JP2007040864A - Method and system for measuring/selecting characteristicelectronic component - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method and a system for quickly re-measuring and selecting electronic components which have been judged no good by a cause of not proper contact of a terminal for measuring to an exterior electrode of the component. <P>SOLUTION: The necessity judgment of a re-measuring process 17 is executed so as to select electronic components capable of judging that the cause of inferiority in the selection process 14 of the electronic components is bad contact of the terminal for measuring to the exterior electrode, judging from the measured data in a measuring process 11. The electronic components selected here are again sent to the measuring process 11. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to an electronic component characteristic measurement / selection method and apparatus, and more particularly to an electronic component characteristic measurement / selection method in which each step of characteristic measurement and selection is performed again for an electronic component that has been determined to be defective. The present invention relates to a sorting method and apparatus.

  For example, an electronic component such as a module component configured with a multilayer circuit board includes a plurality of external electrodes to be external connection terminals. Further, when shipping such electronic parts, their electrical characteristics are measured and sorted into non-defective products and defective products according to the measurement data obtained thereby. In the step of measuring the electrical characteristics, the electrical characteristics are usually measured for a plurality of measurement items in a state where the measurement terminals are simultaneously brought into contact with each of the plurality of external electrodes. In addition, the measurement process may be performed in a plurality of stages.

  In the sorting process, the non-defective product and the defective product are sorted according to the measurement data in the measurement process described above, but some of the electronic components that are determined to be defective are not true defects and are simply measured in the measurement process. In some cases, the terminal is not properly in contact with the external electrode of the electronic component.

  If the electronic component is an inexpensive one such as a chip capacitor, the electronic component that is determined to be defective due to the poor contact of the measurement terminal with the external electrode as described above is also defective. However, in the case of relatively expensive electronic parts such as module parts, electronic parts that are judged to be defective due to mere contact failure are discarded together with true defective parts. There is not a little resistance to it.

  In addition, in the case of electronic parts such as module parts, since the number of external electrodes is as large as three or more, when the measurement terminals are simultaneously brought into contact with each of these external electrodes in the measurement process, any of the external electrodes It must also be taken into account that the probability of contact failure occurring in is relatively high.

  Therefore, in order to determine whether an electronic component once determined as a defective product in the selection process is a true defective product, the measurement process and the selection process are performed again on the electronic component once determined as a defective product. For example, Japanese Patent Laid-Open No. 5-99971 (Patent Document 1) has proposed.

  In Patent Document 1, when a measurement process is performed again on an electronic component that has been regarded as defective, the measurement speed (inspection speed) in the measurement process is slowed down, thereby increasing the measurement accuracy. As a result, it is possible to avoid discarding electronic components that are determined to be defective due to poor contact, that is, electronic components that are not truly defective. This is particularly advantageous for relatively expensive electronic components.

However, according to the technique described in Patent Document 1, the measurement process and the selection process are performed again for all of the electronic components that are defective in the selection process. Therefore, when the number of electronic parts that are defective in the first sorting process is large, the measurement speed in the second measuring process is slowed down, so the second measuring process and the sorting process can be completed quickly. There are cases where it is not possible. Also, in the case of electronic components that were determined to be defective in the first sorting process, if the ratio of true defects is high with respect to defects caused by contact failure, the second measurement process and sorting process were originally performed. Since the second measurement process and the selection process are performed for many electronic components that do not need to be performed, as a result, a lot of wasted time is spent.
JP-A-5-99971

  Accordingly, an object of the present invention is to provide an electronic component characteristic measurement / selection method and apparatus that can solve the above-described problems.

  This invention measures the electrical characteristics of an electronic component having a plurality of external electrodes in a state in which a measurement terminal is simultaneously in contact with each of the plurality of external electrodes, according to the measurement data in the measurement process and the measurement process, In order to solve the technical problems described above, the following configuration is first aimed at a method for measuring and selecting characteristics of electronic components, comprising a sorting process for sorting electronic components into non-defective products and defective products. It is characterized by having.

