JP2008170358A - Sample stand, measuring object sample, and moisture permeability measuring device - Google Patents

Sample stand, measuring object sample, and moisture permeability measuring device Download PDF

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JP2008170358A
JP2008170358A JP2007005474A JP2007005474A JP2008170358A JP 2008170358 A JP2008170358 A JP 2008170358A JP 2007005474 A JP2007005474 A JP 2007005474A JP 2007005474 A JP2007005474 A JP 2007005474A JP 2008170358 A JP2008170358 A JP 2008170358A
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substrate
ring
mounting
moisture permeability
sample
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JP4855276B2 (en
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Satoshi Ikeda
智 池田
Hideo Takei
日出夫 竹井
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Ulvac Inc
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Ulvac Inc
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a technology capable of measuring accurately a moisture permeability without generating a stress of a measuring object film, moisture absorption of a substrate, deformation of the substrate caused by heat, or breakage of the measuring object film. <P>SOLUTION: A substrate 41 used for a sample stand 30 and a measuring object sample 40 is made of a ceramics whose moisture permeability is 1×10<SP>-1</SP>g/m<SP>2</SP>/day or higher. The substrate 41 made of the ceramics is hardly deformable, and has high mechanical strength, being different from a resin substrate, and thereby the substrate 41 itself or the measuring object film 42 formed on the substrate 41 is hardly damaged or deformed. In addition, since the moisture permeability of the ceramic substrate 41 is not changed, the moisture permeability of the measuring object film 42 can be determined accurately. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は透湿度の測定に用いられるサンプル台と、そのサンプル台を用いた測定対象サンプル、及び透湿度測定装置に関する。   The present invention relates to a sample table used for measuring moisture permeability, a measurement target sample using the sample table, and a moisture permeability measuring apparatus.

従来より、測定対象膜の透湿度を測定するために、透湿度測定装置が広く用いられている。
一般に、透湿度測定装置は、表面に測定対象膜が形成された基板を挟んで一方の真空槽(供給室)に気体の水を供給し、測定対象膜と、基板とを通過し、他方の真空槽(測定室)に到達した水の量を測定することで透湿度を測定する。
基板には水の透過性が求められるため、一般にナイロン、アクリル等の有機樹脂が用いられていた。
Conventionally, a moisture permeability measuring apparatus has been widely used to measure the moisture permeability of a measurement target film.
In general, a moisture permeation measuring device supplies gaseous water to one vacuum chamber (supply chamber) across a substrate having a measurement target film formed on the surface, passes through the measurement target film and the substrate, The moisture permeability is measured by measuring the amount of water that has reached the vacuum chamber (measuring chamber).
Since the substrate is required to have water permeability, organic resins such as nylon and acrylic are generally used.

しかし、そのような基板は吸湿性が高い上に熱変形しやすく、しかも柔軟性が高いため、測定対象膜のストレスの影響で丸まり、扱い次第では測定対象膜にクラックが入りやすく、そのため、測定結果の再現性が悪いという問題があった。
また、従来は透湿度測定装置のOリングに直接基板を載置したため、Oリングを変形させて基板をOリングに密着させる際に、基板に皺が生じる等、取り扱いが困難であった。
特開2002−357533号公報
However, such a substrate is highly hygroscopic, easily deformed by heat, and has high flexibility, so it is rounded due to the stress of the film to be measured, and depending on how it is handled, the film to be measured is prone to cracks. There was a problem that the reproducibility of the results was poor.
Conventionally, since the substrate is directly placed on the O-ring of the moisture permeability measuring device, when the O-ring is deformed and the substrate is brought into close contact with the O-ring, the substrate is difficult to handle.
JP 2002-357533 A

本発明は上記課題を解決するために成されたものであり、その目的は、透湿度を正確に測定可能な技術を提供することである。   The present invention has been made to solve the above-described problems, and an object thereof is to provide a technique capable of accurately measuring moisture permeability.

上記課題を解決するために請求項1記載の発明は、透湿度測定装置用のサンプル台であって、リング状の載置環と、前記載置環の内側の開口よりも平面形状が大きく、透湿度が1×10-1g/m2/日以上のセラミック製の基板とを有するサンプル台である。
本発明はサンプル台であって、前記載置環の表面と表面が同じ高さにある支持部が、前記載置環の前記内周からリング内側に向けて突き出されたサンプル台である。
本発明はサンプル台であって、前記載置環の表面には、表面が前記載置環の表面よりも高く突き出された位置決め部が、前記載置環の縁に沿って配置されたサンプル台である。
本発明はサンプル台であって、前記載置環は金属製にされたサンプル台である。
本発明は、前記基板が前記載置環上に載置された前記サンプル台と、前記基板表面に配置された測定対象膜と、前記載置環と前記基板の間に配置され、前記載置環の内側の開口を取り囲み、前記基板と前記載置環との間を気密に接着するシール部材とを有する測定対象サンプルである。
本発明は、壁部材で内部空間がそれぞれ取り囲まれた測定室と供給室と、リング状の載置部材とを有し、前記載置部材は、前記測定室の開口周囲の前記壁部材に気密に接続され、前記載置部材の開口を介して前記測定室の内部空間と、前記供給室の内部空間とが連通するように構成され、前記載置部材上には、請求項5記載の前記測定対象サンプルが、前記載置環の前記シール部材が配置された面とは反対側の面と、前記載置部材の表面に密着して配置され、前記載置部材の開口が前記載置環の外周で取り囲まれ、前記供給室には水供給系が接続され、前記供給室の内部の水は、前記測定対象サンプルの前記基板と前記測定対象膜とを通過して前記測定室に移動可能に構成され、前記水の圧力を測定する測定装置が、前記供給室と前記測定室にそれぞれ接続された透湿度測定装置である。
本発明は透湿度測定装置であって、前記載置環と前記載置部材の間に配置され、前記載置部材の開口を取り囲む密閉部材を有する透湿度測定装置である。
本発明は透湿度測定装置であって、前記供給室は、真空槽内に配置された透湿度測定装置である。
In order to solve the above-mentioned problem, the invention according to claim 1 is a sample table for a moisture permeability measuring device, and has a planar shape larger than the ring-shaped mounting ring and the opening inside the mounting ring, This is a sample stage having a ceramic substrate having a moisture permeability of 1 × 10 −1 g / m 2 / day or more.
This invention is a sample stand, Comprising: The support part in which the surface and the surface of the said mounting ring are the same height protrudes toward the ring inner side from the said inner periphery of the said mounting ring.
The present invention is a sample table, and a sample table in which a positioning portion whose surface protrudes higher than a surface of the previous ring is arranged along an edge of the previous ring. It is.
This invention is a sample stand, Comprising: The said mounting ring is a sample stand made from metal.
The present invention includes the sample table on which the substrate is placed on the mounting ring, a measurement target film that is disposed on the surface of the substrate, and a substrate that is disposed between the mounting ring and the substrate. It is a sample to be measured having a sealing member that surrounds an opening inside the ring and hermetically adheres between the substrate and the mounting ring.
The present invention includes a measurement chamber, a supply chamber, and a ring-shaped mounting member each surrounded by a wall member, and the mounting member is airtight to the wall member around the opening of the measurement chamber. The internal space of the measurement chamber and the internal space of the supply chamber communicate with each other through the opening of the mounting member, and the mounting member according to claim 5 The sample to be measured is disposed in close contact with the surface of the mounting ring opposite to the surface on which the sealing member is disposed and the surface of the mounting member, and the opening of the mounting member is the mounting ring described above. The water supply system is connected to the supply chamber, and the water inside the supply chamber can move to the measurement chamber through the substrate and the measurement target film of the measurement target sample. The measuring device configured to measure the pressure of the water includes the supply chamber and the measuring chamber. Respectively connected moisture permeability measuring device.
The present invention is a moisture permeation measuring apparatus having a sealing member disposed between the mounting ring and the mounting member and surrounding an opening of the mounting member.
The present invention is a moisture permeability measuring apparatus, wherein the supply chamber is a moisture permeability measuring apparatus disposed in a vacuum chamber.

