JP2008098559A - Semiconductor mounting structure, and its mounting method - Google Patents

Semiconductor mounting structure, and its mounting method Download PDF

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JP2008098559A
JP2008098559A JP2006281307A JP2006281307A JP2008098559A JP 2008098559 A JP2008098559 A JP 2008098559A JP 2006281307 A JP2006281307 A JP 2006281307A JP 2006281307 A JP2006281307 A JP 2006281307A JP 2008098559 A JP2008098559 A JP 2008098559A
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metal substrate
semiconductor
cooling metal
bus bar
mounting structure
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JP4743536B2 (en
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Toshiro Nishimura
寿郎 西村
Masashi Yamazaki
雅志 山崎
Mutsumi Yoshino
睦 吉野
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Denso Corp
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Denso Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a semiconductor mounting structure and its mounting method, capable of mounting a semiconductor component on a bus bar and a cooling metal substrate while suppressing complication of mounting work. <P>SOLUTION: A semiconductor component 1 is placed on bus bars 2, 3 and is connected thereto. The bus bars 2, 3 are mounted on a cooling metal substrate 4 via an electric insulating sheet 5. A resin made nail shaped body 8 penetrates through holes of the bus bars 2, 3 and the electric insulating sheet 5 and is collectively pressed into a bottomed hole 41 of the cooling metal substrate 4. Hereby, the bus bars 2, 3 are fixed while being electrically insulated to the cooling metal substrate 4 by a bar-shaped resin member 9. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、半導体チップや半導体モジュールなどの半導体部品の実装構造(半導体実装構造と略称する)及びその実装方法の改良に関する。   The present invention relates to a mounting structure of semiconductor components such as a semiconductor chip and a semiconductor module (abbreviated as a semiconductor mounting structure) and an improvement of the mounting method.

車両エンジンルームなどの高温環境で半導体部品を用いる場合、およびモータなどを駆動するような高電力が必要な半導体部品を用いる場合、優れた放熱性をもつ実装構造が要求される。   When semiconductor components are used in a high-temperature environment such as a vehicle engine room, and when semiconductor components that require high power such as a motor are used, a mounting structure with excellent heat dissipation is required.

従来の半導体実装構造の一つとして、内部に半導体チップを有する半導体モジュールを電気絶縁シートを介して冷却用金属基板又はそれに相当する金属部材にねじで締結する方法が知られている。この半導体モジュールの裏面(冷却用金属基板側の面)には金属板が配置されており、この金属板には半導体チップが搭載されている。半導体チップの熱は、金属板、電気絶縁シートを介して冷却用金属基板に放散される。半導体モジュールは、外部配線に接続されるリード端子をもつ。   As one of the conventional semiconductor mounting structures, a method is known in which a semiconductor module having a semiconductor chip inside is fastened to a cooling metal substrate or a metal member corresponding thereto via an electrical insulating sheet with a screw. A metal plate is disposed on the back surface (surface on the cooling metal substrate side) of the semiconductor module, and a semiconductor chip is mounted on the metal plate. The heat of the semiconductor chip is dissipated to the cooling metal substrate through the metal plate and the electrical insulating sheet. The semiconductor module has lead terminals connected to external wiring.

従来の半導体実装構造の他の一つとして、内部に半導体チップを有する半導体モジュールを配線基板(絶縁金属基板とも言う)にはんだ接合し、この配線基板をねじにより冷却用金属基板又はそれに相当する金属部材に締結する方法が知られている。好適には、配線基板は、裏面が冷却用金属基板に密着する金属板と、この金属板の表面に電気絶縁層を介してパターニングされた銅箔配線パターンとをもつ。半導体モジュールのリード端子は銅箔配線にはんだ付けされる。この種の半導体実装構造が、下記の特許文献1に記載されている。
特表2005−512345号公報
As another conventional semiconductor mounting structure, a semiconductor module having a semiconductor chip inside is solder-bonded to a wiring board (also referred to as an insulating metal board), and the wiring board is cooled by a screw or a metal corresponding thereto. A method of fastening to a member is known. Preferably, the wiring board has a metal plate whose back surface is in close contact with the cooling metal substrate, and a copper foil wiring pattern patterned on the surface of the metal plate via an electric insulating layer. The lead terminals of the semiconductor module are soldered to the copper foil wiring. This type of semiconductor mounting structure is described in Patent Document 1 below.
JP 2005-512345 A

しかしながら、上記した従来の半導体実装構造において、上記半導体モジュールや配線基板と同様に冷却用金属基板上に多数のバスバーを締結することが考えられる。これにより、配線損失の低減とバスバーを通じての半導体モジュールの良好な冷却が期待される。   However, in the conventional semiconductor mounting structure described above, it is conceivable that a large number of bus bars are fastened on the cooling metal substrate in the same manner as the semiconductor module and the wiring substrate. Thereby, reduction of wiring loss and good cooling of the semiconductor module through the bus bar are expected.

しかし、この場合には多数のバスバーを冷却用金属基板に電気絶縁を確保しつついちいちねじにより締結する必要が更に生じるため、実装作業が非常に面倒となる。   However, in this case, since it becomes necessary to fasten a large number of bus bars to the cooling metal substrate with screws while securing electrical insulation, the mounting work becomes very troublesome.

この問題を解決するには、各バスバーを冷却用金属基板に接着するということも考えられる。ただし、この場合には、粘着層がバスバーと冷却用金属基板との間の熱伝導率を増大させるという問題を派生させる。   In order to solve this problem, it can be considered that each bus bar is bonded to a cooling metal substrate. In this case, however, the adhesive layer leads to the problem of increasing the thermal conductivity between the bus bar and the cooling metal substrate.

