JP2006120805A - Solid state image pickup device - Google Patents
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- JP2006120805A JP2006120805A JP2004306182A JP2004306182A JP2006120805A JP 2006120805 A JP2006120805 A JP 2006120805A JP 2004306182 A JP2004306182 A JP 2004306182A JP 2004306182 A JP2004306182 A JP 2004306182A JP 2006120805 A JP2006120805 A JP 2006120805A
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Abstract
Description
本発明は、基体の裏面に光電変換部の受光面を配置した裏面照射型の固体撮像素子に関し、特にMOSプロセスを用いて製造するCMOS型イメージセンサに有効な固体撮像素子に関する。 The present invention relates to a back-illuminated solid-state imaging device in which a light-receiving surface of a photoelectric conversion unit is disposed on the back surface of a substrate, and more particularly to a solid-state imaging device effective for a CMOS image sensor manufactured using a MOS process.
近年、CCDイメージセンサやCMOSイメージセンサ等の固体撮像素子では、搭載されるデバイスの小型化により、チップ面積の小型化が進んでおり、1画素当たりの面積も縮小せざるを得なくなってきている。それに伴い、チップ基板の電極や配線を配置した表面側より光を入射する固体撮像素子では、電極や配線によって光が遮られ、十分な集光特性が得られなくなってきており、これを解決するための技術として配線や電極のない基板の裏面より光を入射し、基板内部で光電変換を行うことで集光特性を向上させた裏面入射型の固体撮像素子が作製されている(例えば特許文献1参照)。 In recent years, in a solid-state imaging device such as a CCD image sensor or a CMOS image sensor, the chip area has been reduced due to downsizing of the mounted device, and the area per pixel has been inevitably reduced. . Along with this, in solid-state imaging devices that receive light from the surface side where the electrodes and wiring of the chip substrate are arranged, light is blocked by the electrodes and wiring, and sufficient light collecting characteristics cannot be obtained. As a technology for this purpose, a back-illuminated solid-state imaging device has been manufactured in which light is incident from the back surface of a substrate without wiring or electrodes and photoelectric conversion is performed inside the substrate to improve the condensing characteristics (for example, Patent Documents) 1).
図14は従来の裏面入射型の固体撮像素子(CMOSイメージセンサ)の一般的な構造例を示す断面図である。
この固体撮像素子は、半導体基板10中に光電変換部(フォトダイオード)の受光部12、素子分離領域14が形成され、その半導体基板10上にMOSトランジスタのゲート酸化膜16、ゲート電極18、コンタクト(図示せず)、配線膜22、26、層間絶縁膜24、28、カバー絶縁膜30等が設けられている。
このような裏面入射型構造の場合、裏面より光を入射させて、半導体基板10中の受光部12に入射した光を光電変換するが、裏面より入射した光は、基板10中で完全に光電変換が行われるわけではなく、矢印Aに示すように、入射した光の一部は基板10の表面側まで達し、さらに基板10の表面より上層へと透過するものがある。そして、この基板上層へ透過した光は、基板10の上層部に配置された金属製の配線膜22によって反射され、矢印Bに示すように、再び光電変換部に入射するものが存在する。
このような反射光が、元々透過してきた光電変換部へ再度戻って入射した場合は大きな問題にはならないが、元の光電変換部とは別の光電変換部へ入射した場合には、色分離特性の悪化やフレア等の問題となることが考えられる。
FIG. 14 is a cross-sectional view showing a general structural example of a conventional back-illuminated solid-state imaging device (CMOS image sensor).
In this solid-state imaging device, a
In the case of such a back-illuminated structure, light is incident from the back surface to photoelectrically convert light incident on the
When such reflected light enters the photoelectric conversion unit that has been transmitted again and enters again, it does not cause a big problem, but when it enters a photoelectric conversion unit different from the original photoelectric conversion unit, color separation is performed. It may be a problem such as deterioration of characteristics and flare.
そこで従来は、ゲート電極またはゲート酸化膜を金属反射膜または誘電体反射膜として反射光による悪影響を防止するものが提案されている。
しかしながら、ゲート酸化膜を反射膜とすることはMOSプロセスと両立させることが難しく、上述した特許文献1にも開示がなく、実現性に問題がある。
また、ゲート電極を反射膜とすることは可能であるが、それだけでは不十分であり、例えば図14に示したように、フォトダイオードを光が透過してしまうと、上層の配線膜で反射した光が他の画素へ再入射してしまう可能性が大きい。
However, it is difficult to make the gate oxide film a reflective film, and it is difficult to make the gate oxide film compatible with the MOS process.