尚、透湿度とは、一定時間に単位面積当たりの膜状物質を通過する気体の水の量をいい、温度25℃又は40℃において測定対象物を境界面とし、一方の側の空気を相対湿度90%、他の側の空気を吸湿剤によって乾燥状態に保ったとき、24時間にこの境界面を通過する水の質量(g)を、その材料1m2当たりに換算した値をその材料の透湿度と定める(JIS Z0208(1976))。 Moisture permeability refers to the amount of gaseous water that passes through a membranous substance per unit area over a certain period of time. At a temperature of 25 ° C or 40 ° C, the object to be measured is the boundary surface, and the air on one side is relative. When the humidity on the other side is kept dry by the hygroscopic agent at a humidity of 90%, the mass (g) of water passing through this interface for 24 hours is converted to the value per 1 m 2 of the material. It is defined as moisture permeability (JIS Z0208 (1976)).

本発明は上記のように構成されており、基板の透湿度は1×10-1g/m2/日以上であり、気体の水の透過性が高いので、測定対象膜を透過した水は、基板も透過して測定室に侵入可能になっている。
基板はセラミック製なので変形や破損が生じにくい。従って、測定対象膜は、膜厚10nm以上100nm以下と薄い場合であっても、基板表面に形成されることで、変形や破損が防止される。
The present invention is configured as described above, and the moisture permeability of the substrate is 1 × 10 −1 g / m 2 / day or more, and the permeability of gaseous water is high. The substrate can also penetrate and enter the measurement chamber.
Since the substrate is made of ceramic, deformation and breakage are unlikely to occur. Therefore, even if the measurement target film is thin with a film thickness of 10 nm or more and 100 nm or less, deformation and damage are prevented by being formed on the substrate surface.

本発明は基板は載置環上に配置されているので、測定対象サンプルをOリングのような密閉部材上に配置した時に、基板が直接密閉部材に接触しない。従って、密閉部材を変形させて、測定対象サンプルを密閉部材に密着させる時に、基板が変形しない。   In the present invention, since the substrate is disposed on the mounting ring, the substrate does not directly contact the sealing member when the sample to be measured is disposed on the sealing member such as an O-ring. Therefore, the substrate is not deformed when the sealing member is deformed and the sample to be measured is brought into close contact with the sealing member.

本発明では、セラミック製の基板を使用しているので、測定対象膜の応力や、基板の吸湿や、熱による基板の変形が生じず、測定対象膜の破損が起こらない。しかも、基板の透湿度は変化しないので、透湿度を正確に測定可能であり、再現性も高い。   In the present invention, since a ceramic substrate is used, stress of the measurement target film, moisture absorption of the substrate, and deformation of the substrate due to heat do not occur, and the measurement target film does not break. In addition, since the moisture permeability of the substrate does not change, the moisture permeability can be measured accurately and the reproducibility is high.

図2の符号30は本発明のサンプル台を示しており、このサンプル台30は載置環31と、位置決め部32と、基板41とを有している。
載置環31は内周が円形のリング状に成形されている。図2の符号35は載置環31のリング内側の開口を示している。位置決め部32はリング状であって、そのリング内側の開口は、載置環31の開口35よりも大径にされ、位置決め部32の開口の中心が載置環31の開口35の中心と一致するように、載置環31の表面に配置され、位置決め部32のリング上部は載置環31の表面から高く突き出されている。
Reference numeral 30 in FIG. 2 represents a sample table of the present invention, and this sample table 30 has a mounting ring 31, a positioning portion 32, and a substrate 41.
The mounting ring 31 is formed in a ring shape having a circular inner periphery. Reference numeral 35 in FIG. 2 indicates an opening inside the ring of the mounting ring 31. The positioning portion 32 has a ring shape, and the opening inside the ring is made larger in diameter than the opening 35 of the mounting ring 31, and the center of the opening of the positioning portion 32 coincides with the center of the opening 35 of the mounting ring 31. As described above, the ring is disposed on the surface of the mounting ring 31, and the upper portion of the ring of the positioning portion 32 protrudes high from the surface of the mounting ring 31.

従って、開口35中心からの距離は、位置決め部32の内周の方が載置環31の内周よりも遠く、載置環31の表面は、開口35から位置決め部32までの部分が露出して、開口35を取り囲むリング状の載置部39が形成されている。   Therefore, the distance from the center of the opening 35 is such that the inner periphery of the positioning portion 32 is farther than the inner periphery of the mounting ring 31, and the surface of the mounting ring 31 is exposed from the opening 35 to the positioning portion 32. Thus, a ring-shaped mounting portion 39 surrounding the opening 35 is formed.

基板41は直径が載置環31の開口35の直径よりも大きく、かつ、位置決め部32の内周よりも小さいセラミック製の円盤であって、基板41は開口35から落下せずに載置部39上に載置可能になっている。   The substrate 41 is a ceramic disk having a diameter larger than the diameter of the opening 35 of the mounting ring 31 and smaller than the inner periphery of the positioning portion 32, and the substrate 41 does not fall from the opening 35 and is placed on the mounting portion. It can be placed on 39.

ここでは、載置環31は一定厚みの平板に開口が形成されており、表面は同一平面に位置するから、載置部39には段差が無く、基板41を載置部39上に載置すると、基板41の開口35の外側に位置する部分は全て載置部39と接触し、基板41が安定して保持されるようになっている。   Here, since the mounting ring 31 has a flat plate with an opening and the surface is located on the same plane, the mounting portion 39 has no step and the substrate 41 is mounted on the mounting portion 39. Then, all the parts located outside the opening 35 of the substrate 41 are in contact with the mounting portion 39 so that the substrate 41 is stably held.

