JP2007213724A - Method of manufacturing glass substrate for magnetic disk, glass substrate for magnetic disks, and method of manufacturing magnetic disk - Google Patents

Method of manufacturing glass substrate for magnetic disk, glass substrate for magnetic disks, and method of manufacturing magnetic disk Download PDF

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JP2007213724A
JP2007213724A JP2006033967A JP2006033967A JP2007213724A JP 2007213724 A JP2007213724 A JP 2007213724A JP 2006033967 A JP2006033967 A JP 2006033967A JP 2006033967 A JP2006033967 A JP 2006033967A JP 2007213724 A JP2007213724 A JP 2007213724A
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glass substrate
inner diameter
magnetic disk
peripheral end
diameter support
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JP4600931B2 (en
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Jinoobua Pinijji
ジノーブア ピニッジ
Ryuichi Kajima
隆一 鹿島
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Hoya Corp
Hoya Glass Disk Thailand Ltd
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Hoya Glass Disk Thailand Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To perform alignment of a glass substrate at high accuracy, and suppress damage to the glass substrate when an inner, circumferential end face and/or an outer, circumferential end face of a glass substrate for a magnetic disk are/is polished. <P>SOLUTION: The method of manufacturing the glass substrate for the magnetic disk has a substrate preparation step of preparing a circular glass substrate 10 having a circular hole 12 in a central portion, and an end-face polishing step of polishing at least one of an inner, circumferential end face 14 and an outer circumferential end face 16 of the glass substrate 10 while performing alignment of the glass substrate 10 by inserting an inner-diameter supporting rod for supporting inner diameter of the glass substrate 10 into the circular hole 12 of the glass substrate 10, wherein a surface of the inner-diameter supporting rod, which is to be contacted to the inner circumferential end face 14 of the glass substrate, has surface roughness of 5 μm or less in arithmetic mean surface roughness Ra. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、磁気ディスク用ガラス基板の製造方法、磁気ディスク用ガラス基板、及び磁気ディスクの製造方法に関する。   The present invention relates to a method for manufacturing a glass substrate for a magnetic disk, a glass substrate for a magnetic disk, and a method for manufacturing a magnetic disk.

近年、磁気ディスク用の基板としてガラス基板が用いられている。このガラス基板としては、例えば、中心部に円孔を有する円板状の基板が用いられる。また、従来、サーマル・アスペリティ(Thermal Asperity)の防止を目的として、このようなガラス基板の内周端面及び/又は外周端面を研磨する方法が知られている(例えば、特許文献1、2参照。)。
特開平11−221742号公報 特開2000−185927号公報
In recent years, glass substrates have been used as substrates for magnetic disks. As this glass substrate, for example, a disk-shaped substrate having a circular hole in the center is used. Conventionally, a method of polishing the inner peripheral end face and / or the outer peripheral end face of such a glass substrate for the purpose of preventing thermal asperity (see, for example, Patent Documents 1 and 2). ).
JP-A-11-221742 JP 2000-185927 A

近年、磁気記録ディスクの記録密度の用途の多様化に伴い、磁気ディスク用ガラス基板に対して、従来とは異なるレベルでの高い品質が求められている。そのため、例えば端面の傷(ヒビ、カケ等)についても、従来は不良と認識されていなかった程度のものが不良と認識されるようになってきた。   In recent years, with the diversification of applications of the recording density of magnetic recording disks, high quality at a level different from the conventional level is required for glass substrates for magnetic disks. For this reason, for example, with respect to scratches (cracks, cracks, etc.) on the end face, those that have not been recognized as defective in the past have been recognized as defective.

特に、例えば回転数5400rpm以上等の高速回転型の磁気ディスクや、携帯端末等の使用時に衝撃を受けやすい用途に用いられる磁気ディスクにおいては、使用時に傷が拡大するおそれもあるため、より小さな傷が問題になる。また、例えば2.5インチ径以下等の小径の磁気ディスクにおいては、ガラス基板が薄型化している。ガラス基板が薄型化した場合、より小さな傷が原因となってガラス基板の割れ等が生じる場合もあるため、より小さな傷が問題になる。更には、磁気ディスクのコストを低減するために工程の簡略化を行う場合等には、例えば化学強化工程等のガラス基板を強化する工程が省略される可能性もある。化学強化工程を省略する場合、ガラス基板の強化がなされていないため、より小さな傷が問題になる。   In particular, in a high-speed rotation type magnetic disk having a rotation speed of 5400 rpm or more, or in a magnetic disk used for an application that is susceptible to an impact when using a portable terminal or the like, there is a possibility that the damage may be enlarged during use. Is a problem. For example, in a small-diameter magnetic disk having a diameter of 2.5 inches or less, the glass substrate is thinned. When the glass substrate is thinned, the glass substrate may be cracked due to a smaller scratch, and therefore a smaller scratch becomes a problem. Furthermore, when the process is simplified in order to reduce the cost of the magnetic disk, a process of strengthening the glass substrate such as a chemical strengthening process may be omitted. When the chemical strengthening step is omitted, since the glass substrate is not strengthened, smaller scratches become a problem.

また、近年、磁気ディスクの記録密度の高密度化に伴い、ガラス基板の内周端面及び/又は外周端面を研磨する場合の位置合わせ精度に対する要求精度が高精度化している。高精度なガラス基板の位置合わせが可能な方法としては、例えば、ガラス基板の内径を基準に位置決めを行う方法が考えられる。この方法では、例えば、ガラス基板の内径を支持する内径支持棒をガラス基板の円孔に挿入することにより、ガラス基板の位置を合わせる。しかし、この方法でガラス基板の位置を合わせる場合、内径支持棒の挿入時にガラス基板の内周端面が内径支持棒に引っかかり、ガラス基板の内周端面に傷が生じるおそれがある。   In recent years, with the increase in the recording density of magnetic disks, the required accuracy with respect to alignment accuracy when polishing the inner peripheral end surface and / or outer peripheral end surface of the glass substrate has been increased. As a method capable of positioning the glass substrate with high accuracy, for example, a method of positioning based on the inner diameter of the glass substrate can be considered. In this method, for example, an inner diameter support rod that supports the inner diameter of the glass substrate is inserted into a circular hole of the glass substrate, thereby aligning the position of the glass substrate. However, when aligning the position of the glass substrate by this method, the inner peripheral end surface of the glass substrate may be caught by the inner diameter support rod when the inner diameter support rod is inserted, and the inner peripheral end surface of the glass substrate may be damaged.

本発明は、上記の課題を解決できる、磁気ディスク用ガラス基板の製造方法、磁気ディスク用ガラス基板、及び磁気ディスクの製造方法を提供することを目的とする。   An object of this invention is to provide the manufacturing method of the glass substrate for magnetic discs, the glass substrate for magnetic discs, and the manufacturing method of a magnetic disc which can solve said subject.

以上のような背景から、本願発明者は、ガラス基板の傷がより生じにくい方法で、高精度なガラス基板の位置合わせを行う方法を鋭意研究した。本発明は、上記鋭意研究の結果なされたものであり、以下の構成を有する。
(構成1)磁気ディスク用ガラス基板の製造方法であって、中心部に円孔を有する円板状のガラス基板を準備する基板準備工程と、ガラス基板の内径を支持する内径支持棒をガラス基板の円孔に挿入することにより、ガラス基板の位置合わせを行い、ガラス基板の内周端面及び外周端面の少なくとも一方を研磨する端面研磨工程とを備え、ガラス基板の内周端面と接触すべき内径支持棒の表面は、表面粗さが算術平均表面粗さRaで5μm以下である。
From the background as described above, the inventor of the present application diligently studied a method for aligning a glass substrate with high accuracy by a method in which the glass substrate is less likely to be damaged. This invention is made | formed as a result of the said earnest research, and has the following structures.
(Structure 1) A method of manufacturing a glass substrate for a magnetic disk, comprising: a substrate preparation step for preparing a disk-shaped glass substrate having a circular hole in the center; and an inner diameter support rod for supporting the inner diameter of the glass substrate. The glass substrate is aligned by inserting into the circular hole, and an end surface polishing step for polishing at least one of the inner peripheral end surface and the outer peripheral end surface of the glass substrate, and an inner diameter to be in contact with the inner peripheral end surface of the glass substrate The surface of the support rod has a surface roughness of 5 μm or less in terms of arithmetic average surface roughness Ra.

このようにすれば、ガラス基板の内周端面と内径支持棒との当接により、高精度でガラス基板の位置合わせができる。これにより、ガラス基板の内周端面及び/又は外周端面を高い精度で研磨できる。端面研磨工程は、例えば、内径支持棒が挿入された状態で保持されたガラス基板の外周端面を鏡面研磨する。また、端面研磨工程は、例えば、ガラス基板の位置合わせを行った後に内径支持棒を円孔から抜き取り、内周端面を鏡面研磨する。   In this way, the glass substrate can be aligned with high accuracy by the contact between the inner peripheral end face of the glass substrate and the inner diameter support rod. Thereby, the inner peripheral end surface and / or outer peripheral end surface of the glass substrate can be polished with high accuracy. In the end surface polishing step, for example, the outer peripheral end surface of the glass substrate held with the inner diameter support bar inserted is mirror-polished. In the end surface polishing step, for example, after aligning the glass substrate, the inner diameter support rod is extracted from the circular hole, and the inner peripheral end surface is mirror-polished.

