JP2007332418A - Surface treated copper foil - Google Patents

Surface treated copper foil Download PDF

Info

Publication number
JP2007332418A
JP2007332418A JP2006165435A JP2006165435A JP2007332418A JP 2007332418 A JP2007332418 A JP 2007332418A JP 2006165435 A JP2006165435 A JP 2006165435A JP 2006165435 A JP2006165435 A JP 2006165435A JP 2007332418 A JP2007332418 A JP 2007332418A
Authority
JP
Japan
Prior art keywords
copper foil
copper
layer
treated
fine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006165435A
Other languages
Japanese (ja)
Inventor
Wataru Kawamoto
渉 河本
Kenji Ishihara
健二 石原
Chiaki Nakajima
千明 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fukuda Metal Foil and Powder Co Ltd
Original Assignee
Fukuda Metal Foil and Powder Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fukuda Metal Foil and Powder Co Ltd filed Critical Fukuda Metal Foil and Powder Co Ltd
Priority to JP2006165435A priority Critical patent/JP2007332418A/en
Publication of JP2007332418A publication Critical patent/JP2007332418A/en
Pending legal-status Critical Current

Links

Images

Abstract

<P>PROBLEM TO BE SOLVED: To provide copper foil for a plasma display electromagnetic wave shielding filter having the characteristics that the color of a laminate face therein is a black system; there is no falling of fine roughened particles or the like; the laminate face has low roughness, and the laminate face has high smoothness which are particularly strongly required in the copper foil for a plasma display electromagnetic wave shielding filter. <P>SOLUTION: A fine roughened particle treatment layer of copper is applied to at least one side of copper foil, and also, ten point average roughness Rz is controlled to ≤2.0 μm. Then, the copper foil for a plasma display electromagnetic wave shielding filter having the characteristics of black color, low roughness and high smoothness in which surface system XYZ(Yxy)Y described in JIS Z8701 is ≤8.0, and also, specular gloss measured at Gs(60°) according to JIS Z8741 is ≥40, can be obtained. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は表面処理銅箔に関するもので、詳しくはプラズマディスプレイパネルに使用されている光学フィルターの一つである電磁波遮蔽フィルターに使用される銅箔に関してのものであり、反射率が低く、微細粗化粒子の脱落がなく、光沢度が高く表面粗度の低い表面処理銅箔に関するものである。   The present invention relates to a surface-treated copper foil, and more particularly to a copper foil used in an electromagnetic wave shielding filter, which is one of optical filters used in plasma display panels. The present invention relates to a surface-treated copper foil having no glossy particles, high glossiness and low surface roughness.

近年、薄型、大画面、軽量、視野角フリー、動画性能、高コントラスト等の機能を備えた画像表示ディスプレイであるプラズマディスプレイパネルの普及が広がっている。   In recent years, the spread of plasma display panels, which are image display displays having functions such as thinness, large screen, light weight, free viewing angle, moving image performance, and high contrast, has been spreading.

しかし、プラズマディスプレイは放電を行うために大きな電流が流れ磁界が発生するため、電磁波の発生は避けられない。そのため、ディスプレイ前面からの放射電磁波が大きく、周辺機器や人体に悪影響を及ぼすため、CISPR(国際無線障害特別委員会)やVCCI(情報処理装置等電波障害自主規制協議会)等の規制をクリアーする必要がある。この電磁波を抑制する目的で電磁波遮蔽フィルターが使用されている。   However, since a large current flows through the plasma display to generate a magnetic field for discharging, the generation of electromagnetic waves is inevitable. As a result, the electromagnetic waves radiated from the front of the display are large and adversely affect peripheral devices and the human body. There is a need. An electromagnetic wave shielding filter is used for the purpose of suppressing this electromagnetic wave.

電磁波遮蔽フィルターには、銀等の透明導電膜、金属繊維をメッシュ状に編んだもの等があるが、銅箔をポリエステルフィルム(以下PETと表記)/接着剤にラミネートした後エッチングによってメッシュを形成する方法が現在の主流となっている。これらの電磁波遮蔽フィルターには光透過性と、これと相反する電磁波シールド性を両立させることが求められており、本用途において構成材料である銅箔に求められる重要な特性は以下の4点となる。   Electromagnetic wave shielding filters include silver and other transparent conductive films, and metal fibers knitted in a mesh shape, etc. After copper foil is laminated to a polyester film (hereinafter referred to as PET) / adhesive, a mesh is formed by etching The way to do it is now mainstream. These electromagnetic wave shielding filters are required to have both light transmittance and electromagnetic wave shielding properties that are contrary to this, and the important characteristics required for the copper foil as a constituent material in this application are the following four points: Become.

1.銅箔のラミネート面が黒色系であること
(理由)外光からの反射を防ぎ、コントラストを高め鮮明な画像を得るため。
2.黒化処理面(ラミネート面)から粗化粒子等の脱落、いわゆる粉落ち現象がないこと
(理由)粉落ちがあるとハンドリングが困難となるだけでなく、エッチング後に接着剤層に粗化粒子が残り接着剤不良となる等の不具合の原因となるため。
3.銅箔のラミネート面が低粗度であること
(理由)電磁波遮蔽フィルターの導電性メッシュは幅10〜20μm、メッシュ間隔200〜300μmが一般的である。このため高粗度銅箔の場合、エッチング時のサイドエッチが大きくなったり、根残りを起こしたりして高精度のメッシュが得られにくいといった不具合が生じるため。
4.銅箔のラミネート面の平滑性が高いこと
(理由)視聴者は電磁波遮蔽フィルターの導電性メッシュのない部分を透過した光を見ることになるため、エッチング後のPET/接着剤の透明性が高い方が画像は鮮明になる。
エッチング後のPET/接着剤の表面形状は銅箔ラミネート面をそのまま転写した形状になるため、銅箔ラミネート面が粗いと接着剤層に銅箔から転写された凹凸ができ、ヘイズ(曇り)となってPET/接着剤の透明性が悪化するため。
1. The laminated surface of the copper foil is black. (Reason) To prevent reflection from outside light and increase the contrast to obtain a clear image.
2. No roughening particles fall off from the blackened surface (laminate surface), so-called powder-off phenomenon (reason) If there is powder-off, handling becomes difficult, and after etching, the roughened particles are formed in the adhesive layer. This may cause problems such as a remaining adhesive failure.
3. The laminated surface of the copper foil has low roughness (reason) The conductive mesh of the electromagnetic wave shielding filter generally has a width of 10 to 20 μm and a mesh interval of 200 to 300 μm. For this reason, in the case of a high-roughness copper foil, there is a problem that side etching during etching becomes large or roots remain, and it is difficult to obtain a highly accurate mesh.
4). The smoothness of the copper foil laminate surface (reason) Since the viewer sees the light transmitted through the part without the conductive mesh of the electromagnetic wave shielding filter, the transparency of the PET / adhesive after etching is high. The image becomes clearer.
Since the surface shape of the PET / adhesive after etching is the shape obtained by transferring the copper foil laminate surface as it is, if the copper foil laminate surface is rough, irregularities transferred from the copper foil to the adhesive layer are created, and haze (cloudy) Because the transparency of PET / adhesive deteriorates.

プラズマディスプレイ電磁波遮蔽フィルター用途の銅箔としては、以上のような特性を満たした銅箔が求められており、黒色で、且つ平坦な表面を持つ銅箔の開発が待たれていた。   As a copper foil for use in plasma display electromagnetic wave shielding filters, a copper foil satisfying the above characteristics has been demanded, and development of a copper foil having a black and flat surface has been awaited.

プラズマディスプレイ電磁波遮蔽フィルター用銅箔の表面処理方法として、例えば(特許文献1)では、銅の樹枝状粗化処理、銅のカバーめっきを施した後に、錫-ニッケル-モリブデンからなる合金めっき層を施す方法が提案されているが、鏡面光沢度が低くエッチング後のPET/接着剤の透明性が悪くなる。   As a surface treatment method for a copper foil for an electromagnetic wave shielding filter for plasma display, for example (Patent Document 1), an alloy plating layer made of tin-nickel-molybdenum is formed after copper dendritic roughening and copper cover plating. Although the method of applying is proposed, the specular glossiness is low and the transparency of the PET / adhesive after etching is deteriorated.

(特許文献2)や(特許文献3)では硫酸コバルト浴による処理方法が提案されているが、同様に鏡面光沢度が低くエッチング後のPET/接着剤の透明性が悪くなり、更に(特許文献3)では反射率Yも高く、外観黒色性が低く問題となる。   (Patent Document 2) and (Patent Document 3) propose a treatment method using a cobalt sulfate bath, but similarly, the mirror gloss is low and the transparency of the PET / adhesive after etching deteriorates. In 3), the reflectance Y is also high, and the appearance blackness is low, which is problematic.

(特許文献4)ではRz3.0μm以下の銅箔に銅の粗化処理を施した後、銅-コバルトからなる処理を行い、更にコバルトの平滑めっきを行う方法が提案されているが、鏡面光沢度が低く、更に反射率Yも高く、光透過性、外光の反射防止のコントラストが共に低く、更に粉落ちもきつく、良好な画像を得られない欠点を有している。   (Patent Document 4) proposes a method in which a copper foil having an Rz of 3.0 μm or less is subjected to a copper roughening treatment, followed by a treatment comprising copper-cobalt, and further a smooth plating of cobalt. It has a disadvantage that the degree of light is low, the reflectivity Y is high, the light transmittance and the contrast for preventing reflection of external light are both low, the powder falls off, and a good image cannot be obtained.

