JP2006008449A - Dielectric porcelain - Google Patents

Dielectric porcelain Download PDF

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JP2006008449A
JP2006008449A JP2004188218A JP2004188218A JP2006008449A JP 2006008449 A JP2006008449 A JP 2006008449A JP 2004188218 A JP2004188218 A JP 2004188218A JP 2004188218 A JP2004188218 A JP 2004188218A JP 2006008449 A JP2006008449 A JP 2006008449A
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Kazumi Tanaka
一美 田中
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Tokin Corp
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NEC Tokin Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide dielectric porcelain in which specific dielectric constant and the temperature coefficient of resonance frequency are controllable. <P>SOLUTION: The dielectric porcelain is obtained by consisting essentially of Zr<SB>x</SB>Sn<SB>y</SB>Ti<SB>z</SB>O<SB>4</SB>(x+y+z=2, 0.55<x<1.00, 0.85<z<1.15) and adding respectively ≤1 wt.% (excluding 0) one or more kinds selected from NiO, La<SB>2</SB>O<SB>3</SB>and Ta<SB>2</SB>O<SB>5</SB>where NiO is essential and contains a crystal phase composed of a rutile type crystal structure. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は高周波帯域で使用される誘電体磁器に関し、特に携帯電話あるいは無線LANで使用される誘電体フィルタ用に好適な誘電体磁器に関する。   The present invention relates to a dielectric ceramic used in a high frequency band, and more particularly to a dielectric ceramic suitable for a dielectric filter used in a mobile phone or a wireless LAN.

携帯電話や無線LANなどの進展にともない、マイクロ波、ミリ波領域を利用した機器の高性能化、小型化が要求されている。その高性能化、小型化をさらに進めるために、それに使用するフィルタ回路や発振回路の誘電体共振器に用いられる誘電体には下記に示す3つの特性が求められている。   With the progress of mobile phones and wireless LANs, there is a demand for higher performance and smaller size of devices using microwave and millimeter wave regions. In order to further improve the performance and miniaturization, the following three characteristics are required for the dielectric used in the dielectric resonator of the filter circuit and the oscillation circuit used therein.

1番目に誘電体共振器の大きさは、誘電体材料が有する比誘電率εの平方根の逆数に比例するために、誘電体共振器の小型化を進めるためには高い比誘電率を有する材料を開発することが求められている。 First, since the size of the dielectric resonator is proportional to the reciprocal of the square root of the relative dielectric constant ε r of the dielectric material, the dielectric resonator has a high relative dielectric constant in order to reduce the size of the dielectric resonator. There is a need to develop materials.

2番目に、誘電体共振器の実用化には、高周波領域で低損失である必要がある。誘電体の損失は誘電損失tanδで表され、この逆数である品質係数Qの高い材料が求められることになる。しかし、実用上、品質係数Qは共振周波数fが上がると減少する傾向があるために、品質係数Qの単独評価ではなく、共振周波数fとの積であるQf積を大きくすることが求められている。   Second, in order to put the dielectric resonator to practical use, it is necessary to have a low loss in the high frequency region. The loss of the dielectric is expressed by dielectric loss tan δ, and a material having a high quality factor Q, which is the reciprocal of the loss, is required. However, since the quality factor Q tends to decrease as the resonance frequency f increases in practice, it is required to increase the Qf product, which is the product of the resonance frequency f, rather than the single evaluation of the quality factor Q. Yes.

3番目に、共振周波数の温度係数の絶対値が数十ppm/℃以下の特性を持つ誘電体材料の開発が求められている。   Thirdly, there is a demand for development of a dielectric material having a characteristic that the absolute value of the temperature coefficient of the resonance frequency is several tens of ppm / ° C. or less.

