JP2007127645A5 - - Google Patents

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Publication number
JP2007127645A5
JP2007127645A5 JP2006296000A JP2006296000A JP2007127645A5 JP 2007127645 A5 JP2007127645 A5 JP 2007127645A5 JP 2006296000 A JP2006296000 A JP 2006296000A JP 2006296000 A JP2006296000 A JP 2006296000A JP 2007127645 A5 JP2007127645 A5 JP 2007127645A5
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JP
Japan
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Application number
JP2006296000A
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JP2007127645A (ja
JP5328096B2 (ja
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Priority claimed from US11/266,472 external-priority patent/US7778319B2/en
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Publication of JP2007127645A publication Critical patent/JP2007127645A/ja
Publication of JP2007127645A5 publication Critical patent/JP2007127645A5/ja
Application granted granted Critical
Publication of JP5328096B2 publication Critical patent/JP5328096B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2006296000A 2005-11-04 2006-10-31 ジッタ測定装置、ジッタ測定方法、試験装置、及び電子デバイス Expired - Fee Related JP5328096B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/266,472 2005-11-04
US11/266,472 US7778319B2 (en) 2005-11-04 2005-11-04 Jitter measuring apparatus, jitter measuring method and test apparatus

Publications (3)

Publication Number Publication Date
JP2007127645A JP2007127645A (ja) 2007-05-24
JP2007127645A5 true JP2007127645A5 (ja) 2008-10-30
JP5328096B2 JP5328096B2 (ja) 2013-10-30

Family

ID=37950142

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006296000A Expired - Fee Related JP5328096B2 (ja) 2005-11-04 2006-10-31 ジッタ測定装置、ジッタ測定方法、試験装置、及び電子デバイス

Country Status (3)

Country Link
US (1) US7778319B2 (ja)
JP (1) JP5328096B2 (ja)
DE (1) DE102006052842A1 (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5300174B2 (ja) * 2005-02-14 2013-09-25 株式会社アドバンテスト ジッタ測定装置、ジッタ測定方法、試験装置、及び電子デバイス
JP4979003B2 (ja) * 2007-04-09 2012-07-18 日本電信電話株式会社 Ｃｄｒ回路
JP5314491B2 (ja) * 2009-05-08 2013-10-16 株式会社アドバンテスト 試験装置、試験方法、および、デバイス
US8477870B2 (en) 2009-07-02 2013-07-02 Panasonic Corporation Transmitter including polar modulation circuit
TWI444636B (zh) * 2011-02-18 2014-07-11 Realtek Semiconductor Corp 內建抖動測試功能之時脈與資料回復電路及其方法
US20140306689A1 (en) * 2013-04-10 2014-10-16 Texas Instruments, Incorporated High resolution current pulse analog measurement
US20150102799A1 (en) * 2013-10-15 2015-04-16 Nvidia Corporation Jitter determination of noisy electrical signals

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07153006A (ja) * 1993-11-30 1995-06-16 Sony Corp ディジタル信号記録回路
JPH08102763A (ja) * 1994-09-30 1996-04-16 Anritsu Corp ジッタ測定装置
JPH08248078A (ja) * 1995-03-07 1996-09-27 Anritsu Corp ジッタ伝達特性測定装置
US5754437A (en) * 1996-09-10 1998-05-19 Tektronix, Inc. Phase measurement apparatus and method
JP2959511B2 (ja) * 1997-03-19 1999-10-06 日本電気株式会社 データストローブ装置
JP2993559B2 (ja) * 1997-03-31 1999-12-20 日本電気株式会社 位相同期回路
JP2001126412A (ja) * 1999-11-01 2001-05-11 Matsushita Electric Ind Co Ltd 復号装置
JP3457626B2 (ja) * 2000-04-20 2003-10-20 Ｎｅｃエレクトロニクス株式会社 ジッタ検出回路
JP3419384B2 (ja) * 2000-04-28 2003-06-23 松下電器産業株式会社 ジッタ検出回路
US6598004B1 (en) * 2000-08-28 2003-07-22 Advantest Corporation Jitter measurement apparatus and its method
JP2002140819A (ja) * 2000-10-31 2002-05-17 Sanyo Electric Co Ltd ジッタ検出回路および光ディスク記録再生装置
US20020136337A1 (en) * 2001-03-20 2002-09-26 Abhijit Chatterjee Method and apparatus for high-resolution jitter measurement
JP2004061287A (ja) * 2002-07-29 2004-02-26 Nec System Technologies Ltd ジッタ検出回路および半導体集積回路
JP4040393B2 (ja) * 2002-08-23 2008-01-30 Ｎｅｃエレクトロニクス株式会社 ジッタテスト回路、ジッタテスト回路を搭載した半導体装置およびジッタテスト方法
US20040062301A1 (en) * 2002-09-30 2004-04-01 Takahiro Yamaguchi Jitter measurement apparatus and jitter measurement method
JP4152710B2 (ja) * 2002-10-01 2008-09-17 株式会社アドバンテスト ジッタ測定装置、及び試験装置
US7317777B2 (en) * 2002-10-07 2008-01-08 International Business Machines Corporation Digital adaptive control loop for data deserialization
US7236555B2 (en) * 2004-01-23 2007-06-26 Sunrise Telecom Incorporated Method and apparatus for measuring jitter
JP5300174B2 (ja) * 2005-02-14 2013-09-25 株式会社アドバンテスト ジッタ測定装置、ジッタ測定方法、試験装置、及び電子デバイス
US7496137B2 (en) * 2005-05-25 2009-02-24 Advantest Corporation Apparatus for measuring jitter and method of measuring jitter

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