本発明は上記問題点に鑑みなされたものであり、実装作業の煩雑化を抑止しつつ半導体部品をバスバー及び冷却用金属基板に実装可能な半導体実装構造及びその実装方法を提供することをその目的としている。   The present invention has been made in view of the above problems, and an object thereof is to provide a semiconductor mounting structure and a mounting method thereof capable of mounting a semiconductor component on a bus bar and a cooling metal substrate while suppressing complicated mounting work. It is said.

上記課題を解決する第1発明は、半導体素子を有する半導体部品と、前記半導体部品が接続されるとともに所定パターンで平面配列された複数のバスバーと、電気絶縁可能かつ熱伝導良好に前記バスバー群の反素子搭載面に密着する冷却用金属基板と、前記各バスバーと前記冷却用金属基板との間に介設される面状の第1の電気絶縁部材と、前記第1の電気絶縁部材を貫通して前記各バスバーを前記冷却用金属基板に変形作用により機械的に結合するとともに第2の電気絶縁部材により前記バスバーから電気絶縁されている固定部材とを備えることを特徴としている。   A first invention that solves the above-described problems includes a semiconductor component having a semiconductor element, a plurality of bus bars to which the semiconductor component is connected and arranged in a plane in a predetermined pattern, and the bus bar group capable of being electrically insulated and having good heat conduction. A cooling metal substrate in close contact with the anti-element mounting surface, a planar first electrical insulating member interposed between each of the bus bars and the cooling metal substrate, and penetrating through the first electrical insulating member The bus bar is mechanically coupled to the cooling metal substrate by a deformation action, and a fixing member electrically insulated from the bus bar by a second electrical insulation member is provided.

すなわち、この発明は、半導体部品が接続された各バスバーを冷却用金属基板に、固定部材又はその相手側部材である冷却用金属基板の変形を利用して結合、固定する。このため、低電気抵抗をもち配線損失が少ないバスバーに半導体部品を接続できるとともに、各バスバーの固定が従来のねじ締結に比べて格段に容易となる。また、半導体部品が発生する熱も良好に冷却用金属基板に放熱することができる。   That is, according to the present invention, each bus bar to which the semiconductor component is connected is coupled and fixed to the cooling metal substrate by utilizing the deformation of the fixing member or the cooling metal substrate that is the counterpart member. For this reason, semiconductor components can be connected to a bus bar having low electrical resistance and low wiring loss, and fixing of each bus bar is much easier than conventional screw fastening. Further, the heat generated by the semiconductor component can also be radiated to the cooling metal substrate satisfactorily.

好適な態様において、前記固定部材は、前記バスバー、前記第1の電気絶縁部材及び前記冷却用金属基板を厚さ方向に貫通してかしめられるブラインドリベットからなる。このようにすれば、リベットかしめにより簡単かつ信頼性よくバスバーを冷却用金属基板に固定することができる。   In a preferred aspect, the fixing member comprises a blind rivet that is caulked through the bus bar, the first electrical insulating member, and the cooling metal substrate in the thickness direction. In this way, the bus bar can be fixed to the cooling metal substrate easily and reliably by rivet caulking.

好適な態様において、前記固定部材は、前記各バスバー及び前記第1の電気絶縁部材を貫通して前記冷却用金属基板に圧入乃至打ち込まれた釘状体からなる。このようにすれば、釘状体又は冷却用金属基板の変形による両者の結合により簡単かつ信頼性よくバスバーを冷却用金属基板に固定することができる。なお、冷却用金属基板に釘状体が押し込まれる孔をあらかじめ設けておいてもよい。このようにすれば、釘状体の打ち込みが容易となる。もちろん、この場合、この孔の内径は釘状体の外径よりも僅かに小さいことが好適である。   In a preferred aspect, the fixing member is made of a nail-like body that is press-fitted or driven into the cooling metal substrate through the bus bars and the first electrical insulating member. In this way, the bus bar can be fixed to the cooling metal substrate easily and reliably by the combination of the nail-like body or the cooling metal substrate due to the deformation. A hole into which the nail-like body is pushed into the cooling metal substrate may be provided in advance. In this way, the nail-like body can be driven easily. Of course, in this case, the inner diameter of the hole is preferably slightly smaller than the outer diameter of the nail-like body.

好適な態様において、前記固定部材は、前記冷却用金属基板と一体に成形されて前記冷却用金属基板から前記バスバーを貫通して突出する突起部と、前記突起部にかしめられたかしめリングとを有する。このようにすれば、たとえば王冠状のかしめリングをかしめることにより簡単かつ信頼性よくバスバーを冷却用金属基板に固定することができる。   In a preferred aspect, the fixing member is formed integrally with the cooling metal substrate and protrudes from the cooling metal substrate through the bus bar, and a caulking ring caulked by the protrusion. Have. In this way, the bus bar can be fixed to the cooling metal substrate easily and reliably by caulking a crown-shaped caulking ring, for example.

好適な態様において、前記固定部材は、前記冷却用金属基板と一体に成形されて前記冷却用金属基板から前記バスバーを越えて突出する突起部を有し、前記突起部の先端部は、塑性変形されて前記バスバーに押しつけられている。突起部の塑性変形は、たとえば突起部の頭部を押しつぶしてもよく、あるいは長い突起部を横へ曲げてバスバーに押しつけても良い。   In a preferred aspect, the fixing member has a protrusion that is formed integrally with the cooling metal substrate and protrudes beyond the bus bar from the cooling metal substrate, and a tip portion of the protrusion is plastically deformed. And pressed against the bus bar. For the plastic deformation of the protrusion, for example, the head of the protrusion may be crushed, or a long protrusion may be bent sideways and pressed against the bus bar.