特開2003-201597号公報Japanese Patent Laid-Open No. 2003-201597 特開2005-139544号公報JP 2005-139544 JP 特開2005-163170号公報JP 2005-163170 A 特開2005-150155号公報JP 2005-150155 A

本発明の解決しようとする課題は、銅箔のラミネート面が黒色の外観を有し、銅箔のラミネート面が低粗度で且つ平滑性が高く、粗化粒子の脱落のない特徴を有した上記プラズマディスプレイ電磁波遮蔽フィルター用銅箔を提供することである。   The problem to be solved by the present invention has a feature that the laminated surface of the copper foil has a black appearance, the laminated surface of the copper foil has low roughness and high smoothness, and does not drop off roughened particles. It is providing the copper foil for said plasma display electromagnetic wave shielding filters.

上記目的を達成するため、様々な表面処理の検討を行った結果、以下のような表面処理を銅箔に施すことで、達成できることを見い出した。   As a result of studying various surface treatments in order to achieve the above object, it has been found that it can be achieved by applying the following surface treatment to the copper foil.

JISZ8741に基づき測定した光沢度Gs(60°)が40以上であり、且つ、JISZ8701に記載の表色系XYZ(Yxy)のYが8.0以下である、銅の微細粗化粒子処理層を銅箔の少なくとも一方の面に有すること。また、銅の微細粗化粒子処理層を形成した後の十点平均粗さRzが2.0μm以下であること。銅の微細粗化粒子処理層上にニッケル、モリブデン、タングステン、コバルト、リン、銅、ゲルマニウム、クロム、亜鉛の少なくとも一種類以上を含む防錆処理層を設けても良く、更に該防錆処理層上にシランカップリング剤層を設けても良い。また、銅の微細粗化粒子処理層上にコバルト又はニッケルの微細粗化粒子層を施しても良く、銅の微細粗化粒子処理層が鉄を含む銅の微細粗化粒子処理層でも良い。   A copper roughened particle treated layer having a glossiness Gs (60 °) measured based on JISZ8741 of 40 or more and Y of color system XYZ (Yxy) described in JISZ8701 is 8.0 or less. On at least one side. Further, the ten-point average roughness Rz after forming the copper fine-roughened particle treated layer is 2.0 μm or less. A rust prevention treatment layer containing at least one of nickel, molybdenum, tungsten, cobalt, phosphorus, copper, germanium, chromium, and zinc may be provided on the copper fine-roughening particle treatment layer. A silane coupling agent layer may be provided thereon. Further, a cobalt or nickel fine roughened particle layer may be provided on the copper finely roughened particle treated layer, or the copper fine roughened particle treated layer may be a copper finely roughened particle treated layer containing iron.

以上に述べてきた本発明の効果は、銅箔の少なくとも一方の面に上記形態の表面処理を行うことで、表色系XYZ(Yxy)のYが低くなり外光からの反射を極めて低く抑制することが可能となるため鮮明な画像が得られ、且つ、低粗度であることからエッチング性が良好で高精度のメッシュパターンが得られ、且つ、光沢度が高くエッチング後のPET/接着剤の透明性が高くヘイズ(曇り)が低いため鮮明な画像が得られる特徴を有した、プラズマディスプレイ電磁波遮蔽フィルター用に適した銅箔である。   The effect of the present invention described above is that the surface treatment of the above-described form is performed on at least one surface of the copper foil, so that the Y of the color system XYZ (Yxy) is lowered and the reflection from external light is suppressed to a very low level. PET / adhesive after etching with high glossiness and high-accuracy mesh pattern with good etching properties due to low roughness. It is a copper foil suitable for a plasma display electromagnetic wave shielding filter having a characteristic that a clear image can be obtained because of its high transparency and low haze.

以下に本発明について詳しく説明する。   The present invention is described in detail below.

まず、使用する銅箔は圧延銅箔、電解銅箔の何れでも良いが、本用途では銅箔の粗面粗度が低粗度であることが前提となるため、微細粗化粒子処理での粗面粗度の上昇等を考慮し未処理銅箔の粗度Rzは1.7μm以下のものを使用することが好ましい。   First, the copper foil to be used may be either a rolled copper foil or an electrolytic copper foil, but in this application, the rough surface roughness of the copper foil is premised on a low roughness. In consideration of an increase in roughness of the rough surface, it is preferable to use an untreated copper foil having a roughness Rz of 1.7 μm or less.

粗面粗度の大きい未処理銅箔を使用した場合も銅の微細粗化粒子処理による黒色化は可能であるが、エッチング性の低下、エッチング後のPET/接着剤の透明性が低下する等の不具合を生じる場合があるため好ましくない。銅箔の箔厚は5〜35μmであり、更に好ましくは6〜18μmである。   Even if untreated copper foil with a large roughness is used, blackening by fine copper roughening particle processing is possible, but the etching property, PET / adhesive transparency after etching is reduced, etc. This is not preferable because it may cause the above problems. The foil thickness of the copper foil is 5 to 35 μm, more preferably 6 to 18 μm.

本発明の銅の微細粗化粒子処理層は、例えば銅イオン及びジエチレントリアミン五酢酸を含む水溶液中に浸漬し、陰極電解させることにより形成させる。以下に銅の微細粗化粒子処理層を形成させる浴組成、電解条件の例を挙げるが特にこれに限定されるものではない。   The copper fine-roughened particle-treated layer of the present invention is formed, for example, by dipping in an aqueous solution containing copper ions and diethylenetriaminepentaacetic acid and cathodic electrolysis. Although the example of the bath composition and electrolysis conditions which form a copper fine roughening particle process layer is given to the following, it does not specifically limit to this.

(浴組成)
硫酸銅五水和物 10〜100g/L(特に好ましくは25〜60g/L)
ジエチレントリアミン五酢酸五ナトリウム 10〜300g/L(特に好ましくは30〜60g/L)
pH 2.5〜13.0(特に好ましくは3.5〜6.0)
pHは硫酸にて調整
(電解条件)
浴温度 20〜60℃(特に好ましくは25〜45℃)
電流密度 1〜10A/dm2(特に好ましくは2〜4A/dm2
電気量 10〜500A・sec/dm2(特に好ましくは30〜100A・sec/dm2
(Bath composition)
Copper sulfate pentahydrate 10-100g / L (particularly preferably 25-60g / L)
Diethylenetriaminepentaacetic acid pentasodium 10-300 g / L (particularly preferably 30-60 g / L)
pH 2.5-13.0 (particularly preferably 3.5-6.0)
pH adjusted with sulfuric acid (electrolysis conditions)
Bath temperature 20-60 ° C (particularly preferably 25-45 ° C)
Current density 1-10A / dm 2 (particularly preferably 2-4A / dm 2 )
Electricity 10 ~ 500A ・ sec / dm 2 (Preferably 30 ~ 100A ・ sec / dm 2 )

本発明の銅の微細粗化粒子処理層は、処理ムラのない黒色の外観を呈する。また、本発明の微細粗化粒子処理は従来の粗化処理法と異なり、粗面粗度の上昇が極めて低いため、処理後の粗面粗度も低粗度にすることが可能であり、結果としてプラズマディスプレイパネル用電磁波遮蔽フィルター用銅箔として適している低いRz、高い光沢度を得ることが可能となる。   The copper fine-roughened particle-treated layer of the present invention exhibits a black appearance with no processing unevenness. In addition, unlike the conventional roughening treatment method, the fine roughening particle treatment of the present invention has an extremely low increase in the roughness of the rough surface, so that it is possible to reduce the roughness of the rough surface after the treatment, As a result, it is possible to obtain low Rz and high glossiness suitable as a copper foil for an electromagnetic wave shielding filter for a plasma display panel.

更に銅の微細粗化粒子処理層形成後にコバルト及びニッケルの微細粗化粒子層を施すことで更に黒い色調の外観を得ることができる。   Furthermore, the appearance of a further black color tone can be obtained by applying a fine roughening particle layer of cobalt and nickel after the formation of a copper fine roughening particle treatment layer.

また、鉄を含む銅の微細粗化粒子処理層を形成させることでも更に黒い色調の外観を得ることができ、プラズマディスプレイパネル用電磁波遮蔽フィルター用銅箔としてより適した銅箔を得ることができる。   Moreover, the appearance of a further black color tone can be obtained by forming a fine roughening particle treatment layer of copper containing iron, and a copper foil more suitable as a copper foil for an electromagnetic wave shielding filter for a plasma display panel can be obtained. .

本発明の銅の微細粗化粒子処理後に特公平2-24037号にあるようなモリブデン、あるいはタングステンの少なくとも一方を含有するコバルト層、特開2003-171781号にあるようなモリブデン、若しくはタングステンを含有するニッケル-リン層、特開2003-298229号にあるようなゲルマニウムを含有するコバルト又はニッケル層、その他公知の耐熱・防錆層、クロメート皮膜層、シランカップリング剤層を施すことにより更に良好な特性を得ることが出来る。   Cobalt layer containing at least one of molybdenum or tungsten as disclosed in JP-B-2-24037 after the copper fine-roughening particle treatment of the present invention, molybdenum or tungsten as disclosed in JP-A-2003-171781 The nickel-phosphorus layer, cobalt or nickel layer containing germanium as disclosed in JP-A-2003-298229, other heat-resistant / rust-proof layer, chromate film layer, and silane coupling agent layer are further improved. Characteristics can be obtained.

