JP2006300688A - 校正方法および校正装置 - Google Patents

校正方法および校正装置 Download PDF

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Publication number
JP2006300688A
JP2006300688A JP2005121955A JP2005121955A JP2006300688A JP 2006300688 A JP2006300688 A JP 2006300688A JP 2005121955 A JP2005121955 A JP 2005121955A JP 2005121955 A JP2005121955 A JP 2005121955A JP 2006300688 A JP2006300688 A JP 2006300688A
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Japan
Prior art keywords
signal
signal transmission
reference signal
transmission path
spectrum
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JP2005121955A
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English (en)
Japanese (ja)
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JP2006300688A5 (enExample
Inventor
Hiroshi Sakayori
酒寄　寛
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Priority to JP2005121955A priority Critical patent/JP2006300688A/ja
Priority to US11/389,847 priority patent/US7315170B2/en
Priority to DE102006017183A priority patent/DE102006017183A1/de
Publication of JP2006300688A publication Critical patent/JP2006300688A/ja
Publication of JP2006300688A5 publication Critical patent/JP2006300688A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2005121955A 2005-04-20 2005-04-20 校正方法および校正装置 Pending JP2006300688A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2005121955A JP2006300688A (ja) 2005-04-20 2005-04-20 校正方法および校正装置
US11/389,847 US7315170B2 (en) 2005-04-20 2006-03-27 Calibration apparatus and method using pulse for frequency, phase, and delay characteristic
DE102006017183A DE102006017183A1 (de) 2005-04-20 2006-04-12 Kalibrierungsvorrichtung und Verfahren, wobei ein Impuls für Frequenz-, Phase- und Verzögerungs-Eigenschaften verwendet wird

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005121955A JP2006300688A (ja) 2005-04-20 2005-04-20 校正方法および校正装置

Publications (2)

Publication Number Publication Date
JP2006300688A true JP2006300688A (ja) 2006-11-02
JP2006300688A5 JP2006300688A5 (enExample) 2008-05-29

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ID=37068117

Family Applications (1)

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JP2005121955A Pending JP2006300688A (ja) 2005-04-20 2005-04-20 校正方法および校正装置

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US (1) US7315170B2 (enExample)
JP (1) JP2006300688A (enExample)
DE (1) DE102006017183A1 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008143897A1 (en) * 2007-05-14 2008-11-27 Evan Grund Transmission line pulse testing with reflection control
JP2009068932A (ja) * 2007-09-12 2009-04-02 Campus Create Co Ltd 線形マルチポートのシステムパラメータの測定方法及び装置、ベクトルネットワークアナライザを用いた測定方法並びにプログラム
JP2011002402A (ja) * 2009-06-22 2011-01-06 Yokogawa Electric Corp 半導体試験装置及び半導体試験方法
KR20220140355A (ko) * 2021-04-09 2022-10-18 주식회사 지니틱스 보이스 코일 모터 액추에이터의 안정성 평가를 위한 주파수 응답 특성 측정방법 및 이를 위한 장치

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2194871B1 (en) 2007-09-05 2016-08-17 Sensible Medical Innovations Ltd. Method and system for monitoring thoracic tissue fluid
US10667715B2 (en) 2008-08-20 2020-06-02 Sensible Medical Innovations Ltd. Methods and devices of cardiac tissue monitoring and analysis
EP3181045B1 (en) 2009-03-04 2020-12-02 Sensible Medical Innovations Ltd. Methods and systems for monitoring intrabody tissues
US8907682B2 (en) * 2009-07-30 2014-12-09 Sensible Medical Innovations Ltd. System and method for calibration of measurements of interacted EM signals in real time
CN105242226A (zh) * 2014-12-30 2016-01-13 北京无线电计量测试研究所 一种脉冲峰值功率计的校准装置
US9897681B2 (en) * 2015-03-02 2018-02-20 Rohde & Schwarz Gmbh & Co. Kg Calibration method and calibration arrangement
CN106771651B (zh) * 2016-11-15 2019-07-05 中国电子科技集团公司第四十一研究所 一种脉冲网络分析仪脉冲内数据采集的同步方法
US10436827B2 (en) * 2016-11-15 2019-10-08 Rohde & Schwarz Gmbh & Co. Kg Measurement device and method for measuring the impedance of a device under test
US10551470B2 (en) * 2017-09-22 2020-02-04 Rohde & Schwarz Gmbh & Co. Kg Calibration apparatus, calibration system and method for calibrating at least one of the signal generator and a signal analyzer
CN115015627B (zh) * 2022-08-10 2022-11-08 武汉格蓝若智能技术有限公司 一种高精度电流测量方法、系统、电子设备及存储介质
CN115356527A (zh) * 2022-08-30 2022-11-18 浪潮商用机器有限公司 一种故障检测方法、装置、设备