  That is, the characteristic measurement / sorting method of the electronic component according to the present invention is based on the measurement data in the measurement step among the electronic components determined to be defective in the sorting step, and is applied to the external electrode of the measurement terminal. It is characterized by further comprising a re-measurement necessity determination step of selecting an electronic component that may be caused by poor contact according to a specific determination criterion. For the electronic components selected in the re-measurement necessity determination step, the measurement step and the selection step are performed again.

  In the present invention, there are two typical embodiments of the determination criteria in the remeasurement necessity determination step.

  In the first embodiment relating to the determination criterion, in the re-measurement necessity determination step, an electronic component that can be determined to be caused by poor contact of the measurement terminal with the external electrode is selected according to the determination criterion.

  More specifically, the first embodiment is preferably implemented as follows. That is, the measurement step includes first and second measurement steps that are sequentially performed, and the first electrical characteristics and the second measurement step for at least one of the measurement items measured in the first measurement step. The second electrical characteristic of at least one of the measurement items measured in the above should have a predetermined correlation with each other, and an electronic component that does not satisfy the correlation is in contact with the second electrical characteristic. There is a high possibility that a defect has occurred. Therefore, an electronic component that does not satisfy such a correlation is selected based on the above determination criteria.

  In the second embodiment relating to the determination criterion, in the re-measurement necessity determination step, an electronic component other than the electronic component that can be determined to be a true defect is selected according to the determination criterion.

  More specifically, the second embodiment is preferably implemented as follows. That is, in the measurement process, when the first and second electrical characteristics are measured for at least the first and second measurement items measured by contact between the common external electrode and the measurement terminal, respectively, When only one of the first and second electrical characteristics is defective, it cannot be a contact failure of the measurement terminal to the external electrode. This is because if the contact is defective, both the first and second electrical characteristics are defective. Therefore, in the re-measurement necessity determination step, an electronic component other than the electronic component in which only one of the first and second electrical characteristics is defective is selected.

  The second embodiment relating to the above-described determination criteria may be implemented as follows. That is, in the measurement process, when the third electrical characteristic is measured for the third measurement item that cannot be measured when the contact failure of the measurement terminal to the external electrode occurs, the third electrical characteristic is measured. When the electrical characteristics are defective, the electronic component can be determined to be a true defect. Therefore, in the re-measurement necessity determination step, an electronic component other than the electronic component having a defective third electrical characteristic is selected.

  The above-described first and second embodiments relating to the determination criteria may be properly used as follows. That is, of the electronic parts that are judged as defective in the sorting process, the defect rate of the electronic parts excluding the electronic parts that are determined to be true defects is compared with a predetermined threshold value. In the case of high, in the re-measurement necessity determination step, according to the determination criteria according to the first embodiment, an electronic component that can be determined to be caused by the contact failure to the external electrode of the measurement terminal is selected, When the rate is lower than the threshold value, in the re-measurement necessity determination step, an electronic component other than the electronic component that can be determined to be a true defect is selected according to the determination criterion according to the second embodiment.

  The present invention also measures the electrical characteristics of an electronic component having a plurality of external electrodes, with the measurement unit and the measurement unit measuring each of the plurality of external electrodes with the measurement terminals simultaneously in contact with each other. The present invention is also directed to a characteristic measuring / sorting device for electronic parts, which includes a sorting unit that sorts electronic parts into non-defective products and defective products according to measurement data.

  The electronic component characteristic measurement / sorting device according to the present invention is a poor contact of the measuring terminal to the external electrode, as judged from the measurement data measured by the measuring unit, out of the electronic components determined to be defective by the sorting unit. A re-measurement necessity determination unit is further provided for selecting electronic components that may be caused by the re-measurement necessity determination unit according to a specific determination criterion. It is characterized by being returned to the department.

