JP2007036461A - Method of specifying noise source of solid-state image pickup device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To easily and positively specify which part mainly causes a noise in a solid-state image pickup device. <P>SOLUTION: In a CCD 2; drives of a photoelectric conversion element (PD) 10, a vertical CCD (VCCD) 11, a horizontal CCD (HCCD) 12, a floating diffusion (FD) unit 14, and a source follower circuit (SF) 17, are each stopped one by one in this order to stop the drives of all the sections, and units are obtained in every stopping. By subtracting a noise obtained when the drive is stopped from a noise obtained when all the units are driven; a noise caused in a unit whose drive is stopped, and the main source of the noise is specified. Thus, countermeasures for reducing noises can be sought, and effects after execution of the countermeasures can also be verified. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to a method for specifying a main generation source of noise generated when a solid-state imaging device is driven with light shielding.

A CCD image sensor (CCD) is known as a solid-state image sensor mounted on a digital camera or the like. Recently, the miniaturization of the CCD has progressed, and an improvement in resolution due to an increase in the number of pixels is expected. However, on the other hand, there is a concern about the deterioration of the S / N ratio under a minute light amount condition, and there is an urgent need to establish a method for improving this (see Non-Patent Document 1).
"Random noise of image sensors and issues of element reduction", Nikkei Microdevices, June 1986 issue

  In order to improve the S / N ratio of the CCD under a minute light amount condition, the present inventors have studied the above problems on a daily basis, and it is necessary to reduce the noise generated when the CCD is driven while being shielded from light. I found it effective. However, a new problem has arisen that a measure for reducing noise cannot be taken unless the location of the main source of noise in the CCD is specified.

  The present invention has been made in view of the above-described problems, and provides a noise generation source identification method for a solid-state imaging device that can easily and reliably identify the location of the main generation source of noise. Objective.

  In order to achieve the above object, the present invention provides a photoelectric conversion element that converts incident light into a signal charge corresponding to the amount of light, accumulates it, a transfer path that transfers signal charge from the photoelectric conversion element, and a transfer path. A method for identifying a main source of noise generated when a solid-state imaging device having a floating diffusion amplifier that converts a transferred signal charge into a signal voltage and outputs the signal voltage is driven to be shielded from light. , Stop driving one place at a time in the order of the transfer path and the floating diffusion amplifier, and stop driving all the places, determine the noise generated each time, from the noise obtained when driving all the places By subtracting the noise obtained when the drive was stopped, the noise caused by the location where the drive was stopped was obtained, and the main source of noise was determined. Characterized in that it constant.

  The transfer path is provided for each vertical column of a plurality of photoelectric conversion elements that are two-dimensionally arranged in a matrix, and a plurality of vertical CCDs that vertically transfer signal charges from the photoelectric conversion elements, and a vertical CCD. The signal charge for one line transferred from the horizontal CCD is horizontally transferred, and when the noise of the transfer path is obtained, the drive is stopped in the order of the vertical CCD and the horizontal CCD.

  The floating diffusion amplifier includes a floating diffusion section that accumulates signal charges transferred from the transfer path, and a source follower circuit that converts the signal charges accumulated in the floating diffusion section into a voltage and outputs the voltage. When the noise of the floating diffusion amplifier is obtained, the driving is stopped in the order of the floating diffusion section and the source follower circuit.

  According to the noise generation source specifying method of the solid-state imaging device of the present invention, the driving is stopped one by one in the order of the photoelectric conversion element, the transfer path, and the floating diffusion amplifier, and the driving of all the locations is stopped each time. Determine the noise generated, subtract the noise obtained when the drive was stopped from the noise obtained when all the locations were driven, and obtain the noise caused by the location where the drive was stopped. Since the generation source is specified, it is possible to easily and reliably specify the location where the main generation source of the noise is.

  In FIG. 1, a CCD 2 is two-dimensionally arranged in a matrix, and is provided for each of a plurality of photoelectric conversion elements (PD) 10 that converts incident light into signal charges corresponding to the amount of light and accumulates it, and for each vertical column of the PD 10. A plurality of vertical CCDs (VCCDs) 11 that vertically transfer signal charges from each PD 10, a horizontal CCD (HCCD) 12 that horizontally transfers signal charges for one line transferred from the VCCD 11, and the HCCD 12. And a floating diffusion amplifier (FDA) 13 that converts the signal charge into a signal voltage and outputs the signal voltage.

  The FDA 13 includes a floating diffusion (FD) unit 14 that accumulates signal charges sequentially transferred from the HCCD 12, and a reset drain (RD) unit 15 to which a reset drain voltage is applied to sweep out signal charges of pixels that have been output. A reset gate (RG) unit 16 to which a reset pulse is input, and a source follower circuit (SF) 17 that converts a signal charge accumulated in the FD unit 14 into a voltage and outputs the voltage. In the FDA 13, the amount of change in the signal charge of the FD unit 14 is ΔQ, the change in voltage is ΔV, the capacitance is C, and conversion from signal charge to signal voltage is performed using a relational expression of ΔQ = CΔV.