それに対して、ZrO2、SnO2、TiO2を主成分とした比誘電率ε≒38の誘電体磁器が使用されている。発明者らは先願(特願2003−119722号)において、この誘電体磁器組成物に添加物としてLa23、NiO、Ta25を加えることによって、比誘電率、Qf積、温度係数のバランスがとれた優れた特性が得られることを示した。 On the other hand, a dielectric ceramic having a relative dielectric constant ε r ≈38 mainly composed of ZrO 2 , SnO 2 and TiO 2 is used. In the prior application (Japanese Patent Application No. 2003-119722), the inventors added La 2 O 3 , NiO, Ta 2 O 5 as additives to this dielectric ceramic composition, thereby allowing the relative permittivity, Qf product, temperature It was shown that excellent characteristics with balanced coefficients were obtained.

また、特許文献1には、ZrO2、SnO2、TiO2を主成分とする誘電体磁器組成物にMnO2を添加して、無負荷Qおよび比誘電率εを高い特性範囲に維持しながら、共振周波数の温度係数をゼロに近づける技術が記載されている。特許文献2には、ZrO2、SnO2、TiO2を主成分とする誘電体磁器組成物に、La23、NiOを含有させ、さらにB23かP25を含有させて低温焼成を図ることが記載されている。 In Patent Document 1, MnO 2 is added to a dielectric ceramic composition mainly composed of ZrO 2 , SnO 2 , and TiO 2 to maintain the no-load Q and the relative dielectric constant ε r in a high characteristic range. However, a technique for bringing the temperature coefficient of the resonance frequency close to zero is described. In Patent Document 2, La 2 O 3 and NiO are contained in a dielectric ceramic composition mainly composed of ZrO 2 , SnO 2 and TiO 2 , and further B 2 O 3 or P 2 O 5 is contained. It is described that low temperature firing is attempted.

特開平6−215626号公報JP-A-6-215626 特開平8−048521号公報JP-A-8-048521

しかし、上記のような組成の誘電体磁器を製造するにあたり、比誘電率の公差は±0.2、温度係数の公差は±1ppm/℃という厳しい規格が要求されており、規格内に再現性良く製造するのは困難である。その上、製造後に規格外となる場合には、再度、組成調整から焼成までの製造工程を経る必要があり、製品供給において小回りの効かない状態であった。   However, when manufacturing dielectric ceramics with the above composition, strict standards are required, with a relative permittivity tolerance of ± 0.2 and a temperature coefficient tolerance of ± 1 ppm / ° C. It is difficult to manufacture well. In addition, when it becomes out of specification after manufacturing, it is necessary to go through the manufacturing process from composition adjustment to firing again, and the product supply is in a state where it is not effective.

また、特許文献2には、特性の変動する誘電体磁器についての記載があるが、これらの場合は、揮発性の物質を含むもので、揮発物質による焼成炉の汚染の問題等もあり、ここでは特性の変動自体が欠点と考えられている。さらに、特性の調整の面からは、この揮発物質ではマス効果も大きく、不安定で採用できないものである。   In addition, Patent Document 2 describes dielectric ceramics whose characteristics fluctuate. In these cases, however, these materials contain volatile substances, and there are problems such as contamination of the firing furnace by volatile substances. Then, the fluctuation of characteristics itself is considered a defect. Furthermore, in terms of adjustment of characteristics, this volatile substance has a large mass effect and is unstable and cannot be employed.

従って、本発明の目的は、比誘電率、および共振周波数の温度係数の調整が可能な誘電体磁器を提供することである。   Accordingly, an object of the present invention is to provide a dielectric ceramic capable of adjusting the relative dielectric constant and the temperature coefficient of the resonance frequency.

本発明の誘電体磁器は、ZrSnTi4(x+y+z=2、0.55<x<1.00、0.85<z<1.15)を主成分とし、NiO、La23、Ta25からNiOを必須とした1種以上を添加物として選択し、選択した添加物をそれぞれ1重量%以下(0重量%を含まず)添加してなる誘電体磁器であって、ルチル型結晶構造をとる結晶相が含まれることを特徴とする。 The dielectric porcelain of the present invention is mainly composed of Zr x Sn y Ti z O 4 (x + y + z = 2, 0.55 <x <1.00, 0.85 <z <1.15), NiO, La 2 In this dielectric ceramic, one or more of O 3 and Ta 2 O 5 which are essential for NiO is selected as an additive, and each selected additive is added in an amount of 1% by weight or less (not including 0% by weight). And a crystal phase having a rutile crystal structure is included.

