JP2007010659A5 - - Google Patents

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Publication number
JP2007010659A5
JP2007010659A5 JP2006176321A JP2006176321A JP2007010659A5 JP 2007010659 A5 JP2007010659 A5 JP 2007010659A5 JP 2006176321 A JP2006176321 A JP 2006176321A JP 2006176321 A JP2006176321 A JP 2006176321A JP 2007010659 A5 JP2007010659 A5 JP 2007010659A5
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JP
Japan
Prior art keywords
measuring device
position measuring
grating
scanning unit
structures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006176321A
Other languages
English (en)
Japanese (ja)
Other versions
JP5005969B2 (ja
JP2007010659A (ja
Filing date
Publication date
Priority claimed from DE102005029917A external-priority patent/DE102005029917A1/de
Application filed filed Critical
Publication of JP2007010659A publication Critical patent/JP2007010659A/ja
Publication of JP2007010659A5 publication Critical patent/JP2007010659A5/ja
Application granted granted Critical
Publication of JP5005969B2 publication Critical patent/JP5005969B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2006176321A 2005-06-28 2006-06-27 位置測定装置 Expired - Fee Related JP5005969B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102005029917.2 2005-06-28
DE102005029917A DE102005029917A1 (de) 2005-06-28 2005-06-28 Positionsmesseinrichtung

Publications (3)

Publication Number Publication Date
JP2007010659A JP2007010659A (ja) 2007-01-18
JP2007010659A5 true JP2007010659A5 (cg-RX-API-DMAC7.html) 2009-03-26
JP5005969B2 JP5005969B2 (ja) 2012-08-22

Family

ID=37110275

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006176321A Expired - Fee Related JP5005969B2 (ja) 2005-06-28 2006-06-27 位置測定装置

Country Status (6)