また、内径支持棒の表面の表面粗さが小さく、摩擦係数が小さいため、内径支持棒を円孔に挿入する場合に引っかかり等が生じにくい。そのため、内径支持棒の挿入時にガラス基板の内周端面に傷が生じることもない。そのため、構成1のようにすれば、ガラス基板の傷の発生を適切に抑えることができる。また、内径支持棒とガラス基板の内周端面との接触による発塵を防ぐこともできる。従って、構成1のようにすれば、磁気ディスク用ガラス基板の製造歩留まりを大きく向上させることができる。   Moreover, since the surface roughness of the surface of the inner diameter support rod is small and the friction coefficient is small, it is difficult to cause catching or the like when the inner diameter support rod is inserted into the circular hole. Therefore, the inner peripheral end face of the glass substrate is not damaged when the inner diameter support rod is inserted. Therefore, if it is made like the structure 1, generation | occurrence | production of the damage | wound of a glass substrate can be suppressed appropriately. Further, dust generation due to contact between the inner diameter support bar and the inner peripheral end surface of the glass substrate can be prevented. Therefore, with the configuration 1, the production yield of the magnetic disk glass substrate can be greatly improved.

内径支持棒の表面は、例えば金属等と比べて熱膨張係数の小さな材料で形成されるのが好ましい。内径支持棒の表面の熱膨張係数は、研磨時に内径支持棒近傍が到達する温度範囲内で、例えば、10×10−/℃以下、より好ましくは7.5×10−/℃以下である。内径支持棒の表面の熱膨張係数が大きい場合、研磨時に生じる熱によって内径支持棒が膨張して、ガラス基板の内周端面を押圧するおそれがある。内径支持棒がガラス基板の内周端面を押圧すれば、内周端面にある微小な傷が拡大されたり、新たな傷が発生するおそれがある。しかし、上記のような熱膨張係数の小さな材料で内径支持棒の表面を形成すれば、内周端面が押圧されるおそれもない。また、これにより、内周端面の傷の拡大や新たな傷の発生を防ぐことができる。 The surface of the inner diameter support rod is preferably formed of a material having a smaller coefficient of thermal expansion than, for example, metal. Thermal expansion coefficient of the surface of the inner diameter support rod, within the temperature range inside diameter support rod near reaches during polishing, for example, 10 × 10- 6 / ℃ less, more preferably 7.5 × 10- 6 / ℃ below is there. When the coefficient of thermal expansion of the surface of the inner diameter support bar is large, the inner diameter support bar may expand due to heat generated during polishing, and may press the inner peripheral end surface of the glass substrate. If the inner diameter support bar presses the inner peripheral end face of the glass substrate, there is a possibility that minute scratches on the inner peripheral end face are enlarged or new scratches are generated. However, if the surface of the inner diameter support rod is formed of a material having a small coefficient of thermal expansion as described above, there is no possibility that the inner peripheral end face is pressed. Thereby, the expansion | swelling of the damage | wound of an inner peripheral end surface and generation | occurrence | production of a new damage | wound can be prevented.

尚、この磁気ディスク用ガラス基板は、例えば2.5インチ径、又は1.8インチ径、1インチ径等の2.5インチ径未満等の磁気ディスク用ガラス基板であることが好ましい。このような小径の磁気ディスク用ガラス基板においては、円孔の大きさも小さくなる。また、要求される位置精度も高くなるため、内径支持棒と内周端面との間に確保できる隙間(公差)も小さくなる。そのため、内径支持棒の表面が荒れているとすれば、内径支持棒の挿入時にガラス基板の内周端面に傷が生じやすいこととなる。しかし、構成1のようにすれば、内径支持棒の挿入時の傷の発生を適切に抑えることができる。   The glass substrate for magnetic disk is preferably a glass substrate for magnetic disk having a diameter of 2.5 inches, a diameter of 1.8 inches, a diameter of less than 2.5 inches such as 1 inch, and the like. In such a small-diameter glass substrate for a magnetic disk, the size of the circular hole is also reduced. Further, since the required positional accuracy is also increased, the clearance (tolerance) that can be secured between the inner diameter support rod and the inner peripheral end surface is reduced. Therefore, if the surface of the inner diameter support rod is rough, the inner peripheral end surface of the glass substrate is likely to be damaged when the inner diameter support rod is inserted. However, with the configuration 1, it is possible to appropriately suppress the occurrence of scratches when inserting the inner diameter support rod.

また、この磁気ディスク用ガラス基板は、例えば、携帯端末等(例えば携帯音楽プレーヤ、ノートパソコン等)の使用時に衝撃を受けやすい用途に用いられる磁気ディスク用ガラス基板であることが好ましい。この磁気ディスク用ガラス基板は、例えば化学強化工程を行わずに製造されてもよい。これらの場合も、ガラス基板の傷の発生を適切に抑えることにより、必要な品質を満たすことができる。また、この磁気ディスク用ガラス基板は、例えば磁気抵抗型ヘッド(MRヘッド)、大型磁気記録型ヘッド(GMRヘッド)用の磁気ディスク用ガラス基板であってもよい。垂直磁気記録ディスク用の磁気ディスク用ガラス基板であってもよい。   Further, the glass substrate for magnetic disk is preferably a glass substrate for magnetic disk that is used for applications that are susceptible to impact when using a portable terminal or the like (for example, a portable music player, a notebook computer, etc.). This glass substrate for magnetic disks may be manufactured without performing a chemical strengthening process, for example. In these cases as well, necessary quality can be satisfied by appropriately suppressing the occurrence of scratches on the glass substrate. The magnetic disk glass substrate may be a magnetic disk glass substrate for a magnetoresistive head (MR head) or a large magnetic recording head (GMR head), for example. It may be a glass substrate for a magnetic disk for a perpendicular magnetic recording disk.

また、この磁気ディスク用ガラス基板は、回転数5400rpm以上の磁気ディスク用ガラス基板であることが好ましい。回転数が高い磁気ディスクにおいては、ガラス基板のより小さな傷が問題になるおそれがある。しかし、構成1のようにすれば、ガラス基板の傷の発生を適切に抑えることができる。また、これにより、磁気ディスクの信頼性を高めることができる。   The magnetic disk glass substrate is preferably a magnetic disk glass substrate having a rotational speed of 5400 rpm or more. In a magnetic disk having a high rotational speed, a smaller scratch on the glass substrate may cause a problem. However, if it is made the structure 1, the generation | occurrence | production of the damage | wound of a glass substrate can be suppressed appropriately. Thereby, the reliability of the magnetic disk can be improved.

また、基板準備工程は、例えば、厚さ0.635mm以下に研磨されるべきガラス基板を準備する。ガラス基板が薄厚である場合、ガラス基板のより小さな傷が問題になるおそれがある。しかし、構成1のようにすれば、ガラス基板の傷の発生を適切に抑えることができる。ガラス基板の研磨されるべき厚さとは、例えば、磁気ディスク用ガラス基板として完成した時点(例えば出荷時)の厚さである。   In the substrate preparation step, for example, a glass substrate to be polished to a thickness of 0.635 mm or less is prepared. If the glass substrate is thin, smaller scratches on the glass substrate may become a problem. However, if it is made the structure 1, the generation | occurrence | production of the damage | wound of a glass substrate can be suppressed appropriately. The thickness to be polished of the glass substrate is, for example, the thickness when the glass substrate for a magnetic disk is completed (for example, at the time of shipment).

(構成2)磁気ディスク用ガラス基板の製造方法であって、中心部に円孔を有する円板状のガラス基板を準備する基板準備工程と、ガラス基板の内径を支持する内径支持棒をガラス基板の円孔に挿入することにより、ガラス基板の位置合わせを行い、ガラス基板の内周端面及び外周端面の少なくとも一方を研磨する端面研磨工程とを備え、ガラス基板の内周端面と接触すべき内径支持棒の表面は、セラミックで形成されている。   (Configuration 2) A method of manufacturing a glass substrate for a magnetic disk, comprising: a substrate preparing step for preparing a disk-shaped glass substrate having a circular hole in the center; and an inner diameter support rod for supporting the inner diameter of the glass substrate. The glass substrate is aligned by inserting into the circular hole, and an end surface polishing step for polishing at least one of the inner peripheral end surface and the outer peripheral end surface of the glass substrate, and an inner diameter to be in contact with the inner peripheral end surface of the glass substrate The surface of the support bar is made of ceramic.

このようにすれば、内径支持棒の表面の表面粗さを適切に低減できる。また、内径支持棒の表面の摩擦係数を適切に低減することができる。そのため、ガラス基板の傷の発生を適切に抑えることができる。また、内径支持棒とガラス基板の内周端面との接触による発塵を防ぐこともできる。従って、構成2のようにすれば、磁気ディスク用ガラス基板の製造歩留まりを大きく向上させることができる。   In this way, the surface roughness of the surface of the inner diameter support rod can be appropriately reduced. Further, the friction coefficient of the surface of the inner diameter support rod can be appropriately reduced. Therefore, generation | occurrence | production of the damage | wound of a glass substrate can be suppressed appropriately. Further, dust generation due to contact between the inner diameter support bar and the inner peripheral end surface of the glass substrate can be prevented. Therefore, with the configuration 2, the production yield of the magnetic disk glass substrate can be greatly improved.

