JP2006012998A - Semiconductor processing adhesive sheet - Google Patents

Semiconductor processing adhesive sheet Download PDF

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JP2006012998A
JP2006012998A JP2004185428A JP2004185428A JP2006012998A JP 2006012998 A JP2006012998 A JP 2006012998A JP 2004185428 A JP2004185428 A JP 2004185428A JP 2004185428 A JP2004185428 A JP 2004185428A JP 2006012998 A JP2006012998 A JP 2006012998A
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adhesive layer
pressure
sensitive adhesive
film
layer
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JP4393934B2 (en
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Kazuhiro Takahashi
和弘 高橋
Koichi Nagamoto
公市 永元
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Lintec Corp
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  • Mechanical Treatment Of Semiconductor (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Adhesive Tapes (AREA)
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a semiconductor processing adhesive sheet which comprises an adhesive sheet, in which a rigid base material and an adhesive layer having a low elasticity as well as a large thickness are combined into a layer structure, and a peel film provided thereon, and which is free from creases even after it is wound in a roll shape and stored. <P>SOLUTION: The semiconductor processing adhesive sheet comprises the base material, adhesive layer formed on the base material, and peel film formed on the adhesive layer. The base material has a rigid film in which at least one layer has a Young's modulus of 2,000 MPa or over, the adhesive layer includes a soft adhesive layer having a storage elastic modulus of 1.0×10<SP>5</SP>Pa or less and a thickness of 50 μm or over, and the peel film has a Young's modulus of 700 MPa or less. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、ロール状等の形状に巻き取って供給するのに適した、半導体加工用粘着シートに関する。   The present invention relates to a pressure-sensitive adhesive sheet for semiconductor processing, which is suitable for winding and supplying in a roll shape or the like.

電子機器の小型化に伴い、従来は350μm程度の厚さであった半導体ウエハを50〜100μm、あるいはそれ以下まで薄く研削する必要が生じている。半導体ウエハの裏面研削工程においては、回路が形成されているウエハ表面は粘着シートを貼付することによって保護される。半導体ウエハは薄く研削されるほど破損が起こりやすくなるため、それを防ぐための保護粘着シートにはより高い支持強度が要求されるようになってきており、たとえば特許文献1では、基材に剛性フィルムを使ったものが開示されている。   Along with the downsizing of electronic equipment, it has become necessary to grind a semiconductor wafer, which has conventionally been about 350 μm thick, to 50 to 100 μm or less. In the back grinding process of the semiconductor wafer, the wafer surface on which the circuit is formed is protected by attaching an adhesive sheet. Since semiconductor wafers are more susceptible to damage as they are ground more thinly, higher support strength is required for protective adhesive sheets for preventing such damage. For example, in Patent Document 1, the base material is rigid. A film is disclosed.

さらに、近年ICチップの実装方法の多様化が進んでおり、たとえばICチップが回路面を下側にして配置される、いわゆるフリップチップ実装では凸状の電極素子が回路表面より突出し、回路表面における高低差は20μm以上、場合によっては100μmを超える。このような表面の凹凸差が大きいウエハの裏面研削工程において好適に使用される保護粘着シートとしては、基材と粘着層の間に貯蔵弾性率の低い中間層を設けて厚みをもたせたものが特許文献2に開示されている。中間層が粘着層と共に被着体の凹凸に追従して高低差を吸収するため、ウエハは平坦に保持され、厚さが均一で極薄な形状まで裏面研削が可能となる。
特開2003−129011号公報 特開2000−212530号公報
Furthermore, in recent years, IC chip mounting methods have been diversified. For example, in so-called flip chip mounting in which an IC chip is arranged with a circuit surface facing downward, a convex electrode element protrudes from the circuit surface. The height difference is 20 μm or more, and in some cases exceeds 100 μm. As a protective adhesive sheet suitably used in the back surface grinding process of a wafer having such a large unevenness of the surface, an adhesive layer having a low storage elastic modulus is provided between the base material and the adhesive layer to give a thickness. It is disclosed in Patent Document 2. Since the intermediate layer and the adhesive layer follow the unevenness of the adherend to absorb the height difference, the wafer is held flat, and the back surface can be ground to a very thin shape with a uniform thickness.
JP 2003-129011 A JP 2000-21530 A

粘着層の平滑性を維持し、また粘着層を汚染から保護するために、上記のような半導体加工用粘着シートにおいては通常、粘着層の表面に剥離フィルムが仮着される。剥離フィルムとしては、片面がシリコーン系剥離剤で処理された寸法安定性に優れるポリエチレンテレフタレートフィルムが多用されている。また粘着シートの輸送、保管は、ロール状に巻き取った形態で行うのが操作性や経済性の観点から有利である。   In order to maintain the smoothness of the pressure-sensitive adhesive layer and protect the pressure-sensitive adhesive layer from contamination, a release film is usually temporarily attached to the surface of the pressure-sensitive adhesive layer in the above-described pressure-sensitive adhesive sheet for semiconductor processing. As the release film, a polyethylene terephthalate film having one side treated with a silicone release agent and excellent in dimensional stability is frequently used. Moreover, it is advantageous from the viewpoint of operability and economy that the pressure-sensitive adhesive sheet is transported and stored in the form of being wound in a roll.

しかしながら、剛性の高い基材上に低弾性で厚みのある粘着層を有する粘着シートに上記のような汎用の剥離フィルムを貼着してロール状に巻くと、基材と剥離フィルムにはその巻き取り半径の差に起因する張力差が生じる。この張力差を解消しようとして、巻き取り時や保管時に粘着シートにシワが発生するという問題があった。   However, when a general-purpose release film as described above is attached to a pressure-sensitive adhesive sheet having a low-elasticity and thick pressure-sensitive adhesive layer on a highly rigid base material, A difference in tension is caused by the difference in the take-off radius. In an attempt to eliminate this tension difference, there was a problem that the pressure-sensitive adhesive sheet was wrinkled during winding or storage.

粘着層と剥離フィルムとの間にシワが入ると粘着層の表面が変形する。粘着層が変形した粘着シートを半導体ウエハに適用すると、剥離する際に、変形した領域に糊残りが大きく発生する。これは、粘着層の粘着剤がエネルギー線硬化性であってもなくても同様である。   When wrinkles enter between the adhesive layer and the release film, the surface of the adhesive layer is deformed. When an adhesive sheet having a deformed adhesive layer is applied to a semiconductor wafer, a large amount of adhesive residue is generated in the deformed region when the adhesive sheet is peeled off. This is the same whether or not the adhesive of the adhesive layer is energy ray curable.

表面の凹凸差が大きいウエハを極薄まで研削するための半導体加工用粘着シートとしては、シート全体に高い支持強度をもたせるための剛性基材と、被着体表面の凹凸差に対応できる低弾性で厚みのある粘着層とを組み合わせたものが理想的である。   As a pressure-sensitive adhesive sheet for semiconductor processing to grind wafers with a large difference in surface roughness to ultrathin, a rigid base material that gives the entire sheet high support strength and low elasticity that can cope with unevenness on the surface of the adherend A combination with a thick adhesive layer is ideal.

したがって、このような層構成のシートにさらに粘着層保護のための剥離フィルムが設けられたもので、ロール状に巻き取られ保管された後でもシワが発生することのない半導
体加工用粘着シートが求められている。
Therefore, the pressure-sensitive adhesive sheet for semiconductor processing is provided with a release film for protecting the pressure-sensitive adhesive layer on the sheet having such a layer structure, and does not generate wrinkles even after being wound and stored in a roll shape. It has been demanded.

このような課題を解決する本発明の要旨は以下のとおりである。
[1]基材と、その上に形成された粘着層と、該粘着層の上に形成された剥離フィルムとからなる半導体加工用粘着シートであって、
該基材が、少なくとも1層のヤング率が2000MPa以上の剛性フィルムを有し、
該粘着層が、貯蔵弾性率が1.0×105Pa以下であり厚さが50μm以上の軟質粘着層を含み、
該剥離フィルムが、ヤング率が700MPa以下のフィルムからなることを特徴とする半導体加工用粘着シート。
[2]前記剥離フィルムの粘着層に接する面が剥離処理されていることを特徴とする[1]に記載の半導体加工用粘着シート。
The gist of the present invention for solving such problems is as follows.
[1] A semiconductor processing pressure-sensitive adhesive sheet comprising a substrate, an adhesive layer formed thereon, and a release film formed on the adhesive layer,
The substrate has a rigid film having a Young's modulus of at least one layer of 2000 MPa or more,
The adhesive layer includes a soft adhesive layer having a storage elastic modulus of 1.0 × 10 5 Pa or less and a thickness of 50 μm or more,
The pressure-sensitive adhesive sheet for semiconductor processing, wherein the release film is a film having a Young's modulus of 700 MPa or less.
[2] The adhesive sheet for semiconductor processing according to [1], wherein a surface of the release film that contacts the adhesive layer is subjected to a release treatment.

