JP2008039777A5 - - Google Patents

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Publication number
JP2008039777A5
JP2008039777A5 JP2007198408A JP2007198408A JP2008039777A5 JP 2008039777 A5 JP2008039777 A5 JP 2008039777A5 JP 2007198408 A JP2007198408 A JP 2007198408A JP 2007198408 A JP2007198408 A JP 2007198408A JP 2008039777 A5 JP2008039777 A5 JP 2008039777A5
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JP
Japan
Prior art keywords
detection device
image detection
heat
heat source
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2007198408A
Other languages
English (en)
Japanese (ja)
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JP2008039777A (ja
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Publication date
Priority claimed from US11/498,589 external-priority patent/US7514692B2/en
Application filed filed Critical
Publication of JP2008039777A publication Critical patent/JP2008039777A/ja
Publication of JP2008039777A5 publication Critical patent/JP2008039777A5/ja
Pending legal-status Critical Current

Links

JP2007198408A 2006-08-03 2007-07-31 撮像装置の内部の偏極を低減する方法及び装置 Pending JP2008039777A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/498,589 US7514692B2 (en) 2005-06-22 2006-08-03 Method and apparatus for reducing polarization within an imaging device

Publications (2)

Publication Number Publication Date
JP2008039777A JP2008039777A (ja) 2008-02-21
JP2008039777A5 true JP2008039777A5 (enExample) 2011-08-18

Family

ID=38885195

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007198408A Pending JP2008039777A (ja) 2006-08-03 2007-07-31 撮像装置の内部の偏極を低減する方法及び装置

Country Status (5)

Country Link
US (1) US7514692B2 (enExample)
JP (1) JP2008039777A (enExample)
CN (1) CN101116620B (enExample)
DE (1) DE102007036821A1 (enExample)
IL (1) IL184912A0 (enExample)

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DE102007054832A1 (de) * 2007-11-16 2009-05-14 Siemens Ag Flachbilddetektor mit Temperatursensor
US20100316184A1 (en) * 2008-10-17 2010-12-16 Jan Iwanczyk Silicon photomultiplier detector for computed tomography
DE102009018877B4 (de) * 2008-11-25 2016-07-28 Siemens Healthcare Gmbh Röntgenstrahlungsdetektor zur Verwendung in einem CT-System
US8532250B2 (en) * 2010-02-24 2013-09-10 Kabushiki Kaisha Toshiba X-ray CT apparatus and control method for X-ray CT apparatus
JP5595804B2 (ja) * 2010-06-21 2014-09-24 株式会社東芝 Ｘ線ｃｔ装置
JP5613487B2 (ja) 2010-07-22 2014-10-22 株式会社東芝 Ｘ線ｃｔ装置
JP2012034848A (ja) * 2010-08-06 2012-02-23 Toshiba Corp Ｘ線検出器およびｘ線ｃｔ装置
JP2014519026A (ja) 2011-05-11 2014-08-07 コーニンクレッカ フィリップス エヌ ヴェ 電離放射線の検出
DE102012204766B4 (de) * 2012-03-26 2015-07-02 Siemens Aktiengesellschaft Röntgendetektor mit photonenzählenden direktwandelnden Detektorelementen und Verfahren zur Temperaturkonstanthaltung des Röntgendetektors
DE102012213404B3 (de) * 2012-07-31 2014-01-23 Siemens Aktiengesellschaft Verfahren zur Temperaturstabilisierung, Röntgenstrahlungsdetektor und CT-System
JP2014210047A (ja) * 2013-04-18 2014-11-13 株式会社東芝 Ｘ線ｃｔ装置
DE102013214684B4 (de) * 2013-07-26 2016-12-22 Siemens Healthcare Gmbh Direktkonvertierender Röntgendetektor
CN104337533A (zh) * 2013-07-31 2015-02-11 Ge医疗系统环球技术有限公司 计算机断层扫描设备及用于该设备的加热单元和方法
KR20150036840A (ko) 2013-09-27 2015-04-08 삼성전자주식회사 엑스선 검출기 및 이를 포함한 엑스선 촬영 장치
US9229115B2 (en) 2013-12-20 2016-01-05 Koninklijke Philips N.V. Temperature stability for a digital positron emission tomography (PET) detector
EP3084474B1 (en) * 2013-12-20 2018-02-21 Koninklijke Philips N.V. Improved temperature stability for a digital positron emission tomography (pet) detector
BR112016010217A2 (pt) * 2014-09-26 2017-08-08 Koninklijke Philips Nv detector de radiação, método para operação de um detector de radiação, e, aparelho de imageamento para a geração de imagens de um objeto
US9989654B2 (en) 2016-01-13 2018-06-05 General Electric Company Systems and methods for reducing polarization in imaging detectors
US9746565B2 (en) 2016-01-13 2017-08-29 General Electric Company Systems and methods for reducing polarization in imaging detectors
CN108415483A (zh) * 2018-03-23 2018-08-17 中科美其（天津）科技有限公司 摄影测量装置
EP3773371A4 (en) * 2018-03-29 2022-01-05 Lumenis Ltd DEVICE AND METHOD FOR TREATMENT OF DRY EYE
DE102023202424A1 (de) * 2023-03-20 2024-09-26 Siemens Healthineers Ag Detektormodul für einen Röntgendetektor mit einer Heizschicht

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JPS6484176A (en) * 1987-09-28 1989-03-29 Matsushita Electric Industrial Co Ltd Semiconductor radiation detector
JPH0627852B2 (ja) * 1990-08-30 1994-04-13 株式会社島津製作所 放射線検出器
US6011264A (en) * 1994-08-11 2000-01-04 Urigal Technologies, Ltd. Apparatus, system and method for gamma ray and x-ray detection
US6399951B1 (en) 2000-02-02 2002-06-04 Ut-Battelle, Llc Simultaneous CT and SPECT tomography using CZT detectors
US6404547B1 (en) * 2000-03-01 2002-06-11 Raytheon Company Semi-active focus and thermal compensation of a centrally-obscured reflective telescope
JP2002202377A (ja) * 2001-01-05 2002-07-19 Shimadzu Corp 放射線検出器
JP2003014860A (ja) * 2001-06-29 2003-01-15 Toshiba Corp 放射線検出器および放射線検査装置
US20040022351A1 (en) * 2002-07-30 2004-02-05 Ge Medical Systems Global Technology Company, Llc Thermoelectrically controlled x-ray detector array
US20040120383A1 (en) * 2002-12-19 2004-06-24 The Boeing Company Non-destructive testing system and method using current flow thermography
US7402815B2 (en) * 2003-10-22 2008-07-22 Koninklijke Philips Electronics N.V. Method and apparatus for reversing performance degradation in semi-conductor detectors

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