JP2005274567A5 - - Google Patents

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Publication number
JP2005274567A5
JP2005274567A5 JP2005055411A JP2005055411A JP2005274567A5 JP 2005274567 A5 JP2005274567 A5 JP 2005274567A5 JP 2005055411 A JP2005055411 A JP 2005055411A JP 2005055411 A JP2005055411 A JP 2005055411A JP 2005274567 A5 JP2005274567 A5 JP 2005274567A5
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JP
Japan
Prior art keywords
segmented
band
projection
illuminating
bands
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2005055411A
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English (en)
Japanese (ja)
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JP2005274567A (ja
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Publication date
Priority claimed from US10/800,499 external-priority patent/US7154613B2/en
Application filed filed Critical
Publication of JP2005274567A publication Critical patent/JP2005274567A/ja
Publication of JP2005274567A5 publication Critical patent/JP2005274567A5/ja
Pending legal-status Critical Current

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JP2005055411A 2004-03-15 2005-03-01 フォトグラメトリーを使用する自動形状計測用にカラーコード化された光 Pending JP2005274567A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/800,499 US7154613B2 (en) 2004-03-15 2004-03-15 Color coded light for automated shape measurement using photogrammetry

Publications (2)

Publication Number Publication Date
JP2005274567A JP2005274567A (ja) 2005-10-06
JP2005274567A5 true JP2005274567A5 (https=) 2008-04-17

Family

ID=34838873

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005055411A Pending JP2005274567A (ja) 2004-03-15 2005-03-01 フォトグラメトリーを使用する自動形状計測用にカラーコード化された光

Country Status (6)

Country Link
US (1) US7154613B2 (https=)
EP (1) EP1577641A3 (https=)
JP (1) JP2005274567A (https=)
BR (1) BRPI0406257A (https=)
CA (1) CA2489994A1 (https=)
IL (1) IL165367A (https=)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
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US7377181B2 (en) * 2006-03-10 2008-05-27 Northrop Grumman Corporation In-situ large area optical strain measurement using an encoded dot pattern
US7661199B2 (en) * 2006-05-19 2010-02-16 The Boeing Company Coded target for use with combination laser and photogrammetry targets
US8245578B2 (en) * 2007-02-23 2012-08-21 Direct Measurements, Inc. Differential non-linear strain measurement using binary code symbol
DE102007042963A1 (de) * 2007-09-10 2009-03-12 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zur dreidimensionalen Digitalisierung von Objekten
WO2009102490A1 (en) * 2008-02-15 2009-08-20 Pilkington Group Limited Method of determination of glass surface shape and optical distortion by reflected optical imaging
CN101960253B (zh) 2008-02-26 2013-05-01 株式会社高永科技 三维形状测量装置及测量方法
FR2936605B1 (fr) * 2008-10-01 2014-10-31 Saint Gobain Dispositif d'analyse de la surface d'un substrat
EP2456613A1 (fr) * 2009-07-24 2012-05-30 Bobst Sa Dispositif de topographie d'une surface d'un substrat
CA2771727C (en) 2009-11-04 2013-01-08 Technologies Numetrix Inc. Device and method for obtaining three-dimensional object surface data
RU2457435C1 (ru) * 2011-01-13 2012-07-27 Государственное образовательное учреждение высшего профессионального образования "Московский государственный университет геодезии и картографии" (МИИГАиК) Фотограмметрическая мира
KR101651174B1 (ko) 2012-07-25 2016-08-25 지멘스 악티엔게젤샤프트 3d 측정을 위한, 특히 투명 산란 표면들을 위한 컬러 코딩
US11455737B2 (en) * 2012-12-06 2022-09-27 The Boeing Company Multiple-scale digital image correlation pattern and measurement
JP6300594B2 (ja) * 2013-04-26 2018-03-28 本田技研工業株式会社 ワーク品質判定方法及びワーク品質判定システム
GB201314642D0 (en) * 2013-08-15 2013-10-02 Summerfield Gideon Image Identification System and Method
RU2551396C1 (ru) * 2013-11-06 2015-05-20 Российская Федерация, от имени которой выступает Министерство промышленности и торговли Российской Федерации (Минпромторг России) Способ бесконтактных измерений геометрических параметров объекта в пространстве и устройство для его осуществления
DE102014207022A1 (de) * 2014-04-11 2015-10-29 Siemens Aktiengesellschaft Tiefenbestimmung einer Oberfläche eines Prüfobjektes
CN103940368A (zh) * 2014-04-16 2014-07-23 南京航空航天大学 一种蜻蜓翅膀褶皱结构三维模型生成方法
CN105806320B (zh) * 2014-12-29 2020-04-21 同方威视技术股份有限公司 拍摄测量系统以及拍摄测量方法
RU2645432C1 (ru) * 2016-12-06 2018-02-21 Российская Федерация, от имени которой выступает Министерство промышленности и торговли Российской Федерации (Минпромторг России) Способ калибровки видеограмметрических систем и контрольное приспособление для его осуществления
CN108748971A (zh) * 2018-03-08 2018-11-06 哈尔滨工程大学 一种基于3d打印的一体化喷水推进器加工方法
CN108931209B (zh) * 2018-05-04 2019-12-31 长春理工大学 一种高适应性的彩色物体三维重建方法
JP7118748B2 (ja) * 2018-06-01 2022-08-16 富士通コンポーネント株式会社 計測器および光学読取器
JP7124624B2 (ja) * 2018-10-12 2022-08-24 トヨタ自動車株式会社 エンターテイメントシステムおよびプログラム
WO2023042346A1 (ja) * 2021-09-16 2023-03-23 株式会社東芝 光学装置、情報処理方法、および、プログラム

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US4871256A (en) * 1987-04-29 1989-10-03 Lbp Partnership Means for projecting patterns of light
RU1768978C (ru) 1988-04-18 1992-10-15 Государственный научно-исследовательский институт автомобильного транспорта Стереоскопическое измерительное устройство
JPH03293507A (ja) * 1990-04-11 1991-12-25 Nippondenso Co Ltd ３次元形状測定装置
DE4130237A1 (de) 1991-09-11 1993-03-18 Zeiss Carl Fa Verfahren und vorrichtung zur dreidimensionalen optischen vermessung von objektoberflaechen
US5608529A (en) 1994-01-31 1997-03-04 Nikon Corporation Optical three-dimensional shape measuring apparatus
JP3553652B2 (ja) * 1994-08-19 2004-08-11 茂樹 小林 形状計測装置、検査装置、及び製品の製造方法
US5675407A (en) 1995-03-02 1997-10-07 Zheng Jason Geng Color ranging method for high speed low-cost three dimensional surface profile measurement
US6442292B1 (en) * 1997-05-22 2002-08-27 Kabushiki Kaisha Topcon Measuring apparatus
DE19747061B4 (de) * 1997-10-24 2005-02-10 Mähner, Bernward Verfahren und Einrichtung zur flächenhaften, dreidimensionalen, optischen Vermessung von Objekten
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