In addition, although it is possible to use the gate electrode as a reflection film, it is not enough. For example, as shown in FIG. 14, when light passes through the photodiode, it is reflected by the upper wiring film. There is a high possibility that light will re-enter the other pixels.
そこで本発明は、裏面照射型の固体撮像素子において、基板裏面から光電変換部を透過して配線膜を反射した光が光電変換部に不正に再入射するのを防止でき、高画質の画像を得ることができる固体撮像素子を提供することを目的とする。 Therefore, the present invention can prevent light that has passed through the photoelectric conversion unit from the back surface of the substrate and reflected from the wiring film from entering the photoelectric conversion unit illegally in the backside illumination type solid-state imaging device, and can produce a high-quality image. An object of the present invention is to provide a solid-state imaging device that can be obtained.
上述の目的を達成するため、本発明の固体撮像素子は、画素毎に設けられ基体の第1面より入射した光を信号電荷に変換する光電変換部と、前記光電変換部によって蓄積された信号電荷を読み出す回路領域と、前記基体の前記第1面の反対側の第2面上に形成された絶縁膜及び配線膜を含む積層膜と、少なくとも前記積層膜内の配線膜と基体との間に設けられた透過防止膜とを有することを特徴とする。
また、本発明の固体撮像素子は、画素毎に設けられ基体の第1面より入射した光を信号電荷に変換する光電変換部と、前記基体の前記第1面の反対側の第2面上に形成された絶縁膜及び配線膜を含む積層膜と、前記基体の第2面上であって前記配線膜よりも基体側に設けられた透過防止膜とを有することを特徴とする。
In order to achieve the above-described object, the solid-state imaging device of the present invention includes a photoelectric conversion unit that is provided for each pixel and that converts light incident from the first surface of the substrate into a signal charge, and a signal accumulated by the photoelectric conversion unit. A circuit region for reading out charges, a laminated film including an insulating film and a wiring film formed on the second surface opposite to the first surface of the substrate, and at least between the wiring film and the substrate in the laminated film And a permeation-preventing film.
In addition, the solid-state imaging device of the present invention includes a photoelectric conversion unit that is provided for each pixel and converts light incident from the first surface of the substrate into a signal charge, and a second surface opposite to the first surface of the substrate. A laminated film including an insulating film and a wiring film, and a permeation preventive film provided on the second surface of the substrate and closer to the substrate than the wiring film.
本発明の固体撮像素子によれば、光電変換部の受光面を基体の第1面(裏面)に配置した裏面照射型の素子において、基体の第2面上に形成された配線膜と基体との間に光の透過を防止する透過防止膜を配置したことから、基体の裏面から入射して基体を透過した光が配線膜で反射して他の画素の光電変換部に不正に入射するのを防止でき、画質の悪化を防止できる効果がある。
また、固体撮像素子の回路領域としては、増幅トランジスタ、選択トランジスタ、及びリセットトランジスタを含むものや、さらに、転送トランジスタを含むものについても容易に適用でき、回路領域の構成に制約を受けることなく、不正な反射光による画質の低下を防止でき、種々の画素構成に容易に対応できる。
また、光電変換部をn型層とp型層を含むHAD構造とすることにより、さらに高特性の画質を得ることができる。
また、透過防止膜をシリサイド膜とすることにより、適正な透過防止機能(反射膜)を得ることができ、さらに、シリサイド膜をシリコン基板及びポリシリコン製のゲート電極上に金属膜を配置して熱処理して形成したものを用いることで、透過防止膜を最適な領域に容易に形成することが可能である。
また、透過防止膜を遮光用の金属膜または合金膜とすることにより、適正な透過防止機能(反射膜)を得ることができ、さらに、遮光用の金属膜または合金膜を光電変換部の受光領域に対応するパターンで形成することにより、必要な領域にだけ金属膜や合金膜を配置して効果的に光の透過を防止できる。
さらに、透過防止膜を光を吸収する層間膜とすることで、適正な透過防止機能(光吸収機能)を得ることができ、不正な反射による画質の悪化を防止できる。
According to the solid-state imaging device of the present invention, in the back-illuminated type device in which the light-receiving surface of the photoelectric conversion unit is disposed on the first surface (back surface) of the substrate, the wiring film formed on the second surface of the substrate, the substrate, Since an anti-transmission film for preventing light transmission is arranged between the two, the light that is incident from the back surface of the substrate and transmitted through the substrate is reflected by the wiring film and illegally enters the photoelectric conversion unit of another pixel. This can prevent the deterioration of image quality.