  According to the present invention, not all electronic components that are defective in the first sorting step are sent to the second measuring step and the sorting step, but determined from the measurement data in the first measuring step. Execute a re-measurement necessity determination process that selects electronic components that may be caused by poor contact of the measurement terminals with the external electrodes according to specific criteria, and select them in this re-measurement necessity determination process. Only the electronic parts that have been processed are subjected to the second measurement process and the selection process. Therefore, the second measurement step and the selection step are performed only on electronic components that may need to be remeasured, and the number of remeasured electronic components can be reduced. The second measurement process and the selection process can be completed quickly.

  According to the first embodiment relating to the determination criterion in the re-measurement necessity determination step, the electronic component that can be determined to be caused by the contact failure of the measurement terminal to the external electrode is selected, so that the contact failure is Electronic parts that cannot be determined to be the cause are not sent to the second measurement process and sorting process regardless of whether or not they are true defects. As a result, the efficiency of the second measurement step and the selection step can be increased.

  On the other hand, according to the second embodiment relating to the determination criteria, in the re-measurement necessity determination step, an electronic component other than an electronic component that can be determined to be a true failure is selected, so that it is a true failure. Electronic parts that could not be judged are sent to the second measurement process and sorting process even if they are true defects. Therefore, the accuracy of characteristic measurement and selection can be improved, and the probability of being treated as a defective product even though it is a good product can be reduced.

  When the defective rate is higher than the threshold value by comparing the defective rate of the electronic component excluding the electronic component judged to be true defective among the electronic components determined as defective products in the sorting process with a predetermined threshold value Adopts the determination criterion according to the first embodiment, and when the defect rate is lower than the threshold, the determination criterion according to the second embodiment is adopted, so that the remeasurement necessity determination step is performed. However, the efficiency of the second measurement step and the selection step can be prevented from being lowered while reducing the number of electronic components that are processed as defective products despite being good products.

  FIG. 1 is a bottom view showing an electronic component 1 to which the present invention can be applied.

  The electronic component 1 is a module component including an electronic component body 2 configured with, for example, a multilayer circuit board. The electronic component 1 includes a plurality of, for example, six external electrodes 3 to 8 to serve as external connection terminals. The external electrodes 3 to 8 are formed so as to be exposed on at least the bottom surface 9 of the electronic component main body 2.

  In shipping such an electronic component 1, electrical characteristics are measured for several measurement items and sorted into non-defective products and defective products according to the measurement data obtained thereby. In the step of measuring electrical characteristics, electrical characteristics are measured for a plurality of measurement items in a state where measurement terminals (not shown) are simultaneously brought into contact with each of the six external electrodes 3 to 8.

  FIG. 2 is a flowchart for explaining the electronic component characteristic measurement / selection method according to the first embodiment of the present invention, which is performed in the electronic component characteristic measurement / selection apparatus. As shown in FIG. 2, in this embodiment, the measurement unit provided in the characteristic measurement / sorting apparatus includes the first station 12 and the second station 13, and the measurement step 11 performed in this measurement unit is the first step. The measurement is performed in two stages, such as measurement at one station 12 and subsequent measurement at the second station 13. In addition, the measurement process 11 may be implemented in 3 steps or more.

  FIG. 3 is a diagram showing measurement items measured at the first station 12 and the second station 13 shown in FIG. FIG. 3 also shows external electrodes used for measuring each measurement item.

  With reference to FIG. 3, in the first station 12, the external electrode 3 and 4 are used for the electrical characteristics of the measurement item A, the external electrodes 3 and 4 are used for the electrical property of the measurement item B, the external electrode 3. And 5 are used to measure the electrical characteristics of the measurement item C, and the external electrodes 3 and 6 are used to measure the electrical characteristics of the measurement item D.

  Next, in the second station 13, the external electrode 3 and 4 are used for the electrical characteristics for the measurement item A, the external electrode 3 and 8 are used for the electrical property for the measurement item E, and the external electrodes 3 and 5 are used. Then, the electrical characteristics of the measurement item F and the electrical characteristics of the measurement item D are measured using the external electrodes 3 and 6, respectively.

