JP2005274567A - フォトグラメトリーを使用する自動形状計測用にカラーコード化された光 - Google Patents

フォトグラメトリーを使用する自動形状計測用にカラーコード化された光 Download PDF

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Publication number
JP2005274567A
JP2005274567A JP2005055411A JP2005055411A JP2005274567A JP 2005274567 A JP2005274567 A JP 2005274567A JP 2005055411 A JP2005055411 A JP 2005055411A JP 2005055411 A JP2005055411 A JP 2005055411A JP 2005274567 A JP2005274567 A JP 2005274567A
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Japan
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band
bands
projection
segmented
illuminating
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JP2005055411A
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Japanese (ja)
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JP2005274567A5 (https=
Inventor
Robert J Christ Jr
ジェイ．クライスト，ジュニア ロバート
John M Papazian
エム．パパジアン ジョン
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Northrop Grumman Corp
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Northrop Grumman Corp
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Publication of JP2005274567A publication Critical patent/JP2005274567A/ja
Publication of JP2005274567A5 publication Critical patent/JP2005274567A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/02—Picture taking arrangements specially adapted for photogrammetry or photographic surveying, e.g. controlling overlapping of pictures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2005055411A 2004-03-15 2005-03-01 フォトグラメトリーを使用する自動形状計測用にカラーコード化された光 Pending JP2005274567A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/800,499 US7154613B2 (en) 2004-03-15 2004-03-15 Color coded light for automated shape measurement using photogrammetry

Publications (2)

Publication Number Publication Date
JP2005274567A true JP2005274567A (ja) 2005-10-06
JP2005274567A5 JP2005274567A5 (https=) 2008-04-17

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ID=34838873

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JP2005055411A Pending JP2005274567A (ja) 2004-03-15 2005-03-01 フォトグラメトリーを使用する自動形状計測用にカラーコード化された光

Country Status (6)

Country Link
US (1) US7154613B2 (https=)
EP (1) EP1577641A3 (https=)
JP (1) JP2005274567A (https=)
BR (1) BRPI0406257A (https=)
CA (1) CA2489994A1 (https=)
IL (1) IL165367A (https=)

Cited By (6)

* Cited by examiner, † Cited by third party
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JP2009069146A (ja) * 2007-09-10 2009-04-02 Steinbichler Optotechnik Gmbh 対象物を３次元デジタル化する方法及び装置
JP2011512533A (ja) * 2008-02-15 2011-04-21 ピルキングトン・グループ・リミテッド 反射光学画像法によるガラス表面形状及び光学歪の測定方法
JP2014224803A (ja) * 2013-04-26 2014-12-04 本田技研工業株式会社 ワーク品質判定方法及びワーク品質判定システム
CN108931209A (zh) * 2018-05-04 2018-12-04 长春理工大学 一种高适应性的彩色物体三维重建方法
CN110555327A (zh) * 2018-06-01 2019-12-10 富士通电子零件有限公司 测量仪器、光学读取器以及光学可读量具
WO2023042346A1 (ja) * 2021-09-16 2023-03-23 株式会社東芝 光学装置、情報処理方法、および、プログラム

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US20060227336A1 (en) * 2005-04-06 2006-10-12 Dinner Todd M Apparatus and methods for preparing customized personal supports
US7377181B2 (en) * 2006-03-10 2008-05-27 Northrop Grumman Corporation In-situ large area optical strain measurement using an encoded dot pattern
US7661199B2 (en) * 2006-05-19 2010-02-16 The Boeing Company Coded target for use with combination laser and photogrammetry targets
US8245578B2 (en) * 2007-02-23 2012-08-21 Direct Measurements, Inc. Differential non-linear strain measurement using binary code symbol
CN101960253B (zh) 2008-02-26 2013-05-01 株式会社高永科技 三维形状测量装置及测量方法
FR2936605B1 (fr) * 2008-10-01 2014-10-31 Saint Gobain Dispositif d'analyse de la surface d'un substrat
EP2456613A1 (fr) * 2009-07-24 2012-05-30 Bobst Sa Dispositif de topographie d'une surface d'un substrat
CA2771727C (en) 2009-11-04 2013-01-08 Technologies Numetrix Inc. Device and method for obtaining three-dimensional object surface data
RU2457435C1 (ru) * 2011-01-13 2012-07-27 Государственное образовательное учреждение высшего профессионального образования "Московский государственный университет геодезии и картографии" (МИИГАиК) Фотограмметрическая мира
KR101651174B1 (ko) 2012-07-25 2016-08-25 지멘스 악티엔게젤샤프트 3d 측정을 위한, 특히 투명 산란 표면들을 위한 컬러 코딩
US11455737B2 (en) * 2012-12-06 2022-09-27 The Boeing Company Multiple-scale digital image correlation pattern and measurement
GB201314642D0 (en) * 2013-08-15 2013-10-02 Summerfield Gideon Image Identification System and Method
RU2551396C1 (ru) * 2013-11-06 2015-05-20 Российская Федерация, от имени которой выступает Министерство промышленности и торговли Российской Федерации (Минпромторг России) Способ бесконтактных измерений геометрических параметров объекта в пространстве и устройство для его осуществления
DE102014207022A1 (de) * 2014-04-11 2015-10-29 Siemens Aktiengesellschaft Tiefenbestimmung einer Oberfläche eines Prüfobjektes
CN103940368A (zh) * 2014-04-16 2014-07-23 南京航空航天大学 一种蜻蜓翅膀褶皱结构三维模型生成方法
CN105806320B (zh) * 2014-12-29 2020-04-21 同方威视技术股份有限公司 拍摄测量系统以及拍摄测量方法
RU2645432C1 (ru) * 2016-12-06 2018-02-21 Российская Федерация, от имени которой выступает Министерство промышленности и торговли Российской Федерации (Минпромторг России) Способ калибровки видеограмметрических систем и контрольное приспособление для его осуществления
CN108748971A (zh) * 2018-03-08 2018-11-06 哈尔滨工程大学 一种基于3d打印的一体化喷水推进器加工方法
JP7124624B2 (ja) * 2018-10-12 2022-08-24 トヨタ自動車株式会社 エンターテイメントシステムおよびプログラム