(構成3)内径支持棒の表面は、表面粗さが算術平均表面粗さRaで5μm以下である。このようにすれば、構成1と同様の効果を得ることができる。   (Configuration 3) The surface of the inner diameter support rod has an arithmetic average surface roughness Ra of 5 μm or less in surface roughness. In this way, the same effect as in Configuration 1 can be obtained.

(構成4)内径支持棒の表面の摩擦係数は、0.5以下である。このようにすれば、ガラス基板の傷の発生を更に適切に抑えることができる。   (Configuration 4) The coefficient of friction of the surface of the inner diameter support rod is 0.5 or less. In this way, the generation of scratches on the glass substrate can be suppressed more appropriately.

(構成5)内径支持棒の表面は、ガラス基板を構成するガラスよりも硬度の高い材料で形成されている。このようにすれば、内径支持棒の表面が傷つくのを適切に防ぐことができる。   (Configuration 5) The surface of the inner diameter support rod is formed of a material having higher hardness than the glass constituting the glass substrate. In this way, it is possible to appropriately prevent the surface of the inner diameter support bar from being damaged.

(構成6)内径支持棒の表面は、酸化アルミニウム又は酸化クロムを主成分とするセラミックで形成されている。このようにすれば、内径支持棒の表面の表面粗さを適切に低減できる。また、内径支持棒の表面の摩擦係数を適切に低減することができる。更には、内径支持棒の表面の耐食性、耐酸化性、耐摩耗性、耐焼付性を高めることができる。   (Configuration 6) The surface of the inner diameter support rod is formed of a ceramic mainly composed of aluminum oxide or chromium oxide. In this way, the surface roughness of the surface of the inner diameter support rod can be appropriately reduced. Further, the friction coefficient of the surface of the inner diameter support rod can be appropriately reduced. Furthermore, the corrosion resistance, oxidation resistance, wear resistance, and seizure resistance of the surface of the inner diameter support rod can be improved.

(構成7)内径支持棒は、金属の棒状部と、棒状部の表面にセラミックコーティングされたセラミック部とを備える。このようにすれば、内径支持棒の表面の表面粗さを低減し、かつ摩擦係数を低減しつつ、内径支持棒の剛性を高めることができる。また、例えば内径支持棒の全体をセラミックで形成する場合等と比べ、内径支持棒を高い寸法精度で形成できる。   (Configuration 7) The inner diameter support rod includes a metal rod-shaped portion and a ceramic portion whose surface is ceramic-coated. In this way, the rigidity of the inner diameter support bar can be increased while reducing the surface roughness of the inner diameter support bar and reducing the friction coefficient. Further, for example, the inner diameter support bar can be formed with higher dimensional accuracy than when the entire inner diameter support bar is made of ceramic.

(構成8)構成1から7の何れか1の構成に記載の磁気ディスク用ガラス基板の製造方法で製造されたことを特徴とする磁気ディスク用ガラス基板。このように構成すれば、構成1から7と同様の効果を得ることができる。   (Structure 8) A magnetic disk glass substrate manufactured by the method for manufacturing a magnetic disk glass substrate according to any one of structures 1 to 7. If comprised in this way, the effect similar to the structures 1-7 can be acquired.

(構成9)構成8に記載の磁気ディスク用ガラス基板上に少なくとも磁気記録層を形成することを特徴とする磁気ディスクの製造方法。このようにすれば、構成8と同様の効果を得ることはできる。また、サーマル・アスペリティを適切に防止できる。   (Structure 9) A method of manufacturing a magnetic disk, wherein at least a magnetic recording layer is formed on the magnetic disk glass substrate according to Structure 8. In this way, the same effect as in the configuration 8 can be obtained. Moreover, thermal asperity can be prevented appropriately.

本発明によれば、磁気ディスク用ガラス基板の内周端面及び/又は外周端面を研磨する場合に、高精度でガラス基板の位置合わせができる。また、ガラス基板の傷の発生を適切に抑えることができる。   ADVANTAGE OF THE INVENTION According to this invention, when grind | polishing the inner peripheral end surface and / or outer peripheral end surface of the glass substrate for magnetic discs, position alignment of a glass substrate can be performed with high precision. Moreover, generation | occurrence | production of the damage | wound of a glass substrate can be suppressed appropriately.

以下、本発明に係る実施形態を、図面を参照しながら説明する。
図1は、本発明の一実施形態に係るガラス基板10を切断してみたときの斜視図である。ガラス基板10は、例えば2.5インチ径の磁気ディスク用ガラス基板であり、中心部を貫通する円孔12を有する。ガラス基板10において、主表面、内周端面14、及び外周端面16は、鏡面研磨されている。内周端面14及び外周端面16は、面取りした面取り部と、側壁部とをそれぞれ含む。
Hereinafter, embodiments according to the present invention will be described with reference to the drawings.
FIG. 1 is a perspective view when a glass substrate 10 according to an embodiment of the present invention is cut. The glass substrate 10 is a glass substrate for a magnetic disk having a diameter of 2.5 inches, for example, and has a circular hole 12 penetrating the center. In the glass substrate 10, the main surface, the inner peripheral end face 14, and the outer peripheral end face 16 are mirror-polished. The inner peripheral end surface 14 and the outer peripheral end surface 16 each include a chamfered chamfered portion and a side wall portion.

また、ガラス基板10は、回転数5400rpm以上(例えば7200rpm、10000rpm以上等)の磁気ディスク用ガラス基板である。ガラス基板10の厚さは、0.635mm以下(例えば0.2〜0.6mm)、より好ましくは0.3〜0.55mm、更に好ましくは、0.4〜0.51mm(例えば0.508mm程度)である。   The glass substrate 10 is a glass substrate for a magnetic disk having a rotational speed of 5400 rpm or more (for example, 7200 rpm, 10000 rpm or more). The thickness of the glass substrate 10 is 0.635 mm or less (for example, 0.2 to 0.6 mm), more preferably 0.3 to 0.55 mm, and still more preferably 0.4 to 0.51 mm (for example, 0.508 mm). Degree).

以下、ガラス基板10の製造方法について更に詳しく説明する。本例のガラス基板10は、基板準備工程、内周端面研磨工程、外周端面研磨工程、主表面研磨工程、及び化学強化工程を経て製造される。内周端面研磨工程及び外周端面研磨工程は、端面研磨工程の一例である。   Hereinafter, the manufacturing method of the glass substrate 10 will be described in more detail. The glass substrate 10 of this example is manufactured through a substrate preparation step, an inner peripheral end surface polishing step, an outer peripheral end surface polishing step, a main surface polishing step, and a chemical strengthening step. The inner peripheral end surface polishing step and the outer peripheral end surface polishing step are examples of the end surface polishing step.

基板準備工程は、中心部に円孔12を有する円板状のガラス基板10を準備する工程である。基板準備工程は、例えば、研削及び所定の粗さへのラッピング加工がなされたガラス基板10を準備する。   The substrate preparation step is a step of preparing a disk-shaped glass substrate 10 having a circular hole 12 in the center. In the substrate preparation step, for example, the glass substrate 10 that has been ground and lapped to a predetermined roughness is prepared.

内周端面研磨工程は、ガラス基板10の内周端面14を鏡面研磨する工程である。鏡面研磨された内周端面14の算術平均表面粗さRaは、0.5μm以下、より好ましくは0.4μm以下、更に好ましくは0.3μm以下である。また、鏡面研磨された内周端面14の最大高さRmaxは、0.5μm以下、より好ましくは0.4μm以下、更に好ましくは0.3μm以下である。尚、算術平均表面粗さRa及び最大高さRmaxは、例えば、それぞれ日本工業規格JISB0601の算術平均表面粗さRa及び最大高さRmaxに準拠して算出される。   The inner peripheral end surface polishing step is a step of mirror polishing the inner peripheral end surface 14 of the glass substrate 10. The arithmetic average surface roughness Ra of the mirror-polished inner peripheral end face 14 is 0.5 μm or less, more preferably 0.4 μm or less, and still more preferably 0.3 μm or less. Further, the maximum height Rmax of the inner peripheral end face 14 subjected to mirror polishing is 0.5 μm or less, more preferably 0.4 μm or less, and still more preferably 0.3 μm or less. The arithmetic average surface roughness Ra and the maximum height Rmax are calculated based on, for example, the arithmetic average surface roughness Ra and the maximum height Rmax of the Japanese Industrial Standard JIS B0601, respectively.