次に、このサンプル台30を用いて測定対象サンプルを作成する工程について説明する。
先ず、ペースト状の接着剤を開口35の縁に沿って載置部39に塗布するか、フィルム状の接着剤を開口35の縁に沿って載置部39に貼付して、開口35を取り囲むリング状の接着剤層36を形成する(図3(a)、図4(a))。
接着剤層36のリング内周は基板41の外周よりも小さく、ここでは接着剤層36のリングは開口35と同心円状になっている。
Next, a process of creating a measurement target sample using the sample stage 30 will be described.
First, a paste-like adhesive is applied to the mounting portion 39 along the edge of the opening 35, or a film-like adhesive is applied to the mounting portion 39 along the edge of the opening 35 to surround the opening 35. A ring-shaped adhesive layer 36 is formed (FIGS. 3A and 4A).
The inner ring periphery of the adhesive layer 36 is smaller than the outer periphery of the substrate 41, and here the ring of the adhesive layer 36 is concentric with the opening 35.

基板41の表面に予め測定対象膜42を成膜しておき、基板41の裏面を載置環31に向けて載置環31の上方に配置し、基板41の中心を開口35中心の真上に位置させ、基板41の縁が位置決め部32と重ならないようにした後、略鉛直方向に降下させると、基板41が位置決め部32と接触せずに載置部39上に乗せられ、接着剤層36の載置環31と反対側の面がリング全周に亘って基板41の裏面と密着し、開口35は基板41で覆われた状態になる。   A measurement target film 42 is formed in advance on the surface of the substrate 41, the rear surface of the substrate 41 is disposed above the mounting ring 31 with the mounting ring 31 facing the mounting ring 31, and the center of the substrate 41 is directly above the center of the opening 35. When the substrate 41 is lowered in a substantially vertical direction after the edge of the substrate 41 does not overlap the positioning portion 32, the substrate 41 is placed on the mounting portion 39 without contacting the positioning portion 32, and the adhesive The surface opposite to the mounting ring 31 of the layer 36 is in close contact with the back surface of the substrate 41 over the entire ring, and the opening 35 is covered with the substrate 41.

接着剤層36は熱硬化性樹脂(ここではエポキシ樹脂)を含有する接着剤で構成されており、接着剤層36を加熱すると熱硬化性樹脂が熱重合し、接着剤層36は全周に亘って、片面が載置部39に、反対側の面が基板41に密着した状態で硬化し、基板41が載置環31に固定されて測定対象サンプル40が得られる(図3(b)、図4(b))。
図4(b)の符号38は接着剤層36が硬化して形成されたリング状のシール部材を示しており、シール部材38は全周に亘って片面が載置部39に、反対側の面が基板41に密着している。
The adhesive layer 36 is composed of an adhesive containing a thermosetting resin (here, an epoxy resin). When the adhesive layer 36 is heated, the thermosetting resin is thermally polymerized, and the adhesive layer 36 is disposed on the entire circumference. Over the course, one surface is cured to the mounting portion 39 and the opposite surface is in close contact with the substrate 41, and the substrate 41 is fixed to the mounting ring 31 to obtain the measurement target sample 40 (FIG. 3B). FIG. 4 (b)).
Reference numeral 38 in FIG. 4B denotes a ring-shaped seal member formed by curing the adhesive layer 36, and the seal member 38 has one surface on the mounting portion 39 and the opposite side over the entire circumference. The surface is in close contact with the substrate 41.

次に、この測定対象サンプル40の測定に用いる透湿度測定装置について説明する。
図1の符号1は本発明の透湿度測定装置の一例を示しており、この透湿度測定装置1は測定室11と、供給室12と、載置部材21と、密閉部材28とを有している。
測定室11と供給室12は開口が形成された箱状である。
載置部材21は中央部分に開口(接続口)25が形成された金属製の板であって、平面形状がリング状になっている。
Next, a moisture permeability measuring device used for measuring the measurement target sample 40 will be described.
Reference numeral 1 in FIG. 1 shows an example of a moisture permeability measuring apparatus of the present invention. This moisture permeability measuring apparatus 1 has a measuring chamber 11, a supply chamber 12, a mounting member 21, and a sealing member 28. ing.
The measurement chamber 11 and the supply chamber 12 are box-shaped with openings.
The mounting member 21 is a metal plate having an opening (connection port) 25 formed in the center portion, and the planar shape is a ring shape.

載置部材21のリングの内周、即ち接続口25は測定室11の開口と供給室12の開口のいずれよりも小さく、リング外周は測定室11の開口と供給室12の開口のいずれよりも大きくなっている。
測定室11は開口を上に向けて配置されている。
The inner periphery of the ring of the mounting member 21, that is, the connection port 25 is smaller than both the opening of the measurement chamber 11 and the opening of the supply chamber 12, and the outer periphery of the ring is smaller than both the opening of the measurement chamber 11 and the opening of the supply chamber 12. It is getting bigger.
The measurement chamber 11 is arranged with the opening facing upward.

載置部材21は接続口25が測定室11の開口上に位置するように、そのリングの全周が測定室11の開口を取り囲む壁部材に密着して取り付けられている。従って、測定室11の開口と接続口25の開口とは連通し、測定室11は接続口だけを介して外部と接続される。   The mounting member 21 is attached in close contact with a wall member surrounding the opening of the measurement chamber 11 so that the connection port 25 is positioned on the opening of the measurement chamber 11. Therefore, the opening of the measurement chamber 11 and the opening of the connection port 25 communicate with each other, and the measurement chamber 11 is connected to the outside through only the connection port.

供給室12は開口を下側に向けられ、該開口が接続口25上に位置するように、その開口を取り囲む壁部材が、測定室11の開口を取り囲む壁部材、又は、載置部材21のリングの縁部分全周に密着するように、測定室11上に配置されている。   The supply chamber 12 has its opening directed downward, and the wall member surrounding the opening is located on the connection port 25 so that the wall member surrounding the opening of the measurement chamber 11 or the mounting member 21 It arrange | positions on the measurement chamber 11 so that it may closely_contact | adhere to the edge part perimeter of a ring.

従って、測定室11の開口と、供給室12の開口は接続口25だけを介して互いに面し、測定室11の内部空間と供給室12の内部空間は接続口25だけを介して互いに接続されている。   Therefore, the opening of the measurement chamber 11 and the opening of the supply chamber 12 face each other only through the connection port 25, and the internal space of the measurement chamber 11 and the internal space of the supply chamber 12 are connected to each other only through the connection port 25. ing.