耐熱・防錆層を施した場合は電磁波シールドフィルター製造時に受ける熱履歴からの耐加熱変色性や耐酸化性が向上する。耐熱・防錆層を形成させる浴組成、電解条件の例を挙げる。   When a heat-resistant / rust-proof layer is applied, the heat discoloration resistance and oxidation resistance from the heat history received during the production of an electromagnetic wave shield filter is improved. Examples of bath composition and electrolysis conditions for forming a heat-resistant / rust-proof layer are given.

(コバルト-モリブデン層)
硫酸コバルト七水和物 10〜100g/L(特に好ましくは20〜50g/L)
モリブデン酸二ナトリウム二水和物 1〜80g/L(特に好ましくは5〜50g/L)
クエン酸三ナトリウム二水和物 5〜100g/L(特に好ましくは20〜60g/L)
pH 4.0〜10.0(特に好ましくは5.0〜7.0)
(Cobalt-molybdenum layer)
Cobalt sulfate heptahydrate 10-100 g / L (particularly preferably 20-50 g / L)
Disodium molybdate dihydrate 1-80 g / L (particularly preferably 5-50 g / L)
Trisodium citrate dihydrate 5-100g / L (particularly preferably 20-60g / L)
pH 4.0 to 10.0 (particularly preferably 5.0 to 7.0)

(ニッケル−リン-タングステン層)
硫酸ニッケル六水和物 10〜100g/L(特に好ましくは20〜50g/L)
次亜リン酸ナトリウム一水和物 0.1〜10g/L(特に好ましくは0.5〜5g/L)
タングステン酸ナトリウム二水和物 0.1〜20g/L(特に好ましくは0.5〜10g/L)
酢酸ナトリウム三水和物 2〜20g/L(特に好ましくは3〜15g/L)
pH 3.0〜5.5(特に好ましくは3.5〜5.0)
(Nickel-phosphorus-tungsten layer)
Nickel sulfate hexahydrate 10-100g / L (particularly preferably 20-50g / L)
Sodium hypophosphite monohydrate 0.1-10 g / L (particularly preferably 0.5-5 g / L)
Sodium tungstate dihydrate 0.1-20 g / L (particularly preferably 0.5-10 g / L)
Sodium acetate trihydrate 2-20g / L (particularly preferably 3-15g / L)
pH 3.0-5.5 (particularly preferably 3.5-5.0)

(コバルト-ニッケル-ゲルマニウム層)
硫酸コバルト七水和物 10〜100g/L(特に好ましくは20〜50g/L)
硫酸ニッケル六水和物 10〜100g/L(特に好ましくは20〜50g/L)CrO3
二酸化ゲルマニウム 0.1〜10g/L(特に好ましくは0.3〜3g/L)
クエン酸三ナトリウム二水和物 5〜100g/L(特に好ましくは20〜60g/L)
pH 3.0〜10.0(特に好ましくは4.0〜7.0)
(Cobalt-nickel-germanium layer)
Cobalt sulfate heptahydrate 10-100 g / L (particularly preferably 20-50 g / L)
Nickel sulfate hexahydrate 10-100 g / L (particularly preferably 20-50 g / L) CrO 3
Germanium dioxide 0.1-10g / L (particularly preferably 0.3-3g / L)
Trisodium citrate dihydrate 5-100g / L (particularly preferably 20-60g / L)
pH 3.0 to 10.0 (particularly preferably 4.0 to 7.0)

また導電性の付与目的として硫酸ナトリウムを添加してもかまわない。   Further, sodium sulfate may be added for the purpose of imparting conductivity.

(電解条件)
浴温度 20〜50℃(特に好ましくは25〜40℃)
電流密度 0.1〜10A/dm2(特に好ましくは10〜30A・sec/dm2
電気量 5〜40A・sec/dm2(特に好ましくは10〜30A・sec/dm2
(Electrolysis conditions)
Bath temperature 20-50 ° C (particularly preferably 25-40 ° C)
Current density 0.1 to 10A / dm 2 (particularly preferably 10 to 30A · sec / dm 2 )
Amount of electricity 5 to 40 A · sec / dm 2 (particularly preferably 10 to 30 A · sec / dm 2 )

クロメート皮膜層を施した場合は耐酸化性等の特性が向上する。クロメート皮膜層を形成させる浴は公知のものでよく、例えばクロム酸、重クロム酸ナトリウム、重クロム酸カリウムなどの6価クロムを有する物であればい。尚、クロメート皮膜層形成後のクロムの析出形態はCr(OH)3とCr2O3が混在した状態であり、人体に悪影響を及ぼす6価クロムはなく3価クロムの形態で析出している。 When a chromate film layer is applied, characteristics such as oxidation resistance are improved. The bath for forming the chromate film layer may be a well-known bath, for example, any one having hexavalent chromium such as chromic acid, sodium dichromate, potassium dichromate and the like. In addition, the precipitation form of chromium after the chromate film layer is formed is a state in which Cr (OH) 3 and Cr 2 O 3 coexist, and there is no hexavalent chromium that adversely affects the human body, and it is deposited in the form of trivalent chromium. .

クロメート皮膜層を形成させる浴組成、電解条件の例を挙げる。
重クロム酸ナトリウム 10g/L
浴温度 30℃
pH 4.2
電流密度 10A/dm2
電解時間 5秒
Examples of the bath composition and electrolysis conditions for forming the chromate film layer are given.
Sodium dichromate 10g / L
Bath temperature 30 ℃
pH 4.2
Current density 10A / dm 2
Electrolysis time 5 seconds

また、特公昭58-15950号にある亜鉛イオン、6価クロムイオンを含むアルカリ性ジンククロメート液を使用してもよく、本クロム酸液を使用することで、クロム単独酸液からのクロメート皮膜層よりも耐酸化性を向上させる事が出来る。   In addition, an alkaline zinc chromate solution containing zinc ions and hexavalent chromium ions described in Japanese Patent Publication No. 58-15950 may be used. By using this chromic acid solution, a chromate film layer from a single acid solution of chromium is used. Can also improve oxidation resistance.

シランカップリング剤層を施した場合は耐酸化性、接着強度、過酷試験後の接着強度等の特性が向上する。シランカップリング剤はエポキシ基、アミノ基、メルカプト基、ビニル基、メタクリロキシ基、スチリル基等多種あるがそれぞれ異なった特性を有し、また、基材との相性もあり選択して使用する必要がある。   When a silane coupling agent layer is applied, properties such as oxidation resistance, adhesive strength, and adhesive strength after severe testing are improved. There are various types of silane coupling agents such as epoxy group, amino group, mercapto group, vinyl group, methacryloxy group, styryl group, etc., but each has different characteristics, and it is compatible with the base material, so it is necessary to select it. is there.

シランカップリング剤層を施す浴としては例えば以下に示す様な組成、条件が挙げられる。
[3-(2-アミノエチル)アミノプロピル]トリメトキシシラン 2mL/L
浴温度 30℃
浸漬時間 15秒
Examples of the bath for applying the silane coupling agent layer include the following composition and conditions.
[3- (2-Aminoethyl) aminopropyl] trimethoxysilane 2mL / L
Bath temperature 30 ℃
Immersion time 15 seconds

以下に上述してきた本発明の実施例を詳細に説明する。ただし、本発明は下記の実施例に特に限定されるものではない。   The embodiments of the present invention described above will be described in detail below. However, the present invention is not particularly limited to the following examples.

実施例1. Example 1.

まず、特開2004-263289号記載の製造方法で作成した12μmの電解銅箔を用意した。
該銅箔は未処理の状態では何れの面も光沢を呈し、一般的にM面、粗面、マット面等と呼ばれるめっき終了面のRz(十点平均粗さ)は0.67μmであり、60°での鏡面光沢度Gsが
687(85°でのGsが141)であった。S面、平滑面、光沢面、シャイニー面、ドラム面等と呼ばれるめっき開始面のRzは1.26μmであった。以降、該電解銅箔のめっき終了面を粗面、めっき開始面を平滑面と表記する。
First, a 12 μm electrolytic copper foil prepared by the manufacturing method described in JP-A-2004-263289 was prepared.
The copper foil is glossy on any surface in an untreated state, and the Rz (ten-point average roughness) of the plating-finished surface generally called M surface, rough surface, mat surface, etc. is 0.67 μm, Mirror gloss Gs at °
687 (Gs at 85 ° was 141). The Rz of the plating starting surface called S surface, smooth surface, gloss surface, shiny surface, drum surface, etc. was 1.26 μm. Hereinafter, the plating end surface of the electrolytic copper foil is referred to as a rough surface, and the plating start surface is referred to as a smooth surface.

まず、該未処理箔を硫酸濃度100g/L、浴温度20℃の硫酸溶液中に60秒間浸漬させ表面の酸化層の除去を行った。次に、以下に示す浴組成、電解条件で陰極電解することで、該未処理箔の粗面に銅の微細粗化粒子処理層を形成させた。   First, the untreated foil was immersed in a sulfuric acid solution having a sulfuric acid concentration of 100 g / L and a bath temperature of 20 ° C. for 60 seconds to remove the oxide layer on the surface. Next, cathodic electrolysis was carried out under the bath composition and electrolysis conditions described below to form a copper fine-roughened particle-treated layer on the rough surface of the untreated foil.