外周端面研磨工程は、ガラス基板10の外周端面16を鏡面研磨する工程である。鏡面研磨された外周端面16の算術平均表面粗さRaは、0.5μm以下、より好ましくは0.4μm以下、更に好ましくは0.3μm以下である。また、鏡面研磨された外周端面16の最大高さRmaxは、0.5μm以下、より好ましくは0.4μm以下、更に好ましくは0.3μm以下である。   The outer peripheral end surface polishing step is a step of mirror polishing the outer peripheral end surface 16 of the glass substrate 10. The arithmetic average surface roughness Ra of the outer peripheral end face 16 subjected to mirror polishing is 0.5 μm or less, more preferably 0.4 μm or less, and still more preferably 0.3 μm or less. Further, the maximum height Rmax of the outer peripheral end face 16 subjected to mirror polishing is 0.5 μm or less, more preferably 0.4 μm or less, and still more preferably 0.3 μm or less.

主表面研磨工程は、ガラス基板10の主表面を鏡面研磨する工程である。鏡面研磨された主表面の算術平均表面粗さRaは、0.5nm以下、より好ましくは0.4nm以下、更に好ましくは0.3nm以下である。また、鏡面研磨された主表面の最大高さRmaxは、5nm以下、より好ましくは4nm以下、更に好ましくは3nm以下である。化学強化工程は、ガラス基板10を化学強化する工程である。   The main surface polishing step is a step of mirror polishing the main surface of the glass substrate 10. The arithmetic average surface roughness Ra of the mirror-polished main surface is 0.5 nm or less, more preferably 0.4 nm or less, and still more preferably 0.3 nm or less. The maximum height Rmax of the mirror-polished main surface is 5 nm or less, more preferably 4 nm or less, and still more preferably 3 nm or less. The chemical strengthening step is a step of chemically strengthening the glass substrate 10.

尚、主表面研磨工程及び化学強化工程は、例えば公知の主表面研磨工程及び化学強化工程と同一又は同様の方法により行うことができる。また、ガラス基板10の製造コストを低減するためには、上記の化学強化工程を省略することも考えられる。   The main surface polishing step and the chemical strengthening step can be performed, for example, by the same or similar method as the known main surface polishing step and the chemical strengthening step. Moreover, in order to reduce the manufacturing cost of the glass substrate 10, it is also conceivable to omit the chemical strengthening step.

以上の工程を経て、ガラス基板10は完成する。そして、完成したガラス基板10は、磁気ディスクの製造に用いられる。磁気ディスクの製造工程においては、ガラス基板10上に少なくとも磁気記録層が形成される。   The glass substrate 10 is completed through the above steps. The completed glass substrate 10 is used for manufacturing a magnetic disk. In the magnetic disk manufacturing process, at least a magnetic recording layer is formed on the glass substrate 10.

図2は、内周端面研磨工程を説明する図である。図2(a)は、内周研磨工程におけるガラス基板10の位置合わせの方法の一例を示す。本例において、内周端面研磨工程は、積層された複数のガラス基板10の内周端面14を同時に研磨する。また、積層された複数のガラス基板10の位置を合わせるために、丸棒状の内径支持棒20が用いられる。   FIG. 2 is a diagram illustrating an inner peripheral end face polishing step. Fig.2 (a) shows an example of the method of alignment of the glass substrate 10 in an inner periphery grinding | polishing process. In this example, the inner peripheral end face polishing step simultaneously polishes the inner peripheral end faces 14 of the plurality of laminated glass substrates 10. Further, in order to align the positions of the plurality of laminated glass substrates 10, a round bar-shaped inner diameter support bar 20 is used.

内周端面研磨工程は、最初に、積層されたガラス基板10の円孔12に内径支持棒20を挿入することによりガラス基板10の位置合わせを行う。そして、円孔12に内径支持棒20が挿入された状態の複数のガラス基板10を基板ホルダー(図示せず)に設置して固定する。これにより、複数のガラス基板10を位置合わせがなされた状態で保持できる。そして、基板ホルダーに保持されている複数のガラス基板10の円孔12から内径支持棒20を抜き取る。尚、内周端面14の鏡面研磨を行う前の円孔12の径と、内径支持棒20の断面の径との差は、例えば0.01〜0.06mmである。このようにすれば、ガラス基板10の位置合わせを高い精度で行うことができる。   In the inner peripheral end face polishing step, first, the glass substrate 10 is aligned by inserting the inner diameter support rod 20 into the circular holes 12 of the laminated glass substrates 10. Then, the plurality of glass substrates 10 with the inner diameter support rods 20 inserted into the circular holes 12 are installed and fixed to a substrate holder (not shown). Thereby, the some glass substrate 10 can be hold | maintained in the state by which alignment was made. Then, the inner diameter support rod 20 is extracted from the circular holes 12 of the plurality of glass substrates 10 held by the substrate holder. The difference between the diameter of the circular hole 12 before mirror polishing of the inner peripheral end face 14 and the diameter of the cross section of the inner diameter support rod 20 is, for example, 0.01 to 0.06 mm. In this way, alignment of the glass substrate 10 can be performed with high accuracy.

内周端面研磨工程は、続いて、基板ホルダーに保持された複数のガラス基板10を研磨装置内に設置して、ガラス基板10の内周端面14に研磨液を供給する。そして、円孔12に回転ブラシ又は研磨パッドを挿入し、ガラス基板10の内周端面14を鏡面研磨する。尚、回転ブラシを用いて研磨を行う場合、研磨液を、例えば35℃程度(例えば30〜40℃程度)に温度制御するのが好ましい。このようにすれば、回転ブラシを長寿命化できる。また、研磨のムラを低減できる。   In the inner peripheral end surface polishing step, the plurality of glass substrates 10 held by the substrate holder are subsequently installed in the polishing apparatus, and the polishing liquid is supplied to the inner peripheral end surface 14 of the glass substrate 10. Then, a rotating brush or a polishing pad is inserted into the circular hole 12, and the inner peripheral end face 14 of the glass substrate 10 is mirror-polished. When polishing is performed using a rotating brush, the temperature of the polishing liquid is preferably controlled to about 35 ° C. (for example, about 30 to 40 ° C.). In this way, the life of the rotating brush can be extended. Further, uneven polishing can be reduced.

ここで、内径支持棒20の構成について更に詳しく説明する。図2(b)は、内周端面研磨工程で用いられる内径支持棒20の構成を示す断面図である。本例において、内径支持棒20は、金属の棒状部30と、棒状部30の表面にセラミックコーティングされたセラミック部32とを備える。棒状部30を構成する金属としては、例えばステンレス、アルミニウム、又は鉄等を用いることができる。棒状部30は、金属の筒状体であってよい。また、内径支持棒20の表面に形成されるセラミック部32は、酸化アルミニウム又は酸化クロムを主成分とするセラミックで形成されている。セラミック部32の厚さは、5μm以上であることが好ましい。セラミック部32は、例えば溶射法により棒状部30の表面に形成される。   Here, the configuration of the inner diameter support rod 20 will be described in more detail. FIG. 2B is a cross-sectional view showing the configuration of the inner diameter support rod 20 used in the inner peripheral end surface polishing step. In this example, the inner diameter support rod 20 includes a metal rod-shaped portion 30 and a ceramic portion 32 that is ceramic-coated on the surface of the rod-shaped portion 30. As the metal constituting the rod-shaped part 30, for example, stainless steel, aluminum, iron or the like can be used. The rod-shaped part 30 may be a metal cylindrical body. The ceramic portion 32 formed on the surface of the inner diameter support rod 20 is formed of a ceramic mainly composed of aluminum oxide or chromium oxide. The thickness of the ceramic part 32 is preferably 5 μm or more. The ceramic part 32 is formed on the surface of the rod-like part 30 by, for example, a thermal spraying method.

また、セラミック部32の表面は、表面粗さが算術平均表面粗さRaで5μm以下、好ましくは1μm以下であり、摩擦係数が0.5以下、好ましくは0.15以下である。このように構成すれば、内径支持棒20の表面の表面粗さが小さく、摩擦係数が小さいため、内径支持棒20を円孔12に挿入する場合に引っかかり等が生じにくい。そのため、内径支持棒20の挿入時にガラス基板10の内周端面14に傷が生じることもない。そのため、ガラス基板10の傷の発生を適切に抑えることができる。また、内径支持棒20とガラス基板10の内周端面14との接触による発塵を防ぐこともできる。   The surface of the ceramic portion 32 has an arithmetic average surface roughness Ra of 5 μm or less, preferably 1 μm or less, and a friction coefficient of 0.5 or less, preferably 0.15 or less. If comprised in this way, since the surface roughness of the surface of the internal diameter support rod 20 is small and a friction coefficient is small, when the internal diameter support rod 20 is inserted in the circular hole 12, it is hard to produce a catch. Therefore, the inner peripheral end face 14 of the glass substrate 10 is not damaged when the inner diameter support rod 20 is inserted. Therefore, generation | occurrence | production of the damage | wound of the glass substrate 10 can be suppressed appropriately. Further, dust generation due to contact between the inner diameter support rod 20 and the inner peripheral end face 14 of the glass substrate 10 can be prevented.

