WO2008129751A1 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
WO2008129751A1
WO2008129751A1 PCT/JP2008/000043 JP2008000043W WO2008129751A1 WO 2008129751 A1 WO2008129751 A1 WO 2008129751A1 JP 2008000043 W JP2008000043 W JP 2008000043W WO 2008129751 A1 WO2008129751 A1 WO 2008129751A1
Authority
WO
WIPO (PCT)
Prior art keywords
ion
distance
virtual
electrodes
quadrupole
Prior art date
Application number
PCT/JP2008/000043
Other languages
English (en)
French (fr)
Inventor
Masaru Nishiguchi
Yoshihiro Ueno
Daisuke Okumura
Hiroto Itoi
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to JP2009510747A priority Critical patent/JP4816792B2/ja
Priority to US12/594,450 priority patent/US8134123B2/en
Priority to EP08702784.3A priority patent/EP2139022B1/en
Publication of WO2008129751A1 publication Critical patent/WO2008129751A1/ja

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/065—Ion guides having stacked electrodes, e.g. ring stack, plate stack
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4235—Stacked rings or stacked plates

Abstract

　イオン光軸方向に並ぶ複数枚の電極素板により１本の仮想ロッド電極を構成し、この仮想ロッド電極をイオン光軸の周りに４本配置することで仮想四重極ロッド型イオン輸送光学系（３０）を構成する。１本の仮想ロッド電極の中で前半領域（３０Ａ）では隣接する電極素板の間隔を広くし、後半領域（３０Ｂ）では間隔を狭くする。電極間隔が広いほうが高次の多重極場成分が多くなるためにイオンアクセプタンスが大きくなり、前段から到来するイオンを効率良く受け容れることが可能となる。一方、電極間隔が狭いと四重極場成分が相対的に多くなり、イオンビームの収束性が良好になるので後段の例えば四重極質量フィルタに効率良くイオンを導入することができる。それによって、質量分析の感度や精度の向上に寄与する。
PCT/JP2008/000043 2007-04-17 2008-01-17 質量分析装置 WO2008129751A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009510747A JP4816792B2 (ja) 2007-04-17 2008-01-17 質量分析装置
US12/594,450 US8134123B2 (en) 2007-04-17 2008-01-17 Mass spectrometer
EP08702784.3A EP2139022B1 (en) 2007-04-17 2008-01-17 Mass spectrometer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/JP2007/000417 WO2008136040A1 (ja) 2007-04-17 2007-04-17 質量分析装置
JPPCT/JP2007/000417 2007-04-17

Publications (1)

Publication Number Publication Date
WO2008129751A1 true WO2008129751A1 (ja) 2008-10-30

Family

ID=39875290

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/JP2007/000417 WO2008136040A1 (ja) 2007-04-17 2007-04-17 質量分析装置
PCT/JP2008/000043 WO2008129751A1 (ja) 2007-04-17 2008-01-17 質量分析装置

Family Applications Before (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/000417 WO2008136040A1 (ja) 2007-04-17 2007-04-17 質量分析装置

Country Status (3)

Country Link
US (1) US8134123B2 (ja)
EP (1) EP2139022B1 (ja)
WO (2) WO2008136040A1 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010118308A (ja) * 2008-11-14 2010-05-27 Shimadzu Corp イオンガイド及びそれを備えた質量分析装置
GB2455593B (en) * 2006-04-28 2010-11-03 Micromass Ltd Mass spectrometer
GB2470664A (en) * 2009-05-29 2010-12-01 Micromass Ltd Ion guides comprising axial groupings of radially segmented electrodes
JP2011171296A (ja) * 2010-01-28 2011-09-01 Carl Zeiss Nts Gmbh イオンを集束および蓄積する装置、および圧力領域を分離する装置
DE102010003578B4 (de) * 2009-05-28 2018-11-08 Agilent Technologies Inc. Konvergierendes mehrpoliges Ionenleitsystem zum Formen eines Ionenstrahls
US10699889B2 (en) 2016-05-13 2020-06-30 Micromass Uk Limited Ion guide