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6396573A (ja) * 1986-10-14 1988-04-27 Radio Res Lab 高精度伝送路電気長測定方法
JPH04269675A (ja) * 1991-02-26 1992-09-25 Berishisu Inc 伝送線路長の測定方法
JPH06130129A (ja) * 1992-09-29 1994-05-13 Berishisu Inc 伝送線路長の測定方法
US20040027138A1 (en) * 2002-08-07 2004-02-12 Pickerd John J. Oscilloscope based return loss analyzer

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2942263A (en) * 1957-02-25 1960-06-21 Gen Dynamics Corp Antennas
US3693080A (en) * 1970-12-21 1972-09-19 Sperry Rand Corp Time domain measurement of high frequency complex permittivity and permeability of transmission line enclosed material sample
US3796948A (en) * 1972-07-25 1974-03-12 Westinghouse Electric Corp Standing wave detector
US4621226A (en) * 1984-05-23 1986-11-04 Weinschel Engineering Co., Inc. Apparatus and method for determining an input electrical characteristic of a device under test
JPH11190760A (ja) 1997-12-26 1999-07-13 Advantest Corp 半導体試験装置
US6920407B2 (en) * 2000-09-18 2005-07-19 Agilent Technologies, Inc. Method and apparatus for calibrating a multiport test system for measurement of a DUT
KR101018972B1 (ko) * 2003-05-12 2011-03-02 텔레폰악티에볼라겟엘엠에릭슨(펍) 신호 루프 테스트용 방법 및 장치

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6396573A (ja) * 1986-10-14 1988-04-27 Radio Res Lab 高精度伝送路電気長測定方法
JPH04269675A (ja) * 1991-02-26 1992-09-25 Berishisu Inc 伝送線路長の測定方法
JPH06130129A (ja) * 1992-09-29 1994-05-13 Berishisu Inc 伝送線路長の測定方法
US20040027138A1 (en) * 2002-08-07 2004-02-12 Pickerd John J. Oscilloscope based return loss analyzer

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008143897A1 (en) * 2007-05-14 2008-11-27 Evan Grund Transmission line pulse testing with reflection control
JP2009068932A (ja) * 2007-09-12 2009-04-02 Campus Create Co Ltd 線形マルチポートのシステムパラメータの測定方法及び装置、ベクトルネットワークアナライザを用いた測定方法並びにプログラム
JP2011002402A (ja) * 2009-06-22 2011-01-06 Yokogawa Electric Corp 半導体試験装置及び半導体試験方法
KR20220140355A (ko) * 2021-04-09 2022-10-18 주식회사 지니틱스 보이스 코일 모터 액추에이터의 안정성 평가를 위한 주파수 응답 특성 측정방법 및 이를 위한 장치
KR102495683B1 (ko) 2021-04-09 2023-02-06 주식회사 지니틱스 보이스 코일 모터 액추에이터의 안정성 평가를 위한 주파수 응답 특성 측정방법 및 이를 위한 장치

Also Published As

Publication number Publication date
DE102006017183A1 (de) 2006-10-26
US7315170B2 (en) 2008-01-01
US20060241887A1 (en) 2006-10-26

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