JP2006295146A5 - - Google Patents
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- Publication number
- JP2006295146A5 JP2006295146A5 JP2006072175A JP2006072175A JP2006295146A5 JP 2006295146 A5 JP2006295146 A5 JP 2006295146A5 JP 2006072175 A JP2006072175 A JP 2006072175A JP 2006072175 A JP2006072175 A JP 2006072175A JP 2006295146 A5 JP2006295146 A5 JP 2006295146A5
- Authority
- JP
- Japan
- Prior art keywords
- exposure
- measurement
- area
- control system
- temperature control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 16
- 239000000758 substrate Substances 0.000 claims 7
- 239000003507 refrigerant Substances 0.000 claims 6
- 230000000903 blocking effect Effects 0.000 claims 2
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006072175A JP2006295146A (ja) | 2005-03-18 | 2006-03-16 | 位置決め装置、露光装置及びデバイス製造方法 |
| US11/378,511 US7312848B2 (en) | 2005-03-18 | 2006-03-17 | Positioning apparatus, exposure apparatus, and device manufacturing method |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005080584 | 2005-03-18 | ||
| JP2006072175A JP2006295146A (ja) | 2005-03-18 | 2006-03-16 | 位置決め装置、露光装置及びデバイス製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2006295146A JP2006295146A (ja) | 2006-10-26 |
| JP2006295146A5 true JP2006295146A5 (enExample) | 2009-04-02 |
Family
ID=37009942
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006072175A Pending JP2006295146A (ja) | 2005-03-18 | 2006-03-16 | 位置決め装置、露光装置及びデバイス製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7312848B2 (enExample) |
| JP (1) | JP2006295146A (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1965414A4 (en) * | 2005-12-06 | 2010-08-25 | Nikon Corp | EXPOSURE METHOD, EXPOSURE DEVICE AND METHOD FOR MANUFACTURING COMPONENTS |
| US8324848B2 (en) * | 2009-02-05 | 2012-12-04 | Asm Assembly Automation Ltd | System for maintaining thermal stability of a motion stage |
| JP5708310B2 (ja) * | 2011-07-01 | 2015-04-30 | 東京エレクトロン株式会社 | 基板処理装置 |
| US9778579B2 (en) * | 2011-11-10 | 2017-10-03 | Nikon Corporation | System and method for controlling a temperature of a reaction assembly |
| JPWO2015011829A1 (ja) * | 2013-07-26 | 2017-03-02 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法及びプログラム |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2928603B2 (ja) * | 1990-07-30 | 1999-08-03 | キヤノン株式会社 | X線露光装置用ウエハ冷却装置 |
| JP3127525B2 (ja) | 1991-11-05 | 2001-01-29 | 株式会社ニコン | 可動ステージ装置 |
| JP4210871B2 (ja) * | 1997-10-31 | 2009-01-21 | 株式会社ニコン | 露光装置 |
| JPH11307430A (ja) * | 1998-04-23 | 1999-11-05 | Canon Inc | 露光装置およびデバイス製造方法ならびに駆動装置 |
| TWI238292B (en) * | 2000-02-10 | 2005-08-21 | Asml Netherlands Bv | Lithographic projection apparatus having a temperature controlled heat shield |
| JP3870002B2 (ja) * | 2000-04-07 | 2007-01-17 | キヤノン株式会社 | 露光装置 |
| JP2002043213A (ja) * | 2000-07-25 | 2002-02-08 | Nikon Corp | ステージ装置および露光装置 |
| TW200305927A (en) * | 2002-03-22 | 2003-11-01 | Nippon Kogaku Kk | Exposure apparatus, exposure method and manufacturing method of device |
| JP4227452B2 (ja) | 2002-12-27 | 2009-02-18 | キヤノン株式会社 | 位置決め装置、及びその位置決め装置を利用した露光装置 |
-
2006
- 2006-03-16 JP JP2006072175A patent/JP2006295146A/ja active Pending
- 2006-03-17 US US11/378,511 patent/US7312848B2/en not_active Expired - Fee Related
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