本発明によれば、表面の凹凸差が大きいウエハの裏面研削に好適に用いられる半導体加工用粘着シートを、ロール状に巻いた状態でシワを発生させることなく提供することが可能となる。このような半導体加工用粘着シートは、ロール状に巻かれているときにシワが発生して粘着層が変形することがないので、ウエハから剥離する際に糊残りを引き起こすこともない。   ADVANTAGE OF THE INVENTION According to this invention, it becomes possible to provide the adhesive sheet for semiconductor processing used suitably for the back surface grinding | polishing of the wafer with a large unevenness | corrugation of the surface, without generating a wrinkle in the state wound by roll shape. Such a pressure-sensitive adhesive sheet for semiconductor processing does not cause wrinkles when the roll is wound and the adhesive layer is not deformed, and therefore does not cause adhesive residue when peeling from the wafer.

以下、本発明に係る粘着シートについて、さらに具体的に説明する。   Hereinafter, the pressure-sensitive adhesive sheet according to the present invention will be described more specifically.

本発明に係る半導体加工用粘着シートは、基材、粘着層、剥離フィルムがこの順に積層されてなる。剥離フィルムの粘着層に接する面は剥離剤によって剥離処理されていてもよい。   The adhesive sheet for semiconductor processing according to the present invention is formed by laminating a base material, an adhesive layer, and a release film in this order. The surface in contact with the adhesive layer of the release film may be subjected to a release treatment with a release agent.

本発明の半導体加工用粘着シートは、基材に特定のヤング率の剛性フィルムを少なくとも1層有する。すなわち、当該剛性フィルムのヤング率は2000MPa以上であり、好ましくは3000〜7000MPaである。このような剛性フィルムを基材に有していることにより、高い支持強度が得られ、ウエハを極薄まで研削する場合であってもウエハを破損することなく保持できる。   The pressure-sensitive adhesive sheet for semiconductor processing of the present invention has at least one layer of a rigid film having a specific Young's modulus on a base material. That is, the Young's modulus of the rigid film is 2000 MPa or more, preferably 3000 to 7000 MPa. By having such a rigid film as a base material, a high support strength can be obtained, and even when the wafer is ground to an extremely thin thickness, the wafer can be held without being damaged.

このような剛性フィルムとしては、上記ヤング率を有する限り特に限定はされず、従来より公知の種々のフィルムが用いられる。中でも、耐水性、耐熱性、剛性等の点から、合成樹脂フィルムが好ましく用いられる。具体的には、ポリ塩化ビニルフィルム、ポリエチレンナフタレートフィルム、ポリイミドフィルム、ポリエーテルエーテルケトンフィルム、ポリエーテルスルフォンフィルム、ポリスチレンフィルム、ポリエチレンテレフタレートフィルム、ポリブチレンテレフタレートフィルム、ポリウレタンフィルム、ポリアミドフィルムなどが用いられる。   Such a rigid film is not particularly limited as long as it has the above Young's modulus, and conventionally known various films are used. Among these, a synthetic resin film is preferably used in terms of water resistance, heat resistance, rigidity, and the like. Specifically, a polyvinyl chloride film, a polyethylene naphthalate film, a polyimide film, a polyether ether ketone film, a polyether sulfone film, a polystyrene film, a polyethylene terephthalate film, a polybutylene terephthalate film, a polyurethane film, a polyamide film, etc. are used. .

上記の剛性フィルムの厚さは、好ましくは10μm以上であり、さらに好ましくは20〜1000μm、特に好ましくは50〜200μmである。   The thickness of the rigid film is preferably 10 μm or more, more preferably 20 to 1000 μm, and particularly preferably 50 to 200 μm.

本発明における基材は、上記のようなヤング率を示す剛性フィルムのみからなる単層または複層構造であってもよいし、異なるヤング率を示す別のフィルムと上記剛性フィルムとの複層構造であってもよい。別のフィルムとしては、前述した剛性フィルムに用いられるフィルムの他、低密度ポリエチレン(LDPE)、直鎖低密度ポリエチレン(LLDPE)、エチレン・プロピレン共重合体、ポリプロピレン、ポリブテン、ポリブタジエン、
ポリメチルペンテン、エチレン・酢酸ビニル共重合体、エチレン・(メタ)アクリル酸共重合体、エチレン・(メタ)アクリル酸メチル共重合体、エチレン・(メタ)アクリル酸エチル共重合体、ポリ塩化ビニル、エチレン・酢酸ビニル共重合体、塩化ビニル・酢酸ビニル共重合体、エチレン・塩化ビニル・酢酸ビニル共重合体、ポリウレタンフィルム、ポリアミドフィルム、アイオノマーあるいはスチレン・ブタジエンゴムおよびその水添加物または変性物等からなるフィルム、ポリプロピレンフィルム、ポリメチルペンテンフィルム等のポリオレフィンフィルム等が挙げられる。
The substrate in the present invention may be a single layer or a multilayer structure composed only of a rigid film exhibiting the above Young's modulus, or a multilayer structure of another film exhibiting a different Young's modulus and the rigid film. It may be. As another film, in addition to the film used for the rigid film described above, low density polyethylene (LDPE), linear low density polyethylene (LLDPE), ethylene / propylene copolymer, polypropylene, polybutene, polybutadiene,
Polymethylpentene, ethylene / vinyl acetate copolymer, ethylene / (meth) acrylic acid copolymer, ethylene / (meth) acrylic acid methyl copolymer, ethylene / (meth) acrylic acid ethyl copolymer, polyvinyl chloride , Ethylene / vinyl acetate copolymer, vinyl chloride / vinyl acetate copolymer, ethylene / vinyl chloride / vinyl acetate copolymer, polyurethane film, polyamide film, ionomer or styrene / butadiene rubber and its water additives or modified products, etc. And a polyolefin film such as a polypropylene film and a polymethylpentene film.

本発明の基材の厚さは、好ましくは25μm以上であり、さらに好ましくは50〜500μm、特に好ましくは75〜200μmである。   The thickness of the base material of the present invention is preferably 25 μm or more, more preferably 50 to 500 μm, and particularly preferably 75 to 200 μm.

なお、基材の上面、すなわち粘着層が形成される側の面には、粘着層との密着性を向上させるために、コロナ処理を施したりプライマー等他の層を設けてもよい。   In addition, in order to improve adhesiveness with an adhesion layer, you may perform a corona treatment or other layers, such as a primer, in the upper surface of a base material, ie, the surface in the side in which an adhesion layer is formed.

本発明に係る半導体加工用粘着シートは、特定の貯蔵弾性率および特定の厚さの軟質粘着層を有する。すなわち、軟質粘着層の貯蔵弾性率は1.0×105Pa以下であり、好ましくは1.0×104〜1.0×105Paである。軟質粘着層の厚さは50μm以上であり、好ましくは60〜300μmである。 The pressure-sensitive adhesive sheet for semiconductor processing according to the present invention has a soft pressure-sensitive adhesive layer having a specific storage elastic modulus and a specific thickness. That is, the storage elastic modulus of the soft adhesive layer is 1.0 × 10 5 Pa or less, preferably 1.0 × 10 4 to 1.0 × 10 5 Pa. The thickness of the soft adhesive layer is 50 μm or more, preferably 60 to 300 μm.

軟質粘着層に用いられる材料は特に限定されず、従来より半導体加工用粘着シートに用いられてきた種々の粘着性材料により形成され得る。具体的には、たとえばゴム系、アクリル系、シリコーン系、ウレタン系、ポリビニルエーテル等の粘着剤が用いられる。また、エネルギー線硬化型や加熱発泡型、水膨潤型の粘着剤も用いることができる。   The material used for the soft adhesive layer is not particularly limited, and may be formed of various adhesive materials that have been conventionally used for adhesive sheets for semiconductor processing. Specifically, adhesives such as rubber-based, acrylic-based, silicone-based, urethane-based, and polyvinyl ether are used. In addition, an energy ray curable adhesive, a heat-foaming adhesive, or a water swelling adhesive can be used.

