スライド装置24、34の縦向きスライドシート243、343中にスライド自在に組み合わされる。該横移動構造はまた、ピックアップ装置25、35の上面に横向きスライドシート252、352を具え、サポートフレーム26、36の横向きスライドレール261、361にスライド自在に組み合わされる。昇降構造は並びに該サポートフレーム26、36の別面に二つの縦向きスライドシート262、362及びスクリュースリーブ263、363を具え、それぞれフレームの縦向きスライドレール27、37及び縦向きスクリュー28、38に組み合わされ、縦向きスクリュー28、38はモータ29、39により駆動され、これにより各横移動構造のモータ23、33が横向きスクリュー22、32を駆動する時、スライド装置24、34の横向きスライドシート242、342及びピックアップ装置25、35の横向きスライドシート252、352が駆動され、フレームの横向きスライドレール21、31及びサポートフレーム26、36の横向きスライドレール261、361上でX方向の往復移動を形成する。各昇降構造のモータ29、39が縦向きスクリュー28、38を駆動する時、サポートフレーム26、36の縦向きスライドシート262、362及びピックアップ装置25、35の縦向きスライドレール251、351が駆動されて、フレームの縦向きスライドレール27、37及びスライド装置24、34の縦向きスライドシート243、343上でZ方向の往復移動を形成する。また、該供給機構40及び送出機構50はそれぞれ試験台10の前方、後方に設けられ、それぞれが載置台41、51を具えた載置台構造を具え、ICの移送を行ない、また、吸着ノズル42、52を具えたピックアップ構造を具え、ICのピックアップと放置を行なう。該供給機構40の吸着ノズル42は試験されるICを載置台41の上に置き、載置台41は第1供給機構20のピックアップ装置25の下方にそれを送り、該第1ピックアップ機構20はピックアップ装置25の吸着ノズルに載置台41上のICを吸着させ、並びにそれを試験台10に置かせて試験を行なわせる。載置台41は更に反対方向に移動してもとの位置に戻り、次のICを載置する。供給機構40の載置台41が更にもう一つのICを試験台10の側方に移送する時、第2ピックアップ機構30のピックアップ装置35がX方向に移動し、ピックアップ装置35を供給機構40の載置台41上に位置させてICを吸着させる。第1ピックアップ機構20のIC試験が完了後、ピックアップ装置25を駆動して横向きに移動させて送出機構50の載置台51上方に至らせ、並びにピックアップ装置25を下降させてICを載置台51上にのせて送出させ、これと同時に、第2ピックアップ機構30のピックアップ装置35がX−Z方向に移動し、ピックアップ装置35がもう一つのICを試験台10に置き試験を行なわせる。第2ピックアップ機構30のICが試験される時、第1ピックアップ機構20のピックアップ装置25は反対方向に移動し、再度供給機構40の載置台41上のICを吸着する。第2ピックアップ機構30のピックアップ装置35は試験完了したICを送出機構50の載置台51上に乗せて送出させ、このとき第1ピックアップ機構20は新たに試験するICを試験台10に置いて試験に供し、こうして第1、2ピックアップ機構20、30が順に迅速にICを移送して試験作業に供する。   1, 2, and 3 show the invention according to Patent Document 1, and the test apparatus includes a test table 10, first and second pickup mechanisms 20 and 30, and supply and delivery mechanisms 40 and 50. Among them, first and second pickup mechanisms 20, 30 are provided on both sides of the test table 10, and each pickup mechanism has a lateral movement structure and a lifting structure combined with each other. Each lateral movement structure includes lateral slide rails 21 and 31 and lateral screws 22 and 32 provided on the frame. The lateral screws 22 and 32 are driven by motors 23 and 33, and screw sleeves 241 and 341 and a lateral slide sheet 242 are driven. , 342 including slide devices 24 and 34 are slidably installed on the sideways slide rails 21 and 31 and the sideways screws 22 and 32 in a screwed manner, and vertically oriented slide sheets 243 and 343 are provided on different surfaces. The elevating structure has vertical slide rails 251 and 351 on the side surfaces of the pickup devices 25 and 35 having suction nozzles on the bottom surface, and is slidably combined in the vertical slide sheets 243 and 343 of the slide devices 24 and 34. The lateral movement structure also includes lateral slide sheets 252 and 352 on the upper surfaces of the pickup devices 25 and 35, and is slidably combined with the lateral slide rails 261 and 361 of the support frames 26 and 36. The elevating structure includes two longitudinal slide seats 262 and 362 and screw sleeves 263 and 363 on the other surface of the support frames 26 and 36, and the frame is provided with longitudinal slide rails 27 and 37 and longitudinal screws 28 and 38, respectively. In combination, the longitudinal screws 28 and 38 are driven by the motors 29 and 39, so that when the motors 23 and 33 of each laterally moving structure drive the lateral screws 22 and 32, the lateral slide sheet 242 of the slide devices 24 and 34. 342 and the lateral slide seats 252 and 352 of the pickup devices 25 and 35 are driven to form a reciprocating movement in the X direction on the lateral slide rails 21 and 31 of the frame and the lateral slide rails 261 and 361 of the support frames 26 and 36. . When the motors 29 and 39 of the lifting structures drive the vertical screws 28 and 38, the vertical slide sheets 262 and 362 of the support frames 26 and 36 and the vertical slide rails 251 and 351 of the pickup devices 25 and 35 are driven. Thus, the Z-direction reciprocation is formed on the vertical slide rails 27 and 37 of the frame and the vertical slide sheets 243 and 343 of the slide devices 24 and 34. The supply mechanism 40 and the delivery mechanism 50 are provided in front of and behind the test table 10, respectively, have a mounting table structure including mounting tables 41 and 51, transfer ICs, and suction nozzles 42. , 52 is provided, and the IC is picked up and left. The suction nozzle 42 of the supply mechanism 40 places the IC to be tested on the mounting table 41, the mounting table 41 sends it below the pickup device 25 of the first supply mechanism 20, and the first pickup mechanism 20 The IC on the mounting table 41 is adsorbed by the adsorbing nozzle of the apparatus 25 and the test is performed by placing it on the test table 10. The mounting table 41 returns to its original position even if it moves in the opposite direction, and mounts the next IC. When the mounting table 41 of the supply mechanism 40 further transfers another IC to the side of the test table 10, the pickup device 35 of the second pickup mechanism 30 moves in the X direction, and the pickup device 35 is mounted on the supply mechanism 40. The IC is adsorbed by being placed on the mounting table 41. After the IC test of the first pickup mechanism 20 is completed, the pickup device 25 is driven and moved sideways to reach the placement table 51 of the delivery mechanism 50, and the pickup device 25 is lowered to place the IC on the placement table 51. At the same time, the pick-up device 35 of the second pick-up mechanism 30 moves in the XZ direction, and the pick-up device 35 places another IC on the test table 10 to perform the test. When the IC of the second pickup mechanism 30 is tested, the pickup device 25 of the first pickup mechanism 20 moves in the opposite direction and sucks the IC on the mounting table 41 of the supply mechanism 40 again. The pick-up device 35 of the second pick-up mechanism 30 sends the IC that has been tested on the mounting table 51 of the sending mechanism 50, and at this time, the first pick-up mechanism 20 places a new IC to be tested on the test table 10 for testing. Thus, the first and second pick-up mechanisms 20 and 30 sequentially transfer the ICs in order and use them for the test work.