また、内径支持棒20の表面は、例えばガラス基板を構成するガラスよりも硬度の高い材料で形成されるのが好ましい。内径支持棒20の表面の硬度が低いと、取り扱い時の衝撃等によって傷が生じ、ガラス基板10の内周端面との引っかかり等の原因となる。しかし、上記のような硬度の高い材料で内径支持棒の表面を形成すれば、内径支持棒20の表面が傷つくのを適切に防ぐことができる。   Moreover, it is preferable that the surface of the inner diameter support rod 20 is formed of a material having a hardness higher than that of the glass constituting the glass substrate, for example. If the hardness of the surface of the inner diameter support bar 20 is low, scratches may occur due to impacts during handling and the like, which may cause catching on the inner peripheral end surface of the glass substrate 10. However, if the surface of the inner diameter support bar is formed of a material having high hardness as described above, the surface of the inner diameter support bar 20 can be appropriately prevented from being damaged.

尚、酸化アルミニウムを主成分とするセラミックとは、例えば、Alを80%以上、より好ましくは90%以上、更に好ましくは98%以上含むセラミックである。酸化クロムを主成分とするセラミックとは、例えば、Crを80%以上、より好ましくは90%以上、更に好ましくは98%以上含むセラミックである。 The ceramic mainly composed of aluminum oxide is, for example, a ceramic containing Al 2 O 3 of 80% or more, more preferably 90% or more, and still more preferably 98% or more. The ceramic containing chromium oxide as a main component is, for example, a ceramic containing 80% or more of Cr 2 O 3 , more preferably 90% or more, and still more preferably 98% or more.

内径支持棒20の表面の表面粗さは、算術平均表面粗さRaで、5μm以下、好ましくは1μm以下である。摩擦係数は、0.5以下、好ましくは0.15以下である。内径支持棒20の表面の硬さは、例えば、ビッカース硬さHVで500以上、より好ましくは1000以上、更に好ましくは2000以上である。   The surface roughness of the inner diameter support rod 20 is 5 μm or less, preferably 1 μm or less, in terms of arithmetic average surface roughness Ra. The coefficient of friction is 0.5 or less, preferably 0.15 or less. The hardness of the surface of the inner diameter support bar 20 is, for example, 500 or more, more preferably 1000 or more, and still more preferably 2000 or more in terms of Vickers hardness HV.

図3は、外周端面研磨工程を説明する図である。図3(a)は、外周研磨工程におけるガラス基板10の位置合わせの方法の一例を示す。外周端面研磨工程は、積層された複数のガラス基板10の外周端面16を同時に研磨する。また、積層された複数のガラス基板10の位置を合わせるために、丸棒状の内径支持棒22が用いられる。図3(b)は、外周端面研磨工程で用いられる内径支持棒22の構成を示す断面図である。尚、以下に説明する点を除き、内径支持棒22は、内径支持棒20(図2参照)と同一又は同様の構成を有する。また、内径支持棒22の棒状部34及びセラミック部36は、内径支持棒20の棒状部30及びセラミック部32(図2参照)と同一又は同様の構成を有する。   FIG. 3 is a diagram for explaining the outer peripheral end face polishing step. Fig.3 (a) shows an example of the method of alignment of the glass substrate 10 in an outer periphery grinding | polishing process. In the outer peripheral end surface polishing step, the outer peripheral end surfaces 16 of the plurality of laminated glass substrates 10 are simultaneously polished. Moreover, in order to align the position of the laminated | stacked several glass substrate 10, the round-bar-shaped internal diameter support bar 22 is used. FIG. 3B is a cross-sectional view showing the configuration of the inner diameter support rod 22 used in the outer peripheral end surface polishing step. Except for the points described below, the inner diameter support bar 22 has the same or similar configuration as the inner diameter support bar 20 (see FIG. 2). Further, the rod-shaped portion 34 and the ceramic portion 36 of the inner diameter support rod 22 have the same or similar configurations as the rod-shaped portion 30 and the ceramic portion 32 (see FIG. 2) of the inner diameter support rod 20.

本例において、外周端面研磨工程は、最初に、積層されたガラス基板10の円孔12に内径支持棒22を挿入する。これにより、複数のガラス基板10の位置が合わせられる。そして、複数のガラス基板10の円孔12を通り抜けた内径支持棒22の先端にかしめ部材24を取り付け、複数のガラス基板10をかしめて固定する。このようにすれば、複数のガラス基板10を高い精度で固定できる。外周端面研磨工程の時点において、ガラス基板10の円孔12の径と、内径支持棒22の断面の径との差は、例えば0.02〜0.07mmである。このようにすれば、ガラス基板10の位置合わせを高い精度で行うことができる。また、本例のように、外周端面研磨工程を内周端面研磨工程よりも後で行う場合、外周端面研磨用の内径支持棒22の径は、内周端面研磨用の内径支持棒20よりも大きくてよい。   In this example, in the outer peripheral end surface polishing step, first, the inner diameter support rod 22 is inserted into the circular hole 12 of the laminated glass substrate 10. Thereby, the position of the some glass substrate 10 is match | combined. Then, a caulking member 24 is attached to the tip of the inner diameter support rod 22 that has passed through the circular holes 12 of the plurality of glass substrates 10, and the plurality of glass substrates 10 are caulked and fixed. In this way, the plurality of glass substrates 10 can be fixed with high accuracy. At the time of the outer peripheral end surface polishing step, the difference between the diameter of the circular hole 12 of the glass substrate 10 and the diameter of the cross section of the inner diameter support rod 22 is, for example, 0.02 to 0.07 mm. In this way, alignment of the glass substrate 10 can be performed with high accuracy. Further, as in this example, when the outer peripheral end surface polishing step is performed after the inner peripheral end surface polishing step, the diameter of the inner diameter support rod 22 for outer peripheral end surface polishing is larger than the inner diameter support rod 20 for inner peripheral end surface polishing. It can be big.

外周端面研磨工程は、続いて、内径支持棒22及びかしめ部材24を用いて固定された複数のガラス基板10を研磨装置内に設置して、ガラス基板10の外周端面16に研磨液を供給する。そして、回転ブラシ又は研磨パッドを接触させて、ガラス基板10の外周端面16を鏡面研磨する。研磨ブラシを用いて研磨を行う場合、研磨液を、例えば35℃程度(例えば30〜40℃程度)に温度制御するのが好ましい。   In the outer peripheral end surface polishing step, a plurality of glass substrates 10 fixed using the inner diameter support rod 22 and the caulking member 24 are subsequently installed in the polishing apparatus, and a polishing liquid is supplied to the outer peripheral end surface 16 of the glass substrate 10. . Then, the outer peripheral end surface 16 of the glass substrate 10 is mirror-polished by contacting a rotating brush or a polishing pad. When polishing with a polishing brush, the temperature of the polishing liquid is preferably controlled to about 35 ° C. (for example, about 30 to 40 ° C.).

ここで、本例において、内径支持棒20の表面のセラミック部36は、金属等と比べて熱膨張係数が小さい。そのため、研磨時に生じる熱によってガラス基板10の近傍の温度が上昇したとしても、内径支持棒22の膨張によって内周端面14が押圧されるおそれもない。そのため、内周端面14の傷の拡大や新たな傷の発生することもない。従って、本例によれば、ガラス基板10の傷の発生を適切に抑えることができる。   Here, in this example, the ceramic portion 36 on the surface of the inner diameter support rod 20 has a smaller thermal expansion coefficient than that of metal or the like. Therefore, even if the temperature in the vicinity of the glass substrate 10 is increased by heat generated during polishing, the inner peripheral end face 14 is not pressed by the expansion of the inner diameter support rod 22. For this reason, there is no expansion of scratches on the inner peripheral end face 14 or new scratches. Therefore, according to this example, generation | occurrence | production of the damage | wound of the glass substrate 10 can be suppressed appropriately.

尚、例えば研磨液の温度制御を行った場合であっても、研磨時に生じる熱によって、ガラス基板10の近傍の温度はより高くなっていることが考えられる。そのため、内径支持棒20の表面は、例えば金属等と比べて熱膨張係数の小さな材料で形成するのが好ましい。   For example, even when the temperature of the polishing liquid is controlled, it is conceivable that the temperature in the vicinity of the glass substrate 10 is higher due to the heat generated during polishing. Therefore, the surface of the inner diameter support rod 20 is preferably formed of a material having a smaller thermal expansion coefficient than, for example, metal.