In addition, as a circuit area of the solid-state imaging device, it can be easily applied to those including an amplification transistor, a selection transistor, and a reset transistor, and further includes a transfer transistor, without being restricted by the configuration of the circuit area, It is possible to prevent deterioration in image quality due to unauthorized reflected light and to easily cope with various pixel configurations.
In addition, when the photoelectric conversion portion has an HAD structure including an n-type layer and a p-type layer, higher quality image quality can be obtained.
In addition, by using a silicide film as the transmission preventing film, an appropriate transmission preventing function (reflection film) can be obtained. Further, a metal film is disposed on the silicon substrate and the polysilicon gate electrode. By using a film formed by heat treatment, the permeation preventive film can be easily formed in an optimum region.
Further, by using a light-shielding metal film or alloy film as the light-shielding film, an appropriate light-shielding function (reflection film) can be obtained, and further, the light-shielding metal film or alloy film can be received by the photoelectric conversion unit. By forming a pattern corresponding to the region, a metal film or an alloy film can be arranged only in a necessary region to effectively prevent light transmission.
Furthermore, by using an interlayer film that absorbs light as the transmission preventing film, an appropriate transmission preventing function (light absorption function) can be obtained, and deterioration of image quality due to unauthorized reflection can be prevented.
本発明の実施の形態では、裏面照射型のCMOS固体撮像素子において、シリコン基板と積層膜内の最下層配線膜との間に、シリコン基板の裏面から入射してシリコン基板を透過した光が配線膜に至るのを防止する透過防止膜を設け、配線膜から反射した光が他の画素に不正に入射して光電変換されるのを防止する。具体的には、シリコン基板表面やポリシリコン電極膜表面にコバルト膜等を配置して熱処理して形成されるシリサイド膜を用いたり、積層膜の最下層にダミーの金属配線を設けて反射膜としたり、あるいは層間絶縁膜に光吸入性の膜を用いるといった構成が可能である。 In the embodiment of the present invention, in a back-illuminated CMOS solid-state imaging device, light that is incident from the back surface of the silicon substrate and transmitted through the silicon substrate is wired between the silicon substrate and the lowermost wiring film in the laminated film. An anti-transmission film that prevents the film from reaching the film is provided to prevent light reflected from the wiring film from being illegally incident on other pixels and being subjected to photoelectric conversion. Specifically, a silicide film formed by placing a cobalt film or the like on the surface of a silicon substrate or a polysilicon electrode film and performing heat treatment, or providing a dummy metal wiring in the bottom layer of the laminated film as a reflective film Alternatively, a configuration in which a light-absorbing film is used as the interlayer insulating film is possible.
図1は本発明の実施例1による固体撮像素子の構造例を示す断面図であり、図2は図1に示す固体撮像素子の回路領域(画素トランジスタ回路)の構成例を示す回路図である。また、図3〜図11は図1に示す固体撮像素子の製造方法の具体例を示す断面図である。
まず、図2に示すように、本実施例の固体撮像素子では、画素内に光電変換部となるフォトダイオード(PD)100と、このフォトダイオード100の蓄積電荷をリセットするためのリセットトランジスタ110と、蓄積電荷量に対応する画素信号を増幅出力するための増幅トランジスタ120と、フォトダイオード100に蓄積された信号電荷を増幅トランジスタ120のゲートに転送する転送タイミングを選択する転送トランジスタ130と、信号電荷を読み出す画素を選択する選択トランジスタ140とを有している。なお、このような画素回路の構成は従来と同様のものであり、また、他の回路構成、例えば転送トランジスタを持たない構成等であってもよいものとする。
1 is a cross-sectional view showing a structural example of a solid-state imaging device according to Embodiment 1 of the present invention, and FIG. 2 is a circuit diagram showing a configuration example of a circuit region (pixel transistor circuit) of the solid-state imaging device shown in FIG. . 3 to 11 are sectional views showing specific examples of the manufacturing method of the solid-state imaging device shown in FIG.