台湾特許出願第093110783号明細書Taiwan Patent Application No. 093110783

上述の特許文献1記載の発明において、該第1、第2ピックアップ機構20、30の吸着ノズルを具えたピックアップ装置25、35は僅かにX−Zの2軸方向の移動しか行なえず、ピックアップ装置25、35は各ピックアップ位置及び放置位置でX−Y−Zの3軸方向の位置の微調整を行なえず、このため、載置台41、51の試験台10に対する移動の定位位置、及び、ピックアップ装置25、35の試験台10、載置台41、51に対する移動の定位位置は、組立、設計のいずれにおいても絶対の正確度を具備しなければならず、そうでなければ、ピックアップ装置25、35がX−Zの2軸方向の移動制限の下で、正確にICを移送し試験作業を行なうことができなくなり、このような高精度の製造要求は、製造の難しさと大幅な製造コストアップの問題を有する。このほか、ピックアップ装置25、35はL形アームの形態で試験台10の両側に架設されて、吸着ノズル253、353を下圧して試験するICに押しつけるが、そのときの水平度が悪くなり、試験品質に影響が生じる。   In the invention described in the above-mentioned Patent Document 1, the pickup devices 25 and 35 having the suction nozzles of the first and second pickup mechanisms 20 and 30 can only move in the XZ biaxial direction. 25 and 35 cannot finely adjust the positions in the three-axis directions of XYZ at the respective pickup positions and leaving positions. For this reason, the position of movement of the mounting tables 41 and 51 relative to the test table 10 and the pickup The localization position of the movement of the devices 25 and 35 with respect to the test table 10 and the mounting tables 41 and 51 must have absolute accuracy in both assembly and design. However, under the restriction of movement in the two-axis direction of XZ, it becomes impossible to accurately transfer the IC and perform the test work. With a concrete cost of the problem. In addition, the pick-up devices 25 and 35 are installed on both sides of the test table 10 in the form of L-shaped arms, and the suction nozzles 253 and 353 are pressed down against the IC to be tested, but the leveling at that time is deteriorated, The test quality is affected.

ゆえに、本発明は一種の3軸方向にスライド可能な移送ピックアップ装置を提供し、移動を微調整する方式で各相対位置間の誤差を補償し、これにより製造を容易とし、安定して作業の実行を行なえるようにする。   Therefore, the present invention provides a kind of transfer pickup device that can slide in three axial directions, and compensates for errors between the relative positions by a method of finely adjusting the movement, thereby facilitating manufacture and stable operation. Enable execution.

