JP2005530174A5 - - Google Patents

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Publication number
JP2005530174A5
JP2005530174A5 JP2004515308A JP2004515308A JP2005530174A5 JP 2005530174 A5 JP2005530174 A5 JP 2005530174A5 JP 2004515308 A JP2004515308 A JP 2004515308A JP 2004515308 A JP2004515308 A JP 2004515308A JP 2005530174 A5 JP2005530174 A5 JP 2005530174A5
Authority
JP
Japan
Prior art keywords
plate
dichroic
measuring device
distance measuring
electronic distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004515308A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005530174A (ja
Filing date
Publication date
Priority claimed from SE0201882A external-priority patent/SE524655C2/sv
Application filed filed Critical
Publication of JP2005530174A publication Critical patent/JP2005530174A/ja
Publication of JP2005530174A5 publication Critical patent/JP2005530174A5/ja
Pending legal-status Critical Current

Links

JP2004515308A 2002-06-19 2003-06-18 マルチ光学チャンネル Pending JP2005530174A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE0201882A SE524655C2 (sv) 2002-06-19 2002-06-19 Elektronisk avstånds- och vinkelmätningsanordning
PCT/SE2003/001027 WO2004001333A1 (en) 2002-06-19 2003-06-18 Multiple optical channels

Publications (2)

Publication Number Publication Date
JP2005530174A JP2005530174A (ja) 2005-10-06
JP2005530174A5 true JP2005530174A5 (enExample) 2006-05-25

Family

ID=20288242

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004515308A Pending JP2005530174A (ja) 2002-06-19 2003-06-18 マルチ光学チャンネル

Country Status (7)

Country Link
US (1) US7382444B2 (enExample)
EP (1) EP1514076B1 (enExample)
JP (1) JP2005530174A (enExample)
AU (1) AU2003239043A1 (enExample)
DE (1) DE60336315D1 (enExample)
SE (1) SE524655C2 (enExample)
WO (1) WO2004001333A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1662278A1 (de) * 2004-11-27 2006-05-31 Leica Geosystems AG Plankonvex- oder Plankonkavlinse mit damit verbundenem Umlenkmittel
US7292179B2 (en) 2005-04-11 2007-11-06 Lockheed Martin Corporation Instantaneous passive range finding
DE602006014263D1 (de) 2006-07-03 2010-06-24 Trimble Ab Vermessungsinstrument und Verfahren zur Steuerung eines Vermessungsinstruments
WO2009106144A1 (en) 2008-02-29 2009-09-03 Trimble Automated calibration of a surveying instrument
DE102009028861B4 (de) * 2009-08-25 2015-03-05 Trimble Jena Gmbh Messvorrichtung mit verringertem Anteil an Störlicht und Herstellungsverfahren für diese
JP5653715B2 (ja) * 2010-10-27 2015-01-14 株式会社トプコン レーザ測量機
WO2014067579A1 (en) 2012-11-01 2014-05-08 Trimble Ab Tracker unit and method in a tracker unit
CN106062511B (zh) 2013-12-05 2018-12-04 特林布尔有限公司 大地测量仪器和操作大地测量仪器的方法
JP6892734B2 (ja) * 2015-12-15 2021-06-23 株式会社トプコン 光波距離測定装置
JP6867736B2 (ja) * 2018-09-21 2021-05-12 株式会社トプコン 光波距離測定装置
EP3640590B1 (en) 2018-10-17 2021-12-01 Trimble Jena GmbH Surveying apparatus for surveying an object
EP3640677B1 (en) 2018-10-17 2023-08-02 Trimble Jena GmbH Tracker of a surveying apparatus for tracking a target
EP4553538A3 (en) 2019-02-15 2025-08-13 Trimble Inc. Surveying instrument and method of calibrating a survey instrument
EP3885789A1 (en) 2020-03-26 2021-09-29 Leica Geosystems AG Distance measuring device
RU2756383C1 (ru) * 2021-04-02 2021-09-29 Акционерное общество "Научно-исследовательский институт "Полюс" им. М.Ф. Стельмаха" Приемный канал лазерного дальномера

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61243385A (ja) * 1985-04-22 1986-10-29 Toshiba Corp 光波測距装置
JPH07280513A (ja) * 1994-04-14 1995-10-27 Omron Corp 光学装置
US5600487A (en) * 1994-04-14 1997-02-04 Omron Corporation Dichroic mirror for separating/synthesizing light with a plurality of wavelengths and optical apparatus and detecting method using the same
JPH109827A (ja) * 1996-06-24 1998-01-16 Omron Corp 高さ判別装置および方法
JP3154047B2 (ja) * 1996-10-25 2001-04-09 旭精密株式会社 Ａｆ機能を有する測量機
US5936736A (en) 1996-09-30 1999-08-10 Asahi Seimitsu Kabushiki Kaisha Focusing method and apparatus for a surveying instrument having an AF function, and arrangement of an AF beam splitting optical system therein
JPH10170239A (ja) * 1996-10-08 1998-06-26 Matsushita Electric Ind Co Ltd ３次元形状計測装置
US5914817A (en) * 1998-05-15 1999-06-22 Optical Coating Laboratory, Inc. Thin film dichroic color separation filters for color splitters in liquid crystal display systems
SE521173C2 (sv) * 1998-09-17 2003-10-07 Spectra Prec Ab Elektronisk distansmätanordning
JP4023572B2 (ja) 1998-09-18 2007-12-19 株式会社トプコン 自動測量機
JP2000329517A (ja) 1999-05-21 2000-11-30 Topcon Corp 距離測定装置
ATE219575T1 (de) * 1999-08-31 2002-07-15 Leica Geosystems Ag Tachymeter-fernrohr
US6844963B2 (en) * 2000-03-23 2005-01-18 Olympus Optical Co., Ltd. Double-resonance-absorption microscope
JP3723721B2 (ja) * 2000-05-09 2005-12-07 ペンタックス株式会社 光波測距儀及びａｆ機能を有する光波測距儀
US6586748B1 (en) * 2000-06-06 2003-07-01 The United States Of America As Represented By The Secretary Of The Navy Non-invasive water current measurement system and method

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