  Next, a sorting step 14 is performed in a sorting unit provided in the specific measurement / sorting device. In the sorting step 14, the quality of the electronic component 1 is determined according to the measurement data in the measuring step 11, and the non-defective product and the defective product are sorted based on the determination result. The electronic component 1 sorted as a non-defective product in the sorting process 14 is supplied to the non-defective product storage unit 15.

  On the other hand, the electronic component determined as a defective product in the sorting step 14 is not immediately supplied to the defective product storage unit 16 but is first sent to the re-measurement necessity determination unit provided in the specific measurement / selection device, Here, a remeasurement necessity determination step 17 for determining whether remeasurement is necessary is performed.

  More specifically, in the re-measurement necessity determination step 17, the external electrodes 3 to 8 of the measurement terminals are determined based on the measurement data in the measurement step 11 among the electronic components 1 determined to be defective in the selection step 14. The electronic component 1 that may be caused by a poor contact with the device is selected according to a specific criterion. Then, the measurement process 11 and the selection process 14 are performed again only for the electronic components 1 that are selected in the remeasurement necessity determination process 17 and need to be remeasured. Note that the repetition of the measurement process 11 and the selection process 14 is normally performed once, but may be performed a plurality of times in relation to the cost of the electronic component 1 to be handled.

  On the other hand, in the re-measurement necessity determination step 17, the electronic components 1 that are not selected because the re-measurement is unnecessary are supplied to the defective product storage unit 16.

  In particular, in this embodiment, in the re-measurement necessity determination step 17, the electronic component 1 that can be determined to be caused by poor contact of the measurement terminals with the external electrodes 3 to 8 is selected. Such a criterion is embodied as follows, for example.

  With reference to FIG. 3, the measurement item A measured at the first station 12 is also measured at the second station 13. In this case, if the measurement conditions at the first station 12 and the measurement conditions at the second station 13 are the same, the measurement value of the electrical characteristics measured at the first station 12 for the measurement item A is the second station. It must be substantially the same as the measured electrical property measured at 13. Alternatively, even if the measurement conditions at the first station 12 and the measurement conditions at the second station 13 are different from each other, the measurement value of the electrical characteristics measured at the first station 12 for the measurement item A is the second station 13. It should have at least a predetermined correlation with the measured value of the electrical characteristic measured in (1).

  Therefore, there is a high possibility that the electronic component 1 that does not satisfy this correlation has a poor contact with either of the external electrodes 3 and 4 of the measurement terminal. The measurement process 11 and the selection process 14 are selected.

  On the other hand, as described above, the electronic component 1 other than the electronic component 1 that can be determined to be caused by poor contact with the external electrodes 3 and 4 of the measurement terminal is true even though it may be poor contact. Regardless of whether it is defective or not, it is determined that re-measurement is unnecessary, and is sent to the defective product storage unit 16.

  FIG. 4 is a flowchart for explaining a characteristic measurement / selection method for an electronic component according to the second embodiment of the present invention. 4, elements corresponding to those shown in FIG. 2 are denoted by the same reference numerals, and redundant description is omitted. FIG. 5 is a diagram showing measurement items measured at the first and second stations 12 and 13 shown in FIG. 4, respectively, for explaining the second embodiment.

  In the second embodiment, as shown in FIG. 5, the electrical characteristics of the measurement items similar to those in the first embodiment are measured at the first and second stations 12 and 13. A sorting step 14 is performed. In the second embodiment, the determination criterion in the remeasurement necessity determination step 17a is different from the determination criterion in the remeasurement necessity determination step 17 in the first embodiment.

  In the second embodiment, in the remeasurement necessity determination step 17a, an electronic component 1 other than the electronic component 1 that can be determined to be a true defect is selected. This determination criterion is embodied as follows, for example.