請求項1の発明は、電子部品移送装置において、
少なくとも一つのワークステーションであって、作業を行なう電子部品が送られて、電子部品の作業を実行する、該ワークステーションと、
第1供給載置具であって、該ワークステーションの一側に位置し、並びに作業を行なう電子部品を載置する、該第1供給載置具と、
第2供給載置具であって、該ワークステーションの別側に位置し、並びに作業を行なう電子部品を載置する、該第1供給載置具と、
第1収集載置具であって、該第1供給載置具と同側に位置し、並びに作業完成した電子部品を載置する、該第1収集載置具と、
第2収集載置具であって、該第2供給載置具と同側に位置し、並びに作業完成した電子部品を載置する、該第2収集載置具と、
第1ピックアップ装置であって、スライドレールセットで該ワークステーションの上方のフレームに架設され、並びに3軸方向のスライド可能で、電子部品を移送し作業の実行に供する、該第1ピックアップ装置と、
第2ピックアップ装置であって、スライドレールセットで該ワークステーションの上方のフレームに架設され、並びに3軸方向のスライド可能で、電子部品を移送し作業の実行に供する、該第2ピックアップ装置と、
を包含したことを特徴とする、電子部品移送装置としている。
請求項2の発明は、請求項1記載の電子部品移送装置において、該第1供給載置具と該第2供給載置具は固定式或いは移動式の供給載置具とされたことを特徴とする、電子部品移送装置としている。
請求項3の発明は、請求項1記載の電子部品移送装置において、該第1収集載置具と該第2収集載置具は固定式或いは移動式の収集載置具とされたことを特徴とする、電子部品移送装置としている。
請求項4の発明は、請求項1記載の電子部品移送装置において、該第1ピックアップ装置は昇降ロッドの前端に吸着ノズルが取り付けられて、供給載置具上の電子部品を該ワークステーション及び収集載置具間で移送し、並びに電子部品を下圧し作業に供することを特徴とする、電子部品移送装置としている。
請求項5の発明は、請求項1記載の電子部品移送装置において、該第2ピックアップ装置は昇降ロッドの前端に吸着ノズルが取り付けられて、供給載置具上の電子部品を該ワークステーション及び収集載置具間で移送し、並びに電子部品を下圧し作業に供することを特徴とする、電子部品移送装置としている。
請求項6の発明は、電子部品移送方法において、
A.第1ピックアップ装置が第1供給載置具部分に位置して作業を行なう電子部品のピックアップに待機し、第2ピックアップ装置がワークステーションの上方に位置して電子部品の作業実行に待機するステップ、
B.ワークステーション内の電子部品の作業完成後、第2ピックアップ装置が作業完成した電子部品を第2収集載置具に移送放置し、第1ピックアップ装置が作業する電子部品をワークステーションに移送して作業実行に供するステップ、
C.ワークステーション内の電子部品に作業を実行すると同時に、第2ピックアップ装置が第2供給載置具部分に移動し、次の一組の作業を行なう電子部品のピックアップに待機するステップ、
D.ワークステーション内の電子部品の作業完成後に、第1ピックアップ装置が作業完成した電子部品を第1収集載置具に移送放置し、第2ピックアップ装置が次の一組の作業を行なう電子部品をワークステーションに移送して作業実行に供するステップ、
E.ワークステーション内の電子部品に作業実行すると同時に、第1ピックアップ装置が第1供給載置具部分に移動して次の一組の作業を行なう電子部品にピックアップに待機するステップ、
以上のAからEのステップを包含したことを特徴とする、電子部品移送方法としている。
請求項7の発明は、請求項6記載の電子部品移送方法において、該第1ピックアップ装置が作業を行なう電子部品を吸着しワークステーションに移送し作業に供する時、電子部品を下圧して作業に供することを特徴とする、電子部品移送方法としている。
請求項8の発明は、請求項6記載の電子部品移送方法において、該第2ピックアップ装置が作業を行なう電子部品を吸着しワークステーションに移送し作業に供する時、電子部品を下圧して作業に供することを特徴とする、電子部品移送方法としている。
請求項9の発明は、請求項6記載の電子部品移送方法において、該第1供給載置具と該第2供給載置具上の作業を行なう電子部品は供給側輸送機構により移送放置されることを特徴とする、電子部品移送方法としている。
請求項10の発明は、請求項6記載の電子部品移送方法において、該第1収集載置具と該第2収集載置具上の作業完成した電子部品は送出側輸送機構により収集機構に移送され分類放置されることを特徴とする、電子部品移送装置としている。
The invention of claim 1 is an electronic component transfer device,
At least one workstation, to which electronic components to perform work are sent to perform the work of the electronic components;
A first supply mounting tool, the first supply mounting tool being placed on one side of the workstation and mounting an electronic component for performing work;
A first supply mounting tool, which is a second supply mounting tool, which is located on the other side of the workstation and on which an electronic component for performing work is placed;
A first collection placement tool, which is located on the same side as the first supply placement tool, and on which the completed electronic component is placed;
A second collection placement tool, which is located on the same side as the second supply placement tool, and places the completed electronic component; and
A first pick-up device, which is mounted on a frame above the workstation with a slide rail set, is slidable in three axial directions, and transfers electronic components to perform work; and
A second pickup device, which is mounted on a frame above the workstation with a slide rail set, is slidable in three axial directions, and transfers electronic components to perform work; and
It is set as the electronic component transfer apparatus characterized by including.
According to a second aspect of the present invention, in the electronic component transfer device according to the first aspect, the first supply mounting tool and the second supply mounting tool are fixed or movable supply mounting tools. And an electronic component transfer device.
According to a third aspect of the present invention, in the electronic component transfer apparatus according to the first aspect, the first collection mounting tool and the second collection mounting tool are fixed or movable collection mounting tools. And an electronic component transfer device.
According to a fourth aspect of the present invention, in the electronic component transfer device according to the first aspect, the first pickup device has a suction nozzle attached to the front end of the lifting rod, and the electronic component on the supply mounting device is collected by the workstation and the electronic component. The electronic component transfer device is characterized in that the electronic component is transferred between mounting tools, and the electronic component is subjected to a lower pressure for work.
According to a fifth aspect of the present invention, in the electronic component transfer device according to the first aspect, the second pickup device has a suction nozzle attached to the front end of the lifting rod, and the electronic component on the supply mounting device is collected by the workstation. The electronic component transfer device is characterized in that the electronic component is transferred between mounting tools, and the electronic component is subjected to a lower pressure for work.
The invention of claim 6 is an electronic component transfer method,
A. A step in which the first pickup device is positioned on the first supply mounting tool portion and waits for pickup of an electronic component to be operated; and a second pickup device is positioned above the workstation and waits for execution of work on the electronic component;
B. After completion of the work of the electronic components in the workstation, the electronic components completed by the second pickup device are transferred to the second collecting and placing device, and the electronic components to be worked by the first pickup device are transferred to the workstation. Steps to be carried out,
C. Simultaneously performing work on the electronic components in the workstation, the second pick-up device moving to the second supply platform part and waiting for pick-up of the electronic components to perform the next set of work;
D. After the work of the electronic components in the workstation is completed, the electronic components completed by the first pick-up device are transferred to the first collecting and placing device, and the second pick-up device performs the next set of operations as work pieces. Steps to transfer to the station for work execution,
E. The first pickup device moves to the first supply mounting part and waits for the electronic component to perform the next set of operations at the same time as performing the operation on the electronic component in the workstation;
The electronic component transfer method is characterized by including the above steps A to E.
According to a seventh aspect of the present invention, in the electronic component transfer method according to the sixth aspect, when the first pick-up device sucks the electronic component to be operated and transfers it to a work station for use in the operation, the electronic component is reduced in pressure for the operation. The electronic component transfer method is characterized by providing the electronic component.
According to an eighth aspect of the present invention, in the electronic component transfer method according to the sixth aspect, when the second pickup device picks up the electronic component to be operated and transfers it to the work station for use in the operation, the electronic component is reduced in pressure for the operation. The electronic component transfer method is characterized by providing the electronic component.
According to a ninth aspect of the present invention, in the electronic component transfer method according to the sixth aspect, the electronic components that perform work on the first supply mounting tool and the second supply mounting tool are left untransferred by the supply-side transport mechanism. This is an electronic component transfer method.
According to a tenth aspect of the present invention, in the electronic component transfer method according to the sixth aspect, the completed electronic parts on the first collection mounting device and the second collection mounting device are transferred to the collection mechanism by the sending side transport mechanism. The electronic component transfer device is characterized by being classified and left unattended.

本発明は一種の電子部品移送装置及び方法を提供し、それは、ワークステーション、ワークステーションの一側の第1供給載置具及び第1収集載置具、もう一側の第2供給載置具と第2収集載置具、第1ピックアップ装置及び第2ピックアップ装置を包含する。そのうち、該第1ピックアップ装置及び第2ピックアップ装置の昇降ロッドの前端には吸着ノズルが設けられ、昇降ロッドはスライドレールセットでそれぞれワークステーション上方のフレームに架設され、それぞれ3軸方向のスライド可能で、作業実行時に、第1ピックアップ装置及び第2ピックアップ装置が3軸方向スライド可能で、微調整移動の方式で、ワークステーション、第1、2供給載置具、第1、2収集載置具間の誤差を補償し、製造を容易とし、製造コストを下げる目的を達成する。   The present invention provides a kind of electronic component transfer apparatus and method, which includes a workstation, a first supply platform on one side of the workstation, a first collection platform, and a second supply platform on the other side. And a second collection mounting tool, a first pickup device, and a second pickup device. Among them, a suction nozzle is provided at the front ends of the lifting rods of the first pickup device and the second pickup device, and the lifting rods are installed on a frame above the workstation by a slide rail set, respectively, and can slide in three axial directions. The first pick-up device and the second pick-up device can be slid in the three-axis directions at the time of performing the work, and are finely adjusted and moved between the workstation, the first and second supply placement tools, and the first and second collection placement tools. To achieve the objective of facilitating manufacturing and reducing manufacturing costs.

