JP2006510196A - 高エネルギー・クラスタ照射による半導体表面皮膜の再結晶化及び半導体のドーピング方法 - Google Patents
高エネルギー・クラスタ照射による半導体表面皮膜の再結晶化及び半導体のドーピング方法 Download PDFInfo
- Publication number
- JP2006510196A JP2006510196A JP2004558211A JP2004558211A JP2006510196A JP 2006510196 A JP2006510196 A JP 2006510196A JP 2004558211 A JP2004558211 A JP 2004558211A JP 2004558211 A JP2004558211 A JP 2004558211A JP 2006510196 A JP2006510196 A JP 2006510196A
- Authority
- JP
- Japan
- Prior art keywords
- gas cluster
- cluster ion
- dopant
- gas
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 116
- 238000000034 method Methods 0.000 title claims abstract description 74
- 238000001953 recrystallisation Methods 0.000 title abstract description 22
- 239000002019 doping agent Substances 0.000 claims abstract description 95
- 238000010884 ion-beam technique Methods 0.000 claims abstract description 37
- 238000005468 ion implantation Methods 0.000 claims abstract description 11
- 230000003213 activating effect Effects 0.000 claims abstract 3
- 150000002500 ions Chemical class 0.000 claims description 70
- 239000000758 substrate Substances 0.000 claims 20
- 239000010409 thin film Substances 0.000 claims 6
- 239000010408 film Substances 0.000 claims 3
- 230000001678 irradiating effect Effects 0.000 claims 1
- 230000004913 activation Effects 0.000 abstract description 24
- 238000009792 diffusion process Methods 0.000 abstract description 4
- 239000007789 gas Substances 0.000 description 190
- 238000010849 ion bombardment Methods 0.000 description 43
- 238000001994 activation Methods 0.000 description 25
- 239000000463 material Substances 0.000 description 22
- 238000000576 coating method Methods 0.000 description 21
- 239000011248 coating agent Substances 0.000 description 20
- 239000013078 crystal Substances 0.000 description 14
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 12
- 238000010586 diagram Methods 0.000 description 12
- 239000000203 mixture Substances 0.000 description 12
- 238000000137 annealing Methods 0.000 description 9
- 230000001052 transient effect Effects 0.000 description 8
- 238000012545 processing Methods 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 229910052786 argon Inorganic materials 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- 239000011261 inert gas Substances 0.000 description 5
- 238000003860 storage Methods 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000003116 impacting effect Effects 0.000 description 4
- 230000035515 penetration Effects 0.000 description 4
- 238000006467 substitution reaction Methods 0.000 description 4
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 3
- 230000001133 acceleration Effects 0.000 description 3
- 229910052796 boron Inorganic materials 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 238000000605 extraction Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000002513 implantation Methods 0.000 description 3
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 2
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- WTEOIRVLGSZEPR-UHFFFAOYSA-N boron trifluoride Chemical compound FB(F)F WTEOIRVLGSZEPR-UHFFFAOYSA-N 0.000 description 2
- -1 but not limited to Substances 0.000 description 2
- 229910002092 carbon dioxide Inorganic materials 0.000 description 2
- 239000001569 carbon dioxide Substances 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000013077 target material Substances 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910015900 BF3 Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- 229910000074 antimony hydride Inorganic materials 0.000 description 1
- RBFQJDQYXXHULB-UHFFFAOYSA-N arsane Chemical compound [AsH3] RBFQJDQYXXHULB-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- YBGKQGSCGDNZIB-UHFFFAOYSA-N arsenic pentafluoride Chemical compound F[As](F)(F)(F)F YBGKQGSCGDNZIB-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 150000001793 charged compounds Chemical class 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 239000007943 implant Substances 0.000 description 1