(浴組成)
硫酸銅五水和物 35g/L
ジエチレントリアミン五酢酸五ナトリウム 42g/L
pH 4.5
(電解条件)
浴温度 35℃
電流密度 2A/dm2
電解時間 10秒
(Bath composition)
Copper sulfate pentahydrate 35g / L
Diethylenetriaminepentaacetic acid pentasodium 42g / L
pH 4.5
(Electrolysis conditions)
Bath temperature 35 ℃
Current density 2A / dm 2
Electrolysis time 10 seconds

更に以下の浴組成の防錆液に10秒浸漬させた。
(浴組成)
重クロム酸ナトリウム 10g/L
浴温度 20℃
pH 4.2
その後水洗して乾燥させた。
Further, it was immersed in a rust preventive solution having the following bath composition for 10 seconds.
(Bath composition)
Sodium dichromate 10g / L
Bath temperature 20 ℃
pH 4.2
Thereafter, it was washed with water and dried.

実施例2. Example 2

銅の微細粗化粒子処理層を形成させる際の電解時間を20秒にした他は実施例1と同じ処理を行った。   The same treatment as in Example 1 was performed except that the electrolysis time for forming the copper fine-roughened particle treatment layer was 20 seconds.

実施例3. Example 3

銅の微細粗化粒子処理層を形成させる際の電解時間を30秒にした他は実施例1と同じ処理を行った。   The same treatment as in Example 1 was performed except that the electrolysis time for forming the copper fine-roughened particle treatment layer was 30 seconds.

実施例4. Example 4

銅の微細粗化粒子処理層を形成させる際の電解時間を40秒にした他は実施例1と同じ処理を行った。   The same treatment as in Example 1 was performed except that the electrolysis time for forming the copper fine-roughened particle treatment layer was 40 seconds.

実施例5. Example 5 FIG.

銅の微細粗化粒子処理層を形成させる際の電流密度を3A/dm2、電解時間を20秒にした他は実施例1と同じ処理を行った。 The same treatment as in Example 1 was performed except that the current density at the time of forming the copper fine-roughened particle treatment layer was 3 A / dm 2 and the electrolysis time was 20 seconds.

実施例6. Example 6

銅の微細粗化粒子処理層を形成させる際の電流密度を4A/dm2、電解時間を20秒にした他は実施例1と同じ処理を行った。 The same treatment as in Example 1 was performed, except that the current density during the formation of the copper fine-roughened particle treatment layer was 4 A / dm 2 and the electrolysis time was 20 seconds.

実施例7. Example 7

実施例1で使用した未処理銅箔を硫酸濃度100g/L、浴温度20℃の硫酸溶液中に60秒間浸漬させ表面の酸化層の除去を行った。その後銅の微細粗化粒子処理層を形成させる際の電流密度を2A/dm2、電解時間を20秒にした他は実施例1と同じ条件で銅の微細粗化粒子処理層を形成させる処理を行った。その後以下に示す浴組成、電解条件のアルカリ性ジンククロメート液で防錆処理を行った。 The untreated copper foil used in Example 1 was immersed in a sulfuric acid solution having a sulfuric acid concentration of 100 g / L and a bath temperature of 20 ° C. for 60 seconds to remove the oxide layer on the surface. Thereafter, the current density when forming the copper fine-roughened particle treatment layer is 2 A / dm 2 , and the process for forming the copper fine-roughened particle treatment layer under the same conditions as in Example 1 except that the electrolysis time is 20 seconds. Went. Thereafter, rust prevention treatment was performed with an alkaline zinc chromate solution having the following bath composition and electrolytic conditions.

(浴組成)
重クロム酸ナトリウム 10g/L
亜鉛イオン 0.5g/L
水酸化ナトリウム 35g/L
(電解条件)
電流密度 2A/dm2
電解時間 10秒
(Bath composition)
Sodium dichromate 10g / L
Zinc ion 0.5g / L
Sodium hydroxide 35g / L
(Electrolysis conditions)
Current density 2A / dm 2
Electrolysis time 10 seconds

実施例8. Example 8 FIG.

実施例7の処理を行った後に、以下に示す組成、条件のシランカップリング剤に10秒浸漬させた。
[3-(2-アミノエチル)アミノプロピル]トリメトキシシラン 10mL/L
浴温度 20℃
After performing the treatment of Example 7, it was immersed in a silane coupling agent having the following composition and conditions for 10 seconds.
[3- (2-Aminoethyl) aminopropyl] trimethoxysilane 10mL / L
Bath temperature 20 ℃

実施例9. Example 9

実施例1で使用した未処理銅箔を硫酸濃度100g/L、浴温度20℃の硫酸溶液中に60秒間浸漬させ表面の酸化層の除去を行った。その後銅の微細粗化粒子処理層を形成させる際の電流密度を2A/dm2、電解時間を20秒にした他は実施例1と同じ条件で銅の微細粗化粒子処理層を形成させる処理を行った。その後以下に示す浴組成、電解条件で耐熱・防錆処理を行った。 The untreated copper foil used in Example 1 was immersed in a sulfuric acid solution having a sulfuric acid concentration of 100 g / L and a bath temperature of 20 ° C. for 60 seconds to remove the oxide layer on the surface. Thereafter, the current density when forming the copper fine-roughened particle treatment layer is 2 A / dm 2 , and the process for forming the copper fine-roughened particle treatment layer under the same conditions as in Example 1 except that the electrolysis time is 20 seconds. Went. Thereafter, heat treatment and rust prevention treatment were performed under the bath composition and electrolysis conditions described below.

(浴組成)
硫酸ニッケル六水和物 30g/L
次亜リン酸ナトリウム一水和物 2g/L
タングステン酸ナトリウム二水和物 3g/L
酢酸ナトリウム三水和物 10g/L
pH 4.5
(電解条件)
浴温度 32℃
電流密度 1.5A/dm2
電解時間 3秒
更に実施例1の浴組成の防錆液に10秒浸漬させ、その後水洗して乾燥させた。
(Bath composition)
Nickel sulfate hexahydrate 30g / L
Sodium hypophosphite monohydrate 2g / L
Sodium tungstate dihydrate 3g / L
Sodium acetate trihydrate 10g / L
pH 4.5
(Electrolysis conditions)
Bath temperature 32 ℃
Current density 1.5A / dm 2
Electrolysis time 3 seconds Further, the film was immersed in a rust preventive liquid having the bath composition of Example 1 for 10 seconds, then washed with water and dried.

実施例10. Example 10

実施例1で使用した未処理銅箔を硫酸濃度100g/L、浴温度20℃の硫酸溶液中に60秒間浸漬させ表面の酸化層の除去を行った。その後銅の微細粗化粒子処理層を形成させる際の電流密度を2A/dm2、電解時間を20秒にした他は実施例1と同じ条件で銅の微細粗化粒子処理層を形成させる処理を行った。その後以下に示す浴組成、電解条件で耐熱・防錆処理を行った。 The untreated copper foil used in Example 1 was immersed in a sulfuric acid solution having a sulfuric acid concentration of 100 g / L and a bath temperature of 20 ° C. for 60 seconds to remove the oxide layer on the surface. Thereafter, the current density when forming the copper fine-roughened particle treatment layer is 2 A / dm 2 , and the process for forming the copper fine-roughened particle treatment layer under the same conditions as in Example 1 except that the electrolysis time is 20 seconds. Went. Thereafter, heat treatment and rust prevention treatment were performed under the bath composition and electrolysis conditions described below.

(浴組成)
硫酸コバルト七水和物 38g/L
モリブデン酸二ナトリウム二水和物 23g/L
クエン酸三ナトリウム二水和物 45g/L
硫酸ナトリウム 80g/L
pH 5.5
(電解条件)
浴温度 30℃
電流密度 2A/dm2
電解時間 3秒
更に実施例1の浴組成の防錆液に10秒浸漬させ、その後水洗して乾燥させた。
(Bath composition)
Cobalt sulfate heptahydrate 38g / L
Disodium molybdate dihydrate 23g / L
Trisodium citrate dihydrate 45g / L
Sodium sulfate 80g / L
pH 5.5
(Electrolysis conditions)
Bath temperature 30 ℃
Current density 2A / dm 2
Electrolysis time 3 seconds Further, the film was immersed in a rust preventive liquid having the bath composition of Example 1 for 10 seconds, then washed with water and dried.

実施例11. Example 11

特開2004-263289号記載の製造方法で作成した12μmの電解銅箔を用意した。ただし、実施例1〜10より粗面の十点平均粗さRzがやや粗めの未処理銅箔を使用した。該未処理銅箔の粗面のRzは1.52μmであり、60°での鏡面光沢度Gsが608(85°でのGsが140)であった。平滑面のRzは1.73μmであった。未処理銅箔の粗面粗さが異なる以外は実施例2と全く同じ条件で処理を行った。   A 12 μm electrolytic copper foil prepared by the manufacturing method described in JP-A-2004-263289 was prepared. However, an untreated copper foil having a slightly rough ten-point average roughness Rz on the rough surface as compared with Examples 1 to 10 was used. Rz of the rough surface of the untreated copper foil was 1.52 μm, and the specular glossiness Gs at 60 ° was 608 (Gs at 85 ° was 140). Rz of the smooth surface was 1.73 μm. The treatment was performed under exactly the same conditions as in Example 2 except that the rough surface roughness of the untreated copper foil was different.