エネルギー線硬化(エネルギー線硬化、紫外線硬化、電子線硬化)型粘着剤とは、エネルギー線硬化性を有しており、エネルギー線照射前においては十分な粘着性を有してウエハ等の被着体に確実に接着し、エネルギー線照射により硬化して接着力を低下または消失して、容易に被着体から剥離する性質を有する粘着剤である。エネルギー線硬化型粘着剤としては、特に紫外線硬化型粘着剤を用いることが好ましい。エネルギー線硬化型粘着剤は、一般的には、アクリル系粘着剤と、エネルギー線重合性化合物とを主成分としてなる。このようなエネルギー線硬化型粘着剤の詳細は、たとえば特開昭60−196956号公報、特開昭60−223139号公報、特開平5−32946号公報、特開平8−27239号公報等に記載されている。軟質粘着層としてエネルギー線硬化型粘着剤が使用された場合、その貯蔵弾性率はエネルギー線硬化前の値である。また、水膨潤型粘着剤としては、たとえば特公平5−77284号公報、特公平6−101455号公報等に記載のものが好ましく用いられる。   Energy ray curable (energy ray curable, ultraviolet ray curable, electron beam curable) type adhesives have energy ray curable properties, and adhere to wafers etc. with sufficient adhesion before energy ray irradiation. It is a pressure-sensitive adhesive that has a property of adhering to a body reliably, curing by irradiation with energy rays, reducing or disappearing the adhesive force, and easily peeling from the adherend. As the energy ray curable adhesive, it is particularly preferable to use an ultraviolet curable adhesive. The energy beam curable pressure-sensitive adhesive generally comprises an acrylic pressure-sensitive adhesive and an energy beam polymerizable compound as main components. Details of such energy beam curable pressure-sensitive adhesives are described in, for example, JP-A-60-196956, JP-A-60-223139, JP-A-5-32946, and JP-A-8-27239. Has been. When an energy ray curable pressure sensitive adhesive is used as the soft adhesive layer, the storage elastic modulus is a value before energy ray curing. Moreover, as a water swelling type adhesive, what is described, for example in Japanese Patent Publication No. 5-77284, Japanese Patent Publication No. 6-101455, etc. is used preferably.

軟質粘着層を構成する粘着性材料としては、溶剤型、エマルジョン型、無溶剤型のいずれを使用してもよい。特に本発明において軟質粘着層の厚さを厚くする場合には、無溶剤型粘着剤を用いることにより、少ない塗布回数で所望の厚さとすることができる。無溶剤型粘着剤としては、アクリル樹脂やウレタン樹脂(あるいはオリゴマー)にエネルギー線硬化性の反応希釈剤を配合したものが挙げられ、基材に塗布した後エネルギー線を照射することにより軟質粘着層が形成される。このようなエネルギー線硬化性の無溶剤型粘着剤は、エネルギー線照射前には塗料状態(液状)で粘着層を形成せず、エネルギー線照射により固化して粘着層を形成してエネルギー線硬化性を消失する性質を有し、前述のエネルギー線硬化型粘着剤とは異なる。軟質粘着層としてこのようなエネルギー線硬化性の無溶剤型粘着剤が使用された場合は、その貯蔵弾性率はエネルギー線照射後の値である。   As the adhesive material constituting the soft adhesive layer, any of a solvent type, an emulsion type, and a solventless type may be used. In particular, when the thickness of the soft adhesive layer is increased in the present invention, a desired thickness can be obtained with a small number of coatings by using a solventless adhesive. Solventless adhesives include acrylic resins and urethane resins (or oligomers) blended with an energy ray-curable reaction diluent, and a soft adhesive layer that is applied to a substrate and then irradiated with energy rays. Is formed. Such an energy ray curable solventless adhesive does not form an adhesive layer in a paint state (liquid) before irradiation with energy rays, but solidifies upon irradiation with energy rays to form an adhesive layer and cures energy rays. It is different from the aforementioned energy ray curable pressure-sensitive adhesive. When such an energy ray-curable solventless adhesive is used as the soft adhesive layer, the storage elastic modulus is a value after irradiation with energy rays.

軟質粘着層の貯蔵弾性率を1.0×105Pa以下とする方法としては、一般的に、軟質粘着層を構成するポリマー成分を柔軟性の高い材質にする、軟質粘着層の架橋構造を疎
とする、低分子量成分の量を増加する、などの方法が挙げられ、具体的には、
1)軟質粘着層のポリマー成分を構成するモノマーにおいて、ホモポリマーのTgが低いモノマーの配合比を増加させること、または極性の高いモノマーの配合比を低減すること、
2)軟質粘着層に配合する架橋剤の量を低減する、または軟質粘着層のポリマー成分への架橋可能な官能基の導入量を低減すること、あるいは軟質粘着層に配合する架橋剤を架橋点間距離の長い化合物にすること、
3)軟質粘着層の架橋構造に影響を及ぼさないような可塑剤等の低分子量成分の配合量を増加する、または軟質粘着層のポリマー成分の分子量分布を低分子領域にシフトするようにすることが挙げられる。
As a method for setting the storage elastic modulus of the soft adhesive layer to 1.0 × 10 5 Pa or less, generally, the cross-linking structure of the soft adhesive layer is made by making the polymer component constituting the soft adhesive layer a highly flexible material. Examples include sparse and increasing the amount of low molecular weight components. Specifically,
1) In the monomer constituting the polymer component of the soft adhesive layer, increasing the blending ratio of the monomer having a low homopolymer Tg, or reducing the blending ratio of the highly polar monomer,
2) Reduce the amount of the crosslinking agent blended in the soft adhesive layer, reduce the amount of crosslinkable functional groups introduced into the polymer component of the soft adhesive layer, or crosslink the crosslinking agent blended in the soft adhesive layer. Making it a long distance compound,
3) Increase the blending amount of low molecular weight components such as plasticizers that do not affect the cross-linking structure of the soft adhesive layer, or shift the molecular weight distribution of the polymer component of the soft adhesive layer to the low molecular region. Is mentioned.

また、軟質粘着層がエネルギー線硬化型粘着剤からなる場合には、上記の手段に加えて、
4)エネルギー線硬化性成分として使用するモノマーやオリゴマーの配合量を増加することが挙げられる。
In addition, when the soft adhesive layer is made of an energy ray curable adhesive, in addition to the above means,
4) Increasing the blending amount of monomers and oligomers used as energy ray-curable components.

本発明の半導体加工用粘着シートにおける粘着層は、上記した軟質粘着層の単層構造であってもよいが、軟質粘着層どうしの複層構造であってもよいし、貯蔵弾性率の大きい別の粘着層との複層構造であってもよい。   The pressure-sensitive adhesive layer in the pressure-sensitive adhesive sheet for semiconductor processing of the present invention may be a single-layer structure of the above-mentioned soft pressure-sensitive adhesive layer, but may be a multilayer structure of soft pressure-sensitive adhesive layers, or a layer having a large storage elastic modulus. It may be a multilayer structure with the adhesive layer.

粘着層が単層構造の軟質粘着層である場合は、その軟質粘着層としてエネルギー線硬化型粘着剤を用いることがより好ましい。貯蔵弾性率が低い軟質粘着層は、剥離時に被着体に糊残りを起こしやすい。しかし、エネルギー線硬化型粘着剤からなる軟質粘着層であれば、粘着シートを剥離する直前にエネルギー線(紫外線、電子線等)を照射して軟質粘着層を硬化すれば、被着体に糊残りしないように剥離することができる。   When the adhesive layer is a soft adhesive layer having a single-layer structure, it is more preferable to use an energy ray-curable adhesive as the soft adhesive layer. The soft adhesive layer having a low storage elastic modulus tends to cause adhesive residue on the adherend when peeled. However, in the case of a soft adhesive layer made of an energy ray-curable adhesive, if the soft adhesive layer is cured by irradiating energy rays (ultraviolet rays, electron beams, etc.) immediately before the adhesive sheet is peeled off, the adhesive is adhered to the adherend. It can be peeled off so as not to remain.