載置部材21の測定室11の外側の面、即ち、供給室12の内部空間と面する面には、接続口25と相似形の溝が、接続口25の縁から所定距離だけ離間して、接続口25を取り囲むように形成されている。   On the outer surface of the mounting member 21 of the measurement chamber 11, that is, the surface facing the internal space of the supply chamber 12, a groove similar to the connection port 25 is separated from the edge of the connection port 25 by a predetermined distance. The connection port 25 is formed so as to surround it.

密閉部材28はリング状であって、ゴムのように変形可能な弾性材料で構成されており、溝24と相似形にして接続口25と同心円状に配置した時に、載置部材21に乗せられる大きさであり、ここでは溝24と同じ大きさであり、溝24の底面上に載置されている(図5(a))。   The sealing member 28 has a ring shape and is made of a deformable elastic material such as rubber. When the sealing member 28 has a similar shape to the groove 24 and is arranged concentrically with the connection port 25, the sealing member 28 is placed on the mounting member 21. Here, it is the same size as the groove 24, and is placed on the bottom surface of the groove 24 (FIG. 5A).

上述したように、溝24は接続口25の縁から所定距離だけ離間して接続口25を取り囲んでいるから、密閉部材28は接続口25の縁から所定距離だけ離間して接続口25を取り囲んでいる。   As described above, since the groove 24 surrounds the connection port 25 with a predetermined distance from the edge of the connection port 25, the sealing member 28 surrounds the connection port 25 with a predetermined distance from the edge of the connection port 25. It is out.

この透湿度測定装置1に使用される測定対象サンプル40の載置環31は、リング外周が接続口25よりも大きく、内周は溝24の底面上の密閉部材28の内周よりも小さくされており、載置環31は接続口25から落下せずに、密閉部材28上に配置可能になっている。   The mounting ring 31 of the measurement target sample 40 used in the moisture permeability measuring device 1 has a ring outer periphery larger than the connection port 25 and an inner periphery smaller than an inner periphery of the sealing member 28 on the bottom surface of the groove 24. The mounting ring 31 can be disposed on the sealing member 28 without dropping from the connection port 25.

ここでは、載置環31のシール部材38が配置された側とは反対側の面には、載置部材21の溝24と平面形状が略等しい溝34が、開口35の縁から所定距離だけ離間した場所で、開口35を取り囲むように形成されている。   Here, on the surface of the mounting ring 31 opposite to the side on which the seal member 38 is disposed, a groove 34 having substantially the same planar shape as the groove 24 of the mounting member 21 is a predetermined distance from the edge of the opening 35. It is formed so as to surround the opening 35 at a spaced location.

真空槽2と供給室12には不図示の搬出入室口が設けられており、搬出入口を開け、真空槽2の内部を通過させて測定対象サンプル40を供給室12内に搬入し、載置環31の溝34が載置部材21の溝24とが対向するよう位置合わせする。   The vacuum chamber 2 and the supply chamber 12 are provided with a carry-in / out chamber opening (not shown), the carry-in / out port is opened, the sample 40 to be measured is carried into the supply chamber 12 through the inside of the vacuum chamber 2 and placed. Alignment is performed so that the groove 34 of the ring 31 faces the groove 24 of the mounting member 21.

密閉部材28の厚みは、載置部材21に乗せた時には、溝24、34の深さの合計よりも大きくなっており、溝24、34が対向する状態で測定対象サンプル40を下降させると、載置環31の溝34に密閉部材28のリング上部が入り込み、その溝34の底面に接触して、測定対象サンプル40が密閉部材28に乗せられた状態になる。   The thickness of the sealing member 28 is larger than the total depth of the grooves 24 and 34 when the sealing member 28 is placed on the mounting member 21, and when the measurement target sample 40 is lowered with the grooves 24 and 34 facing each other, The upper part of the ring of the sealing member 28 enters the groove 34 of the mounting ring 31, contacts the bottom surface of the groove 34, and the measurement target sample 40 is put on the sealing member 28.

その状態で不図示の押圧部材で測定対象サンプル40を載置部材21に向かって押圧すると、押圧によって密閉部材28が変形し、密閉部材28は全周に亘って片面が載置部材21に密着し、反対側の面が載置環31に密着する。
基板41は透湿度が1×10-1g/m2/日以上と気体の透過性が高くされているのに対し、密閉部材28と上述したシール部材38は気体を透過しない材料で構成されている。
In this state, when the measurement target sample 40 is pressed toward the mounting member 21 with a pressing member (not shown), the sealing member 28 is deformed by the pressing, and the sealing member 28 is in close contact with the mounting member 21 over the entire circumference. The opposite surface is in close contact with the mounting ring 31.
The substrate 41 has a moisture permeability of 1 × 10 −1 g / m 2 / day or more and a high gas permeability, whereas the sealing member 28 and the sealing member 38 described above are made of a material that does not transmit gas. ing.

密閉部材28は全周に亘って片面が載置部材21に、反対側の面が載置環31に密着しているから、載置部材21と載置環31の間は気体は透過せず、上述したように、シール部材38は全周に亘って片面が基板41に、反対側の面が載置環31に密着しているから、基板41と載置環31の間も気体が透過しない。   Since the sealing member 28 is in close contact with the mounting member 21 on one side and the mounting ring 31 on the opposite side, the gas does not permeate between the mounting member 21 and the mounting ring 31. As described above, since the seal member 38 is in close contact with the substrate 41 and the opposite surface is in close contact with the mounting ring 31 over the entire circumference, gas is also transmitted between the substrate 41 and the mounting ring 31. do not do.

しかも、載置環31と、載置部材21と、供給室12及び測定室11の壁部材は、金属のように気体を透過しない材料で構成されているから、基板41と、測定対象膜42とを透過した気体だけが、供給室12から測定室11に浸入可能になっている。   Moreover, since the mounting ring 31, the mounting member 21, and the wall members of the supply chamber 12 and the measurement chamber 11 are made of a material that does not transmit gas, such as metal, the substrate 41 and the measurement target film 42. Only the gas that has passed through can enter the measurement chamber 11 from the supply chamber 12.

真空槽2外部には真空排気系9が配置されている。
ここでは、真空排気系9は粗引きポンプ7とターボ分子ポンプ8とを有しており、供給室12と真空槽2の搬出入口を閉じ、測定対象サンプル40を押圧した状態で、粗引きポンプ7で真空槽2と供給室12と測定室11を真空排気する。
An evacuation system 9 is disposed outside the vacuum chamber 2.
Here, the evacuation system 9 includes a roughing pump 7 and a turbo molecular pump 8. The roughing pump 9 is closed in a state where the supply chamber 12 and the carry-in / out port of the vacuum chamber 2 are closed and the sample 40 to be measured is pressed. 7 evacuates the vacuum chamber 2, the supply chamber 12, and the measurement chamber 11.