好適な態様において、前記固定部材は、前記バスバー及び前記第1の電気絶縁部材を貫通するとともに自己変形により前記冷却用金属基板に固定された棒状樹脂部材からなる。棒状樹脂部材の自己変形は、機械力による塑性変形でもよく、あるいは熱変形を利用しても良い。なお、この場合には、固定部材は、固定部材とバスバーとを電気絶縁する第2の電気絶縁部材を兼ねるため、部品点数を減らすことができる。   In a preferred aspect, the fixing member is a rod-shaped resin member that penetrates the bus bar and the first electrical insulating member and is fixed to the cooling metal substrate by self-deformation. The self-deformation of the rod-shaped resin member may be plastic deformation by mechanical force, or may utilize thermal deformation. In this case, since the fixing member also serves as the second electric insulating member that electrically insulates the fixing member and the bus bar, the number of parts can be reduced.

好適な態様において、前記固定部材は、電気絶縁性樹脂により形成されている。このようにすれば、固定部材が第2の電気絶縁部材を兼ねるため、部品点数削減及び実装作業の簡素化を実現することができる。   In a preferred aspect, the fixing member is made of an electrically insulating resin. In this case, since the fixing member also serves as the second electrical insulating member, it is possible to reduce the number of components and simplify the mounting operation.

好適な態様において、前記固定部材は、電気絶縁性樹脂膜が表面に被着されている。この被着、たとえば塗布乾燥などにより実現することができる。このようにすれば、固定部材が第2の電気絶縁部材を兼ねるため、部品点数削減及び実装作業の簡素化を実現することができる。   In a preferred embodiment, the fixing member has an electrically insulating resin film attached to the surface. This deposition can be realized by, for example, coating and drying. In this case, since the fixing member also serves as the second electrical insulating member, it is possible to reduce the number of components and simplify the mounting operation.

好適な態様において、前記固定部材による前記各バスバーと前記冷却用金属基板との固定を一挙に実施する。このようにすれば、各バスバーをねじで一々締結するのに比べて実装工程を大幅に短縮、簡素化することができる。   In a preferred embodiment, the bus bars and the cooling metal substrate are fixed all at once by the fixing member. In this way, the mounting process can be greatly shortened and simplified as compared to fastening each bus bar with screws one by one.

上記課題を解決する第2発明は、半導体素子を有する半導体部品と、前記半導体部品が接続されるとともに所定パターンで平面配列された複数のバスバーと、電気絶縁可能かつ熱伝導良好に前記バスバー群の反素子搭載面に密着する冷却用金属基板と、前記各バスバーと前記冷却用金属基板との間に介設される面状の第1の電気絶縁部材と、前記第1の電気絶縁部材を貫通して前記各バスバーを前記冷却用金属基板に機械的に結合するとともに第2の電気絶縁部材により前記バスバーから電気絶縁されている固定部材とを備え、前記固定部材が、前記バスバーを貫通して前記冷却用金属基板に押しつけられる複数の脚部と、前記バスバーに搭載された前記半導体部品を前記バスバーに押さえつけるとともに前記複数の脚部を連結する連結板部とを有する門形部材と、前記門形部材を前記冷却用金属基板に押圧付勢する押圧付勢部材とを有することをその特徴としている。   According to a second invention for solving the above-described problems, a semiconductor component having a semiconductor element, a plurality of bus bars to which the semiconductor component is connected and arranged in a plane in a predetermined pattern; A cooling metal substrate in close contact with the anti-element mounting surface, a planar first electrical insulating member interposed between each of the bus bars and the cooling metal substrate, and penetrating through the first electrical insulating member A fixing member that mechanically couples each bus bar to the cooling metal substrate and is electrically insulated from the bus bar by a second electric insulating member, and the fixing member penetrates the bus bar. A plurality of legs that are pressed against the cooling metal substrate, and a connecting plate portion that presses the semiconductor component mounted on the bus bar against the bus bar and connects the plurality of legs. A portal member having, and its characterized by having a pressing biasing member that presses and biases the portal member to the cooling metal substrate.

すなわち、この発明によれば、固定部材は、各バスバーを冷却用金属基板へ押しつける脚部と、半導体部品をバスバーを介して冷却用金属基板へ押しつける板部とが一体化されてなる門形部材を、押圧付勢部材により冷却用金属基板に押しつけている。押圧付勢部材としては、冷却用金属基板に固定された弾性体(クリップなど)や、冷却用金属基板が固定された筐体の蓋板又はそれに固定された弾性材料などを用いることができる。なお、これらの弾性は、各部の寸法公差を吸収するためである。   That is, according to the present invention, the fixing member is a gate-shaped member formed by integrating the leg portion that presses each bus bar against the cooling metal substrate and the plate portion that presses the semiconductor component against the cooling metal substrate via the bus bar. Is pressed against the metal substrate for cooling by the pressing biasing member. As the pressing urging member, an elastic body (such as a clip) fixed to the cooling metal substrate, a cover plate of the casing to which the cooling metal substrate is fixed, or an elastic material fixed thereto can be used. In addition, these elasticity is for absorbing the dimensional tolerance of each part.

本発明の好適な実施形態を以下に説明する。   A preferred embodiment of the present invention will be described below.

(実施形態1)
実施形態1の半導体実装構造を図1を参照して説明する。図1は、この半導体実装構造を示す断面図である。
(Embodiment 1)
The semiconductor mounting structure of Embodiment 1 will be described with reference to FIG. FIG. 1 is a cross-sectional view showing this semiconductor mounting structure.