- WABPQHHGFIMREM-RKEGKUSMSA-N lead-214 Chemical compound [214Pb] WABPQHHGFIMREM-RKEGKUSMSA-N 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 1
- OBCUTHMOOONNBS-UHFFFAOYSA-N phosphorus pentafluoride Chemical compound FP(F)(F)(F)F OBCUTHMOOONNBS-UHFFFAOYSA-N 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/2636—Bombardment with radiation with high-energy radiation for heating, e.g. electron beam heating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/08—Ion sources
- H01J2237/0812—Ionized cluster beam [ICB] sources
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- High Energy & Nuclear Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Recrystallisation Techniques (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US43386602P | 2002-12-12 | 2002-12-12 | |
PCT/US2003/039754 WO2004053945A2 (fr) | 2002-12-12 | 2003-12-12 | Recristallisation de films superficiels de semi-conducteurs par irradiation energetique d'amas |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2006510196A true JP2006510196A (ja) | 2006-03-23 |
Family
ID=32508036
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004558211A Pending JP2006510196A (ja) | 2002-12-12 | 2003-12-12 | 高エネルギー・クラスタ照射による半導体表面皮膜の再結晶化及び半導体のドーピング方法 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1584104A4 (fr) |
JP (1) | JP2006510196A (fr) |
AU (1) | AU2003299614A1 (fr) |
WO (1) | WO2004053945A2 (fr) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009524907A (ja) * | 2006-01-28 | 2009-07-02 | バリアン・セミコンダクター・エクイップメント・アソシエイツ・インコーポレイテッド | イオン注入方法およびそれに利用されるイオン源 |
JP2012199430A (ja) * | 2011-03-22 | 2012-10-18 | Toshiba Corp | 多層膜の製造方法 |
US9123879B2 (en) | 2013-09-09 | 2015-09-01 | Masahiko Nakayama | Magnetoresistive element and method of manufacturing the same |
US9231196B2 (en) | 2013-09-10 | 2016-01-05 | Kuniaki SUGIURA | Magnetoresistive element and method of manufacturing the same |
US9368717B2 (en) | 2013-09-10 | 2016-06-14 | Kabushiki Kaisha Toshiba | Magnetoresistive element and method for manufacturing the same |
US9385304B2 (en) | 2013-09-10 | 2016-07-05 | Kabushiki Kaisha Toshiba | Magnetic memory and method of manufacturing the same |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006062536A2 (fr) * | 2004-12-03 | 2006-06-15 | Epion Corporation | Formation de jonctions ultra-minces par irradiation avec des ions d'agregats gazeux |
US7410890B2 (en) | 2002-12-12 | 2008-08-12 | Tel Epion Inc. | Formation of doped regions and/or ultra-shallow junctions in semiconductor materials by gas-cluster ion irradiation |
JP2007525838A (ja) | 2004-02-14 | 2007-09-06 | エピオン コーポレーション | ドープ済みおよび未ドープの歪み半導体の形成方法およびガスクラスタイオン照射による半導体薄膜の形成方法 |
US7759251B2 (en) | 2004-06-03 | 2010-07-20 | Tel Epion Corporation | Dual damascene integration structure and method for forming improved dual damascene integration structure |
US7514725B2 (en) | 2004-11-30 | 2009-04-07 | Spire Corporation | Nanophotovoltaic devices |
JP5591470B2 (ja) | 2005-08-30 | 2014-09-17 | アドバンスト テクノロジー マテリアルズ,インコーポレイテッド | 代替フッ化ホウ素前駆体を使用するホウ素イオン注入および注入のための大きな水素化ホウ素の形成 |
US7566888B2 (en) | 2007-05-23 | 2009-07-28 | Tel Epion Inc. | Method and system for treating an interior surface of a workpiece using a charged particle beam |
US20110021011A1 (en) | 2009-07-23 | 2011-01-27 | Advanced Technology Materials, Inc. | Carbon materials for carbon implantation |
US8138071B2 (en) | 2009-10-27 | 2012-03-20 | Advanced Technology Materials, Inc. | Isotopically-enriched boron-containing compounds, and methods of making and using same |
US8062965B2 (en) | 2009-10-27 | 2011-11-22 | Advanced Technology Materials, Inc. | Isotopically-enriched boron-containing compounds, and methods of making and using same |