実施例12. Example 12

鉄を含む銅の微細粗化粒子処理層を形成させ、特性を確認した。未処理銅箔は実施例1と同様の箔を用い、硫酸濃度100g/L、浴温度20℃の硫酸溶液中に60秒間浸漬させ表面の酸化層の除去を行った。次に、以下に示す浴組成、電解条件で鉄を含む銅の微細粗化粒子処理層を形成処理させた。   A copper fine-roughened particle-treated layer containing iron was formed, and the characteristics were confirmed. As the untreated copper foil, the same foil as in Example 1 was used, and the surface oxide layer was removed by immersing in a sulfuric acid solution having a sulfuric acid concentration of 100 g / L and a bath temperature of 20 ° C. for 60 seconds. Next, a copper fine-roughened particle treatment layer containing iron was formed and processed under the bath composition and electrolysis conditions described below.

(浴組成)
硫酸銅五水和物 35g/L
硫酸第二鉄n水和物 10g/L
ジエチレントリアミン五酢酸五ナトリウム 42g/L
pH 4.5
(電解条件)
浴温度 35℃
電流密度 2A/dm2
電解時間 20秒
更に実施例1の浴組成の防錆液に10秒浸漬させ、その後水洗して乾燥させた。
(Bath composition)
Copper sulfate pentahydrate 35g / L
Ferric sulfate n hydrate 10g / L
Diethylenetriaminepentaacetic acid pentasodium 42g / L
pH 4.5
(Electrolysis conditions)
Bath temperature 35 ℃
Current density 2A / dm 2
Electrolysis time 20 seconds Further, the film was immersed in a rust preventive solution having the bath composition of Example 1 for 10 seconds, then washed with water and dried.

実施例13. Example 13

銅の微細粗化粒子処理層を形成させた後、コバルトの微細粗化粒子処理層を形成させ、特性を確認した。未処理銅箔は実施例1と同様の箔を用いた。硫酸濃度100g/L、浴温度20℃の硫酸溶液中に60秒間浸漬させ表面の酸化層の除去を行い、次に、以下に示す浴組成、電解条件で銅の微細粗化粒子処理層を形成させた。   After forming the copper fine-roughened particle treatment layer, a cobalt fine-roughened particle treatment layer was formed, and the characteristics were confirmed. The untreated copper foil was the same as that used in Example 1. The surface oxide layer is removed by dipping in a sulfuric acid solution with a sulfuric acid concentration of 100 g / L and a bath temperature of 20 ° C. for 60 seconds. Next, a copper roughened particle treatment layer is formed with the bath composition and electrolytic conditions shown below. I let you.

(浴組成)
硫酸銅五水和物 35g/L
ジエチレントリアミン五酢酸五ナトリウム 42g/L
pH 4.5
(電解条件)
浴温度 35℃
電流密度 2A/dm2
電解時間 20秒
更に以下に示す条件でコバルトの微細粗化処理層を形成させた。
(Bath composition)
Copper sulfate pentahydrate 35g / L
Diethylenetriaminepentaacetic acid pentasodium 42g / L
pH 4.5
(Electrolysis conditions)
Bath temperature 35 ℃
Current density 2A / dm 2
Electrolysis time 20 seconds Further, a cobalt fine roughening layer was formed under the following conditions.

(浴組成)
硫酸コバルト七水和物 10g/L
pH 5.0
(電解条件)
浴温度 30℃
電流密度 2A/dm2
電解時間 5秒
その後、実施例1の浴組成の防錆液に10秒浸漬させ、水洗して乾燥させた。
(Bath composition)
Cobalt sulfate heptahydrate 10g / L
pH 5.0
(Electrolysis conditions)
Bath temperature 30 ℃
Current density 2A / dm 2
Electrolysis time: 5 seconds Thereafter, it was immersed in a rust preventive liquid having the bath composition of Example 1 for 10 seconds, washed with water and dried.

比較例1. Comparative Example 1

実施例1で使用した未処理銅箔を硫酸濃度100g/L、浴温度20℃の硫酸溶液中に60秒間浸漬させ表面の酸化層の除去を行った。次に、以下に示す浴組成、電解条件で陰極電解することで、該未処理銅箔平滑面側に硫酸コバルトめっき層を形成した。   The untreated copper foil used in Example 1 was immersed in a sulfuric acid solution having a sulfuric acid concentration of 100 g / L and a bath temperature of 20 ° C. for 60 seconds to remove the oxide layer on the surface. Next, a cobalt sulfate plating layer was formed on the smooth surface side of the untreated copper foil by cathodic electrolysis under the following bath composition and electrolysis conditions.

(浴組成)
硫酸コバルト七水和物 10g/L
pH 5.0
(電解条件)
浴温度 30℃
電流密度 2A/dm2
電解時間 3秒
更に実施例1の浴組成の防錆液に10秒浸漬させ、その後水洗して乾燥させた。
(Bath composition)
Cobalt sulfate heptahydrate 10g / L
pH 5.0
(Electrolysis conditions)
Bath temperature 30 ℃
Current density 2A / dm 2
Electrolysis time 3 seconds Further, the film was immersed in a rust preventive liquid having the bath composition of Example 1 for 10 seconds, then washed with water and dried.

比較例2. Comparative Example 2

硫酸コバルトめっき浴において、電流密度を2A/dm2、電解時間を8秒にした他は比較例1と同じ処理を行った。 The same treatment as in Comparative Example 1 was performed except that the current density was 2 A / dm 2 and the electrolysis time was 8 seconds in a cobalt sulfate plating bath.

比較例3. Comparative Example 3

実施例1で使用した未処理銅箔を硫酸濃度100g/L、浴温度20℃の硫酸溶液中に60秒間浸漬させ表面の酸化層の除去を行い、次に以下に示す浴組成、電解条件で陰極電解することで、該未処理銅箔粗面側に粗化処理層を形成した。   The untreated copper foil used in Example 1 was immersed in a sulfuric acid solution having a sulfuric acid concentration of 100 g / L and a bath temperature of 20 ° C. for 60 seconds to remove the oxidized layer on the surface. Next, the bath composition and electrolytic conditions shown below were used. By cathodic electrolysis, a roughened layer was formed on the rough side of the untreated copper foil.

(浴組成)
硫酸銅五水和物 50g/L
硫酸亜鉛七水和物 58g/L
モリブデン酸ナトリウム二水和物 2g/L
無水硫酸ナトリウム 14g/L
pH 2.0
(電解条件)
浴温度 30℃
電流密度 6A/dm2
電解時間 2秒
次いで以下に示す浴組成、電解条件で陰極電解を行い、カバーめっき層を形成した。
(Bath composition)
Copper sulfate pentahydrate 50g / L
Zinc sulfate heptahydrate 58g / L
Sodium molybdate dihydrate 2g / L
Anhydrous sodium sulfate 14g / L
pH 2.0
(Electrolysis conditions)
Bath temperature 30 ℃
Current density 6A / dm 2
Electrolysis time 2 seconds Cathodic electrolysis was then carried out under the bath composition and electrolysis conditions shown below to form a cover plating layer.

(浴組成)
硫酸銅五水和物 135g/L
硫酸 100g/L
(電解条件)
浴温度 40℃
電流密度 3A/dm2
電解時間 8秒
カバーめっき層形成後水洗を行い、次いで以下に示す浴組成、電解条件で陰極電解を行い、合金めっき層を形成した。
(Bath composition)
Copper sulfate pentahydrate 135g / L
Sulfuric acid 100g / L
(Electrolysis conditions)
Bath temperature 40 ℃
Current density 3A / dm 2
Electrolysis time 8 seconds After the cover plating layer was formed, the plate was washed with water, and then cathodic electrolysis was performed under the bath composition and electrolysis conditions shown below to form an alloy plating layer.

(浴組成)
硫酸ニッケル六水和物 13g/L
ピロリン酸錫 3g/L
モリブデン酸ナトリウム二水和物 12g/L
ピロリン酸カリウム 33g/L
グリシン 4g/L
pH 8.0
(電解条件)
浴温度 30℃
電流密度 3A/dm2
電解時間 8秒
更に実施例1の浴組成の防錆液に10秒浸漬させ、その後水洗して乾燥させた。
(Bath composition)
Nickel sulfate hexahydrate 13g / L
Tin pyrophosphate 3g / L
Sodium molybdate dihydrate 12g / L
Potassium pyrophosphate 33g / L
Glycine 4g / L
pH 8.0
(Electrolysis conditions)
Bath temperature 30 ℃
Current density 3A / dm 2
Electrolysis time: 8 seconds Further, it was immersed in a rust preventive solution having the bath composition of Example 1 for 10 seconds, then washed with water and dried.

比較例4. Comparative Example 4

粗面の十点平均粗さRzが2.65μm、60°での鏡面光沢度Gsが2、平滑面のRzが1.61μmの未処理電解銅箔を用意した。該未処理銅箔を硫酸濃度100g/L、浴温度20℃の硫酸溶液中に60秒間浸漬させ表面の酸化層の除去を行い、次に、以下に示す浴組成、電解条件で陰極電解することで、該未処理箔粗面側に銅の粗化処理層を形成させた。   An untreated electrolytic copper foil having a ten-point average roughness Rz of the rough surface of 2.65 μm, a specular gloss Gs of 2 at 60 °, and a smooth surface Rz of 1.61 μm was prepared. The untreated copper foil is immersed in a sulfuric acid solution having a sulfuric acid concentration of 100 g / L and a bath temperature of 20 ° C. for 60 seconds to remove the oxidized layer on the surface, and then cathodically electrolyzed with the following bath composition and electrolytic conditions. Then, a copper roughened layer was formed on the rough side of the untreated foil.