本発明はまた、電子部品移送装置及び方法を提供し、そのうち、該第1ピックアップ装置及び第2ピックアップ装置の昇降ロッドはそれぞれスライドレールセットでワークステーション上方のフレームに架設され、それぞれ3軸方向のスライド可能で、作業実行時に、昇降ロッドは吸着ノズルを駆動して正確にワークステーションの上方において電子部品を置かせ、並びに良好な水平度で安定して電子部品を押圧させ作業を実行し、作業品質を高める。   The present invention also provides an electronic component transfer apparatus and method, in which the lifting rods of the first pickup apparatus and the second pickup apparatus are each erected on a frame above the workstation by a slide rail set, respectively, It is slidable, and when performing work, the lifting rod drives the suction nozzle to accurately place the electronic component above the workstation, and performs the work by pressing the electronic component stably at a good level. Increase quality.

図4を参照されたい。本発明は試験分類機に配置され使用される時、該試験分類機は供給機構60、供給側輸送機構70、ワークエリア80、送出側輸送機構90、及び収集機構100を包含する。供給側輸送機構70は供給機構60上で試験待ちの電子部品をワークエリア80内の第1、第2供給載置具81、82に送り、ワークエリア80内の第1、第2収集載置具83、84上の試験完了した電子部品は、試験結果により送出側輸送機構90により収集機構100に送られて分類収集される。   Please refer to FIG. When the present invention is deployed and used in a test sorter, the test sorter includes a supply mechanism 60, a supply transport mechanism 70, a work area 80, a delivery transport mechanism 90, and a collection mechanism 100. The supply-side transport mechanism 70 sends electronic components waiting for testing on the supply mechanism 60 to the first and second supply platforms 81 and 82 in the work area 80, and the first and second collection platforms in the work area 80. The electronic components that have been tested on the tools 83 and 84 are sent to the collecting mechanism 100 by the sending-side transport mechanism 90 and classified and collected according to the test results.

図5、6を参照されたい。本発明のワークエリア80はワークステーション85、ワークステーション85の一側に位置する第1供給載置具81及び第1収集載置具83、ワークステーション85の別側に位置する第2供給載置具82及び第2収集載置具84、第1ピックアップ装置86及び第2ピックアップ装置87を包含する。第1、2供給載置具81、82は試験待ちの電子部品を載置し、第1、2収集載置具83、84は試験完了した電子部品を載置する。該第1、2供給載置具81、82及び第1、2収集載置具83、84は固定された方式でワークステーション85の関係位置に位置決めされ、第1、2ピックアップ装置86、87及び供給側輸送機構及び送出側輸送機構による供給、収集作業に供されるか、或いはそれぞれが独立して左右に往復スライド可能な方式で、対応するワークステーション85の関係位置に位置決めされ、第1、2ピックアップ装置86、87及び供給側輸送機構、送出側輸送機構による供給、収集作業に供される。第1ピックアップ装置86及び第2ピックアップ装置87はそれぞれスライドレールセット861、871でワークステーション85上方のフレームに架設され、並びにそれぞれ3軸方向(X−Y−Z)のスライドを行なえる。該第1ピックアップ装置86及び第2ピックアップ装置87の昇降ロッド862、872の前端は横向き面板863、873で二つの吸着ノズル864、874が取り付けられ、これによりスライドレールセット861、871、昇降ロッド862、872及び横向き面板863、873で吸着ノズル864、874を駆動して3軸方向(X−Y−Z)にスライドさせられ、これにより電子部品をワークステーションに移送して試験を実行することができる。   Please refer to FIGS. The work area 80 of the present invention is a work station 85, a first supply placement tool 81 and a first collection placement tool 83 located on one side of the work station 85, and a second supply placement located on the other side of the work station 85. A tool 82, a second collecting and mounting tool 84, a first pickup device 86, and a second pickup device 87. The first and second supply placement tools 81 and 82 place electronic components waiting for the test, and the first and second collection placement tools 83 and 84 place electronic components that have been tested. The first and second supply mounting tools 81 and 82 and the first and second collecting mounting tools 83 and 84 are positioned at a relative position of the workstation 85 in a fixed manner, and the first and second pickup devices 86 and 87 and It is used for supply and collection operations by the supply-side transport mechanism and the delivery-side transport mechanism, or each is independently slidable to the left and right, and is positioned at the corresponding position of the corresponding workstation 85, The two pickup devices 86 and 87 and the supply side transport mechanism and the supply side transport mechanism are used for supply and collection operations. The first pickup device 86 and the second pickup device 87 are installed on the frame above the workstation 85 by slide rail sets 861 and 871, respectively, and can slide in three axial directions (XYZ). Two suction nozzles 864 and 874 are attached to the front ends of the lifting rods 862 and 872 of the first pickup device 86 and the second pickup device 87 by laterally facing plates 863 and 873, whereby the slide rail sets 861 and 871 and the lifting rod 862 are mounted. , 872 and laterally facing plates 863, 873 drive the suction nozzles 864, 874 to be slid in three axial directions (XYZ), thereby transferring the electronic components to the workstation and executing the test. it can.

