JP2005317529A - 不均等にセグメント化された多極子 - Google Patents

不均等にセグメント化された多極子 Download PDF

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Publication number
JP2005317529A
JP2005317529A JP2005115400A JP2005115400A JP2005317529A JP 2005317529 A JP2005317529 A JP 2005317529A JP 2005115400 A JP2005115400 A JP 2005115400A JP 2005115400 A JP2005115400 A JP 2005115400A JP 2005317529 A JP2005317529 A JP 2005317529A
Authority
JP
Japan
Prior art keywords
rod
multipole
ions
segments
conductive segments
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2005115400A
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English (en)
Japanese (ja)
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JP2005317529A5 (https=
Inventor
Gangqiang Li
ガンキアン・リ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2005317529A publication Critical patent/JP2005317529A/ja
Publication of JP2005317529A5 publication Critical patent/JP2005317529A5/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/4255—Device types with particular constructional features

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2005115400A 2004-04-30 2005-04-13 不均等にセグメント化された多極子 Pending JP2005317529A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/837,205 US20050242281A1 (en) 2004-04-30 2004-04-30 Unevenly segmented multipole

Publications (2)

Publication Number Publication Date
JP2005317529A true JP2005317529A (ja) 2005-11-10
JP2005317529A5 JP2005317529A5 (https=) 2008-03-27

Family

ID=34941126

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005115400A Pending JP2005317529A (ja) 2004-04-30 2005-04-13 不均等にセグメント化された多極子

Country Status (3)

Country Link
US (1) US20050242281A1 (https=)
EP (1) EP1592042A3 (https=)
JP (1) JP2005317529A (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008044290A1 (fr) * 2006-10-11 2008-04-17 Shimadzu Corporation Spectroscope de masse ms/ms
WO2008129751A1 (ja) * 2007-04-17 2008-10-30 Shimadzu Corporation 質量分析装置
JP4816792B2 (ja) * 2007-04-17 2011-11-16 株式会社島津製作所 質量分析装置

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7378653B2 (en) * 2006-01-10 2008-05-27 Varian, Inc. Increasing ion kinetic energy along axis of linear ion processing devices
GB0622780D0 (en) * 2006-11-15 2006-12-27 Micromass Ltd Mass spectrometer
US8080785B2 (en) * 2007-09-10 2011-12-20 Ionic Mass Spectrometry Group High pressure collision cell for mass spectrometer
DE102008023694B4 (de) * 2008-05-15 2010-12-30 Bruker Daltonik Gmbh Fragmentierung von Analytionen durch Ionenstoß in HF-Ionenfallen
GB0820308D0 (en) * 2008-11-06 2008-12-17 Micromass Ltd Mass spectrometer
US9613787B2 (en) * 2008-09-16 2017-04-04 Shimadzu Corporation Time-of-flight mass spectrometer for conducting high resolution mass analysis
JP5686566B2 (ja) * 2010-10-08 2015-03-18 株式会社日立ハイテクノロジーズ 質量分析装置
EP3357080B1 (en) * 2015-10-01 2024-05-01 DH Technologies Development PTE. Ltd. Mass-selective axial ejection linear ion trap
US10067141B2 (en) * 2016-06-21 2018-09-04 Thermo Finnigan Llc Systems and methods for improving loading capacity of a segmented reaction cell by utilizing all available segments
CN113764253A (zh) * 2020-06-03 2021-12-07 昆山聂尔精密仪器有限公司 拓宽质谱仪质量检测范围的分段四极杆装置及方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10223174A (ja) * 1997-02-03 1998-08-21 Yokogawa Electric Corp 四重極形質量分析計
JP2002502085A (ja) * 1998-01-23 2002-01-22 アナリティカ オブ ブランフォード インコーポレーテッド 多極イオンガイドを用いた質量分光測定法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3371204A (en) * 1966-09-07 1968-02-27 Bell & Howell Co Mass filter with one or more rod electrodes separated into a plurality of insulated segments
EP0843887A1 (en) * 1995-08-11 1998-05-27 Mds Health Group Limited Spectrometer with axial field
US6753523B1 (en) * 1998-01-23 2004-06-22 Analytica Of Branford, Inc. Mass spectrometry with multipole ion guides
CA2626383C (en) * 1998-05-29 2011-07-19 Craig M. Whitehouse Mass spectrometry with multipole ion guides
US6744043B2 (en) * 2000-12-08 2004-06-01 Mds Inc. Ion mobilty spectrometer incorporating an ion guide in combination with an MS device
CA2430527C (en) * 2002-05-30 2012-03-27 Micromass Limited Mass spectrometer
US7034292B1 (en) * 2002-05-31 2006-04-25 Analytica Of Branford, Inc. Mass spectrometry with segmented RF multiple ion guides in various pressure regions

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10223174A (ja) * 1997-02-03 1998-08-21 Yokogawa Electric Corp 四重極形質量分析計
JP2002502085A (ja) * 1998-01-23 2002-01-22 アナリティカ オブ ブランフォード インコーポレーテッド 多極イオンガイドを用いた質量分光測定法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008044290A1 (fr) * 2006-10-11 2008-04-17 Shimadzu Corporation Spectroscope de masse ms/ms
WO2008129751A1 (ja) * 2007-04-17 2008-10-30 Shimadzu Corporation 質量分析装置
JP4816792B2 (ja) * 2007-04-17 2011-11-16 株式会社島津製作所 質量分析装置
US8134123B2 (en) 2007-04-17 2012-03-13 Shimadzu Corporation Mass spectrometer

Also Published As

Publication number Publication date
US20050242281A1 (en) 2005-11-03
EP1592042A2 (en) 2005-11-02
EP1592042A3 (en) 2006-10-25

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