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010001347A1 (de) * 2010-01-28 2011-08-18 Carl Zeiss NTS GmbH, 73447 Vorrichtung zur Übertragung von Energie und/oder zum Transport eines Ions sowie Teilchenstrahlgerät mit einer solchen Vorrichtung
US9589781B2 (en) * 2010-12-17 2017-03-07 Shimadzu Corporation Ion guide and mass spectrometer
US8507848B1 (en) * 2012-01-24 2013-08-13 Shimadzu Research Laboratory (Shanghai) Co. Ltd. Wire electrode based ion guide device
JP2016009562A (ja) * 2014-06-24 2016-01-18 株式会社島津製作所 イオン輸送装置及び質量分析装置
US10770279B2 (en) * 2015-11-27 2020-09-08 Shimadzu Corporation Ion transfer apparatus
US10984998B2 (en) 2017-10-26 2021-04-20 Shimadzu Corporation Mass spectrometer
JP7127701B2 (ja) 2018-12-19 2022-08-30 株式会社島津製作所 質量分析装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH087827A (ja) * 1994-06-17 1996-01-12 Jeol Ltd ビームガイド
JP2000149865A (ja) 1998-09-02 2000-05-30 Shimadzu Corp 質量分析装置
JP2001101992A (ja) * 1999-09-30 2001-04-13 Shimadzu Corp 大気圧イオン化質量分析装置
JP2001351563A (ja) 2000-06-07 2001-12-21 Shimadzu Corp 質量分析装置
JP2004014177A (ja) * 2002-06-04 2004-01-15 Shimadzu Corp 質量分析装置
JP2005317529A (ja) * 2004-04-30 2005-11-10 Agilent Technol Inc 不均等にセグメント化された多極子

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1278761B (de) * 1963-02-04 1968-09-26 Bell & Howell Co Multipolmassenfilter
GB2341270A (en) * 1998-09-02 2000-03-08 Shimadzu Corp Mass spectrometer having ion lens composed of plurality of virtual rods comprising plurality of electrodes
WO2003094197A1 (en) * 2002-04-29 2003-11-13 Mds Inc., Doing Business As Mds Sciex Broad ion fragmentation coverage in mass spectrometry by varying the collision energy
WO2005043115A2 (en) * 2003-10-20 2005-05-12 Ionwerks, Inc. Ion mobility tof/maldi/ms using drift cell alternating high and low electrical field regions
US7557343B2 (en) * 2005-09-13 2009-07-07 Agilent Technologies, Inc. Segmented rod multipole as ion processing cell

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH087827A (ja) * 1994-06-17 1996-01-12 Jeol Ltd ビームガイド
JP2000149865A (ja) 1998-09-02 2000-05-30 Shimadzu Corp 質量分析装置
JP2001101992A (ja) * 1999-09-30 2001-04-13 Shimadzu Corp 大気圧イオン化質量分析装置
JP2001351563A (ja) 2000-06-07 2001-12-21 Shimadzu Corp 質量分析装置
JP2004014177A (ja) * 2002-06-04 2004-01-15 Shimadzu Corp 質量分析装置
JP2005317529A (ja) * 2004-04-30 2005-11-10 Agilent Technol Inc 不均等にセグメント化された多極子

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2139022A4

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2455593B (en) * 2006-04-28 2010-11-03 Micromass Ltd Mass spectrometer
JP2010118308A (ja) * 2008-11-14 2010-05-27 Shimadzu Corp イオンガイド及びそれを備えた質量分析装置
DE102010003578B4 (de) * 2009-05-28 2018-11-08 Agilent Technologies Inc. Konvergierendes mehrpoliges Ionenleitsystem zum Formen eines Ionenstrahls
GB2470664A (en) * 2009-05-29 2010-12-01 Micromass Ltd Ion guides comprising axial groupings of radially segmented electrodes
JP2012528437A (ja) * 2009-05-29 2012-11-12 マイクロマス・ユーケイ・リミテッド イオントンネル型イオンガイド
GB2470664B (en) * 2009-05-29 2013-12-25 Micromass Ltd Ion tunnel ion guide
US8658970B2 (en) 2009-05-29 2014-02-25 Micromass Uk Limited Ion tunnel ion guide
US8957368B2 (en) 2009-05-29 2015-02-17 Micromass Uk Limited Ion tunnel ion guide
JP2011171296A (ja) * 2010-01-28 2011-09-01 Carl Zeiss Nts Gmbh イオンを集束および蓄積する装置、および圧力領域を分離する装置
US9230789B2 (en) 2010-01-28 2016-01-05 Carl Zeiss Microscopy Gmbh Printed circuit board multipole for ion focusing
US10699889B2 (en) 2016-05-13 2020-06-30 Micromass Uk Limited Ion guide

Also Published As

Publication number Publication date
US20100116979A1 (en) 2010-05-13
US8134123B2 (en) 2012-03-13
WO2008136040A1 (ja) 2008-11-13
EP2139022A1 (en) 2009-12-30
EP2139022A4 (en) 2012-10-24
EP2139022B1 (en) 2017-07-05

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