Country Link
US (1) US7471397B2 (cg-RX-API-DMAC7.html)
EP (1) EP1739395B1 (cg-RX-API-DMAC7.html)
JP (1) JP5005969B2 (cg-RX-API-DMAC7.html)
CN (1) CN100554868C (cg-RX-API-DMAC7.html)
DE (1) DE102005029917A1 (cg-RX-API-DMAC7.html)
ES (1) ES2610804T3 (cg-RX-API-DMAC7.html)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7641856B2 (en) * 2004-05-14 2010-01-05 Honeywell International Inc. Portable sample analyzer with removable cartridge
DE102005029917A1 (de) * 2005-06-28 2007-01-04 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102006042743A1 (de) 2006-09-12 2008-03-27 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102007023300A1 (de) 2007-05-16 2008-11-20 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Anordnung derselben
DE102008008873A1 (de) * 2007-05-16 2008-11-20 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102008007319A1 (de) 2008-02-02 2009-08-06 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
US7864336B2 (en) * 2008-04-28 2011-01-04 Agilent Technologies, Inc. Compact Littrow encoder
WO2010047100A1 (ja) * 2008-10-23 2010-04-29 株式会社ニコン エンコーダ
JP5814339B2 (ja) 2010-03-30 2015-11-17 ザイゴ コーポレーションＺｙｇｏ Ｃｏｒｐｏｒａｔｉｏｎ 干渉計エンコーダ・システム
DE102010029211A1 (de) 2010-05-21 2011-11-24 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
NL2006743A (en) * 2010-06-09 2011-12-12 Asml Netherlands Bv Position sensor and lithographic apparatus.
DE102011081879A1 (de) * 2010-11-03 2012-05-03 Dr. Johannes Heidenhain Gmbh Optische Winkelmesseinrichtung
DE102010043469A1 (de) * 2010-11-05 2012-05-10 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102011082156A1 (de) * 2010-12-16 2012-06-21 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
JP5849103B2 (ja) 2011-02-01 2016-01-27 ザイゴ コーポレーションＺｙｇｏ Ｃｏｒｐｏｒａｔｉｏｎ 干渉ヘテロダイン光学エンコーダシステム
DE102011005937B4 (de) * 2011-03-23 2020-10-22 Dr. Johannes Heidenhain Gmbh Vorrichtung zur interferentiellen Abstandsmessung
DE102011076178B4 (de) 2011-05-20 2022-03-31 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US9534934B2 (en) * 2011-09-06 2017-01-03 Nikon Corporation High resolution encoder head
TWI476376B (zh) 2011-11-09 2015-03-11 Zygo Corp 雙程干涉式編碼器系統
US9201313B2 (en) 2011-11-09 2015-12-01 Zygo Corporation Compact encoder head for interferometric encoder system
DE102012204572A1 (de) * 2012-03-22 2013-09-26 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Anordnung mit einer derartigen Positionsmesseinrichtung
TWI516746B (zh) 2012-04-20 2016-01-11 賽格股份有限公司 在干涉編碼系統中執行非諧循環錯誤補償的方法、裝置及計算機程式產品，以及微影系統
DE102012210309A1 (de) * 2012-06-19 2013-12-19 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102013222383A1 (de) * 2013-02-06 2014-08-07 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102013211758A1 (de) * 2013-06-21 2014-12-24 Dr. Johannes Heidenhain Gmbh Interferometer
DE102013220190B4 (de) * 2013-10-07 2021-08-12 Dr. Johannes Heidenhain Gmbh Messteilung und lichtelektrische Positionsmesseinrichtung mit dieser Messteilung
TWI627379B (zh) 2013-10-07 2018-06-21 德商強那斯海登翰博士有限公司 光學位置測量裝置
JP6593868B2 (ja) * 2015-07-28 2019-10-23 株式会社ミツトヨ 変位検出装置
CN106813578B (zh) * 2015-11-30 2019-02-22 上海微电子装备（集团）股份有限公司 一种二维光栅测量系统
DE102016200847A1 (de) * 2016-01-21 2017-07-27 Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung Optische Positionsmesseinrichtung
JP2018066629A (ja) * 2016-10-19 2018-04-26 太陽誘電株式会社 ロードセル
JP6957088B2 (ja) * 2017-04-19 2021-11-02 株式会社ミツトヨ 光学式エンコーダ
US10648838B2 (en) 2017-06-29 2020-05-12 Mitutoyo Corporation Contamination and defect resistant rotary optical encoder configuration including a rotary scale with yawed scale grating bars and structured illumination generating arrangement with a beam deflector configuration
CN114322817A (zh) * 2022-01-21 2022-04-12 东莞创视自动化科技有限公司 可变光栅组合模组及检测方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1989005964A1 (en) * 1987-12-15 1989-06-29 Renishaw Plc Opto-electronic scale-reading apparatus
DE3905730C2 (de) 1989-02-24 1995-06-14 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
US5079418A (en) * 1990-02-20 1992-01-07 Dr. Johannes Heidenhain Gmbh Position measuring apparatus with reflection
JP3478567B2 (ja) * 1992-09-25 2003-12-15 キヤノン株式会社 回転情報検出装置
JP3028716B2 (ja) * 1993-09-29 2000-04-04 キヤノン株式会社 光学式変位センサ
JP3530573B2 (ja) * 1994-04-27 2004-05-24 キヤノン株式会社 光学式変位センサ
DE19748802B4 (de) * 1996-11-20 2010-09-09 Dr. Johannes Heidenhain Gmbh Optische Positionsmeßeinrichtung
CN1248058C (zh) * 2000-09-14 2006-03-29 约翰尼斯海登海恩博士股份有限公司 位置测量装置
CN1253699C (zh) 2002-03-18 2006-04-26 株式会社三丰 对偏移具有低灵敏度的光学位移传感装置
US20030174343A1 (en) * 2002-03-18 2003-09-18 Mitutoyo Corporation Optical displacement sensing device with reduced sensitivity to misalignment
JP4722474B2 (ja) * 2004-12-24 2011-07-13 株式会社ミツトヨ 変位検出装置
DE102005029917A1 (de) * 2005-06-28 2007-01-04 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
JP5147368B2 (ja) * 2006-11-20 2013-02-20 ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング エンコーダ

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