以下、本発明を、実施例及び比較例を用いて更に詳しく説明する。
(実施例1)
以下の工程を経て、実施例1に係るガラス基板を製造した。
(1)基板準備工程
以下の工程により、円孔を有するガラス基板を準備した。最初に、ダウンドロー法で形成したシートガラスから、研削砥石で直径66mmφ、厚さ1.5mmの円盤状にそれぞれ切り出したアルミノシリケイトガラスからなるガラス基板を、比較的粗いダイヤモンド砥石で研削加工して、直径65mm(2.5インチ)φ、厚さ0.6mmに成形した。この場合、ダウンドロー法の代わりに、溶融ガラスを、上型、下型、胴型を用いてダイレクト・プレスして、円盤状のガラス基板を得てもよい。アルミノシリケイトガラスとしては、モル%表示で、SiOを57〜74%、ZrOを0〜2.8%、Alを3〜15%、LiOを7〜16%、NaOを4〜14%を主成分として含有する化学強化用ガラスを使用した。
Hereinafter, the present invention will be described in more detail with reference to Examples and Comparative Examples.
Example 1
The glass substrate which concerns on Example 1 was manufactured through the following processes.
(1) Substrate preparation step A glass substrate having a circular hole was prepared by the following steps. First, a glass substrate made of aluminosilicate glass cut into a disk shape having a diameter of 66 mmφ and a thickness of 1.5 mm from a sheet glass formed by a downdraw method is ground with a relatively rough diamond grindstone. , 65 mm (2.5 inch) diameter, and 0.6 mm thick. In this case, instead of the downdraw method, the molten glass may be directly pressed using an upper mold, a lower mold, and a body mold to obtain a disk-shaped glass substrate. As the aluminosilicate glass, SiO 2 is 57 to 74%, ZrO 2 is 0 to 2.8%, Al 2 O 3 is 3 to 15%, LiO 2 is 7 to 16%, Na 2 O in mol%. The glass for chemical strengthening which contains 4-14% as a main component was used.

次いで、ガラス基板に砂掛け加工を施した。この砂掛け工程は、寸法精度及び形状精度の向上を目的としている。砂掛け加工は、ラッピング装置を用いて行い、砥粒の粒度を#400として行った。詳しくは、粒度#400のアルミナ砥粒を用い、荷重Lを100kg程度に設定して、内転ギアと外転ギアを回転させることによって、キャリア内に収納したガラス基板の両面を面精度0〜1μm、表面粗さ(Rmax)(JIS B 0601で測定)6μm程度にラッピングした。   Subsequently, the glass substrate was sanded. This sanding step is intended to improve dimensional accuracy and shape accuracy. The sanding process was performed using a lapping apparatus, and the grain size of the abrasive grains was # 400. Specifically, by using alumina abrasive grains having a particle size of # 400, the load L is set to about 100 kg, and the inner rotation gear and the outer rotation gear are rotated, so that both surfaces of the glass substrate housed in the carrier have surface accuracy of 0 to 0. Wrapping to about 1 μm and surface roughness (Rmax) (measured by JIS B 0601) of about 6 μm.

次に、円筒状の砥石を用いてガラス基板の中心部に円孔(直径20mmφ)を開けるとともに、外周端面及び内周端面に所定の面取り加工を施した。このときのガラス基板の内外周端面の表面粗さは、Rmaxで14μm程度であった。   Next, a circular hole (diameter 20 mmφ) was opened in the center of the glass substrate using a cylindrical grindstone, and predetermined chamfering was performed on the outer peripheral end face and the inner peripheral end face. The surface roughness of the inner and outer peripheral end faces of the glass substrate at this time was about 14 μm in Rmax.

次に、粒度#1000のアルミナ砥粒を使用し、荷重Lを100kg程度に設定して、内転ギアと外転ギアを回転させることによって、ラッピングを行い、ガラス基板の両面の表面粗さ(Rmax)を2μm程度とした。そして、砂掛け加工を終えたガラス基板を、中性洗剤、水の各洗浄槽に順次浸漬して、洗浄した。   Next, lapping is performed by using alumina abrasive grains having a particle size of # 1000, setting the load L to about 100 kg, and rotating the inner rotation gear and the outer rotation gear, and the surface roughness of both surfaces of the glass substrate ( Rmax) was about 2 μm. And the glass substrate which finished sanding was immersed in each washing tank of neutral detergent and water sequentially, and was washed.

(2)内周端面研磨工程
図2を用いて説明した方法により、ガラス基板の内周端面を鏡面研磨した。回転ブラシをガラス基板10の円孔12に挿入して、円孔12内に研磨液を供給しつつ回転ブラシを回転させた。研磨液としては、酸化セリウム研磨砥粒を含む研磨液を用いた。内周端面の表面粗さを算術平均表面粗さRaで0.5μm以下、最大高さRmaxで0.5μm以下にした。
(2) Inner peripheral end face polishing step The inner peripheral end face of the glass substrate was mirror-polished by the method described with reference to FIG. The rotating brush was inserted into the circular hole 12 of the glass substrate 10, and the rotating brush was rotated while supplying the polishing liquid into the circular hole 12. As the polishing liquid, a polishing liquid containing cerium oxide abrasive grains was used. The surface roughness of the inner peripheral end face was 0.5 μm or less in terms of arithmetic average surface roughness Ra and 0.5 μm or less in terms of the maximum height Rmax.

また、鉄製の筒状の棒状部と、セラミック部を備える内径支持棒を用いた。セラミック部は、棒状部の表面に溶射法で形成した。このセラミックは、酸化アルミニウムを主成分とし、酸化チタンを含むセラミックであり、Alを94.85%、TiOを2.69%含む。また、その他の成分として、このセラミックは、例えば、Feを0.74%、CaOを0.25%、MgOを0.11%含む。内径支持棒の表面の熱膨張係数は、21〜1480℃の範囲で、7.4×10−/℃程度である。また、セラミック部の厚さは5μmとした。セラミック部の表面粗さは算術平均表面粗さRaで5μm以下にした。また、内径支持棒の断面の径は、19.960〜19.970mm(中央値19.965mm)とした。 Also, an inner diameter support rod provided with an iron cylindrical rod-shaped portion and a ceramic portion was used. The ceramic part was formed on the surface of the rod-like part by thermal spraying. This ceramic is a ceramic containing aluminum oxide as a main component and containing titanium oxide, and contains 94.85% of Al 2 O 3 and 2.69% of TiO 2 . As other components, this ceramic contains, for example, 0.74% of Fe 2 O 3 , 0.25% of CaO, and 0.11% of MgO. Thermal expansion coefficient of the surface of the inner diameter support rod is in the range of 21-1480 ° C., is about 7.4 × 10- 6 / ℃. Moreover, the thickness of the ceramic part was 5 μm. The surface roughness of the ceramic portion was 5 μm or less in terms of arithmetic average surface roughness Ra. The diameter of the cross section of the inner diameter support rod was 19.960 to 19.970 mm (median value 19.965 mm).

(3)外周端面研磨工程
図3を用いて説明した方法により、ガラス基板の外周端面を、回転ブラシを用いて鏡面研磨した。また、径以外は内周端面研磨用の内径支持棒と同様の内径支持棒を用いた。内径支持棒の断面の径は、19.967〜19.980mm(中央値19.974mm)である。
(3) Outer peripheral end surface polishing step The outer peripheral end surface of the glass substrate was mirror-polished using a rotating brush by the method described with reference to FIG. In addition, an inner diameter support rod similar to the inner diameter support rod for polishing the inner peripheral end face was used except for the diameter. The diameter of the cross section of the inner diameter support rod is 19.967 to 19.980 mm (median value 19.974 mm).

(4)主表面研磨工程
まず、第一研磨工程を施した。この第一研磨工程は、上述した砂掛け工程で残留した傷や歪みの除去を目的とするもので、研磨装置を用いて行った。詳しくは、ポリシャ(研磨パッド、研磨布)として硬質ポリシャ(セリウムパッドMHC15:スピードファム社製)を用い、以下の研磨条件で第一研磨工程を実施した。
研磨液:酸化セリウム+水
荷重:300g/cm(L=238kg)
研磨時間:15分
除去量:30μm
下定盤回転数:40rpm
上定盤回転数:35rpm
内ギア回転数:14rpm
外ギア回転数:29rpm
(4) Main surface polishing step First, the first polishing step was performed. This first polishing step is intended to remove scratches and distortions remaining in the above-described sanding step, and was performed using a polishing apparatus. Specifically, a hard polisher (cerium pad MHC15: manufactured by Speed Fam Co., Ltd.) was used as the polisher (polishing pad, polishing cloth), and the first polishing step was performed under the following polishing conditions.
Polishing liquid: cerium oxide + water load: 300 g / cm 2 (L = 238 kg)
Polishing time: 15 minutes Removal amount: 30 μm
Lower platen rotation speed: 40rpm
Upper platen rotation speed: 35rpm
Inner gear speed: 14rpm
Outer gear speed: 29rpm

また、上記第一研磨工程を終えたガラス基板を、中性洗剤、純水、純水、IPA(イソプロピルアルコール)、IPA(蒸気乾燥)の各洗浄槽に順次浸漬して、洗浄した。   Moreover, the glass substrate which finished the said 1st grinding | polishing process was immersed in each washing | cleaning tank of neutral detergent, a pure water, a pure water, IPA (isopropyl alcohol), and IPA (steam drying) sequentially, and was wash | cleaned.