(浴組成)
硫酸銅五水和物 250g/L
硫酸 120g/L
(電解条件)
浴温度 40℃
電流密度 65A/dm2
電解時間 1.2秒
次に、以下に示す浴組成、電解条件で陰極電解することで、銅箔粗面側に粗化処理層を形成させた。
(Bath composition)
Copper sulfate pentahydrate 250g / L
Sulfuric acid 120g / L
(Electrolysis conditions)
Bath temperature 40 ℃
Current density 65A / dm 2
Electrolysis time 1.2 seconds Next, a roughening treatment layer was formed on the rough side of the copper foil by cathodic electrolysis under the following bath composition and electrolysis conditions.

(浴組成)
硫酸銅五水和物 3.9g/L
硫酸コバルト七水和物 38.1g/L
硫酸アンモニウム 40g/L
硼酸 20g/L
pH 3.8
(電解条件)
浴温度 40℃
電流密度 15A/dm2
電解時間 3秒
更に、以下に示す浴組成、電解条件で陰極電解することで、銅箔粗面側にコバルトからなる平滑めっき層を形成させた。
(Bath composition)
Copper sulfate pentahydrate 3.9g / L
Cobalt sulfate heptahydrate 38.1g / L
Ammonium sulfate 40g / L
Boric acid 20g / L
pH 3.8
(Electrolysis conditions)
Bath temperature 40 ℃
Current density 15A / dm 2
Electrolysis time 3 seconds Further, a smooth plating layer made of cobalt was formed on the rough surface side of the copper foil by cathodic electrolysis under the bath composition and electrolysis conditions described below.

(浴組成)
硫酸コバルト七水和物 47.6g/L
硫酸アンモニウム 40g/L
硼酸 20g/L
pH 2.5
(電解条件)
浴温度 40℃
電流密度 3A/dm2
電解時間 30秒
更に実施例1の浴組成の防錆液に10秒浸漬させ、その後水洗して乾燥させた。
(Bath composition)
Cobalt sulfate heptahydrate 47.6g / L
Ammonium sulfate 40g / L
Boric acid 20g / L
pH 2.5
(Electrolysis conditions)
Bath temperature 40 ℃
Current density 3A / dm 2
Electrolysis time 30 seconds Further, the electrolysis time was immersed in a rust preventive liquid having the bath composition of Example 1 for 10 seconds, then washed with water and dried.

比較例5. Comparative Example 5

比較例4と同じ銅箔を用意した。この銅箔に実施例2と全く同じ処理条件で処理を行った。   The same copper foil as in Comparative Example 4 was prepared. This copper foil was processed under exactly the same processing conditions as in Example 2.

また、実施例1〜12、比較例1〜5ともに前工程の溶液を後工程へ持込むことを防止する目的で、各工程間には水洗を設けた。   Further, in each of Examples 1 to 12 and Comparative Examples 1 to 5, water washing was provided between the respective steps for the purpose of preventing the solution of the previous step from being brought into the subsequent step.

実施例1〜12、比較例1〜5の表面処理を施した銅箔の表色系XYZ(Yxy)のY、鏡面光沢度Gs(60°)、粗面粗度Rzを測定した結果を表1に示す。尚、YはJIS Z8701に基づきコニカミノルタ株式会社製の分光測色計CM-508dを用いて測定し、鏡面光沢度Gs(60°)はJIS Z8741に基づきコニカミノルタ株式会社製の光沢計マルチグロス268型を用いて測定し、粗面粗度RzはJIS B0601に基づき小坂研究所製のサーフコーダーSE1700αを用いて測定した。   Table 1 shows the results of measuring Y of the color system XYZ (Yxy), specular glossiness Gs (60 °), and rough surface roughness Rz of the copper foil subjected to the surface treatment of Examples 1 to 12 and Comparative Examples 1 to 5. Shown in 1. Y is measured using Konica Minolta's spectrophotometer CM-508d based on JIS Z8701, and specular gloss Gs (60 °) is Konica Minolta's gloss meter multi gloss based on JIS Z8741. 268 type was used, and the roughness Rz was measured using a surf coder SE1700α manufactured by Kosaka Laboratory based on JIS B0601.

Figure 2007332418
Figure 2007332418

表1に示した通り、実施例1〜13の本発明の銅の微細粗化粒子処理層、或いは鉄を含む銅の微細粗化粒子処理層を有する表面処理銅箔はJIS Z8701に記載のXYZ(Yxy)のYが8.0以下であり、黒色に近い色を有することが分かる。且つ、粗面粗度Rzが2.0以下の低粗度であり、且つ、鏡面光沢度Gs(60°)が40以上であることが分かる。   As shown in Table 1, the surface-treated copper foil having the copper fine-roughened particle-treated layer of the present invention of Examples 1 to 13 or the copper fine-roughened particle-treated layer containing iron is XYZ described in JIS Z8701. It can be seen that Y of (Yxy) is 8.0 or less and has a color close to black. It can also be seen that the rough surface roughness Rz is a low roughness of 2.0 or less and the specular gloss Gs (60 °) is 40 or more.

本実施例の銅箔を使用してプラズマディスプレイ電磁波遮蔽フィルターを作製した場合、外光からの反射を低く抑制することが可能となり、高いコントラストが得られ、更にエッチング精度の高いメッシュ形成が可能で、エッチング後のPET/接着剤の透明性も高いため鮮明な画像が得られる良好な電磁波遮蔽フィルターとなる。ただし実施例12のみ、やや粉落ちが見られる。   When a plasma display electromagnetic wave shielding filter is produced using the copper foil of this example, reflection from outside light can be suppressed low, high contrast can be obtained, and mesh formation with higher etching accuracy is possible. Further, since the PET / adhesive after etching has high transparency, it becomes a good electromagnetic wave shielding filter capable of obtaining a clear image. However, only Example 12 shows a slight powder fall.

一方、比較例1、2のように(特許文献2)や(特許文献3)を参照した硫酸コバルト浴による処理方法では、鏡面光沢度Gs(60°)が低く、エッチング後のPET/接着剤の透明性が悪くなり、また比較例1ではYも10を超え、外観黒色の点で問題となる。   On the other hand, the treatment method using a cobalt sulfate bath referring to (Patent Document 2) and (Patent Document 3) as in Comparative Examples 1 and 2 has a low specular gloss Gs (60 °), and the PET / adhesive after etching. In Comparative Example 1, Y is more than 10, which is problematic in terms of black appearance.

比較例3では(特許文献1)を参照して、銅の樹枝状粗化処理、該粗化処理と銅箔の固着性を発現させるカバーめっきを施した後に、錫-ニッケル-モリブデンからなる合金めっき層を施す方法を試みたが、鏡面光沢度Gs(60°)が低く、エッチング後のPET/接着剤の透明性が悪くなる。またやや粉落ちが見られる。   In Comparative Example 3, referring to (Patent Document 1), an alloy composed of tin-nickel-molybdenum after copper dendritic roughening treatment, cover plating for expressing the roughening treatment and adhesion of copper foil is performed. An attempt was made to apply a plating layer, but the specular gloss Gs (60 °) is low, and the transparency of the PET / adhesive after etching is poor. Slightly falling off is also seen.

比較例4のように(特許文献4)を参照して、Rz3.0μm以下の銅箔に銅からなる粗化処理を施した後、銅-コバルトからなる処理を行い、更にコバルトの平滑めっきを行う方法では、鏡面光沢度Gs(60°)が低く、更にYも高く、多くの粉落ちが見られ、良好な画像を得られない欠点を有することが分かる。   Referring to (Patent Document 4) as in Comparative Example 4, a copper foil having an Rz of 3.0 μm or less was subjected to a roughening treatment made of copper, then a treatment made of copper-cobalt, and further a smooth plating of cobalt. It can be seen that the method used has the disadvantages that the specular gloss Gs (60 °) is low, the Y is also high, many powders are lost, and a good image cannot be obtained.

比較例5のように、Rz 2.65μmの粗めの未処理銅箔を使用して本発明の銅の微細粗化粒子処理層を形成させる処理を行う方法では、鏡面光沢度Gs(60°)が著しく低く、エッチング後のPET/接着剤の透明性が悪くなり、更に粗面粗度Rzが低い例と比較すると粉落ちが多くなる傾向が見られる。このことより、粗面粗さが粗すぎるとプラズマディスプレイ電磁波遮蔽フィルター用銅箔に求められる特性を得ることが出来ず、良好な電磁波遮蔽フィルターを得ることが出来ないことが分かる。   As in Comparative Example 5, in the method of performing the treatment for forming the copper roughened particle treatment layer of the present invention using a rough untreated copper foil of Rz 2.65 μm, the specular gloss Gs (60 °) Is extremely low, the transparency of the PET / adhesive after etching is deteriorated, and there is a tendency that the amount of powder falling increases as compared with an example having a low roughness Rz. From this, it can be seen that if the roughness of the rough surface is too rough, the characteristics required for the copper foil for plasma display electromagnetic wave shielding filter cannot be obtained, and a good electromagnetic wave shielding filter cannot be obtained.