この半導体実装構造は、半導体素子を内蔵する半導体部品1と、半導体部品1が接続されるとともに所定パターンで平面配列された複数のバスバー2、3と、電気絶縁可能かつ熱伝導良好にバスバー2、3の反素子搭載面に密着する冷却用金属基板4と、バスバー2、3と冷却用金属基板4との間に介設される電気絶縁シート(面状の第1の電気絶縁部材)5と、電気絶縁シート5を貫通してバスバー2、3を冷却用金属基板4に変形作用により機械的に結合するとともに樹脂輪板(第2の電気絶縁部材)6によりバスバー2、3から電気絶縁されている2本のブラインドリベット(固定部材)7とを有している。   The semiconductor mounting structure includes a semiconductor component 1 containing a semiconductor element, a plurality of bus bars 2 and 3 to which the semiconductor component 1 is connected and arranged in a plane in a predetermined pattern, and a bus bar 2 that can be electrically insulated and has good heat conduction. 3, a cooling metal substrate 4 that is in close contact with the anti-element mounting surface, and an electric insulating sheet (planar first electric insulating member) 5 interposed between the bus bars 2 and 3 and the cooling metal substrate 4, The bus bars 2 and 3 are mechanically coupled to the cooling metal substrate 4 through the electric insulating sheet 5 by deformation and are electrically insulated from the bus bars 2 and 3 by the resin ring plate (second electric insulating member) 6. Two blind rivets (fixing members) 7.

なお、この実施例としては、電気絶縁シート5として薄い良熱伝導性シートを採用したが、冷却用金属基板4の上面に樹脂膜を形成したり、バスバー2、3の表面に樹脂膜を形成するなどの公知の代替方法を採用しても良い。   In this embodiment, a thin heat conductive sheet is used as the electrical insulating sheet 5, but a resin film is formed on the upper surface of the cooling metal substrate 4, or a resin film is formed on the surfaces of the bus bars 2 and 3. You may employ | adopt well-known alternative methods, such as doing.

この実施形態では、半導体部品1は、図示したリード端子11、12を含む必要数のリード端子を有してバスバー2にはんだにより接合乃至接着剤により接着された半導体モジュールからなるが、これに限定されるものではない。たとえばバスバー2上に樹脂モールドされた半導体チップでもよい。また、両面に電極をなす金属板が露出したカード状の半導体モジュールでもよい。リード端子11はバスバー2に、リード端子12はバスバー3にはんだ接合されている。   In this embodiment, the semiconductor component 1 is composed of a semiconductor module having a necessary number of lead terminals including the lead terminals 11 and 12 shown in the figure and bonded to the bus bar 2 by soldering or bonding with an adhesive. Is not to be done. For example, a semiconductor chip resin-molded on the bus bar 2 may be used. Alternatively, a card-like semiconductor module in which metal plates forming electrodes on both sides are exposed may be used. The lead terminal 11 is soldered to the bus bar 2 and the lead terminal 12 is soldered to the bus bar 3.

バスバー2、3、電気絶縁シート5、冷却用金属基板4には貫通孔が2セット形成され、ブラインドリベット7が2セットの貫通孔にそれぞれ嵌挿されてかしめられている。更に詳しく説明すると、70はブラインドリベット7の頭部、71はブラインドリベット7の先端部である。ブラインドリベット7の頭部70は、樹脂輪板6を介してバスバー2、3の表面(半導体モジュール側)に接している。この状態でブラインドリベット7に軸方向力を与えてその先端部71をかしめることにより、バスバー2、3は冷却用金属基板4に強固に固定される。   Two sets of through holes are formed in the bus bars 2 and 3, the electrical insulating sheet 5, and the cooling metal substrate 4, and blind rivets 7 are respectively fitted and caulked into the two sets of through holes. More specifically, 70 is the head of the blind rivet 7, and 71 is the tip of the blind rivet 7. The head portion 70 of the blind rivet 7 is in contact with the surface (semiconductor module side) of the bus bars 2 and 3 via the resin wheel plate 6. In this state, the bus bars 2 and 3 are firmly fixed to the cooling metal substrate 4 by applying an axial force to the blind rivet 7 and caulking the tip 71.

なお、ブラインドリベット7の外周面と、それに対面するバスバー2、3の貫通孔との間には図示省略したが、リベット周壁絶縁用の電気絶縁性樹脂材(第2の電気絶縁部材)が介設されている。このリベット周壁絶縁用の電気絶縁性樹脂材は、樹脂スリーブでもよく、貫通孔にあらかじめ注入され、リベットかしめ後に固化した液状樹脂とすることができる。その他、バスバー2、3の貫通孔の表面に予め塗布された樹脂膜や、ブラインドリベット7の外周面にあらかじめ塗布された樹脂膜としてもよい。その他、ブラインドリベット7を樹脂により構成してもよく、この場合には上記した第2の電気絶縁部材を省略することができる。   Although not shown between the outer peripheral surface of the blind rivet 7 and the through holes of the bus bars 2 and 3 facing the blind rivet 7, an electrically insulating resin material (second electrical insulating member) for insulating the rivet peripheral wall is interposed. It is installed. The electrically insulating resin material for insulating the rivet peripheral wall may be a resin sleeve, and may be a liquid resin that has been injected into the through hole in advance and solidified after rivet caulking. In addition, it is good also as the resin film previously apply | coated to the surface of the through-hole of the bus-bars 2 and 3, and the resin film previously apply | coated to the outer peripheral surface of the blind rivet 7. FIG. In addition, the blind rivet 7 may be made of resin, and in this case, the second electrical insulating member described above can be omitted.

