JP2007333672A5 - - Google Patents

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Publication number
JP2007333672A5
JP2007333672A5 JP2006168597A JP2006168597A JP2007333672A5 JP 2007333672 A5 JP2007333672 A5 JP 2007333672A5 JP 2006168597 A JP2006168597 A JP 2006168597A JP 2006168597 A JP2006168597 A JP 2006168597A JP 2007333672 A5 JP2007333672 A5 JP 2007333672A5
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JP
Japan
Prior art keywords
wafer
imaging
illumination
imaging means
irradiating
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Withdrawn
Application number
JP2006168597A
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English (en)
Japanese (ja)
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JP2007333672A (ja
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Publication date
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Priority to JP2006168597A priority Critical patent/JP2007333672A/ja
Priority claimed from JP2006168597A external-priority patent/JP2007333672A/ja
Publication of JP2007333672A publication Critical patent/JP2007333672A/ja
Publication of JP2007333672A5 publication Critical patent/JP2007333672A5/ja
Withdrawn legal-status Critical Current

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JP2006168597A 2006-06-19 2006-06-19 外観検査装置および外観検査方法 Withdrawn JP2007333672A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006168597A JP2007333672A (ja) 2006-06-19 2006-06-19 外観検査装置および外観検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006168597A JP2007333672A (ja) 2006-06-19 2006-06-19 外観検査装置および外観検査方法

Publications (2)

Publication Number Publication Date
JP2007333672A JP2007333672A (ja) 2007-12-27
JP2007333672A5 true JP2007333672A5 (enrdf_load_stackoverflow) 2009-08-06

Family

ID=38933275

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006168597A Withdrawn JP2007333672A (ja) 2006-06-19 2006-06-19 外観検査装置および外観検査方法

Country Status (1)

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JP (1) JP2007333672A (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8049878B2 (en) * 2008-08-22 2011-11-01 Corning Incorporated Systems and methods for detecting defects in ceramic filter bodies
JP5552779B2 (ja) * 2009-09-04 2014-07-16 セイコーエプソン株式会社 孔内検査方法
JP5664167B2 (ja) * 2010-11-22 2015-02-04 セイコーエプソン株式会社 検査装置
JP6132322B1 (ja) * 2015-12-10 2017-05-24 上野精機株式会社 外観検査装置
JP2023128225A (ja) * 2022-03-03 2023-09-14 株式会社デンソー 半導体素子の画像検査方法と半導体素子の製造方法
WO2024135842A1 (ja) * 2022-12-23 2024-06-27 ダイキン工業株式会社 撮影装置及び撮影方法

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