前記誘電体磁器において、ルチル型結晶構造をとる結晶相は、(110)面の面間隔dが、0.315〜0.340nmであり、その割合が30体積%以下(0体積%を含まず)であることを特徴とする。   In the dielectric ceramic, the crystal phase having the rutile-type crystal structure has a (110) plane spacing d of 0.315 to 0.340 nm, and the ratio thereof is 30% by volume or less (not including 0% by volume). ).

本発明によれば、ZrSnTi4の所定組成範囲の誘電体磁器で、ルチル型結晶相を含有することによって、焼結温度、焼結保持時間、焼結雰囲気、焼結後の熱処理温度、熱処理時間、熱処理雰囲気などを変化させることにより、比誘電率、温度係数を自由にコントロールすることが可能となる。よって、焼結条件、および熱処理条件を変化させることにより、所望の比誘電率、および温度係数特性に調整できる誘電体磁器を得ることができた。 According to the present invention, a dielectric ceramic having a predetermined composition range of Zr x Sn y Ti z O 4 and containing a rutile crystal phase allows sintering temperature, sintering holding time, sintering atmosphere, after sintering By changing the heat treatment temperature, heat treatment time, heat treatment atmosphere, etc., it is possible to freely control the relative dielectric constant and temperature coefficient. Therefore, it was possible to obtain a dielectric ceramic that can be adjusted to desired relative dielectric constant and temperature coefficient characteristics by changing sintering conditions and heat treatment conditions.

ZrSnTi4(x+y+z=2)を主成分とし、添加物として、La23、NiO、Ta25を添加した誘電体磁器は、主成分の組成が、x≧1.00、または、x≦0.55の場合、Qf積が小さすぎるので望ましくない。さらに、z≦0.85、または、z≧1.15の場合、温度係数の絶対値が大きすぎるので望ましくない。よって、x、zがそれぞれ、0.55<x<1.00、0.85<z<1.15のとき、優れた特性をもつ誘電体磁器を得ることができる。 A dielectric ceramic containing Zr x Sn y Ti z O 4 (x + y + z = 2) as a main component and adding La 2 O 3 , NiO, Ta 2 O 5 as additives has a composition of the main component of x ≧ 1. .00 or x ≦ 0.55 is undesirable because the Qf product is too small. Furthermore, when z ≦ 0.85 or z ≧ 1.15, the absolute value of the temperature coefficient is too large, which is not desirable. Therefore, when x and z are 0.55 <x <1.00 and 0.85 <z <1.15, respectively, a dielectric ceramic having excellent characteristics can be obtained.

添加物においては、La23、NiOは焼結温度を下げる効果があり、特にNiOにおいて顕著である。また、NiO、Ta25はQf積を大きくする効果がある。さらに、La23、NiO、Ta25のすべてにおいて、温度係数の絶対値を小さくする効果が認められる。しかし、添加物をそれぞれ1重量%よりも多く添加した場合、Qf積を小さくするので、望ましくない。よって、添加物として、La23、NiO、Ta25を1重量%以下(0重量%を含まず)を添加した場合、優れた特性を得ることができる。ここで、NiOは必須添加物として用いられ、La23、Ta25は必須ではないが、特性調整に有用な添加物として用いられる。 In the additive, La 2 O 3 and NiO have an effect of lowering the sintering temperature, and particularly remarkable in NiO. NiO and Ta 2 O 5 have the effect of increasing the Qf product. Furthermore, in all of La 2 O 3 , NiO and Ta 2 O 5 , the effect of reducing the absolute value of the temperature coefficient is recognized. However, adding more than 1% by weight of each additive is undesirable because it reduces the Qf product. Therefore, when 1 wt% or less (excluding 0 wt%) of La 2 O 3 , NiO, Ta 2 O 5 is added as an additive, excellent characteristics can be obtained. Here, NiO is used as an essential additive, and La 2 O 3 and Ta 2 O 5 are not essential, but are used as an additive useful for characteristic adjustment.