図7を参照されたい。本発明の電子部品移送方法によると、ワークエリア80で試験作業実行時に、その第2ピックアップ装置87はワークステーション85の上方に位置して電子部品110を押さえて試験作業の実行に供し、第1ピックアップ装置86は第1供給載置具81部分に位置して試験を行なう電子部品111のピックアップに待機する。図8を参照されたい。電子部品110の試験完成後、第2ピックアップ装置87は試験完成した電子部品110を第2収集載置具84に移送して放置し、送出側輸送機構が試験結果により収集機構に分類放置するのに供する。また第1ピックアップ装置86は試験を行なう電子部品111を吸着してワークステーション85上に移送し、並びに電子部品111を押圧し試験作業に供する。図9に示されるように、電子部品111の試験作業を実行すると同時に、第2ピックアップ装置87は試験完成した電子部品110の放置を完成した後、第2供給載置具82部分に平行移動し、供給側輸送機構によりすでに第2供給載置具82に移送された電子部品112を、該第2ピックアップ装置87がピックアップする準備する。図10に示されるように、続いて、電子部品111の試験完成後に、第1ピックアップ装置86が試験完成した電子部品111を第1収集載置具83に移送して放置し、送出側輸送機構が試験結果により収集機構に分類放置するのに供する。同時に第2ピックアップ装置87が試験する電子部品112を吸着してワークステーション85上に移送し、並びに電子部品112を押さえて試験作業に供する。図11に示されるように、電子部品112に試験作業を実行すると同時に、第1ピックアップ装置86が試験完成した電子部品111を放置完成した後、平行に第1供給載置具81部分まで移動し、供給側輸送機構によりすでに試験する電子部品113が第1供給載置具81上に移送されているため、第1ピックアップ装置86が第1供給載置具81上で次の試験を行なう電子部品113のピックアップに待機し、これにより第1ピックアップ装置86及び第2ピックアップ装置87がそれぞれワークステーション85の両側で交互に輪転式に電子部品の移送を行なう。   Please refer to FIG. According to the electronic component transfer method of the present invention, when the test operation is performed in the work area 80, the second pickup device 87 is positioned above the work station 85 and presses the electronic component 110 to perform the test operation. The pickup device 86 is placed on the first supply mounting tool 81 and waits for the pickup of the electronic component 111 to be tested. Please refer to FIG. After the test of the electronic component 110 is completed, the second pick-up device 87 transfers the test completed electronic component 110 to the second collection platform 84 and leaves it, and the sending-side transport mechanism classifies and leaves the collection mechanism according to the test result. To serve. Further, the first pickup device 86 sucks and transfers the electronic component 111 to be tested onto the workstation 85, and presses the electronic component 111 to be used for the test work. As shown in FIG. 9, simultaneously with the execution of the test operation of the electronic component 111, the second pickup device 87 completes the leaving of the electronic component 110 that has been tested, and then translates to the second supply mounting tool 82 portion. The second pickup device 87 prepares to pick up the electronic component 112 that has already been transferred to the second supply mounting tool 82 by the supply-side transport mechanism. As shown in FIG. 10, subsequently, after the test of the electronic component 111 is completed, the electronic component 111 completed by the first pickup device 86 is transferred to the first collecting / mounting tool 83 and left there, and the delivery side transport mechanism Will be left in the collection mechanism according to the test results. At the same time, the second pickup device 87 picks up the electronic component 112 to be tested and transfers it to the work station 85, and presses the electronic component 112 for testing. As shown in FIG. 11, at the same time when the electronic component 112 is tested, the first pick-up device 86 completes the test completed electronic component 111 and then moves in parallel to the first supply mounting tool 81 portion. Since the electronic component 113 to be tested has already been transferred onto the first supply mounting tool 81 by the supply side transport mechanism, the first pickup device 86 performs the next test on the first supply mounting tool 81. The first pickup device 86 and the second pickup device 87 transfer the electronic components alternately on both sides of the workstation 85 in a rotary manner.

本発明の第1ピックアップ装置86及び第2ピックアップ装置87は3軸方向のスライド可能で、これにより、微調整移動の方式で作業点、固定式供給載置具、固定式収集載置具の各相対位置間の誤差を補償でき、これにより製造が容易で及び製造コストを減らせる効果を達成する。   The first pick-up device 86 and the second pick-up device 87 of the present invention are slidable in the three-axis directions, so that each of the working point, the fixed supply mounting tool, and the fixed collecting mounting tool can be adjusted by a fine adjustment movement method. An error between the relative positions can be compensated, thereby achieving an effect that the manufacturing is easy and the manufacturing cost can be reduced.

図12を参照されたい。本発明の第1ピックアップ装置86及び第2ピックアップ装置87は3軸方向のスライド可能で、試験作業実行時に、その昇降ロッド862、872の前端の吸着ノズル864、874が正確にワークステーション85の真上から電子部品を放置でき、並びに良好な水平度を以て、平均した下圧力を提供し、安定して電子部品を押さえて試験作業の実行に供し、これにより作業品質を向上する目的を達成する。   Please refer to FIG. The first pick-up device 86 and the second pick-up device 87 of the present invention are slidable in the three-axis directions, and the suction nozzles 864, 874 at the front ends of the lifting rods 862, 872 are accurately set to the true position of the workstation 85 when performing a test operation. The electronic component can be left from the top, and the average lower pressure is provided with a good levelness, and the electronic component is stably held for execution of the test work, thereby achieving the purpose of improving the work quality.

これにより、本発明は製造を容易とし製造コストを減らす目的を達成できるのみならず、効果的に試験作業品質を向上することができ、実用性と進歩性を具えた発明であり、同じ或いは類似の製品はその出願前に公開されておらず、特許の要件を具備している。   As a result, the present invention not only can achieve the purpose of facilitating the production and reduce the production cost, but also can effectively improve the quality of test work, and is an invention having practicality and inventive step, the same or similar. The product has not been published prior to its filing and has patent requirements.

特許文献1のIC試験装置の配置表示図である。FIG. 10 is a layout display diagram of the IC test apparatus of Patent Document 1. 特許文献1のIC試験装置の第1ピックアップ装置の表示図である。FIG. 10 is a display diagram of the first pickup device of the IC test apparatus of Patent Document 1. 特許文献1のIC試験装置の第2ピックアップ装置の表示図である。It is a display figure of the 2nd pick-up apparatus of the IC test apparatus of patent document 1. 本発明を試験分類機に配置した配置表示図である。It is the arrangement | positioning display figure which has arrange | positioned this invention to the test sorter. 本発明の構造図である。1 is a structural diagram of the present invention. 本発明のピックアップ装置の表示図である。It is a display figure of the pick-up apparatus of this invention. 本発明のピックアップ動作表示図(一)である。It is a pick-up operation | movement display figure (1) of this invention. 本発明のピックアップ動作表示図(二)である。It is a pickup operation | movement display figure (2) of this invention. 本発明のピックアップ動作表示図(三)である。It is a pickup operation | movement display figure (3) of this invention. 本発明のピックアップ動作表示図(四)である。It is a pickup operation | movement display figure (4) of this invention. 本発明のピックアップ動作表示図(五)である。It is a pick-up operation | movement display figure (5) of this invention. 本発明のピックアップ装置が電子部品を下圧して試験作業実行に供する状態表示図である。FIG. 6 is a state display diagram in which the pickup device of the present invention lowers the electronic component and performs test work.