粘着層が複層構造である場合は、粘着層はその位置関係によって被着体に直接貼付される表面粘着層と、基材と該表面粘着層の層間に位置する中間粘着層とに区分される。本発明の半導体加工用粘着シートは、粘着層に軟質粘着層が含まれていれば、軟質粘着層は表面粘着層と中間粘着層のどちらであってもよいし、両方が軟質粘着層であってもよい。さらに中間粘着層が軟質粘着層を含む複層の粘着層であってもよい。貯蔵弾性率が1.0×105Pa以下の軟質粘着層が複層である場合、本発明における軟質粘着層の厚さは、個々の軟質粘着層の厚さの総和とする。 When the adhesive layer has a multi-layer structure, the adhesive layer is classified into a surface adhesive layer directly attached to the adherend and an intermediate adhesive layer located between the substrate and the surface adhesive layer according to the positional relationship. The In the pressure-sensitive adhesive sheet for semiconductor processing of the present invention, as long as the pressure-sensitive adhesive layer contains a soft pressure-sensitive adhesive layer, the soft pressure-sensitive adhesive layer may be either a surface pressure-sensitive adhesive layer or an intermediate pressure-sensitive adhesive layer, and both are soft pressure-sensitive adhesive layers. May be. Further, the intermediate adhesive layer may be a multilayer adhesive layer including a soft adhesive layer. When the soft adhesive layer having a storage elastic modulus of 1.0 × 10 5 Pa or less is a multilayer, the thickness of the soft adhesive layer in the present invention is the sum of the thicknesses of the individual soft adhesive layers.

なお、表面粘着層としては、被着体との親和性や剥離性を優先して設計するのが好ましく、例えば、被着体からの剥離性に優れたいわゆる再剥離型の弱粘着剤もしくはエネルギー線硬化型粘着剤が好ましく用いられる。再剥離型の弱粘着剤は貯蔵弾性率が大きい傾向にあるので、表面粘着層を軟質粘着層とする場合には、エネルギー線硬化型粘着剤を使用することが好ましい。また、中間粘着層を軟質粘着層とすれば、再剥離型の弱粘着剤を表面粘着層として使用することができる。   The surface adhesive layer is preferably designed with priority on affinity and peelability with the adherend. For example, a so-called re-peelable weak adhesive or energy excellent in peelability from the adherend. A wire curable pressure-sensitive adhesive is preferably used. Since the re-peelable weak pressure-sensitive adhesive tends to have a large storage elastic modulus, it is preferable to use an energy ray-curable pressure-sensitive adhesive when the surface pressure-sensitive adhesive layer is a soft pressure-sensitive adhesive layer. If the intermediate adhesive layer is a soft adhesive layer, a re-peelable weak adhesive can be used as the surface adhesive layer.

粘着層を表面粘着層と中間粘着層との複層構造とした場合、表面粘着層の厚さは、好ましくは5〜100μmであり、さらに好ましくは10〜80μmである。また、中間粘着層の厚さは、好ましくは50μm以上であり、さらに好ましくは60〜300μmである。   When the adhesive layer has a multi-layer structure of a surface adhesive layer and an intermediate adhesive layer, the thickness of the surface adhesive layer is preferably 5 to 100 μm, more preferably 10 to 80 μm. Further, the thickness of the intermediate adhesive layer is preferably 50 μm or more, more preferably 60 to 300 μm.

本発明の半導体加工用粘着シートは、特定のヤング率の剥離フィルムを有することを特徴としている。剥離フィルムのヤング率は700MPa以下であり、好ましくは50〜700MPa、さらに好ましくは100〜500MPaである。   The pressure-sensitive adhesive sheet for semiconductor processing of the present invention is characterized by having a release film having a specific Young's modulus. The Young's modulus of the release film is 700 MPa or less, preferably 50 to 700 MPa, more preferably 100 to 500 MPa.

このようなヤング率の剥離フィルムは、低弾性で厚みのある粘着層を有する粘着シートをロール状に巻き取った際に問題となる、巻き取り半径差に起因する基材と剥離フィルム間の張力差を緩和することができる。   Such a Young's modulus release film is problematic when a pressure-sensitive adhesive sheet having a low-elasticity and thick adhesive layer is wound into a roll, and the tension between the substrate and the release film due to the difference in winding radius. The difference can be mitigated.

剥離フィルムのヤング率が高すぎると、粘着シートをロール状に巻き取る際やその後の保管時にシワが発生しやすくなる。ヤング率が低すぎると剥離フィルム自体の剛性が不足するため、巻き取りや粘着層との貼り合わせ、あるいは後述する剥離層を形成するための塗布工程において機械強度が不足して変形し、粘着層を平滑に保護できなくなる恐れがある。   When the Young's modulus of the release film is too high, wrinkles are likely to occur when the pressure-sensitive adhesive sheet is wound into a roll or during subsequent storage. If the Young's modulus is too low, the release film itself lacks rigidity, so that the adhesive layer deforms due to insufficient mechanical strength in the winding process, bonding with the adhesive layer, or the coating process for forming the release layer described later. May not be able to be protected smoothly.

なお、本発明に用いられる剥離フィルムは後述のように剥離剤層を粘着層側の表面に面する側に有する場合があるが、その場合の剥離フィルムのヤング率は、剥離剤層を含めた積層フィルムのヤング率とする。   The release film used in the present invention may have a release agent layer on the side facing the surface on the pressure-sensitive adhesive layer side as described later, but the Young's modulus of the release film in that case includes the release agent layer. The Young's modulus of the laminated film is used.

剥離フィルムとしては、剥離性の表面を有し、上記ヤング率を有する限り特に限定はされず、種々のフィルムが用いられる。このような剥離フィルムとしては、具体的には、低密度ポリエチレン(LDPE)、直鎖低密度ポリエチレン(LLDPE)、エチレン・プロピレン共重合体、ポリプロピレン、ポリブテン、ポリブタジエン、ポリメチルペンテン、エチレン・酢酸ビニル共重合体、エチレン・(メタ)アクリル酸共重合体、エチレン・(メタ)アクリル酸メチル共重合体、エチレン・(メタ)アクリル酸エチル共重合体、ポリ塩化ビニル、エチレン・酢酸ビニル共重合体、塩化ビニル・酢酸ビニル共重合体、エチレン・塩化ビニル・酢酸ビニル共重合体、ポリウレタンフィルム、ポリアミドフィルム、アイオノマーあるいはスチレン・ブタジエンゴムおよびその水添加物または変性物等からなるフィルムなど、あるいはこれらのフィルムの積層物が用いられる。   The release film is not particularly limited as long as it has a peelable surface and has the above Young's modulus, and various films can be used. Specific examples of such release films include low density polyethylene (LDPE), linear low density polyethylene (LLDPE), ethylene / propylene copolymer, polypropylene, polybutene, polybutadiene, polymethylpentene, ethylene / vinyl acetate. Copolymer, ethylene / (meth) acrylic acid copolymer, ethylene / (meth) methyl acrylate copolymer, ethylene / (meth) ethyl acrylate copolymer, polyvinyl chloride, ethylene / vinyl acetate copolymer , Vinyl chloride / vinyl acetate copolymer, ethylene / vinyl chloride / vinyl acetate copolymer, polyurethane film, polyamide film, ionomer or styrene / butadiene rubber and its water additives or modified products, etc. A film laminate is used .

剥離フィルムとしては、上記したようなフィルムの一方の表面に剥離処理を施したフィルムが好ましい。剥離処理に用いられる剥離剤としては、特に限定はないが、シリコーン系、フッ素系、アルキッド系、不飽和ポリエステル系、ポリオレフィン系、ワックス系等が用いられる。特にシリコーン系の剥離剤が低剥離力を実現しやすいので好ましい。また、剥離フィルムが上記のようなヤング率である場合は、通常耐熱性に乏しいので、低温硬化タイプや紫外線・電子線硬化タイプの剥離剤を選択することが好ましい。剥離フィルムに用いるフィルムがポリオレフィンフィルムのようにそれ自身の表面張力が低く、粘着層に対し低剥離力を示すものであれば、剥離処理を行わなくてもよい。   As a peeling film, the film which gave the peeling process to one surface of the above films is preferable. The release agent used for the release treatment is not particularly limited, and silicone-based, fluorine-based, alkyd-based, unsaturated polyester-based, polyolefin-based, wax-based and the like are used. In particular, a silicone-based release agent is preferable because it easily achieves a low release force. When the release film has a Young's modulus as described above, it is usually poor in heat resistance, so it is preferable to select a low-temperature curing type or ultraviolet / electron beam curing type release agent. If the film used for the release film has a low surface tension, such as a polyolefin film, and exhibits a low release force with respect to the adhesive layer, the release treatment may not be performed.

剥離処理の方法としては、剥離剤をそのまま無溶剤で、または溶剤希釈やエマルション化して、グラビアコーター、メイヤーバーコーター、エアナイフコーター、ロールコーター等により該フィルムに塗布し、加熱または紫外線あるいは電子線の照射により硬化させて剥離層を形成する。   As a peeling treatment method, the release agent is used as it is without a solvent, or diluted or emulsified in a solvent, and applied to the film with a gravure coater, Mayer bar coater, air knife coater, roll coater, etc. A release layer is formed by curing by irradiation.