従来のZrSnTi4系の誘電体磁器においては、基本的に特性が安定するような、組成、焼成方法が採用され、結晶構造が単相となるように焼成して用いられていた。反応と焼結の関係は一義的に対応しないが、焼結性が増すことにより、単一相になり易い。特許文献1、2においては、共に焼結性を増し、焼結条件の変化で特性の変動がない誘電体磁器の製造を目指しており、均一でルチル型結晶構造をとる結晶相が含まれない誘電体磁器に関するものである。 In the conventional Zr x Sn y Ti z O 4 based dielectric ceramic, a composition and a firing method are adopted so that the characteristics are basically stabilized, and the ceramic structure is fired so that the crystal structure becomes a single phase. It was. The relationship between reaction and sintering does not uniquely correspond, but it tends to become a single phase due to increased sinterability. Patent Documents 1 and 2 aim to produce a dielectric ceramic that has both increased sinterability and no change in characteristics due to changes in sintering conditions, and does not include a crystal phase that has a uniform rutile crystal structure. The present invention relates to a dielectric ceramic.

誘電体磁器の結晶構造においては、ルチル型結晶構造をとる結晶相が含まれない場合、焼結条件、熱処理条件を変化させても、比誘電率、温度特性がほとんど変化しない。Qf積については低下する場合もある。また、ルチル型結晶構造をとる結晶相が30体積%を超えて含まれると温度特性の絶対値が大きくなりすぎるので望ましくない。また、今回の組成において、ルチル型結晶構造をとる結晶相の(110)面の面間隔dは、Zr、Sn、Ti、La、Ni、Taの含有量によって変化するが0.315nm〜0.340nmの範囲とすることが望ましい。   When the crystal structure of the dielectric ceramic does not include a crystal phase having a rutile crystal structure, the dielectric constant and temperature characteristics hardly change even when the sintering conditions and heat treatment conditions are changed. The Qf product may decrease. Further, if the crystal phase having the rutile crystal structure is contained in an amount exceeding 30% by volume, the absolute value of the temperature characteristic becomes too large, which is not desirable. In the present composition, the interplanar spacing d of the (110) plane of the crystal phase having the rutile crystal structure varies depending on the contents of Zr, Sn, Ti, La, Ni, and Ta, but is 0.315 nm to 0.00. A range of 340 nm is desirable.

即ち、ZrSnTi4(x+y+z=2、0.55<x<1.00、0.85<z<1.15)を主成分とし、添加物として、La23、NiO、Ta25をそれぞれ0〜1重量%(NiOについては0重量%を含まず)添加して、焼結後、ルチル型結晶構造をとる結晶相が存在し、その割合が30体積%以下(0体積%を含まず)、110面の面間隔dが0.315nm〜0.340nmである誘電体磁器とする。 That is, Zr x Sn y Ti z O 4 (x + y + z = 2, 0.55 <x <1.00, 0.85 <z <1.15) is a main component, and La 2 O 3 , NiO as additives. , Ta 2 O 5 is added in an amount of 0 to 1 wt% (excluding 0 wt% for NiO), and after sintering, there is a crystal phase having a rutile-type crystal structure, and the ratio is 30 vol% or less. (0 volume% is not included), a dielectric ceramic having a surface interval d of 110 planes of 0.315 nm to 0.340 nm.