  As shown in FIG. 5, the measurement items A and B measured at the first station 12 are both measured by contact between the external electrodes 3 and 4 and the measurement terminals. In such a case, under the situation where the measured value of the electrical characteristic for only one of the measurement items A and B is defective, the contact of the measuring terminal to the external electrodes 3 and 4 is poor. There is no room to think about. This is because if the contact is poor, the measured values of the electrical characteristics of both the measurement items A and B are defective.

  Therefore, in the re-measurement necessity determination step 17a, the electronic component 1 other than the electronic component 1 in which the measured value of the electrical property for only one of the measurement items A and B is defective is selected, The measurement process 11 and the selection process 14 are sent. Therefore, according to the second embodiment, the electronic component 1 that could not be determined to be a true failure is sent to the second measurement step 11 and the selection step 14 even if it is a true failure. As a result, the accuracy of characteristic measurement and selection is improved, and the probability of being processed as a defective product can be reduced even though it is a non-defective product.

  FIG. 6 is a diagram corresponding to FIG. 5 for explaining the third embodiment. The third embodiment is a modification of the second embodiment, and the basic configuration of the characteristic measurement / selection method according to the third embodiment is shown in FIG.

  In the third embodiment, attention is paid to the measurement item D at the first station 12 or the measurement item D at the second station 13. The electrical characteristics of the measurement item D are known to be not measurable unless the measurement terminal is in proper contact with the external electrodes 3 to 8, for example, “consumption current”.

  Therefore, the electrical characteristics of the measurement item D can be measured, and if the measured value of the electrical characteristics is defective, the electronic component 1 can be determined as a true defect. As a result, in the re-measurement necessity determination step 17a shown in FIG. 4, an electronic component 1 other than the electronic component 1 whose electrical property measurement value for the measurement item D is defective is selected.

  In the second and third embodiments described above, the determination criterion in the re-measurement necessity determination step 17a is based only on the measurement items measured at one station in the measurement step 11, for example, the first station 12. Therefore, the second or third embodiment can be applied even when the measurement process 12 is not performed in a plurality of stages.

  The first embodiment and the second or third embodiment described above may be properly used as follows. That is, the defect rate of the electronic component 1 excluding the electronic component 1 determined to be a true defect out of the electronic components 1 determined as defective in the selection process is compared with a predetermined threshold value to determine the threshold. If it is higher than the value, the first embodiment shown in FIG. 2 is adopted, and it can be determined in the remeasurement necessity determination step 17 that the measurement terminal is caused by poor contact with the external electrodes 3 to 8. When the electronic component 1 is selected for remeasurement and the defect rate is lower than the threshold value, the second or third embodiment shown in FIG. In step 17a, an electronic component 1 other than the electronic component 1 that can be determined to be a true defect is selected for remeasurement.

  More specifically, the electronic components 1 selected by the characteristic measurement / sorting apparatus according to the present invention are “good”, “defect caused by poor contact of terminals”, “true defect”, and “ It is stored separately in trays (boxes) of “not good (not bad terminal contact but not true bad)”. When a certain number of measurement selections have been completed, the ratio of the total number of “defects caused by poor contact of terminals” and “defects that cannot be said to be” to the total number is calculated and set as a defect rate. Compare the threshold value. If the defect rate is larger than the threshold, only “defect caused by terminal contact failure” is re-measured, and if the defect rate is less than the threshold, “defect caused by terminal contact failure” and Both of “defects that cannot be said” are sent to remeasurement.

  When the first embodiment and the second or third embodiment are properly used in this way, the second measurement is performed while reducing the number of electronic components 1 that are processed as defective despite being good products. The efficiency of the process and the sorting process can be prevented from being lowered.