本発明は銅箔の少なくとも一方の面に銅の微細粗化粒子処理層を施し、且つ、十点平均粗さRzを2.0μm以下に調整することで、JIS Z8701に記載の表色系XYZ(Yxy)のYが8.0以下で、且つ、JIS Z8741に基づき測定した鏡面光沢度Gs(60°)が40以上であるプラズマディスプレイ電磁波遮蔽フィルター用銅箔であり、当該銅箔を使用し電磁波遮蔽フィルターを作成した場合、外光からの反射を極めて低く抑制することが可能となるため鮮明な画像が得られ、且つ、エッチング性が良好であるため高精度のメッシュが得られ、且つ、光沢度が高くエッチング後のPET/接着剤の透明性が高くヘイズ(曇り)が低いため鮮明な画像が得られる等の特徴を有するため、良好な電磁波遮蔽フィルターとなる。また、低粗度で黒色を有する銅箔を必要とする電子基板材料用としても利用可能性はある。   In the present invention, a copper fine-roughened particle-treated layer is applied to at least one surface of a copper foil, and the 10-point average roughness Rz is adjusted to 2.0 μm or less, whereby the color system XYZ described in JIS Z8701 ( Yxy) is a copper foil for electromagnetic wave shielding filter for plasma display having Y of 8.0 or less and specular gloss Gs (60 °) measured based on JIS Z8741 of 40 or more, and using this copper foil, an electromagnetic shielding filter , The reflection from outside light can be suppressed to a very low level, so that a clear image can be obtained, and since the etching property is good, a highly accurate mesh can be obtained, and the glossiness is high. Since the PET / adhesive after etching is highly transparent and the haze (cloudiness) is low, a clear image can be obtained. Moreover, there is a possibility of being used for an electronic substrate material that requires a copper foil having a low roughness and a black color.

実施例2本発明銅箔処理面側電子顕微鏡写真Example 2 Electron micrograph of copper foil treated surface side of the present invention 比較例3銅箔処理面側電子顕微鏡写真Comparative example 3 Copper foil treated surface side electron micrograph

Claims (8)

銅箔の少なくとも一方の面に銅の微細粗化粒子処理層を持ち、その面のJISZ8741に記載の光沢度Gs(60°)が40以上であり、且つ、JISZ8701に記載の表色系XYZ(Yxy)のYが8.0以下であることを特徴とする表面処理銅箔。   At least one surface of the copper foil has a copper roughened particle treatment layer, the gloss Gs (60 °) described in JISZ8741 on that surface is 40 or more, and the color system XYZ described in JISZ8701 ( A surface-treated copper foil characterized in that Y of Yxy) is 8.0 or less. PDP(プラズマディスプレイパネル)用電磁波遮蔽フィルターに使用する請求項1に記載の表面処理銅箔。   2. The surface-treated copper foil according to claim 1, which is used for an electromagnetic wave shielding filter for a PDP (plasma display panel). 銅の微細粗化粒子処理層を形成した後の十点平均粗さRzが2.0μm以下である請求項1、2に記載の表面処理銅箔。   3. The surface-treated copper foil according to claim 1, wherein the ten-point average roughness Rz after forming the copper fine-roughened particle-treated layer is 2.0 μm or less. 銅の微細粗化粒子処理層上にニッケル、モリブデン、タングステン、コバルト、リン、銅、ゲルマニウムの少なくとも一種類以上を含む耐熱処理層を設けることを特徴とする請求項1〜3のいずれかに記載の表面処理銅箔。   4. A heat-resistant treatment layer containing at least one kind of nickel, molybdenum, tungsten, cobalt, phosphorus, copper, and germanium is provided on the copper roughening particle treatment layer. Surface treated copper foil. 銅の微細粗化粒子処理層上にニッケル、モリブデン、タングステン、コバルト、リン、銅、ゲルマニウムの少なくとも一種類以上を含む耐熱処理層を設け、該耐熱処理層上にクロム、亜鉛の少なくとも一種類以上を含む防錆処理層を設けることを特徴とする請求項1〜4のいずれかに記載の表面処理銅箔。   A heat-resistant treatment layer containing at least one of nickel, molybdenum, tungsten, cobalt, phosphorus, copper, and germanium is provided on the copper fine-grained particle treatment layer, and at least one of chromium and zinc is provided on the heat-resistant treatment layer. 5. The surface-treated copper foil according to claim 1, further comprising a rust-proofing layer containing 銅の微細粗化粒子処理層上にニッケル、モリブデン、タングステン、コバルト、リン、銅、ゲルマニウムの少なくとも一種類以上を含む耐熱処理層を設け、該耐熱処理層上にクロム、亜鉛の少なくとも一種類以上を含む防錆処理層を設け、更に該耐熱・防錆処理層上にシランカップリング剤層を設けることを特徴とする請求項1〜5のいずれかに記載の表面処理銅箔。   A heat-resistant treatment layer containing at least one of nickel, molybdenum, tungsten, cobalt, phosphorus, copper, and germanium is provided on the copper fine-grained particle treatment layer, and at least one of chromium and zinc is provided on the heat-resistant treatment layer. 6. The surface-treated copper foil according to any one of claims 1 to 5, wherein a rust-proofing layer containing is provided, and a silane coupling agent layer is further provided on the heat-resistant / rust-proofing layer. 微細粗化粒子処理層が鉄を含む銅であることを特徴とする請求項1〜6に記載の表面処理銅箔。   7. The surface-treated copper foil according to claim 1, wherein the fine roughened particle treated layer is copper containing iron. 銅の微細粗化粒子処理層上にコバルト又はニッケルの微細粗化粒子処理層を設けることを特徴とする請求項1〜7に記載の表面処理銅箔。



8. The surface-treated copper foil according to claim 1, wherein a cobalt or nickel fine-roughened particle treated layer is provided on the copper finely-roughened particle treated layer.



JP2006165435A 2006-06-15 2006-06-15 Surface treated copper foil Pending JP2007332418A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006165435A JP2007332418A (en) 2006-06-15 2006-06-15 Surface treated copper foil

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006165435A JP2007332418A (en) 2006-06-15 2006-06-15 Surface treated copper foil

Publications (1)

Publication Number Publication Date
JP2007332418A true JP2007332418A (en) 2007-12-27

Family

ID=38932170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006165435A Pending JP2007332418A (en) 2006-06-15 2006-06-15 Surface treated copper foil

Country Status (1)

Country Link
JP (1) JP2007332418A (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009242945A (en) * 2008-03-31 2009-10-22 Ls Mtron Ltd Surface treating method of copper foil for printed circuit, copper foil produced by the same, and plating apparatus
JP2010236058A (en) * 2009-03-31 2010-10-21 Mitsui Mining & Smelting Co Ltd Roughening-processed copper foil, method of manufacturing roughening-processed copper foil and copper clad laminate
WO2011090174A1 (en) * 2010-01-22 2011-07-28 古河電気工業株式会社 Surface-treated copper foil, method for producing same, and copper clad laminated board
WO2011138876A1 (en) * 2010-05-07 2011-11-10 Jx日鉱日石金属株式会社 Copper foil for printed circuit
WO2012002418A1 (en) * 2010-06-30 2012-01-05 三井金属鉱業株式会社 Process for production of copper foil for negative electrode current collector
WO2012169249A1 (en) * 2011-06-07 2012-12-13 Jx日鉱日石金属株式会社 Liquid crystal polymer-copper clad laminate and copper foil used for liquid crystal polymer-copper clad laminate
WO2013168646A1 (en) * 2012-05-11 2013-11-14 Jx日鉱日石金属株式会社 Surface-treated copper foil and laminate using same, copper foil, printed wiring board, electronic device, and process for producing printed wiring board
WO2013187420A1 (en) * 2012-06-11 2013-12-19 Jx日鉱日石金属株式会社 Surface-treated copper foil and laminated sheet, printed wiring board, and electronic device using same, as well as method for producing printed wiring board
JP2014148742A (en) * 2012-05-11 2014-08-21 Jx Nippon Mining & Metals Corp Copper foil and laminate plate using the same, printed wiring board, electronic apparatus, and method for manufacturing printed wiring board
WO2017138338A1 (en) * 2016-02-10 2017-08-17 古河電気工業株式会社 Surface-treated copper foil and copper-clad laminate produced using same
KR20210015661A (en) * 2019-08-01 2021-02-10 토요잉크Sc홀딩스주식회사 Electromagnetic wave shielding sheet and electromagnetic wave shielding wiring circuit board
KR20210015660A (en) * 2019-08-01 2021-02-10 토요잉크Sc홀딩스주식회사 Electromagnetic wave shielding sheet and electromagnetic wave shielding circuit board

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003102277A1 (en) * 2002-06-04 2003-12-11 Mitsui Mining & Smelting Co.,Ltd. Surface treatment copper foil for low dielectric substrate, copper clad laminate including the same and printed wiring board
JP2005150155A (en) * 2003-11-11 2005-06-09 Furukawa Circuit Foil Kk Copper foil for electromagnetic-wave shielding, its manufacturing method and electromagnetic-wave shielding body made of copper foil
WO2006004299A1 (en) * 2004-04-02 2006-01-12 Iljin Copper Foil Co., Ltd. Method for manufacturing black surface-treated copper foil for emi shield

