JP2007187616A - 分析チップおよび分析方法 - Google Patents

分析チップおよび分析方法 Download PDF

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Publication number
JP2007187616A
JP2007187616A JP2006007387A JP2006007387A JP2007187616A JP 2007187616 A JP2007187616 A JP 2007187616A JP 2006007387 A JP2006007387 A JP 2006007387A JP 2006007387 A JP2006007387 A JP 2006007387A JP 2007187616 A JP2007187616 A JP 2007187616A
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Japan
Prior art keywords
analysis chip
reaction chamber
carrier
analysis
storage tank
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JP2006007387A
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English (en)
Japanese (ja)
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JP2007187616A5 (enExample
Inventor
Yoshiaki Yamazaki
義昭 山崎
Masafumi Hikasa
雅史 日笠
Kiban Tei
基晩 鄭
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Toray Industries Inc
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Toray Industries Inc
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Priority to JP2006007387A priority Critical patent/JP2007187616A/ja
Publication of JP2007187616A publication Critical patent/JP2007187616A/ja
Publication of JP2007187616A5 publication Critical patent/JP2007187616A5/ja
Pending legal-status Critical Current

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JP2006007387A 2006-01-16 2006-01-16 分析チップおよび分析方法 Pending JP2007187616A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006007387A JP2007187616A (ja) 2006-01-16 2006-01-16 分析チップおよび分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006007387A JP2007187616A (ja) 2006-01-16 2006-01-16 分析チップおよび分析方法

Publications (2)

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JP2007187616A true JP2007187616A (ja) 2007-07-26
JP2007187616A5 JP2007187616A5 (enExample) 2009-02-26

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JP2006007387A Pending JP2007187616A (ja) 2006-01-16 2006-01-16 分析チップおよび分析方法

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JP (1) JP2007187616A (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007304093A (ja) * 2006-04-14 2007-11-22 Toray Ind Inc 分析チップ
WO2013172631A1 (ko) * 2012-05-14 2013-11-21 주식회사 나노엔텍 샘플분석용 칩
US8622605B2 (en) 2011-11-25 2014-01-07 Nec Corporation Fluid mixing device
WO2016203807A1 (ja) * 2015-06-18 2016-12-22 ソニー株式会社 分析用プローブ
CN116601493A (zh) * 2020-12-21 2023-08-15 下一代技术公司 用于自由基蛋白质足迹法的光流控阵列

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004132820A (ja) * 2002-10-10 2004-04-30 Dkk Toa Corp 分析装置及び分析方法
WO2005024436A1 (ja) * 2003-09-02 2005-03-17 Nec Corporation カスタマイズ可能なチップおよびその製造方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004132820A (ja) * 2002-10-10 2004-04-30 Dkk Toa Corp 分析装置及び分析方法
WO2005024436A1 (ja) * 2003-09-02 2005-03-17 Nec Corporation カスタマイズ可能なチップおよびその製造方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007304093A (ja) * 2006-04-14 2007-11-22 Toray Ind Inc 分析チップ
US8622605B2 (en) 2011-11-25 2014-01-07 Nec Corporation Fluid mixing device
WO2013172631A1 (ko) * 2012-05-14 2013-11-21 주식회사 나노엔텍 샘플분석용 칩
US9599542B2 (en) 2012-05-14 2017-03-21 Nanoentek, Inc. Sample analyzing chip
WO2016203807A1 (ja) * 2015-06-18 2016-12-22 ソニー株式会社 分析用プローブ
CN116601493A (zh) * 2020-12-21 2023-08-15 下一代技术公司 用于自由基蛋白质足迹法的光流控阵列

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