JP2005241329A5 - - Google Patents

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Publication number
JP2005241329A5
JP2005241329A5 JP2004049224A JP2004049224A JP2005241329A5 JP 2005241329 A5 JP2005241329 A5 JP 2005241329A5 JP 2004049224 A JP2004049224 A JP 2004049224A JP 2004049224 A JP2004049224 A JP 2004049224A JP 2005241329 A5 JP2005241329 A5 JP 2005241329A5
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JP
Japan
Prior art keywords
inspection
data
component
displaying
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004049224A
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English (en)
Japanese (ja)
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JP2005241329A (ja
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Publication date
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Priority to JP2004049224A priority Critical patent/JP2005241329A/ja
Priority claimed from JP2004049224A external-priority patent/JP2005241329A/ja
Publication of JP2005241329A publication Critical patent/JP2005241329A/ja
Publication of JP2005241329A5 publication Critical patent/JP2005241329A5/ja
Pending legal-status Critical Current

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JP2004049224A 2004-02-25 2004-02-25 検査方法、及び検査装置 Pending JP2005241329A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004049224A JP2005241329A (ja) 2004-02-25 2004-02-25 検査方法、及び検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004049224A JP2005241329A (ja) 2004-02-25 2004-02-25 検査方法、及び検査装置

Publications (2)

Publication Number Publication Date
JP2005241329A JP2005241329A (ja) 2005-09-08
JP2005241329A5 true JP2005241329A5 (enrdf_load_stackoverflow) 2007-04-05

Family

ID=35023223

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004049224A Pending JP2005241329A (ja) 2004-02-25 2004-02-25 検査方法、及び検査装置

Country Status (1)

Country Link
JP (1) JP2005241329A (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4958823B2 (ja) * 2008-03-27 2012-06-20 株式会社日立製作所 検査評価システムおよび検査評価方法
WO2012046310A1 (ja) * 2010-10-06 2012-04-12 オリンパス株式会社 内視鏡装置
WO2012046321A1 (ja) * 2010-10-07 2012-04-12 オリンパス株式会社 内視鏡装置
CN111581683B (zh) * 2020-04-27 2023-07-04 深圳市华星光电半导体显示技术有限公司 显示面板信息提取方法、装置及电子设备
KR102262930B1 (ko) * 2020-12-01 2021-06-09 주식회사 딥노이드 상대 좌표 추출 장치 및 방법
JP2024061334A (ja) * 2022-10-21 2024-05-07 アンリツ株式会社 重量測定装置及び重量選別装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01277239A (ja) * 1988-04-28 1989-11-07 Dainippon Screen Mfg Co Ltd ２値画像の記録方法およびその装置
JP2825281B2 (ja) * 1989-07-31 1998-11-18 イビデン株式会社 プリント配線基板の検査装置
JP2863336B2 (ja) * 1991-04-03 1999-03-03 富士通株式会社 プリント板ユニットの検査支援システム
JP2001304836A (ja) * 1992-12-01 2001-10-31 Hitachi Ltd 半導体パッケージ外観検査装置
JP3099666B2 (ja) * 1995-02-16 2000-10-16 株式会社デンソー 物品検査装置
JPH09184715A (ja) * 1995-12-28 1997-07-15 Hitachi Ltd パターン形状検査装置
JPH11312242A (ja) * 1998-04-28 1999-11-09 Nippon Avionics Co Ltd 検査状況表示方法

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