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JPH03293507A (ja) * 1990-04-11 1991-12-25 Nippondenso Co Ltd ３次元形状測定装置
JPH0861930A (ja) * 1994-08-19 1996-03-08 Shigeki Kobayashi 形状計測装置、検査装置、及び製品の製造方法
JP2003518614A (ja) * 1999-12-27 2003-06-10 シーメンス アクチエンゲゼルシヤフト 三次元の表面座標の決定方法
US6700669B1 (en) * 2000-01-28 2004-03-02 Zheng J. Geng Method and system for three-dimensional imaging using light pattern having multiple sub-patterns

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US6252623B1 (en) 1998-05-15 2001-06-26 3Dmetrics, Incorporated Three dimensional imaging system
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Patent Citations (5)

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JPS5229252A (en) * 1975-08-27 1977-03-04 Dynell Elec Method of determining space position of point on surface of matter
JPH03293507A (ja) * 1990-04-11 1991-12-25 Nippondenso Co Ltd ３次元形状測定装置
JPH0861930A (ja) * 1994-08-19 1996-03-08 Shigeki Kobayashi 形状計測装置、検査装置、及び製品の製造方法
JP2003518614A (ja) * 1999-12-27 2003-06-10 シーメンス アクチエンゲゼルシヤフト 三次元の表面座標の決定方法
US6700669B1 (en) * 2000-01-28 2004-03-02 Zheng J. Geng Method and system for three-dimensional imaging using light pattern having multiple sub-patterns

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009069146A (ja) * 2007-09-10 2009-04-02 Steinbichler Optotechnik Gmbh 対象物を３次元デジタル化する方法及び装置
JP2011512533A (ja) * 2008-02-15 2011-04-21 ピルキングトン・グループ・リミテッド 反射光学画像法によるガラス表面形状及び光学歪の測定方法
JP2014224803A (ja) * 2013-04-26 2014-12-04 本田技研工業株式会社 ワーク品質判定方法及びワーク品質判定システム
CN108931209A (zh) * 2018-05-04 2018-12-04 长春理工大学 一种高适应性的彩色物体三维重建方法
CN110555327A (zh) * 2018-06-01 2019-12-10 富士通电子零件有限公司 测量仪器、光学读取器以及光学可读量具
KR20190137714A (ko) * 2018-06-01 2019-12-11 후지쯔 콤포넌트 가부시끼가이샤 계측기, 광학 판독기 및 광학 판독 가능한 측정기
KR102248659B1 (ko) 2018-06-01 2021-05-07 후지쯔 콤포넌트 가부시끼가이샤 계측기, 광학 판독기 및 광학 판독 가능한 측정기
CN110555327B (zh) * 2018-06-01 2022-12-20 富士通电子零件有限公司 测量仪器、光学读取器以及光学可读量具
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WO2023042346A1 (ja) * 2021-09-16 2023-03-23 株式会社東芝 光学装置、情報処理方法、および、プログラム

Also Published As

Publication number Publication date
EP1577641A3 (en) 2011-10-05
IL165367A0 (en) 2006-01-15
BRPI0406257A (pt) 2006-02-14
US20050200857A1 (en) 2005-09-15
IL165367A (en) 2009-06-15
EP1577641A2 (en) 2005-09-21
CA2489994A1 (en) 2005-09-15
US7154613B2 (en) 2006-12-26

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