(実施形態2)
実施形態2の半導体実装構造を図2を参照して説明する。図2は、この半導体実装構造を示す断面図である。
(Embodiment 2)
A semiconductor mounting structure according to the second embodiment will be described with reference to FIG. FIG. 2 is a cross-sectional view showing this semiconductor mounting structure.

この半導体実装構造は、図1において樹脂輪板6及びブラインドリベット7の代わりに、樹脂製の釘状体8を用いた点が異なっている。なお、冷却用金属基板4には貫通孔の代わりに底付き穴41が凹設されているが、貫通孔としてもよい。ただし、この冷却用金属基板4の底付き穴41の内径は、この樹脂製の釘状体8の外径より僅かに小さくされている。樹脂製の釘状体8は、バスバー2、3の貫通孔及び電気絶縁シート5の貫通孔を通じて冷却用金属基板4の底付き穴41に圧入される。この圧入による樹脂製の釘状体8の先端部の塑性変形によりバスバー2、3は良好に冷却用金属基板4に十分良好に固定される。この樹脂製の釘状体8は、本発明で言う第2の電気絶縁部材を兼ねている。なお、樹脂製の釘状体8は、金属芯を有していても良く、あるいは、金属製の釘状体8を実施形態1と同様の方法でバスバー2、3から電気絶縁してもよい。   This semiconductor mounting structure is different in that instead of the resin wheel plate 6 and the blind rivet 7 in FIG. The cooling metal substrate 4 has a bottomed hole 41 in place of the through hole, but may be a through hole. However, the inner diameter of the bottomed hole 41 of the cooling metal substrate 4 is slightly smaller than the outer diameter of the resin-made nail-like body 8. The resin-made nail-like body 8 is press-fitted into the bottomed hole 41 of the cooling metal substrate 4 through the through holes of the bus bars 2 and 3 and the through holes of the electrical insulating sheet 5. The bus bars 2 and 3 are satisfactorily fixed to the cooling metal substrate 4 by plastic deformation of the tip end portion of the resin-made nail-like body 8 by this press-fitting. This resin-made nail-like body 8 also serves as the second electrical insulating member referred to in the present invention. The resin nail 8 may have a metal core, or the metal nail 8 may be electrically insulated from the bus bars 2 and 3 in the same manner as in the first embodiment. .

(実施形態3)
実施形態3の半導体実装構造を図3を参照して説明する。図3は、この半導体実装構造を示す断面図である。
(Embodiment 3)
A semiconductor mounting structure of the third embodiment will be described with reference to FIG. FIG. 3 is a cross-sectional view showing this semiconductor mounting structure.

この半導体実装構造は、図2において樹脂製の釘状体8を溶融固化した棒状樹脂部材9に変更した点が異なっている。この棒状樹脂部材9は、バスバー2、3の貫通孔及び電気絶縁シート5の貫通孔を通じて冷却用金属基板4の底付き穴41に溶融樹脂液を注入し、固化させてバスバー2、3を冷却用金属基板に固定したものである。このようにしても実施形態2と同様の効果を奏することができる。なお、棒状樹脂部材9は、バスバー2、3の貫通孔及び電気絶縁シート5の貫通孔を通じて冷却用金属基板4の底付き穴41にあらかじめ押し込んだ棒状樹脂部材9を熱により軟化させて行ってもよい。   This semiconductor mounting structure is different from that in FIG. 2 in that the resin-made nail-like body 8 is changed to a rod-like resin member 9 obtained by melting and solidifying. This rod-shaped resin member 9 cools the bus bars 2 and 3 by injecting a molten resin liquid into the bottomed holes 41 of the cooling metal substrate 4 through the through holes of the bus bars 2 and 3 and the through holes of the electrical insulating sheet 5 and solidifying them. Fixed to a metal substrate. Even if it does in this way, there can exist an effect similar to Embodiment 2. FIG. The rod-shaped resin member 9 is obtained by softening the rod-shaped resin member 9 that has been previously pressed into the bottomed hole 41 of the cooling metal substrate 4 through the through-holes of the bus bars 2 and 3 and the through-holes of the electrical insulating sheet 5 with heat. Also good.

(実施形態4)
実施形態4の半導体実装構造を図4を参照して説明する。図4は、この半導体実装構造を示す断面図である。
(Embodiment 4)
A semiconductor mounting structure according to the fourth embodiment will be described with reference to FIG. FIG. 4 is a cross-sectional view showing this semiconductor mounting structure.

この半導体実装構造は、図1においてブラインドリベット7を省略し、その代わりに冷却用金属基板4の上面から突出する棒状突起42と、この棒状突起42に樹脂輪板(第2の電気絶縁部材)6を介して易変形製の金属リング10を嵌め、この金属リング10を塑性変形させてバスバー2、3を冷却用金属基板4に固定したものである。金属リング10としては種々の形態が可能であるが、たとえば王冠状に形成して棒状突起42に被せても良い。なお、この実施形態においても、バスバー2、3の貫通孔の内周面と棒状突起42の外周面とは既述の方法により電気絶縁される。この実施形態においても、バスバー2、3を冷却用金属基板4に良好に固定することができる。   In this semiconductor mounting structure, the blind rivet 7 in FIG. 1 is omitted, and instead, a rod-like protrusion 42 protruding from the upper surface of the cooling metal substrate 4 and a resin ring plate (second electrical insulating member) on the rod-like protrusion 42. 6, a metal ring 10 made of easy deformation is fitted, and the metal ring 10 is plastically deformed to fix the bus bars 2 and 3 to the cooling metal substrate 4. The metal ring 10 can have various forms, but may be formed in a crown shape and covered with the rod-shaped protrusion 42, for example. Also in this embodiment, the inner peripheral surface of the through hole of the bus bars 2 and 3 and the outer peripheral surface of the rod-shaped protrusion 42 are electrically insulated by the method described above. Also in this embodiment, the bus bars 2 and 3 can be satisfactorily fixed to the cooling metal substrate 4.