First, as shown in FIG. 2, in the solid-state imaging device of the present embodiment, a photodiode (PD) 100 serving as a photoelectric conversion unit in a pixel, and a
次に、図1において、基体としての半導体基板210中には素子分離領域214によって分離された領域に光電変換部(フォトダイオード)や上述したMOSトランジスタが形成されており、フォトダイオードの受光部212は半導体基板210の裏面から入射した光を受光し、光電変換を行う。なお、本実施例では、フォトダイオードに電子蓄積領域としてのn型層の受光表面に正孔蓄積領域としてのp型層を設けたHAD(Hole Accumulation Diode)構造を採用している。また、フォトダイオードに隣接して転送トランジスタが配置され、ゲート酸化膜216を介してゲート電極218が設けられ、フォトダイオードで生成した信号電荷をフローティングデフュージョン(ドレイン)部220に転送する。
また、半導体基板210の上には、ゲート酸化膜216及びゲート電極218の上面にシリコン層をコバルト等の金属によって合金化したシリサイド膜(CoSi2等)222が形成されており、また、その上層にコンタクト(図示せず)、配線膜226、230、層間絶縁膜228、232、及びカバー絶縁膜234等が設けられている。
このような固体撮像素子では、半導体基板210の上面(表面)と配線膜226、230との間に透過防止膜としてのシリサイド膜222を設けたことから、半導体基板210の裏面から入射して光電変換部を透過した光は、このシリサイド膜222によって光電変換部側に反射する構造となり、配線膜226、230への透過及び配線膜226、230からの反射を防止することができる。
Next, in FIG. 1, a photoelectric conversion unit (photodiode) and the above-described MOS transistor are formed in a region separated by an element isolation region 214 in a semiconductor substrate 210 as a base, and a
On the semiconductor substrate 210, a silicide film (CoSi2 or the like) 222 in which a silicon layer is alloyed with a metal such as cobalt is formed on the upper surfaces of the
In such a solid-state imaging device, since the
次に、図3〜図11に沿って図1に示すようなシリサイド膜の形成方法について説明する。
まず、図3において、n型シリコン基板310にフォトダイオード部やフローティングデフュージョン(FD)部等となる領域にp型のウェル層320を作製する。そして、このシリコン基板310の上面に素子分離部330、ゲート酸化膜340及びゲート電極(ポリシリコン膜)350を形成した後、フォトレジスト360のパターニングを行い、フォトダイオード部にn型のイオンを注入してフォトダイオードのn型層370を形成する。
次に、図4において、フォトレジスト380のパターニングを行い、イオン注入によってFD部に薄いn層390を形成し、さらに図5に示すように、全面に酸化膜400を堆積し、次いで図6に示すようにエッチバックを行い、サイドウォール410を形成する。
この後、図7に示すように、フォトレジスト480のパターニングを行い、FD部に濃いイオン注入を行い、LDD構造を形成する。そして、図8に示すように、フォトレジスト490のパターニングを行い、フォトダイオード部に浅くp型層420をイオン注入してHAD構造のフォトダイオードを形成する。
次に、図9に示すように、全面にCo膜430をスパッタリングで形成する。これをアニールすると、図10に示すように、Co膜430とシリコン基板310のSi、及びゲート電極350のPolySiが接触する部分ではCoSi2膜440が形成される。また、Co膜430とゲート酸化膜340のSiO2が接触する部分では、CoSi2は形成されない。これによって、Si及びPolySiの領域にはシリサイド膜440が形成される。その後、図11に示すようにウェットエッチング処理を行い、ゲート酸化膜340上のCoを除去する。なお、この後は、従来と同様の工程で固体撮像素子を完成していくものとし、本発明には直接関係しないため、説明は省略する。
Next, a method for forming a silicide film as shown in FIG. 1 will be described with reference to FIGS.
First, in FIG. 3, a p-
Next, in FIG. 4, a
Thereafter, as shown in FIG. 7, the
Next, as shown in FIG. 9, a Co film 430 is formed on the entire surface by sputtering. When this is annealed, as shown in FIG. 10, a CoSi 2
これにより、フォトダイオード部、ソース/ドレイン部の表面にシリサイド膜が形成され、矢印Cに示すように、基板の裏面から入射した光を遮光することができる。これにより、シリコン基板を透過した光が上部の配線膜で反射され、別の画素の受光部で光電変換されることがなくなり、色分離性の悪化やフレアの発生を防ぐことができる。なお、本実施例1は一例であり、本発明で用いるシリサイド膜としては、上述したコバルトシリサイドに限定されず、タングステンシリサイド膜等でもよいことはもちろんであり、また、シリサイド膜の形成位置及び形成方法についても、上述した例に限定されないものとする。 Thereby, a silicide film is formed on the surface of the photodiode portion and the source / drain portion, and as shown by an arrow C, light incident from the back surface of the substrate can be shielded. As a result, the light transmitted through the silicon substrate is reflected by the upper wiring film and is not photoelectrically converted by the light receiving portion of another pixel, so that deterioration of color separation and occurrence of flare can be prevented. The first embodiment is an example, and the silicide film used in the present invention is not limited to the cobalt silicide described above, and may be a tungsten silicide film or the like. The method is not limited to the example described above.