測定室11と供給室12には内部圧力(全圧)を測定する第一、第二の測定装置3、4が接続されている。
測定室11の内部圧力が所定圧力まで真空排気されたところで、真空槽2と供給室12の真空排気を続けながら、バルブ19を操作し、測定室11を粗引きポンプ7からターボ分子ポンプ8に切替え、ターボ分子ポンプ8の背圧を粗引きポンプ7で排気し、測定室11内部に、供給室12の内部圧力よりも低い高真空雰囲気を形成する。
The measurement chamber 11 and the supply chamber 12 are connected to first and second measuring devices 3 and 4 that measure internal pressure (total pressure).
When the internal pressure of the measurement chamber 11 is evacuated to a predetermined pressure, the valve 19 is operated while continuing to evacuate the vacuum chamber 2 and the supply chamber 12, and the measurement chamber 11 is changed from the roughing pump 7 to the turbo molecular pump 8. Switching, the back pressure of the turbo molecular pump 8 is exhausted by the roughing pump 7, and a high vacuum atmosphere lower than the internal pressure of the supply chamber 12 is formed inside the measurement chamber 11.

供給室12には、真空槽2外部に配置された水供給系5が流量制御装置17を介して接続されており、測定室11内部に所定圧力の高真空雰囲気が形成された後、真空槽2と供給室12の真空排気を続けると共に、ターボ分子ポンプ8の排気速度を所定速度に維持したまま、水供給系5からキャリアガスと共に気体の水を導入する。
ここでは、第一、第二の測定装置3、4は、質量分析計を備え、キャリアガスと水のモル比を測定可能になっており、モル比と、全圧とから水の分圧が求められる。
A water supply system 5 disposed outside the vacuum chamber 2 is connected to the supply chamber 12 via a flow control device 17, and after a high vacuum atmosphere of a predetermined pressure is formed inside the measurement chamber 11, the vacuum chamber 2 and the supply chamber 12 are continued to be evacuated, and gaseous water is introduced from the water supply system 5 together with the carrier gas while maintaining the exhaust speed of the turbo molecular pump 8 at a predetermined speed.
Here, the first and second measuring devices 3 and 4 are provided with mass spectrometers, and are capable of measuring the molar ratio of the carrier gas and water, and the partial pressure of water is calculated from the molar ratio and the total pressure. Desired.

透湿度を測定するときの供給室12内部の水の分圧は予め決められており、第二の測定装置4は、測定される水の分圧に基づいて、供給室12内部の水の分圧が決められた値になるように、水供給系5と供給室12間の流量制御装置17と、粗引きポンプ7と供給室12間の可変バルブ18を制御し、供給室12内部の水の分圧を所定圧力に維持する。   The partial pressure of water inside the supply chamber 12 when measuring the moisture permeability is determined in advance, and the second measuring device 4 determines the amount of water inside the supply chamber 12 based on the measured partial pressure of water. The flow control device 17 between the water supply system 5 and the supply chamber 12 and the variable valve 18 between the roughing pump 7 and the supply chamber 12 are controlled so that the pressure becomes a predetermined value, and the water inside the supply chamber 12 is controlled. Is maintained at a predetermined pressure.

供給室12内部の水の分圧が所定圧力に達して後、測定室11の水の分圧の測定を続け、ある測定時間での測定室11内部の水の分圧の上昇量と、測定時間と、測定室11内部の温度と、測定室11の排気速度と、基板41の露出面積(ここでは開口35の面積)とから、測定対象膜42と基板41の透湿度(単位:g/m2/日)の合計が分かる。基板41の透湿度は予め分かっており、透湿度の合計から、基板41の透湿度を引いた値が、測定対象膜42の透湿度となる。 After the partial pressure of the water in the supply chamber 12 reaches a predetermined pressure, the measurement of the partial pressure of the water in the measurement chamber 11 is continued, and the amount of increase in the partial pressure of the water in the measurement chamber 11 during a certain measurement time is measured. From the time, the temperature inside the measurement chamber 11, the exhaust speed of the measurement chamber 11, and the exposed area of the substrate 41 (here, the area of the opening 35), the moisture permeability (unit: g / g) of the measurement target film 42 and the substrate 41 is measured. m 2 / day). The moisture permeability of the substrate 41 is known in advance, and a value obtained by subtracting the moisture permeability of the substrate 41 from the total moisture permeability is the moisture permeability of the measurement target film 42.

基板41が樹脂基板のように熱に弱いものであると、破損や変形が生じ、透湿度を正確に測定できないが、基板41はセラミック製であり、破損や変形が生じ難いから、透湿度を正確に測定できる。   If the substrate 41 is weak to heat like a resin substrate, breakage or deformation occurs, and the moisture permeability cannot be measured accurately. However, the substrate 41 is made of ceramic and is not easily damaged or deformed. It can be measured accurately.

尚、基板41は透湿度が既知のものを用いてもよいし、基板41の透湿度が不明な場合は、測定対象膜42が形成されていない状態の基板41を載置環31に固定して測定対象サンプル40を作成し、上記と同じ工程で基板41だけの透湿度を予め求めておくとよい。   The substrate 41 may have a known moisture permeability. If the moisture permeability of the substrate 41 is unknown, the substrate 41 in which the measurement target film 42 is not formed is fixed to the mounting ring 31. Then, the measurement target sample 40 may be prepared, and the moisture permeability of only the substrate 41 may be obtained in the same process as described above.

透湿度は単位面積当たりの値であるので、基板41裏面が開口35以外のところで大きく露出すると、透湿度の測定値が不正確になる。例えば、シール部材38が載置環31のリング内周と開口35の縁との間の距離が大きすぎると、透湿度の測定値が不正確になるので、シール部材38から開口35までの距離が近い方が望ましく、より望ましくは、シール部材38のリング内周と開口35の縁が略一致することである。   Since the moisture permeability is a value per unit area, the measured value of moisture permeability becomes inaccurate if the back surface of the substrate 41 is greatly exposed outside the opening 35. For example, if the distance between the ring inner periphery of the mounting ring 31 and the edge of the opening 35 is too large, the measured value of moisture permeability becomes inaccurate, so the distance from the sealing member 38 to the opening 35 Is more desirable, and more desirably, the inner circumference of the ring of the seal member 38 and the edge of the opening 35 substantially coincide with each other.