It is a bottom view which shows an example of the electronic component to which this invention is applied. It is a flowchart for demonstrating the characteristic measurement and selection method of the electronic component by 1st Embodiment of this invention. It is a figure which shows the measurement item measured in the 1st and 2nd station 12 and 13 shown in FIG. 2, respectively, Comprising: It is for demonstrating 1st Embodiment. It is a flowchart for demonstrating the characteristic measuring / selecting method of the electronic component by 2nd Embodiment of this invention. It is a figure corresponding to FIG. 3, Comprising: It is for demonstrating 2nd Embodiment. It is a figure corresponding to FIG. 5, Comprising: It is for demonstrating 3rd Embodiment.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Electronic component 3-8 External electrode 11 Measuring process 12 1st station 13 2nd station 14 Sorting process 17, 17a Re-measurement necessity judgment process

Claims (8)

Measuring the electrical characteristics of an electronic component having a plurality of external electrodes in a state in which a measurement terminal is simultaneously in contact with each of the plurality of external electrodes,
According to the measurement data in the measurement step, the electronic component is classified into a non-defective product and a defective product.
Of the electronic components that are determined to be defective in the sorting step, an electronic component that may be caused by poor contact of the measurement terminal with the external electrode, as determined from the measurement data in the measurement step Further comprising a re-measurement necessity determination step for selecting according to a specific determination criterion,
An electronic component characteristic measurement / selection method, wherein the measurement step and the selection step are performed again on the electronic component selected in the re-measurement necessity determination step.   2. The electronic component according to claim 1, wherein in the re-measurement necessity determination step, an electronic component that can be determined to be caused by poor contact of the measurement terminal with the external electrode is selected according to the determination criterion. Characteristics measurement and sorting method.   The measurement step includes first and second measurement steps that are sequentially performed, and a first electrical characteristic and a second measurement step for at least one of the measurement items measured in the first measurement step. The second electrical characteristic of at least one of the measurement items measured in the above should have a predetermined correlation with each other, and according to the determination criteria in the re-measurement necessity determination step, The method for measuring and selecting characteristics of an electronic component according to claim 2, wherein an electronic component in which the first electrical characteristic and the second electrical characteristic do not satisfy the correlation is selected.   The electronic component characteristic measurement / selection method according to claim 1, wherein, in the re-measurement necessity determination step, an electronic component other than an electronic component that can be determined to be a true defect is selected according to the determination criterion.   In the measurement step, first and second electrical characteristics are measured for at least first and second measurement items measured by contact between the common external electrode and the measurement terminal, respectively. The electronic component other than the electronic component in which only one of the first and second electrical characteristics is defective is selected based on the determination criterion in the measurement necessity determination step. Measurement and selection method for electronic parts.   In the measurement step, when a contact failure of the measurement terminal to the external electrode occurs, a third electrical characteristic is measured for a third measurement item that cannot be measured, and the necessity of the remeasurement is determined. The electronic component characteristic measurement / selection method according to claim 4, wherein an electronic component other than the electronic component having the third electrical characteristic that is defective is selected based on the determination criterion in the determination step.   A step of comparing a failure rate of electronic components, excluding electronic components determined to be true failures, among electronic components determined as defective products in the sorting step with a predetermined threshold; If it is higher than the threshold value, in the re-measurement necessity determination step, according to the determination criterion, an electronic component that can be determined to be caused by poor contact with the external electrode of the measurement terminal is selected. When the defect rate is lower than the threshold value, in the remeasurement necessity determination step, an electronic component other than an electronic component that can be determined to be a true defect is selected according to the determination criterion. Item 2. A method for measuring and sorting characteristics of electronic components according to Item 1. A measurement unit that measures electrical characteristics of an electronic component having a plurality of external electrodes in a state in which a measurement terminal is in contact with each of the plurality of external electrodes, and
According to the measurement data measured by the measurement unit, the electronic component is classified into a non-defective product and a defective product.
Among the electronic components that are determined as defective products in the sorting unit, an electronic device that may be caused by poor contact of the measurement terminal with the external electrode, as determined from measurement data measured by the measurement unit Further comprising a re-measurement necessity determination unit that selects parts according to a specific criterion,
The electronic component characteristic measurement / selection apparatus, wherein the electronic component selected by the re-measurement necessity determination unit is returned to the measurement unit and the selection unit again.

Images