図12は本発明の実施例2による固体撮像素子の構造例を示す断面図である。なお、図1と共通の構成については同一符号を付している。
本実施例2は、光の透過を防止する膜として、上述したシリサイド膜の代わりに遮光用のダミー配線を用いたものである。
図12に示すように、本来形成される配線膜のうちの最も下層に遮光用のダミー配線500を配置している。なお、その下層には層間絶縁膜501が配置されている。このダミー配線500は、ポリシリコンのような光を透過する材質ではなく、タングステンやアルミ等の金属膜やその他の合金膜を用いるものとし、図示のように、フォトダイオードの受光領域に対応するパターンで形成されている。このような実施例2においても、矢印Dに示すように、基板を裏面側から透過した光をフォトダイオードに近い位置で反射させ、別の画素への不正入射を防止できる。なお、遮光用のダミー配線膜材料としては、上述したタングステンシリサイドやコバルトシリサイドを用いてもよい。
FIG. 12 is a cross-sectional view showing a structural example of a solid-state imaging device according to Embodiment 2 of the present invention. In addition, the same code | symbol is attached | subjected about the same structure as FIG.
In the second embodiment, a light-shielding dummy wiring is used in place of the above-described silicide film as a film for preventing light transmission.
As shown in FIG. 12, a light-shielding
図13は本発明の実施例3による固体撮像素子の構造例を示す断面図である。なお、図1と共通の構成については同一符号を付している。
本実施例2は、光の透過を防止する膜として、光を吸収する材質を用いた層間膜を設けたものである。
図13に示すように、シリコン基板と2層の配線膜の間には、それぞれ層間絶縁膜510、520が配置されており、これら層間絶縁膜510、520が光吸収膜となっている。具体的には、例えばシリコンカーバイド(SiC)を用いることができる。
このような層間絶縁膜510、520を設けることで、矢印Eに示すように、裏面側から入射した光が基板の表面側へと達しても、そこで吸収してしまうことが可能になり、別の画素への不正入射を防止できる。
なお、上述した実施例1〜3では、主に透過防止膜を基板と最下層の配線膜との間に設けたが、最下層の配線膜より上層に透過防止膜を配置した場合でも十分な効果が得られるものであり、例えば基板と最下層より上で2層目の配線層との間に透過防止膜を設けてもよく、このような構成も本発明に含まれるものとする。
FIG. 13 is a cross-sectional view showing a structural example of a solid-state imaging device according to Embodiment 3 of the present invention. In addition, the same code | symbol is attached | subjected about the same structure as FIG.
In the second embodiment, an interlayer film using a material that absorbs light is provided as a film for preventing light transmission.
As shown in FIG. 13, interlayer insulating films 510 and 520 are disposed between the silicon substrate and the two-layer wiring films, respectively, and these interlayer insulating films 510 and 520 serve as light absorption films. Specifically, for example, silicon carbide (SiC) can be used.
By providing such interlayer insulating films 510 and 520, as indicated by an arrow E, even if light incident from the back side reaches the front side of the substrate, it can be absorbed there. Can be prevented from being incident on the pixel.
In Examples 1 to 3 described above, the permeation preventive film is mainly provided between the substrate and the lowermost wiring film. However, even when the permeation preventive film is arranged above the lowermost wiring film, it is sufficient. For example, a permeation prevention film may be provided between the substrate and the second wiring layer above the lowermost layer, and such a configuration is also included in the present invention.