符号の説明Explanation of symbols

10 試験台
20 第1ピックアップ機構
21 横向きスライドレール 22 横向きスクリュー 23 モータ
24 スライド装置 241 スクリュースリーブ
242 横向きスライドシート 243 縦向きスライドシート
25 ピックアップ装置 251 縦向きスライドレール
252 横向きスライドシート 253 吸着ノズル
26 サポートフレーム 261 横向きスライドレール
262 縦向きスライドシート 263 スクリュースリーブ
27 縦向きスライドレール 28 縦向きスクリュー 29 モータ
30 第2ピックアップ機構 31 横向きスライドレール
32 横向きスクリュー 33 モータ 34 スライド装置
341 スクリュースリーブ 342 横向きスライドシート
343 縦向きスライドシート 35 ピックアップ装置
351 縦向きスライドレール 352 横向きスライドシート
353 吸着ノズル 36 サポートフレーム
361 横向きスライドレール 362 縦向きスライドシート
363 スクリュースリーブ 37 縦向きスライドレール
38 縦向きスクリュー 39 モータ
40 供給機構 41 載置台 42 吸着ノズル
50 送出機構 51 載置台 52 吸着ノズル
60 供給機構 70 供給側輸送機構
80 ワークエリア 81 第1供給載置具
82 第2供給載置具 83 第1収集載置具
84 第2収集載置具 85 ワークステーション
86 第1ピックアップ装置 861 スライドレールセット
862 昇降ロッド 863 横向き面板
864 吸着ノズル 87 第2ピックアップ装置
871 スライドレールセット 872 昇降ロッド
873 横向き面板 874 吸着ノズル
90 送出側輸送機構 100 収集機構
110、111、112、113 電子部品
DESCRIPTION OF SYMBOLS 10 Test stand 20 1st pick-up mechanism 21 Lateral slide rail 22 Lateral screw 23 Motor 24 Slide apparatus 241 Screw sleeve 242 Lateral slide sheet 243 Vertical slide sheet 25 Pickup apparatus 251 Vertical slide rail 252 Horizontal slide sheet 253 Adsorption nozzle 26 Support frame 261 Horizontal slide rail 262 Vertical slide sheet 263 Screw sleeve 27 Vertical slide rail 28 Vertical screw 29 Motor 30 Second pickup mechanism 31 Horizontal slide rail 32 Horizontal screw 33 Motor 34 Slide device 341 Screw sleeve 342 Horizontal slide sheet 343 Vertical Slide sheet 35 Pickup device 351 Vertical slide rail 3 52 Horizontal slide sheet 353 Adsorption nozzle 36 Support frame 361 Horizontal slide rail 362 Vertical slide sheet 363 Screw sleeve 37 Vertical slide rail 38 Vertical screw 39 Motor 40 Supply mechanism 41 Mounting table 42 Adsorption nozzle 50 Delivery mechanism 51 Mounting table 52 Adsorption Nozzle 60 Supply mechanism 70 Supply-side transport mechanism 80 Work area 81 First supply mounting tool 82 Second supply mounting tool 83 First collection mounting tool 84 Second collection mounting tool 85 Workstation 86 First pickup device 861 Slide Rail set 862 Lifting rod 863 Horizontally facing plate 864 Suction nozzle 87 Second pickup device 871 Slide rail set 872 Lifting rod 873 Horizontally facing plate 874 Suction nozzle 90 Delivery side transport mechanism 100 Collecting mechanism 10,111,112,113 electronic components

Claims (10)