(実施形態5)
実施形態5の半導体実装構造を図5を参照して説明する。図5は、この半導体実装構造を示す断面図である。
(Embodiment 5)
A semiconductor mounting structure according to the fifth embodiment will be described with reference to FIG. FIG. 5 is a cross-sectional view showing this semiconductor mounting structure.

この半導体実装構造は、図4において易変形製の金属リング10を省略し、棒状突起42を略直角に曲げてその先端部によりバスバー2、3を押さえつけることにより、バスバー2、3を冷却用金属基板4に固定している。なお、図5では、棒状突起42は、冷却用金属基板4の端部に形成されているが、冷却用金属基板4の中央部に設けても良い。また、図5では、棒状突起42はバスバー2、3の端部に配置されているが、バスバー2、3の貫通孔に嵌め込まれても良いことはもちろんである。この実施形態でも、図4に示す樹脂輪板6と同様の樹脂部材61が、棒状突起42とバスバー2、3との間に介設されている。この樹脂部材61としては、フランジ形状に形成されてその筒部が棒状突起42に嵌着されることが好適である。このようにすれば、棒状突起42の先端部を曲げるだけでバスバー2、3を冷却用金属基板4に簡単に固定することができる。   This semiconductor mounting structure omits the easily deformable metal ring 10 in FIG. 4, bends the bar-shaped protrusion 42 substantially at a right angle, and presses the bus bars 2 and 3 with their tip portions, whereby the bus bars 2 and 3 are cooled. It is fixed to the substrate 4. In FIG. 5, the rod-shaped protrusion 42 is formed at the end of the cooling metal substrate 4, but may be provided at the center of the cooling metal substrate 4. Further, in FIG. 5, the rod-like protrusions 42 are arranged at the ends of the bus bars 2 and 3, but of course, they may be fitted into the through holes of the bus bars 2 and 3. Also in this embodiment, a resin member 61 similar to the resin ring plate 6 shown in FIG. 4 is interposed between the rod-shaped protrusion 42 and the bus bars 2 and 3. The resin member 61 is preferably formed in a flange shape and its cylindrical portion is fitted to the rod-shaped protrusion 42. In this way, it is possible to easily fix the bus bars 2 and 3 to the cooling metal substrate 4 simply by bending the tip of the rod-like protrusion 42.

(実施形態6)
実施形態6の半導体実装構造を図6を参照して説明する。図6は、この半導体実装構造を示す断面図である。
(Embodiment 6)
A semiconductor mounting structure of the sixth embodiment will be described with reference to FIG. FIG. 6 is a cross-sectional view showing this semiconductor mounting structure.

この半導体実装構造は、図1において冷却用金属基板4の貫通孔を省略し、更にブラインドリベット7の代わりに樹脂製の門形部材101と、この門形部材101を押圧付勢する押圧付勢部材102を採用した点にその特徴がある。   In this semiconductor mounting structure, the through hole of the cooling metal substrate 4 is omitted in FIG. 1, and a resin-made gate-shaped member 101 instead of the blind rivet 7 and a pressing bias that presses and biases the portal-shaped member 101 are used. The feature is that the member 102 is employed.

門形部材101は、一対の脚部101a、101bと、これら脚部101a、101bと一体に形成されて冷却用金属基板4の上面と平行に延在する連結板部101cとを有して門形に形成されている。門形部材101が押圧付勢部材102により冷却用金属基板4に向けて押圧付勢されているため、門形部材101の脚部101a、101bの先端部はバスバー2、3の貫通孔に挿入され、電気絶縁シート5を通じて冷却用金属基板4を押圧している。脚部101a、101bの先端部をバスバー2、3の貫通孔に挿入することは必須ではなく、バスバー2、3の貫通孔を底付き穴としてもよい。   The gate-shaped member 101 includes a pair of leg portions 101a and 101b and a connecting plate portion 101c that is formed integrally with the leg portions 101a and 101b and extends in parallel with the upper surface of the cooling metal substrate 4. It is formed into a shape. Since the gate-shaped member 101 is pressed and biased toward the cooling metal substrate 4 by the pressing and biasing member 102, the distal ends of the leg portions 101 a and 101 b of the gate-shaped member 101 are inserted into the through holes of the bus bars 2 and 3. The cooling metal substrate 4 is pressed through the electrical insulating sheet 5. It is not essential to insert the tip portions of the leg portions 101a and 101b into the through holes of the bus bars 2 and 3, and the through holes of the bus bars 2 and 3 may be used as bottomed holes.

押圧付勢部材102は、たとえば一端部が門形部材101を押圧付勢し、他端部が冷却用金属基板4の裏面を押圧付勢するコ字状のクリップとしてもよい。その代わりに、この半導体実装構造が収容される筐体の蓋板又はその蓋板の裏面に設けられた弾性板により押圧付勢部材を構成してもよい。   The pressing biasing member 102 may be, for example, a U-shaped clip whose one end presses and biases the gate-shaped member 101 and whose other end presses and biases the back surface of the cooling metal substrate 4. Instead, the pressing and urging member may be constituted by a cover plate of a housing in which the semiconductor mounting structure is accommodated or an elastic plate provided on the back surface of the cover plate.