100……フォトダイオード、110……リセットトランジスタ、120……増幅トランジスタ、130……転送トランジスタ、140……選択トランジスタ、210……半導体基板、212……受光部、214……素子分離領域、216……ゲート酸化膜、218……ゲート電極、220……フローティングデフュージョン部、222……シリサイド膜、224……絶縁膜、226、230……配線膜、228、232……層間絶縁膜、234……カバー絶縁膜。
DESCRIPTION OF
Claims (11)
前記光電変換部によって蓄積された信号電荷を読み出す回路領域と、
前記基体の前記第1面の反対側の第2面上に形成された絶縁膜及び配線膜を含む積層膜と、
少なくとも前記積層膜内の配線膜と基体との間に設けられた透過防止膜と、
を有することを特徴とする固体撮像素子。 A photoelectric conversion unit that is provided for each pixel and converts light incident from the first surface of the substrate into a signal charge;
A circuit region for reading out signal charges accumulated by the photoelectric conversion unit;
A laminated film including an insulating film and a wiring film formed on the second surface of the base opposite to the first surface;
At least a permeation preventive film provided between the wiring film and the substrate in the laminated film;
A solid-state imaging device comprising:
前記基体の前記第1面の反対側の第2面上に形成された絶縁膜及び配線膜を含む積層膜と、
前記基体の第2面上であって前記配線膜よりも基体側に設けられた透過防止膜と、
を有することを特徴とする固体撮像素子。 A photoelectric conversion unit that is provided for each pixel and converts light incident from the first surface of the substrate into a signal charge;
A laminated film including an insulating film and a wiring film formed on the second surface of the base opposite to the first surface;
A permeation preventive film provided on the second surface of the base body and closer to the base body than the wiring film;
A solid-state imaging device comprising:
The solid-state imaging device according to claim 10, wherein the transmission preventing film is a reflective film.
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Publication number | Priority date | Publication date | Assignee | Title |
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US9911781B2 (en) | 2009-09-17 | 2018-03-06 | Sionyx, Llc | Photosensitive imaging devices and associated methods |
JP2011129627A (en) * | 2009-12-16 | 2011-06-30 | Panasonic Corp | Semiconductor device |
JP5663925B2 (en) * | 2010-03-31 | 2015-02-04 | ソニー株式会社 | Solid-state imaging device, manufacturing method thereof, and electronic apparatus |
US8629523B2 (en) | 2010-04-16 | 2014-01-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Inserted reflective shield to improve quantum efficiency of image sensors |
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US8389921B2 (en) * | 2010-04-30 | 2013-03-05 | Omnivision Technologies, Inc. | Image sensor having array of pixels and metal reflectors with widths scaled based on distance from center of the array |
US20120146172A1 (en) | 2010-06-18 | 2012-06-14 | Sionyx, Inc. | High Speed Photosensitive Devices and Associated Methods |
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JP2012064709A (en) | 2010-09-15 | 2012-03-29 | Sony Corp | Solid state image pick-up device and electronic device |
US9496308B2 (en) | 2011-06-09 | 2016-11-15 | Sionyx, Llc | Process module for increasing the response of backside illuminated photosensitive imagers and associated methods |
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US9064764B2 (en) | 2012-03-22 | 2015-06-23 | Sionyx, Inc. | Pixel isolation elements, devices, and associated methods |
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JP6466346B2 (en) | 2013-02-15 | 2019-02-06 | サイオニクス、エルエルシー | High dynamic range CMOS image sensor with anti-blooming characteristics and associated method |
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US9209345B2 (en) | 2013-06-29 | 2015-12-08 | Sionyx, Inc. | Shallow trench textured regions and associated methods |
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US11101305B2 (en) * | 2016-10-27 | 2021-08-24 | Sony Semiconductor Solutions Corporation | Imaging element and electronic device |
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CN110444556B (en) * | 2019-08-30 | 2021-12-03 | 上海华力微电子有限公司 | CMOS sensor and method for forming CMOS sensor |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03104166A (en) * | 1989-09-18 | 1991-05-01 | Fujitsu Ltd | Photo detecting device |
JPH06236986A (en) * | 1993-02-10 | 1994-08-23 | Nec Corp | Solid-state infrared imaging device |
JP2000323695A (en) * | 1999-05-14 | 2000-11-24 | Nec Corp | Solid-state image sensor and its manufacture |