電子部品移送装置において、
少なくとも一つのワークステーションであって、作業を行なう電子部品が送られて、電子部品の作業を実行する、該ワークステーションと、
第1供給載置具であって、該ワークステーションの一側に位置し、並びに作業を行なう電子部品を載置する、該第1供給載置具と、
第2供給載置具であって、該ワークステーションの別側に位置し、並びに作業を行なう電子部品を載置する、該第1供給載置具と、
第1収集載置具であって、該第1供給載置具と同側に位置し、並びに作業完成した電子部品を載置する、該第1収集載置具と、
第2収集載置具であって、該第2供給載置具と同側に位置し、並びに作業完成した電子部品を載置する、該第2収集載置具と、
第1ピックアップ装置であって、スライドレールセットで該ワークステーションの上方のフレームに架設され、並びに3軸方向のスライド可能で、電子部品を移送し作業の実行に供する、該第1ピックアップ装置と、
第2ピックアップ装置であって、スライドレールセットで該ワークステーションの上方のフレームに架設され、並びに3軸方向のスライド可能で、電子部品を移送し作業の実行に供する、該第2ピックアップ装置と、
を包含したことを特徴とする、電子部品移送装置。
In the electronic component transfer device,
At least one workstation, to which electronic components to perform work are sent to perform the work of the electronic components;
A first supply mounting tool, the first supply mounting tool being placed on one side of the workstation and mounting an electronic component for performing work;
A first supply mounting tool, which is a second supply mounting tool, which is located on the other side of the workstation and on which an electronic component for performing work is placed;
A first collection placement tool, which is located on the same side as the first supply placement tool, and on which the completed electronic component is placed;
A second collection placement tool, which is located on the same side as the second supply placement tool, and places the completed electronic component; and
A first pick-up device, which is mounted on a frame above the workstation with a slide rail set, is slidable in three axial directions, and transfers electronic components to perform work; and
A second pickup device, which is mounted on a frame above the workstation with a slide rail set, is slidable in three axial directions, and transfers electronic components to perform work; and
An electronic component transfer device comprising:
請求項1記載の電子部品移送装置において、該第1供給載置具と該第2供給載置具は固定式或いは移動式の供給載置具とされたことを特徴とする、電子部品移送装置。   2. The electronic component transfer apparatus according to claim 1, wherein the first supply mounting tool and the second supply mounting tool are fixed or movable supply mounting tools. . 請求項1記載の電子部品移送装置において、該第1収集載置具と該第2収集載置具は固定式或いは移動式の収集載置具とされたことを特徴とする、電子部品移送装置。   2. The electronic component transfer apparatus according to claim 1, wherein the first collection mounting device and the second collection mounting device are fixed or movable collection mounting devices. . 請求項1記載の電子部品移送装置において、該第1ピックアップ装置は昇降ロッドの前端に吸着ノズルが取り付けられて、供給載置具上の電子部品を該ワークステーション及び収集載置具間で移送し、並びに電子部品を下圧し作業に供することを特徴とする、電子部品移送装置。   2. The electronic component transfer device according to claim 1, wherein the first pickup device has a suction nozzle attached to a front end of the lifting rod, and transfers the electronic component on the supply mounting device between the workstation and the collection mounting device. In addition, the electronic component transfer device is characterized by lowering the pressure of the electronic component and using it for work. 請求項1記載の電子部品移送装置において、該第2ピックアップ装置は昇降ロッドの前端に吸着ノズルが取り付けられて、供給載置具上の電子部品を該ワークステーション及び収集載置具間で移送し、並びに電子部品を下圧し作業に供することを特徴とする、電子部品移送装置。   2. The electronic component transfer device according to claim 1, wherein the second pickup device has a suction nozzle attached to a front end of the lifting rod, and transfers the electronic component on the supply mounting device between the workstation and the collection mounting device. In addition, the electronic component transfer device is characterized by lowering the pressure of the electronic component and using it for work. 電子部品移送方法において、
A.第1ピックアップ装置が第1供給載置具部分に位置して作業を行なう電子部品のピックアップに待機し、第2ピックアップ装置がワークステーションの上方に位置して電子部品の作業実行に待機するステップ、
B.ワークステーション内の電子部品の作業完成後、第2ピックアップ装置が作業完成した電子部品を第2収集載置具に移送放置し、第1ピックアップ装置が作業する電子部品をワークステーションに移送して作業実行に供するステップ、
C.ワークステーション内の電子部品に作業を実行すると同時に、第2ピックアップ装置が第2供給載置具部分に移動し、次の一組の作業を行なう電子部品のピックアップに待機するステップ、
D.ワークステーション内の電子部品の作業完成後に、第1ピックアップ装置が作業完成した電子部品を第1収集載置具に移送放置し、第2ピックアップ装置が次の一組の作業を行なう電子部品をワークステーションに移送して作業実行に供するステップ、
E.ワークステーション内の電子部品に作業実行すると同時に、第1ピックアップ装置が第1供給載置具部分に移動して次の一組の作業を行なう電子部品にピックアップに待機するステップ、
以上のAからEのステップを包含したことを特徴とする、電子部品移送方法。
In the electronic component transfer method,
A. A step in which the first pickup device is positioned on the first supply mounting tool portion and waits for pickup of an electronic component to be operated; and a second pickup device is positioned above the workstation and waits for execution of work on the electronic component;
B. After completion of the work of the electronic components in the workstation, the electronic components completed by the second pickup device are transferred to the second collecting and placing device, and the electronic components to be worked by the first pickup device are transferred to the workstation. Steps to be carried out,
C. Simultaneously performing work on the electronic components in the workstation, the second pick-up device moving to the second supply platform part and waiting for pick-up of the electronic components to perform the next set of work;
D. After the work of the electronic components in the workstation is completed, the electronic components completed by the first pick-up device are transferred to the first collecting and placing device, and the second pick-up device performs the next set of operations as work pieces. Steps to transfer to the station for work execution,
E. The first pickup device moves to the first supply mounting part and waits for the electronic component to perform the next set of operations at the same time as performing the operation on the electronic component in the workstation;
An electronic component transfer method comprising the steps A to E described above.
.
請求項6記載の電子部品移送方法において、該第1ピックアップ装置が作業を行なう電子部品を吸着しワークステーションに移送し作業に供する時、電子部品を下圧して作業に供することを特徴とする、電子部品移送方法。   The electronic component transfer method according to claim 6, wherein when the first pickup device sucks and transfers the electronic component to be operated to the work station to be used for work, the electronic component is subjected to pressure reduction for use in the work. Electronic component transfer method. 請求項6記載の電子部品移送方法において、該第2ピックアップ装置が作業を行なう電子部品を吸着しワークステーションに移送し作業に供する時、電子部品を下圧して作業に供することを特徴とする、電子部品移送方法。   The electronic component transfer method according to claim 6, wherein when the second pickup device sucks the electronic component to be operated and transfers it to a work station to be used for the operation, the electronic component is subjected to a lower pressure for the operation. Electronic component transfer method. 請求項6記載の電子部品移送方法において、該第1供給載置具と該第2供給載置具上の作業を行なう電子部品は供給側輸送機構により移送放置されることを特徴とする、電子部品移送方法。   7. The electronic component transfer method according to claim 6, wherein the electronic components that perform the operations on the first supply mounting tool and the second supply mounting tool are left unloaded by a supply-side transport mechanism. Parts transfer method. 請求項6記載の電子部品移送方法において、該第1収集載置具と該第2収集載置具上の作業完成した電子部品は送出側輸送機構により収集機構に移送され分類放置されることを特徴とする、電子部品移送方法。   7. The electronic component transfer method according to claim 6, wherein work-completed electronic components on the first collection platform and the second collection platform are transported to a collection mechanism by a sending-side transport mechanism and left unsorted. A method for transferring an electronic component.
JP2008001253A 2007-01-29 2008-01-08 Electronic component transfer apparatus and method Expired - Fee Related JP4879914B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN200710002488.1 2007-01-29
CN2007100024881A CN101234704B (en) 2007-01-29 2007-01-29 Electronic component transfer loading device and method

Publications (2)

Publication Number Publication Date
JP2008185583A true JP2008185583A (en) 2008-08-14
JP4879914B2 JP4879914B2 (en) 2012-02-22

Family

ID=39728720

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008001253A Expired - Fee Related JP4879914B2 (en) 2007-01-29 2008-01-08 Electronic component transfer apparatus and method

Country Status (3)

Country Link
JP (1) JP4879914B2 (en)
KR (1) KR20080071068A (en)
CN (1) CN101234704B (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104752270A (en) * 2013-12-31 2015-07-01 致茂电子股份有限公司 Variable pitch chip taking and placing device
CN108111961A (en) * 2018-02-07 2018-06-01 江西天键电声有限公司 The de- equipment of automatic magnetic rule point applied to earphone production
CN114429930A (en) * 2022-01-28 2022-05-03 上海世禹精密机械有限公司 Automatic collecting device for chip carriers
CN114455317A (en) * 2022-02-11 2022-05-10 江西安福华洋劳务合作有限公司 Conveying device for electronic component production line