  Here, when the CCD 2 is mounted on a real machine such as a digital camera and actually used, the linear calculation unit 18 is connected to the subsequent stage of the SF 17. The linear operation unit 18 performs linear operations such as correlated double sampling (CDS), amplification (AMP), and A / D conversion (A / D) on the signal voltage output from the SF 17 to obtain digital data QL. Is output.

  In the method for identifying the noise source of the solid-state imaging device according to the present invention, as indicated by the dotted line and the section of the arrow in the figure, first, the driving is stopped one by one in the order of PD10, VCCD11, HCCD12, FD unit 14, and SF17. And the drive of all the places is stopped, and the noise generated each time is obtained.

  The driving of the PD 10 is stopped by stopping the movement of signal charges from the PD 10 to the VCCD 11. The driving of the VCCD 11 and the HCCD 12 is stopped by stopping the movement of the signal charge from the VCCD 11 to the HCCD 12 and the movement of the signal charge from the HCCD 12 to the FD section 14. The driving of the FD unit 14 is stopped by applying a reset drain voltage to the RD unit 15. The driving of the SF 17 is stopped by stopping the driving of the linear calculation unit 18.

As described above, driving was stopped one by one and driving was stopped at all locations, and the generated noise was obtained. Then, driving was stopped from the noise N _total obtained when all locations were driven. By subtracting the noise that is sometimes obtained, noise (N _PD (noise due to PD10)), N _VCCD (noise due to _VCCD 11), N _HCCD (noise due to HCCD 12) due to the location where driving is stopped ), N _FD (noise due to FD section 14), N _SF (noise due to _SF 17), N _pass (noise due to the entire CCD 2 circuit system, noise obtained by stopping driving of all locations))) Determine the main source of noise. The noise is obtained by converting the digital data QL to analog and obtaining the root mean square. In addition, it is assumed that noise at each location is generated independently.

FIG. 2 shows an example of the calculation result of noise caused by each location obtained as described above. In this example, since the noise N _SF caused by the _SF 17 is the largest among the obtained noises, it can be specified that the main source of noise is the SF 17. In this case, as a measure for reducing the noise N _SF , it is assumed that the 1 / f noise and thermal noise of the MOSFET constituting the _SF 17 are fundamental causes, and the current amount and the W / L ratio are increased, or the gate film Reduce the thickness.

  As described above, the driving of each part constituting the CCD 2 is stopped one by one, the driving of all the parts is stopped, the noise caused by the stopped driving is obtained, and the main generation source of the noise Could be identified. As a result, it is possible to devise a measure for reducing noise and to verify the effect after the measure is taken.

It is a figure which shows schematic structure of CCD. It is a graph which shows an example of the calculation result of noise.

Explanation of symbols

2 CCD
10 Photoelectric conversion element (PD)
11 Vertical CCD (VCCD)
12 Horizontal CCD (HCCD)
13 Floating diffusion amplifier (FDA)
14 Floating diffusion (FD) section 17 Source follower circuit (SF)

Claims (3)

A photoelectric conversion element that converts incident light into signal charges corresponding to the amount of light, stores the photoelectric conversion elements, a transfer path that transfers signal charges from the photoelectric conversion elements, and a signal charge that is transferred by the transfer paths is converted into a signal voltage. A method of identifying a main source of noise generated when a solid-state imaging device having a floating diffusion amplifier to output is driven while being shielded from light.
Stop driving one by one in the order of the photoelectric conversion element, the transfer path, and the floating diffusion amplifier, and stop driving all locations, and determine the noise generated each time,
By subtracting the noise obtained when driving was stopped from the noise obtained when driving all locations, the noise caused by the location where driving was stopped was obtained.
A noise generation source specifying method for a solid-state imaging device, characterized in that a main generation source of noise is specified. The transfer path is provided for each vertical column of a plurality of photoelectric conversion elements arranged two-dimensionally in a matrix, and a plurality of vertical CCDs that vertically transfer a signal charge from each photoelectric conversion element;
It consists of a horizontal CCD that horizontally transfers signal charges for one line transferred from the vertical CCD,
2. The noise generation source specifying method for a solid-state imaging device according to claim 1, wherein the noise in the transfer path is obtained by stopping driving in the order of the vertical CCD and the horizontal CCD. The floating diffusion amplifier includes a floating diffusion unit that accumulates signal charges transferred from the transfer path;
A source follower circuit that converts the signal charge accumulated in the floating diffusion portion into a voltage and outputs the voltage.
The noise generation source identification of the solid-state imaging device according to claim 1 or 2, wherein when the noise of the floating diffusion amplifier is obtained, driving is stopped in order of the floating diffusion section and the source follower circuit. Method.

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