上記の剥離フィルムの厚さは、好ましくは12μm以上であり、さらに好ましくは15〜1000μm、特に好ましくは50〜200μmである。剥離フィルムが薄すぎると、粘着シートを構成する各層を積層する工程や、粘着シートを巻き取る工程において蓄積されるストレスに対する、粘着シート自体の寸法安定性が不足する。剥離フィルムが厚すぎると粘着シートの総厚が過大となるため取り扱いが困難になる。   The thickness of the release film is preferably 12 μm or more, more preferably 15 to 1000 μm, and particularly preferably 50 to 200 μm. If the release film is too thin, the dimensional stability of the pressure-sensitive adhesive sheet itself with respect to stress accumulated in the step of laminating the layers constituting the pressure-sensitive adhesive sheet or the step of winding up the pressure-sensitive adhesive sheet is insufficient. If the release film is too thick, the total thickness of the pressure-sensitive adhesive sheet becomes excessive, making handling difficult.

本発明の粘着シートは、上記基材上に、ロールコーター、ナイフコーター、グラビアコーター、ダイコーター、リバースコーターなど一般に公知の方法にしたがって適宜の厚さ・順序で粘着剤を塗工・乾燥させて粘着層を形成し、次いで粘着層上に上記剥離フィルムを貼り合わせることによって得られる。粘着層の形成は、各粘着剤を剥離フィルム上にそれぞれ塗工・乾燥させた後、これを基材上に順次転写して行ってもよい。   The pressure-sensitive adhesive sheet of the present invention is obtained by applying and drying a pressure-sensitive adhesive in an appropriate thickness and order according to a generally known method such as a roll coater, knife coater, gravure coater, die coater, reverse coater, etc. It is obtained by forming an adhesive layer and then laminating the release film on the adhesive layer. The pressure-sensitive adhesive layer may be formed by coating and drying each pressure-sensitive adhesive on the release film, and sequentially transferring it onto the substrate.

本発明の粘着シートでは、上記した特定の基材および剥離フィルムを用いているため、粘着層を厚く低弾性率のものにした場合であっても、ロール状に巻き取った際のシワの発生を防止できる。したがって、粘着層を従来の半導体加工用粘着シートの場合よりも厚く低弾性率に設定できる。厚く低弾性率の粘着層は、貼着するウエハ表面の凹凸に追従して高低差を吸収するので、表面の凹凸差が大きなウエハも平坦に保持し、厚さが均一で極薄な形状まで裏面研削が可能となる。すなわち、本発明によれば、表面の凹凸差が大きいウエハの裏面研削に好適に用いられる半導体加工用粘着シートを、ロール状に巻いた状態でシワを発生させることなく提供することが可能となる。   In the pressure-sensitive adhesive sheet of the present invention, since the specific substrate and release film described above are used, even when the pressure-sensitive adhesive layer is thick and has a low elastic modulus, wrinkles are generated when wound into a roll. Can be prevented. Therefore, the pressure-sensitive adhesive layer can be set to be thicker and have a lower elastic modulus than the conventional pressure-sensitive adhesive sheet for semiconductor processing. The thick and low-elasticity adhesive layer absorbs the height difference following the unevenness of the wafer surface to be stuck, so even wafers with large unevenness on the surface can be held flat, and the thickness can be uniform and extremely thin Backside grinding is possible. That is, according to the present invention, it is possible to provide a semiconductor processing pressure-sensitive adhesive sheet suitably used for grinding a back surface of a wafer having a large surface unevenness without causing wrinkles in a rolled state. .

本発明によれば、表面の凹凸差が大きいウエハの裏面研削に好適に用いられる半導体加工用粘着シートを、ロール状に巻いた状態でシワを発生させることなく提供することが可能となる。このような半導体加工用粘着シートは、ロール状に巻かれているときにシワが発生して粘着層が変形することがないので、ウエハから剥離する際に糊残りを引き起こすこともない。
<実施例>
以下、本発明を実施例により説明するが、本発明はこれらの実施例に限定されるものではない。
ADVANTAGE OF THE INVENTION According to this invention, it becomes possible to provide the adhesive sheet for semiconductor processing used suitably for the back surface grinding | polishing of the wafer with a large unevenness | corrugation of the surface, without generating a wrinkle in the state wound by roll shape. Such a pressure-sensitive adhesive sheet for semiconductor processing does not cause wrinkles when the roll is wound and the adhesive layer is not deformed, and therefore does not cause adhesive residue when peeling from the wafer.
<Example>
EXAMPLES Hereinafter, although an Example demonstrates this invention, this invention is not limited to these Examples.

本実施例における「ヤング率」および「貯蔵弾性率」の測定、ならびにロールの「シワの発生」の評価は、次に示す方法で行った。
「ヤング率」
剛性フィルム及び剥離フィルムをJIS K 7127に従って測定したMD方向の値を、そのフィルムのヤング率とした。具体的には、長さ150mm(MD方向)、幅15mm(CD方向)の試験片を用意し、これを万能引張試験機により、チャック間初期距離100mm、引張スピード200mm/分で測定した。
「貯蔵弾性率」
Rheometrics社製、ダイナミックアナライザ RDA−IIを用い、直径8mm、厚さ3mmの円柱型の測定試料を用いて、捻り剪断法により周波数1Hz、23℃において測定した。
「シワの発生」
(1)ロールの作製
後述の構成で作製した粘着シートを幅330mmに裁断しながら、外径87mmのABS樹脂製の巻芯に、巻き取り速度3m/min、巻き取り張力100N/m、巻き取り長さ50mとなるよう巻き取った。なお、巻き取り方向は基材面が内側で剥離フィルムが外側とする内巻きと、基材面が外側で剥離フィルムが内側となる外巻きの2種の形態を用意した。
(2)評価方法
(1)により作製されたロールを、それぞれ5℃の低温条件、23℃相対湿度50%の室温条件、40℃相対湿度80%の高温高湿条件とする環境下に1ヶ月保管し、シワの発生の有無を目視で確認した。
(実施例1)
基材として、ポリエチレンテレフタレート(以下「PET」と表記する。東レ社製「ルミラーS」:ヤング率4000MPa、厚さ100μm)の単層品を用いた。
The measurement of “Young's modulus” and “storage elastic modulus” in this example and the evaluation of “wrinkle generation” of the roll were performed by the following methods.
"Young's modulus"
The value of MD direction which measured the rigid film and the peeling film according to JISK7127 was made into the Young's modulus of the film. Specifically, a test piece having a length of 150 mm (MD direction) and a width of 15 mm (CD direction) was prepared, and this was measured with a universal tensile tester at an initial distance between chucks of 100 mm and a tensile speed of 200 mm / min.
"Storage modulus"
Using a dynamic analyzer RDA-II manufactured by Rheometrics Co., Ltd., a cylindrical measurement sample having a diameter of 8 mm and a thickness of 3 mm was used to measure at a frequency of 1 Hz and 23 ° C.
"Occurrence of wrinkles"
(1) Production of roll While cutting the pressure-sensitive adhesive sheet produced in the configuration described later to 330 mm in width, a winding speed of 3 m / min, winding tension of 100 N / m, winding up to an ABS resin core having an outer diameter of 87 mm It wound up so that it might become length 50m. In addition, the winding direction prepared two types of forms, the inner winding which makes a base material surface inside and a peeling film outside, and the external winding which makes a base material surface outside and a peeling film becomes inside.
(2) Evaluation method The rolls produced by (1) are each one month in an environment of a low temperature condition of 5 ° C., a room temperature condition of 23 ° C. and a relative humidity of 50%, and a high temperature and high humidity condition of a relative humidity of 40 ° C. and 80%. The product was stored and visually checked for wrinkles.
Example 1
A single layer product of polyethylene terephthalate (hereinafter referred to as “PET”; “Lumirror S” manufactured by Toray Industries, Inc .: Young's modulus 4000 MPa, thickness 100 μm) was used as the substrate.

軟質粘着層として、2−エチルヘキシルアクリレート95重量部と2−ヒドロキシエチルアクリレート5重量部からなるアクリル共重合体(重量平均分子量Mw30万)100重量部、多価イソシアネート化合物(日本ポリウレタン社製「コロネートL」)0.5重量部からなる非エネルギー線硬化型のアクリル系粘着剤組成物を用意した。   As a soft adhesive layer, an acrylic copolymer (weight average molecular weight Mw 300,000) consisting of 95 parts by weight of 2-ethylhexyl acrylate and 5 parts by weight of 2-hydroxyethyl acrylate, 100 parts by weight of a polyisocyanate compound (“Coronate L” manufactured by Nippon Polyurethane Co., Ltd.) ]) A non-energy ray curable acrylic pressure-sensitive adhesive composition comprising 0.5 parts by weight was prepared.

