JP2006284591A5 - - Google Patents

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Publication number
JP2006284591A5
JP2006284591A5 JP2006103085A JP2006103085A JP2006284591A5 JP 2006284591 A5 JP2006284591 A5 JP 2006284591A5 JP 2006103085 A JP2006103085 A JP 2006103085A JP 2006103085 A JP2006103085 A JP 2006103085A JP 2006284591 A5 JP2006284591 A5 JP 2006284591A5
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JP
Japan
Prior art keywords
circuit
signal
measuring
receiver
signal generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006103085A
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English (en)
Japanese (ja)
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JP2006284591A (ja
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Publication date
Priority claimed from US11/098,695 external-priority patent/US20060224345A1/en
Application filed filed Critical
Publication of JP2006284591A publication Critical patent/JP2006284591A/ja
Publication of JP2006284591A5 publication Critical patent/JP2006284591A5/ja
Pending legal-status Critical Current

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JP2006103085A 2005-04-04 2006-04-04 環境条件補正により電気装置の精度を改善するためのシステム及び方法 Pending JP2006284591A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/098,695 US20060224345A1 (en) 2005-04-04 2005-04-04 System and method for improving electrical equipment accuracy by environmental condition compensation

Publications (2)

Publication Number Publication Date
JP2006284591A JP2006284591A (ja) 2006-10-19
JP2006284591A5 true JP2006284591A5 (enExample) 2009-06-25

Family

ID=36999078

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006103085A Pending JP2006284591A (ja) 2005-04-04 2006-04-04 環境条件補正により電気装置の精度を改善するためのシステム及び方法

Country Status (4)

Country Link
US (1) US20060224345A1 (enExample)
JP (1) JP2006284591A (enExample)
CN (1) CN1849055A (enExample)
DE (1) DE102006001476A1 (enExample)

Families Citing this family (15)

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DE602006020054D1 (de) * 2006-12-19 2011-03-24 Abb Technology Ag Vorrichtung und Verfahren zur Präzisionserhöhung bei Messwandlern
TW200929680A (en) * 2007-12-19 2009-07-01 Wistron Neweb Corp An antenna module and a positioning device thereof
CN102096057B (zh) * 2010-11-16 2013-10-02 北京航天测控技术有限公司 一种电容测量电路的校准方法及装置
US8803505B2 (en) * 2011-09-29 2014-08-12 Imagine Communications Corp. Transmitter calibration system
CN105487023A (zh) * 2016-01-21 2016-04-13 晋江知保企业管理咨询有限公司 工频磁场检测装置
CN105629083A (zh) * 2016-01-21 2016-06-01 晋江知保企业管理咨询有限公司 工频电场检测装置
CN106153173B (zh) * 2016-06-16 2020-01-17 北京海卓同创科技有限公司 一种水中声速测量方法及装置
CN106546901A (zh) * 2016-09-23 2017-03-29 上海为准电子科技有限公司 一种针对射频电路湿度性能的功率校准的方法与装置
CN106772187B (zh) * 2017-03-13 2019-05-14 郑州云海信息技术有限公司 一种用于传输线损耗测试正确性的确定方法
US11209377B2 (en) * 2019-03-05 2021-12-28 Andrew Wireless Systems Gmbh Methods and apparatuses for compensating for moisture absorption
CN110427631B (zh) * 2019-03-27 2023-03-10 贵州电网有限责任公司 理论线损计算所需主网线路与变压器参数双重校核方法
CN110261697B (zh) * 2019-06-20 2022-04-15 中国电力科学研究院有限公司 处于实际运行工况的架空输电线路的线损计算方法及系统
CN113741582B (zh) * 2021-08-27 2022-07-15 安徽创谱仪器科技有限公司 一种电容温度补偿方法及装置
CN119827818B (zh) * 2024-12-31 2025-11-18 科大智能电气技术有限公司 一种湿度补偿的交流高压及超高压线路电压在线测量方法
CN120610149B (zh) * 2025-08-12 2025-12-05 浪潮计算机科技有限公司 一种测试方法、装置、存储介质及电子设备

Family Cites Families (18)

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Publication number Priority date Publication date Assignee Title
FI74549C (fi) * 1986-02-13 1988-02-08 Vaisala Oy Maetningsfoerfarande foer impedanser, saerskilt smao kapacitanser.
JPH02205373A (ja) * 1989-02-03 1990-08-15 Masatoshi Utaka ホール素子のオフセット電圧を自己補償する方法
JPH03277961A (ja) * 1990-03-27 1991-12-09 Matsushita Electric Works Ltd 電気化学式ガスセンサ
US5059892A (en) * 1990-10-15 1991-10-22 Hewlett-Packard Company Radio frequency signal interface
JP3502423B2 (ja) * 1993-10-08 2004-03-02 リーダー電子株式会社 信号処理回路補正装置
US5566088A (en) * 1994-06-13 1996-10-15 Motorola, Inc. Modular radio test system and method
US5572160A (en) * 1994-12-01 1996-11-05 Teradyne, Inc. Architecture for RF signal automatic test equipment
FR2742232B1 (fr) * 1995-12-08 1998-02-06 Sextant Avionique Procede et dispositif pour le test d'instruments de radio-navigation utilisant des appareils de mesure et de generation de signaux standards
US6316945B1 (en) * 1998-09-02 2001-11-13 Anritsu Company Process for harmonic measurement accuracy enhancement
US6396287B1 (en) * 1998-09-02 2002-05-28 Anritsu Company Process for measuring output harmonic relative to output fundamental with enhanced accuracy
JP2000171504A (ja) * 1998-12-04 2000-06-23 Nec Corp 半導体評価装置
FR2790097B1 (fr) * 1999-02-18 2001-04-27 St Microelectronics Sa Procede d'etalonnage d'une sonde de circuit integre rf
FR2790096B1 (fr) * 1999-02-18 2001-04-13 St Microelectronics Sa Structure etalon elementaire a faibles pertes pour l'etalonnage d'une sonde de circuit integre
US6407540B1 (en) * 1999-04-09 2002-06-18 Agilent Technologies, Inc. Switched attenuator diode microwave power sensor
CA2341941C (en) * 2000-03-22 2006-07-04 Communications Research Laboratory, Ministry Of Public Management, Home Affairs, Posts And Telecommunications Method and apparatus for measuring harmonic load-pull for frequency multiplication
US6815964B2 (en) * 2000-12-29 2004-11-09 Stmicroelectronics S.R.L. Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers
JP2003098222A (ja) * 2001-09-25 2003-04-03 Mitsubishi Electric Corp 検査用基板、検査装置及び半導体装置の検査方法
US6903542B2 (en) * 2003-08-29 2005-06-07 Agilent Technologies, Inc. Systems and method for performing RF power measurements

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