(実装方法)
上記した各実施形態において、専用の降下押圧治具を用いて各バスバー2、3の固定は一括して行われる。このようにすれば、各バスバー2、3を一々締結することに比べて格段に実装作業時間を短縮することができる。また、冷却用金属基板4の挿入穴に、ねじ山が必要なくなるため、加工費も低減できる。
(Mounting method)
In each of the above-described embodiments, the bus bars 2 and 3 are fixed together using a dedicated lowering pressing jig. In this way, the mounting work time can be significantly shortened compared to fastening the bus bars 2 and 3 one by one. Further, since no screw thread is required in the insertion hole of the cooling metal substrate 4, the processing cost can be reduced.

実施形態1の半導体実装構造を示す縦断面図である。1 is a longitudinal sectional view showing a semiconductor mounting structure of Embodiment 1. FIG. 実施形態2の半導体実装構造を示す縦断面図である。FIG. 6 is a longitudinal sectional view showing a semiconductor mounting structure of a second embodiment. 実施形態3の半導体実装構造を示す縦断面図である。It is a longitudinal cross-sectional view which shows the semiconductor mounting structure of Embodiment 3. 実施形態4の半導体実装構造を示す縦断面図である。It is a longitudinal cross-sectional view which shows the semiconductor mounting structure of Embodiment 4. 実施形態5の半導体実装構造を示す縦断面図である。FIG. 10 is a longitudinal sectional view showing a semiconductor mounting structure of a fifth embodiment. 実施形態6の半導体実装構造を示す縦断面図である。It is a longitudinal cross-sectional view which shows the semiconductor mounting structure of Embodiment 6.

符号の説明Explanation of symbols

1 半導体部品
2 バスバー
3 バスバー
4 冷却用金属基板
5 電気絶縁シート
6 樹脂輪板
7 ブラインドリベット
8 釘状体
9 棒状樹脂部材
10 金属リング
11 リード端子
12 リード端子
41 底付き穴
42 棒状突起
61 樹脂部材
70 頭部
71 先端部
101 門形部材
101a 脚部
101b 脚部
101c 連結板部
102 押圧付勢部材
DESCRIPTION OF SYMBOLS 1 Semiconductor component 2 Bus bar 3 Bus bar 4 Cooling metal board 5 Electrical insulation sheet 6 Resin ring plate 7 Blind rivet 8 Nail-like body 9 Rod-shaped resin member 10 Metal ring 11 Lead terminal 12 Lead terminal 41 Bottom hole 42 Rod-shaped protrusion 61 Resin member 70 head 71 distal end 101 portal member 101a leg 101b leg 101c connecting plate part 102 pressing member

Claims (10)

