JP2007187616A5 - - Google Patents

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Publication number
JP2007187616A5
JP2007187616A5 JP2006007387A JP2006007387A JP2007187616A5 JP 2007187616 A5 JP2007187616 A5 JP 2007187616A5 JP 2006007387 A JP2006007387 A JP 2006007387A JP 2006007387 A JP2006007387 A JP 2006007387A JP 2007187616 A5 JP2007187616 A5 JP 2007187616A5
Authority
JP
Japan
Prior art keywords
reaction chamber
flow path
storage tank
measurement target
analysis chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006007387A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007187616A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2006007387A priority Critical patent/JP2007187616A/ja
Priority claimed from JP2006007387A external-priority patent/JP2007187616A/ja
Publication of JP2007187616A publication Critical patent/JP2007187616A/ja
Publication of JP2007187616A5 publication Critical patent/JP2007187616A5/ja
Pending legal-status Critical Current

Links

JP2006007387A 2006-01-16 2006-01-16 分析チップおよび分析方法 Pending JP2007187616A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006007387A JP2007187616A (ja) 2006-01-16 2006-01-16 分析チップおよび分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006007387A JP2007187616A (ja) 2006-01-16 2006-01-16 分析チップおよび分析方法

Publications (2)

Publication Number Publication Date
JP2007187616A JP2007187616A (ja) 2007-07-26
JP2007187616A5 true JP2007187616A5 (enExample) 2009-02-26

Family

ID=38342874

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006007387A Pending JP2007187616A (ja) 2006-01-16 2006-01-16 分析チップおよび分析方法

Country Status (1)

Country Link
JP (1) JP2007187616A (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5145752B2 (ja) * 2006-04-14 2013-02-20 東レ株式会社 分析チップ
US8622605B2 (en) 2011-11-25 2014-01-07 Nec Corporation Fluid mixing device
KR101175594B1 (ko) * 2012-05-14 2012-08-21 주식회사 나노엔텍 샘플분석용 칩
WO2016203807A1 (ja) * 2015-06-18 2016-12-22 ソニー株式会社 分析用プローブ
CN116601493A (zh) * 2020-12-21 2023-08-15 下一代技术公司 用于自由基蛋白质足迹法的光流控阵列

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004132820A (ja) * 2002-10-10 2004-04-30 Dkk Toa Corp 分析装置及び分析方法
WO2005024436A1 (ja) * 2003-09-02 2005-03-17 Nec Corporation カスタマイズ可能なチップおよびその製造方法

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