JP2006140460A5 - - Google Patents
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- Publication number
- JP2006140460A5 JP2006140460A5 JP2005299354A JP2005299354A JP2006140460A5 JP 2006140460 A5 JP2006140460 A5 JP 2006140460A5 JP 2005299354 A JP2005299354 A JP 2005299354A JP 2005299354 A JP2005299354 A JP 2005299354A JP 2006140460 A5 JP2006140460 A5 JP 2006140460A5
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- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/962,550 US7119883B2 (en) | 2004-10-13 | 2004-10-13 | Correcting variations in the intensity of light within an illumination field without distorting the telecentricity of the light |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006140460A JP2006140460A (ja) | 2006-06-01 |
| JP2006140460A5 true JP2006140460A5 (enExample) | 2006-09-14 |
| JP4385016B2 JP4385016B2 (ja) | 2009-12-16 |
Family
ID=36144874
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005299354A Expired - Fee Related JP4385016B2 (ja) | 2004-10-13 | 2005-10-13 | 光のテレセントリック性を歪めることなく照明フィールド内の光の強度の変動を修正する装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | US7119883B2 (enExample) |
| JP (1) | JP4385016B2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7119883B2 (en) * | 2004-10-13 | 2006-10-10 | Asml Holding N.V. | Correcting variations in the intensity of light within an illumination field without distorting the telecentricity of the light |
| US7173688B2 (en) * | 2004-12-28 | 2007-02-06 | Asml Holding N.V. | Method for calculating an intensity integral for use in lithography systems |
| JP5902884B2 (ja) * | 2007-10-26 | 2016-04-13 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 結像光学系及びこの種の結像光学系を含むマイクロリソグラフィ用の投影露光装置 |
| JP2009164355A (ja) * | 2008-01-07 | 2009-07-23 | Canon Inc | 走査露光装置およびデバイス製造方法 |
| JPWO2011010560A1 (ja) * | 2009-07-24 | 2012-12-27 | 株式会社ニコン | 照明光学系、露光装置、およびデバイス製造方法 |
| US10866519B1 (en) * | 2019-10-01 | 2020-12-15 | Taiwan Semiconductor Manufacturing Company Ltd. | Reticle-masking structure, extreme ultraviolet apparatus, and method of forming the same |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58115725U (ja) * | 1982-02-01 | 1983-08-08 | 株式会社ニコン | 光制御装置用遮光羽根 |
| US5315629A (en) | 1990-10-10 | 1994-05-24 | At&T Bell Laboratories | Ringfield lithography |
| US5361292A (en) | 1993-05-11 | 1994-11-01 | The United States Of America As Represented By The Department Of Energy | Condenser for illuminating a ring field |
| US5631721A (en) | 1995-05-24 | 1997-05-20 | Svg Lithography Systems, Inc. | Hybrid illumination system for use in photolithography |
| JP3711586B2 (ja) * | 1995-06-02 | 2005-11-02 | 株式会社ニコン | 走査露光装置 |
| JPH10106942A (ja) | 1996-10-02 | 1998-04-24 | Canon Inc | 走査型露光装置及びそれを用いた半導体デバイスの製造方法 |
| US6013401A (en) * | 1997-03-31 | 2000-01-11 | Svg Lithography Systems, Inc. | Method of controlling illumination field to reduce line width variation |
| US6014252A (en) | 1998-02-20 | 2000-01-11 | The Regents Of The University Of California | Reflective optical imaging system |
| US6186632B1 (en) | 1998-12-31 | 2001-02-13 | The Regents Of The University Of California | Condenser for ring-field deep-ultraviolet and extreme-ultraviolet lithography |
| US6195201B1 (en) | 1999-01-27 | 2001-02-27 | Svg Lithography Systems, Inc. | Reflective fly's eye condenser for EUV lithography |
| US6476905B1 (en) * | 2000-01-20 | 2002-11-05 | Taiwan Semiconductor Manufacturing Co., Ltd. | Step and scan exposure system equipped with a plurality of attenuator blades for exposure control |
| TWI283798B (en) | 2000-01-20 | 2007-07-11 | Asml Netherlands Bv | A microlithography projection apparatus |
| US6307682B1 (en) | 2000-02-16 | 2001-10-23 | Silicon Valley Group, Inc. | Zoom illumination system for use in photolithography |
| JP2001244183A (ja) | 2000-02-29 | 2001-09-07 | Canon Inc | 投影露光装置 |
| JP3599629B2 (ja) | 2000-03-06 | 2004-12-08 | キヤノン株式会社 | 照明光学系及び前記照明光学系を用いた露光装置 |
| JP2002184676A (ja) | 2000-12-18 | 2002-06-28 | Nikon Corp | 照明光学装置および該照明光学装置を備えた露光装置 |
| US6741329B2 (en) * | 2001-09-07 | 2004-05-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP4923370B2 (ja) | 2001-09-18 | 2012-04-25 | 株式会社ニコン | 照明光学系、露光装置、及びマイクロデバイスの製造方法 |
| US6563907B1 (en) | 2001-12-07 | 2003-05-13 | Euv Llc | Radiation source with shaped emission |
| TWI251116B (en) * | 2002-12-19 | 2006-03-11 | Asml Netherlands Bv | Device manufacturing method, computer-readable medium and lithographic apparatus |
| US6853493B2 (en) | 2003-01-07 | 2005-02-08 | 3M Innovative Properties Company | Folded, telecentric projection lenses for use with pixelized panels |
| US7119883B2 (en) | 2004-10-13 | 2006-10-10 | Asml Holding N.V. | Correcting variations in the intensity of light within an illumination field without distorting the telecentricity of the light |
-
2004
- 2004-10-13 US US10/962,550 patent/US7119883B2/en not_active Expired - Lifetime
-
2005
- 2005-10-13 JP JP2005299354A patent/JP4385016B2/ja not_active Expired - Fee Related
-
2006
- 2006-09-20 US US11/523,695 patent/US7633599B2/en not_active Expired - Fee Related
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