JP2003273343A (en) * | 2002-03-19 | 2003-09-26 | Sony Corp | Manufacturing method of solid-state image sensing element |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5416344A (en) * | 1992-07-29 | 1995-05-16 | Nikon Corporation | Solid state imaging device and method for producing the same |
JP2797941B2 (en) * | 1993-12-27 | 1998-09-17 | 日本電気株式会社 | Photoelectric conversion element and driving method thereof |
US5747863A (en) * | 1996-07-08 | 1998-05-05 | Nikon Corporation | Infrared solid-state image pickup device and infrared solid-state image pickup apparatus equipped with this device |
EP0837418A3 (en) * | 1996-10-18 | 2006-03-29 | Kabushiki Kaisha Toshiba | Method and apparatus for generating information input using reflected light image of target object |
JPH1145989A (en) * | 1997-04-08 | 1999-02-16 | Matsushita Electron Corp | Solid state image pickup device and manufacture thereof |
US6731007B1 (en) * | 1997-08-29 | 2004-05-04 | Hitachi, Ltd. | Semiconductor integrated circuit device with vertically stacked conductor interconnections |
TW556013B (en) * | 1998-01-30 | 2003-10-01 | Seiko Epson Corp | Electro-optical apparatus, method of producing the same and electronic apparatus |
JP3103064B2 (en) * | 1998-04-23 | 2000-10-23 | 松下電子工業株式会社 | Solid-state imaging device and method of manufacturing the same |
US6077722A (en) * | 1998-07-14 | 2000-06-20 | Bp Solarex | Producing thin film photovoltaic modules with high integrity interconnects and dual layer contacts |
US6310366B1 (en) * | 1999-06-16 | 2001-10-30 | Micron Technology, Inc. | Retrograde well structure for a CMOS imager |
US6168965B1 (en) * | 1999-08-12 | 2001-01-02 | Tower Semiconductor Ltd. | Method for making backside illuminated image sensor |
US6350127B1 (en) * | 1999-11-15 | 2002-02-26 | Taiwan Semiconductor Manufacturing Company | Method of manufacturing for CMOS image sensor |
US6511778B2 (en) * | 2000-01-05 | 2003-01-28 | Shin-Etsu Chemical Co., Ltd. | Phase shift mask blank, phase shift mask and method of manufacture |
DE10056871B4 (en) * | 2000-11-16 | 2007-07-12 | Advanced Micro Devices, Inc., Sunnyvale | Improved gate contact field effect transistor and method of making the same |
US6387767B1 (en) * | 2001-02-13 | 2002-05-14 | Advanced Micro Devices, Inc. | Nitrogen-rich silicon nitride sidewall spacer deposition |
JP4123415B2 (en) * | 2002-05-20 | 2008-07-23 | ソニー株式会社 | Solid-state imaging device |
WO2004027879A2 (en) * | 2002-09-19 | 2004-04-01 | Quantum Semiconductor Llc | Light-sensing device |
US7091536B2 (en) * | 2002-11-14 | 2006-08-15 | Micron Technology, Inc. | Isolation process and structure for CMOS imagers |
JP3840214B2 (en) * | 2003-01-06 | 2006-11-01 | キヤノン株式会社 | Photoelectric conversion device, method for manufacturing photoelectric conversion device, and camera using the same |
JP4647404B2 (en) * | 2004-07-07 | 2011-03-09 | 三星電子株式会社 | Manufacturing method of image sensor having photodiode self-aligned while being superimposed on transfer gate electrode |
WO2006137866A2 (en) * | 2004-09-17 | 2006-12-28 | Bedabrata Pain | Back- illuminated cmos or ccd imaging device structure |
-
2004
- 2004-10-20 JP JP2004306182A patent/JP4867152B2/en not_active Expired - Fee Related
-
2005
- 2005-10-19 TW TW094136606A patent/TWI281253B/en not_active IP Right Cessation
- 2005-10-19 US US11/253,823 patent/US8384176B2/en active Active
- 2005-10-20 CN CN200510131571.XA patent/CN1776917B/en active Active
- 2005-10-20 KR KR1020050098969A patent/KR101150559B1/en not_active IP Right Cessation
-
2008
- 2008-06-26 US US12/215,242 patent/US7902623B2/en not_active Expired - Fee Related
- 2008-06-26 US US12/215,287 patent/US7902622B2/en not_active Expired - Fee Related
-
2011
- 2011-03-08 US US13/043,090 patent/US8324702B2/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03104166A (en) * | 1989-09-18 | 1991-05-01 | Fujitsu Ltd | Photo detecting device |
JPH06236986A (en) * | 1993-02-10 | 1994-08-23 | Nec Corp | Solid-state infrared imaging device |
JP2000323695A (en) * | 1999-05-14 | 2000-11-24 | Nec Corp | Solid-state image sensor and its manufacture |
