JP2005317127A5 - - Google Patents
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- Publication number
- JP2005317127A5 JP2005317127A5 JP2004134486A JP2004134486A JP2005317127A5 JP 2005317127 A5 JP2005317127 A5 JP 2005317127A5 JP 2004134486 A JP2004134486 A JP 2004134486A JP 2004134486 A JP2004134486 A JP 2004134486A JP 2005317127 A5 JP2005317127 A5 JP 2005317127A5
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- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004134486A JP2005317127A (ja) | 2004-04-28 | 2004-04-28 | 不揮発性半導体記憶装置 |
| US11/113,046 US7310277B2 (en) | 2004-04-28 | 2005-04-25 | Non-volatile semiconductor storage device with specific command enable/disable control signal |
| CNB2005100685137A CN100468574C (zh) | 2004-04-28 | 2005-04-28 | 非易失性半导体存储器件 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004134486A JP2005317127A (ja) | 2004-04-28 | 2004-04-28 | 不揮発性半導体記憶装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005317127A JP2005317127A (ja) | 2005-11-10 |
| JP2005317127A5 true JP2005317127A5 (enExample) | 2007-03-22 |
Family
ID=35186911
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004134486A Pending JP2005317127A (ja) | 2004-04-28 | 2004-04-28 | 不揮発性半導体記憶装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7310277B2 (enExample) |
| JP (1) | JP2005317127A (enExample) |
| CN (1) | CN100468574C (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100718042B1 (ko) | 2006-04-06 | 2007-05-14 | 주식회사 하이닉스반도체 | 반도체 메모리 장치 및 그 테스트 방법 |
| CN103677748A (zh) * | 2012-09-26 | 2014-03-26 | 北京兆易创新科技股份有限公司 | 非易失性存储器指令处理的装置及方法 |
| CN104657684B (zh) * | 2014-08-27 | 2018-01-30 | 北京中电华大电子设计有限责任公司 | 增强智能卡可靠性的方法 |
| JP2017045415A (ja) | 2015-08-28 | 2017-03-02 | 株式会社東芝 | メモリシステム |
| JP2018014050A (ja) | 2016-07-22 | 2018-01-25 | 東芝メモリ株式会社 | メモリシステム |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5361341A (en) * | 1987-10-02 | 1994-11-01 | Sgs-Thomson Microelectronics, S.A. | Device for enabling the use of the contents of memory areas of an electronic microprocessor system |
| JPH07182885A (ja) | 1993-02-05 | 1995-07-21 | Toshiba Corp | 半導体記憶装置 |
| US6260172B1 (en) * | 1997-09-05 | 2001-07-10 | Nippon Steel Corporation | Semiconductor device with logic rewriting and security protection function |
| JPH11110293A (ja) * | 1997-09-29 | 1999-04-23 | Mitsubishi Electric Corp | 不揮発性メモリ制御回路 |
| JP3625377B2 (ja) * | 1998-05-25 | 2005-03-02 | ローム株式会社 | 半導体発光素子 |
| JP4079552B2 (ja) * | 1999-07-16 | 2008-04-23 | 富士通株式会社 | 不正コピーを防止した不揮発性半導体メモリ |
| JP2002074996A (ja) * | 2000-08-25 | 2002-03-15 | Mitsubishi Electric Corp | 半導体集積回路 |
| JP2002288988A (ja) * | 2001-03-28 | 2002-10-04 | Mitsubishi Electric Corp | 不揮発性半導体記憶装置 |
| JP3961806B2 (ja) * | 2001-10-18 | 2007-08-22 | 富士通株式会社 | 不揮発性半導体記憶装置 |
| US6996692B2 (en) * | 2002-04-17 | 2006-02-07 | Matsushita Electric Industrial Co., Ltd. | Nonvolatile semiconductor memory device and method for providing security for the same |
| JP4327626B2 (ja) * | 2004-03-12 | 2009-09-09 | 株式会社東芝 | 不揮発性半導体記憶装置 |
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2004
- 2004-04-28 JP JP2004134486A patent/JP2005317127A/ja active Pending
-
2005
- 2005-04-25 US US11/113,046 patent/US7310277B2/en not_active Expired - Fee Related
- 2005-04-28 CN CNB2005100685137A patent/CN100468574C/zh not_active Expired - Fee Related