JP2007033327A5 - - Google Patents

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Publication number
JP2007033327A5
JP2007033327A5 JP2005219185A JP2005219185A JP2007033327A5 JP 2007033327 A5 JP2007033327 A5 JP 2007033327A5 JP 2005219185 A JP2005219185 A JP 2005219185A JP 2005219185 A JP2005219185 A JP 2005219185A JP 2007033327 A5 JP2007033327 A5 JP 2007033327A5
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JP
Japan
Prior art keywords
plate
defect detection
light
less
light projecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2005219185A
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English (en)
Japanese (ja)
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JP2007033327A (ja
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Publication date
Application filed filed Critical
Priority to JP2005219185A priority Critical patent/JP2007033327A/ja
Priority claimed from JP2005219185A external-priority patent/JP2007033327A/ja
Publication of JP2007033327A publication Critical patent/JP2007033327A/ja
Publication of JP2007033327A5 publication Critical patent/JP2007033327A5/ja
Pending legal-status Critical Current

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JP2005219185A 2005-07-28 2005-07-28 欠陥検出方法及び装置 Pending JP2007033327A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005219185A JP2007033327A (ja) 2005-07-28 2005-07-28 欠陥検出方法及び装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005219185A JP2007033327A (ja) 2005-07-28 2005-07-28 欠陥検出方法及び装置

Publications (2)

Publication Number Publication Date
JP2007033327A JP2007033327A (ja) 2007-02-08
JP2007033327A5 true JP2007033327A5 (https=) 2008-06-26

Family

ID=37792767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005219185A Pending JP2007033327A (ja) 2005-07-28 2005-07-28 欠陥検出方法及び装置

Country Status (1)

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JP (1) JP2007033327A (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5297717B2 (ja) * 2008-08-11 2013-09-25 キヤノン化成株式会社 欠陥検出装置及び欠陥検出方法
CN118392877B (zh) * 2024-06-26 2024-08-30 深圳市诚誉兴光电有限公司 一种扩散板缺陷检测装置及方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06235624A (ja) * 1992-12-15 1994-08-23 Hitachi Ltd 透明シートの検査方法とその装置
JP4056399B2 (ja) * 1993-10-25 2008-03-05 株式会社リコー 外観欠陥検査装置
JPH08327561A (ja) * 1995-06-05 1996-12-13 Nippon Sheet Glass Co Ltd 連続シート状物体の欠点検査装置
JP2001041719A (ja) * 1999-07-27 2001-02-16 Canon Inc 透明材の検査装置及び検査方法並びに記憶媒体
JP3696005B2 (ja) * 1999-10-14 2005-09-14 オリンパス株式会社 電子内視鏡装置
JP2004094031A (ja) * 2002-09-02 2004-03-25 Sumitomo Rubber Ind Ltd フィルム観察装置
JP4139265B2 (ja) * 2003-04-25 2008-08-27 オリンパス株式会社 電子内視鏡の光量制御装置

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