シール部材38に用いる熱硬化性樹脂はエポキシ樹脂に限定されず、硬化物の気体(特に水)を透過しないものであれば、例えば、アクリル樹脂、メラミン樹脂、ウレタン樹脂等を用いることもできる。シール部材38を構成する接着剤には、熱硬化性樹脂以外にもフィラーや熱可塑性樹脂やゴム等の添加剤を添加することもできる。また、気体を透過しないのであれば、接着剤層36を硬化させずにそのままシール部材としてもよい。シール部材38は、真空リークレートが1×10-7Pa・m3/秒以下であることが望ましい。 The thermosetting resin used for the seal member 38 is not limited to an epoxy resin, and for example, an acrylic resin, a melamine resin, a urethane resin, or the like can be used as long as it does not transmit a gas (particularly water) of a cured product. In addition to the thermosetting resin, additives such as a filler, a thermoplastic resin, and rubber can be added to the adhesive constituting the seal member 38. Further, if the gas does not permeate, the adhesive layer 36 may be used as it is without being cured. The seal member 38 preferably has a vacuum leak rate of 1 × 10 −7 Pa · m 3 / sec or less.

密閉部材28は特に限定されないが、具体的にはフッ素ゴムやシリコーンゴムやニトリルゴム等のゴム製のOリングである。密閉部材28はH2O(水蒸気)リークレートが1×10-7Pa・m3/秒以下であることが望ましい。
以上は、載置環31の開口35に全部に基板41の裏面が露出する場合について説明したが本発明はこれに限定されるものではない。
The sealing member 28 is not particularly limited, but is specifically an O-ring made of rubber such as fluorine rubber, silicone rubber, or nitrile rubber. The sealing member 28 preferably has an H 2 O (water vapor) leak rate of 1 × 10 −7 Pa · m 3 / sec or less.
The case where the back surface of the substrate 41 is exposed in the entire opening 35 of the mounting ring 31 has been described above, but the present invention is not limited to this.

図6は本発明の測定対象サンプル40に用いる載置環31の他の例を示しており、この載置環31は細長の支持部37を有している。
支持部37は一端が載置環31のリング内周側面に接続され、他端が開口35の内側に向かって突き出されている。ここでは、支持部37は細長の板状であって、4本の支持部37の一端が載置環31のリングの内周に接続され、他端が開口35の略中心で互いに接続され、十字状になっている。
FIG. 6 shows another example of the mounting ring 31 used for the measurement target sample 40 of the present invention, and this mounting ring 31 has an elongated support portion 37.
One end of the support portion 37 is connected to the inner circumferential side surface of the mounting ring 31, and the other end protrudes toward the inside of the opening 35. Here, the support portion 37 is an elongated plate, and one end of each of the four support portions 37 is connected to the inner periphery of the ring of the mounting ring 31, and the other end is connected to each other substantially at the center of the opening 35. It has a cross shape.

支持部37の表面は載置部39と面一になっており、シール部材38の厚みが無視できる程小さい場合には、基板41をシール部材38に配置した時に、基板41裏面は支持部37と接触する。   When the surface of the support portion 37 is flush with the placement portion 39 and the thickness of the seal member 38 is negligibly small, when the substrate 41 is placed on the seal member 38, the back surface of the substrate 41 is supported by the support portion 37. Contact with.

基板41は縁部分がシール部材38を介して載置部39に支持されるだけなく、その中央部分が支持部37によって支持されるので、基板41が大径で可撓性を有する場合であっても撓まず、基板41や測定対象膜42の破損や変形が起こらない。   The substrate 41 is not only supported by the mounting portion 39 via the seal member 38 but also the central portion thereof is supported by the support portion 37, so that the substrate 41 has a large diameter and flexibility. However, the substrate 41 and the measurement target film 42 are not damaged or deformed without bending.

尚、シール部材38の厚みが無視できない程大きい場合には、支持部37の表面を載置部39よりも高くし、基板41をシール部材38で載置環31に固定した時に、基板41の表面に支持部37の表面を接触させる。
支持部37は、基板41をシール部材38で固定した時に、基板41裏面と接触可能であれば、板状ではなく、断面形状が円形の棒状であってもよい。
When the thickness of the seal member 38 is so large that it cannot be ignored, the surface of the support portion 37 is made higher than the placement portion 39, and when the substrate 41 is fixed to the placement ring 31 by the seal member 38, The surface of the support part 37 is brought into contact with the surface.
As long as the support part 37 can contact the back surface of the substrate 41 when the substrate 41 is fixed by the seal member 38, the support part 37 may be a bar having a circular cross section instead of a plate.

支持部37の面積が無視できない程大きい場合には、透湿度を算出するときの開口35の面積として、開口35の面積から、支持部37の開口35内に位置する部分の面積を引いた値を用いる。   When the area of the support part 37 is so large that it cannot be ignored, the area of the opening 35 when calculating the water vapor transmission rate is obtained by subtracting the area of the part located in the opening 35 of the support part 37 from the area of the opening 35. Is used.

以上は、基板41が円盤状であり、開口35が円形である場合について説明したが、本発明はこれに限定されるものではなく、基板41の平面形状が開口35よりも大きく、基板41の縁部分が全て載置環31に接触可能であれば、基板41と開口35の平面形状は、例えば矩形であってもよい。   In the above, the case where the substrate 41 is disk-shaped and the opening 35 is circular has been described. However, the present invention is not limited to this, and the planar shape of the substrate 41 is larger than the opening 35, and If all the edge portions can contact the mounting ring 31, the planar shape of the substrate 41 and the opening 35 may be, for example, a rectangle.

位置決め部32の形状も円形リングに限定されず、矩形のリング形状であってもよく、位置決め部32はリング形状である必要も無い。位置決め部32は開口35中心からの距離が、基板41を載置環31に配置したときの開口35中心から基板41縁までの距離よりも遠く、基板41を載置環31に載置可能であれば、例えば、複数の位置決め部32を、開口35の中心からの距離が、開口35中心から基板41縁までの距離よりも遠い円周上に間隔を空けて配置してもよい。   The shape of the positioning portion 32 is not limited to a circular ring, and may be a rectangular ring shape, and the positioning portion 32 does not have to be a ring shape. The positioning part 32 is farther from the center of the opening 35 than the distance from the center of the opening 35 to the edge of the substrate 41 when the substrate 41 is placed on the mounting ring 31, and can place the substrate 41 on the mounting ring 31. If there is, for example, the plurality of positioning portions 32 may be arranged at intervals on a circumference whose distance from the center of the opening 35 is farther than the distance from the center of the opening 35 to the edge of the substrate 41.

以上は、測定室11と供給室12を真空槽2内部に配置する場合について説明したが、本発明はこれに限定されるものではない。測定室11と供給室12を真空槽2内部に配置せず、その外壁を直接外部雰囲気に晒してもよいが、供給室12を真空槽2内部に配置し、供給室12の搬出入口を外部雰囲気に直接晒さないようにすれば、供給室12内部に外部雰囲気から水や空気が浸入し難くなるので、透湿度の測定がより正確に行われる。   Although the case where the measurement chamber 11 and the supply chamber 12 are disposed inside the vacuum chamber 2 has been described above, the present invention is not limited to this. Although the measurement chamber 11 and the supply chamber 12 may not be arranged inside the vacuum chamber 2 and the outer wall thereof may be directly exposed to the external atmosphere, the supply chamber 12 is arranged inside the vacuum chamber 2 and the carry-in / out port of the supply chamber 12 is provided outside. If it is not directly exposed to the atmosphere, water and air are less likely to enter the supply chamber 12 from the outside atmosphere, so that the moisture permeability can be measured more accurately.