半導体素子を有する半導体部品と、
前記半導体部品が接続されるとともに所定パターンで平面配列された複数のバスバーと、
電気絶縁可能かつ熱伝導良好に前記バスバー群の反素子搭載面に密着する冷却用金属基板と、
前記各バスバーと前記冷却用金属基板との間に介設される面状の第1の電気絶縁部材と、
前記第1の電気絶縁部材を貫通して前記各バスバーを前記冷却用金属基板に変形作用により機械的に結合するとともに第2の電気絶縁部材により前記バスバーから電気絶縁されている固定部材と、
を備えることを特徴とする半導体実装構造。
A semiconductor component having a semiconductor element;
A plurality of bus bars connected to the semiconductor component and arranged in a plane in a predetermined pattern;
A cooling metal substrate that is insulative and has good thermal conductivity and is in close contact with the anti-element mounting surface of the bus bar group;
A planar first electrical insulating member interposed between each bus bar and the cooling metal substrate;
A fixing member that penetrates through the first electrical insulating member and mechanically couples each bus bar to the cooling metal substrate by a deformation action and is electrically insulated from the bus bar by a second electrical insulating member;
A semiconductor mounting structure comprising:
請求項1記載の半導体実装構造において、
前記固定部材は、
前記バスバー、前記第1の電気絶縁部材及び前記冷却用金属基板を厚さ方向に貫通してかしめられるブラインドリベットからなる半導体実装構造。
The semiconductor packaging structure according to claim 1,
The fixing member is
A semiconductor mounting structure comprising a blind rivet that is caulked through the bus bar, the first electrical insulating member, and the cooling metal substrate in a thickness direction.
請求項1記載の半導体実装構造において、
前記固定部材は、
前記各バスバー及び前記第1の電気絶縁部材を貫通して前記冷却用金属基板に圧入乃至打ち込まれた釘状体からなる半導体実装構造。
The semiconductor packaging structure according to claim 1,
The fixing member is
A semiconductor mounting structure comprising a nail-like body that is press-fitted or driven into the cooling metal substrate through the bus bars and the first electrical insulating member.
請求項1記載の半導体実装構造において、
前記固定部材は、
前記冷却用金属基板と一体に成形されて前記冷却用金属基板から前記バスバーを貫通して突出する突起部と、
前記突起部にかしめられたかしめリングとを有する半導体実装構造。
The semiconductor packaging structure according to claim 1,
The fixing member is
A protrusion that is formed integrally with the cooling metal substrate and protrudes from the cooling metal substrate through the bus bar;
A semiconductor mounting structure having a caulking ring caulked on the protrusion.
請求項1記載の半導体実装構造において、
前記固定部材は、
前記冷却用金属基板と一体に成形されて前記冷却用金属基板から前記バスバーを越えて突出する突起部を有し、
前記突起部の先端部は、塑性変形されて前記バスバーに押しつけられている半導体実装構造。
The semiconductor packaging structure according to claim 1,
The fixing member is
A protrusion that is formed integrally with the cooling metal substrate and protrudes beyond the bus bar from the cooling metal substrate;
A semiconductor mounting structure in which a tip portion of the protruding portion is plastically deformed and pressed against the bus bar.
請求項1記載の半導体実装構造において、
前記固定部材は、
前記バスバー及び前記第1の電気絶縁部材を貫通するとともに前記冷却用金属基板に固定された棒状樹脂部材からなる半導体実装構造。
The semiconductor packaging structure according to claim 1,
The fixing member is
A semiconductor mounting structure comprising a rod-shaped resin member that penetrates the bus bar and the first electrical insulating member and is fixed to the cooling metal substrate.
請求項1記載の半導体実装構造において、
前記固定部材は、
電気絶縁性樹脂により形成されている半導体実装構造。
The semiconductor packaging structure according to claim 1,
The fixing member is
A semiconductor mounting structure made of electrically insulating resin.
請求項1記載の半導体実装構造において、
前記固定部材は、
電気絶縁性樹脂膜が表面に被着されている半導体実装構造。
The semiconductor packaging structure according to claim 1,
The fixing member is
A semiconductor mounting structure with an electrically insulating resin film deposited on the surface.
請求項1乃至8のいずれか記載の半導体実装構造の実装方法において、
前記固定部材による前記各バスバーと前記冷却用金属基板との固定を一挙に実施することを特徴とする半導体実装構造の実装方法。
In the mounting method of the semiconductor mounting structure in any one of Claims 1 thru | or 8,
A mounting method for a semiconductor mounting structure, wherein the fixing of the bus bars and the cooling metal substrate by the fixing member is performed at once.
半導体素子を有する半導体部品と、
前記半導体部品が接続されるとともに所定パターンで平面配列された複数のバスバーと、
電気絶縁可能かつ熱伝導良好に前記バスバー群の反素子搭載面に密着する冷却用金属基板と、
前記各バスバーと前記冷却用金属基板との間に介設される面状の第1の電気絶縁部材と、
前記第1の電気絶縁部材を貫通して前記各バスバーを前記冷却用金属基板に機械的に結合するとともに第2の電気絶縁部材により前記バスバーから電気絶縁されている固定部材と、
を備え、
前記固定部材は、
前記バスバーを貫通して前記冷却用金属基板に押しつけられる複数の脚部と、前記バスバーに搭載された前記半導体部品を前記バスバーに押さえつけるとともに前記複数の脚部を連結する連結板部とを有する門形部材と、
前記門形部材を前記冷却用金属基板に押圧付勢する押圧付勢部材と、
を有する半導体実装構造。
A semiconductor component having a semiconductor element;
A plurality of bus bars connected to the semiconductor component and arranged in a plane in a predetermined pattern;
A cooling metal substrate that is insulative and has good thermal conductivity and is in close contact with the anti-element mounting surface of the bus bar group;
A planar first electrical insulating member interposed between each bus bar and the cooling metal substrate;
A fixing member penetrating the first electrical insulation member to mechanically couple each bus bar to the cooling metal substrate and electrically insulated from the bus bar by a second electrical insulation member;
With
The fixing member is
A gate having a plurality of legs that pass through the bus bar and pressed against the metal substrate for cooling, and a connecting plate that presses the semiconductor component mounted on the bus bar against the bus bar and connects the plurality of legs. A shape member;
A pressing urging member that urges the gate-shaped member against the cooling metal substrate;
A semiconductor mounting structure.
JP2006281307A 2006-10-16 2006-10-16 Semiconductor mounting structure Expired - Fee Related JP4743536B2 (en)

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JP2011223314A (en) * 2010-04-09 2011-11-04 Denso Corp Noise filter device
JP2011258878A (en) * 2010-06-11 2011-12-22 Otics Corp Element mounting structure
JP2011258877A (en) * 2010-06-11 2011-12-22 Otics Corp Element mounting structure
JP2012200071A (en) * 2011-03-22 2012-10-18 Yaskawa Electric Corp Motor control device
WO2015037561A1 (en) * 2013-09-13 2015-03-19 株式会社 豊田自動織機 Circuit device
WO2015098498A1 (en) * 2013-12-26 2015-07-02 株式会社 豊田自動織機 Electronic apparatus
CN113068309A (en) * 2021-04-12 2021-07-02 景旺电子科技(龙川)有限公司 Manufacturing method of heat dissipation circuit board
CN114797251A (en) * 2022-04-30 2022-07-29 厦门华最灌溉设备科技有限公司 Self-cleaning lamination filtering system controller for color display screen

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JPH08222672A (en) * 1995-02-14 1996-08-30 Nec Corp Cooling structure for semiconductor module
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Cited By (10)

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Publication number Priority date Publication date Assignee Title
JP2011223314A (en) * 2010-04-09 2011-11-04 Denso Corp Noise filter device
JP2011258878A (en) * 2010-06-11 2011-12-22 Otics Corp Element mounting structure
JP2011258877A (en) * 2010-06-11 2011-12-22 Otics Corp Element mounting structure
JP2012200071A (en) * 2011-03-22 2012-10-18 Yaskawa Electric Corp Motor control device
WO2015037561A1 (en) * 2013-09-13 2015-03-19 株式会社 豊田自動織機 Circuit device
JP2015056609A (en) * 2013-09-13 2015-03-23 株式会社豊田自動織機 Circuit device
WO2015098498A1 (en) * 2013-12-26 2015-07-02 株式会社 豊田自動織機 Electronic apparatus
JP2015126104A (en) * 2013-12-26 2015-07-06 株式会社豊田自動織機 Electronic apparatus
CN113068309A (en) * 2021-04-12 2021-07-02 景旺电子科技(龙川)有限公司 Manufacturing method of heat dissipation circuit board
CN114797251A (en) * 2022-04-30 2022-07-29 厦门华最灌溉设备科技有限公司 Self-cleaning lamination filtering system controller for color display screen

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