JP2003273343A (en) * | 2002-03-19 | 2003-09-26 | Sony Corp | Manufacturing method of solid-state image sensing element |
Cited By (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8130297B2 (en) | 2005-12-19 | 2012-03-06 | Renesas Electronics Corporation | Solid state imaging device including a light receiving portion with a silicided surface |
JP2007173267A (en) * | 2005-12-19 | 2007-07-05 | Nec Electronics Corp | Solid-state image pickup device |
US8810699B2 (en) | 2005-12-19 | 2014-08-19 | Renesas Electronics Corporation | Solid state imaging device including a light receiving portion with a silicided surface |
JP2008016733A (en) * | 2006-07-07 | 2008-01-24 | Nec Electronics Corp | Solid-state image pickup device |
US9159759B2 (en) | 2006-07-07 | 2015-10-13 | Renesas Electronics Corporation | Solid-state image pickup device |
JP4525671B2 (en) * | 2006-12-08 | 2010-08-18 | ソニー株式会社 | Solid-state imaging device |
KR101396671B1 (en) * | 2006-12-08 | 2014-05-16 | 소니 주식회사 | Solid-state imaging device |
JP2008147333A (en) * | 2006-12-08 | 2008-06-26 | Sony Corp | Solid-state imaging device, manufacturing method thereof and imaging apparatus |
US8405180B2 (en) | 2006-12-08 | 2013-03-26 | Sony Corporation | Solid-state imaging device, method of making the same, and imaging apparatus |
US7960197B2 (en) | 2006-12-08 | 2011-06-14 | Sony Corporation | Method of making a solid-state imaging device |
US8039914B2 (en) | 2006-12-08 | 2011-10-18 | Sony Corporation | Solid-state imaging device, method of making the same, and imaging apparatus |
US8098312B2 (en) | 2008-05-29 | 2012-01-17 | Kabushiki Kaisha Toshiba | Back-illuminated type solid-state image pickup apparatus with peripheral circuit unit |
US8384172B2 (en) | 2009-01-06 | 2013-02-26 | Samsung Electronics Co., Ltd. | Image sensor having reflective metal lines under photoelectric conversion devices |
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US8319305B2 (en) | 2009-05-12 | 2012-11-27 | Canon Kabushiki Kaisha | Solid-state image sensing apparatus |
JP2010267680A (en) * | 2009-05-12 | 2010-11-25 | Canon Inc | Solid state image pickup device |
JP2010177705A (en) * | 2010-04-16 | 2010-08-12 | Sony Corp | Solid-state imaging device, manufacturing method thereof and imaging device |
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JP2010177704A (en) * | 2010-04-16 | 2010-08-12 | Sony Corp | Solid-state imaging device, manufacturing method thereof and imaging device |
JP2012079979A (en) * | 2010-10-04 | 2012-04-19 | Sony Corp | Solid-state imaging device, method for manufacturing the same, and electronic apparatus |
US9136420B2 (en) | 2010-10-04 | 2015-09-15 | Sony Corporation | Solid-state imaging device with photoelectric conversion section, method of manufacturing the same, and electronic device with photoelectric conversion section |
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JP2012231032A (en) * | 2011-04-26 | 2012-11-22 | Canon Inc | Solid state imaging device and imaging apparatus |
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JP2011228748A (en) * | 2011-08-04 | 2011-11-10 | Renesas Electronics Corp | Solid-state imaging device |
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JP2016171345A (en) * | 2011-09-01 | 2016-09-23 | キヤノン株式会社 | Solid state image pickup device |
JP2013058661A (en) * | 2011-09-09 | 2013-03-28 | Sony Corp | Solid-state imaging device and electronic apparatus |
JP2012070005A (en) * | 2011-12-22 | 2012-04-05 | Renesas Electronics Corp | Solid photographing device |
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Also Published As
Publication number | Publication date |
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CN1776917B (en) | 2014-11-12 |
US20080272415A1 (en) | 2008-11-06 |
US20060086956A1 (en) | 2006-04-27 |
KR20060054129A (en) | 2006-05-22 |
KR101150559B1 (en) | 2012-06-01 |
US20080272419A1 (en) | 2008-11-06 |
TW200633199A (en) | 2006-09-16 |
JP4867152B2 (en) | 2012-02-01 |
US20110180690A1 (en) | 2011-07-28 |
CN1776917A (en) | 2006-05-24 |
US8384176B2 (en) | 2013-02-26 |
US8324702B2 (en) | 2012-12-04 |
US7902623B2 (en) | 2011-03-08 |
US7902622B2 (en) | 2011-03-08 |
TWI281253B (en) | 2007-05-11 |
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