JP2006005674A5 - - Google Patents

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Publication number
JP2006005674A5
JP2006005674A5 JP2004180151A JP2004180151A JP2006005674A5 JP 2006005674 A5 JP2006005674 A5 JP 2006005674A5 JP 2004180151 A JP2004180151 A JP 2004180151A JP 2004180151 A JP2004180151 A JP 2004180151A JP 2006005674 A5 JP2006005674 A5 JP 2006005674A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004180151A
Other versions
JP2006005674A (ja
JP4490740B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2004180151A priority Critical patent/JP4490740B2/ja
Priority claimed from JP2004180151A external-priority patent/JP4490740B2/ja
Priority to PCT/JP2005/011053 priority patent/WO2005125187A1/ja
Priority to DE112005001466T priority patent/DE112005001466T5/de
Publication of JP2006005674A publication Critical patent/JP2006005674A/ja
Priority to US11/637,955 priority patent/US7796164B2/en
Publication of JP2006005674A5 publication Critical patent/JP2006005674A5/ja
Application granted granted Critical
Publication of JP4490740B2 publication Critical patent/JP4490740B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2004180151A 2004-06-17 2004-06-17 信号読出装置及び試験装置 Expired - Fee Related JP4490740B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2004180151A JP4490740B2 (ja) 2004-06-17 2004-06-17 信号読出装置及び試験装置
PCT/JP2005/011053 WO2005125187A1 (ja) 2004-06-17 2005-06-16 信号読出装置及び試験装置
DE112005001466T DE112005001466T5 (de) 2004-06-17 2005-06-16 Signallesevorrichtung und Prüfvorrichtung
US11/637,955 US7796164B2 (en) 2004-06-17 2006-12-12 Signal reading apparatus and test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004180151A JP4490740B2 (ja) 2004-06-17 2004-06-17 信号読出装置及び試験装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2010048117A Division JP2010141924A (ja) 2010-03-04 2010-03-04 信号読出装置及び試験装置

Publications (3)

Publication Number Publication Date
JP2006005674A JP2006005674A (ja) 2006-01-05
JP2006005674A5 true JP2006005674A5 (ja) 2007-07-05
JP4490740B2 JP4490740B2 (ja) 2010-06-30

Family

ID=35510123

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004180151A Expired - Fee Related JP4490740B2 (ja) 2004-06-17 2004-06-17 信号読出装置及び試験装置

Country Status (4)

Country Link
US (1) US7796164B2 (ja)
JP (1) JP4490740B2 (ja)
DE (1) DE112005001466T5 (ja)
WO (1) WO2005125187A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010141924A (ja) * 2010-03-04 2010-06-24 Advantest Corp 信号読出装置及び試験装置
DE102021214608B3 (de) 2021-12-17 2023-05-04 Deutsches Zentrum für Luft- und Raumfahrt e.V. Optische Sensoreinrichtung und Verfahren zur Ermittlung von Degenerationen eines optischen Sensors einer optischen Sensoreinrichtung

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03225284A (ja) * 1990-01-30 1991-10-04 Nec Corp 固体撮像装置の出力信号計測方法
JPH0461587A (ja) * 1990-06-29 1992-02-27 Toshiba Corp カラー固体撮像装置
US5138459A (en) * 1990-11-20 1992-08-11 Personal Computer Cameras, Inc. Electronic still video camera with direct personal computer (pc) compatible digital format output
JP2845289B2 (ja) * 1991-03-14 1999-01-13 株式会社アドバンテスト 画像データの高速合成方法
JP2988095B2 (ja) * 1991-12-18 1999-12-06 ソニー株式会社 固体撮像装置
US5264939A (en) * 1992-05-29 1993-11-23 Eastman Kodak Company Apparatus and method for generating an interlaced viewing signal from the output signal of a non-interlaced camera system
US5949483A (en) * 1994-01-28 1999-09-07 California Institute Of Technology Active pixel sensor array with multiresolution readout
US5572155A (en) * 1994-06-20 1996-11-05 Fuji Photo Film Co., Ltd. CCD signal read-out circuit free from ailiasing of high-frequency noises
JP2743852B2 (ja) * 1995-01-05 1998-04-22 日本電気株式会社 積分型信号検出回路
JP3225284B2 (ja) 1995-03-31 2001-11-05 大阪ダイヤモンド工業株式会社 サーキュラソーで片面切削する方法ならびに同方法に用いるサーキュラソー
JP3351192B2 (ja) * 1995-07-12 2002-11-25 富士ゼロックス株式会社 画像読取信号処理装置
JP2000224392A (ja) * 1999-01-29 2000-08-11 Canon Inc 撮像装置、方法及びコンピュータ読み取り可能な記憶媒体
US6342919B2 (en) 1999-04-08 2002-01-29 Nucore Technology, Inc. Power saving method using interleaved programmable gain amplifier and A/D converters for digital imaging devices
JP2001258053A (ja) * 2000-03-10 2001-09-21 Sharp Corp 固体撮像装置の検査装置
EP1428380A2 (en) * 2001-08-17 2004-06-16 Micron Technology, Inc. Doubling of speed in cmos sensor with column-parallel adcs
US8054357B2 (en) * 2001-11-06 2011-11-08 Candela Microsystems, Inc. Image sensor with time overlapping image output
US7233350B2 (en) * 2002-01-05 2007-06-19 Candela Microsystems, Inc. Image sensor with interleaved image output
JP4284582B2 (ja) 2002-03-04 2009-06-24 富士電機システムズ株式会社 多接合型薄膜太陽電池とその製造方法

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