剥離フィルムとして、低密度ポリエチレン(タマポリ社製「GF−1」:ヤング率200MPa、厚さ50μm)フィルムのコロナ処理面に、付加反応型シリコーン樹脂剥離剤(東レ・ダウコーニング・シリコーン社製「LTC−760A」)100重量部に、白金系触媒(東レ・ダウコーニング・シリコーン社製「SRX−212」)を2重量部、光増感剤アセトフェノン1重量部を添加し、固形分濃度1重量%に溶剤で希釈した塗工液を乾燥後の塗布量が1μmになるように塗布し、40℃30秒乾燥後、紫外線を照射(フュージョンHバルブ、240W/cm)して剥離剤層を形成したフィルムを用意した。   As a release film, an addition reaction type silicone resin release agent (“LTC” manufactured by Toray Dow Corning Silicone Co., Ltd.) is applied to a corona-treated surface of a low density polyethylene (“GF-1” manufactured by Tamapoly Co., Ltd .: Young's modulus 200 MPa, thickness 50 μm). -760A ") To 100 parts by weight, 2 parts by weight of a platinum-based catalyst (" SRX-212 "manufactured by Toray Dow Corning Silicone) and 1 part by weight of a photosensitizer acetophenone were added, and the solid content concentration was 1% by weight. A coating solution diluted with a solvent was applied so that the coating amount after drying was 1 μm, dried at 40 ° C. for 30 seconds, and then irradiated with ultraviolet rays (fusion H bulb, 240 W / cm) to form a release agent layer. A film was prepared.

基材の片面に粘着剤組成物を乾燥後の塗布厚が100μmとなるように塗布乾燥して粘着層を形成し、該粘着層面に剥離フィルムの剥離剤層面を積層し、粘着層が軟質粘着層の単層である半導体加工用粘着シートを得た。軟質粘着層(粘着層)の23℃における貯蔵弾性率G'は、5×104Paであった。 A pressure-sensitive adhesive composition is applied and dried on one side of a substrate so that the coating thickness after drying is 100 μm to form a pressure-sensitive adhesive layer, and the pressure-sensitive adhesive layer surface is laminated with the surface of the pressure-sensitive adhesive layer. The adhesive sheet for semiconductor processing which is a single layer was obtained. The storage elastic modulus G ′ at 23 ° C. of the soft adhesive layer (adhesive layer) was 5 × 10 4 Pa.

評価結果を表1に示す。
(実施例2)
基材として、ポリエチレンナフタレート(帝人デュポン社製「テオネックス」:ヤング率6000MPa、厚さ75μm)の単層品を用いた。
The evaluation results are shown in Table 1.
(Example 2)
A single layer product of polyethylene naphthalate (“Teonex” manufactured by Teijin DuPont: Young's modulus 6000 MPa, thickness 75 μm) was used as the substrate.

軟質粘着層として、ブチルアクリレート90重量部とアクリル酸10重量部からなるアクリル共重合体(重量平均分子量Mw60万)100重量部、平均分子量約5000のウレタンアクリレートオリゴマー150重量部、光重合開始剤(チバ・スペシャルティケミカルズ社製「イルガキュア184」)5重量部、多価イソシアネート化合物(日本ポリウレタン社製「コロネートL」)5重量部からなるエネルギー線硬化型の粘着剤組成物を用意した。   As a soft adhesive layer, an acrylic copolymer (weight average molecular weight Mw 600,000) consisting of 90 parts by weight of butyl acrylate and 10 parts by weight of acrylic acid, 150 parts by weight of a urethane acrylate oligomer having an average molecular weight of about 5000, a photopolymerization initiator ( An energy ray-curable pressure-sensitive adhesive composition comprising 5 parts by weight of “Irgacure 184” manufactured by Ciba Specialty Chemicals Co., Ltd. and 5 parts by weight of a polyvalent isocyanate compound (“Coronate L” manufactured by Nippon Polyurethane Co., Ltd.) was prepared.

剥離フィルムとして、直鎖低密度ポリエチレンフィルム(アイセロ化学社製「スズロンL−105」:ヤング率500MPa、厚さ100μm)のコロナ処理面に、実施例1と同じ処方および塗布方法により剥離剤層を形成したフィルムを用意した。   As a release film, a release agent layer was applied to the corona-treated surface of a linear low-density polyethylene film (“Tsulon L-105” manufactured by Aicero Chemical Co., Ltd .: Young's modulus 500 MPa, thickness 100 μm) by the same formulation and application method as in Example 1. A formed film was prepared.

基材の片面に粘着剤組成物を乾燥後の塗布厚が150μmとなるように塗布乾燥して粘着層を形成し、該粘着層面に剥離フィルムの剥離剤層面を積層し、粘着層が軟質粘着層の単層である半導体加工用粘着シートを得た。軟質粘着層(粘着層)のエネルギー線硬化前における23℃の貯蔵弾性率G'は8×104Paであった。 The pressure-sensitive adhesive composition is applied and dried on one side of the substrate so that the coating thickness after drying is 150 μm to form an adhesive layer, and the release layer of the release film is laminated on the adhesive layer surface, and the adhesive layer is soft adhesive The adhesive sheet for semiconductor processing which is a single layer was obtained. The storage elastic modulus G ′ at 23 ° C. before the energy ray curing of the soft adhesive layer (adhesive layer) was 8 × 10 4 Pa.

評価結果を表1に示す。
(実施例3)
基材として、PET(東レ社製、商品名ルミラーS:ヤング率4000MPa、厚さ75μm)と直鎖低密度ポリエチレンフィルム(アイセロ化学社製「スズロンL−105」:ヤング率500MPa、厚さ100μm)とを、アクリル系粘着剤(ブチルアクリレート90重量部とアクリル酸10重量部との共重合体(重量平均分子量Mw60万)100重量部、多価イソシアネート化合物(日本ポリウレタン社製「コロネートL」)2重量部)10μmにより積層した積層品(厚さ185μm)を用いた。
The evaluation results are shown in Table 1.
Example 3
As base materials, PET (manufactured by Toray Industries, Inc., trade name Lumirror S: Young's modulus 4000 MPa, thickness 75 μm) and linear low-density polyethylene film (Aisero Chemical Co., Ltd. “Suzuron L-105”: Young's modulus 500 MPa, thickness 100 μm) Acrylic adhesive (100 parts by weight of a copolymer of 90 parts by weight of butyl acrylate and 10 parts by weight of acrylic acid (weight average molecular weight Mw 600,000), polyisocyanate compound (“Coronate L” manufactured by Nippon Polyurethane) 2 A laminated product (thickness: 185 μm) laminated by 10 μm (weight part) was used.

軟質粘着層として、実施例2に使用した粘着剤組成物を使用した。   The pressure-sensitive adhesive composition used in Example 2 was used as the soft pressure-sensitive adhesive layer.

剥離フィルムとして、ポリオレフィンフィルム(オカモト社製「エコロフィン」:ヤング率260MPa、厚さ200μm)のコロナ処理面に実施例1と同じ処方および塗布方法により剥離剤層を形成したフィルムを用意した。   As a release film, a film having a release agent layer formed on the corona-treated surface of a polyolefin film (“Ecolofin” manufactured by Okamoto Co., Ltd .: Young's modulus 260 MPa, thickness 200 μm) by the same formulation and application method as in Example 1 was prepared.

基材の直鎖低密度ポリエチレンフィルム側に粘着剤組成物を乾燥後の塗布厚が50μmとなるように塗布乾燥して粘着層を形成し、該粘着層面に剥離フィルムの剥離剤層面を積層し、粘着層が軟質粘着層の単層である半導体加工用粘着シートを得た。   The pressure-sensitive adhesive composition is coated and dried on the linear low-density polyethylene film side of the substrate so that the coating thickness after drying is 50 μm to form a pressure-sensitive adhesive layer, and the release film layer surface of the release film is laminated on the pressure-sensitive adhesive layer surface. Thus, an adhesive sheet for semiconductor processing was obtained in which the adhesive layer was a single layer of a soft adhesive layer.

評価結果を表1に示す。
(実施例4)
基材として、PET(東レ社製「ルミラーS」:ヤング率4000MPa、厚さ188μm)の単層品を用いた。
The evaluation results are shown in Table 1.
Example 4
A single-layer product of PET (“Lumirror S” manufactured by Toray Industries, Inc .: Young's modulus 4000 MPa, thickness 188 μm) was used as the substrate.