基板41は厚みが大きい程透湿度は低くなる。多孔質アルミニウム製の基板で厚みを変えて透湿度を測定したところ、厚みが0.15mm以上では、透湿度は1×10-1g/m2/日未満となった。透湿度が1×10-1g/m2/日未満であると、測定対象膜42の透湿度測定が正確にできなくなるので、本発明には、厚みが0.14mm以下のセラミック基板が適している。 As the thickness of the substrate 41 increases, the moisture permeability decreases. When the thickness was changed with a porous aluminum substrate and the moisture permeability was measured, the moisture permeability was less than 1 × 10 −1 g / m 2 / day when the thickness was 0.15 mm or more. If the moisture permeability is less than 1 × 10 −1 g / m 2 / day, the moisture permeability of the measurement target film 42 cannot be accurately measured. Therefore, a ceramic substrate having a thickness of 0.14 mm or less is suitable for the present invention. ing.

本発明に用いる基板は、透湿度が1×10-1g/m2/日以上のセラミック基板であれば、特に限定されない。具体的には、多孔質アルミニウム以外にも、多孔質アルミナ製の基板を用いることができる。 The substrate used in the present invention is not particularly limited as long as it is a ceramic substrate having a moisture permeability of 1 × 10 −1 g / m 2 / day or more. Specifically, in addition to porous aluminum, a substrate made of porous alumina can be used.

本発明の測定対象膜42は特に限定されないが、その一例を述べると、有機EL素子のバリア膜、例えば、SiON膜、SiOx膜(xは正の実数)、Al23膜等の絶縁膜である。
測定対象膜42が有機EL素子に用いるバリア膜の場合、該バリア膜の膜厚は一般に10nm以上100nm以下であるから、測定対象膜42で基板41表面を覆うためには、基板41の表面粗さは10nm以下にすることが望ましい。
The measurement target film 42 of the present invention is not particularly limited, but an example thereof is a barrier film of an organic EL element, for example, an insulating film such as a SiON film, a SiOx film (x is a positive real number), an Al 2 O 3 film, etc. It is.
When the measurement target film 42 is a barrier film used for an organic EL element, the thickness of the barrier film is generally 10 nm or more and 100 nm or less. Therefore, in order to cover the surface of the substrate 41 with the measurement target film 42, the surface roughness of the substrate 41 is reduced. The thickness is desirably 10 nm or less.

載置部材21や、載置環31は金属製に限定されず、透湿度が低いものであれば、ガラスや硬質樹脂等を用いることもできる。
キャリアガスは水を分解しないものであればよく、例えば、窒素、アルゴン等の不活性ガスを単独又は混合して用いることができる。
The mounting member 21 and the mounting ring 31 are not limited to metal, and glass, hard resin, or the like can be used as long as the moisture permeability is low.
Any carrier gas may be used as long as it does not decompose water. For example, an inert gas such as nitrogen or argon can be used alone or in combination.

基板41として、膜厚0.14mmの、多孔質アルミニウム製のセラミック基板を用い、該基板41の表面に測定対象膜を形成せずに実施例の測定対象サンプル40を作成した。
これとは別に、膜厚25μmのポリイミドフィルムを基板として用い、該基板の表面に測定対象膜を形成せずに比較例の測定対象サンプルを作成した。
A porous aluminum ceramic substrate having a thickness of 0.14 mm was used as the substrate 41, and the measurement target sample 40 of the example was formed without forming the measurement target film on the surface of the substrate 41.
Separately from this, a polyimide film having a film thickness of 25 μm was used as a substrate, and a measurement target sample of a comparative example was prepared without forming a measurement target film on the surface of the substrate.

実施例と比較例の測定対象サンプル40を、上記図1の透湿度測定装置1に取付け、基板41を交換せずに透湿度の測定を5回繰り返した。その測定結果を下記表1に記載する。   The measurement target sample 40 of the example and the comparative example was attached to the moisture permeability measuring device 1 of FIG. 1 and the moisture permeability measurement was repeated five times without replacing the substrate 41. The measurement results are shown in Table 1 below.

Figure 2008170358
Figure 2008170358

上記表1から明らかなように、比較例は透湿度の変化が大きかったのに対し、実施例は測定を繰り返しても透湿度の変化が小さく、本発明によれば測定対象膜42の透湿度を正確に求められることがわかる。   As apparent from Table 1 above, the change in the moisture permeability was large in the comparative example, whereas the change in the moisture permeability was small even when the measurement was repeated. It can be seen that is accurately obtained.

本発明の透湿度測定装置を説明するための断面図Sectional drawing for demonstrating the water vapor permeability measuring apparatus of this invention 本発明のサンプル台を説明するための斜視図The perspective view for demonstrating the sample stand of this invention (a)、(b):測定対象サンプルを作成する工程を説明するための斜視図(A), (b): The perspective view for demonstrating the process of producing a measurement object sample (a)、(b):測定対象サンプルを作成する工程を説明するための断面図(A), (b): Sectional drawing for demonstrating the process of producing a measuring object sample (a)〜(c):測定対象サンプルを載置部材に載置する工程を説明するための断面図(A)-(c): Sectional drawing for demonstrating the process of mounting a measurement object sample on a mounting member. 載置環の他の例を説明するための斜視図The perspective view for demonstrating the other example of a mounting ring

符号の説明Explanation of symbols

1……透湿度測定装置 2……真空槽 5……水供給系 11……測定室 12……供給室 21……載置部材 25……接続口 28……密閉部材 30……サンプル台 31……載置環 32……位置決め部 35……開口 37……支持部 38……シール部材 40……測定対象サンプル 41……基板 42……測定対象膜   DESCRIPTION OF SYMBOLS 1 ... Moisture permeability measuring device 2 ... Vacuum chamber 5 ... Water supply system 11 ... Measurement chamber 12 ... Supply chamber 21 ... Mounting member 25 ... Connection port 28 ... Sealing member 30 ... Sample stand 31 …… Mounting ring 32 …… Positioning part 35 …… Opening 37 …… Supporting part 38 …… Seal member 40 …… Measurement sample 41 …… Substrate 42 …… Measurement film

Claims (8)