次に、第一研磨工程で使用した研磨装置を用い、ポリシャを硬質ポリシャから軟質ポリシャ(ポリラックス:スピードファム社製)に替えて、第二研磨工程を実施した。研磨条件は、酸化セリウム研磨砥粒と水を含む研磨液を用い、荷重を100g/cm、研磨時間を5分、除去量を5μmとしたこと以外は、第一研磨工程と同様とした。また、上記第二研磨工程を終えたガラス基板を、中性洗剤、中性洗剤、純水、純水、IPA(イソプロピルアルコール)、IPA(蒸気乾燥)の各洗浄槽に順次浸漬して、洗浄した。尚、各洗浄槽には超音波を印加した。 Next, using the polishing apparatus used in the first polishing step, the second polishing step was performed by changing the polisher from a hard polisher to a soft polisher (Porelax: manufactured by Speedfam). The polishing conditions were the same as those in the first polishing step, except that a polishing liquid containing cerium oxide polishing grains and water was used, the load was 100 g / cm 2 , the polishing time was 5 minutes, and the removal amount was 5 μm. Moreover, the glass substrate which finished the said 2nd grinding | polishing process is immersed in each washing tank of a neutral detergent, a neutral detergent, a pure water, a pure water, IPA (isopropyl alcohol), and IPA (steam drying) sequentially, and is wash | cleaned. did. An ultrasonic wave was applied to each cleaning tank.

(5)化学強化工程
次に、ガラス基板に化学強化を施した。化学強化は、硝酸カリウム(60%)と硝酸ナトリウム(40%)を混合した化学強化溶液を用意し、この化学強化溶液を400℃に加熱し、300℃に予熱された洗浄済みのガラス基板を約3時間浸漬して行った。この浸漬の際に、ガラス基板の表面全体が化学強化されるようにするため、複数のガラス基板が端面で保持されるようにホルダーに収納した状態で行った。
(5) Chemical strengthening process Next, the glass substrate was chemically strengthened. For chemical strengthening, a chemical strengthening solution prepared by mixing potassium nitrate (60%) and sodium nitrate (40%) is prepared, and the chemically strengthened solution is heated to 400 ° C., and the cleaned glass substrate preheated to 300 ° C. is reduced to about It was immersed for 3 hours. In this immersion, in order to chemically strengthen the entire surface of the glass substrate, the plurality of glass substrates were stored in a holder so as to be held by the end surfaces.

このように、化学強化溶液に浸漬処理することによって、ガラス基板表層のリチウムイオン、ナトリウムイオンは、化学強化溶液中のナトリウムイオン、カリウムイオンにそれぞれ置換されガラス基板は強化される。ガラス基板の表層に形成された圧縮応力層の厚さは、約100〜200μmであった。   Thus, by immersing in the chemical strengthening solution, the lithium ions and sodium ions on the surface of the glass substrate are replaced with sodium ions and potassium ions in the chemical strengthening solution, respectively, and the glass substrate is strengthened. The thickness of the compressive stress layer formed on the surface layer of the glass substrate was about 100 to 200 μm.

また、上記化学強化を終えたガラス基板を、20℃の水槽に浸漬して急冷し約10分間維持した。上記急冷を終えたガラス基板を、約40℃に加熱した濃硫酸に浸漬して洗浄を行った。更に上記硫酸洗浄を終えたガラス基板を、純水、純水、IPA(イソプロピルアルコール)、IPA(蒸気乾燥)の各洗浄槽に順次浸漬して、洗浄した。尚、各洗浄槽には超音波を印加した。   Moreover, the glass substrate which finished the said chemical strengthening was immersed in a 20 degreeC water tank, rapidly cooled, and maintained for about 10 minutes. The glass substrate after the rapid cooling was washed by immersing it in concentrated sulfuric acid heated to about 40 ° C. Further, the glass substrate that had been subjected to the sulfuric acid cleaning was immersed in each cleaning bath of pure water, pure water, IPA (isopropyl alcohol), and IPA (steam drying) in order and cleaned. An ultrasonic wave was applied to each cleaning tank.

(比較例1)
内周端面研磨工程及び外周端面研磨工程のぞれぞれで用いる内径支持棒として、セラミック部の表面粗さが算術平均表面粗さRaで5μmよりも大きなものを用いて、ガラス基板を製造した。
(Comparative Example 1)
A glass substrate was manufactured using an inner diameter support rod used in each of the inner peripheral end surface polishing step and the outer peripheral end surface polishing step, wherein the surface roughness of the ceramic portion was larger than 5 μm in arithmetic average surface roughness Ra. .

(評価)
実施例1においては、内径支持棒の表面の表面粗さを低減することにより、摩擦係数を0.5以下に低減できた。そのため、内径支持棒の挿入時にガラス基板の内周端面が内径支持棒に引っかかることはなかった。そのため、実施例1においては、製造されるガラス基板の端面品質を高い水準に保つことができた。また、これにより、実施例1においては、内周端面研磨工程及び外周端面研磨工程の歩留まりを99%以上に保つことができた。また、内径支持棒の表面は、十分な硬さを有しているため、実施例1の内径支持棒は、表面が傷つき難い構成となった。また、例え衝撃を受けたとしても、表面にカケが生じることはなく、衝撃を受けた部分が凹むのみであった。凹みが生じるのみであり、その後の研磨においてガラス基板の内周端面に傷が生じることはない。
(Evaluation)
In Example 1, the friction coefficient could be reduced to 0.5 or less by reducing the surface roughness of the surface of the inner diameter support bar. Therefore, the inner peripheral end surface of the glass substrate was not caught by the inner diameter support rod when the inner diameter support rod was inserted. Therefore, in Example 1, the end surface quality of the manufactured glass substrate was able to be maintained at a high level. Thereby, in Example 1, the yield of the inner peripheral end face polishing step and the outer peripheral end face polishing step could be maintained at 99% or more. In addition, since the surface of the inner diameter support bar has sufficient hardness, the inner diameter support bar of Example 1 has a configuration in which the surface is hardly damaged. Moreover, even if an impact was received, no chipping occurred on the surface, and the impacted part was only recessed. Only the dent is generated, and the inner peripheral end face of the glass substrate is not damaged in the subsequent polishing.

これに対し、比較例1においては、内径支持棒の挿入時にガラス基板の内周端面が内径支持棒に引っかかり、ガラス基板の端面品質が低下してしまう場合があった。この結果、内周端面研磨工程及び外周端面研磨工程の歩留まりは、実施例1と比べて低かった。   On the other hand, in Comparative Example 1, the inner peripheral end surface of the glass substrate was caught by the inner diameter support rod when the inner diameter support rod was inserted, and the end surface quality of the glass substrate might be deteriorated. As a result, the yield in the inner peripheral end surface polishing step and the outer peripheral end surface polishing step was lower than that in Example 1.

以上、本発明を実施形態を用いて説明したが、本発明の技術的範囲は上記実施形態に記載の範囲には限定されない。上記実施形態に、多様な変更又は改良を加えることが可能であることが当業者に明らかである。その様な変更又は改良を加えた形態も本発明の技術的範囲に含まれ得ることが、特許請求の範囲の記載から明らかである。   As mentioned above, although this invention was demonstrated using embodiment, the technical scope of this invention is not limited to the range as described in the said embodiment. It will be apparent to those skilled in the art that various modifications or improvements can be added to the above embodiment. It is apparent from the scope of the claims that the embodiments added with such changes or improvements can be included in the technical scope of the present invention.

本発明は、例えば、磁気ディスク用ガラス基板の製造方法、磁気ディスク用ガラス基板、及び磁気ディスクの製造方法に好適に用いることができる。   The present invention can be suitably used for, for example, a method for manufacturing a magnetic disk glass substrate, a magnetic disk glass substrate, and a magnetic disk manufacturing method.

本発明の一実施形態に係るガラス基板10を切断してみたときの斜視図である。It is a perspective view when the glass substrate 10 which concerns on one Embodiment of this invention is cut | disconnected. 内周端面研磨工程を説明する図である。 図2(a)は、内周研磨工程におけるガラス基板10の位置合わせの方法の一例を示す。 図2(b)は、内周端面研磨工程で用いられる内径支持棒20の構成を示す断面図である。It is a figure explaining an inner peripheral end surface grinding | polishing process. Fig.2 (a) shows an example of the method of alignment of the glass substrate 10 in an inner periphery grinding | polishing process. FIG. 2B is a cross-sectional view showing the configuration of the inner diameter support rod 20 used in the inner peripheral end surface polishing step. 外周端面研磨工程を説明する図である。 図3(a)は、外周研磨工程におけるガラス基板10の位置合わせの方法の一例を示す。 図3(b)は、外周端面研磨工程で用いられる内径支持棒22の構成を示す断面図である。It is a figure explaining an outer periphery end surface grinding | polishing process. Fig.3 (a) shows an example of the method of alignment of the glass substrate 10 in an outer periphery grinding | polishing process. FIG. 3B is a cross-sectional view showing the configuration of the inner diameter support rod 22 used in the outer peripheral end surface polishing step.

