JP2006284591A - 環境条件補正により電気装置の精度を改善するためのシステム及び方法 - Google Patents

環境条件補正により電気装置の精度を改善するためのシステム及び方法 Download PDF

Info

Publication number
JP2006284591A
JP2006284591A JP2006103085A JP2006103085A JP2006284591A JP 2006284591 A JP2006284591 A JP 2006284591A JP 2006103085 A JP2006103085 A JP 2006103085A JP 2006103085 A JP2006103085 A JP 2006103085A JP 2006284591 A JP2006284591 A JP 2006284591A
Authority
JP
Japan
Prior art keywords
signal
circuit
measuring
test
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006103085A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006284591A5 (enExample
Inventor
Fred H Ives
フレッド・エイチ・アイヴス
James B Summers
ジェイムズ・ビー・サマーズ
Brad E Andersen
ブラッド・エルウッド・アンダーセン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2006284591A publication Critical patent/JP2006284591A/ja
Publication of JP2006284591A5 publication Critical patent/JP2006284591A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0201—Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0213—Electrical arrangements not otherwise provided for
    • H05K1/0237—High frequency adaptations
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
    • H05K1/162—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor incorporating printed capacitors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007—Types of components
    • H05K2201/10151—Sensor
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/163—Monitoring a manufacturing process
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/165—Stabilizing, e.g. temperature stabilization

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP2006103085A 2005-04-04 2006-04-04 環境条件補正により電気装置の精度を改善するためのシステム及び方法 Pending JP2006284591A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/098,695 US20060224345A1 (en) 2005-04-04 2005-04-04 System and method for improving electrical equipment accuracy by environmental condition compensation

Publications (2)

Publication Number Publication Date
JP2006284591A true JP2006284591A (ja) 2006-10-19
JP2006284591A5 JP2006284591A5 (enExample) 2009-06-25

Family

ID=36999078

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006103085A Pending JP2006284591A (ja) 2005-04-04 2006-04-04 環境条件補正により電気装置の精度を改善するためのシステム及び方法

Country Status (4)

Country Link
US (1) US20060224345A1 (enExample)
JP (1) JP2006284591A (enExample)
CN (1) CN1849055A (enExample)
DE (1) DE102006001476A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE602006020054D1 (de) * 2006-12-19 2011-03-24 Abb Technology Ag Vorrichtung und Verfahren zur Präzisionserhöhung bei Messwandlern
TW200929680A (en) * 2007-12-19 2009-07-01 Wistron Neweb Corp An antenna module and a positioning device thereof
CN102096057B (zh) * 2010-11-16 2013-10-02 北京航天测控技术有限公司 一种电容测量电路的校准方法及装置
US8803505B2 (en) * 2011-09-29 2014-08-12 Imagine Communications Corp. Transmitter calibration system
CN105487023A (zh) * 2016-01-21 2016-04-13 晋江知保企业管理咨询有限公司 工频磁场检测装置
CN105629083A (zh) * 2016-01-21 2016-06-01 晋江知保企业管理咨询有限公司 工频电场检测装置
CN106153173B (zh) * 2016-06-16 2020-01-17 北京海卓同创科技有限公司 一种水中声速测量方法及装置
CN106546901A (zh) * 2016-09-23 2017-03-29 上海为准电子科技有限公司 一种针对射频电路湿度性能的功率校准的方法与装置
CN106772187B (zh) * 2017-03-13 2019-05-14 郑州云海信息技术有限公司 一种用于传输线损耗测试正确性的确定方法
US11209377B2 (en) * 2019-03-05 2021-12-28 Andrew Wireless Systems Gmbh Methods and apparatuses for compensating for moisture absorption
CN110427631B (zh) * 2019-03-27 2023-03-10 贵州电网有限责任公司 理论线损计算所需主网线路与变压器参数双重校核方法
CN110261697B (zh) * 2019-06-20 2022-04-15 中国电力科学研究院有限公司 处于实际运行工况的架空输电线路的线损计算方法及系统
CN113741582B (zh) * 2021-08-27 2022-07-15 安徽创谱仪器科技有限公司 一种电容温度补偿方法及装置
CN119827818B (zh) * 2024-12-31 2025-11-18 科大智能电气技术有限公司 一种湿度补偿的交流高压及超高压线路电压在线测量方法
CN120610149B (zh) * 2025-08-12 2025-12-05 浪潮计算机科技有限公司 一种测试方法、装置、存储介质及电子设备

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62191774A (ja) * 1986-02-13 1987-08-22 ヴァイサラ　オイ インピ−ダンスの測定方法
JPH02205373A (ja) * 1989-02-03 1990-08-15 Masatoshi Utaka ホール素子のオフセット電圧を自己補償する方法
JPH03277961A (ja) * 1990-03-27 1991-12-09 Matsushita Electric Works Ltd 電気化学式ガスセンサ
JPH08274691A (ja) * 1994-12-01 1996-10-18 Teledyne Inc Ｒｆ信号自動試験装置のアーキテクチャ
JP2000346884A (ja) * 1999-04-09 2000-12-15 Agilent Technol Inc ダイオードマイクロ波電力センサ