軟質粘着層として、実施例1と同じ粘着剤組成物を用意した。   The same adhesive composition as Example 1 was prepared as a soft adhesive layer.

剥離フィルムとして、無延伸ポリプロピレン(東洋紡績社製「パイレン−CT P1111」:ヤング率670MPa、厚さ50μm)のコロナ処理面に実施例1と同じ処方および塗布方法により剥離剤層を形成したフィルムを用意した。   As a release film, a film having a release agent layer formed on the corona-treated surface of unstretched polypropylene (“Pyrene-CT P1111” manufactured by Toyobo Co., Ltd .: Young's modulus 670 MPa, thickness 50 μm) by the same formulation and application method as in Example 1. Prepared.

基材の片面に粘着剤組成物を乾燥後の塗布厚が60μmとなるように塗布乾燥して粘着層を形成し、該粘着層面に剥離フィルムの剥離剤層面を積層し、粘着層が軟質粘着層の単層である半導体加工用粘着シートを得た。   The pressure-sensitive adhesive composition is applied and dried on one side of the base material so that the coating thickness after drying is 60 μm to form a pressure-sensitive adhesive layer, and the pressure-sensitive adhesive layer surface is laminated with the surface of the pressure-sensitive adhesive layer. The adhesive sheet for semiconductor processing which is a single layer was obtained.

評価結果を表1に示す。
(実施例5)
基材として、PET(東レ社製「ルミラーS」:ヤング率4000MPa、厚さ50μm)と、低密度ポリエチレン(タマポリ社製「GF−1」:ヤング率200MPa、厚さ25μm)とをポリエステル系のドライラミネート用接着剤(厚さ2μm)により積層し、PET側をコロナ処理した積層品(厚さ77μm)を用いた。
The evaluation results are shown in Table 1.
(Example 5)
As a base material, PET (“Lumirror S” manufactured by Toray Industries, Inc .: Young's modulus 4000 MPa, thickness 50 μm) and low-density polyethylene (“GF-1” manufactured by Tamapoly: Young's modulus 200 MPa, thickness 25 μm) are polyester-based. A laminated product (thickness 77 μm) obtained by laminating with an adhesive for dry lamination (thickness 2 μm) and corona-treating the PET side was used.

軟質粘着層として、ブチルアクリレート90重量部とアクリル酸10重量部とからなるアクリル共重合体(重量平均分子量Mw60万)100重量部、平均分子量約8000のウレタンアクリレートオリゴマー120重量部、光重合開始剤(チバ・スペシャルティケミカルズ社製「イルガキュア184」)4重量部、多価イソシアネート化合物(日本ポリウレタン社製「コロネートL」)2重量部からなるエネルギー線硬化型の粘着剤組成物を用意した。   As a soft adhesive layer, an acrylic copolymer (weight average molecular weight Mw 600,000) consisting of 90 parts by weight of butyl acrylate and 10 parts by weight of acrylic acid, 120 parts by weight of a urethane acrylate oligomer having an average molecular weight of about 8000, a photopolymerization initiator An energy ray-curable pressure-sensitive adhesive composition comprising 4 parts by weight (“Irgacure 184” manufactured by Ciba Specialty Chemicals) and 2 parts by weight of a polyvalent isocyanate compound (“Coronate L” manufactured by Nippon Polyurethane) was prepared.

剥離フィルムは、実施例1と同じ物を用意した。   The same release film as in Example 1 was prepared.

基材のPET側に粘着剤組成物を乾燥後の塗布厚が200μmとなるように塗布乾燥して粘着層を形成し、該粘着層面に剥離フィルムの剥離剤層面を積層し、粘着層が軟質粘着層の単層である半導体加工用粘着シートを得た。軟質粘着層(粘着層)のエネルギー線硬化前の23℃の貯蔵弾性率G'は1×105Paであった。 The pressure-sensitive adhesive composition is coated and dried on the PET side of the base material so that the coating thickness after drying is 200 μm to form a pressure-sensitive adhesive layer. The pressure-sensitive adhesive layer surface is laminated with the surface of the pressure-sensitive adhesive layer, and the pressure-sensitive adhesive layer is soft. A pressure-sensitive adhesive sheet for semiconductor processing, which is a single layer of the pressure-sensitive adhesive layer, was obtained. The storage elastic modulus G ′ at 23 ° C. before the energy ray curing of the soft adhesive layer (adhesive layer) was 1 × 10 5 Pa.

評価結果を表1に示す。
(実施例6)
基材として、PET(東レ社製「ルミラーS」:ヤング率4000MPa、厚さ25μm)の両面に、低密度ポリエチレン(タマポリ社製「GF−1」:ヤング率200MPa、厚さ25μm)をポリエステル系のドライラミネート用接着剤(厚さ2μm)によりそれぞれ積層した積層品(厚さ79μm)を用いた。
The evaluation results are shown in Table 1.
(Example 6)
Low-density polyethylene (“GF-1” manufactured by Tamapoly Co., Ltd .: Young's modulus 200 MPa, thickness 25 μm) on both sides of PET (“Lumirror S” manufactured by Toray Industries Inc .: Young's modulus 4000 MPa, thickness 25 μm) as a base material Laminated products (thickness 79 μm) each laminated with an adhesive for dry lamination (thickness 2 μm) were used.

軟質粘着層として、実施例5と同じ粘着剤組成物を用意した。また、剥離フィルムは、実施例1と同じ物を用意した。   The same adhesive composition as in Example 5 was prepared as a soft adhesive layer. Moreover, the same thing as Example 1 was prepared for the peeling film.

基材の片面に粘着剤組成物を乾燥後の塗布厚が60μmとなるように塗布乾燥して粘着層を形成し、該粘着層面に剥離フィルムの剥離剤層面を積層し、粘着層が軟質粘着層の単層である半導体加工用粘着シートを得た。   The pressure-sensitive adhesive composition is applied and dried on one side of the base material so that the coating thickness after drying is 60 μm to form a pressure-sensitive adhesive layer, and the pressure-sensitive adhesive layer surface is laminated with the surface of the pressure-sensitive adhesive layer. The adhesive sheet for semiconductor processing which is a single layer was obtained.

評価結果を表1に示す。
(実施例7)
実施例1の基材をポリイミド(宇部興産社製「ユーピレックス−S」:ヤング率7000MPa、厚さ75μm)に、粘着層の厚さを500μmに変更した以外は実施例1と同様にして、粘着層が軟質粘着層の単層である半導体加工用粘着シートを得た。
The evaluation results are shown in Table 1.
(Example 7)
In the same manner as in Example 1 except that the base material of Example 1 was changed to polyimide ("Upilex-S" manufactured by Ube Industries, Ltd .: Young's modulus 7000 MPa, thickness 75 μm), and the thickness of the adhesive layer was changed to 500 μm. A pressure-sensitive adhesive sheet for semiconductor processing in which the layer was a single layer of a soft pressure-sensitive adhesive layer was obtained.

評価結果を表1に示す。
(実施例8)
基材として実施例5で使用したPETと低密度ポリエチレンの積層品を用い、剥離フィルムとして実施例1と同じ剥離フィルムを用いた。また、軟質粘着層として実施例1で使用した粘着剤組成物を用いた。
The evaluation results are shown in Table 1.
(Example 8)
A laminate of PET and low-density polyethylene used in Example 5 was used as the substrate, and the same release film as in Example 1 was used as the release film. Moreover, the adhesive composition used in Example 1 was used as a soft adhesive layer.

表面粘着層として、ブチルアクリレート65重量部、メチルメタクリレート10重量部、2−ヒドロキシエチルアクリレート25重量部の共重合体100重量部にメタクリロイルオキシエチルイソシアネート33重量部を付加したアクリル共重合体(重量平均分子量Mw50万)133重量部、光重合開始剤(チバ・スペシャルティケミカルズ社製「イルガキュア184」2重量部、多価イソシアネート化合物(日本ポリウレタン社製「コロネートL」0.5重量部からなるエネルギー線硬化型の粘着剤組成物を用意した。   As a surface adhesive layer, an acrylic copolymer (weight average) in which 65 parts by weight of butyl acrylate, 10 parts by weight of methyl methacrylate and 100 parts by weight of 2-hydroxyethyl acrylate are added to 33 parts by weight of methacryloyloxyethyl isocyanate. Energy ray curing comprising 133 parts by weight of molecular weight Mw 500,000, 2 parts by weight of photopolymerization initiator (“Irgacure 184” manufactured by Ciba Specialty Chemicals), 0.5 parts by weight of polyisocyanate compound (“Coronate L” manufactured by Nippon Polyurethane) A mold-type pressure-sensitive adhesive composition was prepared.