US8598022B2 (en) | 2009-10-27 | 2013-12-03 | Advanced Technology Materials, Inc. | Isotopically-enriched boron-containing compounds, and methods of making and using same |
US8779383B2 (en) | 2010-02-26 | 2014-07-15 | Advanced Technology Materials, Inc. | Enriched silicon precursor compositions and apparatus and processes for utilizing same |
TWI689467B (zh) | 2010-02-26 | 2020-04-01 | 美商恩特葛瑞斯股份有限公司 | 用以增進離子植入系統中之離子源的壽命及性能之方法與設備 |
CN106237934B (zh) | 2010-08-30 | 2019-08-27 | 恩特格里斯公司 | 由固体材料制备化合物或其中间体以及使用该化合物和中间体的设备和方法 |
TWI583442B (zh) | 2011-10-10 | 2017-05-21 | 恩特葛瑞斯股份有限公司 | B2f4之製造程序 |
CN108565198A (zh) | 2012-02-14 | 2018-09-21 | 恩特格里斯公司 | 用于改善注入束和源寿命性能的碳掺杂剂气体和协流 |
CN105637616A (zh) | 2013-08-16 | 2016-06-01 | 恩特格里斯公司 | 基板中的硅注入及提供其硅前体组合物 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53109475A (en) * | 1977-03-07 | 1978-09-25 | Hitachi Ltd | Manufacture for semiconductor device |
JPS56115527A (en) * | 1980-02-15 | 1981-09-10 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Manufacture of semiconductor device |
JPS56122127A (en) * | 1980-02-01 | 1981-09-25 | Commissariat Energie Atomique | Method of doping semiconductor at high speed |
JPS58111324A (ja) * | 1981-12-25 | 1983-07-02 | Hitachi Ltd | 半導体装置の製造方法 |
JPH04354865A (ja) * | 1991-05-31 | 1992-12-09 | Res Dev Corp Of Japan | 超低速クラスターイオンビームによる表面処理方法 |
JPH0941138A (ja) * | 1995-07-31 | 1997-02-10 | Res Dev Corp Of Japan | ガスクラスターイオンビームによるイオン注入法 |
WO2001043160A1 (fr) * | 1999-12-10 | 2001-06-14 | Epion Corporation | Ionisateur pour formation de faisceau d'ions a amas gazeux |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6251835B1 (en) * | 1997-05-08 | 2001-06-26 | Epion Corporation | Surface planarization of high temperature superconductors |
US6770874B2 (en) * | 2000-07-14 | 2004-08-03 | Epion Corporation | Gas cluster ion beam size diagnostics and workpiece processing |
EP1305452A4 (fr) * | 2000-07-14 | 2007-12-26 | Tel Epion Inc | Procede et dispositif servant a diagnostiquer les dimensions d'agregats ionises preformes en phase gazeuse et a traiter une piece |
WO2002052608A2 (fr) * | 2000-12-26 | 2002-07-04 | Epion Corporation | Systeme de dosimetrie et de regulation de charge pour faisceau d'ions d'agregats gazeux |
KR100445105B1 (ko) * | 2001-10-25 | 2004-08-21 | 주식회사 다산 씨.앤드.아이 | 가스 클러스터 이온빔을 이용한 아이.티.오 박막 표면처리시스템 및 그 방법 |
US20040002202A1 (en) * | 2002-06-26 | 2004-01-01 | Horsky Thomas Neil | Method of manufacturing CMOS devices by the implantation of N- and P-type cluster ions |
-
2003
- 2003-12-12 AU AU2003299614A patent/AU2003299614A1/en not_active Abandoned
- 2003-12-12 EP EP03799903A patent/EP1584104A4/fr not_active Withdrawn
- 2003-12-12 WO PCT/US2003/039754 patent/WO2004053945A2/fr active Application Filing
- 2003-12-12 JP JP2004558211A patent/JP2006510196A/ja active Pending
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53109475A (en) * | 1977-03-07 | 1978-09-25 | Hitachi Ltd | Manufacture for semiconductor device |
JPS56122127A (en) * | 1980-02-01 | 1981-09-25 | Commissariat Energie Atomique | Method of doping semiconductor at high speed |
JPS56115527A (en) * | 1980-02-15 | 1981-09-10 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Manufacture of semiconductor device |
JPS58111324A (ja) * | 1981-12-25 | 1983-07-02 | Hitachi Ltd | 半導体装置の製造方法 |
JPH04354865A (ja) * | 1991-05-31 | 1992-12-09 | Res Dev Corp Of Japan | 超低速クラスターイオンビームによる表面処理方法 |
JPH0941138A (ja) * | 1995-07-31 | 1997-02-10 | Res Dev Corp Of Japan | ガスクラスターイオンビームによるイオン注入法 |
WO2001043160A1 (fr) * | 1999-12-10 | 2001-06-14 | Epion Corporation | Ionisateur pour formation de faisceau d'ions a amas gazeux |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009524907A (ja) * | 2006-01-28 | 2009-07-02 | バリアン・セミコンダクター・エクイップメント・アソシエイツ・インコーポレイテッド | イオン注入方法およびそれに利用されるイオン源 |
JP2012199430A (ja) * | 2011-03-22 | 2012-10-18 | Toshiba Corp | 多層膜の製造方法 |