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5059892A (en) * 1990-10-15 1991-10-22 Hewlett-Packard Company Radio frequency signal interface
JP3502423B2 (ja) * 1993-10-08 2004-03-02 リーダー電子株式会社 信号処理回路補正装置
US5566088A (en) * 1994-06-13 1996-10-15 Motorola, Inc. Modular radio test system and method
FR2742232B1 (fr) * 1995-12-08 1998-02-06 Sextant Avionique Procede et dispositif pour le test d'instruments de radio-navigation utilisant des appareils de mesure et de generation de signaux standards
US6316945B1 (en) * 1998-09-02 2001-11-13 Anritsu Company Process for harmonic measurement accuracy enhancement
US6396287B1 (en) * 1998-09-02 2002-05-28 Anritsu Company Process for measuring output harmonic relative to output fundamental with enhanced accuracy
JP2000171504A (ja) * 1998-12-04 2000-06-23 Nec Corp 半導体評価装置
FR2790097B1 (fr) * 1999-02-18 2001-04-27 St Microelectronics Sa Procede d'etalonnage d'une sonde de circuit integre rf
FR2790096B1 (fr) * 1999-02-18 2001-04-13 St Microelectronics Sa Structure etalon elementaire a faibles pertes pour l'etalonnage d'une sonde de circuit integre
CA2341941C (en) * 2000-03-22 2006-07-04 Communications Research Laboratory, Ministry Of Public Management, Home Affairs, Posts And Telecommunications Method and apparatus for measuring harmonic load-pull for frequency multiplication
US6815964B2 (en) * 2000-12-29 2004-11-09 Stmicroelectronics S.R.L. Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers
JP2003098222A (ja) * 2001-09-25 2003-04-03 Mitsubishi Electric Corp 検査用基板、検査装置及び半導体装置の検査方法
US6903542B2 (en) * 2003-08-29 2005-06-07 Agilent Technologies, Inc. Systems and method for performing RF power measurements

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62191774A (ja) * 1986-02-13 1987-08-22 ヴァイサラ　オイ インピ−ダンスの測定方法
JPH02205373A (ja) * 1989-02-03 1990-08-15 Masatoshi Utaka ホール素子のオフセット電圧を自己補償する方法
JPH03277961A (ja) * 1990-03-27 1991-12-09 Matsushita Electric Works Ltd 電気化学式ガスセンサ
JPH08274691A (ja) * 1994-12-01 1996-10-18 Teledyne Inc Ｒｆ信号自動試験装置のアーキテクチャ
JP2000346884A (ja) * 1999-04-09 2000-12-15 Agilent Technol Inc ダイオードマイクロ波電力センサ

Also Published As

Publication number Publication date
DE102006001476A1 (de) 2006-10-05
US20060224345A1 (en) 2006-10-05
CN1849055A (zh) 2006-10-18

Similar Documents

Publication Publication Date Title
JP2006284591A (ja) 環境条件補正により電気装置の精度を改善するためのシステム及び方法
US7504833B1 (en) Automatically balanced sensing device and method for multiple capacitive sensors
EP2425532B1 (en) Temperature compensation in a telecommunications device
EP3654027B1 (en) Calibration of a humidity sensor device
EP1025450A1 (en) Automated microwave test system with improved accuracy
CN106289328B (zh) 一种温湿度值测量补偿方法及系统
CN110676150A (zh) 质谱仪自适应校正方法及装置
CN108020808B (zh) 一种高可靠高精度电能表实时时钟设计方法
US20190195820A1 (en) Relative humidity sensor calibration
US20220155198A1 (en) Systems and methods for water content measurement correction
US7818595B2 (en) Method, system, and apparatus for dynamic clock adjustment
CN1849517B (zh) 测量系统、组件有功及无功功率和电组件阻抗的方法和装置
JP3682398B2 (ja) 無線方位測定装置
FI85770B (fi) Foerfarande i samband med impedansgivare i radiosonder.
CN111026232A (zh) 时钟校准方法、芯片、电子设备
KR101960888B1 (ko) 온도 센서 보정 장치, 온도 센서 및 온도 센서 보정 방법
KR100333176B1 (ko) 스펙트럼 어날라이저의 레벨평탄화 보상장치 및 보상방법
US12146935B2 (en) Fast RF power measurement apparatus for production testing
JPH08136593A (ja) スペクトラムアナライザ
KR102334597B1 (ko) 임피던스 모니터링 장치 및 이의 동작 방법
Sokoll et al. In-situ moisture detection system with a vector network analyser
JPH07159457A (ja) スペクトルアナライザおよび周波数スペクトル測定方法
Sokoll et al. A self-calibrating low-cost sensor system for moisture monitoring of buildings
JP3210222B2 (ja) 温度測定装置
Baccigalupi et al. A methodology for testing immunity of field programmable analog arrays to radiated electromagnetic field

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090403

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20090403

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20110520

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110822

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120410

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20121109

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20130405