この誘電体磁器は1100〜1600℃の熱処理によって、比誘電率、温度係数が共に変化する。その変化は熱処理の温度が高い場合、比誘電率、温度係数は小さくなり、熱処理の温度が低い場合、比誘電率、温度係数は大きくなる。また、時間によっても変化し、熱処理温度と時間を制御することによって、焼成後に比誘電率、および温度係数をある程度コントロールすることができる。   In this dielectric ceramic, both the relative dielectric constant and the temperature coefficient change by heat treatment at 1100 to 1600 ° C. The change is such that when the heat treatment temperature is high, the relative permittivity and temperature coefficient are small, and when the heat treatment temperature is low, the relative permittivity and temperature coefficient are large. Also, it changes with time, and by controlling the heat treatment temperature and time, the specific permittivity and temperature coefficient can be controlled to some extent after firing.

さらに、焼結温度、焼結時間を変化させることによっても、異なる比誘電率、温度係数を得ることができ、十分な再現性もある。よって、焼成後もしくは焼成直前に温度係数、比誘電率が規格外となるような場合でも、最初から製造しなおす必要がなく、工業上有用である。   Further, by changing the sintering temperature and the sintering time, different relative dielectric constants and temperature coefficients can be obtained, and there is sufficient reproducibility. Therefore, even when the temperature coefficient and the relative dielectric constant are out of specification after firing or just before firing, it is not necessary to remanufacture from the beginning and is industrially useful.

以下、実施例を挙げて本発明をさらに説明する。   Hereinafter, the present invention will be further described with reference to examples.

酸化物原料としてZrO2、SnO2、TiO2を表1に示す通り秤量し、さらにLa23、NiO、Ta25をそれぞれ0.2重量%、0.2重量%、0.3重量%加えて、20時間の湿式混合を行った。脱水処理後、大気雰囲気中にて1000〜1200℃の温度条件にて仮焼を行い、得られた仮焼粉を粉砕、乾燥後、バインダと潤滑剤を加えて混合し、整粒した。この粉末を1000kg/cm2の圧力で直径14mm、高さ5.6mmの円盤状になるように加圧成形し、脱バインダー後に、酸素雰囲気中にて1350〜1550℃4時間の条件で焼成を行った。ここで得られた焼成体の両面を研磨して空洞共振器法を用いて、共振周波数4.6GHzにおける比誘電率ε、Qf積、25〜75℃における共振周波数の温度係数τを求めた。さらに、1350℃で焼結した焼成体を1000〜1600℃で20時間、大気中熱処理を行い、上記と同様にして、比誘電率ε、Qf積、25〜75℃における共振周波数の温度係数τを求めた。これらの結果を表1に示す。 As oxide raw materials, ZrO 2 , SnO 2 , and TiO 2 were weighed as shown in Table 1, and La 2 O 3 , NiO, and Ta 2 O 5 were respectively 0.2 wt%, 0.2 wt%, and 0.3 wt%. Wet mixing was carried out for 20 hours by adding wt%. After the dehydration treatment, calcination was performed in an air atmosphere at a temperature of 1000 to 1200 ° C., and the obtained calcination powder was pulverized and dried, and then a binder and a lubricant were added, mixed, and sized. This powder is pressure-molded at a pressure of 1000 kg / cm 2 to form a disk shape having a diameter of 14 mm and a height of 5.6 mm, and after debinding, it is fired in an oxygen atmosphere at 1350 to 1550 ° C. for 4 hours. went. The both sides of the fired body obtained here are polished and the cavity resonator method is used to obtain the relative dielectric constant ε r and Qf product at a resonant frequency of 4.6 GHz and the temperature coefficient τ r of the resonant frequency at 25 to 75 ° C. It was. Further, the fired body sintered at 1350 ° C. is subjected to heat treatment in the atmosphere at 1000 to 1600 ° C. for 20 hours, and in the same manner as described above, the relative dielectric constant ε r , the Qf product, and the temperature coefficient of the resonance frequency at 25 to 75 ° C. τ r was determined. These results are shown in Table 1.