US9082961B2 (en) | 2011-03-22 | 2015-07-14 | Kabushiki Kaisha Toshiba | Method of manufacturing multilayer film |
US9123879B2 (en) | 2013-09-09 | 2015-09-01 | Masahiko Nakayama | Magnetoresistive element and method of manufacturing the same |
US9406871B2 (en) | 2013-09-09 | 2016-08-02 | Kabushiki Kaisha Toshiba | Magnetoresistive element and method of manufacturing the same |
US9231196B2 (en) | 2013-09-10 | 2016-01-05 | Kuniaki SUGIURA | Magnetoresistive element and method of manufacturing the same |
US9368717B2 (en) | 2013-09-10 | 2016-06-14 | Kabushiki Kaisha Toshiba | Magnetoresistive element and method for manufacturing the same |
US9385304B2 (en) | 2013-09-10 | 2016-07-05 | Kabushiki Kaisha Toshiba | Magnetic memory and method of manufacturing the same |
Also Published As
Publication number | Publication date |
---|---|
EP1584104A4 (fr) | 2010-05-26 |
EP1584104A2 (fr) | 2005-10-12 |
AU2003299614A8 (en) | 2004-06-30 |
WO2004053945A3 (fr) | 2005-03-03 |
WO2004053945A2 (fr) | 2004-06-24 |
AU2003299614A1 (en) | 2004-06-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7410890B2 (en) | Formation of doped regions and/or ultra-shallow junctions in semiconductor materials by gas-cluster ion irradiation | |
US7396745B2 (en) | Formation of ultra-shallow junctions by gas-cluster ion irradiation | |
JP2006510196A (ja) | 高エネルギー・クラスタ照射による半導体表面皮膜の再結晶化及び半導体のドーピング方法 | |
US6111260A (en) | Method and apparatus for in situ anneal during ion implant | |
US7259036B2 (en) | Methods of forming doped and un-doped strained semiconductor materials and semiconductor films by gas-cluster-ion-beam irradiation and materials and film products | |
US6646277B2 (en) | Charging control and dosimetry system for gas cluster ion beam | |
US7060989B2 (en) | Method and apparatus for improved processing with a gas-cluster ion beam | |
US11735432B2 (en) | Method and apparatus for forming substrate surfaces with exposed crystal lattice using accelerated neutral atom beam | |
US7547900B2 (en) | Techniques for providing a ribbon-shaped gas cluster ion beam | |
US4370176A (en) | Process for fast droping of semiconductors | |
US8440578B2 (en) | GCIB process for reducing interfacial roughness following pre-amorphization | |
JP4977008B2 (ja) | 高電流ガスクラスターイオンビーム処理システムにおけるビーム安定性向上方法及び装置 | |
US20090032725A1 (en) | Apparatus and methods for treating a workpiece using a gas cluster ion beam | |
JP2008547229A (ja) | 置換ゲート電界効果トランジスタ、及びその製造方法 | |
US20090084988A1 (en) | Single wafer implanter for silicon-on-insulator wafer fabrication | |
TW201007821A (en) | Control of particles on semiconductor wafers when implanting boron hydrides | |
TWI469368B (zh) | 在太陽能電池製造中供固態磊晶成長之直流電離子注入 | |
CN112176306A (zh) | 一种气体团簇离子束在衬底中形成非晶层的方法 | |
US8481340B2 (en) | Method for preparing a light-emitting device using gas cluster ion beam processing | |
US20240018003A1 (en) | Using anab technology to remove production processing residuals from graphene | |
Gordon et al. | A silicon MBE-compatible low-energy ion implanter | |
JP2003188110A (ja) | ドーピング方法およびイオン注入装置 | |
El-Kareh et al. | Ion implantation | |
JPH04225520A (ja) | イオン注入により生じたシリコン結晶欠陥の抑制方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20061102 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20100325 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100331 |
|
RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20100423 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20100629 |
|
A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20100706 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20100729 |
|
A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20100805 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100830 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20110118 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20111025 |