透湿度測定装置用のサンプル台であって、
リング状の載置環と、前記載置環の内側の開口よりも平面形状が大きく、透湿度が1×10-1g/m2/日以上のセラミック製の基板とを有するサンプル台。
A sample base for a moisture permeability measuring device,
A sample table having a ring-shaped mounting ring and a ceramic substrate having a planar shape larger than the opening inside the mounting ring and a moisture permeability of 1 × 10 −1 g / m 2 / day or more.
前記載置環の表面と表面が同じ高さにある支持部が、前記載置環の前記内周からリング内側に向けて突き出されたサンプル台。   The sample stage in which the support part in which the surface and surface of the said mounting ring are the same height protruded toward the ring inner side from the said inner periphery of the said mounting ring. 前記載置環の表面には、表面が前記載置環の表面よりも高く突き出された位置決め部が、前記載置環の縁に沿って配置された請求項1又は請求項2のいずれか1項記載のサンプル台。   Either one of Claim 1 or Claim 2 with which the positioning part by which the surface was protruded higher than the surface of the said mounting ring was arrange | positioned on the surface of the said mounting ring along the edge of the said mounting ring. Sample stand as described in the section. 前記載置環は金属製である請求項1乃至請求項3のいずれか1項記載のサンプル台。   The sample stand according to any one of claims 1 to 3, wherein the placement ring is made of metal. 前記基板が前記載置環上に載置された請求項1乃至請求項3のいずれか1項記載のサンプル台と、
前記基板表面に配置された測定対象膜と、
前記載置環と、前記基板の間に配置され、前記載置環の内側の開口を取り囲み、
前記基板と前記載置環との間を気密に接着するシール部材とを有する測定対象サンプル。
The sample stage according to any one of claims 1 to 3, wherein the substrate is placed on the placement ring.
A measurement target film disposed on the substrate surface;
Arranged between the mounting ring and the substrate, surrounding an opening inside the mounting ring,
A sample to be measured having a sealing member that hermetically adheres between the substrate and the mounting ring.
壁部材で内部空間がそれぞれ取り囲まれた測定室と供給室と、
リング状の載置部材とを有し、
前記載置部材は、前記測定室の開口周囲の前記壁部材に気密に接続され、
前記載置部材の開口を介して前記測定室の内部空間と、前記供給室の内部空間とが連通するように構成され、
前記載置部材上には、請求項5記載の前記測定対象サンプルが、前記載置環の前記シール部材が配置された面とは反対側の面と、前記載置部材の表面に密着して配置され、
前記載置部材の開口が前記載置環の外周で取り囲まれ、
前記供給室には水供給系が接続され、前記供給室の内部の水は、前記測定対象サンプルの前記基板と前記測定対象膜とを通過して前記測定室に移動可能に構成され、
前記水の圧力を測定する測定装置が、前記供給室と前記測定室にそれぞれ接続された透湿度測定装置。
A measurement chamber and a supply chamber each surrounded by a wall member,
A ring-shaped mounting member,
The mounting member is hermetically connected to the wall member around the opening of the measurement chamber,
The internal space of the measurement chamber and the internal space of the supply chamber communicate with each other through the opening of the mounting member,
On the mounting member, the sample to be measured according to claim 5 is in close contact with the surface of the mounting ring opposite to the surface on which the seal member is disposed and the surface of the mounting member. Arranged,
The opening of the mounting member is surrounded by the outer periphery of the mounting ring,
A water supply system is connected to the supply chamber, and water inside the supply chamber is configured to be able to move to the measurement chamber through the substrate and the measurement target film of the measurement target sample,
A moisture permeability measuring device in which a measuring device for measuring the pressure of water is connected to the supply chamber and the measuring chamber, respectively.
前記載置環と前記載置部材の間に配置され、前記載置部材の開口を取り囲む密閉部材を有する請求項6記載の透湿度測定装置。   The moisture permeability measuring device according to claim 6, further comprising a sealing member disposed between the mounting ring and the mounting member and surrounding an opening of the mounting member. 前記供給室は、真空槽内に配置された請求項6又は請求項7のいずれか1項記載の透湿度測定装置。   The moisture permeability measuring device according to claim 6 or 7, wherein the supply chamber is arranged in a vacuum chamber.
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Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011002303A (en) * 2009-06-17 2011-01-06 Ulvac Japan Ltd Instrument for measuring transmission amount of water vapor
WO2011058717A1 (en) * 2009-11-10 2011-05-19 株式会社アルバック Apparatus for measuring amount of water vapor transmission and method for measuring amount of water vapor transmission
JP2012007954A (en) * 2010-06-23 2012-01-12 Sumitomo Bakelite Co Ltd Steam permeability evaluation cell and steam permeability evaluation method
JP2012047509A (en) * 2010-08-25 2012-03-08 Sumitomo Bakelite Co Ltd Cell for water vapor permeability evaluation and method for manufacturing the same
WO2014119688A1 (en) * 2013-01-31 2014-08-07 独立行政法人産業技術総合研究所 Gas-barrier-performance evaluation device and evaluation method
WO2014119689A1 (en) * 2013-01-31 2014-08-07 独立行政法人産業技術総合研究所 Gas-barrier-performance evaluation device and evaluation method
JP2015190884A (en) * 2014-03-28 2015-11-02 三菱電機株式会社 gas permeability measuring device
KR20150135013A (en) * 2014-05-23 2015-12-02 국민대학교산학협력단 Liquid Entry Pressure Gaging Apparatus
KR20160089895A (en) * 2013-11-26 2016-07-28 꼼미사리아 아 레네르지 아토미끄 에뜨 옥스 에너지스 앨터네이티브즈 Sample holder and associated permeation device
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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002357533A (en) * 2001-05-31 2002-12-13 Sony Corp Method and apparatus for evaluating permeability
JP2003185561A (en) * 2001-10-10 2003-07-03 Borgwarner Inc Transmissometer, porosity meter
JP2005345342A (en) * 2004-06-04 2005-12-15 Createc:Kk Moisture permeability/gas permeability measuring device, and gas permeability measuring method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002357533A (en) * 2001-05-31 2002-12-13 Sony Corp Method and apparatus for evaluating permeability
JP2003185561A (en) * 2001-10-10 2003-07-03 Borgwarner Inc Transmissometer, porosity meter
JP2005345342A (en) * 2004-06-04 2005-12-15 Createc:Kk Moisture permeability/gas permeability measuring device, and gas permeability measuring method

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JP2012007954A (en) * 2010-06-23 2012-01-12 Sumitomo Bakelite Co Ltd Steam permeability evaluation cell and steam permeability evaluation method
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US9746411B2 (en) 2013-01-31 2017-08-29 National Institute Of Advanced Industrial Science And Technology Apparatus and method for evaluating gas barrier properties
US9696251B2 (en) 2013-01-31 2017-07-04 National Institute Of Advanced Industrial Science And Technology Apparatus and method for evaluating gas barrier properties
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