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003102277A1 (en) * 2002-06-04 2003-12-11 Mitsui Mining & Smelting Co.,Ltd. Surface treatment copper foil for low dielectric substrate, copper clad laminate including the same and printed wiring board
JP2005150155A (en) * 2003-11-11 2005-06-09 Furukawa Circuit Foil Kk Copper foil for electromagnetic-wave shielding, its manufacturing method and electromagnetic-wave shielding body made of copper foil
WO2006004299A1 (en) * 2004-04-02 2006-01-12 Iljin Copper Foil Co., Ltd. Method for manufacturing black surface-treated copper foil for emi shield

Cited By (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009242945A (en) * 2008-03-31 2009-10-22 Ls Mtron Ltd Surface treating method of copper foil for printed circuit, copper foil produced by the same, and plating apparatus
JP2010236058A (en) * 2009-03-31 2010-10-21 Mitsui Mining & Smelting Co Ltd Roughening-processed copper foil, method of manufacturing roughening-processed copper foil and copper clad laminate
US8852754B2 (en) 2010-01-22 2014-10-07 Furukawa Electric Co., Ltd. Surface-treated copper foil, method for producing same, and copper clad laminated board
WO2011090174A1 (en) * 2010-01-22 2011-07-28 古河電気工業株式会社 Surface-treated copper foil, method for producing same, and copper clad laminated board
JP2011149067A (en) * 2010-01-22 2011-08-04 Furukawa Electric Co Ltd:The Surface-treated copper foil, method for producing the same, and copper-clad laminated board
CN102713020A (en) * 2010-01-22 2012-10-03 古河电气工业株式会社 Surface-treated copper foil, method for producing same, and copper clad laminated board
KR101561731B1 (en) 2010-01-22 2015-10-19 후루카와 덴키 고교 가부시키가이샤 Surface-treated copper foil, method for producing same and copper clad laminated board
CN102713020B (en) * 2010-01-22 2015-05-13 古河电气工业株式会社 Surface-treated copper foil, method for producing same, and copper clad laminated board
WO2011138876A1 (en) * 2010-05-07 2011-11-10 Jx日鉱日石金属株式会社 Copper foil for printed circuit
US10472728B2 (en) 2010-05-07 2019-11-12 Jx Nippon Mining & Metals Corporation Copper foil for printed circuit
US9580829B2 (en) 2010-05-07 2017-02-28 Jx Nippon Mining & Metals Corporation Copper foil for printed circuit
JP5654581B2 (en) * 2010-05-07 2015-01-14 Jx日鉱日石金属株式会社 Copper foil for printed circuit, copper-clad laminate, printed circuit board, printed circuit and electronic equipment
JPWO2012002418A1 (en) * 2010-06-30 2013-08-29 三井金属鉱業株式会社 Method for producing copper foil for negative electrode current collector
KR101520813B1 (en) 2010-06-30 2015-05-15 미쓰이금속광업주식회사 Process for production of copper foil for negative electrode current collector
JP5898616B2 (en) * 2010-06-30 2016-04-06 三井金属鉱業株式会社 Method for producing copper foil for negative electrode current collector
WO2012002418A1 (en) * 2010-06-30 2012-01-05 三井金属鉱業株式会社 Process for production of copper foil for negative electrode current collector
WO2012169249A1 (en) * 2011-06-07 2012-12-13 Jx日鉱日石金属株式会社 Liquid crystal polymer-copper clad laminate and copper foil used for liquid crystal polymer-copper clad laminate
JP2012255180A (en) * 2011-06-07 2012-12-27 Jx Nippon Mining & Metals Corp Liquid crystal polymer-copper clad laminate and copper foil used in the laminate
US9060431B2 (en) 2011-06-07 2015-06-16 Jx Nippon Mining & Metals Corporation Liquid crystal polymer copper-clad laminate and copper foil used for said laminate
CN104271813A (en) * 2012-05-11 2015-01-07 Jx日矿日石金属株式会社 Surface-treated copper foil and laminate using same, copper foil, printed wiring board, electronic device, and process for producing printed wiring board
TWI479036B (en) * 2012-05-11 2015-04-01 Jx Nippon Mining & Metals Corp Surface treatment of copper foil and the use of its laminate, copper foil, printed wiring board, electronic equipment, and printed wiring board manufacturing methods
WO2013168646A1 (en) * 2012-05-11 2013-11-14 Jx日鉱日石金属株式会社 Surface-treated copper foil and laminate using same, copper foil, printed wiring board, electronic device, and process for producing printed wiring board
JP5475897B1 (en) * 2012-05-11 2014-04-16 Jx日鉱日石金属株式会社 Surface-treated copper foil and laminate using the same, copper foil, printed wiring board, electronic device, and method for manufacturing printed wiring board
KR20150008482A (en) * 2012-05-11 2015-01-22 제이엑스 닛코 닛세키 킨조쿠 가부시키가이샤 Surface-treated copper foil and laminate using same, copper foil, printed wiring board, electronic device, and process for producing printed wiring board
CN107022774A (en) * 2012-05-11 2017-08-08 Jx日矿日石金属株式会社 Surface treatment copper foil and the manufacture method using its laminated plates, copper foil, printing distributing board, e-machine and printing distributing board
JP2014148742A (en) * 2012-05-11 2014-08-21 Jx Nippon Mining & Metals Corp Copper foil and laminate plate using the same, printed wiring board, electronic apparatus, and method for manufacturing printed wiring board
KR101704892B1 (en) * 2012-05-11 2017-02-08 제이엑스금속주식회사 Surface-treated copper foil and laminate using same, copper foil, printed wiring board, electronic device, and process for producing printed wiring board
CN104364426A (en) * 2012-06-11 2015-02-18 Jx日矿日石金属株式会社 Surface-treated copper foil and laminated sheet, printed wiring board, and electronic device using same, as well as method for producing printed wiring board
KR101751622B1 (en) 2012-06-11 2017-06-27 제이엑스금속주식회사 Surface-treated copper foil and laminated sheet, printed wiring board, and electronic device using same, as well as method for producing printed wiring board
WO2013187420A1 (en) * 2012-06-11 2013-12-19 Jx日鉱日石金属株式会社 Surface-treated copper foil and laminated sheet, printed wiring board, and electronic device using same, as well as method for producing printed wiring board
JP5417538B1 (en) * 2012-06-11 2014-02-19 Jx日鉱日石金属株式会社 Surface-treated copper foil, laminate using the same, printed wiring board, electronic device, and method for manufacturing printed wiring board
WO2017138338A1 (en) * 2016-02-10 2017-08-17 古河電気工業株式会社 Surface-treated copper foil and copper-clad laminate produced using same
JP6248231B1 (en) * 2016-02-10 2017-12-13 古河電気工業株式会社 Surface-treated copper foil and copper-clad laminate produced using the same
KR20180112769A (en) 2016-02-10 2018-10-12 후루카와 덴키 고교 가부시키가이샤 A surface-treated copper foil and a copper clad laminate produced using the same
KR20210015661A (en) * 2019-08-01 2021-02-10 토요잉크Sc홀딩스주식회사 Electromagnetic wave shielding sheet and electromagnetic wave shielding wiring circuit board
KR20210015660A (en) * 2019-08-01 2021-02-10 토요잉크Sc홀딩스주식회사 Electromagnetic wave shielding sheet and electromagnetic wave shielding circuit board
KR102238613B1 (en) * 2019-08-01 2021-04-09 토요잉크Sc홀딩스주식회사 Electromagnetic wave shielding sheet and electromagnetic wave shielding wiring circuit board
KR102238617B1 (en) * 2019-08-01 2021-04-09 토요잉크Sc홀딩스주식회사 Electromagnetic wave shielding sheet and electromagnetic wave shielding circuit board

Similar Documents

Publication Publication Date Title
JP2007332418A (en) Surface treated copper foil
JP4681936B2 (en) Copper foil for plasma display electromagnetic wave shielding filter
CN111989425B (en) Surface-treated copper foil, copper-clad laminate, and printed wiring board
KR100852863B1 (en) Copper foil having blackened surface or layer
US9078353B2 (en) Copper foil structure having blackened ultra-thin foil and manufacturing method thereof
JP5868890B2 (en) Composite double-sided black copper foil and method for producing the same
WO2006001594A1 (en) Method for manufacturing black surface- treated copper foil for emi shield and copper foil the same and the composite material using it
JP2003201597A (en) Copper foil, production method therefor and electromagnetic wave shield body obtained by using the copper foil
JP2008227352A (en) Electromagnetic wave shielding sheet, method for manufacturing the same, and filter for plasma display panel
JP2008166655A (en) Copper foil for electromagnetic shielding material
KR100560672B1 (en) surface treated copper foil and the preparation method thereof
JP4365372B2 (en) Copper foil for electromagnetic shielding filter and electromagnetic shielding filter
JP4867261B2 (en) Electromagnetic wave shielding sheet
JP4867263B2 (en) Electromagnetic wave shielding sheet
JP3869433B2 (en) Method for producing blackened surface-treated copper foil for electromagnetic wave shielding
JP2004253587A (en) Transparent electromagnetic wave shielding composite material and its manufacturing method
JP2004253588A (en) Composite material and its manufacturing method
JP2012184498A (en) Electrolytic copper foil for electromagnetic-wave shielding, and manufacturing method therefor
KR20050022441A (en) surface treated copper foil

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20090512

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120124

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120131

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20120710