JP2005322908A5 - - Google Patents
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- Publication number
- JP2005322908A5 JP2005322908A5 JP2005131323A JP2005131323A JP2005322908A5 JP 2005322908 A5 JP2005322908 A5 JP 2005322908A5 JP 2005131323 A JP2005131323 A JP 2005131323A JP 2005131323 A JP2005131323 A JP 2005131323A JP 2005322908 A5 JP2005322908 A5 JP 2005322908A5
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- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/838,892 US7196332B2 (en) | 2004-05-04 | 2004-05-04 | Monolithic x-ray detector with staggered detection areas |
| US10/838,892 | 2004-05-04 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005322908A JP2005322908A (ja) | 2005-11-17 |
| JP2005322908A5 true JP2005322908A5 (enExample) | 2008-06-19 |
| JP5095921B2 JP5095921B2 (ja) | 2012-12-12 |
Family
ID=35220139
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005131323A Expired - Fee Related JP5095921B2 (ja) | 2004-05-04 | 2005-04-28 | 食違い配置の検出区域を有するモノリシックｘ線検出器 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7196332B2 (enExample) |
| JP (1) | JP5095921B2 (enExample) |
| DE (1) | DE102005019975A1 (enExample) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7551712B2 (en) * | 2006-04-20 | 2009-06-23 | General Electric Company | CT detector with non-rectangular cells |
| US7638776B2 (en) * | 2006-08-21 | 2009-12-29 | Endicott Interconnect Technologies, Inc. | Staggered array imaging system using pixilated radiation detectors |
| JP4344760B2 (ja) * | 2007-06-15 | 2009-10-14 | シャープ株式会社 | 固体撮像装置およびそれを備えた電子機器 |
| JP4344761B2 (ja) * | 2007-06-15 | 2009-10-14 | シャープ株式会社 | 固体撮像装置およびそれを備えた電子機器 |
| EP2240963B1 (en) * | 2007-12-28 | 2016-05-04 | Koninklijke Philips N.V. | Electrical isolation of x-ray semiconductor imager pixels |
| US8614423B2 (en) * | 2009-02-02 | 2013-12-24 | Redlen Technologies, Inc. | Solid-state radiation detector with improved sensitivity |
| US9202961B2 (en) | 2009-02-02 | 2015-12-01 | Redlen Technologies | Imaging devices with solid-state radiation detector with improved sensitivity |
| US8300911B1 (en) | 2009-09-10 | 2012-10-30 | General Electric Company | Methods and apparatus for measuring visceral fat mass |
| US8165266B2 (en) * | 2009-09-10 | 2012-04-24 | General Electric Company | Transverse scanning bone densitometer and detector used in same |
| US20110060247A1 (en) * | 2009-09-10 | 2011-03-10 | General Electric Company | Methods and apparatus for measuring bone lengths |
| US8295570B2 (en) * | 2009-09-10 | 2012-10-23 | General Electric Company | Methods and apparatus for measuring body circumference |
| US8280138B2 (en) * | 2009-09-10 | 2012-10-02 | General Electric Company | System and method for performing bone densitometer measurements |
| US8884228B2 (en) | 2012-01-27 | 2014-11-11 | Savannah River Nuclear Solutions, Llc | Modification of solid state CdZnTe (CZT) radiation detectors with high sensitivity or high resolution operation |
| US9508618B2 (en) * | 2014-04-11 | 2016-11-29 | Globalfoundries Inc. | Staggered electrical frame structures for frame area reduction |
| EP3161522B1 (en) * | 2014-12-05 | 2018-02-28 | Koninklijke Philips N.V. | X-ray detector device for inclined angle x-ray radiation |
| JP6810045B2 (ja) * | 2015-01-26 | 2021-01-06 | イリノイ トゥール ワークス インコーポレイティド | 線形検出器アレイ用のギャップ分解能 |
| ITUA20163149A1 (it) * | 2016-05-04 | 2017-11-04 | Xnext S R L | Rivelatore, apparecchiatura e metodo per l’esecuzione di un controllo radiografico non invasivo di oggetti |
| CN106324649B (zh) * | 2016-08-31 | 2023-09-15 | 同方威视技术股份有限公司 | 半导体探测器 |
| SE2050777A1 (en) | 2020-06-26 | 2021-07-13 | Direct Conv Ab | Sensor unit, radiation detector, method of manufacturing sensor unit, and method of using sensor unit |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57141178A (en) * | 1981-02-26 | 1982-09-01 | Toshiba Corp | Solid-state image pickup device |
| JPH0797140B2 (ja) * | 1987-10-28 | 1995-10-18 | 富士電機株式会社 | 半導体回折ｘ線検出素子 |
| US5021663B1 (en) * | 1988-08-12 | 1997-07-01 | Texas Instruments Inc | Infrared detector |
| JPH02305063A (ja) * | 1989-05-18 | 1990-12-18 | Matsushita Electric Ind Co Ltd | イメージセンサ |
| US5841832A (en) | 1991-02-13 | 1998-11-24 | Lunar Corporation | Dual-energy x-ray detector providing spatial and temporal interpolation |
| US5841833A (en) | 1991-02-13 | 1998-11-24 | Lunar Corporation | Dual-energy x-ray detector providing spatial and temporal interpolation |
| US5436458A (en) * | 1993-12-06 | 1995-07-25 | Minnesota Mining And Manufacturing Company | Solid state radiation detection panel having tiled photosensitive detectors arranged to minimize edge effects between tiles |
| JP3776485B2 (ja) * | 1995-09-18 | 2006-05-17 | 東芝医用システムエンジニアリング株式会社 | Ｘ線診断装置 |
| US6037595A (en) | 1995-10-13 | 2000-03-14 | Digirad Corporation | Radiation detector with shielding electrode |
| US5677539A (en) * | 1995-10-13 | 1997-10-14 | Digirad | Semiconductor radiation detector with enhanced charge collection |
| US6410922B1 (en) * | 1995-11-29 | 2002-06-25 | Konstantinos Evangelos Spartiotis | Forming contacts on semiconductor substrates for radiation detectors and imaging devices |
| US5889313A (en) * | 1996-02-08 | 1999-03-30 | University Of Hawaii | Three-dimensional architecture for solid state radiation detectors |
| JP2002158343A (ja) * | 2000-11-21 | 2002-05-31 | Canon Inc | 放射線検出装置及びその製造方法 |
-
2004
- 2004-05-04 US US10/838,892 patent/US7196332B2/en not_active Expired - Lifetime
-
2005
- 2005-04-27 DE DE102005019975A patent/DE102005019975A1/de not_active Ceased
- 2005-04-28 JP JP2005131323A patent/JP5095921B2/ja not_active Expired - Fee Related