符号の説明Explanation of symbols

10・・・ガラス基板、12・・・円孔、14・・・内周端面、16・・・外周端面、20・・・内径支持棒、22・・・内径支持棒、24・・・かしめ部材、30・・・棒状部、32・・・セラミック部、34・・・棒状部、36・・・セラミック部 DESCRIPTION OF SYMBOLS 10 ... Glass substrate, 12 ... Circular hole, 14 ... Inner peripheral end surface, 16 ... Outer peripheral end surface, 20 ... Inner diameter support rod, 22 ... Inner diameter support rod, 24 ... Caulking Member 30 ... Bar-shaped part 32 ... Ceramic part 34 ... Bar-shaped part 36 ... Ceramic part

Claims (9)

磁気ディスク用ガラス基板の製造方法であって、
中心部に円孔を有する円板状のガラス基板を準備する基板準備工程と、
前記ガラス基板の内径を支持する内径支持棒を前記ガラス基板の前記円孔に挿入することにより、前記ガラス基板の位置合わせを行い、前記ガラス基板の内周端面及び外周端面の少なくとも一方を研磨する端面研磨工程と
を備え、
前記ガラス基板の前記内周端面と接触すべき前記内径支持棒の表面は、表面粗さが算術平均表面粗さRaで5μm以下であることを特徴とする磁気ディスク用ガラス基板の製造方法。
A method of manufacturing a glass substrate for a magnetic disk,
A substrate preparation step of preparing a disk-shaped glass substrate having a circular hole in the center;
By inserting an inner diameter support rod for supporting the inner diameter of the glass substrate into the circular hole of the glass substrate, the glass substrate is aligned, and at least one of the inner peripheral end surface and the outer peripheral end surface of the glass substrate is polished. An end face polishing step,
The method of manufacturing a glass substrate for a magnetic disk, wherein the surface of the inner diameter support rod to be brought into contact with the inner peripheral end surface of the glass substrate has an arithmetic average surface roughness Ra of 5 μm or less.
磁気ディスク用ガラス基板の製造方法であって、
中心部に円孔を有する円板状のガラス基板を準備する基板準備工程と、
前記ガラス基板の内径を支持する内径支持棒を前記ガラス基板の前記円孔に挿入することにより、前記ガラス基板の位置合わせを行い、前記ガラス基板の内周端面及び外周端面の少なくとも一方を研磨する端面研磨工程と
を備え、
前記ガラス基板の前記内周端面と接触すべき前記内径支持棒の表面は、セラミックで形成されていることを特徴とする磁気ディスク用ガラス基板の製造方法。
A method of manufacturing a glass substrate for a magnetic disk,
A substrate preparation step of preparing a disk-shaped glass substrate having a circular hole in the center;
By inserting an inner diameter support rod for supporting the inner diameter of the glass substrate into the circular hole of the glass substrate, the glass substrate is aligned, and at least one of the inner peripheral end surface and the outer peripheral end surface of the glass substrate is polished. An end face polishing step,
The method of manufacturing a glass substrate for a magnetic disk, wherein a surface of the inner diameter support rod to be brought into contact with the inner peripheral end surface of the glass substrate is made of ceramic.
前記内径支持棒の前記表面は、表面粗さが算術平均表面粗さRaで5μm以下であることを特徴とする請求項2に記載の磁気ディスク用ガラス基板の製造方法。   3. The method of manufacturing a glass substrate for a magnetic disk according to claim 2, wherein the surface of the inner diameter support rod has a surface roughness of 5 [mu] m or less in terms of arithmetic average surface roughness Ra. 前記内径支持棒の前記表面の摩擦係数は、0.5以下であることを特徴とする請求項1から3の何れか1項に記載の磁気ディスク用ガラス基板の製造方法。   4. The method for manufacturing a glass substrate for a magnetic disk according to claim 1, wherein a friction coefficient of the surface of the inner diameter support rod is 0.5 or less. 5. 前記内径支持棒の表面は、前記ガラス基板を構成するガラスよりも硬度の高い材料で形成されていることを特徴とする請求項1から4の何れか1項に記載の磁気ディスク用ガラス基板の製造方法。   5. The glass substrate for a magnetic disk according to claim 1, wherein a surface of the inner diameter support bar is formed of a material having a hardness higher than that of the glass constituting the glass substrate. Production method. 前記内径支持棒の表面は、酸化アルミニウム又は酸化クロムを主成分とするセラミックで形成されていることを特徴とする請求項1から5の何れか1項に記載の磁気ディスク用ガラス基板の製造方法。   6. The method of manufacturing a glass substrate for a magnetic disk according to claim 1, wherein a surface of the inner diameter support bar is made of a ceramic mainly composed of aluminum oxide or chromium oxide. . 前記内径支持棒は、
金属の棒状部と、
前記棒状部の表面にセラミックコーティングされたセラミック部と
を備えることを特徴とする請求項1から6の何れか1項に記載の磁気ディスク用ガラス基板の製造方法。
The inner diameter support rod is
A metal bar,
The method for manufacturing a glass substrate for a magnetic disk according to any one of claims 1 to 6, further comprising a ceramic portion coated with a ceramic on a surface of the rod-shaped portion.
請求項1から7の何れか1項に記載の磁気ディスク用ガラス基板の製造方法で製造されたことを特徴とする磁気ディスク用ガラス基板。   A glass substrate for a magnetic disk manufactured by the method for manufacturing a glass substrate for a magnetic disk according to any one of claims 1 to 7. 請求項8に記載の磁気ディスク用ガラス基板上に少なくとも磁気記録層を形成することを特徴とする磁気ディスクの製造方法。
A method for manufacturing a magnetic disk, comprising forming at least a magnetic recording layer on the glass substrate for a magnetic disk according to claim 8.
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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010214532A (en) * 2009-03-17 2010-09-30 Showa Denko Kk Method for manufacturing disc-shaped substrate and tool for placing the same
JP2012142046A (en) * 2010-12-28 2012-07-26 Konica Minolta Advanced Layers Inc Glass substrate and its manufacturing method, and information recording device
CN102825534A (en) * 2011-06-13 2012-12-19 旭硝子株式会社 Support fixture and method for manufacturing glass substrate for magnetic recording medium
JP2013073636A (en) * 2011-09-26 2013-04-22 Asahi Glass Co Ltd Glass substrate laminating holder, method for polishing end surface of glass substrate for magnetic recording medium using holder, and method for manufacturing glass substrate for magnetic recording medium using method for polishing end surface
WO2013099656A1 (en) * 2011-12-27 2013-07-04 コニカミノルタ株式会社 Glass substrate for information recording medium and method for producing same
WO2013145458A1 (en) * 2012-03-30 2013-10-03 旭硝子株式会社 Supporting shaft, method for polishing end surface of magnetic disk glass substrate, and method for manufacturing magnetic disk glass substrate
JP2014056639A (en) * 2013-11-12 2014-03-27 Asahi Glass Co Ltd Method for manufacturing glass substrate for magnetic recording medium

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07192261A (en) * 1993-12-28 1995-07-28 Furukawa Electric Co Ltd:The Heat treatment of disk
JPH11221742A (en) * 1997-09-30 1999-08-17 Hoya Corp Grinding method, grinding device, glass substrate for magnetic recording medium and magnetic recording medium
JP2007118174A (en) * 2005-09-29 2007-05-17 Hoya Corp Polishing brush, polishing member, polishing method, polishing device, manufacturing method for glass substrate for magnetic disk, and method for magnetic disk

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07192261A (en) * 1993-12-28 1995-07-28 Furukawa Electric Co Ltd:The Heat treatment of disk
JPH11221742A (en) * 1997-09-30 1999-08-17 Hoya Corp Grinding method, grinding device, glass substrate for magnetic recording medium and magnetic recording medium
JP2007118174A (en) * 2005-09-29 2007-05-17 Hoya Corp Polishing brush, polishing member, polishing method, polishing device, manufacturing method for glass substrate for magnetic disk, and method for magnetic disk

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010214532A (en) * 2009-03-17 2010-09-30 Showa Denko Kk Method for manufacturing disc-shaped substrate and tool for placing the same
JP2012142046A (en) * 2010-12-28 2012-07-26 Konica Minolta Advanced Layers Inc Glass substrate and its manufacturing method, and information recording device
CN102825534A (en) * 2011-06-13 2012-12-19 旭硝子株式会社 Support fixture and method for manufacturing glass substrate for magnetic recording medium
JP2013004114A (en) * 2011-06-13 2013-01-07 Asahi Glass Co Ltd Support tool and manufacturing method for glass substrate for magnetic recording medium
JP2013073636A (en) * 2011-09-26 2013-04-22 Asahi Glass Co Ltd Glass substrate laminating holder, method for polishing end surface of glass substrate for magnetic recording medium using holder, and method for manufacturing glass substrate for magnetic recording medium using method for polishing end surface
WO2013099656A1 (en) * 2011-12-27 2013-07-04 コニカミノルタ株式会社 Glass substrate for information recording medium and method for producing same
WO2013145458A1 (en) * 2012-03-30 2013-10-03 旭硝子株式会社 Supporting shaft, method for polishing end surface of magnetic disk glass substrate, and method for manufacturing magnetic disk glass substrate
JP5565524B2 (en) * 2012-03-30 2014-08-06 旭硝子株式会社 Support shaft, method for polishing end face of glass substrate for magnetic disk, and method for manufacturing glass substrate for magnetic disk
CN104205218A (en) * 2012-03-30 2014-12-10 旭硝子株式会社 Supporting shaft, method for polishing end surface of magnetic disk glass substrate, and method for manufacturing magnetic disk glass substrate
JP2014056639A (en) * 2013-11-12 2014-03-27 Asahi Glass Co Ltd Method for manufacturing glass substrate for magnetic recording medium

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