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102233334B (en) * 2010-04-21 2015-03-18 鸿劲科技股份有限公司 Test device for electronic component test classifier
CN102233335B (en) * 2010-04-21 2013-06-05 鸿劲科技股份有限公司 Testing device for electronic component test classifier
JP2013053991A (en) * 2011-09-06 2013-03-21 Seiko Epson Corp Handler and component inspection device
CN103086153B (en) * 2011-11-01 2015-03-04 鸿劲科技股份有限公司 Variable distance transfer device for electronic components
CN102784761A (en) * 2012-06-25 2012-11-21 致茂电子(苏州)有限公司 Semi-packaged stacked wafer testing classification bench
CN103575937B (en) * 2012-07-31 2016-03-02 鸿劲科技股份有限公司 The testing apparatus of vapour-pressure type proving installation and application thereof
TW201434578A (en) * 2013-03-15 2014-09-16 Hon Tech Inc Material transfer device and operation equipment applying with the same
TWI560536B (en) * 2014-06-27 2016-12-01 Mpi Corp Apparutus of fully-auto loader and control method thereof
CN104133173B (en) * 2014-08-14 2017-02-01 潍坊路加精工有限公司 Full-automatic test device
CN105984722B (en) * 2015-02-16 2018-05-15 鸿劲科技股份有限公司 Electronic component Filtting device and its implement of application
TWI581900B (en) * 2015-06-05 2017-05-11 Hon Tech Inc Object transfer device and its application of electronic components operating equipment
TWI575644B (en) * 2015-12-18 2017-03-21 Hon Tech Inc Electronic device moving mechanism and its application equipment
CN106428795A (en) * 2016-10-20 2017-02-22 Tcl王牌电器(惠州)有限公司 Packing device
CN109709463A (en) * 2017-10-25 2019-05-03 泰克元有限公司 Manipulator
CN108459259A (en) * 2018-02-08 2018-08-28 上海华岭集成电路技术股份有限公司 One kind ensuring the correct method of multistation coordinate
CN110095707A (en) * 2019-04-09 2019-08-06 深圳市贝优通新能源技术开发有限公司 A kind of portable type chip detecting equipment with adjustment function

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07239367A (en) * 1994-02-28 1995-09-12 Ando Electric Co Ltd Ic conveying mechanism by a plurality of sucking hands
JPH0854444A (en) * 1994-08-16 1996-02-27 Tokyo Electron Ltd Inspecting apparatus and method therefor
JP2002357635A (en) * 2001-06-01 2002-12-13 Yamaha Motor Co Ltd Part testing device
JP2003075505A (en) * 2001-09-05 2003-03-12 Yamaha Motor Co Ltd Parts tester

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5865319A (en) * 1994-12-28 1999-02-02 Advantest Corp. Automatic test handler system for IC tester
CN1715940A (en) * 2004-06-29 2006-01-04 鸿劲科技股份有限公司 IC detector suitable for different IC's

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07239367A (en) * 1994-02-28 1995-09-12 Ando Electric Co Ltd Ic conveying mechanism by a plurality of sucking hands
JPH0854444A (en) * 1994-08-16 1996-02-27 Tokyo Electron Ltd Inspecting apparatus and method therefor
JP2002357635A (en) * 2001-06-01 2002-12-13 Yamaha Motor Co Ltd Part testing device
JP2003075505A (en) * 2001-09-05 2003-03-12 Yamaha Motor Co Ltd Parts tester

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104752270A (en) * 2013-12-31 2015-07-01 致茂电子股份有限公司 Variable pitch chip taking and placing device
CN104752270B (en) * 2013-12-31 2018-01-05 致茂电子股份有限公司 Variable pitch chip taking and placing device
CN108111961A (en) * 2018-02-07 2018-06-01 江西天键电声有限公司 The de- equipment of automatic magnetic rule point applied to earphone production
CN108111961B (en) * 2018-02-07 2023-11-07 江西天键电声有限公司 Be applied to automatic magnetic rule of earphone production and divide and take off equipment
CN114429930A (en) * 2022-01-28 2022-05-03 上海世禹精密机械有限公司 Automatic collecting device for chip carriers
CN114429930B (en) * 2022-01-28 2023-04-14 上海世禹精密设备股份有限公司 Chip carrier automatic collection device
CN114455317A (en) * 2022-02-11 2022-05-10 江西安福华洋劳务合作有限公司 Conveying device for electronic component production line

Also Published As

Publication number Publication date
CN101234704B (en) 2011-11-16
KR20080071068A (en) 2008-08-01
JP4879914B2 (en) 2012-02-22
CN101234704A (en) 2008-08-06

Similar Documents

Publication Publication Date Title
JP4879914B2 (en) Electronic component transfer apparatus and method
CN204624689U (en) Glass baseplate automatic charging device
CN103771113A (en) Material conveying device
CN110513370B (en) Pressure control attaching mechanism of automatic equipment
CN103512904A (en) Workpiece appearance measurement device and operation method for measuring workpiece appearance
CN109001926A (en) A kind of contraposition module
CN202759742U (en) Double-head glue dispensing mounting machine
CN105974619A (en) Liquid-crystal-screen detecting device with transferring function
CN208922000U (en) A kind of contraposition module
CN2727784Y (en) Circuit fault detecting and laser repairing device for two-dimensional display
CN1673765A (en) Line defect detection maintenance equipment and method
KR100819540B1 (en) Transferring apparatus for producing the plate type display
CN114813692B (en) Online fluorescence microscopy machine of OLED screen
CN202753549U (en) Fitting transfer device
CN106583942B (en) Wafer marking mechanism
TWI534442B (en) Electronic components operating equipment and its application of the test classification equipment
CN111483757B (en) Fine positioning device and fine positioning method of flat-panel television
CN108356432A (en) Optical scanner and laser drill equipment
CN208945504U (en) A kind of key mapping spring automatic assembly equipment
KR20230052517A (en) Packing device for PCB substrates
CN210283574U (en) Be applied to climbing mechanism of screen printing equipment
CN208471020U (en) A kind of material collecting device for Full-automatic tester
CN106926569A (en) A kind of new big glass plate printing machine
JP5189002B2 (en) Flux printing on board and solder ball mounting device
CN206327810U (en) A kind of discharging mechanism for the general assembly that flowed back for carrier

Legal Events

Date Code Title Description
A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20100804

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100810

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20101109

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20110830

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20111102

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20111122

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20111130

R150 Certificate of patent or registration of utility model

Ref document number: 4879914

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20141209

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees