JPH06331327A - Inspection of cream solder printing state - Google Patents

Inspection of cream solder printing state

Info

Publication number
JPH06331327A
JPH06331327A JP11971993A JP11971993A JPH06331327A JP H06331327 A JPH06331327 A JP H06331327A JP 11971993 A JP11971993 A JP 11971993A JP 11971993 A JP11971993 A JP 11971993A JP H06331327 A JPH06331327 A JP H06331327A
Authority
JP
Japan
Prior art keywords
bridge
land
cream solder
measurement window
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11971993A
Other languages
Japanese (ja)
Other versions
JP3129026B2 (en
Inventor
Toshihiko Tsujikawa
俊彦 辻川
Yasushi Mizuoka
靖司 水岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP05119719A priority Critical patent/JP3129026B2/en
Publication of JPH06331327A publication Critical patent/JPH06331327A/en
Application granted granted Critical
Publication of JP3129026B2 publication Critical patent/JP3129026B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

PURPOSE:To judge the bridge inferiority at the time of the printing of cream solder from the continuity of a bridged land. CONSTITUTION:The bridge inferiority at the time of the printing of solder is inspected by performing an image input processing process receiving an image from an imaging means to store the same in an image memory means, a contour tracking process 1 tracking the contour of solder with respect to the stored image, a process 2 calculating the distance (land) moved at the time of the process 1, a process 3 judging a continuous bridge by the process 2 and a process 4 moving to a next inspection land. By this constitution, this inspection method can correspond to such a phenomenon that bonding inferiority becomes hard to generate at the time of the printing of cream solder by one bridge but becomes easy to generate by a continuous bridge developed in a process using a nitrogen reflow furnace and can achieve the lowering of a line-out ratio in the inspection at the time of the printing of solder.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、表面実装分野におい
て、クリーム半田印刷装置により印刷されたクリーム半
田の印刷状態検査を行う、クリーム半田印刷状態の検査
方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cream solder printing state inspection method for inspecting the print state of cream solder printed by a cream solder printing apparatus in the field of surface mounting.

【0002】[0002]

【従来の技術】近年、プリント回路基板の高密度実装化
が進み、人手による検査・修正が困難になる中、実装検
査装置の導入が行われている。特にクリーム半田印刷工
程でのブリッジ不良はそのまま接合不良になりやすいた
め、そのブリッジ不良を判定する検査アルゴリズムを搭
載したクリーム半田印刷検査装置が開発されている。
2. Description of the Related Art In recent years, a mounting inspection apparatus has been introduced while a high density mounting of a printed circuit board is progressing and it becomes difficult to inspect and correct manually. In particular, since a bridging defect in the cream solder printing process is likely to result in a bonding defect as it is, a cream solder printing inspection device equipped with an inspection algorithm for determining the bridging defect has been developed.

【0003】以下図面を参照しながら、上述した従来の
ブリッジ不良の判定アルゴリズムの一例について説明す
る。
An example of the conventional bridging failure determination algorithm described above will be described below with reference to the drawings.

【0004】第7図は従来処理の流れ図、第8図はその
イメージ図である。第7図において26は計測窓設置工
程、27は輪郭追跡処理工程、28はブリッジ幅検出処
理工程、29はブリッジ不良判定処理工程である。第8
図において、30は検査開始ランド、31は計測窓、3
2は輪郭追跡開始点、33は半田輪郭と計測窓31との
交点、34は交点31からの余裕幅、35はリードピッ
チ幅、36はブリッジ計測窓、37は最小ブリッジ幅で
ある。
FIG. 7 is a flow chart of conventional processing, and FIG. 8 is an image diagram thereof. In FIG. 7, 26 is a measurement window installation process, 27 is a contour tracking process process, 28 is a bridge width detection process process, and 29 is a bridge defect determination process process. 8th
In the figure, 30 is an inspection start land, 31 is a measurement window, 3
2 is a contour tracing start point, 33 is an intersection between the solder contour and the measurement window 31, 34 is a margin width from the intersection 31, 35 is a lead pitch width, 36 is a bridge measurement window, and 37 is a minimum bridge width.

【0005】計測窓設置処理工程26において検査開始
ランド30に計測窓31を設置する。その後、輪郭追跡
処理工程において輪郭追跡開始点32から順次計測窓3
1内の半田の輪郭を追跡することにより、計測窓31と
の交点33を求める。交点33が検出されないならば正
常とする。交点31が検出されたならブリッジ幅検出処
理工程において余裕幅34を持ち、リードピッチ幅35
のブリッジ計測窓36を設置し、その窓内での最小ブリ
ッジ幅37を計測する。その後ブリッジ不良判定処理工
程において計測された最小ブリッジ幅35とブリッジ判
定幅との比較、すなわち
In the measurement window installation processing step 26, the measurement window 31 is installed on the inspection start land 30. After that, in the contour tracing processing step, the measurement window 3 is sequentially arranged from the contour tracing starting point 32.
An intersection 33 with the measurement window 31 is obtained by tracing the outline of the solder in the sample 1. If the intersection 33 is not detected, it is regarded as normal. If the intersection 31 is detected, a margin width 34 is provided in the bridge width detection processing step, and a lead pitch width 35
The bridge measurement window 36 is installed, and the minimum bridge width 37 in the window is measured. After that, the minimum bridge width 35 measured in the bridge failure determination processing step is compared with the bridge determination width, that is,

【0006】[0006]

【数1】 [Equation 1]

【0007】の場合ブリッジ不良とする。In the case of "7", the bridge is defective.

【0008】[0008]

【発明が解決しようとする課題】しかしながら上記のよ
うな構成では、ランド1つ1つのブリッジ判定を行って
いる為、最近の窒素リフロー炉を用いた工程における。
1ランドのブリッジではリフロー炉内で切れてしまい正
常となることが多く、ランドが連続してブリッジしてい
る場合には全て切れることはなくどこかのランドがリフ
ロー後もブリッジ不良になるという現象には対応できな
い、すなわち印刷時のブリッジ不良とリフロー後のブリ
ッジ不良が一致しにくいという問題点を有していた。
However, in the above-mentioned configuration, since bridge determination is made for each land, it is in a process using a recent nitrogen reflow furnace.
A bridge of one land often breaks in the reflow furnace and becomes normal, and if the lands are continuously bridged, all the bridges will not be broken and some land will become defective even after reflow. However, there is a problem in that it is difficult to match a bridge defect during printing and a bridge defect after reflow.

【0009】[0009]

【課題を解決するための手段】上述したような問題点を
解決するために、ブリッジ不良の判定をブリッジしてい
るランドの連続性から判定する機能を付加した、クリー
ム半田印刷検査方法を提供することを目的とする。
In order to solve the above problems, there is provided a cream solder printing inspection method to which a function of judging a bridging defect judgment from the continuity of lands bridging is added. The purpose is to

【0010】[0010]

【作用】本発明は上記した構成によって、特に窒素リフ
ロー炉を用いた工程において、半田印刷時における1つ
のランドだけのブリッジ不良ではリフロー後に不良にな
らず、連続ランドの不良時には、リフロー後にも不良に
なりやすいという現象に対応が可能になる。
According to the present invention, with the above-described structure, particularly in a process using a nitrogen reflow furnace, a bridge failure of only one land at the time of solder printing does not cause a failure after reflow, and a failure of a continuous land causes a failure after reflow. It becomes possible to deal with the phenomenon that it is easy to become.

【0011】[0011]

【実施例】【Example】

(実施例1)以下本発明の実施例のクリーム半田印刷時
におけるブリッジ不良判定アルゴリズムについて説明す
る。
(Embodiment 1) Hereinafter, a bridging defect determination algorithm during cream solder printing according to an embodiment of the present invention will be described.

【0012】発明者らは、窒素リフロー炉を用いた実装
工程において印刷不良と接合不良の相関関係を調査した
ところ以下の様なことが分かった。
The inventors of the present invention have investigated the correlation between defective printing and defective bonding in the mounting process using a nitrogen reflow furnace, and found the following.

【0013】印刷時におけるブリッジで、1つのランド
だけの場合は、リフロー中に切れてしまい良品となるこ
とが多く、連続したランドのブリッジ(5〜10ラン
ド)の場合は、全てリフロー中に切れることはなく、そ
の中で1つは接合不良を起こす場合が多い。
In the case of a bridge at the time of printing, if it is only one land, it often breaks during reflow and becomes a non-defective product, and if it is a bridge of continuous lands (5 to 10 lands), it all breaks during reflow. However, one of them often causes a defective joint.

【0014】そこで、この様な現象が検査できる様に印
刷時のブリッジ判定をその連続性から判定する機能を付
加した検査アルゴリズムについて、図面を参照しながら
説明する。
Therefore, an inspection algorithm having a function of judging the bridge judgment at the time of printing from its continuity so that such a phenomenon can be inspected will be described with reference to the drawings.

【0015】第1図は、本発明の第1実施例における処
理の流れ図、第2図はそのイメージ図である。第1図に
おいて、1は輪郭追跡処理工程、2移動距離ランド算出
処理工程、3は連続ブリッジ判定処理工程、4は次検査
ランド移動処理工程である。第2図において、5は検査
開始ランド、6は輪郭追跡開始点7,8はそれぞれ輪郭
追跡処理工程1において検出された座標値の中で、Y座
標が最大値をとるXY座標値、Y座標が最小値をとるX
Y座標値で、9はランドピッチ幅、10は次検査ラン
ド、11はあらかじめ知らせれている検査開始ランド5
の中心座標、12はあらかじめ知らされている次検査ラ
ンドの中心座標である。
FIG. 1 is a flow chart of processing in the first embodiment of the present invention, and FIG. 2 is an image diagram thereof. In FIG. 1, 1 is a contour tracking processing step, 2 is a moving distance land calculation processing step, 3 is a continuous bridge determination processing step, and 4 is a next inspection land moving processing step. In FIG. 2, 5 is an inspection start land, 6 is a contour tracking start point 7, 8 is an XY coordinate value and a Y coordinate where the Y coordinate has the maximum value among the coordinate values detected in the contour tracking processing step 1, respectively. Is the minimum X
Y coordinate value, 9 is the land pitch width, 10 is the next inspection land, 11 is the previously announced inspection start land 5
Is the center coordinate of 12 and the center coordinate of the next inspection land is known in advance.

【0016】まず、輪郭追跡処理工程1におて、入力さ
れた画像内で、任意の検査開始ランド5上の半田輪郭追
跡開始点6から順次半田の輪郭追跡を開始点6に戻るま
で行う。この時同時に輪郭追跡点の中でY座標が最大値
をとるXY座標値7(Xa,Xmax)及び、Y座標が最
小値をとるXY座標値8(Xb,Ymin)を求まる。次
に移動距離(ランド)算出処理工程において、XY座標
7,8とランドピッチ幅9を用いた。
First, in the contour tracing processing step 1, the solder contour tracing starting point 6 on an arbitrary inspection start land 5 is sequentially performed in the input image until the solder contour tracing is returned to the starting point 6. At this time, the XY coordinate value 7 (Xa, Xmax) at which the Y coordinate takes the maximum value and the XY coordinate value 8 (Xb, Ymin) at which the Y coordinate takes the minimum value are simultaneously obtained in the contour tracing points. Next, in the movement distance (land) calculation processing step, the XY coordinates 7 and 8 and the land pitch width 9 were used.

【0017】[0017]

【数2】 [Equation 2]

【0018】によりいくつのランド半田を追跡したのか
を算出する。そして、連続ブリッジ判定処理工程3にお
いては、連続ブリッジ不良判定ランド数Nと(式1)の
値を比較し
The number of land solders traced is calculated by the following. Then, in the continuous bridge determination processing step 3, the number N of continuous bridge failure determination lands and the value of (Equation 1) are compared.

【0019】[0019]

【数3】 [Equation 3]

【0020】の場合、連続ブリッジ不良とする。全ラン
ド検査が終了していない場合には、次検査ランド移動処
理工程4で、検査開始ランドの中心位置に(式1)の値
を付加した、次検査ランド中心位置へ移動し、輪郭追跡
処理工程1から同様の処理を行う。
In the case of (2), it is considered as a continuous bridge failure. If all lands have not been inspected, in the next inspection land movement processing step 4, the center position of the inspection start land is moved to the next inspection land center position where the value of (Equation 1) is added, and contour tracing processing is performed. The same process is performed from step 1.

【0021】(実施例2)第3図は、本発明の第2実施
例における処理の流れ図、第4図はそのイメージ図であ
る。
(Embodiment 2) FIG. 3 is a flow chart of processing in a second embodiment of the present invention, and FIG. 4 is an image diagram thereof.

【0022】第3図において、13は計測窓設置処理、
14はブリッジ幅検出処理である。第4図において、1
5は検査開始ランド、16は計測窓、16はブリッジ計
測窓である。
In FIG. 3, 13 is a measurement window setting process,
Reference numeral 14 is a bridge width detection process. In FIG. 4, 1
Reference numeral 5 is an inspection start land, 16 is a measurement window, and 16 is a bridge measurement window.

【0023】まず、計測窓設置処理工程13において、
検査開始ランド15に対し、計測窓16、及びブリッジ
幅検出処理工程14においてブリッジ計測窓16を設置
することによりブリッジ不良を検出する従来法によりブ
リッジ不良となったランドのみ実施例1を適用する。
First, in the measurement window installation processing step 13,
The first embodiment is applied only to the land where the bridge failure has been detected by the conventional method of detecting the bridge failure by installing the bridge measurement window 16 in the bridge width detection processing step 14 with respect to the inspection start land 15.

【0024】(実施例3)第5図は本発明の第3実施例
における処理の流れ図、第6図はそのイメージ図であ
る。第5図において、18は計測窓設置処理工程、19
は輪郭追跡処理工程、20はブリッジ幅、面積検出処理
工程、21はリード方向別ランド番号でのデータ並びか
え処理工程、22は連続ブリッジ判定処理工程である。
第6図において、23は検査開始ランド、24は計測
窓、25はブリッジ計測窓である。
(Embodiment 3) FIG. 5 is a flow chart of processing in a third embodiment of the present invention, and FIG. 6 is an image diagram thereof. In FIG. 5, 18 is a measurement window installation processing step, and 19
Is a contour tracking processing step, 20 is a bridge width and area detection processing step, 21 is a data rearrangement processing step by land number by read direction, and 22 is a continuous bridge determination processing step.
In FIG. 6, 23 is an inspection start land, 24 is a measurement window, and 25 is a bridge measurement window.

【0025】従来例通り、計測窓設置工程18により、
計測窓24を設置し、輪郭追跡処理工程19の後、ブリ
ッジ計測窓25と設置する。その後、ブリッジ幅、面積
検出処理工程20において、最小ブリッジ幅d、ブリッ
ジ計測窓25内の半田面積計測Sを行う。以上の処理を
全ランド終了したならば、次にリード方向別にランド番
号で上述したデータの並びかえ処理工程にて、データの
並びかえを行う。その後、連続ブリッジ判定処理工程に
て、連続したランド数N、及びその連続したランドのブ
リッジ幅の総和
As in the conventional example, by the measurement window installation step 18,
The measurement window 24 is installed, and after the contour tracking processing step 19, the bridge measurement window 25 is installed. Then, in the bridge width / area detection processing step 20, the minimum bridge width d and the solder area measurement S in the bridge measurement window 25 are performed. When all the lands have been subjected to the above processing, data rearrangement is performed in the data rearrangement processing step described above by land number for each read direction. After that, in the continuous bridge determination processing step, the total number N of continuous lands and the bridge width of the continuous lands

【0026】[0026]

【外1】 [Outer 1]

【0027】面積の総和Total area

【0028】[0028]

【外2】 [Outside 2]

【0029】を求め、各々の判定規準値との比較、例え
Is obtained and compared with each criterion value, for example,

【0030】[0030]

【数4】 [Equation 4]

【0031】ならば連続ブリッジ不良とする。If so, it is determined as a continuous bridge failure.

【0032】[0032]

【発明の効果】以上のように本発明は、クリーム半田印
刷時におけるブリッジ不良の判定を、その連続性から判
定する機能を付加したことにより、窒素リフロー炉を用
いた工程に見られる1回のブリッジでは接合不良になり
にくいが、連続回数のブリッジはどこか接合不良を起こ
しやすいという現象に対応が可能となり、印刷検査にお
けるラインアウト率も低下させることができる。
As described above, according to the present invention, by adding the function of judging the bridge failure at the time of cream solder printing from the continuity thereof, it is possible to perform the one-time process found in the process using the nitrogen reflow furnace. Although it is difficult for a bridge to have a defective joint, it is possible to deal with a phenomenon that a continuous number of bridges are likely to cause a defective joint, and the line-out rate in the print inspection can be reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明における第1実施例の処理流れ図FIG. 1 is a process flow chart of a first embodiment of the present invention.

【図2】本発明における第1実施例の処理イメージを表
わしたランドの平面図
FIG. 2 is a plan view of a land showing a processing image of the first embodiment of the present invention.

【図3】本発明における第2実施例の処理流れ図FIG. 3 is a processing flowchart of a second embodiment of the present invention.

【図4】同、処理イメージを表したランドの平面図FIG. 4 is a plan view of a land showing a processing image of the same.

【図5】本発明における第3実施例の処理流れ図FIG. 5 is a processing flowchart of a third embodiment of the present invention.

【図6】同、処理イメージを表したランドの平面図FIG. 6 is a plan view of a land showing a processing image of the same.

【図7】従来例の処理流れ図FIG. 7 is a processing flow chart of a conventional example.

【図8】同、処理イメージを表したランドの平面図FIG. 8 is a plan view of a land showing a processing image of the same.

【符号の説明】[Explanation of symbols]

1 輪郭追跡処理工程 2 移動距離(ランド)算出処理工程 3 連続ブリッジ判定処理工程 4 次検査ランド移動処理工程 5 検査開始ランド 6 輪郭追跡開始点 7 Y座標値が最大値である半田輪郭部のXY座標 8 Y座標値が最小値である半田輪郭部のXY座標 9 ランドピッチ幅 10 次検査ランド 11 検査開始ランドの中心座標 12 次検査ランドの中心座標 13 計測窓設置処理 14 ブリッジ幅検出処理 15 検査開始ランド 16 計測窓 17 ブリッジ幅計測窓 18 計測窓設置処理工程 19 輪郭追跡処理工程 20 ブリッジ幅、面積検出処理工程 21 リード方向別、ランド番号でのデータ並びかえ処
理工程 22 連続ブリッジ判定処理工程 23 検査開始ランド 24 計測窓 25 ブリッジ計測窓 26 計測窓設置処理工程 27 輪郭追跡処理工程 29 ブリッジ判定処理工程 30 検査開始ランド 31 計測窓 32 輪郭追跡開始点 33 半田輪郭部と計測窓との交点 34 余裕幅 35 ランドピッチ幅 36 ブリッジ計測窓 37 最小ブリッジ幅
1 contour tracking processing step 2 movement distance (land) calculation processing step 3 continuous bridge determination processing step 4th inspection land movement processing step 5 inspection start land 6 contour tracking start point 7 XY of solder contour part where Y coordinate value is maximum Coordinates 8 XY coordinates of the solder contour part where the Y coordinate value is the minimum value 9 Land pitch width 10th inspection land 11 Central coordinates of inspection start land 12 Central coordinates of secondary inspection land 13 Measurement window installation processing 14 Bridge width detection processing 15 Inspection Start land 16 Measurement window 17 Bridge width measurement window 18 Measurement window installation processing step 19 Contour tracking processing step 20 Bridge width, area detection processing step 21 Data rearrangement processing step by lead direction and land number 22 Continuous bridge determination processing step 23 Inspection start land 24 Measuring window 25 Bridge measuring window 26 Measuring window installation process 27 Contouring Step 29 bridging determination process 30 inspection start land 31 measuring window 32 contour intersection 34 margin width 35 land pitch of the measuring window tracking start point 33 solder contour 36 bridge measuring window 37 minimum bridge width

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 クリーム半田印刷時におけるリード付電
子部品などに発生しやすい多ランドに渡る連続した連続
ブリッジ不良の検査を撮像手段により画像を入力し画像
記憶手段に格納する画像入力処理工程の後、クリーム半
田の輪郭を順次追跡していく第1工程と、第1工程にお
ける移動距離を算出する第2工程と、第2工程の結果と
判定値の比較により連続ブリッジ不良の判定を行う第3
工程と、さらに第2工程の結果より次検査対象物へ移動
する第4工程により行うことを特徴としたクリーム半田
印刷状態の検査方法。
1. An image input processing step in which an image is input by an image pickup means and an image is stored in an image storage means for an inspection of continuous continuous bridge defects over multiple lands that are likely to occur in electronic components with leads during cream solder printing. , A first step of sequentially tracing the contour of the cream solder, a second step of calculating a moving distance in the first step, and a third step of judging a continuous bridge failure by comparing the result of the second step with a judgment value.
A method of inspecting a cream solder printing state, which comprises performing a step and a fourth step of moving to a next inspection object based on a result of the second step.
【請求項2】 第1工程の前に計測窓を設置する第5工
程と、第5工程で設置した計測窓内におけるクリーム半
田の輪郭を順次追跡していく第6工程と、第6工程の結
果より、ブリッジ計測窓を設置し、ブリッジ幅を計測す
る第7工程と、第7工程の結果と判定値との比較により
単ランドブリッジ不良を判定する第8工程を行うことを
特徴とした請求項1記載のクリーム半田印刷状態の検査
方法。
2. A fifth step of installing a measurement window before the first step, a sixth step of sequentially tracing the contour of the cream solder in the measurement window installed in the fifth step, and a sixth step of the sixth step. From the results, the seventh step of installing the bridge measurement window and measuring the bridge width, and the eighth step of judging the single land bridge failure by comparing the result of the seventh step with the judgment value are characterized. Item 3. A method for inspecting a printed state of cream solder according to Item 1.
【請求項3】 クリーム半田印刷時における連続ブリッ
ジ不良の検査を、撮像手段により画像入力を行い画像記
憶手段に格納する画像入力が処理工程の後、計測窓を設
置する第1工程と、第1工程で設置した計測窓内におけ
るクリーム半田の輪郭を順次追跡する第2工程と、第2
工程の結果より、ブリッジ計測窓を設置しブリッジ幅、
ブリッジ計測窓内半田面積を計測する第3工程と、第3
工程の結果と判定値との比較により単ランドブリッジ不
良を判定する第4工程と第4工程の結果をランド番号に
より並びかえる第5工程と、第5工程の結果である。ラ
ンド番号の連続数、その連続したランドにおけるブリッ
ジ幅の総和、またそのブリッジ計測窓内の面積の総和と
それぞれの判定値との比較による連続ブリッジの判定を
行う第6工程により行うことを特徴としたクリーム半田
印刷状態の検査方法。
3. A first step of installing a measurement window after the processing step of image input by the image pickup means and image storage for storing the image in the image storage means for the inspection of a continuous bridge defect at the time of cream solder printing. A second step of sequentially tracing the contour of the cream solder in the measurement window installed in the step, and a second step
From the result of the process, install the bridge measurement window and set the bridge width,
A third step of measuring the solder area in the bridge measurement window, and a third step
It is the result of the 4th process which determines a single land bridge failure by comparing the result of a process, and a judgment value, the 5th process which rearranges the result of the 4th process by a land number, and the result of the 5th process. It is characterized by performing a sixth step of judging continuous bridges by comparing the number of consecutive land numbers, the sum of bridge widths in the consecutive lands, and the sum of areas in the bridge measurement window with respective judgment values. The method of inspecting the printed state of cream solder.
JP05119719A 1993-05-21 1993-05-21 Inspection method of cream solder printing condition Expired - Fee Related JP3129026B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP05119719A JP3129026B2 (en) 1993-05-21 1993-05-21 Inspection method of cream solder printing condition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP05119719A JP3129026B2 (en) 1993-05-21 1993-05-21 Inspection method of cream solder printing condition

Publications (2)

Publication Number Publication Date
JPH06331327A true JPH06331327A (en) 1994-12-02
JP3129026B2 JP3129026B2 (en) 2001-01-29

Family

ID=14768428

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110216186A1 (en) * 2010-03-03 2011-09-08 Ckd Corporation Solder printing inspection apparatus and solder printing system
CN104614385A (en) * 2015-02-06 2015-05-13 北京中科纳新印刷技术有限公司 Microscopic quality detection method for printing, platemaking and imaging
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JPWO2021144981A1 (en) * 2020-01-17 2021-07-22

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110216186A1 (en) * 2010-03-03 2011-09-08 Ckd Corporation Solder printing inspection apparatus and solder printing system
JP2011180058A (en) * 2010-03-03 2011-09-15 Ckd Corp Solder printing inspection device and solder print system
CN102192912A (en) * 2010-03-03 2011-09-21 Ckd株式会社 Solder printing inspection apparatus and solder printing system
US8754938B2 (en) 2010-03-03 2014-06-17 Ckd Corporation Solder printing inspection apparatus and solder printing system
CN104614385A (en) * 2015-02-06 2015-05-13 北京中科纳新印刷技术有限公司 Microscopic quality detection method for printing, platemaking and imaging
JPWO2021144981A1 (en) * 2020-01-17 2021-07-22
WO2021144981A1 (en) * 2020-01-17 2021-07-22 株式会社Fuji Inspection device and inspection method
CN111816579A (en) * 2020-07-10 2020-10-23 英特尔产品(成都)有限公司 Method and apparatus for detecting chips contaminated with flux residue
CN111816579B (en) * 2020-07-10 2023-04-07 英特尔产品(成都)有限公司 Method and apparatus for detecting chips contaminated with flux residue

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