JP2005195545A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2005195545A5 JP2005195545A5 JP2004004372A JP2004004372A JP2005195545A5 JP 2005195545 A5 JP2005195545 A5 JP 2005195545A5 JP 2004004372 A JP2004004372 A JP 2004004372A JP 2004004372 A JP2004004372 A JP 2004004372A JP 2005195545 A5 JP2005195545 A5 JP 2005195545A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004004372A JP4646520B2 (ja) | 2004-01-09 | 2004-01-09 | ３次元形状測定方法及び装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004004372A JP4646520B2 (ja) | 2004-01-09 | 2004-01-09 | ３次元形状測定方法及び装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005195545A JP2005195545A (ja) | 2005-07-21 |
| JP2005195545A5 true JP2005195545A5 (de) | 2007-02-22 |
| JP4646520B2 JP4646520B2 (ja) | 2011-03-09 |
Family
ID=34819002
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004004372A Expired - Fee Related JP4646520B2 (ja) | 2004-01-09 | 2004-01-09 | ３次元形状測定方法及び装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4646520B2 (de) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4260180B2 (ja) | 2006-11-02 | 2009-04-30 | パナソニック株式会社 | 三次元形状測定装置及び三次元形状測定装置用プローブ |
| JP2015040785A (ja) | 2013-08-22 | 2015-03-02 | 株式会社東芝 | 走査型プローブ顕微鏡 |
| JP2017072583A (ja) * | 2015-08-26 | 2017-04-13 | 財團法人工業技術研究院Ｉｎｄｕｓｔｒｉａｌ Ｔｅｃｈｎｏｌｏｇｙ Ｒｅｓｅａｒｃｈ Ｉｎｓｔｉｔｕｔｅ | 表面測定装置及びその方法 |
| US9835449B2 (en) * | 2015-08-26 | 2017-12-05 | Industrial Technology Research Institute | Surface measuring device and method thereof |
| US9970754B2 (en) | 2015-08-26 | 2018-05-15 | Industrial Technology Research Institute | Surface measurement device and method thereof |
| CN107322930B (zh) * | 2017-08-03 | 2019-08-23 | 陕西恒通智能机器有限公司 | 一种具有检测现有工件功能的3d打印机 |
| JP7068849B2 (ja) * | 2018-02-19 | 2022-05-17 | 株式会社東京精密 | 研削装置 |
| CN110006379B (zh) * | 2019-01-16 | 2021-08-06 | 苏州罗伊艾米精密工业有限公司 | 一种结构检测系统 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55133551A (en) * | 1979-04-06 | 1980-10-17 | Hitachi Ltd | Device for driving circular face plate |
| JPH0581623U (ja) * | 1992-04-08 | 1993-11-05 | エヌオーケー株式会社 | 密封性検査装置 |
| JP2002333311A (ja) * | 2001-05-10 | 2002-11-22 | Matsushita Electric Ind Co Ltd | 形状測定装置及び方法 |
-
2004
- 2004-01-09 JP JP2004004372A patent/JP4646520B2/ja not_active Expired - Fee Related