Figure 2006008449
Figure 2006008449

表1のように、主成分の組成により異なるが、焼結温度、熱処理温度が高い場合、比誘電率ε、温度係数τは小さくなる。それに対して、低い場合には比誘電率ε、温度係数τは大きくなる。よって、焼成温度、もしくは焼成後の熱処理温度を設定することにより、ある範囲内で、特性を調整することが可能である。 As shown in Table 1, the relative permittivity ε r and the temperature coefficient τ r are small when the sintering temperature and the heat treatment temperature are high, although depending on the composition of the main component. On the other hand, when it is low, the relative dielectric constant ε r and the temperature coefficient τ r increase. Therefore, it is possible to adjust the characteristics within a certain range by setting the firing temperature or the heat treatment temperature after firing.

一方、No.8,9,10のルチル型結晶構造相がないもの、および微量の場合には比誘電率ε、温度係数τは焼結温度、熱処理温度によってほとんど差がないので、特性を調整することは困難である。 On the other hand, no. In the case where there is no 8, 9, 10 rutile crystal structure phase, and in the case of a very small amount, the relative permittivity ε r and the temperature coefficient τ r have almost no difference depending on the sintering temperature and the heat treatment temperature. It is difficult.

1350℃で焼結した本発明の誘電体磁器のX線回折パターンを図1に示す。本発明の誘電体磁器はルチル型結晶構造を取る結晶相が含まれるので、図1のようにX線回折パターンには、ルチル型結晶構造によるピークを見ることができる。図1では↓印のピークがルチル型結晶構造をとる結晶相の110面のピークである。   An X-ray diffraction pattern of the dielectric ceramic of the present invention sintered at 1350 ° C. is shown in FIG. Since the dielectric ceramic of the present invention includes a crystal phase having a rutile crystal structure, a peak due to the rutile crystal structure can be seen in the X-ray diffraction pattern as shown in FIG. In FIG. 1, the peak marked with ↓ is the peak of the 110 plane of the crystal phase having a rutile crystal structure.

本発明のZrSnTiZO4(x+y+z=2)を主成分とした誘電体磁器のX線回折パターンを示す図。 Zr x Sn y Ti z ZO 4 (x + y + z = 2) shows an X-ray diffraction pattern of the dielectric ceramic mainly composed of the present invention.

Claims (2)

ZrSnTi4(x+y+z=2、0.55<x<1.00、0.85<z<1.15)を主成分とし、NiO、La23、Ta25からNiOを必須とした1種以上を添加物として選択し、選択した添加物をそれぞれ1重量%以下添加してなる誘電体磁器であって、ルチル型結晶構造をとる結晶相を含有することを特徴とする誘電体磁器。 Zr x Sn y Ti z O 4 (x + y + z = 2, 0.55 <x <1.00, 0.85 <z <1.15) as a main component, from NiO, La 2 O 3 , Ta 2 O 5 A dielectric ceramic comprising at least one selected from NiO as an additive and 1% by weight or less of the selected additive, each containing a crystalline phase having a rutile crystal structure. Dielectric porcelain. 前記ルチル型結晶構造をとる結晶相は、(110)面の面間隔dが、0.315〜0.340nmであり、割合が30体積%以下(0体積%を含まず)であることを特徴とする請求項1記載の誘電体磁器。   The crystal phase having the rutile crystal structure has a (110) plane spacing d of 0.315 to 0.340 nm and a ratio of 30% by volume or less (not including 0% by volume). The dielectric ceramic according to claim 1.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105777116A (en) * 2016-04-13 2016-07-20 苏州子波电子科技有限公司 Microwave dielectric ceramic and preparation method thereof
CN105884351A (en) * 2016-04-13 2016-08-24 苏州子波电子科技有限公司 Microwave dielectric ceramic and preparation method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105777116A (en) * 2016-04-13 2016-07-20 苏州子波电子科技有限公司 Microwave dielectric ceramic and preparation method thereof
CN105884351A (en) * 2016-04-13 2016-08-24 苏州子波电子科技有限公司 Microwave dielectric ceramic and preparation method thereof

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