基材のPET側に軟質粘着層用の粘着剤組成物を乾燥後の塗布量が100μmとなるように塗布乾燥し中間粘着層を形成した。さらに、中間粘着層の上に表面粘着層用の粘着剤組成物を乾燥後の塗布量が50μmとなるよう塗布乾燥した。続いて、該表面粘着層の面に剥離フィルムの剥離剤層を積層し、粘着層が複層の半導体加工用粘着シートを得た。表面粘着層の23℃の貯蔵弾性率G'は2×105Paであった。
(実施例9)
実施例8の軟質粘着層に使用する粘着剤組成物及びその塗工方法を以下のように変更した以外は、実施例8と同様にして半導体加工用粘着シートを得た。
The pressure-sensitive adhesive composition for the soft adhesive layer was applied and dried on the PET side of the substrate so that the coating amount after drying was 100 μm, thereby forming an intermediate adhesive layer. Furthermore, the pressure-sensitive adhesive composition for the surface pressure-sensitive adhesive layer was applied and dried on the intermediate pressure-sensitive adhesive layer so that the coating amount after drying was 50 μm. Subsequently, a release agent layer of a release film was laminated on the surface of the surface adhesive layer to obtain an adhesive sheet for semiconductor processing having a multilayer adhesive layer. The storage elastic modulus G ′ at 23 ° C. of the surface adhesive layer was 2 × 10 5 Pa.
Example 9
A pressure-sensitive adhesive sheet for semiconductor processing was obtained in the same manner as in Example 8 except that the pressure-sensitive adhesive composition used in the soft pressure-sensitive adhesive layer of Example 8 and the coating method thereof were changed as follows.

ウレタンオリゴマー(重量平均分子量5000)50重量部、ポリエステルオリゴマー(重量平均分子量2000)10重量部、紫外線硬化性の反応希釈剤としてフェニルヒドロキシプロピルアクリレート40重量部、及び光重合開始剤(チバ・スペシャルティケミカルズ社製「イルガキュア184」)2重量部を配合し、紫外線硬化により粘着剤となる無溶剤型粘着剤組成物を得た。この無溶剤型粘着剤組成物を基材のPET側に塗布量が200μmとなるように塗布し、続いて紫外線を照射することにより基材に軟質粘着層を形成した。紫外線照射の条件は高圧水銀ランプ(160W/cm、照射距離10cm)を用い光量を250mJ/cm2とした。この軟質粘着層の23℃の貯蔵弾性率G'は、6×104Paであった。
(比較例1)
実施例1の剥離フィルムを、PETフィルム(東レ社製「ルミラーS」:ヤング率4000MPa、厚さ38μm)に実施例1と同じ処方および塗布方法により剥離剤層を形成したフィルムに変更した以外は、実施例1と同様にして半導体加工用粘着シートを得た。
50 parts by weight of urethane oligomer (weight average molecular weight 5000), 10 parts by weight of polyester oligomer (weight average molecular weight 2000), 40 parts by weight of phenylhydroxypropyl acrylate as a UV curable reaction diluent, and a photopolymerization initiator (Ciba Specialty Chemicals) 2 parts by weight of “Irgacure 184” manufactured by the company was blended to obtain a solventless pressure-sensitive adhesive composition that became a pressure-sensitive adhesive by ultraviolet curing. This solventless pressure-sensitive adhesive composition was applied on the PET side of the base material so that the coating amount was 200 μm, and then irradiated with ultraviolet rays to form a soft adhesive layer on the base material. The ultraviolet irradiation condition was a high pressure mercury lamp (160 W / cm, irradiation distance 10 cm), and the light intensity was 250 mJ / cm 2 . The storage elastic modulus G ′ at 23 ° C. of this soft adhesive layer was 6 × 10 4 Pa.
(Comparative Example 1)
Except for changing the release film of Example 1 to a PET film ("Lumirror S" manufactured by Toray Industries, Inc., Young's modulus 4000 MPa, thickness 38 μm) with a release agent layer formed by the same formulation and application method as Example 1. In the same manner as in Example 1, a pressure-sensitive adhesive sheet for semiconductor processing was obtained.

評価結果を表1に示す。
(比較例2)
実施例1の剥離フィルムを、二軸延伸ポリプロピレンフィルム(東洋紡績社製「パイレン−OTP2164」:ヤング率1600MPa、厚さ40μm)に実施例1と同じ処方
および塗布方法により剥離剤層を形成したフィルムに変更した以外は、実施例1と同様にして半導体加工用粘着シートを得た。
The evaluation results are shown in Table 1.
(Comparative Example 2)
A film obtained by forming a release agent layer of the release film of Example 1 on a biaxially stretched polypropylene film (“Pyrene-OTP2164” manufactured by Toyobo Co., Ltd .: Young's modulus 1600 MPa, thickness 40 μm) by the same formulation and application method as Example 1. Except having changed into, it carried out similarly to Example 1, and obtained the adhesive sheet for semiconductor processing.

評価結果を表1に示す。
(比較例3)
実施例3の剥離フィルムを、PETフィルム(東レ社製「ルミラーS」:ヤング率4000MPa、厚さ38μm)に実施例1と同じ処方および塗布方法により剥離剤層を形成したフィルムに変更した以外は、実施例3と同様にして半導体加工用粘着シートを得た。
The evaluation results are shown in Table 1.
(Comparative Example 3)
Except that the release film of Example 3 was changed to a PET film ("Lumirror S" manufactured by Toray Industries, Inc .: Young's modulus 4000 MPa, thickness 38 μm) with a release agent layer formed by the same formulation and application method as Example 1. In the same manner as in Example 3, a pressure-sensitive adhesive sheet for semiconductor processing was obtained.

評価結果を表1に示す。
(比較例4)
実施例6の剥離フィルムを、PETフィルム(東レ社製「ルミラーS」:ヤング率4000MPa、厚さ38μm)に実施例1と同じ処方および塗布方法により剥離剤層を形成したフィルムに変更した以外は、実施例6と同様にして半導体加工用粘着シートを得た。
The evaluation results are shown in Table 1.
(Comparative Example 4)
Except that the release film of Example 6 was changed to a PET film (“Lumirror S” manufactured by Toray Industries Inc .: Young's modulus 4000 MPa, thickness 38 μm) with a release agent layer formed by the same formulation and application method as Example 1. In the same manner as in Example 6, a pressure-sensitive adhesive sheet for semiconductor processing was obtained.

評価結果を表1に示す。
(比較例5)
実施例7の剥離フィルムを、PETフィルム(東レ社製「ルミラーS」:ヤング率4000MPa、厚さ38μm)に実施例1と同じ処方および塗布方法により剥離剤層を形成したフィルムに変更した以外は、実施例7と同様にして半導体加工用粘着シートを得た。
The evaluation results are shown in Table 1.
(Comparative Example 5)
Except for changing the release film of Example 7 to a PET film (“Lumirror S” manufactured by Toray Industries, Inc .: Young's modulus 4000 MPa, thickness 38 μm) with a release agent layer formed by the same formulation and application method as Example 1. In the same manner as in Example 7, a pressure-sensitive adhesive sheet for semiconductor processing was obtained.

評価結果を表1に示す。   The evaluation results are shown in Table 1.

Figure 2006012998
Figure 2006012998

Claims (2)

基材と、その上に形成された粘着層と、該粘着層の上に形成された剥離フィルムとからなる半導体加工用粘着シートであって、
該基材が、少なくとも1層のヤング率が2000MPa以上の剛性フィルムを有し、
該粘着層が、貯蔵弾性率が1.0×105Pa以下であり厚さが50μm以上の軟質粘着層を含み、
該剥離フィルムが、ヤング率が700MPa以下のフィルムからなることを特徴とする半導体加工用粘着シート。
A semiconductor processing pressure-sensitive adhesive sheet comprising a substrate, an adhesive layer formed thereon, and a release film formed on the adhesive layer,
The substrate has a rigid film having a Young's modulus of at least one layer of 2000 MPa or more,
The adhesive layer includes a soft adhesive layer having a storage elastic modulus of 1.0 × 10 5 Pa or less and a thickness of 50 μm or more,
The pressure-sensitive adhesive sheet for semiconductor processing, wherein the release film is a film having a Young's modulus of 700 MPa or less.
前記剥離フィルムの粘着層に接する面が剥離処理されていることを特徴とする請求項1に記載の半導体加工用粘着シート。   The adhesive sheet for semiconductor processing according to claim 1, wherein a surface of the release film that contacts the adhesive layer is subjected to a release treatment.
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